Q62702-A1473 [INFINEON]

Silicon PIN Diode Array (Surge protection device Two PIN diodes, series configuration); 硅PIN二极管阵列(电涌保护器两个PIN二极管系列配置)
Q62702-A1473
型号: Q62702-A1473
厂家: Infineon    Infineon
描述:

Silicon PIN Diode Array (Surge protection device Two PIN diodes, series configuration)
硅PIN二极管阵列(电涌保护器两个PIN二极管系列配置)

二极管
文件: 总5页 (文件大小:56K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
GaAlAs-IR-Lumineszenzdiode in SMT-Gehäuse  
GaAlAs Infrared Emitter in SMT Package  
SFH 421  
SFH 426  
3.0  
2.1  
2.6  
1.7  
2.3  
2.1  
0.1 (typ)  
0.9  
0.7  
0.8  
0.6  
0.18  
0.12  
0.6  
0.4  
Cathode/Collector marking  
SFH 421 TOPLED  
Cathode/Collector  
Approx. weight 0.03 g  
(2.4)  
GPL06724  
(2.85)  
1.1  
0.9  
2.54  
spacing  
Cathode/  
Collector  
Anode/  
Emitter  
GPL06880  
Collector/Cathode marking  
(R1)  
SFH 426 SIDELED  
4.2  
3.8  
Maβe in mm, wenn nicht anders angegeben/Dimensions in mm, unless otherwise specified.  
Wesentliche Merkmale  
Features  
GaAIAs-LED mit sehr hohem Wirkungsgrad  
Gute Linearität (Ie = f [IF]) bei hohen Strömen  
Gleichstrom- (mit Modulation) oder  
Impulsbetrieb möglich  
Very highly efficient GaAIAs-LED  
Good Linearity (Ie = f [IF]) at high currents  
DC (with modulation) or pulsed operations  
are possible  
Hohe Zuverlässigkeit  
High reliability  
Hohe Impulsbelastbarkeit  
Oberflächenmontage geeignet  
Gegurtet lieferbar  
High pulse handling capability  
Suitable for surface mounting (SMT)  
Available on tape and reel  
SFH 421 Gehäusegleich mit SFH 320/420  
SFH 426 Gehäusegleich mit SFH 325/425  
SFH 421 same package as SFH 320/420  
SFH 426 same package as SFH 325/425  
SFH 426: Nur für IR-Reflow-Lötung geeignet. SFH 426: Suitable only for IR-reflow  
Bei Schwallötung wenden Sie sich bitte an uns.  
soldering. In case of dip soldering, please  
contact us first.  
Semiconductor Group  
1
1997-11-01  
SFH 421  
SFH 426  
Applications  
Anwendungen  
Miniature photointerrupters  
Industrial electronics  
For drive and control circuits  
Miniaturlichtschranken für Gleich- und  
Wechsellichtbetrieb, Lochstreifenlaser  
Industrieelektronik  
“Messen/Steuern/Regeln”  
Typ  
Type  
Bestellnummer  
Ordering Code  
Gehäuse  
Package  
Kathodenkennzeichnung: abgesetzte Ecke  
cathode marking: bevelled edge  
TOPLED  
SFH 421  
SFH 426  
Q62702-P1055  
Q62703-P0331  
SIDELED  
Grenzwerte (TA = 25 °C)  
Maximum Ratings  
Bezeichnung  
Description  
Symbol  
Symbol  
Wert  
Value  
Einheit  
Unit  
Betriebs- und Lagertemperatur  
Top; Tstg  
– 55 ... + 100  
°C  
Operating and storage temperature range  
Sperrschichttemperatur  
Junction temperature  
Tj  
100  
5
°C  
Sperrspannung  
Reverse voltage  
VR  
V
Durchlaβstrom  
Forward current  
IF  
100  
2.5  
180  
450  
mA  
A
Stoβstrom, τ = 10 µs, D = 0  
Surge current  
IFSM  
Ptot  
Verlustleistung  
Power dissipation  
mW  
K/W  
Wärmewiderstand Sperrschicht - Umgebung bei  
Montage auf FR4 Platine, Padgröße je 16 mm2  
Thermal resistance junction - ambient mounted on  
PC-board (FR4), padsize 16 mm2 each  
Wärmewiderstand Sperrschicht - Lötstelle bei  
Montage auf Metall-Block  
RthJA  
RthJS  
200  
K/W  
Thermal resistance junction - soldering point,  
mounted on metal block  
Semiconductor Group  
2
1997-11-01  
SFH 421  
SFH 426  
Kennwerte (TA = 25 °C)  
Characteristics  
Bezeichnung  
Description  
Symbol  
Symbol  
Wert  
Value  
Einheit  
Unit  
Wellenlänge der Strahlung  
Wavelength at peak emission  
IF = 100 mA, tp = 20 ms  
λpeak  
880  
nm  
Spektrale Bandbreite bei 50% von Imax  
Spectral bandwidth at 50% of Imax  
IF = 100 mA  
∆λ  
80  
nm  
Abstrahlwinkel  
Half angle  
ϕ
± 60  
Grad  
deg.  
2
Aktive Chipfläche  
Active chip area  
0.16  
mm  
A
Abmessungen der aktiven Chipfläche  
Dimension of the active chip area  
L × B  
L ×W  
0.4 × 0.4  
0.5  
mm  
Schaltzeiten, Ie von 10 % auf 90 % und von  
90 % auf 10 %, bei IF = 100 mA, RL = 50 Ω  
Switching times, Ie from 10 % to 90 % and  
from 90 % to 10 %, IF = 100 mA, RL = 50 Ω  
tr, tf  
µs  
Kapazität  
Co  
25  
pF  
Capacitance  
VR = 0 V, f = 1 MHz  
Durchlaβspannung  
Forward voltage  
IF = 100 mA, tp = 20 ms  
IF = 1 A, tp = 100 µs  
VF  
VF  
1.5 (≤ 1.8)  
3.0 (≤ 3.8)  
V
V
Sperrstrom  
Reverse current  
VR = 5 V  
IR  
0.01 (≤ 1)  
µA  
Gesamtstrahlungsfluβ  
Total radiant flux  
IF = 100 mA, tp = 20 ms  
Φe  
TCI  
23  
mW  
%/K  
Temperaturkoeffizient von Ie bzw. Φe,  
IF = 100 mA  
– 0.5  
Temperature coefficient of Ie or Φe,  
IF = 100 mA  
Temperaturkoeffizient von VF, IF = 100 mA  
Temperature coefficient of VF, IF = 100 mA  
TCV  
TCλ  
– 2  
mV/K  
nm/K  
Temperaturkoeffizient von λ, IF = 100 mA  
Temperature coefficient of λ, IF = 100 mA  
+ 0.25  
Semiconductor Group  
3
1997-11-01  
SFH 421  
SFH 426  
Gruppierung der Strahlstärke Ie in Achsrichtung  
gemessen bei einem Raumwinkel = 0.01 sr  
Grouping at radiant intensity Ie in axial direction  
at a solid angle of = 0.01 sr  
Bezeichnung  
Description  
Symbol  
Werte  
Values  
Einheit  
Unit  
Strahlstärke  
Ie  
> 4  
mW/sr  
Radiant intensity  
IF = 100 mA, tp = 20 ms  
Strahlstärke  
Ie typ.  
48  
mW/sr  
Radiant intensity  
IF = 1 A, tp = 100 µs  
I
e
= f (I )  
Relative spectral emission  
Radiant intensity  
Max. permissible forward current  
I = f (T )  
F
I 100 mA  
e
I
= f (λ)  
rel  
F
A
Single pulse, t = 20 µs  
p
OHR00883  
OHR00877  
OHR00878  
10 2  
100  
%
120  
mA  
Ι e  
Ι F  
Ι e (100mA)  
Ι rel  
100  
80  
60  
40  
20  
0
80  
10 1  
10 0  
60  
40  
20  
RthjA = 450 K/W  
10 -1  
10 -2  
10 -3  
0
750  
10 0  
10 1  
10 2  
10 3 mA 10 4  
0
20  
40  
60  
80  
100 ˚C 120  
800  
850  
900  
950 nm 1000  
λ
TA  
Ι F  
Forward current  
I = f (V ), single pulse, t = 20 µs  
Radiation characteristics S = f (ϕ)  
rel  
F
F
p
OHL01660  
40˚  
30˚  
20˚  
10˚  
0˚  
1.0  
OHR00881  
10 1  
ϕ
A
Ι F  
50˚  
0.8  
0.6  
0.4  
0.2  
0
10 0  
10 -1  
10 -2  
10 -3  
60˚  
70˚  
80˚  
90˚  
100˚  
1.0  
0.8  
0.6  
0.4  
0˚  
20˚  
40˚  
60˚  
80˚  
100˚  
120˚  
0
1
2
3
4
5
6
V
8
VF  
Semiconductor Group  
4
1997-11-01  
SFH 421  
SFH 426  
Löthinweise  
Soldering conditions  
Bauform  
Types  
Tauch-, Schwall- und Schlepplötung  
Dip, wave and drag soldering  
Reflowlötung  
Reflow soldering  
Lötbad-  
temperatur  
Maximal  
zulässige  
Lötzeit  
Abstand  
Lötstelle –  
Gehäuse  
Lötzonen-  
temperatur  
Maximale  
Durchlaufzeit  
Temperature Max. perm.  
Distance  
between  
solder joint zone  
and case  
Temperature Max. transit  
of soldering time  
of the  
soldering  
time  
soldering  
bath  
TOPLED  
SIDELED  
260 °C  
8 s  
245 °C  
10 s  
10 s  
225 °C  
Zusätzliche Informationen über allgemeine Lötbedingungen finden Sie im Datenbuch S. 103ff.  
For additional information on generel soldering conditions please refer to our Data Book on  
page 169ff.  
Permissible pulse handling capability  
I = f (t )  
F
p
duty cycle D = Parameter, T = 25 °C  
A
OHR00886  
104  
mA  
Ι F  
D
= 0.005  
0.01  
0.02  
0.05  
103  
102  
101  
0.1  
0.2  
0.5  
DC  
t p  
t p  
D =  
Ι F  
T
T
10-5 10-4 10-3 10-2 10-1 100 101 s 102  
t p  
Semiconductor Group  
5
1997-11-01  

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