IRFHM4226PBF [INFINEON]

Compatible with Existing Surface Mount Techniques;
IRFHM4226PBF
型号: IRFHM4226PBF
厂家: Infineon    Infineon
描述:

Compatible with Existing Surface Mount Techniques

文件: 总9页 (文件大小:560K)
中文:  中文翻译
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FastIRFET™  
IRFHM4226TRPbF  
HEXFET® Power MOSFET  
VDSS  
25  
V
RDS(on) max  
(@ VGS = 10V)  
2.4  
m  
(@ VGS = 4.5V)  
3.3  
16  
Qg (typical)  
nC  
A
ID  
60  
(@TC (Bottom) = 25°C)  
PQFN 3.3 x 3.3 mm  
Applications  
Control or Synchronous MOSFET for high frequency buck converters  
Features  
Benefits  
Low RDSon (<2.4m)  
Low Charge (typical 16nC)  
Low Thermal Resistance to PCB (<3.2°C/W)  
Lower Conduction Losses  
Low Switching Losses  
Enable better thermal dissipation  
Increased Power Density  
Multi-Vendor Compatibility  
Easier Manufacturing  
Low Profile (<0.9 mm)  
results in  
Industry-Standard Pinout  
Compatible with Existing Surface Mount Techniques  
RoHS Compliant, Halogen-Free  
MSL1  
  
Environmentally Friendlier  
Increased Reliability  
Standard Pack  
Base part number  
Package Type  
Orderable Part Number  
Form  
Quantity  
IRFHM4226TRPbF  
PQFN 3.3mm x 3.3mm  
Tape and Reel  
4000  
IRFHM4226TRPbF  
Absolute Maximum Ratings  
Parameter  
Max.  
± 20  
Units  
VGS  
Gate-to-Source Voltage  
V
ID @ TA = 25°C  
ID @ TC(Bottom) = 25°C  
Continuous Drain Current, VGS @ 10V  
Continuous Drain Current, VGS @ 10V  
28  
105  
67  
A
ID @ TC(Bottom) = 100°C Continuous Drain Current, VGS @ 10V  
ID @ TC = 25°C  
Continuous Drain Current, VGS @ 10V  
(Source Bonding Technology Limited)  
Pulsed Drain Current   
60  
IDM  
420  
2.7  
PD @TA = 25°C  
PD @TC(Bottom) = 25°C  
Power Dissipation   
W
Power Dissipation   
39  
Linear Derating Factor   
Operating Junction and  
Storage Temperature Range  
0.021  
W/°C  
TJ  
-55 to + 150  
°C  
TSTG  
Notes through are on page 9  
1
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December 9, 2014  
IRFHM4226TRPbF  
Static @ TJ = 25°C (unless otherwise specified)  
Parameter  
Min.  
25  
–––  
–––  
–––  
1.1  
Typ.  
–––  
21  
Max. Units  
–––  
––– mV/°C Reference to 25°C, ID = 1mA  
Conditions  
VGS = 0V, ID = 250µA  
BVDSS  
Drain-to-Source Breakdown Voltage  
Breakdown Voltage Temp. Coefficient  
Static Drain-to-Source On-Resistance  
V
BVDSS/TJ  
RDS(on)  
1.7  
2.6  
1.6  
-5.7  
–––  
–––  
–––  
–––  
32  
2.4  
3.3  
2.1  
VGS = 10V, ID = 30A   
VGS = 4.5V, ID = 30A   
VDS = VGS, ID = 50µA  
m  
VGS(th)  
VGS(th)  
IDSS  
Gate Threshold Voltage  
Gate Threshold Voltage Coefficient  
Drain-to-Source Leakage Current  
Gate-to-Source Forward Leakage  
Gate-to-Source Reverse Leakage  
Forward Transconductance  
Total Gate Charge  
V
–––  
–––  
–––  
–––  
136  
–––  
–––  
–––  
–––  
–––  
–––  
–––  
–––  
–––  
–––  
––– mV/°C  
1.0  
100  
-100  
–––  
–––  
24  
µA VDS = 20V, VGS = 0V  
VGS = 20V  
nA  
IGSS  
V
V
GS = -20V  
DS = 10V, ID = 30A  
gfs  
Qg  
S
nC VGS = 10V, VDS = 13V, ID = 30A  
Qg  
Total Gate Charge  
16  
V
V
DS = 13V  
GS = 4.5V  
Qgs1  
Qgs2  
Qgd  
Qgodr  
Qsw  
Qoss  
RG  
Pre-Vth Gate-to-Source Charge  
Post-Vth Gate-to-Source Charge  
Gate-to-Drain Charge  
Gate Charge Overdrive  
Switch Charge (Qgs2 + Qgd)  
Output Charge  
3.6  
2.0  
5.8  
4.6  
7.8  
15  
–––  
–––  
–––  
–––  
–––  
–––  
–––  
–––  
nC  
ID = 30A  
nC VDS = 16V, VGS = 0V  
Gate Resistance  
1.1  
11  
td(on)  
Turn-On Delay Time  
VDD = 13V, VGS = 4.5V  
ns ID = 30A  
tr  
td(off)  
tf  
Ciss  
Coss  
Crss  
Rise Time  
Turn-Off Delay Time  
Fall Time  
Input Capacitance  
Output Capacitance  
Reverse Transfer Capacitance  
–––  
–––  
–––  
–––  
–––  
–––  
35  
14  
8.1  
2000  
570  
150  
–––  
–––  
–––  
–––  
–––  
–––  
RG=1.8  
VGS = 0V  
pF  
VDS = 13V  
ƒ = 1.0MHz  
Avalanche Characteristics  
Parameter  
Typ.  
Max.  
Units  
EAS  
IAR  
Single Pulse Avalanche Energy   
–––  
124  
mJ  
Avalanche Current   
–––  
30  
A
Diode Characteristics  
Parameter  
Min.  
Typ. Max. Units  
Conditions  
D
IS  
Continuous Source Current  
(Body Diode)  
MOSFET symbol  
showing the  
–––  
–––  
––– 60  
A
––– 420  
G
ISM  
Pulsed Source Current  
(Body Diode)   
integral reverse  
p-n junction diode.  
S
VSD  
trr  
Qrr  
Diode Forward Voltage  
Reverse Recovery Time  
Reverse Recovery Charge  
–––  
–––  
–––  
–––  
16  
28  
1.0  
24  
42  
V
ns  
TJ = 25°C, IS = 30A, VGS = 0V   
TJ = 25°C, IF = 30A, VDD = 13V  
nC di/dt = 450A/µs   
Thermal Resistance  
Parameter  
Typ.  
Max.  
Units  
Junction-to-Case   
Junction-to-Case   
–––  
–––  
–––  
–––  
3.2  
RJC (Bottom)  
RJC (Top)  
RJA  
°C/W  
35  
47  
30  
Junction-to-Ambient   
Junction-to-Ambient   
RJA (<10s)  
2
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December 9, 2014  
IRFHM4226TRPbF  
1000  
100  
10  
1000  
100  
10  
VGS  
10V  
VGS  
10V  
TOP  
TOP  
5.5V  
4.5V  
4.0V  
3.5V  
3.25V  
3.0V  
2.75V  
5.5V  
4.5V  
4.0V  
3.5V  
3.25V  
3.0V  
2.75V  
BOTTOM  
BOTTOM  
2.75V  
2.75V  
60µs PULSE WIDTH  
Tj = 150°C  
60µs PULSE WIDTH  
Tj = 25°C  
1
1
0.1  
1
10  
100  
0.1  
1
10  
100  
V
, Drain-to-Source Voltage (V)  
V
, Drain-to-Source Voltage (V)  
DS  
DS  
Fig 2. Typical Output Characteristics  
Fig 1. Typical Output Characteristics  
1.8  
1.6  
1.4  
1.2  
1.0  
0.8  
0.6  
1000  
100  
10  
I
= 30A  
D
V
= 10V  
GS  
T = 150°C  
J
T = 25°C  
J
1
V
= 10V  
DS  
60µs PULSE WIDTH  
0.1  
-60 -40 -20  
0
20 40 60 80 100 120 140 160  
1.0  
2.0  
V
3.0  
4.0  
5.0  
6.0  
7.0  
T , Junction Temperature (°C)  
, Gate-to-Source Voltage (V)  
J
GS  
Fig 4. Normalized On-Resistance vs. Temperature  
Fig 3. Typical Transfer Characteristics  
14.0  
100000  
10000  
1000  
V
= 0V,  
f = 1 MHZ  
GS  
I = 30A  
D
C
C
C
= C + C , C SHORTED  
iss  
gs  
gd  
ds  
12.0  
= C  
rss  
oss  
gd  
V
V
V
= 20V  
= 13V  
= 5.0V  
DS  
DS  
DS  
= C + C  
ds  
gd  
10.0  
8.0  
6.0  
4.0  
2.0  
0.0  
C
iss  
C
oss  
C
rss  
100  
0
5
10 15 20 25 30 35 40  
0.1  
1
10  
100  
Q , Total Gate Charge (nC)  
G
V
, Drain-to-Source Voltage (V)  
DS  
Fig 5. Typical Capacitance vs. Drain-to-Source Voltage  
Fig 6. Typical Gate Charge vs. Gate-to-Source Voltage  
3
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December 9, 2014  
IRFHM4226TRPbF  
1000  
100  
10  
OPERATION IN THIS AREA  
1000  
100  
10  
LIMITED BY R (on)  
DS  
T = 150°C  
J
100µsec  
T = 25°C  
Limited by Package  
J
1msec  
1
10msec  
DC  
1
Tc = 25°C  
Tj = 150°C  
Single Pulse  
0.1  
0.01  
V
= 0V  
GS  
0.1  
0.1  
1
10  
100  
0.2 0.4 0.6 0.8 1.0 1.2 1.4 1.6 1.8  
, Source-to-Drain Voltage (V)  
V
, Drain-to-Source Voltage (V)  
V
DS  
SD  
Fig 8. Maximum Safe Operating Area  
Fig 7. Typical Source-Drain Diode Forward Voltage  
2.8  
120  
Limited by package  
100  
2.4  
2.0  
80  
60  
40  
20  
0
I
= 50µA  
D
I
= 250µA  
= 1.0mA  
= 10mA  
1.6  
1.2  
0.8  
D
I
D
I
D
-75 -50 -25  
0
25 50 75 100 125 150  
25  
50  
75  
100  
125  
150  
T , Temperature ( °C )  
T
, Case Temperature (°C)  
J
C
Fig 10. Threshold Voltage Vs. Temperature  
Fig 9. Maximum Drain Current vs. Case Temperature  
10  
D = 0.50  
1
0.20  
0.10  
0.05  
0.1  
0.02  
0.01  
0.01  
SINGLE PULSE  
( THERMAL RESPONSE )  
Notes:  
1. Duty Factor D = t1/t2  
2. Peak Tj = P dm x Zthjc + Tc  
0.001  
1E-006  
1E-005  
0.0001  
0.001  
0.01  
0.1  
1
t
, Rectangular Pulse Duration (sec)  
1
Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Case  
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4
December 9, 2014  
IRFHM4226TRPbF  
8.0  
6.0  
4.0  
2.0  
0.0  
600  
500  
400  
300  
200  
100  
0
I
= 30A  
I
D
D
TOP  
5.1A  
7.2A  
BOTTOM 30A  
T = 125°C  
J
T = 25°C  
J
2
4
6
8
10 12 14 16 18 20  
25  
50  
75  
100  
125  
150  
Starting T , Junction Temperature (°C)  
J
V
Gate -to -Source Voltage (V)  
GS,  
Fig 13. Maximum Avalanche Energy vs. Drain Current  
Fig 12. On– Resistance vs. Gate Voltage  
100  
Allowed avalanche Current vs avalanche  
pulsewidth, tav, assuming Tj = 125°C and  
Tstart =25°C (Single Pulse)  
10  
1
Allowed avalanche Current vs avalanche  
pulsewidth, tav, assuming  j = 25°C and  
Tstart = 125°C.  
0.1  
1.0E-06  
1.0E-05  
1.0E-04  
1.0E-03  
1.0E-02  
1.0E-01  
tav (sec)  
Fig 14. Single Avalanche Current vs. pulse Width  
5
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December 9, 2014  
IRFHM4226TRPbF  
Fig 15. Peak Diode Recovery dv/dt Test Circuit for N-Channel HEXFET® Power MOSFETs  
V
(BR)DSS  
t
15V  
p
DRIVER  
+
L
V
DS  
D.U.T  
AS  
R
G
V
DD  
-
I
A
20V  
0.01  
t
I
p
AS  
Fig 16a. Unclamped Inductive Test Circuit  
Fig 16b. Unclamped Inductive Waveforms  
Fig 17a. Switching Time Test Circuit  
Fig 17b. Switching Time Waveforms  
Id  
Vds  
Vgs  
Vgs(th)  
Qgs1  
Qgs2  
Qgd  
Qgodr  
Fig 19. Gate Charge Waveform  
Submit Datasheet Feedback December 9, 2014  
Fig 18. Gate Charge Test Circuit  
6
www.irf.com © 2014 International Rectifier  
IRFHM4226TRPbF  
PQFN 3.3 x 3.3 Package Details  
For more information on board mounting, including footprint and stencil recommendation, please refer to application note  
AN-1136: http://www.irf.com/technical-info/appnotes/an-1136.pdf  
For more information on package inspection techniques, please refer to application note AN-1154:  
http://www.irf.com/technical-info/appnotes/an-1154.pdf  
PQFN 3.3 x 3.3 Part Marking  
Note: For the most current drawing please refer to IR website at http://www.irf.com/package/  
7
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December 9, 2014  
IRFHM4226TRPbF  
PQFN 3.3 x 3.3 Tape and Reel  
REEL DIMENSIONS  
TAPE DIMENSIONS  
CODE  
Ao  
DESCRIPTION  
Dimension design to accommodate the component width  
Dimension design to accommodate the component lenght  
Dimension design to accommodate the component thickness  
Overall width of the carrier tape  
Bo  
Ko  
W
P
1
Pitch between successive cavity centers  
QUADRANT ASSIGNMENTS FOR PIN 1 ORIENTATION IN TAPE  
Note: All dimension are nominal  
Package  
Type  
Reel  
Diameter  
(Inch)  
QTY  
Reel  
Width  
W1  
Ao  
Bo  
Ko  
P1  
W
Pin 1  
(mm)  
(mm)  
(mm)  
(mm)  
(mm)  
Quadrant  
(mm)  
3.3 X 3.3 PQFN  
13  
4000  
12.4  
3.600  
3.600  
1.20  
8.00  
12  
Q1  
Note: For the most current drawing please refer to IR website at http://www.irf.com/package/  
8
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December 9, 2014  
IRFHM4226TRPbF  
Qualification Information†  
MSL1  
PQFN 3.3mm x 3.3mm  
Moisture Sensitivity Level  
RoHS Compliant  
(per JEDEC J-STD-020D††)  
Yes  
Qualification standards can be found at International Rectifier’s web site: http://www.irf.com/product-info/reliability  
†† Applicable version of JEDEC standard at the time of product release.  
Notes:  
Repetitive rating; pulse width limited by max. junction temperature.  
Starting TJ = 25°C, L = 0.275mH, RG = 50, IAS = 30A.  
Pulse width 400µs; duty cycle 2%.  
Ris measured at TJ of approximately 90°C.  
When mounted on 1 inch square PCB (FR-4). Please refer to AN-994 for more details:  
http://www.irf.com/technical-info/appnotes/an-994.pdf  
Calculated continuous current based on maximum allowable junction temperature.  
Current is limited to 60A by source bonding technology.  
Pulse drain current is limited at 240A by source bonding technology.  
Revision History  
Date  
08/07/13  
12/5/13  
Comments  
 Added "FastIRFET™" above part number, on page1  
 Updated fig.14, limit curve to 40A package limitation current, on page 5  
 Updated IC @ TC 25C from “40A” to “60A” on page 1, 2  
 Updated schematic on page 1  
 Updated fig 8 and 9 on page 4  
6/3/14  
 Updated fig14 on page 5  
 Updated Tape and Reel on page 8  
 Updated RDS(on) from 2.2mto 2.4min accordance with PCN#188, For backwards  
compatibility, datasheet thermal calculations remain unchanged (RDS(on) = 2.2 m)  
12/09/14  
IR WORLD HEADQUARTERS: 101 N. Sepulveda Blvd., El Segundo, California 90245, USA  
To contact International Rectifier, please visit http://www.irf.com/whoto-call/  
9
www.irf.com © 2014 International Rectifier  
Submit Datasheet Feedback  
December 9, 2014  

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