APT25GN120S [MICROSEMI]

Utilizing the latest Field Stop and Trench Gate technologies; 利用最新的场站和沟槽栅技术
APT25GN120S
型号: APT25GN120S
厂家: Microsemi    Microsemi
描述:

Utilizing the latest Field Stop and Trench Gate technologies
利用最新的场站和沟槽栅技术

晶体 晶体管 功率控制 双极性晶体管 栅
文件: 总6页 (文件大小:149K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
1200V  
APT25GN120B  
APT25GN120S  
APT25GN120BG* APT25GN120SG*  
*G Denotes RoHS Compliant, Pb Free Terminal Finish.  
Utilizing the latest Field Stop and Trench Gate technologies, these IGBT's have ultra  
low VCE(ON) and are ideal for low frequency applications that require absolute minimum  
conduction loss. Easy paralleling is a result of very tight parameter distribution and  
a slightly positive VCE(ON) temperature coefficient. A built-in gate resistor ensures  
extremely reliable operation, even in the event of a short circuit fault. Low gate charge  
simplifies gate drive design and minimizes losses.  
(B)  
D3PAK  
(S)  
C
E
G
G
C
E
1200V Field Stop  
• Trench Gate: Low VCE(on)  
• Easy Paralleling  
• Integrated Gate Resistor: Low EMI, High Reliability  
C
E
G
Applications:Welding, Inductive Heating, Solar Inverters, SMPS, Motor drives, UPS  
MAXIMUM RATINGS  
All Ratings: T = 25°C unless otherwise specified.  
C
Parameter  
Symbol  
APT25GN120B(G)  
UNIT  
VCES  
Collector-Emitter Voltage  
1200  
Volts  
VGE  
IC1  
Gate-Emitter Voltage  
±±0  
67  
Continuous Collector Current @ TC = 25°C  
Continuous Collector Current @ TC = 110°C  
IC2  
±±  
Amps  
1
Pulsed Collector Current  
ICM  
75  
Switching Safe Operating Area @ TJ = 150°C  
75A @ 1200V  
272  
SSOA  
PD  
Total Power Dissipation  
Watts  
°C  
TJ,TSTG  
Operating and Storage Junction Temperature Range  
-55 to 150  
±00  
TL  
Max. Lead Temp. for Soldering: 0.06±" from Case for 10 Sec.  
STATIC ELECTRICAL CHARACTERISTICS  
Symbol Characteristic / Test Conditions  
MIN  
TYP  
MAX  
Units  
V(BR)CES  
1200  
5
Collector-Emitter Breakdown Voltage (VGE = 0V, IC = 150µA)  
VGE(TH)  
5.8  
1.7  
1.9  
6.5  
2.1  
Gate Threshold Voltage (VCE = VGE, IC = 1mA, Tj = 25°C)  
Collector-Emitter On Voltage (VGE = 15V, IC = 25A, Tj = 25°C)  
Collector-Emitter On Voltage (VGE = 15V, IC = 25A, Tj = 125°C)  
Volts  
1.4  
VCE(ON)  
2
Collector Cut-off Current (VCE = 1200V, VGE = 0V, Tj = 25°C)  
100  
TBD  
600  
ICES  
µA  
2
Collector Cut-off Current (VCE = 1200V, VGE = 0V, Tj = 125°C)  
Gate-Emitter Leakage Current (VGE = ±20V)  
Integrated Gate Resistor  
IGES  
nA  
RG(int)  
8
Ω
CAUTION: These Devices are Sensitive to Electrostatic Discharge. Proper Handling Procedures Should Be Followed.  
Microsemi Website - http://www.microsemi.com  
APT25GN120B_S(G)  
DYNAMIC CHARACTERISTICS  
Test Conditions  
Capacitance  
Characteristic  
Symbol  
Cies  
MIN  
TYP  
1800  
105  
85  
MAX  
UNIT  
Input Capacitance  
Coes  
Cres  
Output Capacitance  
pF  
V
GE = 0V, VCE = 25V  
f = 1 MHz  
Reverse Transfer Capacitance  
Gate-to-Emitter Plateau Voltage  
VGEP  
Qg  
9.5  
V
Gate Charge  
±
V
GE = 15V  
155  
10  
Total Gate Charge  
VCE = 600V  
IC = 25A  
Qge  
Qgc  
Gate-Emitter Charge  
nC  
Gate-Collector ("Miller") Charge  
85  
TJ = 150°C, RG = 4.±Ω 7, VGE  
=
75  
SSOA  
Switching Safe Operating Area  
A
15V, L = 100µH,VCE = 1200V  
td(on)  
tr  
td(off)  
tf  
Inductive Switching (25°C)  
22  
17  
Turn-on Delay Time  
Current Rise Time  
Turn-off Delay Time  
Current Fall Time  
VCC = 800V  
VGE = 15V  
IC = 25A  
ns  
280  
1±5  
TBD  
1490  
2150  
22  
RG = 1.0Ω 7  
4
Eon1  
Eon2  
Eoff  
td(on)  
tr  
Turn-on Switching Energy  
TJ = +25°C  
5
mJ  
ns  
Turn-on Switching Energy (Diode)  
6
Turn-off Switching Energy  
Inductive Switching (125°C)  
Turn-on Delay Time  
Current Rise Time  
Turn-off Delay Time  
VCC = 800V  
17  
td(off)  
tf  
VGE = 15V  
±±5  
225  
IC = 25A  
RG = 1.0Ω 7  
TJ = +125°C  
Current Fall Time  
4 4  
Eon1  
Eon2  
Eoff  
TBD  
2±90  
±075  
Turn-on Switching Energy  
55  
mJ  
Turn-on Switching Energy (Diode)  
66  
Turn-off Switching Energy  
THERMAL AND MECHANICAL CHARACTERISTICS  
Symbol  
Characteristic  
UNIT  
MIN  
TYP  
MAX  
.46  
R
Junction to Case (IGBT)  
Junction to Case (DIODE)  
Package Weight  
θJC  
°C/W  
gm  
R
N/A  
θJC  
WT  
5.9  
1
2
±
4
Repetitive Rating: Pulse width limited by maximum junction temperature.  
For Combi devices, Ices includes both IGBT and FRED leakages  
See MIL-STD-750 Method ±471.  
Eon1 is the clamped inductive turn-on energy of the IGBT only, without the effect of a commutating diode reverse recovery current  
adding to the IGBT turn-on loss. Tested in inductive switching test circuit shown in figure 21, but with a Silicon Carbide diode.  
5
Eon2 is the clamped inductive turn-on energy that includes a commutating diode reverse recovery current in the IGBT turn-on switching  
loss. (See Figures 21, 22.)  
6
7
Eoff is the clamped inductive turn-off energy measured in accordance with JEDEC standard JESD24-1. (See Figures 21, 2±.)  
RG is external gate resistance, not including RG(int) nor gate driver impedance. (MIC4452)  
Microsemi Reserves the right to change, without notice, the specifications and information contained herein.  
TYPICAL PERFORMANCE CURVES  
APT25GN120B_S(G)  
80  
70  
60  
50  
40  
±0  
20  
80  
15V  
15V  
70  
12V  
60  
50  
12V  
11V  
10V  
11V  
40  
10V  
±0  
9V  
8V  
9V  
20  
8V  
7V  
10  
0
10  
0
7V  
10  
, COLLECTER-TO-EMITTER VOLTAGE (V)  
0
V
5
15  
0
V
5
10  
15  
, COLLECTER-TO-EMITTER VOLTAGE (V)  
CE  
CE  
FIGURE 1, Output Characteristics(T = 25°C)  
FIGURE 2, Output Characteristics (T = 125°C)  
J
J
16  
14  
12  
75  
250µs PULSE  
TEST<0.5 % DUTY  
CYCLE  
I
T
= 25A  
= 25°C  
C
J
60  
45  
±0  
V
V
= 240V  
= 600V  
CE  
TJ = 125°C  
CE  
10  
8
V
= 960V  
CE  
TJ = 25°C  
6
TJ = -55°C  
4
15  
0
2
0
0
2
4
6
8
10  
12  
14  
0
20 40 60 80 100 120 140 160 180  
GATE CHARGE (nC)  
V
, GATE-TO-EMITTER VOLTAGE (V)  
GE  
FIGURE 3, Transfer Characteristics  
FIGURE 4, Gate Charge  
4
±.5  
±
±
2.5  
2
TJ = 25°C.  
250µs PULSE TEST  
<0.5 % DUTY CYCLE  
I
= 50A  
C
I
= 50A  
C
2.5  
2
I
= 25A  
C
I
= 25A  
C
1.5  
1
I
= 12.5A  
1.5  
C
I
= 12.5A  
C
1.0  
0.5  
0
0.5  
0
VGE = 15V.  
250µs PULSE TEST  
<0.5 % DUTY CYCLE  
8
10  
12  
14  
16  
-50 -25  
0
25  
50  
75 100 125  
V
, GATE-TO-EMITTER VOLTAGE (V)  
T , Junction Temperature (°C)  
GE  
J
FIGURE 5, On State Voltage vs Gate-to- Emitter Voltage  
FIGURE 6, On State Voltage vs Junction Temperature  
90  
1.10  
80  
70  
60  
50  
40  
±0  
20  
1.05  
1.00  
0.95  
0.90  
10  
0
-50 -25  
0
25  
50  
75  
100 125  
-50 -25  
0
25 50 75 100 125 150  
T , JUNCTION TEMPERATURE (°C)  
T , CASE TEMPERATURE (°C)  
J
C
FIGURE 7, Breakdown Voltage vs. Junction Temperature  
FIGURE 8, DC Collector Current vs Case Temperature  
APT25GN120B_S(G)  
±50  
±00  
250  
200  
150  
100  
50  
±0  
25  
20  
15  
10  
VGE =15V,TJ=125°C  
V
= 15V  
GE  
VGE =15V,TJ=25°C  
VCE = 800V  
TJ = 25°C, or 125°C  
5
0
VCE = 800V  
RG = 4.±Ω  
L = 100µH  
R
G = 4.±Ω  
L = 100µH  
0
10 15 20 25 ±0 ±5 40 45 50 55  
, COLLECTOR TO EMITTER CURRENT (A)  
10  
20  
±0  
40  
50  
60  
I
I
, COLLECTOR TO EMITTER CURRENT (A)  
CE  
CE  
FIGURE 9,Turn-On Delay Time vs Collector Current  
FIGURE 10,Turn-Off Delay Time vs Collector Current  
45  
±00  
R
G = 4.±Ω, L = 100µH, VCE = 800V  
RG = 4.±Ω, L = 100µH, VCE = 800V  
40  
±5  
±0  
25  
20  
15  
10  
5
250  
200  
150  
100  
50  
T
J = 125°C, VGE = 15V  
T
J = 25°C, VGE = 15V  
T
J = 25 or 125°C,VGE = 15V  
0
0
10 15 20 25 ±0 ±5 40 45 50 55  
10 15 20 25 ±0 ±5 40  
45 50 55  
I
, COLLECTOR TO EMITTER CURRENT (A)  
I
, COLLECTOR TO EMITTER CURRENT (A)  
CE  
CE  
FIGURE 11, Current Rise Time vs Collector Current  
FIGURE 12, Current Fall Time vs Collector Current  
7000  
6000  
5000  
4000  
±000  
2000  
7000  
6000  
5000  
4000  
±000  
2000  
V
V
R
=
=
800V  
+15V  
V
V
R
=
=
800V  
+15V  
CE  
GE  
CE  
GE  
= 4.±Ω  
= 4.±Ω  
G
G
T
J = 125°C  
T
J = 125°C  
T
J = 25°C  
1000  
0
1000  
0
T
J = 25°C  
10 15 20 25 ±0 ±5 40 45 50 55  
, COLLECTOR TO EMITTER CURRENT (A)  
10 15 20 25 ±0 ±5 40 45 50 55  
, COLLECTOR TO EMITTER CURRENT (A)  
I
I
CE  
CE  
FIGURE 13,Turn-On Energy Loss vs Collector Current  
FIGURE 14, Turn Off Energy Loss vs Collector Current  
14000  
12000  
10000  
8000  
7000  
V
V
T
=
=
800V  
+15V  
V
V
R
=
=
800V  
+15V  
CE  
GE  
CE  
GE  
E
50A  
off,  
E
50A  
= 125°C  
= 4.±Ω  
on2,  
J
6000  
5000  
4000  
±000  
2000  
G
E
50A  
off,  
E
50A  
25A  
on2,  
6000  
E
off,  
4000  
E
25A  
E
25A  
off,  
on2,  
E
12.5A  
E
E
12.5A  
12.5A  
E
25A  
20  
off,  
off,  
on2,  
2000  
0
1000  
0
E
12.5A  
on2,  
on2,  
40  
0
10  
±0  
50  
0
25  
50  
75  
100  
125  
R , GATE RESISTANCE (OHMS)  
T , JUNCTION TEMPERATURE (°C)  
G
J
FIGURE 15, Switching Energy Losses vs. Gate Resistance  
FIGURE 16, Switching Energy Losses vs Junction Temperature  
TYPICAL PERFORMANCE CURVES  
APT25GN120B_S(G)  
80  
70  
60  
50  
40  
±0  
20  
4,000  
Cies  
1,000  
500  
Coes  
Cres  
100  
50  
10  
0
10  
0
10  
20  
±0  
40  
50  
0
200 400 600 800 1000 1200 1400  
V , COLLECTOR TO EMITTER VOLTAGE  
CE  
V
, COLLECTOR-TO-EMITTER VOLTAGE (VOLTS)  
CE  
Figure 17, Capacitance vs Collector-To-Emitter Voltage  
Figure 18,Minimim Switching Safe Operating Area  
0.50  
D = 0.9  
0.40  
0.7  
0.±0  
0.5  
Note:  
0.20  
t
1
0.±  
t
2
0.10  
SINGLE PULSE  
t
1
t
/
2
Duty Factor D =  
Peak T = P x Z  
0.1  
+ T  
C
J
DM  
θJC  
0.05  
0
10-5  
10-4  
10-±  
10-2  
10-1  
1.0  
RECTANGULAR PULSE DURATION (SECONDS)  
Figure 19a, Maximum Effective Transient Thermal Impedance, Junction-To-Case vs Pulse Duration  
140  
100  
50  
Fmax = min (fmax, fmax2  
)
RC MODEL  
0.05  
Junction  
temp. (°C)  
fmax1  
=
t d(on) + tr + td(off) + tf  
0.05±6  
0.169  
0.00826  
0.±5±  
Pdiss - Pcond  
Eon2 + E off  
fmax2  
=
Power  
(watts)  
T
T
=
125°C  
75°C  
J
=
C
D = 50 %  
V
R
TJ - T C  
R θJC  
= 800V  
Pdiss  
=
CE  
= 4.±Ω  
G
10  
Case temperature. (°C)  
5
10 15 20 25  
±0 ±5 40 45  
I , COLLECTOR CURRENT (A)  
C
Figure 20, Operating Frequency vs Collector Current  
FIGURE 19b, TRANSIENT THERMAL IMPEDANCE MODEL  
APT25GN120B_S(G)  
Gate Voltage  
10%  
td(on)  
APT±0DQ120  
T
= 125°C  
J
90%  
VCE  
IC  
VCC  
tr  
Collector Current  
CollectorVoltage  
5%  
10%  
5%  
A
Switching Energy  
D.U.T.  
Figure 22,Turn-on Switching Waveforms and Definitions  
Figure 21, Inductive Switching Test Circuit  
90%  
Gate Voltage  
T
= 125°C  
J
CollectorVoltage  
td(off)  
90%  
tf  
10%  
0
Collector Current  
Switching Energy  
Figure 23,Turn-off Switching Waveforms and Definitions  
D3PAKPackageOutline  
TO-247 Package Outline  
e1 SAC: Tin, Silver, Copper  
e± 100% Sn Plated  
4.98 (.196)  
5.08 (.200)  
1.47 (.058)  
1.57 (.062)  
4.69 (.185)  
15.95 (.628)  
16.05(.6±2)  
1±.41 (.528)  
1±.51(.5±2)  
5.±1 (.209)  
15.49 (.610)  
16.26 (.640)  
1.04 (.041)  
1.15(.045)  
1.49 (.059)  
2.49 (.098)  
5.±8 (.212)  
6.20 (.244)  
6.15 (.242) BSC  
Revised  
8/29/97  
11.51 (.45±)  
11.61 (.457)  
1±.79 (.54±)  
1±.99(.551)  
20.80 (.819)  
21.46 (.845)  
±.50 (.1±8)  
±.81 (.150)  
0.46 (.018)  
0.56 (.022)  
{± Plcs}  
1.27 (.050)  
1.40 (.055)  
0.020 (.001)  
0.178 (.007)  
2.87 (.11±)  
±.12 (.12±)  
±.81 (.150)  
4.50 (.177) Max.  
1.98 (.078)  
2.08 (.082)  
4.06 (.160)  
2.67 (.105)  
2.84 (.112)  
(Base of Lead)  
1.65 (.065)  
2.1± (.084)  
1.22 (.048)  
1.±2 (.052)  
0.40 (.016)  
0.79 (.0±1)  
19.81 (.780)  
20.±2 (.800)  
Heat Sink (Collector)  
and Leads are Plated  
5.45 (.215) BSC  
{2 Plcs.}  
1.01 (.040)  
1.40 (.055)  
Gate  
Collector  
Emitter  
Emitter  
Collector  
Gate  
Dimensions in Millimeters (Inches)  
2.21 (.087)  
2.59 (.102)  
5.45 (.215) BSC  
2-Plcs.  
Dimensions in Millimeters and (Inches)  
Microsemi’s products are covered by one or more of U.S. patents 4,895,810 5,045,903 5,089,434 5,182,234 5,019,522 5,262,336 6,503,786 5,256,583  
4,748,103 5,283,202 5,231,474 5,434,095 5,528,058 6,939,743, 7,352,045 5,283,201 5,801,417 5,648,283 7,196,634 6,664,594 7,157,886 6,939,743 7,342,262  
and foreign patents. US and Foreign patents pending. All Rights Reserved.  

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