IRFH9310 [INFINEON]
The StrongIRFET™ power MOSFET family is optimized for low RDS(on) and high current capability. The devices are ideal for low frequency applications requiring performance and ruggedness. The comprehensive portfolio addresses a broad range of applications including DC motors, battery management systems, inverters, and DC-DC converters. ;型号: | IRFH9310 |
厂家: | Infineon |
描述: | The StrongIRFET™ power MOSFET family is optimized for low RDS(on) and high current capability. The devices are ideal for low frequency applications requiring performance and ruggedness. The comprehensive portfolio addresses a broad range of applications including DC motors, battery management systems, inverters, and DC-DC converters. |
文件: | 总10页 (文件大小:294K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
IRFH9310PbF
HEXFET® Power MOSFET
VDS
-30
4.6
V
6 mm
S
RDS(on) max
(@VGS = 10V)
Qg (typical)
S
S
G
m
Ω
D
D
D
110
2.8
nC
RG (typical)
Ω
D
ID
PQFN
5mm x 6mm
-21
A
(@TA = 25°C)
Applications
• Charge and Discharge Switch for Notebook PC Battery Application
FeaturesandBenefits
Resulting Benefits
Features
Low RDSon (≤ 4.6mΩ)
Lower Conduction Losses
results in
Industry-Standard PQFN Package
RoHS Compliant Containing no Lead, no Bromide and no Halogen
Multi-Vendor Compatibility
Environmentally Friendlier
⇒
Orderable part number
Package Type
Standard Pack
Note
Form
Quantity
IRFH9310TRPBF
PQFN 5mm x 6mm
Tape and Reel
4000
Absolute Maximum Ratings
Parameter
Max.
Units
VDS
Drain-to-Source Voltage
Gate-to-Source Voltage
-30
V
VGS
± 20
ID @ TA = 25°C
ID @ TA = 70°C
ID @ TC = 25°C
ID @ TC = 70°C
ID @ TC = 25°C
IDM
Continuous Drain Current, VGS @ -10V
Continuous Drain Current, VGS @ -10V
-21
-17
-107
- 86
-40
Continuous Drain Current, VGS @ -10V (Silicon Limited)
Continuous Drain Current, VGS @ -10V (Silicon Limited)
Continuous Drain Current, VGS @ -10V (Package Limited)
Pulsed Drain Current
A
-170
3.1
PD @TA = 25°C
PD @ TA = 70°C
Power Dissipation
W
Power Dissipation
2.0
Linear Derating Factor
Operating Junction and
Storage Temperature Range
0.025
-55 to + 150
W/°C
°C
TJ
TSTG
Notes through are on page 2
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IRFH9310PbF
Static @ TJ = 25°C (unless otherwise specified)
Conditions
VGS = 0V, ID = -250µA
Parameter
Drain-to-Source Breakdown Voltage
Min.
Typ.
–––
0.020
3.7
Max.
–––
–––
4.6
Units
V
BVDSS
∆Β
-30
–––
–––
–––
-1.3
–––
–––
–––
–––
–––
39
Reference to 25°C, ID = -1mA
VGS = -10V, ID = -21A
∆
VDSS/ TJ
Breakdown Voltage Temp. Coefficient
V/°C
RDS(on)
Static Drain-to-Source On-Resistance
Ω
m
VGS = -4.5V, ID = -17A
5.7
7.1
VGS(th)
Gate Threshold Voltage
-1.9
-5.8
–––
–––
–––
–––
–––
58
-2.4
–––
-1.0
-150
-100
100
–––
–––
165
–––
–––
–––
–––
–––
–––
–––
–––
–––
–––
V
VDS = VGS, ID = -100µA
∆
VGS(th)
Gate Threshold Voltage Coefficient
Drain-to-Source Leakage Current
mV/°C
VDS = -24V, VGS = 0V
IDSS
µA
V
DS = -24V, VGS = 0V, TJ = 125°C
VGS = -20V
IGSS
Gate-to-Source Forward Leakage
Gate-to-Source Reverse Leakage
Forward Transconductance
Total Gate Charge
nA
VGS = 20V
VDS = -10V, ID = -17A
VDS = -15V,VGS = -4.5V,ID = - 17A
VGS = -10V
gfs
Qg
S
–––
–––
–––
–––
–––
–––
–––
–––
–––
–––
–––
–––
nC
Qg
Total Gate Charge
110
17
VDS = -15V
Qgs
Qgd
RG
td(on)
tr
nC
Gate-to-Source Charge
Gate-to-Drain Charge
Gate Resistance
ID = -17A
28
2.8
Ω
V
DD = -15V, VGS = -4.5V
Turn-On Delay Time
Rise Time
25
ID = -1.0A
47
ns
pF
Ω
td(off)
tf
RG = 1.8
Turn-Off Delay Time
Fall Time
65
See Figs. 19a & 19b
VGS = 0V
70
Ciss
Coss
Crss
Input Capacitance
5250
1300
880
VDS = -15V
Output Capacitance
Reverse Transfer Capacitance
ƒ = 1.0MHz
Avalanche Characteristics
Typ.
–––
–––
Max.
170
-17
Parameter
Units
mJ
EAS
IAR
Single Pulse Avalanche Energy
Avalanche Current
A
Diode Characteristics
Conditions
Parameter
Min.
Typ.
Max.
Units
IS
MOSFET symbol
Continuous Source Current
D
–––
–––
-3.1
showing the
(Body Diode)
A
G
ISM
integral reverse
p-n junction diode.
Pulsed Source Current
(Body Diode)
–––
–––
-170
S
VSD
trr
T = 25°C, I = -3.1A, V = 0V
Diode Forward Voltage
–––
–––
–––
–––
42
-1.2
63
V
J
S
GS
T = 25°C, I = -3.1A, VDD = -24V
Reverse Recovery Time
Reverse Recovery Charge
ns
nC
J
F
Qrr
di/dt = 100/µs
42
63
Thermal Resistance
Typ.
Max.
1.6
40
Parameter
Units
Junction-to-Case
RθJC
RθJA
RθJA
–––
–––
–––
Junction-to-Ambient
Junction-to-Ambient (t<10s)
°C/W
35
Notes:
Repetitive rating; pulse width limited by max. junction temperature.
Starting TJ = 25°C, L = 1.1mH, RG = 50Ω, IAS = -17A.
Pulse width ≤ 400µs; duty cycle ≤ 2%.
When mounted on 1 inch square copper board.
ꢀ Rθ is measured at TJ of approximately 90°C.
For DESIGN AID ONLY, not subject to production testing.
2
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IRFH9310PbF
1000
100
10
1000
100
10
VGS
-10V
VGS
-10V
TOP
TOP
-5.0V
-4.5V
-3.5V
-3.3V
-3.1V
-2.9V
-2.7V
-5.0V
-4.5V
-3.5V
-3.3V
-3.1V
-2.9V
-2.7V
BOTTOM
BOTTOM
-2.7V
1
2.7V
60µs PULSE WIDTH
Tj = 150°C
≤
60µs PULSE WIDTH
Tj = 25°C
≤
1
0.1
0.1
1
10
100
0.1
1
10
100
-V , Drain-to-Source Voltage (V)
DS
-V , Drain-to-Source Voltage (V)
DS
Fig 2. Typical Output Characteristics
Fig 1. Typical Output Characteristics
1000
1.6
I
= -21A
D
V
= -10V
GS
1.4
1.2
1.0
0.8
0.6
100
10
1
T
= 25°C
J
T
= 150°C
J
V
= -15V
DS
≤
60µs PULSE WIDTH
0.1
1
2
3
4
5
-60 -40 -20
0
20 40 60 80 100 120140 160
T
J
, Junction Temperature (°C)
-V , Gate-to-Source Voltage (V)
GS
Fig 3. Typical Transfer Characteristics
Fig 4. Normalized On-Resistance vs. Temperature
12.0
100000
10000
1000
V
= 0V,
= C
f = 1 MHZ
GS
I = -17A
D
C
C
C
+ C , C
SHORTED
ds
iss
gs
gd
= C
10.0
rss
oss
gd
= C + C
V
V
= -24V
= -15V
ds
gd
DS
DS
8.0
6.0
4.0
2.0
0.0
VDS = -6.0V
C
iss
C
C
oss
rss
100
1
10
-V , Drain-to-Source Voltage (V)
100
0
25
50
75
100
125
Q
Total Gate Charge (nC)
DS
G
Fig 5. Typical Capacitance vs.Drain-to-Source Voltage
Fig 6. Typical Gate Charge vs.Gate-to-Source Voltage
3
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IRFH9310PbF
1000
100
10
1000
100
10
OPERATION IN THIS AREA
LIMITED BY R (on)
DS
100µsec
1msec
T
= 150°C
J
10msec
DC
T
= 25°C
J
1
T
= 25°C
A
Tj = 150°C
Single Pulse
V
= 0V
GS
1.0
0.1
0.3 0.4 0.5 0.6 0.7 0.8 0.9 1.0 1.1
0
1
10
100
-V , Source-to-Drain Voltage (V)
SD
-V , Drain-to-Source Voltage (V)
DS
Fig 7. Typical Source-Drain Diode Forward Voltage
Fig 8. Maximum Safe Operating Area
2.2
25
2.0
1.8
20
15
10
5
1.6
1.4
1.2
1.0
I
= -100µA
D
0
-75 -50 -25
0
25 50 75 100 125 150
25
50
75
100
125
150
T , Temperature ( °C )
T
, Ambient Temperature (°C)
J
A
Fig 10. Threshold Voltage vs. Temperature
Fig 9. Maximum Drain Current vs.
AmbientTemperature
100
D = 0.50
10
1
0.20
0.10
0.05
0.02
0.01
0.1
0.01
0.001
Notes:
1. Duty Factor D = t1/t2
2. Peak Tj = P dm x Zthja + T
SINGLE PULSE
( THERMAL RESPONSE )
A
1E-006
1E-005
0.0001
0.001
0.01
0.1
1
10
100
t
, Rectangular Pulse Duration (sec)
1
Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Ambient
4
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IRFH9310PbF
12
10
8
10
8
I
= -21A
D
Vgs = -4.5V
6
T
= 125°C
J
6
4
4
Vgs = -10V
T
= 25°C
J
2
2
0
0
2
4
6
8
10 12 14 16 18 20
0
20
40
60
80
100
120
-I , Drain Current (A)
D
-V
Gate -to -Source Voltage (V)
GS,
Fig 13. Typical On-Resistance vs. Drain Current
Fig 12. On-Resistance vs. Gate Voltage
50000
800
I
D
TOP
-2.0A
-3.1A
40000
30000
20000
10000
600
400
200
0
BOTTOM -17A
0
1E-8 1E-7 1E-6 1E-5 1E-4 1E-3 1E-2 1E-1
25
50
75
100
125
150
Time (sec)
Starting T , Junction Temperature (°C)
J
Fig 14. Maximum Avalanche Energy vs. Drain Current
Fig 15. Typical Power vs. Time
Driver Gate Drive
P.W.
Period
D =
D.U.T *
Period
P.W.
+
*
=10V
V
GS
Circuit Layout Considerations
• Low Stray Inductance
• Ground Plane
• Low Leakage Inductance
Current Transformer
-
D.U.T. I Waveform
SD
+
Reverse
Recovery
Current
Body Diode Forward
Current
di/dt
-
+
-
D.U.T. V Waveform
DS
Diode Recovery
dv/dt
V
DD
VDD
• di/dt controlled by RG
Re-Applied
Voltage
RG
+
-
• Driver same type as D.U.T.
Body Diode
Inductor Current
Forward Drop
• ISD controlled by Duty Factor "D"
• D.U.T. - Device Under Test
I
SD
Ripple ≤ 5%
* VGS = 5V for Logic Level Devices
* Reverse Polarity of D.U.T for P-Channel
Fig 16. Diode Reverse Recovery Test Circuit for P-Channel HEXFET® Power MOSFETs
5
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IRFH9310PbF
Id
Vds
Vgs
L
VCC
DUT
0
Vgs(th)
20K
Qgs1
Qgs2
Qgodr
Qgd
Fig 17a. Gate Charge Test Circuit
Fig 17b. Gate Charge Waveform
L
V
DS
I
AS
D.U.T
R
G
V
DD
I
A
AS
-VGS
DRIVER
0.01
Ω
t
p
t
p
V
(BR)DSS
15V
Fig 18b. Unclamped Inductive Waveforms
Fig 18a. Unclamped Inductive Test Circuit
RD
VDS
t
t
r
t
t
f
d(on)
d(off)
VGS
V
GS
D.U.T.
10%
RG
-
VDD
+
-VGS
90%
Pulse Width ≤ 1 µs
Duty Factor ≤ 0.1 %
V
DS
Fig 19a. Switching Time Test Circuit
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Fig 19b. Switching Time Waveforms
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IRFH9310PbF
PQFN Package Details
PQFN Part Marking
INTERNATIONAL
RECTIFIER LOGO
6
DATE CODE
PART NUMBER
XXXX
XYWWX
XXXXX
ASSEMBLY SITE CODE
(Per SCOP 200-002)
MARKING CODE
(Per Marking Spec.)
PIN 1
IDENTIFIER
LOT CODE
(Eng Mode - Min. last 4 digits of EATI #)
(Prod Mode - 4 digits SPN code)
TOP MARKING (LASER)
Note: For the most current drawing please refer to IR website at: http://www.irf.com/package/
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IRFH9310PbF
PQFN Tape and Reel
Note: For the most current drawing please refer to IR website at: http://www.irf.com/package/
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IRFH9310PbF
Qualification Information†
Consumer ††
(per JEDEC JESD47F††† guidelines)
MSL2
(per JEDEC J-STD-020D†††
Qualification level
Moisture Sensitivity Level
RoHS Compliant
PQFN 5mm x 6mm
)
Yes
Qualification standards can be found at International Rectifier’s web site
http://www.irf.com/product-info/reliability
Higher qualification ratings may be available should the user have such requirements.
Please contact your International Rectifier sales representative for further information:
http://www.irf.com/whoto-call/salesrep/
Applicable version of JEDEC standard at the time of product release.
Higher MSL ratings may be available for the specific package types listed here. Please contact your
International Rectifier sales representative for further information: http://www.irf.com/whoto-call/salesrep/
Revision History
Date
Comments
Updated datasheet as per new IR Corporate Template
•
•
8/19/2014
Updated data sheet with latest PQFN Tape and Reel Diagram.
IR WORLD HEADQUARTERS: 101 N. Sepulveda Blvd., El Segundo, California 90245, USA
To contact International Rectifier, please visit http://www.irf.com/whoto-call/
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IMPORTANT NOTICE
The information given in this document shall in no For further information on the product, technology,
event be regarded as a guarantee of conditions or delivery terms and conditions and prices please
characteristics (“Beschaffenheitsgarantie”) .
contact your nearest Infineon Technologies office
(www.infineon.com).
With respect to any examples, hints or any typical
values stated herein and/or any information
regarding the application of the product, Infineon
Technologies hereby disclaims any and all
warranties and liabilities of any kind, including
without limitation warranties of non-infringement
of intellectual property rights of any third party.
WARNINGS
Due to technical requirements products may
contain dangerous substances. For information on
the types in question please contact your nearest
Infineon Technologies office.
In addition, any information given in this document
is subject to customer’s compliance with its
obligations stated in this document and any
applicable legal requirements, norms and
standards concerning customer’s products and any
use of the product of Infineon Technologies in
customer’s applications.
Except as otherwise explicitly approved by Infineon
Technologies in a written document signed by
authorized
representatives
of
Infineon
Technologies, Infineon Technologies’ products may
not be used in any applications where a failure of
the product or any consequences of the use thereof
can reasonably be expected to result in personal
injury.
The data contained in this document is exclusively
intended for technically trained staff. It is the
responsibility of customer’s technical departments
to evaluate the suitability of the product for the
intended application and the completeness of the
product information given in this document with
respect to such application.
相关型号:
IRFH9310TRPBF
Power Field-Effect Transistor, 21A I(D), 30V, 0.0046ohm, 1-Element, P-Channel, Silicon, Metal-oxide Semiconductor FET, 6 X 5 MM, HALOGEN FREE AND ROHS COMPLIANT, PLASTIC, QFN-8
INFINEON
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