5962L0251002HZA [ETC]
DC to DC Converter ; 直流到直流转换器\n
| 型号： | 5962L0251002HZA |
| 厂家： | 
ETC |
| 描述： | DC to DC Converter
|
| 文件： | 总14页 (文件大小：76K) |
| 中文： | 中文翻译 | 下载： | 下载PDF数据表文档文件 |
REVISIONS
LTR
DESCRIPTION
DATE (YR-MO-DA)
APPROVED
REV
SHEET
REV
SHEET
REV STATUS
OF SHEETS
REV
SHEET
1
2
3
4
5
6
7
8
9
10
11
12
13
PMIC N/A
PREPARED BY
Steve L. Duncan
DEFENSE SUPPLY CENTER COLUMBUS
POST OFFICE BOX 3990
STANDARD
MICROCIRCUIT
DRAWING
CHECKED BY
Michael C. Jones
COLUMBUS, OHIO 43216-5000
THIS DRAWING IS
AVAILABLE
FOR USE BY ALL
APPROVED BY
Raymond Monnin
MICROCIRCUIT, HYBRID, LINEAR, 3.3 VOLT,
SINGLE CHANNEL, DC-DC CONVERTER
DEPARTMENTS
AND AGENCIES OF THE
DEPARTMENT OF DEFENSE
DRAWING APPROVAL DATE
01-11-30
AMSC N/A
REVISION LEVEL
SIZE
A
CAGE CODE
5962-02510
67268
SHEET
1 OF 13
DSCC FORM 2233
APR 97
5962-E090-02
DISTRIBUTION STATEMENT A. Approved for public release; distribution is unlimited.
1. SCOPE
1.1 Scope. This drawing documents five product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A
choice of case outlines and lead finishes which are available and are reflected in the Part or Identifying Number (PIN). When
available, a choice of radiation hardness assurance levels are reflected in the PIN.
1.2 PIN. The PIN shall be as shown in the following example:
5962
-
02510
01
H
X
X
Federal
stock class
designator
\
RHA
designator
(see 1.2.1)
Device
type
(see 1.2.2)
Device
class
designator
(see 1.2.3)
Case
outline
(see 1.2.4)
Lead
finish
(see 1.2.5)
/
\/
Drawing number
1.2.1 Radiation hardness assurance (RHA) designator. RHA marked devices shall meet the MIL-PRF-38534 specified RHA
levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device.
1.2.2 Device type(s). The device type(s) identify the circuit function as follows:
Device type
Generic number
Circuit function
01
02
MHF+283R3S/883, MHF+283R3SF/883
SMHF283R3S, SMHF283R3SF
DC-DC converter, 8 W, 3.3 V output
DC-DC converter, 8 W, 3.3 V output
1.2.3 Device class designator. This device class designator shall be a single letter identifying the product assurance level.
All levels are defined by the requirements of MIL-PRF-38534 and require QML Certification as well as qualification (Class H, K,
and E) or QML Listing (Class G and D). The product assurance levels are as follows:
Device class
K
Device performance documentation
Highest reliability class available. This level is intended for use in space
applications.
H
G
Standard military quality class level. This level is intended for use in applications
where non-space high reliability devices are required.
Reduced testing version of the standard military quality class. This level uses the
Class H screening and In-Process Inspections with a possible limited temperature
range, manufacturer specified incoming flow, and the manufacturer guarantees (but
may not test) periodic and conformance inspections (Group A, B, C and D).
E
D
Designates devices which are based upon one of the other classes (K, H, or G)
with exception(s) taken to the requirements of that class. These exception(s) must
be specified in the device acquisition document; therefore the acquisition document
should be reviewed to ensure that the exception(s) taken will not adversely affect
system performance.
Manufacturer specified quality class. Quality level is defined by the manufacturers
internal, QML certified flow. This product may have a limited temperature range.
SIZE
STANDARD
MICROCIRCUIT DRAWING
5962-02510
A
REVISION LEVEL
SHEET
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
2
DSCC FORM 2234
APR 97
1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows:
Outline letter
Descriptive designator
Terminals
Package style
X
Z
See figure 1
See figure 1
8
8
Dual-in-line
Flange mount
1.2.5 Lead finish. The lead finish shall be as specified in MIL-PRF-38534.
1.3 Absolute maximum ratings. 1/
Input voltage range....................................................................
Power dissipation (PD):
-0.5 V dc to +50 V dc
Device types 01 and 02 (non-RHA) .......................................
Device type 02 (RHA levels L and R).....................................
Output power.............................................................................
Lead soldering temperature (10 seconds).................................
Storage temperature range .......................................................
8 W
9 W
8.23 W
+300°C
-65°C to +150°C
1.4 Recommended operating conditions.
Input voltage range....................................................................
Case operating temperature range (TC) ....................................
+16 V dc to +40 V dc
-55°C to +125°C
2. APPLICABLE DOCUMENTS
2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a
part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those listed in
the issue of the Department of Defense Index of Specifications and Standards (DoDISS) and supplement thereto, cited in the
solicitation.
SPECIFICATION
DEPARTMENT OF DEFENSE
MIL-PRF-38534 - Hybrid Microcircuits, General Specification for.
STANDARDS
DEPARTMENT OF DEFENSE
MIL-STD-883 - Test Method Standard Microcircuits.
MIL-STD-1835 - Interface Standard for Microcircuit Case Outlines.
HANDBOOKS
DEPARTMENT OF DEFENSE
MIL-HDBK-103 - List of Standard Microcircuit Drawings (SMD's).
MIL-HDBK-780 - Standard Microcircuit Drawings.
(Unless otherwise indicated, copies of the specification, standards, and handbooks are available from the Standardization
Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.)
1/ Stresses above the absolute maximum ratings may cause permanent damage to the device. Extended operation at the
maximum levels may degrade performance and affect reliability.
SIZE
STANDARD
5962-02510
A
MICROCIRCUIT DRAWING
REVISION LEVEL
SHEET
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
3
DSCC FORM 2234
APR 97
2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text
of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a
specific exemption has been obtained.
3. REQUIREMENTS
3.1 Item requirements. The individual item performance requirements for device classes D, E, G, H, and K shall be in
accordance with MIL-PRF-38534. Compliance with MIL-PRF-38534 may include the performance of all tests herein or as
designated in the device manufacturer's Quality Management (QM) plan or as designated for the applicable device class.
Therefore, the tests and inspections herein may not be performed for the applicable device class (see MIL-PRF-38534).
Furthermore, the manufacturer may take exceptions or use alternate methods to the tests and inspections herein and not
perform them. However, the performance requirements as defined in MIL-PRF-38534 shall be met for the applicable device
class.
3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified
in MIL-PRF-38534 and herein.
3.2.1 Case outline(s). The case outline(s) shall be in accordance with 1.2.4 herein and figure 1.
3.2.2 Terminal connections. The terminal connections shall be as specified on figure 2.
3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are
as specified in table I and shall apply over the full specified operating temperature range.
3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical
tests for each subgroup are defined in table I.
3.5 Marking of device(s). Marking of device(s) shall be in accordance with MIL-PRF-38534. The device shall be marked
with the PIN listed in 1.2 herein. In addition, the manufacturer's vendor similar PIN may also be marked in MIL-HDBK-103 and
QML-38534.
3.6 Data. In addition to the general performance requirements of MIL-PRF-38534, the manufacturer of the device described
herein shall maintain the electrical test data (variables format) from the initial quality conformance inspection group A lot
sample, for each device type listed herein. Also, the data should include a summary of all parameters manually tested, and for
those which, if any, are guaranteed. This data shall be maintained under document revision level control by the manufacturer
and be made available to the preparing activity (DSCC-VA) upon request.
3.7 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to supply to this
drawing. The certificate of compliance (original copy) submitted to DSCC-VA shall affirm that the manufacturer's product meets
the performance requirements of MIL-PRF-38534 and herein.
3.8 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38534 shall be provided with each lot of
microcircuits delivered to this drawing.
SIZE
STANDARD
5962-02510
A
MICROCIRCUIT DRAWING
REVISION LEVEL
SHEET
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
4
DSCC FORM 2234
APR 97
TABLE I. Electrical performance characteristics.
Test
Symbol
Conditions 1/
Group A
subgroups
Device
types
Limits
Unit
-55°C ≤ T ≤ +125°C
C
VIN = 28 V dc ±0.5 V
no external sync, CL = 0
unless otherwise specified
Min
3.27
Max
3.33 V dc
Output voltage
VOUT
IOUT = 2.4 A dc
1
01,02
2,3
3.20
3.10
3.40
3.50
L, R
1,2,3
1,2,3
02
Output current
IOUT
VIN = 16 V dc to 40 V dc
01, 02
2400
mA
L, R
1,2,3
1
02
01
02
2400
80
VOUT ripple voltage
VRIP
IOUT = 2.4 A
mVp-p
BW = 10 kHz to 2 MHz
160
2,3
01,02
02
240
350
L, R
1,2,3
VOUT line regulation
VRLINE
VIN =16 V dc to 40 V dc
IOUT = 2.4 A
1,2,3
01,02
100
mV
L, R
IOUT = 0 to 2.4 A
L, R
1,2,3
1,2,3
1,2,3
1,2,3
02
01,02
02
200
50
VOUT load regulation
Input current
VRLOAD
mV
mA
100
12
IIN
IOUT = 0 A,
01,02
Inhibit (pin 1) = 0 V dc
L, R
1,2,3
02
01
15
40
IOUT = 0 A,
1, 2, 3
Inhibit (pin 1) = open
02
65
L, R
1,2,3
1
02
100
80
IIN ripple current
IRIP
IOUT = 2.4 A,
01,02
mAp-p
BW = 10 kHz to 10 MHz
2,3
01,02
02
120
150
L, R
1,2,3
See footnotes at end of table.
SIZE
STANDARD
MICROCIRCUIT DRAWING
5962-02510
A
REVISION LEVEL
SHEET
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
5
DSCC FORM 2234
APR 97
TABLE I. Electrical performance characteristics - Continued.
Test
Symbol
Conditions 1/
-55°C ≤ T ≤ +125°C
Group A
subgroups
Device
types
Limits
Unit
C
VIN = 28 V dc ±0.5 V
no external sync, CL = 0
unless otherwise specified
Min
70
Max
Efficiency
Isolation
Eff
IOUT = 2.4 A
1
01,02
%
2,3
1,2,3
1
01,02
02
67
62
L, R
ISO
Input to output or any pin
to case (except pin 6) at
500V dc,
01,02
100
MΩ
T
C
= +25°C
L, R
1
02
100
Short circuit
power dissipation,
PD
PD = PIN - total POUT
1,2,3
01,02
8
W
L, R
1,2,3
4
02
9
Switching frequency
FS
IOUT = 2.4 A
01,02
500
600
kHz
5,6
01,02
02
480
400
500
620
700
600
L, R
4,5,6
4,5,6
External sync range 2/
VOUT step load transient 3/
FSYNC
IOUT = 2.4 A, TTL level to
pin 5
01,02
kHz
mV pk
µs
L, R
4,5,6
4,5,6
02
500
600
VTLOAD
50% load to/from 100%
load
01,02
-400
+400
L, R
4,5,6
4,5,6
02
-1200
+1200
300
VOUT step load transient
recovery 3/ 4/ 5/
TTLOAD
50% load to/from 100%
load
01,02
L, R
4,5,6
4,5,6
02
1200
+800
VOUT step line transient
4/ 6/
VTLINE
Input step 16 V dc to/from
40 V dc, IOUT = 2.4 A
01,02
-800
mV pk
L, R
4,5,6
02
-1500
+1500
See footnotes at end of table.
SIZE
STANDARD
MICROCIRCUIT DRAWING
5962-02510
A
REVISION LEVEL
SHEET
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
6
DSCC FORM 2234
APR 97
TABLE I. Electrical performance characteristics - Continued.
Test
Symbol
Conditions 1/
-55°C ≤ T ≤ +125°C
Group A
subgroups
Device
types
Limits
Unit
C
VIN = 28 V dc ±0.5 V
no external sync, CL = 0
unless otherwise specified
Min
Max
1.2 ms
VOUT step line transient
recovery 4/ 5/
TTLINE
VtonOS
TonD
Input step 16 V dc to/from
40 V dc, IOUT = 2.4 A
4,5,6
01,02
L, R
4,5,6
4,5,6
02
2.4
300
Start up overshoot 4/
Start up delay 7/
IOUT = 2.4 A,
VIN = 0 to 28 V dc
01,02
mV pk
ms
L, R
4,5,6
4,5,6
02
1500
25
IOUT = 2.4 A,
01,02
VIN = 0 to 28 V dc
L, R
4,5,6
4,5,6
02
100
30
Load fault recovery 4/
Capacitive load 4/ 8/
TrLF
IOUT = 2.4 A
01,02
ms
L, R
4,5,6
4
02
100
300
CL
01,02
µF
No effect on dc
performance, T = +25°C
C
L, R
4
02
300
1/ Post irradiation testing shall be in accordance with 4.3.5 herein.
2/ A TTL level waveform (VIH = 4.5 V minimum, VIL = 0.8 V maximum) with a 50% ±10% duty cycle applied
to the sync input pin (pin 5) within the sync range frequency shall cause the converter’s switching frequency to become
synchronous with the frequency applied to the sync input pin (pin 5).
3/ Load step transition time greater than 10 µs.
4/ Parameter shall be tested as part of device characterization and after design and process changes. Thereafter,
parameters shall be guaranteed to the limits specified in table I.
5/ Recovery time is measured from the initiation of the transient until VOUT has returned to within ±1 percent of VOUT
final value.
6/ Input step transition time greater than 10 µs.
7/ Start up delay time measurement is either for a step application of power at the input or the removal of a ground signal from
the inhibit pin (pin 1) while power is applied to the input.
8/ Capacitive load may be any value from 0 to the maximum limit without compromising dc performance.
SIZE
STANDARD
5962-02510
A
MICROCIRCUIT DRAWING
REVISION LEVEL
SHEET
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
7
DSCC FORM 2234
APR 97
Case outline X.
Symbol
Millimeters
Inches
Max
Min
Max
8.38
Min
A
φb
D
.330
.035
0.64
36.70
5.08
0.89
28.32
5.33
.025
1.445
.200
1.455
.210
e
e1
e2
e3
e4
E
12.08
17.78
22.86
27.94
28.32
20.19
6.09
12.95
18.03
23.11
28.19
28.57
20.44
6.60
.500
.700
.900
1.100
1.115
.795
.510
.710
.910
1.110
1.125
.805
E1
L
.240
.260
NOTES:
1. The case outline X was originally designed using the inch-pound units of measurement, in the event of conflict
between the metric and inch-pound units, the inch-pound units shall take precedence.
2. Pin numbers are for reference only.
3. Device weight: 30 grams.
FIGURE 1. Case outline(s).
SIZE
STANDARD
MICROCIRCUIT DRAWING
5962-02510
A
REVISION LEVEL
SHEET
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
8
DSCC FORM 2234
APR 97
Case outline Z.
Symbol
Millimeters
Inches
Max
Min
Max
8.38
Min
A
A1
φb
D
D1
D2
e
e1
e2
e3
e4
E
.330
.057
.035
0.94
0.64
1.45
0.89
.037
.025
50.80
44.07
36.83
8.89
16.51
21.59
26.67
31.75
28.70
20.57
6.60
2.000
1.735
1.450
.350
43.82
1.725
8.64
16.26
21.37
26.41
31.50
.340
.640
.650
.840
.850
1.040
1.240
1.050
1.250
1.130
.810
.260
.130
E1
L
φp
R
20.07
6.09
3.20
3.18
.790
.240
.126
.125
3.30
3.43
.135
NOTES:
1. The case outline Z was originally designed using the inch-pound units of measurement, in the event of conflict
between the metric and inch-pound units, the inch-pound units shall take precedence.
2. Pin numbers are for reference only.
3. Device weight: 30 grams maximum.
FIGURE 1. Case outline(s) - continued.
SIZE
STANDARD
MICROCIRCUIT DRAWING
5962-02510
A
REVISION LEVEL
SHEET
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
9
DSCC FORM 2234
APR 97
Device types
01 and 02
X and Z
Case outlines
Terminal number
Terminal symbol
Inhibit
1
2
3
4
5
6
7
8
No connection
Output return
Output
Sync input
Case ground
Input return
Input
FIGURE 2. Terminal connections.
SIZE
STANDARD
MICROCIRCUIT DRAWING
5962-02510
A
REVISION LEVEL
SHEET
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
10
DSCC FORM 2234
APR 97
4. QUALITY ASSURANCE PROVISIONS
4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38534 or as
modified in the device manufacturer's Quality Management (QM) plan. The modification in the QM plan shall not affect the
form, fit, or function as described herein.
4.2 Screening. Screening shall be in accordance with MIL-PRF-38534. The following additional criteria shall apply:
a. Burn-in test, method 1015 of MIL-STD-883.
(1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level
control and shall be made available to either DSCC-VA or the acquiring activity upon request. Also, the test circuit
shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent
specified in test method 1015 of MIL-STD-883.
(2) T as specified in accordance with table I of method 1015 of MIL-STD-883.
A
b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter
tests prior to burn-in are optional at the discretion of the manufacturer.
TABLE II. Electrical test requirements.
MIL-PRF-38534 test requirements
Subgroups
(in accordance with
MIL-PRF-38534, group A
test table)
Interim electrical parameters
Final electrical parameters
Group A test requirements
1*, 2, 3, 4, 5, 6
1, 2, 3, 4, 5, 6
1
Group C end-point electrical
parameters
End-point electrical parameters
for radiation hardness
1, 2, 3, 4, 5, 6
assurance (RHA) devices
* PDA applies to subgroup 1.
4.3 Conformance and periodic inspections. Conformance inspection (CI) and periodic inspection (PI) shall be in accordance
with MIL-PRF-38534 and as specified herein.
4.3.1 Group A inspection (CI). Group A inspection shall be in accordance with MIL-PRF-38534 and as follows:
a. Tests shall be as specified in table II herein.
b. Subgroups 7, 8, 9, 10, and 11 shall be omitted.
4.3.2 Group B inspection (PI). Group B inspection shall be in accordance with MIL-PRF-38534.
SIZE
STANDARD
5962-02510
A
MICROCIRCUIT DRAWING
REVISION LEVEL
SHEET
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
11
DSCC FORM 2234
APR 97
4.3.3 Group C inspection (PI). Group C inspection shall be in accordance with MIL-PRF-38534 and as follows:
a. End-point electrical parameters shall be as specified in table II herein.
b. Steady-state life test, method 1005 of MIL-STD-883.
(1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level
control and shall be made available to either DSCC-VA or the acquiring activity upon request. Also, the test circuit
shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent
specified in test method 1005 of MIL-STD-883.
(2) T as specified in accordance with table I of method 1005 of MIL-STD-883.
A
(3) Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883.
4.3.4 Group D inspection (PI). Group D inspection shall be in accordance with MIL-PRF-38534.
4.3.5. Radiation hardness assurance (RHA). RHA qualification is required only for those devices with the RHA designator as
specified herein.
RHA level L
50
RHA level R
100
Units
Total ionizing dose
tolerance level
kRad (Si)
Single event upset
survival level (LET)
No
guarantee
40
MeV
a. Radiation dose rate is in accordance with condition C of method 1019 of MIL-STD-883. Unless otherwise specified,
components are tested at a rate of 9 rad(Si)/s, in accordance with method 1019 of MIL-STD-750 or MIL-STD-883, as
applicable.
b. The manufacturer shall perform a worst-case and radiation susceptibility analysis on the device. This analysis shall
show that the minimum performance requirements of each component has adequate design margin under worst-case
operating conditions (extremes of line voltage, temperatures, load, frequency, radiation environment, etc.). This
analysis guarantees the post-irradiation parameter limits specified in table I.
c. RHA testing shall be performed at the component level for initial device qualification, and after design changes that
may affect the RHA performance of the device. As an alternative to testing, components may be procured to
manufacturer radiation guarantees that meet the minimum performance requirements. Component radiation
performance guarantees shall be established in compliance with MIL-PRF-19500, Group D or MIL-PRF-38535, Group
E, as applicable. For components with less than adequate performance margin, component lot radiation acceptance
screening shall be performed.
d. The manufacturer shall establish procedures controlling component radiation testing, and shall establish radiation test
plans used to implement component lot qualification during procurement. Test plans and test reports shall be filed and
controlled in accordance with the manufacturer's configuration management system.
e. The device manufacturer shall designate a RHA program manager to oversee component lot qualification, and to
monitor design changes for continued compliance to RHA requirements.
SIZE
STANDARD
5962-02510
A
MICROCIRCUIT DRAWING
REVISION LEVEL
SHEET
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
12
DSCC FORM 2234
APR 97
5. PACKAGING
5.1 Packaging requirements. The requirements for packaging shall be in accordance with MIL-PRF-38534.
6. NOTES
6.1 Intended use. Microcircuits conforming to this drawing are intended for use for Government microcircuit applications
(original equipment), design applications, and logistics purposes.
6.2 Replaceability. Microcircuits covered by this drawing will replace the same generic device covered by a contractor-
prepared specification or drawing.
6.3 Configuration control of SMD's. All proposed changes to existing SMD's will be coordinated with the users of record for
the individual documents. This coordination will be accomplished in accordance with MIL-PRF-38534.
6.4 Record of users. Military and industrial users shall inform Defense Supply Center Columbus when a system application
requires configuration control and the applicable SMD. DSCC will maintain a record of users and this list will be used for
coordination and distribution of changes to the drawings. Users of drawings covering microelectronic devices (FSC 5962)
should contact DSCC-VA, telephone (614) 692-0544.
6.5 Comments. Comments on this drawing should be directed to DSCC-VA, Post Office Box 3990, Columbus, Ohio 43216-
5000, or telephone (614) 692-0512.
6.6 Sources of supply. Sources of supply are listed in MIL-HDBK-103 and QML-38534. The vendors listed in MIL-HDBK-
103 and QML-38534 have submitted a certificate of compliance (see 3.7 herein) to DSCC-VA and have agreed to this drawing.
SIZE
STANDARD
5962-02510
A
MICROCIRCUIT DRAWING
REVISION LEVEL
SHEET
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
13
DSCC FORM 2234
APR 97
STANDARD MICROCIRCUIT DRAWING BULLETIN
DATE: 01-11-30
Approved sources of supply for SMD 5962-02510 are listed below for immediate acquisition information only and
shall be added to MIL-HDBK-103 and QML-38534 during the next revisions. MIL-HDBK-103 and QML-38534 will be
revised to include the addition or deletion of sources. The vendors listed below have agreed to this drawing and a
certificate of compliance has been submitted to and accepted by DSCC-VA. This bulletin is superseded by the next
dated revisions of MIL-HDBK-103 and QML-38534.
Standard
microcircuit drawing
PIN 1/
Vendor
CAGE
number
Vendor
similar
PIN 2/
5962-0251001HXA
5962-0251001HXC
5962-0251001HZA
5962-0251001HZC
50821
50821
50821
50821
MHF+283R3S/883
MHF+283R3S/883
MHF+283R3SF/883
MHF+283R3SF/883
5962-0251002HXA
5962-0251002HXC
5962-0251002HZA
5962-0251002HZC
50821
50821
50821
50821
SMHF283R3S/HO
SMHF283R3S/HO
SMHF283R3SF/HO
SMHF283R3SF/HO
5962L0251002HXA
5962L0251002HXC
5962L0251002HZA
5962L0251002HZC
50821
50821
50821
50821
SMHF283R3S/HL
SMHF283R3S/HL
SMHF283R3SF/HL
SMHF283R3SF/HL
5962R0251002HXA
5962R0251002HXC
5962R0251002HZA
5962R0251002HZC
50821
50821
50821
50821
SMHF283R3S/HR
SMHF283R3S/HR
SMHF283R3SF/HR
SMHF283R3SF/HR
5962L0251002KXA
5962L0251002KXC
5962L0251002KZA
5962L0251002KZC
50821
50821
50821
50821
SMHF283R3S/KL
SMHF283R3S/KL
SMHF283R3SF/KL
SMHF283R3SF/KL
5962R0251002KXA
5962R0251002KXC
5962R0251002KZA
5962R0251002KZC
50821
50821
50821
50821
SMHF283R3S/KR
SMHF283R3S/KR
SMHF283R3SF/KR
SMHF283R3SF/KR
1/ The lead finish shown for each PIN representing a hermetic package is the most readily available from the
manufacturer listed for that part. If the desired lead finish is not listed contact the Vendor to determine its
availability.
2/ Caution. Do not use this number for item acquisition. Items acquired to this number may not satisfy the
performance requirements of this drawing.
Vendor CAGE
number
Vendor name
and address
50821
Interpoint Corporation
10301 Willows Road
Redmond, WA 98073-9705
The information contained herein is disseminated for convenience only and the
Government assumes no liability whatsoever for any inaccuracies in the
information bulletin.
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