2N7002KB_15 [GOOD-ARK]

60V N-Channel MOSFET;
2N7002KB_15
型号: 2N7002KB_15
厂家: GOOD-ARK ELECTRONICS    GOOD-ARK ELECTRONICS
描述:

60V N-Channel MOSFET

文件: 总6页 (文件大小:675K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
2N7002KB  
60V N-Channel MOSFET  
Main Product Characteristics  
VDSS  
RDS(on)  
ID  
60V  
2Ω(max.)  
0.3A  
MarkingandPin  
Assignment  
SOT-23  
SchematicDiagram  
Features and Benefits  
AdvancedMOSFETprocesstechnology  
Special designed for PWM, load switching and  
generalpurposeapplications  
Ultralowon-resistancewithlowgatecharge  
Fastswitching andreversebodyrecovery  
ESDRating1000VHBM  
150operating temperature  
Leadfreeproduct  
Description  
It utilizes the latest processing techniques to achieve the high cell density and reduces the on-resistance with  
high repetitive avalanche rating. These features combine to make this design an extremely efficient and reliable  
devicefor useinpower switching applicationandawidevarietyof other applications.  
Absolute Max Rating  
Symbol  
ID @ TC = 25°C  
IDM  
Parameter  
Max.  
0.3  
Units  
Continuous Drain Current, VGS @ 10V①  
Pulsed Drain Current②  
A
1.2  
PD @TC = 25°C  
VDS  
0.63  
W
V
Power Dissipation③  
Drain-Source Voltage  
60  
VGS  
Gate-to-Source Voltage  
± 20  
V
TJ TSTG  
Operating Junction and Storage Temperature Range  
-55 to +150  
°C  
Thermal Resistance  
Symbol  
Characteristics  
Junction-to-ambient (t ≤ 10s) ④  
Typ.  
Max.  
Units  
RθJA  
200  
/W  
www.goodark.com  
Page 1 of 6  
Rev.1.0  
2N7002KB  
60V N-Channel MOSFET  
Electrical Characteristics @TA=25unless otherwise specified  
Symbol Parameter  
Min.  
60  
1
Typ.  
Max.  
Units  
Conditions  
V(BR)DSS Drain-to-Source breakdown voltage  
V
VGS = 0V, ID = 250μA  
VGS=10V, ID=0.5A  
VGS=5V, ID=0.05A  
VDS = VGS, ID = 250μA  
VDS = 60V,VGS = 0V  
VGS=±5V,VDS=0V  
VGS=±20V,VDS=0V  
1.5  
2
RDS(on)  
Static Drain-to-Source on-resistance  
Ω
3
VGS(th)  
IDSS  
Gate threshold voltage  
2.5  
1
V
Drain-to-Source leakage current  
μA  
nA  
uA  
±100  
±10  
25  
IGSS  
Gate-to-Source forward leakage  
td(on)  
Turn-on delay time  
VGS=10V, VDS=30V,  
ID=0.2A,RGEN=10Ω  
ns  
td(off)  
Ciss  
Coss  
Crss  
Turn-Off delay time  
40  
35  
Input capacitance  
VGS = 0V  
VDS = 25V  
ƒ = 1MHz  
pF  
Output capacitance  
16.6  
9.5  
Reverse transfer capacitance  
Source-Drain Ratings and Characteristics  
Symbol  
Parameter  
Continuous Source Current  
(Body Diode)  
Min.  
Typ.  
Max.  
Units  
Conditions  
MOSFET symbol  
showing the  
IS  
0.3  
A
integral reverse  
p-n junction diode.  
IS=0.2A, VGS=0V  
Pulsed Source Current  
(Body Diode)  
ISM  
VSD  
1.2  
1.3  
A
V
Diode Forward Voltage  
www.goodark.com  
Page 2 of 6  
Rev.1.0  
2N7002KB  
60V N-Channel MOSFET  
Test circuits and Waveforms  
aveforms:  
Notes:  
The maximum current rating is limited by bond-wires.  
Repetitive rating; pulse width limited by max. junction temperature.  
The power dissipation PD is based on max. junction temperature, using junction-to-case thermal  
resistance.  
The value of RθJA is measured with the device mounted on 1in 2 FR-4 board with 2oz. Copper, in a  
still air environment with TA =25°C  
These curves are based on the junction-to-case thermal impedence which is measured with the  
device mounted to a large heatsink, assuming a maximum junction temperature of TJ(MAX)=150°C.  
www.goodark.com  
Page 3 of 6  
Rev.1.0  
2N7002KB  
60V N-Channel MOSFET  
Typical Electrical and Thermal Characteristics  
Figure 1. Power Dissipation Vs. Case Temperature  
Figure 2.Typical Capacitance Vs. Drain-to-Source  
Voltage  
Figure3. Maximum Effective Transient Thermal Impedance, Junction-to-Case  
www.goodark.com  
Page 4 of 6  
Rev.1.0  
2N7002KB  
60V N-Channel MOSFET  
Mechanical Data  
www.goodark.com  
Page 5 of 6  
Rev.1.0  
2N7002KB  
60V N-Channel MOSFET  
Ordering and Marking Information  
Device Marking: S72K  
Package (Available)  
SOT-23  
Operating Temperature Range  
C : -55 to 150 ºC  
Devices per Unit  
Package Units/ Tapes/Inner  
Units/Inner Inner  
Units/  
Type  
Tape  
Box  
Box  
Boxes/Carton Carton  
Box  
Box  
SOT-23  
3000  
10  
30000  
4
120000  
Reliability Test Program  
Test Item  
High  
Conditions  
Tj=125to 150@  
Duration Sample Size  
168 hours  
500 hours  
1000 hours  
3 lots x 77 devices  
Temperature  
Reverse  
80% of Max  
V
DSS/VCES/VR  
Bias(HTRB)  
High  
Tj=150@ 100% of  
168 hours  
500 hours  
1000 hours  
3 lots x 77 devices  
Temperature  
Gate  
Max VGSS  
Bias(HTGB)  
www.goodark.com  
Page 6 of 6  
Rev.1.0  

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