IRFHM792PBF_15 [INFINEON]
Compatible with Existing Surface Mount Techniques;型号: | IRFHM792PBF_15 |
厂家: | Infineon |
描述: | Compatible with Existing Surface Mount Techniques |
文件: | 总9页 (文件大小:267K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
IRFHM792PbF
HEXFET® Power MOSFET
VDS
100
V
V
TOP VIEW
Vgs max
± 20
RDS(on) max
(@VGS = 10V)
Qg typ
D
D
D
5
D
8
m
195
4.2
Ω
6
7
G
S
G
S
D
nC
A
D
D
D
D
D
ID
3.4
4
G
1
S
2
G
3
S
(@Tc(Bottom) = 25°C)
PQFN Dual 3.3X3.3 mm
Applications
• DC-DC Primary Switch
• 48V Battery Monitoring
FeaturesandBenefits
Features
Low RDSon (<195mΩ)
Low Thermal Resistance to PCB (< 12°C/W)
Low Profile (<1.2mm)
Benefits
Lower Conduction Losses
Enable better thermal dissipation
results in Increased Power Density
⇒
Industry-Standard Pinout
Compatible with Existing Surface Mount Techniques
Multi-Vendor Compatibility
Easier Manufacturing
RoHS Compliant Containing no Lead, no Bromide and no Halogen
MSL1, Industrial Qualification
Environmentally Friendlier
Increased Reliability
Standard Pack
Orderable part number
Package Type
Note
Form
Quantity
IRFHM792TRPBF
IRFHM792TR2PBF
PQFN Dual 3.3mm x 3.3mm
PQFN Dual 3.3mm x 3.3mm
Tape and Reel
Tape and Reel
4000
400
EOL notice # 259
Absolute Maximum Ratings
Parameter
Max.
100
± 20
2.3
Units
VDS
Drain-to-Source Voltage
Gate-to-Source Voltage
V
V
GS
Continuous Drain Current, VGS @ 10V
Continuous Drain Current, VGS @ 10V
Continuous Drain Current, VGS @ 10V
Continuous Drain Current, VGS @ 10V
I
I
I
I
I
I
@ TA = 25°C
D
D
D
D
D
@ TA = 70°C
1.8
4.8
@ TC(Bottom) = 25°C
@ TC(Bottom) = 100°C
@ TC = 25°C
A
3.1
Continuous Drain Current, VGS @ 10V (Wirebond Limited)
Pulsed Drain Current
3.4
14
DM
Power Dissipation
P
P
@TA = 25°C
2.3
D
D
W
Power Dissipation
@TC(Bottom) = 25°C
10.4
0.018
-55 to + 150
Linear Derating Factor
Operating Junction and
W/°C
°C
T
T
J
Storage Temperature Range
STG
Notes through are on page 9
1
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IRFHM792PbF
Static @ TJ = 25°C (unless otherwise specified)
Parameter
Min. Typ. Max. Units
Conditions
VGS = 0V, ID = 250μA
BVDSS
Drain-to-Source Breakdown Voltage
Breakdown Voltage Temp. Coefficient
Static Drain-to-Source On-Resistance
Gate Threshold Voltage
100
–––
–––
2.0
–––
0.11
164
3.0
-8.2
–––
–––
–––
–––
–––
4.2
0.7
0.3
1.3
1.9
1.6
6.7
1.6
3.4
4.7
5.2
2.6
251
31
–––
–––
195
4.0
V
ΔΒVDSS/ΔTJ
RDS(on)
VGS(th)
V/°C Reference to 25°C, ID = 1.0mA
Ω
VGS = 10V, ID = 2.9A
m
VDS = VGS, ID = 10μA
V
ΔVGS(th)
IDSS
Gate Threshold Voltage Coefficient
Drain-to-Source Leakage Current
–––
–––
–––
–––
–––
3.5
––– mV/°C
20
250
100
-100
–––
6.3
VDS = 100V, VGS = 0V
VDS = 100V, VGS = 0V, TJ = 125°C
VGS = 20V
μA
mA
IGSS
Gate-to-Source Forward Leakage
Gate-to-Source Reverse Leakage
Forward Transconductance
Total Gate Charge
nA
S
VGS = -20V
gfs
VDS = 50V, ID = 2.9A
Qg
–––
–––
–––
–––
–––
–––
–––
–––
–––
–––
–––
–––
–––
–––
–––
Qgs1
Qgs2
Qgd
Qgodr
Qsw
Qoss
RG
Pre-Vth Gate-to-Source Charge
Post-Vth Gate-to-Source Charge
Gate-to-Drain Charge
Gate Charge Overdrive
Switch Charge (Qgs2 + Qgd)
Output Charge
–––
–––
–––
–––
–––
–––
VDS = 50V
VGS = 10V
ID = 2.9A
nC
nC
V
DS = 16V, VGS = 0V
DD = 50V, VGS = 10V
Gate Resistance
Ω
–––
–––
td(on)
tr
td(off)
tf
Turn-On Delay Time
V
Rise Time
–––
–––
–––
–––
–––
–––
ID = 2.9A
ns
pF
Ω
Turn-Off Delay Time
RG=1.8
Fall Time
Ciss
Coss
Crss
Input Capacitance
VGS = 0V
Output Capacitance
VDS = 25V
Reverse Transfer Capacitance
ƒ = 1.0MHz
13
Avalanche Characteristics
Parameter
Typ.
–––
–––
Max.
Units
mJ
Single Pulse Avalanche Energy
EAS
IAR
10.2
2.9
Avalanche Current
A
Diode Characteristics
Parameter
Min. Typ. Max. Units
Conditions
D
IS
Continuous Source Current
MOSFET symbol
–––
–––
3.4
showing the
integral reverse
(Body Diode)
Pulsed Source Current
A
G
ISM
–––
–––
14
S
p-n junction diode.
(Body Diode)
VSD
trr
T = 25°C, I = 2.9A, V = 0V
Diode Forward Voltage
–––
–––
–––
–––
15
1.3
23
68
V
J
S
GS
T = 25°C, I = 2.9A, VDD = 50V
Reverse Recovery Time
Reverse Recovery Charge
Forward Turn-On Time
ns
nC
J
F
Qrr
ton
di/dt = 500A/μs
45
Time is dominated by parasitic Inductance
Thermal Resistance
Parameter
Typ.
–––
–––
–––
–––
Max.
12
Units
Junction-to-Case
RθJC (Bottom)
RθJC (Top)
RθJA
Junction-to-Case
85
°C/W
Junction-to-Ambient
Junction-to-Ambient
55
RθJA (<10s)
38
2
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IRFHM792PbF
100
10
1
100
10
VGS
15V
10V
8.0V
6.0V
5.0V
4.5V
4.3V
4.0V
VGS
15V
10V
8.0V
6.0V
5.0V
4.5V
4.3V
4.0V
TOP
TOP
BOTTOM
BOTTOM
1
0.1
0.01
4.0V
PULSE WIDTH Tj = 150°C
4.0V
PULSE WIDTH Tj = 25°C
60μs
≤
60μs
≤
0.1
0.1
1
10
100
0.1
1
10
100
V
, Drain-to-Source Voltage (V)
V
, Drain-to-Source Voltage (V)
DS
DS
Fig 1. Typical Output Characteristics
Fig 2. Typical Output Characteristics
100
10
1
2.4
2.2
2.0
1.8
1.6
1.4
1.2
1.0
0.8
0.6
0.4
I
= 2.9A
D
V
= 10V
GS
T
= 150°C
J
T
= 25°C
J
V
= 50V
DS
≤
60μs PULSE WIDTH
0.1
2
4
6
8
10 12 14
-60 -40 -20
0
20 40 60 80 100 120 140160
T
J
, Junction Temperature (°C)
V
, Gate-to-Source Voltage (V)
GS
Fig 4. Normalized On-Resistance vs. Temperature
Fig 3. Typical Transfer Characteristics
14
10000
1000
100
10
V
= 0V,
= C
f = 1 MHZ
GS
I = 2.9A
D
C
C
C
+ C , C
SHORTED
ds
iss
gs
gd
12
= C
rss
oss
gd
= C + C
V
V
= 80V
= 50V
DS
DS
ds
gd
10
8
VDS= 20V
C
iss
C
oss
6
C
rss
4
2
0
1
0
1
2
3
4
5
6
1
10
, Drain-to-Source Voltage (V)
100
Q , Total Gate Charge (nC)
V
DS
G
Fig 5. Typical Capacitance vs.Drain-to-Source Voltage
Fig 6. Typical Gate Charge vs.Gate-to-Source Voltage
3
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IRFHM792PbF
100
10
1
100
10
1
OPERATION IN THIS AREA LIMITED BY RDS(on)
100μsec
T
= 150°C
J
Limited by
Wirebond
1msec
T
= 25°C
J
10msec
Tc = 25°C
Tj = 150°C
DC
V
= 0V
GS
Single Pulse
0.1
0.1
0.2
0.4
0.6
0.8
1.0
1.2
0.10
1
10
100
1000
V
, Source-to-Drain Voltage (V)
V
, Drain-to-Source Voltage (V)
SD
DS
Fig 7. Typical Source-Drain Diode Forward Voltage
Fig 8. Maximum Safe Operating Area
4.0
5.2
4.8
Limited By Wirebond
4.4
3.5
3.0
4
3.6
3.2
2.8
2.4
2
I
I
I
I
= 10μA
= 25μA
= 250μA
= 1.0mA
2.5
2.0
1.5
D
D
D
D
1.6
1.2
0.8
0.4
0
-75 -50 -25
0
25 50 75 100 125 150
25
50
T
75
100
125
150
T , Temperature ( °C )
, Case Temperature (°C)
J
C
Fig 9. Maximum Drain Current vs.
Fig 10. Threshold Voltage vs. Temperature
Case(Bottom)Temperature
100
10
D = 0.50
0.20
0.10
1
0.05
0.02
0.01
0.1
Notes:
SINGLE PULSE
1. Duty Factor D = t1/t2
2. Peak Tj = P dm x Zthjc + Tc
( THERMAL RESPONSE )
0.01
1E-006
1E-005
0.0001
0.001
0.01
0.1
t
, Rectangular Pulse Duration (sec)
1
Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Case (Bottom)
4
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IRFHM792PbF
45
40
35
30
25
20
15
10
5
400
350
300
250
200
150
100
I
D
I
= 2.9A
D
TOP
0.43A
0.98A
BOTTOM 2.90A
T
= 125°C
J
T
= 25°C
J
0
25
50
75
100
125
150
5
10
15
20
Starting T , Junction Temperature (°C)
J
V
Gate -to -Source Voltage (V)
GS,
Fig 13. Maximum Avalanche Energy vs. Drain Current
Fig 12. On-Resistance vs. Gate Voltage
V
(BR)DSS
t
p
15V
DRIVER
+
L
V
DS
D.U.T
AS
R
G
V
DD
-
I
A
I
AS
20V
Ω
0.01
t
p
Fig 14b. Unclamped Inductive Waveforms
Fig 14a. Unclamped Inductive Test Circuit
RD
VDS
VDS
90%
VGS
D.U.T.
RG
+VDD
-
10%
VGS
VGS
Pulse Width ≤ 1 µs
Duty Factor ≤ 0.1
td(on)
td(off)
tr
tf
Fig 15a. Switching Time Test Circuit
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Fig 15b. Switching Time Waveforms
5
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IRFHM792PbF
Driver Gate Drive
P.W.
P.W.
D =
D.U.T
Period
Period
+
*
=10V
V
GS
Circuit Layout Considerations
• Low Stray Inductance
• Ground Plane
• Low Leakage Inductance
Current Transformer
-
D.U.T. I Waveform
SD
+
-
Reverse
Recovery
Current
Body Diode Forward
Current
di/dt
-
+
D.U.T. V Waveform
DS
Diode Recovery
dv/dt
V
DD
VDD
Re-Applied
Voltage
• dv/dt controlled by RG
RG
+
-
Body Diode
Forward Drop
• Driver same type as D.U.T.
• ISD controlled by Duty Factor "D"
• D.U.T. - Device Under Test
Inductor Curent
I
SD
Ripple
≤ 5%
* VGS = 5V for Logic Level Devices
Fig 16. Peak Diode Recovery dv/dt Test Circuit for N-Channel
HEXFET® Power MOSFETs
Id
Vds
Vgs
L
VCC
DUT
0
Vgs(th)
1K
Qgs1
Qgs2
Qgd
Qgodr
Fig 18. Gate Charge Waveform
Fig 17. Gate Charge Test Circuit
6
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IRFHM792PbF
PQFN Dual 3.3x3.3 Package Details
For footprint and stencil design recommendations, please refer to application note AN-1154 at
http://www.irf.com/technical-info/appnotes/an-1154.pdf
PQFN Dual 3.3x3.3 Part Marking
Note: For the most current drawing please refer to IR website at: http://www.irf.com/package/
7
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December 16, 2013
IRFHM792PbF
PQFN Dual 3.3x3.3 Tape and Reel
Note: For the most current drawing please refer to IR website at: http://www.irf.com/package/
8
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December 16, 2013
IRFHM792PbF
Qualification information†
Industrial††
(per JEDEC JES D47F ††† guidelines )
Qualification level
MS L 1
Moisture Sensitivity Level
RoHS compliant
PQFN Dual 3.3mm x 3.3mm
(per JEDEC J-S T D-020D†††
Yes
)
Qualification standards can be found at International Rectifier’s web site
http://www.irf.com/product-info/reliability
Higher qualification ratings may be available should the user have such requirements.
Please contact your International Rectifier sales representative for further information:
http://www.irf.com/whoto-call/salesrep/
Applicable version of JEDEC standard at the time of product release.
Notes:
Repetitive rating; pulse width limited by max. junction temperature.
Starting TJ = 25°C, L = 2.43mH, RG = 50Ω, IAS = 2.9A.
Pulse width ≤ 400μs; duty cycle ≤ 2%.
R is measured at TJ of approximately 90°C.
θ
ꢀ When mounted on 1 inch square 2 oz copper pad on 1.5x1.5 in. board of FR-4 material.
Calculated continuous current based on maximum allowable junction temperature. Package is limited to 3.4A by wirebond capability.
Revision History
Date
Comments
• Updated ordering information to reflect the End-Of-life (EOL) of the mini-reel option (EOL notice #259)
12/16/2013
•
Updated data sheet with new IR corporate template
IR WORLD HEADQUARTERS: 101 N. Sepulveda Blvd., El Segundo, California 90245, USA
To contact International Rectifier, please visit http://www.irf.com/whoto-call/
9
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December 16, 2013
相关型号:
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Power Field-Effect Transistor, 19A I(D), 25V, 0.0052ohm, 1-Element, N-Channel, Silicon, Metal-oxide Semiconductor FET, QFN-8
INFINEON
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