2SK2796S [HITACHI]

Silicon N Channel MOS FET High Speed Power Switching; 硅N沟道MOS FET高速电源开关
2SK2796S
型号: 2SK2796S
厂家: HITACHI SEMICONDUCTOR    HITACHI SEMICONDUCTOR
描述:

Silicon N Channel MOS FET High Speed Power Switching
硅N沟道MOS FET高速电源开关

晶体 开关 晶体管 功率场效应晶体管 电源开关
文件: 总10页 (文件大小:57K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
2SK2796(L), 2SK2796(S)  
Silicon N Channel MOS FET  
High Speed Power Switching  
ADE-208-534C (Z)  
4th. Edition  
Jun 1998  
Features  
Low on-resistance  
RDS(on) = 0.12typ.  
4V gate drive devices.  
High speed switching  
Outline  
DPAK |1  
4
4
D
1
2
3
G
1. Gate  
2. Drain  
3. Source  
4. Drain  
1
2
3
S
2SK2796(L), 2SK2796(S)  
Absolute Maximum Ratings (Ta = 25°C)  
Item  
Symbol  
VDSS  
Ratings  
Unit  
V
Drain to source voltage  
Gate to source voltage  
Drain current  
60  
VGSS  
ID  
±20  
V
5
A
Note1  
Drain peak current  
ID(pulse)  
20  
A
Body-drain diode reverse drain current IDR  
5
A
Note3  
Note3  
Avalanche current  
Avalanche energy  
Channel dissipation  
Channel temperature  
Storage temperature  
IAP  
5
A
EAR  
2.14  
mJ  
W
°C  
°C  
Pch Note2  
20  
Tch  
150  
Tstg  
–55 to +150  
Note: 1. PW 10µs, duty cycle 1 %  
2. Value at Tc = 25°C  
3. Value at Tch = 25°C, Rg 50 Ω  
2
2SK2796(L), 2SK2796(S)  
Electrical Characteristics (Ta = 25°C)  
Item  
Symbol Min  
Typ  
Max  
Unit  
V
Test Conditions  
Drain to source breakdown voltage V(BR)DSS 60  
ID = 10mA, VGS = 0  
IG = ±100µA, VDS = 0  
VDS = 60 V, VGS = 0  
VGS = ±16V, VDS = 0  
ID = 1mA, VDS = 10V  
ID = 3 A, VGS = 10VNote4  
Gate to source breakdown voltage V(BR)GSS ±20  
V
Zero gate voltege drain current  
Gate to source leak current  
Gate to source cutoff voltage  
IDSS  
1.0  
10  
µA  
µA  
V
IGSS  
±10  
2.0  
0.16  
VGS(off)  
RDS(on)  
Static drain to source on state  
resistance  
0.12  
Static drain to source on state  
resistance  
RDS(on)  
0.16  
0.25  
ID = 3A, VGS = 4VNote4  
Forward transfer admittance  
Input capacitance  
Output capacitance  
Reverse transfer capacitance  
Turn-on delay time  
Rise time  
|yfs|  
Ciss  
Coss  
Crss  
td(on)  
tr  
2.5  
4.0  
180  
90  
30  
9
S
ID = 3A, VDS = 10VNote4  
VDS = 10V  
pF  
pF  
pF  
ns  
ns  
ns  
ns  
V
VGS = 0  
f = 1MHz  
VGS = 10V, ID = 3A  
RL = 10Ω  
25  
35  
55  
1.0  
40  
Turn-off delay time  
Fall time  
td(off)  
tf  
Body–drain diode forward voltage VDF  
IF = 5A, VGS = 0  
Body–drain diode reverse  
recovery time  
trr  
ns  
IF = 5A, VGS = 0  
diF/ dt =50A/µs  
Note: 4. Pulse test  
3
2SK2796(L), 2SK2796(S)  
Main Characteristics  
Power vs. Temperature Derating  
40  
Maximum Safe Operation Area  
100  
30  
10  
30  
20  
10  
DC Operation (Tc = 25°C)  
3
1
Operation in  
this area is  
limited by R  
DS(on)  
5
0.3  
0.1  
Ta = 25°C  
0
50  
100  
150  
200  
0.2 0.5  
1
2
10 20  
50 100  
(V)  
Drain to Source Voltage  
V
DS  
Ambient Temperature Ta (°C)  
Typical Output Characteristics  
6 V  
Typical Transfer Characteristics  
10 V  
5
5
4
3
2
1
5 V  
4 V  
3.5 V  
25°C  
–25°C  
Pulse Test  
3 V  
4
3
2
1
Tc = 75°C  
2.5 V  
V
= 10 V  
DS  
V
= 2 V  
8
GS  
Pulse Test  
0
0
2
4
6
8
(V)  
GS  
10  
2
4
6
10  
Gate to Source Voltage  
V
Drain to Source Voltage  
V
(V)  
DS  
4
2SK2796(L), 2SK2796(S)  
Drain to Source Saturation Voltage vs.  
Gate to Source Voltage  
Static Drain to Source on State Resistance  
vs. Drain Current  
5
2.0  
1.6  
1.2  
0.8  
0.4  
Pulse Test  
Pulse Test  
2
1
0.5  
I
= 5 A  
D
V
GS  
= 4 V  
10 V  
0.2  
0.1  
2 A  
1 A  
0.05  
6
0
2
4
8
10  
0.1 0.3  
1
3
10  
30  
(A)  
100  
Gate to Source Voltage  
V
(V)  
GS  
Drain Current  
I
D
Forward Transfer Admittance vs.  
Drain Current  
Static Drain to Source on State Resistance  
vs. Temperature  
10  
5
0.5  
Pulse Test  
Tc = –25 °C  
0.4  
0.3  
0.2  
0.1  
1 A  
25 °C  
2 A  
2
I
= 5 A  
D
75 °C  
1
V
= 4 V  
GS  
0.5  
5 A  
1, 2 A  
0.2  
0.1  
V
= 10 V  
DS  
Pulse Test  
10 V  
0
–40  
0.5  
1
2
5
0
40  
80  
120  
160  
0.1 0.2  
10  
Case Temperature Tc (°C)  
Drain Current  
I
(A)  
D
5
2SK2796(L), 2SK2796(S)  
Body–Drain Diode Reverse  
Typical Capacitance vs.  
Drain to Source Voltage  
Recovery Time  
1000  
500  
500  
V
GS  
= 0  
f = 1 MHz  
200  
200  
100  
50  
100  
50  
Ciss  
Coss  
20  
10  
20  
10  
di / dt = 50 A / µs  
Crss  
40  
V
= 0, Ta = 25 °C  
GS  
5
0.1 0.2  
0.5  
1
2
5
10  
0
10  
20  
30  
50  
Reverse Drain Current  
I
(A)  
DR  
Drain to Source Voltage  
V
(V)  
DS  
Dynamic Input Characteristics  
= 5 A  
Switching Characteristics  
100  
80  
60  
40  
20  
20  
100  
50  
I
D
t
d(off)  
V
= 10 V  
25 V  
16  
12  
8
DD  
t
f
t
50 V  
r
20  
V
DS  
t
d(on)  
10  
5
V
GS  
4
0
V
= 50 V  
25 V  
DD  
V
= 10 V, V  
GS  
= 30 V  
2
1
DD  
PW = 5 µs, duty < 1 %  
10 V  
0
0.5  
1
2
5
2
4
6
8
10  
0.1 0.2  
10  
Gate Charge Qg (nc)  
Drain Current  
I
(A)  
D
6
2SK2796(L), 2SK2796(S)  
Maximun Avalanche Energy vs.  
Channel Temperature Derating  
Reverse Drain Current vs.  
Source to Drain Voltage  
10  
8
2.5  
2.0  
1.5  
1.0  
I
= 5 A  
AP  
V
= 25 V  
DD  
duty < 0.1 %  
5 V  
W
Rg > 50  
6
10 V  
V
= 0, –5 V  
GS  
4
2
0.5  
0
Pulse Test  
1.6 2.0  
0
0.4  
0.8  
1.2  
25  
50  
75  
100  
125  
150  
Source to Drain Voltage  
V
(V)  
Channel Temperature Tch (°C)  
SD  
Avalanche Test Circuit  
Avalanche Waveform  
V
DSS  
– V  
1
2
2
E
=
• L • I  
AP  
AR  
V
DSS  
DD  
L
V
DS  
Monitor  
I
AP  
Monitor  
V
(BR)DSS  
I
AP  
Rg  
V
V
DD  
D. U. T  
DS  
I
D
Vin  
15 V  
50W  
V
DD  
0
7
2SK2796(L), 2SK2796(S)  
Normalized Transient Thermal Impedance vs. Pulse Width  
3
1
Tc = 25°C  
D = 1  
0.5  
0.3  
0.1  
q
q
g
q
ch – c(t) = s (t) • ch – c  
ch – c = 6.25 °C/W, Tc = 25 °C  
PW  
T
P
DM  
D =  
0.03  
0.01  
PW  
T
10 µ  
100 µ  
1 m  
10 m  
100 m  
1
10  
Pulse Width PW (S)  
Switching Time Test Circuit  
Waveform  
Vout  
Monitor  
Vin Monitor  
D.U.T.  
90%  
R
L
10%  
10%  
90%  
Vin  
V
DD  
Vin  
10 V  
Vout  
10%  
50W  
= 30 V  
90%  
td(off)  
td(on)  
t
f
tr  
8
2SK2796(L), 2SK2796(S)  
Package Dimensions  
Unit: mm  
2.3 ± 0.5  
0.55 ± 0.1  
6.5 ± 0.5  
5.4 ± 0.5  
2.3 ± 0.5  
0.55 ± 0.1  
6.5 ± 0.5  
5.4 ± 0.5  
1.15 ± 0.1  
0.8 ± 0.1  
0 ~ 0.25  
1.15 ± 0.1  
0.8 ± 0.1  
0.55 ± 0.1  
2.29 ± 0.5  
2.29 ± 0.5  
2.29 ± 0.5  
0.55 ± 0.1  
2.29 ± 0.5  
1.5 Max  
DPAK  
SC–63  
SC–64  
Hitachi Code  
EIAJ ( L type)  
EIAJ ( S type)  
JEDEC  
type  
type  
S
L
9
Cautions  
1. Hitachi neither warrants nor grants licenses of any rights of Hitachi’s or any third party’s patent,  
copyright, trademark, or other intellectual property rights for information contained in this document.  
Hitachi bears no responsibility for problems that may arise with third party’s rights, including  
intellectual property rights, in connection with use of the information contained in this document.  
2. Products and product specifications may be subject to change without notice. Confirm that you have  
received the latest product standards or specifications before final design, purchase or use.  
3. Hitachi makes every attempt to ensure that its products are of high quality and reliability. However,  
contact Hitachi’s sales office before using the product in an application that demands especially high  
quality and reliability or where its failure or malfunction may directly threaten human life or cause risk  
of bodily injury, such as aerospace, aeronautics, nuclear power, combustion control, transportation,  
traffic, safety equipment or medical equipment for life support.  
4. Design your application so that the product is used within the ranges guaranteed by Hitachi particularly  
for maximum rating, operating supply voltage range, heat radiation characteristics, installation  
conditions and other characteristics. Hitachi bears no responsibility for failure or damage when used  
beyond the guaranteed ranges. Even within the guaranteed ranges, consider normally foreseeable  
failure rates or failure modes in semiconductor devices and employ systemic measures such as fail-  
safes, so that the equipment incorporating Hitachi product does not cause bodily injury, fire or other  
consequential damage due to operation of the Hitachi product.  
5. This product is not designed to be radiation resistant.  
6. No one is permitted to reproduce or duplicate, in any form, the whole or part of this document without  
written approval from Hitachi.  
7. Contact Hitachi’s sales office for any questions regarding this document or Hitachi semiconductor  
products.  
Hitachi, Ltd.  
Semiconductor & Integrated Circuits.  
Nippon Bldg., 2-6-2, Ohte-machi, Chiyoda-ku, Tokyo 100-0004, Japan  
Tel: Tokyo (03) 3270-2111 Fax: (03) 3270-5109  
URL  
NorthAmerica  
Europe  
: http:semiconductor.hitachi.com/  
: http://www.hitachi-eu.com/hel/ecg  
Asia (Singapore)  
Asia (Taiwan)  
: http://www.has.hitachi.com.sg/grp3/sicd/index.htm  
: http://www.hitachi.com.tw/E/Product/SICD_Frame.htm  
Asia (HongKong) : http://www.hitachi.com.hk/eng/bo/grp3/index.htm  
Japan  
: http://www.hitachi.co.jp/Sicd/indx.htm  
For further information write to:  
Hitachi Semiconductor  
(America) Inc.  
Hitachi Europe GmbH  
Hitachi Asia (Hong Kong) Ltd.  
Group III (Electronic Components)  
7/F., North Tower, World Finance Centre,  
Harbour City, Canton Road, Tsim Sha Tsui,  
Kowloon, Hong Kong  
Tel: <852> (2) 735 9218  
Fax: <852> (2) 730 0281  
Hitachi Asia Pte. Ltd.  
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Hitachi Tower  
Singapore 049318  
Tel: 535-2100  
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D-85622 Feldkirchen, Munich  
Germany  
Tel: <49> (89) 9 9180-0  
Fax: <49> (89) 9 29 30 00  
179 East Tasman Drive,  
San Jose,CA 95134  
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Fax: <1>(408) 433-0223  
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Taipei Branch Office  
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Tun-Hwa North Road, Taipei (105)  
Tel: <886> (2) 2718-3666  
Fax: <886> (2) 2718-8180  
Telex: 40815 HITEC HX  
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Electronic Components Group.  
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Lower Cookham Road  
Maidenhead  
Berkshire SL6 8YA, United Kingdom  
Tel: <44> (1628) 585000  
Fax: <44> (1628) 778322  
Copyright ' Hitachi, Ltd., 1999. All rights reserved. Printed in Japan.  

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