FDD4141_10 [FAIRCHILD]

P-Channel PowerTrench® MOSFET -40V, -50A, 12.3mΩ; P沟道MOSFET PowerTrench® -40V , -50A , 12.3mÎ ©
FDD4141_10
型号: FDD4141_10
厂家: FAIRCHILD SEMICONDUCTOR    FAIRCHILD SEMICONDUCTOR
描述:

P-Channel PowerTrench® MOSFET -40V, -50A, 12.3mΩ
P沟道MOSFET PowerTrench® -40V , -50A , 12.3mÎ ©

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October 2010  
FDD4141_F085  
P-Channel PowerTrench® MOSFET  
-40V, -50A, 12.3mΩ  
Features  
General Description  
„ Max rDS(on) = 12.3mΩ at VGS = -10V, ID = -12.7A  
„ Max rDS(on) = 18.0mΩ at VGS = -4.5V, ID = -10.4A  
„ High performance trench technology for extremely low rDS(on)  
„ Qualified to AEC Q101  
This P-Channel MOSFET has been produced using Fairchild  
Semiconductor’s proprietary PowerTrench® technology to  
deliver low rDS(on) and optimized Bvdss capability to offer  
superior performance benefit in the applications. and optimized  
switching performance capability reducing power dissipation  
losses in converter/inverter applications.  
„ RoHS Compliant  
Applications  
„ Inverter  
„ Power Supplies  
S
D
G
G
S
D-PAK  
(TO-252)  
D
MOSFET Maximum Ratings TC = 25°C unless otherwise noted  
Symbol  
VDS  
VGS  
Parameter  
Ratings  
-40  
Units  
Drain to Source Voltage  
Gate to Source Voltage  
V
V
±20  
Drain Current -Continuous (Package limited)  
-Continuous (Silicon limited)  
-Continuous  
TC = 25°C  
C = 25°C  
-50  
T
-58  
ID  
A
TA = 25°C  
(Note 1a)  
(Note 3)  
-10.8  
-100  
337  
-Pulsed  
EAS  
Single Pulse Avalanche Energy  
Power Dissipation  
mJ  
W
TC = 25°C  
TA = 25°C  
69  
PD  
Power Dissipation  
(Note 1a)  
2.4  
TJ, TSTG  
Operating and Storage Junction Temperature Range  
-55 to +150  
°C  
Thermal Characteristics  
RθJC  
RθJA  
Maximum Thermal Resistance, Junction to Case  
Maximum Thermal Resistance, Junction to Ambient  
1.8  
52  
°C/W  
(Note 1a)  
Package Marking and Ordering Information  
Device Marking  
Device  
Package  
Reel Size  
13’’  
Tape Width  
12mm  
Quantity  
FDD4141  
FDD4141_F085  
D-PAK (TO-252)  
2500 units  
www.fairchildsemi.com  
©2010 Fairchild Semiconductor Corporation  
FDD4141_F085 Rev.C  
1
Electrical Characteristics TJ = 25°C unless otherwise noted  
Symbol  
Parameter  
Test Conditions  
Min  
Typ  
Max  
Units  
Off Characteristics  
BVDSS  
Drain to Source Breakdown Voltage  
ID = -250μA, VGS = 0V  
-40  
V
ΔBVDSS  
ΔTJ  
Breakdown Voltage Temperature  
Coefficient  
I
D = -250μA, referenced to 25°C  
-29  
mV/°C  
IDSS  
IGSS  
Zero Gate Voltage Drain Current  
Gate to Source Leakage Current  
VDS = -32V, VGS = 0V  
VGS = ±20V, VDS = 0V  
-1  
μA  
±100  
nA  
On Characteristics  
VGS(th)  
Gate to Source Threshold Voltage  
VGS = VDS, ID = -250μA  
-1  
-1.8  
5.8  
-3  
V
ΔVGS(th)  
ΔTJ  
Gate to Source Threshold Voltage  
Temperature Coefficient  
ID = -250μA, referenced to 25°C  
mV/°C  
V
GS = -10V, ID = -12.7A  
10.1  
14.5  
12.3  
18.0  
VGS = -4.5V, ID = -10.4A  
rDS(on)  
Static Drain to Source On Resistance  
Forward Transconductance  
mΩ  
VGS = -10V, ID = -12.7A,  
TJ = 125°C  
15.3  
38  
18.7  
gFS  
VDS = -5V, ID = -12.7A  
S
Dynamic Characteristics  
Ciss  
Coss  
Crss  
Rg  
Input Capacitance  
2085  
360  
210  
4.6  
2775  
480  
pF  
pF  
pF  
Ω
VDS = -20V, VGS = 0V,  
f = 1MHz  
Output Capacitance  
Reverse Transfer Capacitance  
Gate Resistance  
310  
f = 1MHz  
Switching Characteristics  
td(on)  
tr  
td(off)  
tf  
Turn-On Delay Time  
Rise Time  
10  
7
19  
13  
60  
27  
50  
27  
ns  
ns  
VDD = -20V, ID = -12.7A,  
V
GS = -10V, RGEN = 6Ω  
Turn-Off Delay Time  
Fall Time  
38  
15  
36  
19  
7
ns  
ns  
Qg  
Total Gate Charge  
Total Gate Charge  
Gate to Source Charge  
Gate to Drain “Miller” Charge  
VGS = 0V to -10V  
VGS = 0V to -5V  
nC  
nC  
nC  
nC  
VDD = -20V,  
D = -12.7A  
Qg  
I
Qgs  
Qgd  
8
Drain-Source Diode Characteristics  
VSD  
trr  
Source to Drain Diode Forward Voltage  
Reverse Recovery Time  
VGS = 0V, IS = -12.7A (Note 2)  
-0.8  
29  
-1.2  
44  
V
ns  
nC  
IF = -12.7A, di/dt = 100A/μs  
Qrr  
Reverse Recovery Charge  
26  
40  
Notes:  
1: R  
R
is the sum of the junction-to-case and case-to-ambient thermal resistance where the case thermal reference is defined as the solder mounting surface of the drain pins.  
θJA  
θJC  
is guaranteed by design while R  
is determined by the user’s board design.  
θJA  
a)  
52°C/W when mounted on a  
1 in pad of 2 oz copper  
b) 100°C/W when mounted  
on a minimum pad.  
2
2: Pulse Test: Pulse Width < 300μs, Duty cycle < 2.0%.  
3: Starting T = 25°C, L = 3mH, I = 15A, V = 40V, V = 10V.  
J
AS  
DD  
GS  
2
©2010 Fairchild Semiconductor Corporation  
FDD4141_F085 Rev.C  
www.fairchildsemi.com  
Typical Characteristics TJ = 25°C unless otherwise noted  
4.0  
3.5  
3.0  
2.5  
2.0  
1.5  
1.0  
0.5  
100  
PULSE DURATION = 80μs  
DUTY CYCLE = 0.5%MAX  
PULSE DURATION = 80μs  
DUTY CYCLE = 0.5%MAX  
80  
VGS = -3V  
V
= -4.5V  
GS  
VGS = -3.5V  
V
= -4V  
GS  
60  
40  
20  
0
V
= -10V  
GS  
VGS = -4V  
V
V
= -3.5V  
= -3V  
GS  
VGS = -4.5V  
VGS = -10V  
80  
GS  
0
20  
40  
60  
100  
0
1
2
3
4
5
-ID, DRAIN CURRENT(A)  
-VDS, DRAIN TO SOURCE VOLTAGE (V)  
Figure 1. On-Region Characteristics  
Figure2. N o r m a l i z e d O n - R e s i s ta n c e  
vs Drain Current and Gate Voltage  
1.8  
55  
PULSE DURATION = 80μs  
DUTY CYCLE = 0.5%MAX  
ID = -12.7A  
GS = -10V  
ID = -12.7A  
V
1.6  
1.4  
1.2  
1.0  
0.8  
0.6  
45  
35  
25  
15  
5
TJ = 125oC  
TJ = 25oC  
-75 -50 -25  
0
25 50 75 100 125 150  
2
4
6
8
10  
TJ, JUNCTION TEMPERATURE (oC)  
-VGS, GATE TO SOURCE VOLTAGE (V)  
F i gu re 3 . N orma li zed On - Res is ta nc e  
vs Junction Temperature  
Figure4. On-Resistance vs Gate to  
Source Voltage  
100  
100  
VGS = 0V  
PULSE DURATION = 80μs  
DUTY CYCLE = 0.5%MAX  
80  
60  
40  
20  
0
10  
1
VDS = -5V  
TJ = 150oC  
TJ = 25oC  
0.1  
TJ = 150oC  
TJ = 25oC  
0.01  
TJ = -55oC  
1.0  
TJ = -55oC  
1E-3  
1
2
3
4
5
0.0  
0.2  
0.4  
0.6  
0.8  
1.2  
-VGS, GATE TO SOURCE VOLTAGE (V)  
-VSD, BODY DIODE FORWARD VOLTAGE (V)  
Figure 5. Transfer Characteristics  
Figure6. Source to Drain Diode  
Forward Voltage vs Source Current  
3
©2010 Fairchild Semiconductor Corporation  
FDD4141_F085 Rev.C  
www.fairchildsemi.com  
Typical Characteristics TJ = 25°C unless otherwise noted  
10000  
1000  
100  
10  
ID = -12.7A  
8
Ciss  
VDD = -15V  
6
VDD = -20V  
VDD = -10V  
Coss  
4
2
0
f = 1MHz  
= 0V  
Crss  
V
GS  
40  
0.1  
1
10  
0
8
16  
24  
32  
40  
-VDS, DRAIN TO SOURCE VOLTAGE (V)  
Qg, GATE CHARGE(nC)  
Figure 7. Gate Charge Characteristics  
Figure8. C a p a c i t a n c e v s D r a i n  
to Source Voltage  
60  
50  
40  
30  
20  
10  
0
30  
10  
VGS = -4.5V  
VGS = -10V  
TJ = 125oC  
TJ = 25oC  
Limited by Package  
R
θJC = 1.8oC/W  
1
0.01  
0.1  
1
10  
100  
1000  
25  
50  
75  
100  
125  
150  
tAV, TIME IN AVALANCHE(ms)  
TC, CASE TEMPERATURE (oC)  
Figure9. U n c l a m p e d I n d u c t i v e  
Switching Capability  
Figure10. Maximum Continuous Drain  
Current vs Case Temperature  
200  
100  
10000  
VGS = -10V  
SINGLE PULSE  
100us  
o
RθJC = 1.8 C/W  
10  
1
1000  
1ms  
10ms  
DC  
SINGLE PULSE  
OPERATION IN THIS  
T
= MAX RATED  
J
100  
50  
AREA MAY BE  
LIMITED BY r  
o
T
= 25  
C
C
DS(on)  
0.1  
10-5 10-4 10-3 10-2 10-1 100 101 102 103  
t, PULSE WIDTH (s)  
0.1  
1
10  
100  
-VDS, DRAIN TO SOURCE VOLTAGE (V)  
Figure 11. Forward Bias Safe  
Operating Area  
Figure12. Single Pulse Maximum  
Power Dissipation  
4
©2010 Fairchild Semiconductor Corporation  
FDD4141_F085 Rev.C  
www.fairchildsemi.com  
Typical Characteristics TJ = 25°C unless otherwise noted  
2
1
DUTY CYCLE-DESCENDING ORDER  
D = 0.5  
0.2  
0.1  
0.05  
0.02  
0.01  
P
DM  
0.1  
t
1
t
2
NOTES:  
DUTY FACTOR: D = t /t  
1
2
SINGLE PULSE  
PEAK T = P  
x Z  
x R  
+ T  
0.01  
R
θJC = 1.8oC/W  
J
DM  
θJC  
θJC C  
0.005  
10-5  
10-4  
10-3  
10-2  
10-1  
100  
101  
t, RECTANGULAR PULSE DURATION (s)  
Figure 13. Transient Thermal Response Curve  
5
©2010 Fairchild Semiconductor Corporation  
FDD4141_F085 Rev.C  
www.fairchildsemi.com  
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The following includes registered and unregistered trademarks and service marks, owned by Fairchild Semiconductor and/or its global subsidiaries, and is not  
intended to be an exhaustive list of all such trademarks.  
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CTL™  
F-PFS™  
FRFET  
Global Power Resource  
Green FPS™  
Green FPS™ e-Series™  
Gmax™  
Power-SPM™  
PowerTrench  
PowerXS™  
®*  
®
®
SM  
®
The Power Franchise  
®
Programmable Active Droop™  
®
QFET  
QS™  
Quiet Series™  
TinyBoost™  
TinyBuck™  
TinyCalc™  
GTO™  
Current Transfer Logic™  
IntelliMAX™  
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®
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®
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®
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®
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TinyWire™  
MicroPak2™  
MillerDrive™  
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Motion-SPM™  
OptiHiT™  
SMART START™  
TriFault Detect™  
TRUECURRENT™*  
μSerDes™  
®
SPM  
®
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SuperSOT™-3  
SuperSOT™-6  
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SupreMOS™  
SyncFET™  
Fairchild  
®
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®
®
OPTOLOGIC  
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FAST  
®
®
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®
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®
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UniFET™  
VCX™  
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XS™  
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FETBench™  
®
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FlashWriter  
FPS™  
*
PDP SPM™  
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Definition of Terms  
Datasheet Identification  
Product Status  
Definition  
Datasheet contains the design specifications for product development. Specifications  
may change in any manner without notice.  
Advance Information  
Formative / In Design  
Datasheet contains preliminary data; supplementary data will be published at a later  
date. Fairchild Semiconductor reserves the right to make changes at any time without  
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First Production  
Datasheet contains final specifications. Fairchild Semiconductor reserves the right to  
make changes at any time without notice to improve the design.  
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Obsolete  
Full Production  
Datasheet contains specifications on a product that is discontinued by Fairchild  
Semiconductor. The datasheet is for reference information only.  
Not In Production  
Rev. I48  
www.fairchildsemi.com  
©2010 Fairchild Semiconductor Corporation  
FDD4141_F085 Rev.C  
6

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