2SK2800 [HITACHI]

Silicon N Channel MOS FET High Speed Power Switching; 硅N沟道MOS FET高速电源开关
2SK2800
型号: 2SK2800
厂家: HITACHI SEMICONDUCTOR    HITACHI SEMICONDUCTOR
描述:

Silicon N Channel MOS FET High Speed Power Switching
硅N沟道MOS FET高速电源开关

开关 电源开关
文件: 总10页 (文件大小:54K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
2SK2800  
Silicon N Channel MOS FET  
High Speed Power Switching  
ADE-208-513G (Z)  
8th. Edition  
Jun 1998  
Features  
Low on-resistance  
RDS(on) = 15 mtyp.  
High speed switching  
Low drive current  
4V gate drive device can be driven from 5V source  
Outline  
TO–220AB  
D
G
1. Gate  
2. Drain (Flange)  
3. Source  
1
2
3
S
2SK2800  
Absolute Maximum Ratings (Ta = 25°C)  
Item  
Symbol  
VDSS  
Ratings  
Unit  
V
Drain to source voltage  
Gate to source voltage  
Drain current  
60  
VGSS  
ID  
±20  
V
40  
A
Note1  
Drain peak current  
ID(pulse)  
160  
A
Body-drain diode reverse drain current IDR  
40  
A
Note 3  
Note 3  
Avalanche current  
Avalanche energy  
Channel dissipation  
Channel temperature  
Storage temperature  
IAP  
40  
A
EAR  
137  
mJ  
W
°C  
°C  
Pch Note 2  
50  
Tch  
150  
Tstg  
–55 to +150  
Note: 1. PW 10µs, duty cycle 1 %  
2. Value at Tc = 25°C  
3. Value at Tch = 25°C, Rg 50Ω  
2
2SK2800  
Electrical Characteristics (Ta = 25°C)  
Item  
Symbol Min  
Typ  
Max  
Unit  
V
Test Conditions  
Drain to source breakdown voltage V(BR)DSS 60  
ID = 10mA, VGS = 0  
IG = ±100µA, VDS = 0  
VGS = ±16V, VDS = 0  
VDS = 60 V, VGS = 0  
ID = 1mA, VDS = 10V  
ID = 20A, VGS = 10VNote4  
ID = 20A, VGS = 4VNote4  
ID = 20A, VDS = 10VNote4  
VDS = 10V  
Gate to source breakdown voltage V(BR)GSS ±20  
V
Gate to source leak current  
Zero gate voltege drain current  
Gate to source cutoff voltage  
Static drain to source on state  
resistance  
IGSS  
1.5  
20  
±10  
10  
2.5  
20  
40  
µA  
µA  
V
IDSS  
VGS(off)  
RDS(on)  
RDS(on)  
|yfs|  
15  
mΩ  
mΩ  
S
25  
Forward transfer admittance  
Input capacitance  
35  
Ciss  
Coss  
Crss  
td(on)  
tr  
1500  
720  
200  
20  
pF  
pF  
pF  
ns  
ns  
ns  
ns  
V
Output capacitance  
Reverse transfer capacitance  
Turn-on delay time  
VGS = 0  
f = 1MHz  
ID = 20A, RL = 1.5Ω  
VGS = 10V  
Rise time  
180  
200  
200  
0.95  
70  
Turn-off delay time  
td(off)  
tf  
Fall time  
Body–drain diode forward voltage VDF  
IF = 40A, VGS = 0  
Body–drain diode reverse  
recovery time  
trr  
V
IF = 40A, VGS = 0  
diF/ dt =50A/µs  
Note: 4. Pulse test  
3
2SK2800  
Main Characteristics  
Power vs. Temperature Derating  
Maximum Safe Operation Area  
100  
75  
1000  
300  
100  
30  
10  
50  
3
1
Operation in  
this area is  
limited by R  
25  
DS(on)  
3
0.3  
0.1  
Ta = 25 °C  
0
30  
(V)  
50  
100  
150  
200  
0.1 0.3  
1
10  
100  
Drain to Source Voltage  
V
DS  
Case Temperature Tc (°C)  
Typical Transfer Characteristics  
Typical Output Characteristics  
50  
40  
30  
20  
10  
50  
40  
30  
20  
10  
10 V  
6 V  
4.5 V  
V
= 10 V  
DS  
Pulse Test  
4 V  
Pulse Test  
Tc = 75°C  
25°C  
3.5 V  
–25°C  
V
= 3 V  
8
GS  
0
0
1
2
3
4
(V)  
5
2
4
6
10  
Gate to Source Voltage  
V
GS  
Drain to Source Voltage  
V
(V)  
DS  
4
2SK2800  
Drain to Source Saturation Voltage vs.  
Gate to Source Voltage  
Static Drain to Source on State Resistance  
vs. Drain Current  
0.5  
2.0  
1.6  
1.2  
0.8  
0.4  
Pulse Test  
Pulse Test  
0.2  
0.1  
0.05  
I
= 50 A  
D
V
GS  
= 4 V  
10 V  
0.02  
0.01  
20 A  
10 A  
0.005  
12  
Gate to Source Voltage  
0
4
8
16  
20  
1
2
5
10 20  
50 100  
(A)  
V
(V)  
Drain Current  
I
GS  
D
Forward Transfer Admittance vs.  
Drain Current  
Static Drain to Source on State Resistance  
vs. Temperature  
100  
50  
0.05  
Pulse Test  
Tc = –25 °C  
0.04  
0.03  
0.02  
0.01  
I
= 20 A  
D
25 °C  
75 °C  
20  
10 A  
V
= 4 V  
GS  
10  
5
50 A  
10, 20 A  
10 V  
0
2
1
V
= 10 V  
DS  
Pulse Test  
0
–40  
1
10 20 50  
40  
80  
120  
160  
5
100  
2
Case Temperature Tc (°C)  
Drain Current  
I
(A)  
D
5
2SK2800  
Body–Drain Diode Reverse  
Recovery Time  
Typical Capacitance vs.  
Drain to Source Voltage  
5000  
1000  
500  
V
GS  
= 0  
f = 1 MHz  
2000  
1000  
500  
Ciss  
200  
100  
50  
Coss  
200  
100  
Crss  
20  
10  
di / dt = 50 A / µs  
V
= 0, Ta = 25 °C  
GS  
50  
0.1 0.3  
1
3
10  
30  
(A)  
100  
0
10  
20  
30  
40  
50  
Reverse Drain Current  
I
DR  
Drain to Source Voltage  
V
(V)  
DS  
Dynamic Input Characteristics  
= 40 A  
Switching Characteristics  
100  
80  
20  
1000  
I
D
t
d(off)  
300  
100  
16  
12  
8
V
= 10 V  
25 V  
DD  
t
f
50 V  
60  
V
V
t
GS  
r
DS  
30  
10  
t
d(on)  
40  
20  
4
0
V
= 50 V  
25 V  
10 V  
3
1
DD  
V
= 10 V, V  
= 30 V  
GS  
DD  
PW = 5 µs, duty < 1 %  
10 30  
(A)  
0
8
16  
24  
32  
40  
0.1 0.3  
1
3
100  
Gate Charge Qg (nc)  
Drain Current  
I
D
6
2SK2800  
Maximum Avalanche Energy vs.  
Channel Temperature Derating  
Reverse Drain Current vs.  
Source to Drain Voltage  
50  
40  
30  
20  
10  
200  
160  
120  
80  
I
= 40 A  
AP  
V
= 25 V  
DD  
duty < 1 %  
W
10 V  
Rg > 50  
5 V  
V
= 0, –5 V  
GS  
1.2  
40  
0
Pulse Test  
1.6 2.0  
0
0.4  
0.8  
25  
50  
75  
100  
125  
150  
Channel Temperature Tch (°C)  
Source to Drain Voltage  
V
(V)  
SD  
Avalanche Test Circuit  
Avalanche Waveform  
V
DSS  
– V  
1
2
2
E
=
• L • I  
AP  
AR  
V
DSS  
DD  
L
V
DS  
Monitor  
I
AP  
Monitor  
V
(BR)DSS  
I
AP  
Rg  
V
V
DD  
D. U. T  
DS  
I
D
Vin  
15 V  
50W  
V
DD  
0
7
2SK2800  
Normalized Transient Thermal Impedance vs. Pulse Width  
3
1
Tc = 25°C  
D = 1  
0.5  
0.3  
0.1  
q
q
g
q
ch – c(t) = s (t) • ch – c  
ch – c = 2.5 °C/W, Tc = 25 °C  
PW  
T
P
DM  
D =  
0.03  
0.01  
PW  
T
10 µ  
100 µ  
1 m  
10 m  
100 m  
1
10  
Pulse Width PW (S)  
Switching Time Test Circuit  
Waveform  
Vout  
Monitor  
Vin Monitor  
D.U.T.  
90%  
R
L
10%  
10%  
90%  
Vin  
V
DD  
Vin  
10 V  
Vout  
10%  
50W  
= 30 V  
90%  
td(off)  
td(on)  
t
f
tr  
8
2SK2800  
Package Dimensions  
Unit: mm  
10.16±0.2  
9.5  
+ 0.1  
– 0.08  
4.44±0.2  
f 3.6  
8.0  
1.26±0.15  
1.2±0.1  
1.27±0.1  
1.5 max  
0.5±0.1  
2.7 max  
0.76 ±0.1  
2.54 ±0.5  
2.54 ±0.5  
TO–220AB  
SC–46  
Hitachi Code  
EIAJ  
JEDEC  
9
Cautions  
1. Hitachi neither warrants nor grants licenses of any rights of Hitachi’s or any third party’s patent,  
copyright, trademark, or other intellectual property rights for information contained in this document.  
Hitachi bears no responsibility for problems that may arise with third party’s rights, including  
intellectual property rights, in connection with use of the information contained in this document.  
2. Products and product specifications may be subject to change without notice. Confirm that you have  
received the latest product standards or specifications before final design, purchase or use.  
3. Hitachi makes every attempt to ensure that its products are of high quality and reliability. However,  
contact Hitachi’s sales office before using the product in an application that demands especially high  
quality and reliability or where its failure or malfunction may directly threaten human life or cause risk  
of bodily injury, such as aerospace, aeronautics, nuclear power, combustion control, transportation,  
traffic, safety equipment or medical equipment for life support.  
4. Design your application so that the product is used within the ranges guaranteed by Hitachi particularly  
for maximum rating, operating supply voltage range, heat radiation characteristics, installation  
conditions and other characteristics. Hitachi bears no responsibility for failure or damage when used  
beyond the guaranteed ranges. Even within the guaranteed ranges, consider normally foreseeable  
failure rates or failure modes in semiconductor devices and employ systemic measures such as fail-  
safes, so that the equipment incorporating Hitachi product does not cause bodily injury, fire or other  
consequential damage due to operation of the Hitachi product.  
5. This product is not designed to be radiation resistant.  
6. No one is permitted to reproduce or duplicate, in any form, the whole or part of this document without  
written approval from Hitachi.  
7. Contact Hitachi’s sales office for any questions regarding this document or Hitachi semiconductor  
products.  
Hitachi, Ltd.  
Semiconductor & Integrated Circuits.  
Nippon Bldg., 2-6-2, Ohte-machi, Chiyoda-ku, Tokyo 100-0004, Japan  
Tel: Tokyo (03) 3270-2111 Fax: (03) 3270-5109  
URL  
NorthAmerica  
Europe  
: http:semiconductor.hitachi.com/  
: http://www.hitachi-eu.com/hel/ecg  
Asia (Singapore)  
Asia (Taiwan)  
: http://www.has.hitachi.com.sg/grp3/sicd/index.htm  
: http://www.hitachi.com.tw/E/Product/SICD_Frame.htm  
Asia (HongKong) : http://www.hitachi.com.hk/eng/bo/grp3/index.htm  
Japan  
: http://www.hitachi.co.jp/Sicd/indx.htm  
For further information write to:  
Hitachi Semiconductor  
(America) Inc.  
Hitachi Europe GmbH  
Hitachi Asia (Hong Kong) Ltd.  
Group III (Electronic Components)  
7/F., North Tower, World Finance Centre,  
Harbour City, Canton Road, Tsim Sha Tsui,  
Kowloon, Hong Kong  
Tel: <852> (2) 735 9218  
Fax: <852> (2) 730 0281  
Hitachi Asia Pte. Ltd.  
16 Collyer Quay #20-00  
Hitachi Tower  
Singapore 049318  
Tel: 535-2100  
Electronic components Group  
Dornacher Stra§e 3  
D-85622 Feldkirchen, Munich  
Germany  
Tel: <49> (89) 9 9180-0  
Fax: <49> (89) 9 29 30 00  
179 East Tasman Drive,  
San Jose,CA 95134  
Tel: <1> (408) 433-1990  
Fax: <1>(408) 433-0223  
Fax: 535-1533  
Hitachi Asia Ltd.  
Taipei Branch Office  
3F, Hung Kuo Building. No.167,  
Tun-Hwa North Road, Taipei (105)  
Tel: <886> (2) 2718-3666  
Fax: <886> (2) 2718-8180  
Telex: 40815 HITEC HX  
Hitachi Europe Ltd.  
Electronic Components Group.  
Whitebrook Park  
Lower Cookham Road  
Maidenhead  
Berkshire SL6 8YA, United Kingdom  
Tel: <44> (1628) 585000  
Fax: <44> (1628) 778322  
Copyright ' Hitachi, Ltd., 1999. All rights reserved. Printed in Japan.  

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