GT15J321_06 [TOSHIBA]

Silicon N Channel IGBT High Power Switching Applications; 硅N沟道IGBT高功率开关应用
GT15J321_06
型号: GT15J321_06
厂家: TOSHIBA    TOSHIBA
描述:

Silicon N Channel IGBT High Power Switching Applications
硅N沟道IGBT高功率开关应用

开关 双极性晶体管
文件: 总7页 (文件大小:195K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
GT15J321  
TOSHIBA Insulated Gate Bipolar Transistor Silicon N Channel IGBT  
GT15J321  
High Power Switching Applications  
Unit: mm  
Fast Switching Applications  
Fourth-generation IGBT  
Fast switching (FS  
Enhancement mode type  
High speed: t = 0.03 μs (typ.)  
f
Low saturation Voltage: V  
= 1.90 V (typ.)  
CE (sat)  
FRD included between emitter and collector  
Absolute Maximum Ratings (Ta = 25°C)  
Characteristics  
Symbol  
Rating  
Unit  
Collector-emitter voltage  
Gate-emitter voltage  
V
V
600  
±20  
15  
V
V
CES  
GES  
DC  
1 ms  
DC  
I
C
Collector current  
A
I
30  
CP  
JEDEC  
I
15  
F
Emitter-collector forward  
current  
A
1 ms  
I
30  
JEITA  
FM  
Collector power dissipation  
(Tc = 25°C)  
TOSHIBA  
Weight: 1.7 g  
2-10R1C  
P
30  
W
C
Junction temperature  
T
150  
°C  
°C  
j
Storage temperature range  
T
stg  
55~150  
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the  
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even  
if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum  
ratings.  
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook  
(“Handling Precautions”/Derating Concept and Methods) and individual reliability data (i.e. reliability test report  
and estimated failure rate, etc).  
Equivalent Circuit  
Marking  
Collector  
Gate  
15J321  
Part No. (or abbreviation code)  
Lot No.  
Emitter  
A line indicates  
lead (Pb)-free package or  
lead (Pb)-free finish.  
1
2006-10-31  
GT15J321  
Electrical Characteristics (Ta = 25°C)  
Characteristics  
Gate leakage current  
Symbol  
Test Condition  
Min  
Typ.  
Max  
Unit  
I
V
V
= ±20 V, V  
= 600 V, V  
= 0  
= 0  
±500  
1.0  
nA  
mA  
V
GES  
GE  
CE  
CE  
Collector cut-off current  
I
CES  
GE  
Gate-emitter cut-off voltage  
Collector-emitter saturation voltage  
Input capacitance  
V
I
I
= 1.5 mA, V  
= 5 V  
3.5  
6.5  
GE (OFF)  
C
C
CE  
V
= 15 A, V  
= 15 V  
1.90  
2300  
2.45  
V
CE (sat)  
GE  
= 20 V, V = 0, f = 1 MHz  
GE  
C
V
pF  
ies  
CE  
Rise time  
t
0.04  
0.17  
0.03  
0.34  
r
Inductive Load  
Turn-on time  
t
V
V
= 300 V, I = 15 A  
C
on  
CC  
GG  
Switching time  
μs  
= 15 V, R = 43 Ω  
G
Fall time  
t
f
0.15  
(Note 1)  
Turn-off time  
t
off  
Peak forward voltage  
V
I
I
= 15 A, V = 0  
GE  
2.0  
200  
4.16  
4.63  
V
F
F
F
Reverse recovery time  
Thermal resistance (IGBT)  
Thermal resistance (Diode)  
t
= 15 A, di/dt = −100 A/μs  
ns  
rr  
R
R
°C/W  
°C/W  
th (j-c)  
th (j-c)  
Note 1: Switching time measurement circuit and input/output waveforms  
V
GE  
90%  
10%  
0
0
V  
GE  
I
C
L
I
V
CC  
C
90%  
10%  
90%  
R
G
V
CE  
V
10%  
10%  
10%  
CE  
t
t
t
r
d (off)  
d (on)  
t
f
t
t
on  
off  
Note 2: Switching loss measurement waveforms  
V
GE  
90%  
10%  
0
0
I
C
V
5%  
CE  
E
E
on  
off  
2
2006-10-31  
GT15J321  
I
– V  
V
– V  
GE  
C
CE  
CE  
50  
40  
20  
16  
12  
8
Common emitter  
Common emitter  
Tc = 25°C  
Tc = −40°C  
20 15  
30  
30  
20  
9
15  
8
4
10  
0
I
= 6 A  
C
V
= 7 V  
GE  
0
0
0
1
2
3
4
5
4
8
12  
16  
20  
Collector-emitter voltage  
V
(V)  
Gate-emitter voltage  
V
GE  
(V)  
CE  
V
– V  
V
– V  
GE  
CE  
GE  
CE  
20  
16  
12  
8
20  
16  
12  
8
Common emitter  
Common emitter  
Tc = 25°C  
Tc = 125°C  
30  
30  
15  
15  
4
4
I
= 6 A  
I
= 6 A  
C
C
0
0
0
0
4
8
12  
16  
20  
4
8
12  
16  
20  
Gate-emitter voltage  
V
GE  
(V)  
Gate-emitter voltage  
V
GE  
(V)  
I
C
– V  
V – Tc  
CE (sat)  
GE  
4
3
2
1
30  
25  
Common emitter  
Common emitter  
= 15 V  
V
= 5 V  
CE  
V
GE  
30 A  
15 A  
20  
15  
10  
5
I
= 6 A  
C
Tc = 125°C  
40  
25  
0
0
0
60  
4
8
12  
16  
20  
20  
20  
60  
100  
140  
Gate-emitter voltage  
V
GE  
(V)  
Case temperature Tc (°C)  
3
2006-10-31  
GT15J321  
Switching time  
t
, t – R  
r
Switching time  
t
, t – I  
on C  
on  
G
r
3
1
3
1
Common emitter  
Common emitter  
V
V
R
= 300 V  
= 15 V  
= 43 Ω  
V
V
= 300 V  
CC  
GG  
G
CC  
GG  
= 15 V  
I
= 15 A  
C
: Tc = 25°C  
: Tc = 125°C  
: Tc = 25°C  
0.5  
0.3  
0.5  
0.3  
: Tc = 125°C  
t
on  
t
on  
0.1  
0.1  
0.05  
0.03  
0.05  
0.03  
t
r
t
r
0.01  
0.01  
0
1
3
10  
30  
100  
300  
1000  
1000  
1000  
3
6
9
15  
12  
Gate resistance  
R
(Ω)  
Collector current  
I
(A)  
G
C
Switching time  
t
, t – R  
f
Switching time  
t
, t – I  
f C  
off  
G
off  
3
1
3
1
Common emitter  
V
V
= 300 V  
= 15 V  
= 15 A  
CC  
GG  
I
C
: Tc = 25°C  
: Tc = 125°C  
t
off  
0.5  
0.3  
0.5  
0.3  
t
off  
t
f
0.1  
0.1  
Common emitter  
0.05  
0.03  
0.05  
0.03  
V
V
R
= 300 V  
= 15 V  
= 43 Ω  
: Tc = 25°C  
: Tc = 125°C  
CC  
GG  
t
f
G
0.01  
0.01  
0
1
3
10  
30  
100  
300  
3
6
9
15  
12  
Collector current  
I
C
(A)  
Gate resistance  
R
(Ω)  
G
Switching loss  
E
, E – R  
on off  
Switching loss  
E
, E – I  
on off  
G
C
10  
10  
Common emitter  
Common emitter  
5
3
V
V
= 300 V  
= 15 V  
= 43 Ω  
CC  
GG  
V
V
= 300 V  
= 15 V  
= 15 A  
: Tc = 25°C  
: Tc = 125°C  
(Note 2)  
CC  
GG  
5
3
R
G
I
C
: Tc = 25°C  
: Tc = 125°C  
(Note 2)  
1
1
0.5  
0.3  
E
on  
0.5  
0.3  
0.1  
E
off  
E
off  
E
on  
0.05  
0.03  
0.1  
0.05  
0.03  
0.01  
0
3
6
9
15  
1
3
10  
30  
100  
300  
12  
Gate resistance  
R
G
(Ω)  
Collector current  
I
C
(A)  
4
2006-10-31  
GT15J321  
C – V  
V
, V – Q  
CE GE  
CE  
G
3000  
1000  
500  
400  
20  
16  
C
ies  
Common emitter  
= 20 Ω  
R
L
Tc = 25°C  
300  
100  
300  
200  
12  
8
300  
30  
10  
3
200  
C
oes  
V
= 100 V  
CE  
C
res  
Common emitter  
= 0  
f = 1 MHz  
4
0
100  
0
V
GE  
Tc = 25°C  
1
3
10  
30  
100  
300  
1000  
3000  
0
20  
40  
60  
80  
100  
120  
Collector-emitter voltage  
V
(V)  
Gate charge  
Q
G
(nC)  
CE  
I
F
V  
t , I IF  
rr rr  
F
30  
25  
20  
15  
10  
5
100  
1000  
Common collector  
Common collector  
= 0  
di/dt = −100 A/μs  
V
GE  
V
= 0  
GE  
: Tc = 25°C  
30  
10  
300  
100  
: Tc = 125°C  
t
I
rr  
rr  
Tc = 125°C  
25  
40  
3
1
30  
10  
0
0
0
3
6
9
12  
15  
0.4  
0.8  
1.2  
1.6  
2.0  
Forward voltage  
V
F
(V)  
Forward current  
I
F
(A)  
Safe operating area  
Reverse bias SOA  
50  
30  
50  
30  
I
max (pulsed)*  
C
50 μs*  
I
max (continuous)  
C
10  
10  
100 μs*  
5
3
5
3
1 ms*  
DC operation  
10 ms*  
1
1
*:Single  
nonrepetitive pulse  
Tc = 25°C  
0.5  
0.3  
0.5  
0.3  
<
T
125°C  
j
Curves must be derated  
linearly with increase in  
temperature.  
V
= 15 V  
= 43 Ω  
GE  
R
G
0.1  
1
0.1  
1
3
10  
30  
100  
300  
(V)  
1000  
3
10  
30  
100  
300  
1000  
Collector-emitter voltage  
V
Collector-emitter voltage  
V
(V)  
CE  
CE  
5
2006-10-31  
GT15J321  
r
– t  
th (t)  
w
2
1
0
1
2
3
10  
10  
Tc = 25°C  
FRD  
10  
IGBT  
10  
10  
10  
10  
4
5
4
3
2
1
0
1
2
10  
10  
10  
10  
10  
10  
10  
10  
Pulse width  
t
(s)  
w
6
2006-10-31  
GT15J321  
RESTRICTIONS ON PRODUCT USE  
20070701-EN  
The information contained herein is subject to change without notice.  
TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor  
devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical  
stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of  
safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of  
such TOSHIBA products could cause loss of human life, bodily injury or damage to property.  
In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as  
set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and  
conditions set forth in the “Handling Guide for Semiconductor Devices,” or “TOSHIBA Semiconductor Reliability  
Handbook” etc.  
The TOSHIBA products listed in this document are intended for usage in general electronics applications  
(computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances,  
etc.).These TOSHIBA products are neither intended nor warranted for usage in equipment that requires  
extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or  
bodily injury (“Unintended Usage”). Unintended Usage include atomic energy control instruments, airplane or  
spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments,  
medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in his  
document shall be made at the customer’s own risk.  
The products described in this document shall not be used or embedded to any downstream products of which  
manufacture, use and/or sale are prohibited under any applicable laws and regulations.  
The information contained herein is presented only as a guide for the applications of our products. No  
responsibility is assumed by TOSHIBA for any infringements of patents or other rights of the third parties which  
may result from its use. No license is granted by implication or otherwise under any patents or other rights of  
TOSHIBA or the third parties.  
Please contact your sales representative for product-by-product details in this document regarding RoHS  
compatibility. Please use these products in this document in compliance with all applicable laws and regulations  
that regulate the inclusion or use of controlled substances. Toshiba assumes no liability for damage or losses  
occurring as a result of noncompliance with applicable laws and regulations.  
7
2006-10-31  

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