2SC5976 [TOSHIBA]

Transistor Silicon NPN Epitaxial Type; 晶体管NPN硅外延型
2SC5976
型号: 2SC5976
厂家: TOSHIBA    TOSHIBA
描述:

Transistor Silicon NPN Epitaxial Type
晶体管NPN硅外延型

晶体 晶体管
文件: 总5页 (文件大小:176K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
2SC5976  
TOSHIBA Transistor Silicon NPN Epitaxial Type  
2SC5976  
High-Speed Switching Applications  
Unit: mm  
DC-DC Converter Applications  
Strobe Flash Applications  
+0.2  
2.8-0.3  
+0.2  
1.6-0.1  
High DC current gain: h  
= 250 to 400 (I = 0.3 A)  
C
FE  
1
2
Low collector-emitter saturation voltage: V  
= 0.14 V (max)  
CE (sat)  
High-speed switching: t = 25 ns (typ.)  
f
3
Maximum Ratings  
=
(Ta 25°C)  
Characteristics  
Collector-base voltage  
Symbol  
Rating  
Unit  
50  
50  
V
V
V
V
V
CBO  
Collector-emitter voltage  
Collector-emitter voltage  
Emitter-base voltage  
V
CEX  
CEO  
EBO  
1.Base  
2.Emitter  
3.Collector  
30  
V
V
6
I
3.0  
DC  
C
Collector current  
Base current  
A
A
JEDEC  
I
5.0  
Pulse  
CP  
JEITA  
0.3  
I
B
TOSHIBA  
23S1A  
1.00  
0.625  
150  
Collector power dissipation (t=10s)  
Total collector power dissipation (DC)  
Junction temperature  
P
C
(Note.1)  
W
T
j
°C  
°C  
Storage temperature range  
T
stg  
55 to 150  
Note 1: Mounted on an FR4 board (glass epoxy, 1.6 mm thick, Cu area: 645 mm2)  
1
2004-07-01  
2SC5976  
Electrical Characteristics (Ta = 25°C)  
Characteristics  
Collector cut-off current  
Symbol  
Test Condition  
Min  
Typ.  
Max  
Unit  
V
V
I
= 50 V, I = 0  
0.1  
0.1  
I
μA  
μA  
V
CB  
EB  
E
CBO  
= 6 V, I = 0  
Emitter cut-off current  
I
C
EBO  
= 10 mA, I = 0  
30  
Collector-emitter breakdown voltage  
V
(BR) CEO  
C
B
V
V
= 2 V, I = 0.3 A  
250  
120  
400  
h
(1)  
(2)  
CE  
C
FE  
FE  
DC current gain  
h
= 2 V, I = 1.0 A  
CE  
C
Collector-emitter saturation voltage  
Base-emitter saturation voltage  
Collector output capacitance  
Rise time  
V
I
I
= 1.0 A, I =33mA  
B
0.14  
1.10  
V
V
C
C
CE (sat)  
= 1.0 A, I =33mA  
B
V
BE (sat)  
Cob  
V
= 10 V, I = 0, f=1MHz  
18  
40  
320  
25  
pF  
CB  
E
t
r
See Figure 1.  
Switching time  
V
I
12V, R = 12 Ω  
ns  
Storage time  
Fall time  
t
CC  
L
stg  
= −I = 33 mA  
t
f
B1  
B2  
V
CC  
20 µs  
I
I
I
B1  
B1  
B2  
Output  
Input  
I
B2  
Duty cycle < 1%  
Figure 1 Switching Time Test Circuit & Timing Chart  
MARKING  
Part No. (or abbreviation code)  
W W  
Lot code (month)  
Lot code (year)  
Dot: even year  
No dot: odd year  
2
2004-07-01  
2SC5976  
I
– V  
h – I  
FE C  
C
CE  
3.0  
1000  
100  
10  
20  
15  
10  
8
Ta = 100°C  
2.5  
2.0  
1.5  
25°C  
6
4
55°C  
1.0  
0.5  
0
I
B
= 2 mA  
Common emitter  
Common emitter  
VCE = 2 V  
Single nonrepetitive pulse  
Ta = 25°C  
Single nonrepetitive pulse  
0.001 0.01  
0.1  
1
10  
0
0.4  
0.8  
1.2  
1.6  
2.0  
2.4  
Collector current  
I
C
(A)  
Collectoremitter voltage  
V
CE  
(V)  
V
– I  
C
V
– I  
CE (sat)  
BE (sat) C  
1
10  
Common emitter  
= 30  
Single nonrepetitive pulse  
Common emitter  
= 30  
Single nonrepetitive pulse  
β
β
Ta = −55°C  
0.1  
1
55°C  
Ta = 100°C  
100°C  
25°C  
25°C  
0.01  
0.001  
0.1  
0.001  
0.01  
0.1  
1
10  
0.01  
0.1  
1
10  
Collector current  
I
C
(A)  
Collector current  
I
C
(A)  
P – Ta  
c
I
– V  
BE  
C
0.8  
0.6  
0.4  
3.0  
2.5  
2.0  
DC Operation Ta = 25°C  
Mounted on an FR4 board glass epoxy,  
1.6 mm thick, Cu area: 645 mm2)  
Common emitter  
VCE = 2 V  
Single nonrepetitive pulse  
1.5  
1.0  
0.5  
0
Ta = 100°C  
55°C  
0.2  
0
25°C  
0
20  
40  
60  
80  
100  
120  
140  
160  
0
0.2  
0.4  
0.6  
0.8  
1.0  
BE  
1.2  
Ambient temperature Ta (°C)  
Baseemitter saturation voltage  
V
(V)  
3
2004-07-01  
2SC5976  
r
– t  
w
th  
1000  
100  
10  
Curves should be applied in thermal limited area.  
Single nonrepetitive pulse Ta = 25°C  
Mounted on an FR4 board (glass epoxy, 1.6 mm thick, Cu area: 645 mm2)  
1
0.001  
0.01  
0.1  
1
10  
100  
1000  
Pulse width  
t
(s)  
w
Safe operating area  
10  
10 ms*  
1 ms*  
100 µs*  
I
max (Pulsed)*  
C
10 µs*  
I
C
max (Continuous)*  
100 ms*  
10 s*  
1
DC operation  
Ta = 25°C  
*: Single nonrepetitive pulse  
Ta = 25°C  
Note that the curves for 100 ms,  
10 s and DC operation will be  
different when the devices aren’t  
mounted on an FR4 board (glass  
epoxy, 1.6 mm thick, Cu area:  
645 mm2).  
0.1  
These characteristic curves must  
be derated linearly with increase  
in temperature.  
0.01  
0.1  
1
10  
100  
Collectoremitter voltage  
V
CE  
(V)  
4
2004-07-01  
2SC5976  
RESTRICTIONS ON PRODUCT USE  
030619EAA  
The information contained herein is subject to change without notice.  
The information contained herein is presented only as a guide for the applications of our products. No  
responsibility is assumed by TOSHIBA for any infringements of patents or other rights of the third parties which  
may result from its use. No license is granted by implication or otherwise under any patent or patent rights of  
TOSHIBA or others.  
TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor  
devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical  
stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of  
safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of  
such TOSHIBA products could cause loss of human life, bodily injury or damage to property.  
In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as  
set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and  
conditions set forth in the “Handling Guide for Semiconductor Devices,” or “TOSHIBA Semiconductor Reliability  
Handbook” etc..  
The TOSHIBA products listed in this document are intended for usage in general electronics applications  
(computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances,  
etc.). These TOSHIBA products are neither intended nor warranted for usage in equipment that requires  
extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or  
bodily injury (“Unintended Usage”). Unintended Usage include atomic energy control instruments, airplane or  
spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments,  
medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in this  
document shall be made at the customer’s own risk.  
TOSHIBA products should not be embedded to the downstream products which are prohibited to be produced  
and sold, under any law and regulations.  
5
2004-07-01  

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