BUK7226-100B [PHILIPS]

Power Field-Effect Transistor, N-Channel, Metal-oxide Semiconductor FET,;
BUK7226-100B
型号: BUK7226-100B
厂家: PHILIPS SEMICONDUCTORS    PHILIPS SEMICONDUCTORS
描述:

Power Field-Effect Transistor, N-Channel, Metal-oxide Semiconductor FET,

开关 脉冲 晶体管
文件: 总12页 (文件大小:86K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
BUK7226-100B  
TrenchMOS™ standard level FET  
Rev. 01 — 10 December 2002  
Objective data  
M3D300  
1. Product profile  
1.1 Description  
N-channel enhancement mode field-effect power transistor in a plastic package using  
Philips High-Performance Automotive (HPA) TrenchMOS™ technology, featuring very  
low on-state resistance.  
Product availability:  
BUK7226-100B in SOT428 (D-PAK)  
1.2 Features  
TrenchMOSTM technology  
175 °C rated  
Q101 compliant  
Standard level compatible  
1.3 Applications  
Automotive systems  
12 V, 24 V and 42 V loads  
Motors, lamps and solenoids  
General purpose power switching  
1.4 Quick reference data  
EDS(AL)S 147 mJ  
ID 48 A  
RDSon = 22 m(typ)  
Ptot 150 W  
2. Pinning information  
Table 1:  
Pinning - SOT428 (D-PAK), simplified outline and symbol  
Pin Description  
Simplified outline  
Symbol  
1
2
3
gate (g)  
d
mb  
[1]  
drain (d)  
source (s)  
g
mb mounting base;  
connected to  
s
MBB076  
drain (d)  
2
1
3
Top view  
MBK091  
SOT428 (D-PAK)  
[1] It is not possible to make connection to pin 2 of the SOT428 package.  
 
 
 
 
 
BUK7226-100B  
TrenchMOS™ standard level FET  
Philips Semiconductors  
3. Limiting values  
Table 2:  
Limiting values  
In accordance with the Absolute Maximum Rating System (IEC 60134).  
Symbol  
VDS  
Parameter  
Conditions  
Min  
Max  
100  
100  
±20  
48  
Unit  
V
drain-source voltage (DC)  
drain-gate voltage (DC)  
gate-source voltage (DC)  
drain current (DC)  
-
-
-
-
VDGR  
VGS  
RGS = 20 kΩ  
V
V
ID  
Tmb = 25 °C; VGS = 10 V;  
A
Figure 2 and 3  
T
mb = 100 °C; VGS = 10 V; Figure 2  
-
-
34  
A
A
IDM  
peak drain current  
Tmb = 25 °C; pulsed; tp 10 µs;  
192  
Figure 3  
Ptot  
Tstg  
Tj  
total power dissipation  
storage temperature  
junction temperature  
Tmb = 25 °C; Figure 1  
-
150  
W
55  
55  
+175  
+175  
°C  
°C  
Source-drain diode  
IDR  
reverse drain current (DC)  
peak reverse drain current  
Tmb = 25 °C  
-
-
48  
A
A
IDRM  
Tmb = 25 °C; pulsed; tp 10 µs  
192  
Avalanche ruggedness  
EDS(AL)S  
non-repetitive avalanche energy  
unclamped inductive load; ID = 48 A;  
-
147  
mJ  
VDS 100 V; VGS = 10 V;  
RGS = 50 ; starting Tj = 25 °C  
9397 750 10802  
© Koninklijke Philips Electronics N.V. 2002. All rights reserved.  
Objective data  
Rev. 01 — 10 December 2002  
2 of 12  
 
BUK7226-100B  
TrenchMOS™ standard level FET  
Philips Semiconductors  
03nl33  
03na19  
50  
120  
I
D
(A)  
P
der  
(%)  
40  
80  
40  
0
30  
20  
10  
0
0
50  
100  
150  
200  
0
50  
100  
150  
200  
C)  
T
( C)  
°
T
mb  
mb  
VGS 10 V  
Ptot  
Pder  
=
× 100%  
-----------------------  
P
°
tot(25 C)  
Fig 1. Normalized total power dissipation as a  
function of mounting base temperature.  
Fig 2. Continuous drain current as a function of  
mounting base temperature.  
03nl31  
3
10  
I
D
(A)  
limit R  
DSon  
= V /I  
DS D  
2
10  
t
p
= 10 s  
µ
100  
s
µ
10  
DC  
1 ms  
10 ms  
100 ms  
1
2
3
10  
1
10  
10  
V
(V)  
DS  
Tmb = 25 °C; IDM single pulse.  
Fig 3. Safe operating area; continuous and peak drain currents as a function of drain-source voltage.  
9397 750 10802  
© Koninklijke Philips Electronics N.V. 2002. All rights reserved.  
Objective data  
Rev. 01 — 10 December 2002  
3 of 12  
BUK7226-100B  
TrenchMOS™ standard level FET  
Philips Semiconductors  
4. Thermal characteristics  
Table 3:  
Symbol Parameter  
Rth(j-a) thermal resistance from junction to  
ambient  
Thermal characteristics  
Conditions  
Min  
Typ  
Max Unit  
-
71.4  
-
K/W  
Rth(j-mb) thermal resistance from junction to  
mounting base  
Figure 4  
-
0.45 1.0  
K/W  
4.1 Transient thermal impedance  
03nl34  
1
δ = 0.5  
Z
th(j-mb)  
(K/W)  
0.2  
0.1  
-1  
10  
0.05  
0.02  
-2  
10  
t
p
P
δ =  
single shot  
T
t
t
p
T
-3  
10  
-6  
10  
-5  
10  
-4  
10  
-3  
10  
-2  
10  
-1  
10  
1
t
(s)  
p
Fig 4. Transient thermal impedance from junction to mounting base as a function of pulse duration.  
9397 750 10802  
© Koninklijke Philips Electronics N.V. 2002. All rights reserved.  
Objective data  
Rev. 01 — 10 December 2002  
4 of 12  
 
 
BUK7226-100B  
TrenchMOS™ standard level FET  
Philips Semiconductors  
5. Characteristics  
Table 4:  
Tj = 25 °C unless otherwise specified.  
Symbol Parameter  
Static characteristics  
V(BR)DSS drain-source breakdown  
voltage  
Characteristics  
Conditions  
Min  
Typ  
Max  
Unit  
ID = 0.25 mA; VGS = 0 V  
Tj = 25 °C  
100  
89  
-
-
-
-
V
V
Tj = 55 °C  
VGS(th)  
gate-source threshold voltage ID = 1 mA; VDS = VGS  
Figure 9  
Tj = 25 °C  
;
2
1
-
3
-
4
V
V
V
Tj = 175 °C  
Tj = 55 °C  
-
-
4.4  
IDSS  
drain-source leakage current VDS = 100 V; VGS = 0 V  
Tj = 25 °C  
Tj = 175 °C  
-
-
-
0.02  
1
µA  
µA  
nA  
-
500  
100  
IGSS  
gate-source leakage current VGS = ±20 V; VDS = 0 V  
2
RDSon  
drain-source on-state  
resistance  
VGS = 10 V; ID = 25 A;  
Figure 7 and 8  
Tj = 25 °C  
-
-
22  
-
26  
65  
mΩ  
mΩ  
Tj = 175 °C  
Dynamic characteristics  
Qg(tot)  
Qgs  
Qgd  
Ciss  
Coss  
Crss  
td(on)  
tr  
total gate charge  
gate-source charge  
gate-drain (Miller) charge  
input capacitance  
output capacitance  
reverse transfer capacitance  
turn-on delay time  
rise time  
VGS = 10V; VDS = 80 V;  
ID = 25 A; Figure 14  
-
-
-
-
-
-
-
-
-
-
-
37  
-
nC  
nC  
nC  
pF  
pF  
pF  
nS  
nS  
nS  
nS  
nH  
9
-
13  
-
VGS = 0 V; VDS = 25 V;  
f = 1 MHz; Figure 12  
2092  
241  
102  
18  
2789  
289  
140  
VDS = 25 V; RL = 1.0 ;  
VGS = 10 V; RG = 10 Ω  
-
-
-
-
-
99  
td(off)  
tf  
turn-off delay time  
fall time  
50  
20  
Ld  
internal drain inductance  
measured from drain to  
centre of die  
2.5  
Ls  
internal source inductance  
measured from source lead  
to source bond pad  
-
-
7.5  
-
nH  
V
Source-drain diode  
VSD  
source-drain (diode forward) IS = 16 A; VGS = 0 V;  
0.85  
1.2  
voltage  
Figure 15  
trr  
reverse recovery time  
recovered charge  
IS = 20 A; dIS/dt = 100 A/µs  
VGS = 10 V; VDS = 30 V  
-
-
94  
-
-
ns  
Qr  
114  
nC  
9397 750 10802  
© Koninklijke Philips Electronics N.V. 2002. All rights reserved.  
Objective data  
Rev. 01 — 10 December 2002  
5 of 12  
 
BUK7226-100B  
TrenchMOS™ standard level FET  
Philips Semiconductors  
03nl28  
03nl27  
140  
35  
Label is V  
(V)  
GS  
I
D
9
(A)  
R
20  
12  
10  
8.5  
8
DSon  
(m)  
105  
7.5  
7
30  
25  
20  
70  
35  
0
6.5  
6
5.5  
5
4.5  
0
2
4
6
8
10  
(V)  
5
10  
15  
20  
V
(V)  
GS  
V
DS  
Tj = 25 °C; tp = 300 µs  
Tj = 25 °C; ID = 25 A  
Fig 5. Output characteristics: drain current as a  
function of drain-source voltage; typical values.  
Fig 6. Drain-source on-state resistance as a function  
of gate-source voltage; typical values.  
03nl29  
03ng41  
60  
2.5  
Label is V  
(V)  
6
R
GS  
DSon  
a
2
(m)  
6.5  
7
8
10 20  
50  
40  
30  
20  
10  
1.5  
1
0.5  
0
0
35  
70  
105  
140  
-60  
0
60  
120  
180  
I
(A)  
D
T (ºC)  
j
Tj = 25 °C; tp = 300µs  
RDSon  
a =  
----------------------------  
RDSon(25 C)  
°
Fig 7. Drain-source on-state resistance as a function  
of drain current; typical values.  
Fig 8. Normalized drain-source on-state resistance  
factor as a function of junction temperature.  
9397 750 10802  
© Koninklijke Philips Electronics N.V. 2002. All rights reserved.  
Objective data  
Rev. 01 — 10 December 2002  
6 of 12  
BUK7226-100B  
TrenchMOS™ standard level FET  
Philips Semiconductors  
03aa32  
03aa35  
-1  
-2  
-3  
-4  
-5  
-6  
5
10  
I
V
D
(A)  
GS(th)  
(V)  
4
10  
max  
typ  
min  
typ  
max  
3
2
1
0
10  
10  
10  
10  
min  
-60  
0
60  
120  
180  
0
2
4
6
°
T ( C)  
V
(V)  
j
GS  
ID = 1 mA; VDS = VGS  
Tj = 25 °C; VDS = VGS  
Fig 9. Gate-source threshold voltage as a function of  
junction temperature.  
Fig 10. Sub-threshold drain current as a function of  
gate-source voltage.  
03nl25  
03nl30  
40  
3000  
C
iss  
g
(S)  
fs  
C
(pF)  
30  
2000  
C
oss  
20  
10  
0
1000  
C
rss  
0
-1  
2
10  
0
20  
40  
60  
10  
1
10  
I
(A)  
D
V
(V)  
DS  
Tj = 25 °C; VDS = 25 V  
VGS = 0 V; f = 1 MHz  
Fig 11. Forward transconductance as a function of  
drain current; typical values.  
Fig 12. Input, output and reverse transfer capacitances  
as a function of drain-source voltage; typical  
values.  
9397 750 10802  
© Koninklijke Philips Electronics N.V. 2002. All rights reserved.  
Objective data  
Rev. 01 — 10 December 2002  
7 of 12  
BUK7226-100B  
TrenchMOS™ standard level FET  
Philips Semiconductors  
03nl26  
03nl24  
100  
10  
V
GS  
(V)  
I
D
(A)  
8
6
4
2
0
75  
V
= 14 V  
V
= 80 V  
DD  
DD  
50  
25  
T = 175 C  
T = 25 C  
°
°
j
j
0
0
2
4
6
8
0
10  
20  
30  
40  
V
(V)  
Q
(nC)  
GS  
G
VDS = 25 V  
Tj = 25 °C; ID = 25 A  
Fig 13. Transfer characteristics: drain current as a  
function of gate-source voltage; typical values.  
Fig 14. Gate-source voltage as a function of turn-on  
gate charge; typical values.  
03nl23  
100  
I
S
(A)  
75  
50  
25  
T = 175 C  
T = 25 C  
°
°
j
j
0
0.0  
0.3  
0.6  
0.9  
1.2  
V
(V)  
SD  
VGS = 0 V  
Fig 15. Reverse diode current as a function of reverse diode voltage; typical values.  
9397 750 10802  
© Koninklijke Philips Electronics N.V. 2002. All rights reserved.  
Objective data  
Rev. 01 — 10 December 2002  
8 of 12  
BUK7226-100B  
TrenchMOS™ standard level FET  
Philips Semiconductors  
6. Package outline  
Plastic single-ended surface mounted package (Philips version of D-PAK); 3 leads  
(one lead cropped)  
SOT428  
seating plane  
y
A
A
E
A
2
A
b
E
1
1
2
mounting  
base  
D
1
D
H
E
L
2
2
L
1
L
1
3
b
b
w
M
A
c
1
e
e
1
0
10  
20 mm  
scale  
DIMENSIONS (mm are the original dimensions)  
(1)  
D
L
y
1
1
A
A
A
b
D
E
E
H
UNIT  
b
b
c
e
e
1
L
L
w
2
1
2
1
E
1
2
max.  
min.  
min.  
0.65  
0.45  
0.89  
0.71  
0.9  
0.5  
2.38  
2.22  
0.93  
0.73  
1.1  
0.9  
5.46  
5.26  
0.4 6.22  
0.2 5.98  
6.73  
6.47  
10.4 2.95  
9.6  
2.55  
4.81  
4.45  
mm  
4.57  
0.2  
0.2  
4.0  
2.285  
0.5  
Note  
1. Measured from heatsink back to lead.  
REFERENCES  
JEDEC  
EUROPEAN  
PROJECTION  
OUTLINE  
VERSION  
ISSUE DATE  
IEC  
JEITA  
99-09-13  
01-12-11  
SOT428  
TO-252  
SC-63  
Fig 16. SOT428 (D-PAK)  
9397 750 10802  
© Koninklijke Philips Electronics N.V. 2002. All rights reserved.  
Objective data  
Rev. 01 — 10 December 2002  
9 of 12  
 
BUK7226-100B  
TrenchMOS™ standard level FET  
Philips Semiconductors  
7. Revision history  
Table 5:  
Revision history  
CPCN  
Rev Date  
Description  
01 20021210  
-
Objective data (9397 750 10802)  
9397 750 10802  
© Koninklijke Philips Electronics N.V. 2002. All rights reserved.  
Objective data  
Rev. 01 — 10 December 2002  
10 of 12  
 
BUK7226-100B  
TrenchMOS™ standard level FET  
Philips Semiconductors  
8. Data sheet status  
Level Data sheet status[1]  
Product status[2][3]  
Definition  
I
Objective data  
Development  
This data sheet contains data from the objective specification for product development. Philips  
Semiconductors reserves the right to change the specification in any manner without notice.  
II  
Preliminary data  
Qualification  
This data sheet contains data from the preliminary specification. Supplementary data will be published  
at a later date. Philips Semiconductors reserves the right to change the specification without notice, in  
order to improve the design and supply the best possible product.  
III  
Product data  
Production  
This data sheet contains data from the product specification. Philips Semiconductors reserves the  
right to make changes at any time in order to improve the design, manufacturing and supply. Relevant  
changes will be communicated via a Customer Product/Process Change Notification (CPCN).  
[1]  
[2]  
Please consult the most recently issued data sheet before initiating or completing a design.  
The product status of the device(s) described in this data sheet may have changed since this data sheet was published. The latest information is available on the Internet at  
URL http://www.semiconductors.philips.com.  
[3]  
For data sheets describing multiple type numbers, the highest-level product status determines the data sheet status.  
customers using or selling these products for use in such applications do so  
at their own risk and agree to fully indemnify Philips Semiconductors for any  
damages resulting from such application.  
9. Definitions  
Short-form specification The data in a short-form specification is  
extracted from a full data sheet with the same type number and title. For  
detailed information see the relevant data sheet or data handbook.  
Right to make changes — Philips Semiconductors reserves the right to  
make changes in the products - including circuits, standard cells, and/or  
software - described or contained herein in order to improve design and/or  
performance. When the product is in full production (status ‘Production’),  
relevant changes will be communicated via a Customer Product/Process  
Change Notification (CPCN). Philips Semiconductors assumes no  
responsibility or liability for the use of any of these products, conveys no  
licence or title under any patent, copyright, or mask work right to these  
products, and makes no representations or warranties that these products are  
free from patent, copyright, or mask work right infringement, unless otherwise  
specified.  
Limiting values definition Limiting values given are in accordance with  
the Absolute Maximum Rating System (IEC 60134). Stress above one or  
more of the limiting values may cause permanent damage to the device.  
These are stress ratings only and operation of the device at these or at any  
other conditions above those given in the Characteristics sections of the  
specification is not implied. Exposure to limiting values for extended periods  
may affect device reliability.  
Application information Applications that are described herein for any  
of these products are for illustrative purposes only. Philips Semiconductors  
make no representation or warranty that such applications will be suitable for  
the specified use without further testing or modification.  
11. Trademarks  
TrenchMOS — is a trademark of Koninklijke Philips Electronics N.V.  
10. Disclaimers  
Life support — These products are not designed for use in life support  
appliances, devices, or systems where malfunction of these products can  
reasonably be expected to result in personal injury. Philips Semiconductors  
Contact information  
For additional information, please visit http://www.semiconductors.philips.com.  
For sales office addresses, send e-mail to: sales.addresses@www.semiconductors.philips.com.  
Fax: +31 40 27 24825  
© Koninklijke Philips Electronics N.V. 2002. All rights reserved.  
11 of 12  
9397 750 10802  
Objective data  
Rev. 01 — 10 December 2002  
 
 
 
 
 
BUK7226-100B  
TrenchMOS™ standard level FET  
Philips Semiconductors  
Contents  
1
Product profile . . . . . . . . . . . . . . . . . . . . . . . . . . 1  
Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1  
Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1  
Applications . . . . . . . . . . . . . . . . . . . . . . . . . . . 1  
Quick reference data. . . . . . . . . . . . . . . . . . . . . 1  
1.1  
1.2  
1.3  
1.4  
2
Pinning information. . . . . . . . . . . . . . . . . . . . . . 1  
Limiting values. . . . . . . . . . . . . . . . . . . . . . . . . . 2  
Thermal characteristics. . . . . . . . . . . . . . . . . . . 4  
Transient thermal impedance . . . . . . . . . . . . . . 4  
Characteristics. . . . . . . . . . . . . . . . . . . . . . . . . . 5  
Package outline . . . . . . . . . . . . . . . . . . . . . . . . . 9  
Revision history. . . . . . . . . . . . . . . . . . . . . . . . 10  
Data sheet status . . . . . . . . . . . . . . . . . . . . . . . 11  
Definitions . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11  
Disclaimers. . . . . . . . . . . . . . . . . . . . . . . . . . . . 11  
Trademarks. . . . . . . . . . . . . . . . . . . . . . . . . . . . 11  
3
4
4.1  
5
6
7
8
9
10  
11  
© Koninklijke Philips Electronics N.V. 2002.  
Printed in The Netherlands  
All rights are reserved. Reproduction in whole or in part is prohibited without the prior  
written consent of the copyright owner.  
The information presented in this document does not form part of any quotation or  
contract, is believed to be accurate and reliable and may be changed without notice. No  
liability will be accepted by the publisher for any consequence of its use. Publication  
thereof does not convey nor imply any license under patent- or other industrial or  
intellectual property rights.  
Date of release: 10 December 2002  
Document order number: 9397 750 10802  

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