Q62702-A1277 [INFINEON]

Silicon Switching Diode Array (For high-speed switching applications Connected in series Internal galvanic isolated Diodes in one package); 硅开关二极管阵列(串联连接的内部电流隔离二极管在一个封装的高速开关应用)
Q62702-A1277
型号: Q62702-A1277
厂家: Infineon    Infineon
描述:

Silicon Switching Diode Array (For high-speed switching applications Connected in series Internal galvanic isolated Diodes in one package)
硅开关二极管阵列(串联连接的内部电流隔离二极管在一个封装的高速开关应用)

二极管 开关
文件: 总4页 (文件大小:45K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
BAV 99S  
Silicon Switching Diode Array  
4
For high-speed switching applications  
Connected in series  
5
6
Internal (galvanic) isolated Diodes  
in one package  
3
2
VPS05604  
1
Type  
Marking Ordering Code  
A7s Q62702-A1277  
Pin Configuration  
Package  
BAV 99S  
1/4 = A1 2/5 = C2 3/6=C1/A2 SOT-363  
Maximum Ratings  
Parameter  
Symbol  
Value  
70  
Unit  
Diode reverse voltage  
Peak reverse voltage  
Forward current  
V
V
V
R
70  
RM  
I
I
200  
mA  
A
F
Surge forward current, t = 1 µs  
4.5  
FS  
Total power dissipation, T = 85 °C  
P
T
T
250  
mW  
°C  
S
tot  
j
Junction temperature  
Storage temperature  
150  
65 ...+150  
stg  
Thermal Resistance  
1)  
Junction - ambient  
R
R
530  
260  
K/W  
thJA  
thJS  
Junction - soldering point  
2
1) Package mounted on epoxy pcb 40mm x 40mm x 1.5mm / 0.5cm Cu  
Semiconductor Group  
1
Apr-27-1998  
1998-11-01  
Semiconductor Group  
1
BAV 99S  
Electrical Characteristics at T = 25°C, unless otherwise specified.  
A
Parameter  
Symbol  
Values  
typ. max.  
Unit  
min.  
DC characteristics  
Breakdown voltage  
V
V
70  
-
-
V
(BR)  
F
I
= 100 µA  
(BR)  
Forward voltage  
I = 1 mA  
mV  
-
-
-
-
-
715  
855  
F
I = 10 mA  
-
-
-
F
I = 50 mA  
1000  
1250  
F
I = 150 mA  
F
Reverse current  
I
I
-
-
2.5 µA  
R
V = 70 V  
R
Reverse current  
nA  
R
V = 25 V, T = 150 °C  
-
-
-
-
30  
50  
R
A
V = 70 V, T = 150 °C  
R
A
AC characteristics  
Diode capacitance  
C
-
-
-
1.5 pF  
D
V = 0 V, f = 1 MHz  
R
Reverse recovery time  
t
-
6
ns  
rr  
I = 10 mA, I = 10 mA, R = 100 ,  
F
R
L
measured at I = 1mA  
R
Test circuit for reverse recovery time  
D.U.T.  
Oscillograph  
ΙF  
EHN00019  
Pulse generator: t = 100ns, D = 0.05,  
Oscillograph: R = 50, t = 0.35ns,  
p
r
t = 0.6ns, R = 50Ω  
C 1pF  
r
i
Semiconductor Group  
Semiconductor Group  
2
Apr-27-1998  
1998-11-01  
2
BAV 99S  
Forward current I = f (T *;T )  
Forward current I = f V )  
F
A
S
F
F
* Package mounted on epoxy  
T = 25°C  
A
BAV 99  
EHB00076  
300  
150  
mA  
1
Ι F  
mA  
I
F
200  
150  
100  
50  
100  
50  
0
T
S
typ  
max  
T
A
0
°C  
0
20  
40  
60  
80  
100 120  
150  
0
0.5  
1.0  
V
1.5  
T ,T  
A
S
VF  
Permissible Pulse Load R  
= f(t )  
Permissible Pulse Load  
thJS  
p
I
/ I  
= f(t )  
Fmax FDC  
p
10 2  
10 3  
K/W  
-
I
R
thJS  
10 2  
D = 0  
0.005  
0.01  
0.02  
0.05  
0.1  
I
10 1  
0.5  
0.2  
0.1  
0.05  
0.02  
0.01  
0.005  
D = 0  
0.2  
0.5  
10 1  
10 0  
10 -6  
10 0  
10 -5  
10 -4  
10 -3  
10 -2  
10 0  
10 -6  
10 -5  
10 -4  
10 -3  
10 -2  
10 0  
s
s
t
p
t
p
Semiconductor Group  
Semiconductor Group  
3
Apr-27-1998  
1998-11-01  
3
BAV 99S  
Forward voltage V = f (T )  
Reverse current I = f (T )  
F
A
R
A
BAV 99  
EHB00078  
BAV 99  
EHB00075  
105  
nA  
1.0  
V
VF  
Ι R  
Ι F  
= 100 mA  
VR = 70 V  
104  
5
max.  
10 mA  
1 mA  
70V  
103  
5
0.5  
0.1 mA  
25 V  
typ.  
50  
102  
5
0
101  
0
50  
100  
150  
0
100  
150  
C
C
TA  
TA  
Semiconductor Group  
Semiconductor Group  
4
Apr-27-1998  
1998-11-01  
4

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