CEP01N6 [CET]

N-Channel Enhancement Mode Field Effect Transistor; N沟道增强型网络场效晶体管
CEP01N6
型号: CEP01N6
厂家: CHINO-EXCEL TECHNOLOGY    CHINO-EXCEL TECHNOLOGY
描述:

N-Channel Enhancement Mode Field Effect Transistor
N沟道增强型网络场效晶体管

晶体 晶体管
文件: 总4页 (文件大小:86K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
CEP01N6/CEB01N6  
CEI01N6/CEF01N6  
N-Channel Enhancement Mode Field Effect Transistor  
FEATURES  
Type  
VDSS  
650V  
650V  
650V  
650V  
RDS(ON)  
15  
ID  
@VGS  
10V  
CEP01N6  
CEB01N6  
CEI01N6  
CEF01N6  
1A  
1A  
1A  
1A e  
15Ω  
10V  
15Ω  
10V  
15Ω  
10V  
D
Super high dense cell design for extremely low RDS(ON)  
High power and current handing capability.  
Lead free product is acquired.  
.
TO-220 & TO-263 & TO-262 package & TO-220F full-pak for through hole.  
G
CEB SERIES  
TO-263(DD-PAK)  
CEI SERIES  
TO-262(I2-PAK)  
S
CEF SERIES  
TO-220F  
CEP SERIES  
TO-220  
ABSOLUTE MAXIMUM RATINGS T = 25 C unless otherwise noted  
c
Limit  
Parameter  
Symbol  
Units  
TO-220/263/262 TO-220F  
650  
Drain-Source Voltage  
VDS  
VGS  
ID  
V
V
Gate-Source Voltage  
±30  
1
4
1 e  
4 e  
Drain Current-Continuous  
Drain Current-Pulsed a  
A
f
IDM  
A
Maximum Power Dissipation @ TC = 25 C  
- Derate above 25 C  
Single Pulsed Avalanche Energy d  
Repetitive Avalanche Current  
Operating and Store Temperature Range  
36  
0.29  
28  
W
W/ C  
mJ  
A
PD  
0.22  
EAS  
IAS  
60  
0.8  
TJ,Tstg  
-55 to 150  
C
Thermal Characteristics  
Parameter  
Symbol  
RθJC  
Limit  
Units  
C/W  
C/W  
Thermal Resistance, Junction-to-Case  
Thermal Resistance, Junction-to-Ambient  
3.5  
62.5  
4.5  
65  
RθJA  
Rev 1. 2005.December  
http://www.cetsemi.com  
1
CEP01N6/CEB01N6  
CEI01N6/CEF01N6  
Electrical Characteristics T = 25 C unless otherwise noted  
c
Parameter  
Off Characteristics  
Symbol  
Test Condition  
Min  
Typ  
Max  
Units  
Drain-Source Breakdown Voltage  
Zero Gate Voltage Drain Current  
Gate Body Leakage Current, Forward  
Gate Body Leakage Current, Reverse  
On Characteristics  
BVDSS  
IDSS  
VGS = 0V, ID = 250µA  
VDS = 600V, VGS = 0V  
VGS = 30V, VDS = 0V  
VGS = -30V, VDS = 0V  
650  
V
1
µA  
µA  
µA  
IGSSF  
IGSSR  
10  
-10  
6
Gate Threshold Voltage  
Static Drain-Source  
VGS(th)  
RDS(on)  
VGS = VDS, ID = 250µA  
VGS = 10V, ID = 0.4A  
2
4
V
12  
15  
On-Resistance  
Dynamic Characteristics c  
Forwand Transconductance  
Input Capacitance  
b
gFS  
VDS = 20V, ID = 0.4A  
0.5  
136  
46  
S
Ciss  
Coss  
Crss  
pF  
pF  
pF  
VDS = 25V, VGS = 0V  
f = 1.0MHz  
Output Capacitance  
Reverse Transfer Capacitance  
Switching Characteristics c  
Turn-On Delay Time  
19  
td(on)  
tr  
td(off)  
tf  
19  
13  
24  
35  
6
38  
26  
48  
70  
8
ns  
ns  
VDD = 300V, ID = 0.4A,  
VGS = 10V, RGEN = 4.7Ω  
Turn-On Rise Time  
Turn-Off Delay Time  
ns  
Turn-On Fall Time  
ns  
Total Gate Charge  
Qg  
nC  
nC  
nC  
VDS = 480V, ID = 0.8A,  
VGS = 10V  
Gate-Source Charge  
Qgs  
Qgd  
1.0  
4.4  
Gate-Drain Charge  
Drain-Source Diode Characteristics and Maximun Ratings  
Drain-Source Diode Forward Current  
Drain-Source Diode Forward Voltage b  
IS  
0.8  
1.6  
A
V
VSD  
VGS = 0V, IS = 0.8A  
Notes :  
a.Repetitive Rating : Pulse width limited by maximum junction temperature .  
b.Pulse Test : Pulse Width < 300µs, Duty Cycle < 2% .  
c.Guaranteed by design, not subject to production testing.  
d.L = 190mH, I = 0.8A, V = 50V, R = 25Ω, Starting T = 25 C .  
AS  
DD  
G
J
e.Limited only by maximum temperature allowed .  
f .Pulse width limited by safe operating area .  
2
CEP01N6/CEB01N6  
CEI01N6/CEF01N6  
2.5  
1.5  
1.2  
0.9  
0.6  
0.3  
0.0  
25 C  
VGS=10,9,8V  
2.0  
1.5  
1.0  
0.5  
V
GS=6V  
V
GS=5V  
-55 C  
TJ=125 C  
0.0  
0
5
10  
15  
20  
25  
1
2
3
4
5
6
7
VDS, Drain-to-Source Voltage (V)  
VGS, Gate-to-Source Voltage (V)  
Figure 1. Output Characteristics  
Figure 2. Transfer Characteristics  
3.0  
2.5  
2.0  
1.5  
1.0  
0.5  
0.0  
240  
200  
160  
120  
80  
ID=0.4A  
VGS=10V  
C
iss  
C
oss  
40  
C
rss  
0
0
5
10  
15  
20  
25  
-100  
-50  
0
50  
100  
150  
200  
VDS, Drain-to-Source Voltage (V)  
TJ, Junction Temperature( C)  
Figure 3. Capacitance  
Figure 4. On-Resistance Variation  
with Temperature  
1.3  
1.2  
1.1  
1.0  
0.9  
0.8  
0.7  
0.6  
VDS=VGS  
ID=250µA  
V
GS=0V  
100  
10-1  
10-2  
-50 -25  
0
25 50 75 100 125 150  
0.2  
0.6  
1.0  
1.4  
1.8  
2.2  
TJ, Junction Temperature( C)  
VSD, Body Diode Forward Voltage (V)  
Figure 5. Gate Threshold Variation  
with Temperature  
Figure 6. Body Diode Forward Voltage  
Variation with Source Current  
3
CEP01N6/CEB01N6  
CEI01N6/CEF01N6  
101  
10  
8
VDS=480V  
ID=0.8A  
4
RDS(ON)Limit  
100ms  
1ms  
100  
10ms  
DC  
6
4
10-1  
2
TC=25 C  
TJ=150 C  
Single Pulse  
10-2  
0
100  
101  
102  
103  
0
1
2
3
4
5
6
Qg, Total Gate Charge (nC)  
VDS, Drain-Source Voltage (V)  
Figure 7. Gate Charge  
Figure 8. Maximum Safe  
Operating Area  
VDD  
on  
t
toff  
d(off)  
t
r
t
d(on)  
OUT  
RL  
t
f
t
VIN  
90%  
10%  
90%  
D
OUT  
V
V
VGS  
10%  
INVERTED  
RGEN  
G
90%  
50%  
50%  
S
IN  
V
10%  
PULSE WIDTH  
Figure 10. Switching Waveforms  
Figure 9. Switching Test Circuit  
100  
D=0.5  
0.2  
0.1  
10-1  
PDM  
0.05  
t1  
t2  
0.02  
0.01  
1. RθJC (t)=r (t) * RθJC  
2. RθJC=See Datasheet  
3. TJM-TC = P* RθJC (t)  
4. Duty Cycle, D=t1/t2  
Single Pulse  
10-2  
10-5  
10-4  
10-3  
10-2  
10-1  
100  
101  
Square Wave Pulse Duration (sec)  
Figure 11. Normalized Thermal Transient Impedance Curve  
4 - 5  

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