FPD1500 [RFMD]

1W POWER pHEMT; 1W功率pHEMT制
FPD1500
型号: FPD1500
厂家: RF MICRO DEVICES    RF MICRO DEVICES
描述:

1W POWER pHEMT
1W功率pHEMT制

晶体 晶体管 放大器
文件: 总4页 (文件大小:238K)
中文:  中文翻译
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FPD15001W  
Power pHEMT  
FPD1500  
1W POWER pHEMT  
Package Style: Bare Die  
Product Description  
Features  
The FPD1500 is an AlGaAs/InGaAs pseudomorphic High Electron Mobility Transis-  
tor (pHEMT), featuring a 0.25μmx1500μm Schottky barrier gate, defined by high -  
resolution stepper-based photolithography. The recessed gate structure minimizes  
parasitics to optimize performance. The epitaxial structure and processing have  
been optimized for reliable high-power applications. The FPD1500 is also available  
in the low-cost plastic SOT89 and DFN packages.  
„
29dBm Linear Output Power  
at 12GHz  
„
„
9dB Power Gain at 12GHz  
12.5dB Max Stable Gain at  
12GHz  
„
„
41 dBm O  
IP3  
35% Power-Added Efficiency  
Optimum Technology  
Matching® Applied  
Applications  
GaAs HBT  
GaAs MESFET  
InGaP HBT  
SiGe BiCMOS  
Si BiCMOS  
SiGe HBT  
„
Narrowband and Broadband  
High-Performance Amplifiers  
„
„
SATCOM Uplink Transmitters  
PCS/Cellular Low-Voltage  
High-Efficiency Output Ampli-  
fiers  
GaAs pHEMT  
9
Si CMOS  
Si BJT  
„
Medium-Haul Digital Radio  
Transmitters  
GaN HEMT  
InP HBT  
RF MEMS  
LDMOS  
Specification  
Parameter  
Unit  
Condition  
Min.  
28.5  
11.5  
8.0  
Typ.  
30.0  
12.5  
9.0  
Max.  
Power at P  
Gain Compression  
dBm  
dB  
V
V
V
V
V
=8V, I =50% I  
DS  
1dB  
DS  
DS  
DS  
DS  
DS  
DSS  
DSS  
DSS  
Maximum Stable Gain (S21/S12)  
=8V, I =50% I  
DS  
Power Gain at P  
PAE  
dB  
=8V, I =50% I  
DS  
1dB  
45  
%
=8V, I =50% I , P =P  
DS  
DSS  
DSS  
OUT  
1dB  
OIP from 15dB to 5dB below P  
41  
dBm  
dBm  
mA  
mA  
=8V, I =50% I  
DS  
3
1dB  
43  
Matched for optimal power, tuned for best IP  
3
Saturated Drain-Source Current (I  
Maximum Drain-Source Current  
)
375  
465  
750  
550  
V
V
=1.3V, V =0V  
DSS  
DS  
DS  
GS  
=1.3V, V +1V  
GS  
(I  
)
MAX  
Transconductance  
400  
1
ms  
μA  
V
V
V
V
=1.3V, V =0 V  
DS  
GS  
DS  
GS  
Gate-Source Leakage Current (I  
)
15  
=-5V  
GSO  
Pinch-Off Voltage (V )  
|0.7|  
|1.0|  
|14.0|  
|1.3|  
=1.3V, I =1.5mA  
DS  
P
Gate-Source Breakdown Voltage  
(V  
|12.0|  
V
I
=1.5mA  
=1.5mA  
>6V  
GS  
)
BDGS  
Gate-Drain Breakdown Voltage  
(V  
|14.5|  
|16.0|  
42  
V
I
GD  
)
BDGD  
Thermal Resistivity (θJC) *  
Note: T  
°C/W  
V
DS  
=22°C, RF specifications measured at f=12GHz using CW signal.  
AMBIENT  
RF MICRO DEVICES®, RFMD®, Optimum Technology Matching®, Enabling Wireless Connectivity™, PowerStar®, POLARIS™ TOTAL RADIO™ and UltimateBlue™ are trademarks of RFMD, LLC. BLUETOOTH is a trade-  
mark owned by Bluetooth SIG, Inc., U.S.A. and licensed for use by RFMD. All other trade names, trademarks and registered trademarks are the property of their respective owners. ©2006, RF Micro Devices, Inc.  
7628 Thorndike Road, Greensboro, NC 27409-9421 · For sales or technical  
support, contact RFMD at (+1) 336-678-5570 or sales-support@rfmd.com.  
Rev A1 DS090612  
1 of 4  
FPD1500  
Absolute Maximum Ratings1  
Parameter  
Caution! ESD sensitive device.  
Rating  
Unit  
Exceeding any one or a combination of the Absolute Maximum Rating conditions may  
cause permanent damage to the device. Extended application of Absolute Maximum  
Rating conditions to the device may reduce device reliability. Specified typical perfor-  
mance or functional operation of the device under Absolute Maximum Rating condi-  
tions is not implied.  
Drain-Source Voltage (V  
2
)
10  
V
DS  
(-3V<V <-0.5V)  
GS  
Gate-Source Voltage (V  
)
-3  
V
GS  
RoHS status based on EUDirective2002/95/EC (at time of this document revision).  
(0V<V <+8V)  
DS  
The information in this publication is believed to be accurate and reliable. However, no  
responsibility is assumed by RF Micro Devices, Inc. ("RFMD") for its use, nor for any  
infringement of patents, or other rights of third parties, resulting from its use. No  
license is granted by implication or otherwise under any patent or patent rights of  
RFMD. RFMD reserves the right to change component circuitry, recommended appli-  
cation circuitry and specifications at any time without prior notice.  
Drain-Source Current (I  
)
I
DS  
DSS  
15  
25  
(For V <2V)  
DS  
Gate Current  
mA  
(Forward or reverse current)  
RF Input Power (P  
)
dBm  
IN  
(Under any acceptable bias state)  
Channel Operating Temperature (T  
)
175  
°C  
°C  
CH  
(Under any acceptable bias state)  
Storage Temperature (T  
)
-65 to 150  
STG  
(Non-Operating Storage)  
3, 4, 5  
3.6  
80  
W
%
Total Power Dissipation (P  
)
TOT  
6
Simultaneous Combination of Limits  
(2 or more max. limits)  
Notes:  
1
T
=22°C unless otherwise noted; exceeding any one of these absolute max-  
AMBIENT  
imum ratings may cause permanent damage to the device.  
2
Operating at absolute maximum V continuously is not recommended. If operation  
D
at 10V is considered then I must be reduced in order to keep the part within  
DS  
its thermal power dissipation limits. Therefore V is restricted to <-0.5V.  
GS  
3
Total Power Dissipation to be de-rated as follows above 22°C: P =3.6-  
TOT  
(0.024W/°C)xT , where T =heatsink or ambient temperature above 22°C.  
HS  
HS  
Example: For a 85°C carrier temperature: P =3.6-(0.024x(85-22))=2.09W  
TOT  
4
Total Power Dissipation (P ) defined as (P +P )–P , where P : DC Bias  
TOT  
DC  
IN  
OUT  
DC  
Power, P : RF Input Power, P : RF Output Power.  
IN  
OUT  
5
6
Users should avoid exceeding 80% of 2 or more Limits simultaneously.  
Thermal Resistivity specification assumes a Au/Sn eutectic die attach onto an Au-  
plated copper heatsink or rib.  
Pad Layout  
Pad  
A1  
A2  
B1  
B2  
C
Description  
Gate Pad  
Gate Pad  
Drain Pad  
Drain Pad  
Source Pad  
Pin Coordinates (μm)  
130, 330  
130, 190  
390, 330  
390, 190  
Note: Coordinates are referenced from the bottom left hand  
corner of the die to the center of the bond pad opening.  
Die Size (μm)  
Die Thickness (μm)  
Min. Bond Pad Opening (μmxμm)  
470x530  
75  
64x77  
7628 Thorndike Road, Greensboro, NC 27409-9421 · For sales or technical  
support, contact RFMD at (+1) 336-678-5570 or sales-support@rfmd.com.  
2 of 4  
Rev A1 DS090612  
FPD1500  
Preferred Assembly Instructions  
GaAs devices are fragile and should be handled with great care. Specially designed collets should be used where possible.  
The back of the die is metallized and the recommended mounting method is by the use of conductive epoxy. Epoxy should be  
applied to the attachment surface uniformly and sparingly to avoid encroachment of epoxy onto the top face of the die. Ideally  
it should not exceed half the chip height. For automated dispense Ablestick LMISR4 is recommended and for manual dispense  
Ablestick 84-1 LMI or 84-1 LMIT are recommended. These should be cured at a temperature of 150°C for one hour in an oven  
especially set aside for epoxy curing only. If possible the curing oven should be flushed with dry nitrogen. The gold-tin (80% Au  
20% Sn) eutectic die attach has a melting point of approximately 280°C but the absolute temperature being used depends on  
the leadframe material used and the particular application. The maximum time at used should be kept to a minimum.  
This part has gold (Au) bond pads requiring the use of gold (99.99% pure) bondwire. It is recommended that 25.4mm diameter  
gold wire be used. Recommended lead bond technique is thermocompression wedge bonding with 0.001” (25µm) diameter  
wire. Bond force, time stage temperature and ultrasonics are all critical parameters and the settings are dependent on the  
setup being used and application. Ultrasonic or thermosonic bonding is not recommended.  
Bonds should be made from the die first and then to the mounting substrate or package. The physical length of the bondwires  
should be minimized especially when making RF or ground connections.  
Handling Precautions  
To avoid damage to the devices, care should be exercised during handling. Proper Electro-  
static Discharge (ESD) precautions should be observed at all stages of storage, handling,  
assembly, and testing.  
ESD/MSL Rating  
These devices should be treated as Class 0 (0V to 250V) using the human body model as defined in JEDEC Standard No. 22-  
A114. Further information on ESD control measures can be found in MIL-STD-1686 and MIL-HDBK-263. This is an unpackaged  
part and therefore no MSL rating applies.  
Application Notes and Design Data  
Application Notes and design data including S-parameters, noise paramters, and device model are available on request from  
www.rfmd.com.  
Reliability  
An MTTF of 4.2 million hours at a channel temperature of 150°C is achieved for the process used to manufacture this device.  
Disclaimers  
This product is not designed for use in any space-based or life-sustaining/supporting equipment.  
Ordering Information  
Delivery Quantity  
Full Pack (100)  
Ordering Code  
FPD1500-000  
Small Quantity (25)  
Sample Quantity (3)  
FPD1500-000SQ  
FPD1500-000S3  
7628 Thorndike Road, Greensboro, NC 27409-9421 · For sales or technical  
support, contact RFMD at (+1) 336-678-5570 or sales-support@rfmd.com.  
Rev A1 DS090612  
3 of 4  
FPD1500  
7628 Thorndike Road, Greensboro, NC 27409-9421 · For sales or technical  
support, contact RFMD at (+1) 336-678-5570 or sales-support@rfmd.com.  
4 of 4  
Rev A1 DS090612  

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