AN-03 [ETC]
SONET OC-12 Jitter Measurement ; SONET OC -12的抖动测量\n![AN-03](http://pdffile.icpdf.com/pdf1/p00006/img/icpdf/AN-03_28898_icpdf.jpg)
型号: | AN-03 |
厂家: | ![]() |
描述: | SONET OC-12 Jitter Measurement
|
文件: | 总6页 (文件大小:59K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
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SONET OC-12
JITTER MEASUREMENT
APPLICATION NOTE
AN-03
JITTER GENERATION
Jitter Generation Definition
Jitter Generation Requirement
Bellcore TR-NWT-000499 (Issue 4), section 7.3.3 "Jitter
generation is the process whereby jitter appears at the
output port of an individual unit of digital equipment in the
absence of applied input jitter."
Bellcore TA-NWT-000253 (Issue 2), section 5.6.5.2 "For
Category II interfaces, jitter generation shall not exceed 0.01
UI rms. For OC-N and STSX-N interfaces, a high-pass
measurement filter with a 12kHz cutoff frequency shall be
used." The low-pass cutoff frequency of the measurement
filter shall be higher than 5MHz.
The characteristic of the measurement filter is shown
below.
SONET OC-12 Category II Jitter Generation Measurement
Filter Characteristics
UI (rms)
0.01
+20dB/decade
5MHz
(minimum)
12kHz
Frequency
Figure 1
Rev.: C
Amendment:/0
Issue Date: June, 1998
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APPLICATION NOTE
AN-03
Micrel
JITTER GENERATION (continued)
Measuring Jitter Generation on the SY69712 Transmit
Measuring Jitter Generation on the SY69712 Receive
Jitter generation is measured on the CKE622 output from
the device. This output is a differential ECL signal at the
622.08MHz rate that is synthesized from the reference clock
input of 77.76MHz, 51.84MHz or 19.44MHz. Figure 2a shows
the test setup for measuring jitter generation on the SY69712
transmit.
Jitter generation is measured on the CKE622 (recovered
clock) output from the device. This output is recovered from
the clock recovery circuit. Figure 2b shows the test setup for
measuring jitter generation on the SY69712 receive.
Test Setup for Measuring Jitter Generation
on the SY69612 and SY69712 Transmit
HP 70820A Microwave Transition Analyzer &
HP 70004A Display
CH 1
Filter
HP 70841B Pattern Generator &
HP 70311A Clock Source
÷ 8 / ÷ 12 / ÷ 32
RFCLKIN
CKE622
SY69612
&
77.76MHz,
51.84MHz
or
SY69712
19.44MHz
Figure 2a
Test Setup for Measuring Jitter Generation
on the SY69712 Receive
HP 70820A Microwave Transition Analyzer &
HP 70004A Display
CH 1
Filter
SDIN
622MHz
CKE622
(recovered clock)
HP 3325B Synthesizer
Function Generator
SY69712
HP 70841B Pattern Generator &
HP 70311A Clock Source
Figure 2b
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APPLICATION NOTE
AN-03
Micrel
JITTER TRANSFER
Jitter Transfer Definition
Jitter Transfer Requirement
Bellcore TA-NWT-000253 (Issue 2), section 5.6.3.2: "For
Bellcore TR-NWT-000499 (Issue 4), section 7.3.2:
"The transfer of jitter through an individual unit of digital CategoryIIinterfaces,thejittertransferfunctionshallbeunder
equipment is characterized by the relationship between the the curve in Figure 4, when input sinusoidal jitter up to the
applied input jitter and the resulting output jitter as a function masklevelinFigure5isapplied,withtheparametersspecified
of frequency. For equipment in which a linear process in Figure 4 for each OC-N rate."
describes the transfer of jitter from the input to the output port,
Figures 4 and 5 show the Bellcore specification for Jitter
the jitter transfer function is the ratio of the output jitter Transfer.
spectrum to the applied (deterministic) input jitter spectrum.
ITU/CCITTRecommendationG.958,section6.3.2,isstated
(Thetermtransferfunctionimpliesalinearprocess, wherethe similarly to Bellcore specification.
conventional definition of linearity applies, i.e., a process that
is both additive and homegeneous.)"
Measuring Jitter Transfer on the SY69712
Jitter Transfer is measured by applying the appropriate
reference frequency (77.76MHz, 51.84MHz or 19.44MHz) to
the RFCLKIN. The jitter on the synthesized 622MHz Clock
output is then measured and compared to the jitter on the
RFCLKIN to determine the jitter transfer of the Transmit PLL.
Test Setup for Measuring Jitter Transfer
on the SY69712
HP 70820A Microwave Transition Analyzer &
HP 70004A Display
CKE622
CH 1
Filter
CH 2
Filter
HP 3325B Synthesizer
Function Generator
Transmit
RFCLKIN
SY69712
÷ 8 / ÷ 12 / ÷ 32
77.76MHz/
Modulation Source
51.84MHZ/
HP 70841B Pattern Generator
19.44MHZ
& HP 70311A Clock Source
Figure 3a
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APPLICATION NOTE
AN-03
Micrel
JITTER TRANSFER (continued)
Figure 3b shows the test setup for measuring jitter transfer
on the SY69712 receive.
Measuring Jitter Transfer on the SY69712 Receive
Jitter transfer is measured at the CKE622 (recovered
clock) output.
Test Setup for Measuring Jitter Transfer
on the SY69712 Receive
HP 70820A Microwave Transition Analyzer &
HP 70004A Display
CKE622 (recovered clock)
CH 1
CH 2
Filter
HP 3325B Synthesizer
Function Generator
Filter
SDIN
SY69712
622MHz
Modulation Source
HP 3325B Pattern Generator &
HP 70311A Clock Source
Figure 3b
SONET OC-12 Category II Input Jitter Mask
for Jitter Transfer and Jitter Tolerance
Measurement
SONET OC-12 Category II Jitter
Transfer Function
Jitter
Gain
(dB)
A
0.1
15
-20db/decade
Sinusoidal
Input
Jitter
Amplitude
(p-p)
-20db/decade
-20db/decade
1.5
Acceptable
Range
-20
0.15
500kHz
Frequency
10
30
300
25kHz 250kHz
Frequency
Figure 5
Figure 4
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APPLICATION NOTE
AN-03
Micrel
JITTER TOLERANCE
Measuring Jitter Tolerance on the SY69712
Jitter Tolerance Definition
On the SY69712 jitter tolerance is measured by applying
sinusoidal input jitter at the serial data input. Jitter tolerance
ismeasuredatSDOUT(retimeddata)withCKE622(recovered
clock). Figure 6 shows the test setup for measuring jitter
tolerance.
Bellcore TA-NWT-000253 (Issue 2), section 5.6.4.2:
“For Category II SONET interfaces, jitter tolerance is defined
as the peak-to-peak amplitude of sinusoidal jitter applied on
the input OC-N/STS-N signal that causes a 1-dB power
penalty. This is a stress test intended to ensure that no
additional penalty is incurred under operating conditions.”
Jitter Tolerance Requirement
Bellcore TA-NWT-000253 (Issue 2), section 5.6.4.2:
"OC-12 Category II SONET interface shall tolerate, as a
minimum, the input jitter applied according to the mask in
Figure 4 and 5, with the parameters specified in the figure for
OC-12."
Test Setup for Measuring Jitter Tolerance
on the SY69712
HP 70820A Microwave Transition Analyzer &
HP 70004A Display
CH 2
Filter
(Recovered Clock & Data)
SDOUT
CKE622
SDIN
HP 70842B Error Detector &
HP 70004A Display
SY69712
HP 3325B Synthesizer
Function Generator
Receive
622MHz Data
Modulation Source
HP 70841B Pattern Generator &
HP 70311A Clock Source
Figure 6
5
APPLICATION NOTE
AN-03
Micrel
APPENDIX
Equipment List
HP 0955-0732 622 Mb/s Bandpass Filter (2)
HP 3325B Synthesizer Function Generator
HP 6623A System DC Power Supply
HP 7090A Measurement Plotting System
HP 8082A Pulse Generator
HP 8493C 6dB Attenuator
HP 70001A Mainframe
HP 70004A Color Display
HP 70311A Clock Source (Range 16.1MHz - 3.3GHz)
HP 70820A Microwave Transition Analyzer
HP 70841B Pattern Generator (Range 0.1 - 3 Gbit/s)
HP 70842B Error Detector (Range 0.1 - 3 Gbit/s)
HP 70874A Eye Diagram Analyzer Personality Card
HP 70874B Jitter Analyzer Personality Card
HP 53132A 225 MHz Universal Counter with high
frequency option
HP 85700A 32 kbyte RAM Card
Tektronix 11801B Digital Sampling Oscilloscope
SD26 Sampling Heads (4)
MICREL-SYNERGY 3250 SCOTT BOULEVARD SANTA CLARA CA 95054 USA
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