CEP02N7 [CET]

N-Channel Enhancement Mode Field Effect Transistor; N沟道增强型网络场效晶体管
CEP02N7
型号: CEP02N7
厂家: CHINO-EXCEL TECHNOLOGY    CHINO-EXCEL TECHNOLOGY
描述:

N-Channel Enhancement Mode Field Effect Transistor
N沟道增强型网络场效晶体管

晶体 晶体管
文件: 总4页 (文件大小:135K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
CEP02N7/CEB02N7  
CEI02N7/CEF02N7  
N-Channel Enhancement Mode Field Effect Transistor  
FEATURES  
Type  
VDSS  
700V  
700V  
700V  
700V  
RDS(ON)  
6.6  
ID  
@VGS  
10V  
CEP02N7  
CEB02N7  
CEI02N7  
CEF02N7  
1.9A  
1.9A  
1.9A  
1.9A e  
6.6Ω  
10V  
6.6Ω  
10V  
6.6Ω  
10V  
D
Super high dense cell design for extremely low RDS(ON)  
High power and current handing capability.  
Lead free product is acquired.  
.
TO-220 & TO-263 & TO-262 package & TO-220F full-pak for through hole.  
G
S
CEB SERIES  
TO-263(DD-PAK)  
CEI SERIES  
TO-262(I2-PAK)  
CEF SERIES  
TO-220F  
CEP SERIES  
TO-220  
ABSOLUTE MAXIMUM RATINGS T = 25 C unless otherwise noted  
c
Limit  
Parameter  
Symbol  
Units  
TO-220/263/262 TO-220F  
700  
Drain-Source Voltage  
VDS  
VGS  
ID  
V
V
Gate-Source Voltage  
±30  
1.9  
6
1.9 e  
6 e  
Drain Current-Continuous  
Drain Current-Pulsed a  
A
f
IDM  
A
Maximum Power Dissipation @ TC = 25 C  
- Derate above 25 C  
Single Pulsed Avalanche Energy d  
Repetitive Avalanche Current a  
Repetitive Avalanche Energy a  
Operating and Store Temperature Range  
60  
32  
W
PD  
0.48  
125  
2
0.26  
125  
2
W/ C  
mJ  
A
EAS  
IAR  
EAR  
5.4  
5.4  
mJ  
C
TJ,Tstg  
-55 to 150  
Thermal Characteristics  
Parameter  
Symbol  
RθJC  
Limit  
Units  
C/W  
C/W  
Thermal Resistance, Junction-to-Case  
Thermal Resistance, Junction-to-Ambient  
2.1  
3.9  
65  
RθJA  
62.5  
2004.October  
http://www.cetsemi.com  
4 - 10  
CEP02N7/CEB02N7  
CEI02N7/CEF02N7  
Electrical Characteristics T = 25 C unless otherwise noted  
c
4
Parameter  
Off Characteristics  
Symbol  
Test Condition  
Min  
Typ  
Max  
Units  
Drain-Source Breakdown Voltage  
Zero Gate Voltage Drain Current  
Gate Body Leakage Current, Forward  
Gate Body Leakage Current, Reverse  
On Characteristics b  
BVDSS  
IDSS  
VGS = 0V, ID = 250µA  
VDS = 700V, VGS = 0V  
VGS = 30V, VDS = 0V  
VGS = -30V, VDS = 0V  
700  
V
25  
µA  
nA  
nA  
IGSSF  
IGSSR  
100  
-100  
Gate Threshold Voltage  
Static Drain-Source  
VGS(th)  
RDS(on)  
gFS  
VGS = VDS, ID = 250µA  
VGS = 10V, ID = 1A  
2
4
V
S
5.5  
0.7  
6.6  
On-Resistance  
Forward Transconductance  
Dynamic Characteristics c  
Input Capacitance  
VDS = 50V, ID = 1A  
Ciss  
Coss  
Crss  
250  
50  
pF  
pF  
pF  
VDS = 25V, VGS = 0V,  
f = 1.0 MHz  
Output Capacitance  
Reverse Transfer Capacitance  
Switching Characteristics c  
Turn-On Delay Time  
30  
td(on)  
tr  
td(off)  
tf  
19  
26  
34  
15  
14  
2.5  
8.6  
35  
50  
70  
40  
20  
ns  
ns  
VDD = 300V, ID = 2A,  
VGS = 10V, RGEN = 18Ω  
Turn-On Rise Time  
Turn-Off Delay Time  
ns  
Turn-Off Fall Time  
ns  
Total Gate Charge  
Qg  
nC  
nC  
nC  
VDS = 480V, ID = 2A,  
VGS = 10V  
Gate-Source Charge  
Qgs  
Qgd  
Gate-Drain Charge  
Drain-Source Diode Characteristics and Maximun Ratings  
g
Drain-Source Diode Forward Current  
Drain-Source Diode Forward Voltage b  
IS  
1.9  
1.5  
A
V
h
VSD  
VGS = 0V, IS = 2A  
Notes :  
a.Repetitive Rating : Pulse width limited by maximum junction temperature .  
b.Pulse Test : Pulse Width < 300µs, Duty Cycle < 2% .  
c.Guaranteed by design, not subject to production testing.  
d.L =60mH, I =2.0A, V = 50V, R = 25Ω, Starting T = 25 C .  
AS  
DD  
G
J
e.Limited only by maximum temperature allowed .  
f .Pulse width limited by safe operating area .  
g.Full package I  
= 1.4A .  
S(max)  
h.Full package V test condition I = 1.5A , V = 1.6V .  
SD  
S
SD(Max)  
4 - 11  
CEP02N7/CEB02N7  
CEI02N7/CEF02N7  
3.0  
2.5  
2.0  
1.5  
1.0  
0.5  
0.0  
TJ=150 C  
100  
-55 C  
1.VDS=40V  
2.Pulse Test  
25 C  
10-1  
0
5
10  
15  
20  
25  
2
4
6
8
10  
VDS, Drain-to-Source Voltage (V)  
VGS, Gate-to-Source Voltage (V)  
Figure 1. Output Characteristics  
Figure 2. Transfer Characteristics  
3.0  
2.5  
2.0  
1.5  
1.0  
0.5  
0.0  
300  
250  
200  
150  
100  
50  
ID=1A  
VGS=10V  
C
iss  
C
oss  
C
rss  
0
-100  
-50  
0
50  
100  
150  
200  
0
5
10  
15  
20  
25  
VDS, Drain-to-Source Voltage (V)  
TJ, Junction Temperature( C)  
Figure 3. Capacitance  
Figure 4. On-Resistance Variation  
with Temperature  
1.3  
1.2  
1.1  
1.0  
0.9  
0.8  
0.7  
0.6  
VDS=VGS  
ID=250µA  
V
GS=0V  
101  
100  
10-1  
0.4  
0.6  
0.8  
1.0  
1.2  
-50 -25  
0
25 50 75 100 125 150  
TJ, Junction Temperature( C)  
VSD, Body Diode Forward Voltage (V)  
Figure 5. Gate Threshold Variation  
with Temperature  
Figure 6. Body Diode Forward Voltage  
Variation with Source Current  
4 - 12  
CEP02N7/CEB02N7  
CEI02N7/CEF02N7  
101  
15  
12  
9
VDS=480V  
ID=2A  
10ms  
4
RDS(ON)Limit  
1ms  
100  
10ms  
DC  
6
10-1  
3
TC=25 C  
TJ=150 C  
Single Pulse  
10-2  
0
100  
101  
102  
103  
0
5
10  
15  
20  
Qg, Total Gate Charge (nC)  
VDS, Drain-Source Voltage (V)  
Figure 7. Gate Charge  
Figure 8. Maximum Safe  
Operating Area  
VDD  
on  
t
toff  
d(off)  
t
r
t
d(on)  
OUT  
RL  
t
f
t
VIN  
90%  
10%  
90%  
D
OUT  
V
V
VGS  
10%  
INVERTED  
RGEN  
G
90%  
50%  
50%  
S
IN  
V
10%  
PULSE WIDTH  
Figure 10. Switching Waveforms  
Figure 9. Switching Test Circuit  
100  
D=0.5  
0.2  
0.1  
10-1  
PDM  
0.05  
t1  
t2  
0.02  
0.01  
1. RθJC (t)=r (t) * RθJC  
2. RθJC=See Datasheet  
3. TJM-TC = P* RθJC (t)  
4. Duty Cycle, D=t1/t2  
Single Pulse  
10-2  
10-5  
10-4  
10-3  
10-2  
10-1  
100  
101  
Square Wave Pulse Duration (sec)  
Figure 11. Normalized Thermal Transient Impedance Curve  
4 - 13  

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