AN-03 [ETC]

SONET OC-12 Jitter Measurement ; SONET OC -12的抖动测量\n
AN-03
型号: AN-03
厂家: ETC    ETC
描述:

SONET OC-12 Jitter Measurement
SONET OC -12的抖动测量\n

文件: 总6页 (文件大小:59K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
SONET OC-12  
JITTER MEASUREMENT  
APPLICATION NOTE  
AN-03  
JITTER GENERATION  
Jitter Generation Definition  
Jitter Generation Requirement  
Bellcore TR-NWT-000499 (Issue 4), section 7.3.3 "Jitter  
generation is the process whereby jitter appears at the  
output port of an individual unit of digital equipment in the  
absence of applied input jitter."  
Bellcore TA-NWT-000253 (Issue 2), section 5.6.5.2 "For  
Category II interfaces, jitter generation shall not exceed 0.01  
UI rms. For OC-N and STSX-N interfaces, a high-pass  
measurement filter with a 12kHz cutoff frequency shall be  
used." The low-pass cutoff frequency of the measurement  
filter shall be higher than 5MHz.  
The characteristic of the measurement filter is shown  
below.  
SONET OC-12 Category II Jitter Generation Measurement  
Filter Characteristics  
UI (rms)  
0.01  
+20dB/decade  
5MHz  
(minimum)  
12kHz  
Frequency  
Figure 1  
Rev.: C  
Amendment:/0  
Issue Date: June, 1998  
1
APPLICATION NOTE  
AN-03  
Micrel  
JITTER GENERATION (continued)  
Measuring Jitter Generation on the SY69712 Transmit  
Measuring Jitter Generation on the SY69712 Receive  
Jitter generation is measured on the CKE622 output from  
the device. This output is a differential ECL signal at the  
622.08MHz rate that is synthesized from the reference clock  
input of 77.76MHz, 51.84MHz or 19.44MHz. Figure 2a shows  
the test setup for measuring jitter generation on the SY69712  
transmit.  
Jitter generation is measured on the CKE622 (recovered  
clock) output from the device. This output is recovered from  
the clock recovery circuit. Figure 2b shows the test setup for  
measuring jitter generation on the SY69712 receive.  
Test Setup for Measuring Jitter Generation  
on the SY69612 and SY69712 Transmit  
HP 70820A Microwave Transition Analyzer &  
HP 70004A Display  
CH 1  
Filter  
HP 70841B Pattern Generator &  
HP 70311A Clock Source  
÷ 8 / ÷ 12 / ÷ 32  
RFCLKIN  
CKE622  
SY69612  
&
77.76MHz,  
51.84MHz  
or  
SY69712  
19.44MHz  
Figure 2a  
Test Setup for Measuring Jitter Generation  
on the SY69712 Receive  
HP 70820A Microwave Transition Analyzer &  
HP 70004A Display  
CH 1  
Filter  
SDIN  
622MHz  
CKE622  
(recovered clock)  
HP 3325B Synthesizer  
Function Generator  
SY69712  
HP 70841B Pattern Generator &  
HP 70311A Clock Source  
Figure 2b  
2
APPLICATION NOTE  
AN-03  
Micrel  
JITTER TRANSFER  
Jitter Transfer Definition  
Jitter Transfer Requirement  
Bellcore TA-NWT-000253 (Issue 2), section 5.6.3.2: "For  
Bellcore TR-NWT-000499 (Issue 4), section 7.3.2:  
"The transfer of jitter through an individual unit of digital CategoryIIinterfaces,thejittertransferfunctionshallbeunder  
equipment is characterized by the relationship between the the curve in Figure 4, when input sinusoidal jitter up to the  
applied input jitter and the resulting output jitter as a function masklevelinFigure5isapplied,withtheparametersspecified  
of frequency. For equipment in which a linear process in Figure 4 for each OC-N rate."  
describes the transfer of jitter from the input to the output port,  
Figures 4 and 5 show the Bellcore specification for Jitter  
the jitter transfer function is the ratio of the output jitter Transfer.  
spectrum to the applied (deterministic) input jitter spectrum.  
ITU/CCITTRecommendationG.958,section6.3.2,isstated  
(Thetermtransferfunctionimpliesalinearprocess, wherethe similarly to Bellcore specification.  
conventional definition of linearity applies, i.e., a process that  
is both additive and homegeneous.)"  
Measuring Jitter Transfer on the SY69712  
Jitter Transfer is measured by applying the appropriate  
reference frequency (77.76MHz, 51.84MHz or 19.44MHz) to  
the RFCLKIN. The jitter on the synthesized 622MHz Clock  
output is then measured and compared to the jitter on the  
RFCLKIN to determine the jitter transfer of the Transmit PLL.  
Test Setup for Measuring Jitter Transfer  
on the SY69712  
HP 70820A Microwave Transition Analyzer &  
HP 70004A Display  
CKE622  
CH 1  
Filter  
CH 2  
Filter  
HP 3325B Synthesizer  
Function Generator  
Transmit  
RFCLKIN  
SY69712  
÷ 8 / ÷ 12 / ÷ 32  
77.76MHz/  
Modulation Source  
51.84MHZ/  
HP 70841B Pattern Generator  
19.44MHZ  
& HP 70311A Clock Source  
Figure 3a  
3
APPLICATION NOTE  
AN-03  
Micrel  
JITTER TRANSFER (continued)  
Figure 3b shows the test setup for measuring jitter transfer  
on the SY69712 receive.  
Measuring Jitter Transfer on the SY69712 Receive  
Jitter transfer is measured at the CKE622 (recovered  
clock) output.  
Test Setup for Measuring Jitter Transfer  
on the SY69712 Receive  
HP 70820A Microwave Transition Analyzer &  
HP 70004A Display  
CKE622 (recovered clock)  
CH 1  
CH 2  
Filter  
HP 3325B Synthesizer  
Function Generator  
Filter  
SDIN  
SY69712  
622MHz  
Modulation Source  
HP 3325B Pattern Generator &  
HP 70311A Clock Source  
Figure 3b  
SONET OC-12 Category II Input Jitter Mask  
for Jitter Transfer and Jitter Tolerance  
Measurement  
SONET OC-12 Category II Jitter  
Transfer Function  
Jitter  
Gain  
(dB)  
A
0.1  
15  
-20db/decade  
Sinusoidal  
Input  
Jitter  
Amplitude  
(p-p)  
-20db/decade  
-20db/decade  
1.5  
Acceptable  
Range  
-20  
0.15  
500kHz  
Frequency  
10  
30  
300  
25kHz 250kHz  
Frequency  
Figure 5  
Figure 4  
4
APPLICATION NOTE  
AN-03  
Micrel  
JITTER TOLERANCE  
Measuring Jitter Tolerance on the SY69712  
Jitter Tolerance Definition  
On the SY69712 jitter tolerance is measured by applying  
sinusoidal input jitter at the serial data input. Jitter tolerance  
ismeasuredatSDOUT(retimeddata)withCKE622(recovered  
clock). Figure 6 shows the test setup for measuring jitter  
tolerance.  
Bellcore TA-NWT-000253 (Issue 2), section 5.6.4.2:  
For Category II SONET interfaces, jitter tolerance is defined  
as the peak-to-peak amplitude of sinusoidal jitter applied on  
the input OC-N/STS-N signal that causes a 1-dB power  
penalty. This is a stress test intended to ensure that no  
additional penalty is incurred under operating conditions.”  
Jitter Tolerance Requirement  
Bellcore TA-NWT-000253 (Issue 2), section 5.6.4.2:  
"OC-12 Category II SONET interface shall tolerate, as a  
minimum, the input jitter applied according to the mask in  
Figure 4 and 5, with the parameters specified in the figure for  
OC-12."  
Test Setup for Measuring Jitter Tolerance  
on the SY69712  
HP 70820A Microwave Transition Analyzer &  
HP 70004A Display  
CH 2  
Filter  
(Recovered Clock & Data)  
SDOUT  
CKE622  
SDIN  
HP 70842B Error Detector &  
HP 70004A Display  
SY69712  
HP 3325B Synthesizer  
Function Generator  
Receive  
622MHz Data  
Modulation Source  
HP 70841B Pattern Generator &  
HP 70311A Clock Source  
Figure 6  
5
APPLICATION NOTE  
AN-03  
Micrel  
APPENDIX  
Equipment List  
HP 0955-0732 622 Mb/s Bandpass Filter (2)  
HP 3325B Synthesizer Function Generator  
HP 6623A System DC Power Supply  
HP 7090A Measurement Plotting System  
HP 8082A Pulse Generator  
HP 8493C 6dB Attenuator  
HP 70001A Mainframe  
HP 70004A Color Display  
HP 70311A Clock Source (Range 16.1MHz - 3.3GHz)  
HP 70820A Microwave Transition Analyzer  
HP 70841B Pattern Generator (Range 0.1 - 3 Gbit/s)  
HP 70842B Error Detector (Range 0.1 - 3 Gbit/s)  
HP 70874A Eye Diagram Analyzer Personality Card  
HP 70874B Jitter Analyzer Personality Card  
HP 53132A 225 MHz Universal Counter with high  
frequency option  
HP 85700A 32 kbyte RAM Card  
Tektronix 11801B Digital Sampling Oscilloscope  
SD26 Sampling Heads (4)  
MICREL-SYNERGY 3250 SCOTT BOULEVARD SANTA CLARA CA 95054 USA  
TEL + 1 (408) 980-9191 FAX + 1 (408) 914-7878 WEB http://www.micrel.com  
This information is believed to be accurate and reliable, however no responsibility is assumed by Micrel for its use nor for any infringement of patents or  
other rights of third parties resulting from its use. No license is granted by implication or otherwise under any patent or patent right of Micrel Inc.  
© 2000 Micrel Incorporated  
6

相关型号:

AN-04

SONET OC-3 Jitter Measurement
ETC

AN-05

SY69952 in an OC-3 Transmission System
ETC

AN-06

SY89429A Frequency Synthesis
ETC

AN-07

SY89429/30V Frequency Synthesis
ETC

AN-0971

Recommendations for Control of Radiated Emissions with isoPower Devices
ADI

AN-0982

The Residual Phase Noise Measurement
ADI

AN-0988

The AD9552: A Programmable Crystal Oscillator for Network Clocking Applications
ADI

AN-1006

Backing Up Epson Toyocom Real-Time Clock Chips
CYMBET

AN-1008

Using Cymbet EnerChip Batteries Instead of Coin Cells and Super Capacitors
CYMBET

AN-101(FC67200)

UEBERSTROMSCHUTZSCHALTER MINIATUR 1A
ETC

AN-1014

Using the Atmel® picoPower AVR Microcontroller with Cymbet EnerChips
CYMBET

AN-1025

Maximum Power Enhancement Techniques for SuperSOTTM-3 Power MOSFETs
FAIRCHILD