2SK3176_07 [TOSHIBA]

Silicon N Channel MOS Type Switching Regulator, DC-DC Converter and Motor Drive Applications; 硅N沟道MOS型开关稳压器, DC-DC转换器和电机驱动应用
2SK3176_07
型号: 2SK3176_07
厂家: TOSHIBA    TOSHIBA
描述:

Silicon N Channel MOS Type Switching Regulator, DC-DC Converter and Motor Drive Applications
硅N沟道MOS型开关稳压器, DC-DC转换器和电机驱动应用

转换器 稳压器 开关 电机 驱动 DC-DC转换器
文件: 总6页 (文件大小:186K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
2SK3176  
TOSHIBA Field Effect Transistor Silicon N Channel MOS Type (π-MOS V)  
2SK3176  
Switching Regulator, DC-DC Converter and Motor Drive  
Applications  
Unit: mm  
Low drain-source ON resistance: R  
= 38 mΩ (typ.)  
DS (ON)  
High forward transfer admittance: |Y | = 30 S (typ.)  
fs  
Low leakage current: I  
= 100 μA (max) (V  
= 200 V)  
DSS  
DS  
Enhancement-mode: V = 1.5 to 3.5 V (V  
= 10 V, I = 1 mA)  
D
th  
DS  
Absolute Maximum Ratings (Ta = 25°C)  
Characteristics  
Drain-source voltage  
Symbol  
Rating  
Unit  
V
200  
200  
±20  
30  
V
V
V
DSS  
Drain-gate voltage (R  
Gate-source voltage  
= 20 kΩ)  
V
GS  
DGR  
V
GSS  
DC (Note 1)  
I
1. GATE  
D
Drain current  
A
2. DRAIN (HEAT SINK)  
3. SOURCE  
Pulse (Note 1)  
I
120  
150  
DP  
Drain power dissipation  
(Tc = 25°C)  
P
W
D
AS  
AR  
JEDEC  
Single pulse avalanche energy  
(Note 2)  
E
925  
mJ  
JEITA  
SC-65  
Avalanche current  
I
30  
15  
A
TOSHIBA  
2-16C1B  
Repetitive avalanche energy (Note 3)  
Channel temperature  
E
mJ  
°C  
°C  
AR  
Weight: 4.6 g (typ.)  
T
ch  
150  
Storage temperature range  
T
stg  
55 to 150  
Note 1: Please use devices on condition that the channel temperature is below 150°C.  
Note 2: = 50 V, T = 25°C (initial), L = 1.66 mH, R = 25 Ω, I = 30 A  
Note 3: Repetitive rating: pulse width limited by maximum junction temperature.  
V
DD  
ch  
G
AR  
Note 4: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change  
in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e.  
operating temperature/current/voltage, etc.) are within the absolute maximum ratings. Please design the appropriate  
reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling Precautions”/Derating Concept and  
Methods) and individual reliability data (i.e. reliability test report and estimated failure rate, etc).  
This transistor is an electrostatic sensitive device.  
Please handle with caution.  
Thermal Characteristics  
Characteristics  
Symbol  
Max  
Unit  
Thermal resistance, channel to case  
Thermal resistance, channel to ambient  
R
0.833 °C/W  
50.0 °C/W  
th (ch-c)  
R
th (ch-a)  
1
2007-03-16  
2SK3176  
Electrical Characteristics (Ta = 25°C)  
Characteristics  
Gate leakage current  
Symbol  
Test Condition  
Min  
Typ.  
Max  
Unit  
I
V
V
= ±16 V, V = 0 V  
DS  
±10  
100  
μA  
μA  
V
GSS  
GS  
DS  
Drain cut-off current  
I
= 200 V, V  
= 0 V  
DSS  
(BR) DSS  
GS  
Drain-source breakdown voltage  
Gate threshold voltage  
Drain-source ON resistance  
Forward transfer admittance  
Input capacitance  
V
I
= 10 mA, V  
= 0 V  
200  
1.5  
D
GS  
V
V
V
V
V
V
V
= 10 V, I = 1 mA  
3.5  
52  
V
th  
DS  
GS  
DS  
DS  
DS  
DS  
D
R
= 10 V, I = 15 A  
38  
mΩ  
S
DS (ON)  
|Y |  
D
= 10 V, I = 15 A  
15  
30  
fs  
D
C
= 10 V, V  
= 10 V, V  
= 10 V, V  
= 0 V, f = 1 MHz  
= 0 V, f = 1 MHz  
= 0 V, f = 1 MHz  
5400  
580  
1900  
pF  
pF  
pF  
iss  
rss  
oss  
GS  
GS  
GS  
Reverse transfer capacitance  
Output capacitance  
C
C
I
= 15 A  
Rise time  
t
D
15  
55  
r
10 V  
GS  
V
OUT  
V
0 V  
Turn-on time  
t
on  
Switching time  
ns  
Fall time  
t
25  
f
V
100 V  
DD  
Turn-off time  
t
190  
125  
off  
Duty 1%, t = 10 μs  
w
Total gate charge  
Q
V
160 V, V  
= 10 V, I = 30 A  
nC  
g
DD  
GS  
D
(gate-source plus gate-drain)  
Gate-source charge  
Q
V
V
160 V, V  
160 V, V  
= 10 V, I = 30 A  
80  
45  
nC  
nC  
gs  
DD  
DD  
GS  
GS  
D
Gate-drain (“miller”) charge  
Q
= 10 V, I = 30 A  
gd  
D
Source-Drain Ratings and Characteristics (Ta = 25°C)  
Characteristics  
Symbol  
Test Condition  
Min  
Typ.  
Max  
30  
Unit  
A
Continuous drain reverse current  
I
DR  
(Note 1)  
Pulse drain reverse current (Note 1)  
Forward voltage (diode)  
I
90  
A
V
DRP  
V
I
I
= 30 A, V  
= 30 A, V  
= 0 V  
2.0  
DSF  
DR  
DR  
GS  
GS  
= 0 V,  
dI /dt = 100 A/μs  
Reverse recovery time  
t
270  
3.0  
ns  
rr  
DR  
I
= 30 A, V  
= 0 V,  
GS  
DR  
dI /dt = 100 A/μs  
Reverse recovery charge  
Q
rr  
μC  
DR  
Marking  
TOSHIBA  
K3176  
Product No. (or abbreviation code)  
Lot No.  
A line indicates  
lead (Pb)-free package or  
lead (Pb)-free finish.  
2
2007-03-16  
2SK3176  
I
– V  
I – V  
D DS  
D
8
DS  
20  
16  
12  
8
50  
40  
30  
20  
10  
0
15  
10  
4.8  
10  
Common source  
Tc = 25°C  
Pulse test  
4.6  
4.4  
4
6
5
6
8
Common source  
15  
5
Tc = 25°C  
Pulse test  
4.2  
4
3.8  
3.6  
3.8  
4
V
= 3.4 V  
GS  
V
= 3.6 V  
GS  
16  
0
0
0.4  
0.8  
1.2  
1.6  
2.0  
0
4
8
12  
20  
Drain-source voltage  
V
DS  
(V)  
Drain-source voltage  
V
DS  
(V)  
I
D
– V  
V
– V  
DS GS  
GS  
50  
40  
30  
20  
10  
0
5
4
3
2
1
0
Common source  
Tc = 25°C  
Common source  
= 10 V  
V
DS  
Pulse test  
Pulse test  
25  
I
= 30 A  
D
Tc = −55°C  
15  
100  
7.5  
0
4
8
12  
16  
20  
0
2
4
6
8
10  
Gate-source voltage  
V
GS  
(V)  
Gate-source voltage  
V
GS  
(V)  
R
– I  
D
DS (ON)  
|Y | – I  
fs  
D
0.5  
0.3  
Common source  
Tc = 25°C  
100  
Common source  
= 10 V  
25  
Pulse test  
V
DS  
Pulse test  
50  
30  
Tc = −55°C  
0.1  
100  
10  
0.05  
0.03  
V
= 10 V  
GS  
5
3
15  
1
0.01  
0.3 0.5  
1
3
5
10  
30 50  
100  
1
3
5
10  
30  
50  
100  
Drain current  
I
(A)  
Drain current  
I
(A)  
D
D
3
2007-03-16  
2SK3176  
R
Tc  
I
– V  
DR DS  
DS (ON)  
0.10  
0.08  
0.06  
0.04  
0.02  
0
100  
Common source  
= 10 V  
Common source  
Tc = 25°C  
V
GS  
I
= 30 A  
D
50  
30  
Pulse test  
Pulse test  
15  
7.5  
10  
10  
5
3
5
3
V
= 0 V  
GS  
1
0
80  
40  
0
40  
80  
120  
160  
0.4  
0.8  
1.2  
1.6  
2.0  
Case temperature Tc (°C)  
Drain-source voltage  
V
DS  
(V)  
Capacitance – V  
V
Tc  
th  
DS  
5
4
3
2
1
Common source  
= 10 V  
10000  
V
DS  
= 1 mA  
D
I
C
iss  
Pulse test  
3000  
1000  
C
oss  
300  
100  
Common source  
= 0 V  
C
rss  
V
GS  
f = 1 MHz  
Tc = 25°C  
0
30  
0.1  
80  
40  
0
40  
80  
120  
160  
0.3  
1
3
10  
30  
100  
Drain-source voltage  
V
DS  
(V)  
Case temperature Tc (°C)  
Dynamic Input/Output  
Characteristics  
P
Tc  
D
250  
200  
150  
100  
50  
200  
20  
Common source  
= 30 A  
Tc = 25°C  
I
D
V
DS  
Pulse test  
150  
100  
50  
15  
10  
5
80  
V
= 40 V  
DD  
160  
V
GS  
80  
0
0
0
0
0
200  
40  
80  
120  
160  
200  
40  
120  
160  
Case temperature Tc (°C)  
Total gate charge  
Q
(nC)  
g
4
2007-03-16  
2SK3176  
r
th  
– t  
w
3
1
Duty = 0.5  
0.5  
0.3  
0.2  
0.1  
0.1  
0.05  
P
DM  
0.05  
0.03  
0.02  
t
Single pulse  
T
0.01  
0.01  
Duty = t/T  
R
= 0.833°C/W  
th (ch-c)  
0.005  
0.003  
10 μ  
100 μ  
1 m  
10 m  
100 m  
1
10  
Pulse width  
t
(s)  
w
Safe Operating Area  
E
– T  
ch  
AS  
300  
100  
1000  
800  
600  
400  
200  
0
I
I
max (pulse)*  
D
D
100 μs*  
1 ms*  
50  
30  
max (continuous)  
10  
5
3
DC operation  
Tc = 25°C  
1
25  
50  
75  
100  
125  
150  
*: Single nonrepetitive  
pulse Tc = 25°C  
0.5  
0.3  
Channel temperature (initial)  
T
(°C)  
ch  
Curves must be derated  
linearly with increase in  
temperature.  
V
max  
DSS  
0.1  
1
B
VDSS  
3
5
10  
30 50  
100  
300 500  
15 V  
15 V  
Drain-source voltage  
V
(V)  
I
DS  
AR  
V
V
DS  
DD  
Test circuit  
Wave form  
1
2
B
2
R
V
= 25 Ω  
VDSS  
G
=
·L·I ·  
Ε
AS  
= 50 V, L = 1.66 mH  
B
V
DD  
DD  
VDSS  
5
2007-03-16  
2SK3176  
RESTRICTIONS ON PRODUCT USE  
20070701-EN  
The information contained herein is subject to change without notice.  
TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor  
devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical  
stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of safety  
in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such  
TOSHIBA products could cause loss of human life, bodily injury or damage to property.  
In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as  
set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and  
conditions set forth in the “Handling Guide for Semiconductor Devices,” or “TOSHIBA Semiconductor Reliability  
Handbook” etc.  
The TOSHIBA products listed in this document are intended for usage in general electronics applications  
(computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances,  
etc.).These TOSHIBA products are neither intended nor warranted for usage in equipment that requires  
extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or  
bodily injury (“Unintended Usage”). Unintended Usage include atomic energy control instruments, airplane or  
spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments,  
medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in his  
document shall be made at the customer’s own risk.  
The products described in this document shall not be used or embedded to any downstream products of which  
manufacture, use and/or sale are prohibited under any applicable laws and regulations.  
The information contained herein is presented only as a guide for the applications of our products. No responsibility  
is assumed by TOSHIBA for any infringements of patents or other rights of the third parties which may result from  
its use. No license is granted by implication or otherwise under any patents or other rights of TOSHIBA or the third  
parties.  
Please contact your sales representative for product-by-product details in this document regarding RoHS  
compatibility. Please use these products in this document in compliance with all applicable laws and regulations  
that regulate the inclusion or use of controlled substances. Toshiba assumes no liability for damage or losses  
occurring as a result of noncompliance with applicable laws and regulations.  
6
2007-03-16  

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