STW20NB50 [STMICROELECTRONICS]

N - CHANNEL 500V - 0.22ohm - 20A - TO-247 PowerMESH MOSFET; N - CHANNEL 500V - 0.22ohm - 20A - TO- 247 MOSFET的PowerMESH
STW20NB50
型号: STW20NB50
厂家: ST    ST
描述:

N - CHANNEL 500V - 0.22ohm - 20A - TO-247 PowerMESH MOSFET
N - CHANNEL 500V - 0.22ohm - 20A - TO- 247 MOSFET的PowerMESH

文件: 总8页 (文件大小:89K)
中文:  中文翻译
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STW20NB50  
N - CHANNEL 500V - 0.22- 20A - TO-247  
PowerMESH  
MOSFET  
TYPE  
VDSS  
RDS(on)  
ID  
STW20NB50  
500 V  
< 0.25 Ω  
20 A  
TYPICAL RDS(on) = 0.22 Ω  
EXTREMELY HIGH dv/dt CAPABILITY  
± 30V GATE TO SOURCE VOLTAGE RATING  
100% AVALANCHE TESTED  
REPETITIVE AVALANCHE DATA AT 100oC  
VERY LOW INTRINSIC CAPACITANCES  
GATE CHARGE MINIMIZED  
3
2
1
DESCRIPTION  
Using the latest high voltage technology,  
STMicroelectronics has designed an advanced  
family of power Mosfets with outstanding  
performances. The new patent pending strip  
layout coupled with the Company’s proprietary  
edge termination structure, gives the lowest  
TO-247  
INTERNAL SCHEMATIC DIAGRAM  
RDS(on) per area, exceptional avalanche and  
dv/dt capabilities and unrivalled gate charge and  
switching characteristics.  
APPLICATIONS  
HIGH CURRENT, HIGH SPEED SWITCHING  
SWITCH MODE POWER SUPPLIES(SMPS)  
DC-AC CONVERTERS FOR WELDING  
EQUIPMENTAND UNINTERRUPTIBLE  
POWER SUPPLIES AND MOTOR DRIVE  
ABSOLUTE MAXIMUM RATINGS  
Symbol  
VDS  
VDGR  
VGS  
ID  
Parameter  
Value  
500  
Unit  
Drain-source Voltage (VGS = 0)  
Drain- gate Voltage (RGS = 20 k  
Gate-source Voltage  
V
V
500  
)
± 30  
20  
V
o
Drain Current (continuous) at Tc = 25 C  
Drain Current (continuous) at Tc = 100 oC  
Drain Current (pulsed)  
A
ID  
12.7  
80  
A
I
DM()  
A
o
Ptot  
Total Dissipation at Tc = 25 C  
250  
W
Derating Factor  
2
W/oC  
V/ns  
oC  
oC  
dv/dt(1) Peak Diode Recovery voltage slope  
4
Tstg  
Storage Temperature  
-65 to 150  
Tj  
Max. Operating Junction Temperature  
150  
() Pulse width limited by safe operating area  
(1) ISD 20A, di/dt 200 A/µs, VDD V(BR)DSS, Tj TJMAX  
1/8  
October 1999  
STW20NB50  
THERMAL DATA  
Rthj-case Thermal Resistance Junction-case  
Rthj-amb Thermal Resistance Junction-ambient  
Rthc-sink Thermal Resistance Case-sink  
Max  
Max  
Typ  
0.5  
30  
0.1  
300  
oC/W  
oC/W  
oC/W  
oC  
Tl  
Maximum Lead Temperature For Soldering Purpose  
AVALANCHE CHARACTERISTICS  
Symbol  
Parameter  
Max Value  
Unit  
IAR  
Avalanche Current, Repetitive or Not-Repetitive  
20  
A
(pulse width limited by Tj max, δ < 1%)  
EAS  
Single Pulse Avalanche Energy  
1000  
mJ  
(starting Tj = 25 oC, ID = IAR, VDD = 50 V)  
(Tcase = 25 oC unless otherwisespecified)  
ELECTRICAL CHARACTERISTICS  
OFF  
Symbol  
V(BR)DSS Drain-source  
Breakdown Voltage  
Zero Gate Voltage  
Drain Current (VGS = 0) VDS = Max Rating  
Parameter  
Test Conditions  
Min.  
Typ.  
Max.  
Unit  
500  
V
ID = 250 µA VGS = 0  
IDSS  
IGSS  
VDS = Max Rating  
10  
100  
µA  
µA  
Tc = 125 oC  
Gate-body Leakage  
Current (VDS = 0)  
± 100  
nA  
VGS = ± 30 V  
ON ( )  
Symbol  
Parameter  
Test Conditions  
VDS = VGS ID = 250 µA  
Min.  
Typ.  
Max.  
Unit  
VGS(th)  
Gate Threshold  
Voltage  
3
4
5
V
RDS(on)  
ID(on)  
Static Drain-source On VGS = 10 V ID = 10 A  
Resistance  
0.22  
0.25  
On State Drain Current VDS > ID(on) x RDS(on)max  
VGS = 10 V  
20  
A
DYNAMIC  
Symbol  
Parameter  
Forward  
Test Conditions  
VDS > ID(on) x RDS(on)max ID = 10 A  
Min.  
Typ.  
Max.  
Unit  
gfs ( )  
9
13.5  
S
Transconductance  
Ciss  
Coss  
Crss  
Input Capacitance  
Output Capacitance  
Reverse Transfer  
Capacitance  
VDS = 25 V f = 1 MHz VGS = 0  
3600  
460  
55  
4700  
600  
75  
pF  
pF  
pF  
2/8  
STW20NB50  
ELECTRICAL CHARACTERISTICS  
(continued)  
SWITCHING ON  
Symbol  
Parameter  
Turn-on Time  
Test Conditions  
VDD = 250 V ID = 10 A  
RG = 4.7 VGS = 10 V  
Min.  
Typ.  
Max.  
Unit  
td(on)  
tr  
32  
15  
43  
21  
ns  
ns  
Rise Time  
(see test circuit, figure 3)  
Qg  
Qgs  
Qgd  
Total Gate Charge  
Gate-Source Charge  
Gate-Drain Charge  
VDD = 400 V ID = 20 A VGS = 10 V  
85  
21  
37  
110  
nC  
nC  
nC  
SWITCHING OFF  
Symbol  
Parameter  
Test Conditions  
Min.  
Typ.  
Max.  
Unit  
tr(Voff)  
tf  
tc  
Off-voltage Rise Time  
Fall Time  
Cross-over Time  
VDD = 400 V ID = 20 A  
20  
25  
47  
27  
33  
62  
ns  
ns  
ns  
RG = 4.7  
VGS = 10 V  
(see test circuit, figure 5)  
SOURCE DRAIN DIODE  
Symbol  
Parameter  
Test Conditions  
Min.  
Typ.  
Max.  
Unit  
ISD  
ISDM ( )  
Source-drain Current  
Source-drain Current  
(pulsed)  
20  
80  
A
A
VSD ( ) Forward On Voltage  
ISD = 20 A VGS = 0  
1.6  
V
trr  
Reverse Recovery  
Time  
Reverse Recovery  
Charge  
700  
9
ns  
ISD = 20 A di/dt = 100 A/ s  
VDD = 100 V  
(see test circuit, figure 5)  
µ
Tj = 150 oC  
Qrr  
C
µ
IRRM  
Reverse Recovery  
Current  
25  
A
( ) Pulsed: Pulse duration = 300 µs, duty cycle 1.5 %  
() Pulse width limited by safe operating area  
Safe Operating Area  
Thermal Impedance  
3/8  
STW20NB50  
Output Characteristics  
Transfer Characteristics  
Transconductance  
Static Drain-source On Resistance  
Gate Charge vs Gate-sourceVoltage  
CapacitanceVariations  
4/8  
STW20NB50  
Normalized Gate Threshold Voltage vs  
Temperature  
Normalized On Resistance vs Temperature  
Source-drainDiode Forward Characteristics  
5/8  
STW20NB50  
Fig. 1:  
Fig. 2:  
Unclamped Inductive Waveform  
Unclamped Inductive Load Test Circuit  
Fig. 3: Switching Times Test Circuits For  
Fig. 4: Gate Charge test Circuit  
Resistive Load  
Fig. 5:  
Test Circuit For InductiveLoad Switching  
And Diode Recovery Times  
6/8  
STW20NB50  
TO-247 MECHANICAL DATA  
mm  
inch  
TYP.  
DIM.  
MIN.  
4.7  
2.2  
0.4  
1
TYP.  
MAX.  
5.3  
MIN.  
0.185  
0.087  
0.016  
0.039  
0.079  
0.118  
MAX.  
0.209  
0.102  
0.031  
0.055  
0.094  
0.134  
A
D
2.6  
E
0.8  
F
1.4  
F3  
F4  
G
2
2.4  
3
3.4  
10.9  
0.429  
H
15.3  
19.7  
14.2  
15.9  
20.3  
14.8  
0.602  
0.776  
0.559  
0.626  
0.779  
0.582  
L
L3  
L4  
L5  
M
34.6  
5.5  
1.362  
0.217  
2
3
0.079  
0.118  
P025P  
7/8  
STW20NB50  
Information furnished is believed to be accurate and reliable. However, STMicroelectronics assumes no responsibility for the consequences  
of use of such information nor for any infringement of patents or other rights of third parites which may result from its use. No license is  
granted by implication or otherwise under any patent or patent rights of STMicroelectronics. Specificationmentioned in this publication are  
subject tochange without notice. This publication supersedes and replaces all informaiton previouslysupplied. STMicroelectronics products  
are not authorized for use as critical components in life support devices or systemswithout express written approval of STMicroelectronics.  
The ST logo is a trademark of STMicroelectronics  
1999 STMicroelectronics – Printed in Italy – All Rights Reserved  
STMicroelectronics GROUP OF COMPANIES  
Australia - Brazil - China - Finland - France - Germany - Hong Kong - India - Italy - Japan - Malaysia - Malta - Morocco -  
Singapore - Spain - Sweden - Switzerland - United Kingdom - U.S.A.  
http://www.st.com  
.
8/8  

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