FPD1050-000 [RFMD]

0.75W POWER pHEMT; 0.75W功率pHEMT制
FPD1050-000
型号: FPD1050-000
厂家: RF MICRO DEVICES    RF MICRO DEVICES
描述:

0.75W POWER pHEMT
0.75W功率pHEMT制

文件: 总4页 (文件大小:260K)
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FPD1050  
0.75W Power  
pHEMT  
FPD1050  
0.75W POWER pHEMT  
Package Style: Bare Die  
Product Description  
Features  
The FPD1050 is an AlGaAs/InGaAs pseudomorphic High Electron Mobility Transis-  
tor (pHEMT), featuring a 0.25μmx1050μm Schottky barrier gate, defined by high-  
resolution stepper-based photolithography. The double recessed gate structure  
minimizes parasitics to optimize performance. The epitaxial structure and process-  
ing have been optimized for reliable high-power applications. The FPD1050 is also  
available in the low-cost plastic SOT89 package.  
„
28.5dBm Linear Output  
Power at 12GHz  
„
„
11dB Power Gain at 12GHz  
14dB Max Stable Gain at  
12GHz  
„
„
41 dBm O  
IP3  
45% Power-Added Efficiency  
Optimum Technology  
Matching® Applied  
Applications  
GaAs HBT  
GaAs MESFET  
InGaP HBT  
SiGe BiCMOS  
Si BiCMOS  
SiGe HBT  
„
Narrowband and Broadband  
High-Performance Amplifiers  
„
„
SATCOM Uplink Transmitters  
PCS/Cellular Low-Voltage  
High-Efficiency Output Ampli-  
fiers  
GaAs pHEMT  
9
Si CMOS  
Si BJT  
„
Medium-Haul Digital Radio  
Transmitters  
GaN HEMT  
InP HBT  
RF MEMS  
LDMOS  
Specification  
Parameter  
Unit  
Condition  
Min.  
27.5  
Typ.  
28.5  
14.0  
11.0  
45  
Max.  
P
Gain Compression  
dBm  
dB  
V
V
V
V
V
=8V, I =50% I  
DS  
1dB  
DS  
DS  
DS  
DS  
DS  
DSS  
DSS  
DSS  
S21/S12 (MSG)  
Power Gain at P  
PAE  
=8V, I =50% I  
DS  
(G  
)
10.0  
dB  
=8V, I =50% I  
DS  
1dB 1dB  
%
=8V, I =50% I , P =P  
DS  
DSS  
DSS  
OUT  
1dB  
OIP  
39  
dBm  
dBm  
mA  
=8V, I =50% I  
DS  
3
41  
Matched for optimal power, tuned for best IP  
3
Saturated Drain-Source Current  
(IDSS)  
260  
325  
385  
V
=1.3V, V =0V  
DS  
GS  
Maximum Drain-Source Current  
(IMAX)  
520  
mA  
V
=1.3V, V +1V  
DS  
GS  
Transconductance (GM)  
280  
15  
ms  
μA  
V
V
V
V
=1.3V, V =0V  
DS  
GS  
DS  
GS  
Gate-Source Leakage Current (IGSO)  
=-5V  
Pinch-Off Voltage (V )  
|1.0|  
|14.0|  
=1.3V, I =1mA  
DS  
P
Gate-Source Breakdown Voltage  
|12.0|  
|14.5|  
V
I
=3mA  
=3mA  
>6V  
GS  
(V  
)
BDGS  
Gate-Drain Breakdown Voltage  
(V  
|16.0|  
45  
V
I
GD  
)
BDGD  
Thermal Resistivity (θJC) *  
*Note: T  
°C/W  
V
DS  
=22°C, RF specifications measured at f=12GHz using CW signal.  
AMBIENT  
RF MICRO DEVICES®, RFMD®, Optimum Technology Matching®, Enabling Wireless Connectivity™, PowerStar®, POLARIS™ TOTAL RADIO™ and UltimateBlue™ are trademarks of RFMD, LLC. BLUETOOTH is a trade-  
mark owned by Bluetooth SIG, Inc., U.S.A. and licensed for use by RFMD. All other trade names, trademarks and registered trademarks are the property of their respective owners. ©2006, RF Micro Devices, Inc.  
7628 Thorndike Road, Greensboro, NC 27409-9421 · For sales or technical  
support, contact RFMD at (+1) 336-678-5570 or sales-support@rfmd.com.  
Rev A0 DS080702 3.0  
1 of 4  
FPD1050  
Absolute Maximum Ratings1  
Parameter  
Caution! ESD sensitive device.  
Rating  
Unit  
Exceeding any one or a combination of the Absolute Maximum Rating conditions may  
cause permanent damage to the device. Extended application of Absolute Maximum  
Rating conditions to the device may reduce device reliability. Specified typical perfor-  
mance or functional operation of the device under Absolute Maximum Rating condi-  
tions is not implied.  
Drain-Source Voltage (V  
2
)
10  
V
DS  
(-3V<V <-0.5V)  
GS  
Gate-Source Voltage (V  
)
-3  
V
GS  
RoHS status based on EUDirective2002/95/EC (at time of this document revision).  
(0V<V <+8V)  
DS  
The information in this publication is believed to be accurate and reliable. However, no  
responsibility is assumed by RF Micro Devices, Inc. ("RFMD") for its use, nor for any  
infringement of patents, or other rights of third parties, resulting from its use. No  
license is granted by implication or otherwise under any patent or patent rights of  
RFMD. RFMD reserves the right to change component circuitry, recommended appli-  
cation circuitry and specifications at any time without prior notice.  
Drain-Source Current (I  
)
I
DSS  
DS  
(For V <2V)  
DS  
Gate Current (I ) (Forward or reverse)  
10  
23  
mA  
G
RF Input Power (P  
)
dBm  
IN  
(Under any acceptable bias state)  
Channel Operating Temperature (T  
)
175  
°C  
°C  
CH  
(Under any acceptable bias state)  
Storage Temperature (T  
)
-65 to 150  
STG  
(Non-Operating Storage)  
3, 4, 5  
3.4  
80  
W
%
Total Power Dissipation (P  
)
TOT  
6
Simultaneous Combination of Limits  
(2 or more max. limits)  
Notes:  
1
T
=22°C unless otherwise noted; exceeding any one of these absolute max-  
AMBIENT  
imum ratings may cause permanent damage to the device.  
2
Operating at absolute maximum V continuously is not recommended. If operation  
D
at 10V is considered then I must be reduced in order to keep the part within  
DS  
its thermal power dissipation limits. Therefore V is restricted to <-0.5V.  
GS  
3
Total Power Dissipation to be de-rated as follows above 22°C: P =3.4-  
TOT  
(0.022W/°C)xT , where T =heatsink or ambient temperature above 22°C.  
HS  
HS  
Example: For a 85°C carrier temperature: P =3.4-(0.022x(85-22))=2.01W  
TOT  
4
Total Power Dissipation (P ) defined as (P +P )–P , where P : DC Bias  
TOT  
DC  
IN  
OUT  
DC  
Power, P : RF Input Power, P : RF Output Power.  
Users should avoid exceeding 80% of 2 or more Limits simultaneously.  
Thermal Resistivity specification assumes a Au/Sn eutectic die attach onto an Au-  
plated copper heatsink or rib.  
IN  
OUT  
5
6
Pad Layout  
Pad  
A
Description  
Gate pad.  
Pin Coordinates (μm)  
130, 220  
380, 220  
B
C
Drain pad.  
Source pad.  
B
A
C
Note: Coordinates are referenced from the bottom left hand  
corner of the die to the center of the bond pad opening.  
Die Size (μm)  
Die Thickness (μm)  
Min. Bond Pad Opening (μmxμm)  
470 x440  
75  
67x 77  
7628 Thorndike Road, Greensboro, NC 27409-9421 · For sales or technical  
support, contact RFMD at (+1) 336-678-5570 or sales-support@rfmd.com.  
2 of 4  
Rev A0 DS080702 3.0  
FPD1050  
Preferred Assembly Instructions  
GaAs devices are fragile and should be handled with great care. Specially designed collets should be used where possible.  
The back of the die is metallized and the recommended mounting method is by the use of conductive epoxy. Epoxy should be  
applied to the attachment surface uniformly and sparingly to avoid encroachment of epoxy on to the top face of the die and  
ideally should not exceed half the chip height. For automated dispense Ablestick LMISR4 is recommended. For manual dis-  
pense Ablestick 84-1 LMI or 84-1 LMIT are recommended. These should be cured at a temperature of 150°C for 1 hour in an  
oven especially set aside for epoxy curing only. If possible, the curing oven should be flushed with dry nitrogen. The gold-tin  
(80% Au 20% Sn) eutectic die attach has a melting point of approximately 280°C but the absolute temperature being used  
depends on the leadframe material used and the particular application. The maximum time should be kept to a minimum.  
This part has gold (Au) bond pads requiring the use of gold (99.99% pure) bondwire. It is recommended that 25.4mm diameter  
gold wire be used. Recommended lead bond technique is thermocompression wedge bonding with 0.001” (25µm) diameter  
wire. Bond force, time stage temperature, and ultrasonics are all critical parameters and the settings are dependant on the  
setup and application being used. Ultrasonic or thermosonic bonding is not recommended.  
Bonds should be made from the die first and then to the mounting substrate or package. The physical length of the bondwires  
should be minimized especially when making RF or ground connections.  
Handling Precautions  
To avoid damage to the devices, care should be exercised during handling. Proper  
Electrostatic Discharge (ESD) precautions should be observed at all stages of storage,  
handling, assembly, and testing.  
ESD/MSL Rating  
These devices should be treated as Class 0 (0V to 250V) using the human body model as defined in JEDEC Standard No. 22-  
A114. Further information on ESD control measures can be found in MIL-STD-1686 and MIL-HDBK-263.  
Application Notes and Design Data  
Application Notes and design data including S-parameters and device model are available on request and from  
www.rfmd.com.  
Reliability  
An MTTF of in excess of 4.2 million hours at a channel temperature of 150°C is achieved for the process used to manufacture  
this device.  
Disclaimers  
This product is not designed for use in any space-based or life-sustaining/supporting equipment.  
Ordering Information  
Delivery Quantity  
Ordering Code  
FPD1050-000  
Standard Order Quantity (waffle-pack)  
Small Quantity (25)  
FPD1050-000SQ  
FPD1050-000S3  
Small Quantity (3)  
7628 Thorndike Road, Greensboro, NC 27409-9421 · For sales or technical  
support, contact RFMD at (+1) 336-678-5570 or sales-support@rfmd.com.  
Rev A0 DS080702 3.0  
3 of 4  
FPD1050  
7628 Thorndike Road, Greensboro, NC 27409-9421 · For sales or technical  
support, contact RFMD at (+1) 336-678-5570 or sales-support@rfmd.com.  
4 of 4  
Rev A0 DS080702 3.0  

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