HI-5701883 [INTERSIL]

6-Bit, 30 MSPS Flash A/D Converter; 6位, 30 MSPS的Flash A / D转换器
HI-5701883
型号: HI-5701883
厂家: Intersil    Intersil
描述:

6-Bit, 30 MSPS Flash A/D Converter
6位, 30 MSPS的Flash A / D转换器

转换器
文件: 总8页 (文件大小:63K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
HI-5701/883  
6-Bit, 30 MSPS Flash A/D Converter  
June 1994  
Features  
Description  
• This Circuit is Processed in Accordance to MIL-STD- The HI-5701/883 is a monolithic, 6-bit, CMOS Flash Analog-  
883 and is Fully Conformant Under the Provisions of to-Digital Converter. It is designed for high speed  
Paragraph 1.2.1.  
applications where wide bandwidth and low power  
consumption are essential. Its 30 MSPS speed is made  
possible by a parallel architecture which also eliminates the  
need for an external sample and hold circuit. The HI-5701/  
883 delivers ±0.7 LSB differential nonlinearity while  
consuming only 250mW (typical) at 30 MSPS. Microproces-  
sor compatible data output latches are provided which  
present valid data to the output bus 1.5 clock cycles after the  
convert command is received. An overflow bit is provided to  
allow the series connection of two converters to achieve 7-bit  
resolution.  
• 30 MSPS with No Missing Codes  
• 20MHz Full Power Input Bandwidth  
• No Missing Codes Over Temperature  
• Sample and Hold Not Required  
• Single +5V Supply Voltage  
• CMOS/TTL  
• Overflow Bit  
Ordering Information  
Applications  
TEMPERATURE  
• Video Digitizing  
PART NUMBER  
RANGE  
PACKAGE  
• Radar Systems  
o
o
HI1-5701T/883  
-55 C to +125 C  
18 Lead CerDIP  
• Medical Imaging  
• Communication Systems  
• High Speed Data Acquisition Systems  
Functional Block Diagram  
Pinout  
2
1
1
2
1
HI-5701/883  
(18 LEAD CERDIP)  
TOP VIEW  
VIN 11  
OVERFLOW  
(OVF)  
D
CL  
R/2  
Q
2
9
VREF  
+
COMP  
64  
D
CL  
1
2
3
4
5
6
7
8
9
18  
17  
D5 (MSB)  
OVF  
D4  
D3  
Q
R
1
3
D5 (MSB)  
D4  
D
CL  
Q
VSS  
16 1/2R  
15 D2  
R
COMP  
63  
NC  
D
CL  
R
R
Q
4
5
D3  
16  
1/2R  
CE2  
14 D1  
D
CL  
CE1  
13 D0 (LSB)  
COMP  
32  
Q
D2  
R
R
CLK  
12  
11  
10  
VDD  
VIN  
D
CL  
10  
D1  
Q
PHASE  
COMP  
2
VREF  
+
VREF  
-
D
CL  
D0 (LSB)  
Q
11  
10  
-
VREF  
R/2  
COMP  
1
CE1  
CE2  
16  
15  
VDD  
VSS  
12  
3
7
8
CLK  
2 (SAMPLE)  
1 (AUTO BALANCE)  
PHASE  
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures.  
Spec Number 512031  
File Number 3378  
1-888-INTERSIL or 321-724-7143 | Copyright © Intersil Corporation 1999  
6-1  
HI-5701/883  
Pin Description  
PIN #  
NAME  
DESCRIPTION  
1
2
3
4
5
6
7
8
D5  
Bit 6, Output (MSB)  
Overflow, Output  
Digital Ground  
OVF  
V
SS  
NC  
CE2  
No Connection  
Three-State Output Enable Input, Active high (See Truth Table)  
Three-State Output Enable Input, Active Low (See Truth Table)  
Clock Input  
CE1  
CLK  
PHASE  
Sample Clock Phase Control Input. When Phase is Low, Sample Unknown (φ1) occurs when the Clock  
is Low and Auto Balance (φ2) occurs when the Clock is High (See Phase Control Table)  
9
V
+
Reference Voltage Positive Input  
Reference Voltage Negative Input  
Analog Signal Input  
Power Supply, +5V  
Bit 1, Output (LSB)  
Bit 2, Output  
REF  
10  
11  
12  
13  
14  
15  
16  
17  
18  
V
-
REF  
V
IN  
V
DD  
D0  
D1  
D2  
Bit 3, Output  
1/2R  
D3  
Reference Ladder Midpoint  
Bit 4, Output  
D4  
Bit 5, Output  
Chip Enable Truth Table  
Phase Control  
CE1  
CE2  
D0 - D5  
Valid  
OVF  
CLOCK  
PHASE  
INTERNAL GENERATION  
Sample Unknown (φ2)  
Auto Balance 1)  
0
1
1
0
Valid  
Valid  
0
0
1
1
0
1
0
1
1
Three-State  
Three-State  
X
Three-State  
Auto Balance 1)  
X = Don’t Care.  
Sample Unknown (φ2)  
Spec Number 512031  
6-2  
Specifications HI-5701/883  
Absolute Maximum Ratings  
Thermal Information  
Supply Voltage, V to V . . . . . . . . . . . (VSS - 0.5) < V < +7.0V Thermal Resistance  
θ
θ
JC  
28 C/W  
DD  
SS  
DD  
JA  
0
o
Analog and Reference Input Pins. .(VSS - 0.5) < V  
< (V +0.5V)  
HI1-5701T/883. . . . . . . . . . . . . . . . . . . . .  
70 C/W  
INA  
DD  
o
Digital I/O Pins . . . . . . . . . . . . . . . . (VSS - 0.5) < V < (V +0.5V) Power Dissipation at +75 C (Note 1)  
I/O  
DD  
Operating Temperature Range  
HI1-5701T/883 . . . . . . . . . . . . . . . . . . . . . . . . . . -55 C to +125 C  
Junction Temperature. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . +175 C  
Storage Temperature Range . . . . . . . . . . . . . . . -65 C to +150 C Reliability Information  
Lead Temperature (Soldering, 10s) . . . . . . . . . . . . . . . . . . . . 300 C  
ESD Clasification . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Class 1 Worst Case Density . . . . . . . . . . . . . . . . . . . . . . . . 3.05 x 10 A/cm  
HI1-5701T/883. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1.4mW  
o
o
o
Power Dissipation Derating Factor Above +75 C  
HI1-5701T/883. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14mW/ C  
o
o
o
o
o
Transistor Count . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4815  
4
2
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation  
of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied.  
TABLE 1. DC ELECTRICAL PERFORMANCE CHARACTERISTICS  
Device Tested at: V = +5.0V; V  
+ = +4.0V; V  
- = V = GND; F = Specified Clock Frequency at 50% Duty Cycle; C = 30pF;  
DD  
REF  
REF SS S L  
Unless Otherwise Specified.  
LIMITS  
GROUP A  
PARAMETERS  
SYMBOL  
CONDITIONS  
SUBGROUP  
TEMPERATURE  
MIN  
MAX  
UNIT  
ACCURACY  
o
Integral Linearity Error  
(Best Fit Method)  
INL  
F
F
F
F
F
F
= 20MHz, f = DC  
1
2, 3  
1
+25 C  
-
-
-
-
-
-
-
-
-
-
-
-
±1.25  
±2.0  
±1.5  
±2.5  
±0.6  
±0.75  
±0.75  
±1.0  
±2.0  
±2.5  
±2.0  
±2.5  
LSB  
LSB  
LSB  
LSB  
LSB  
LSB  
LSB  
LSB  
LSB  
LSB  
LSB  
LSB  
S
S
S
S
S
S
IN  
o
o
+125 C, -55 C  
o
= 30MHz, f = DC  
+25 C  
IN  
o
o
2, 3  
1
+125 C, -55 C  
o
Differential Linearity Error  
(Guaranteed No Missing  
Codes)  
DNL  
= 20MHz, f = DC  
+25 C  
IN  
o
o
2, 3  
1
+125 C, -55 C  
o
= 30MHz, f = DC  
+25 C  
IN  
o
o
2, 3  
1
+125 C, -55 C  
o
Offset Error  
(Adjustable to Zero)  
VOS  
FSE  
= 20MHz, f = DC  
+25 C  
IN  
o
o
2, 3  
1
+125 C, -55 C  
o
Full Scale Error  
(Adjustable to Zero)  
= 20MHz, f = DC  
+25 C  
IN  
o
o
2, 3  
+125 C, -55 C  
ANALOG INPUT  
o
Analog Input Resistance  
R
V
V
= 4V  
1
+25 C  
4
4
-
MΩ  
MΩ  
µA  
IN  
IN  
IN  
o
o
2, 3  
1
+125 C, -55 C  
-
o
Analog Input Bias Current  
I
= 0V, 4V  
+25 C  
±1.0  
±1.0  
B
o
o
2, 3  
+125 C, -55 C  
µA  
REFERENCE INPUT  
o
Total Reference Resistance  
R
1
+25 C  
250  
235  
-
-
L
o
o
2, 3  
+125 C, -55 C  
Spec Number 512031  
6-3  
Specifications HI-5701/883  
TABLE 1. DC ELECTRICAL PERFORMANCE CHARACTERISTICS (Continued)  
Device Tested at: V = +5.0V; V  
+ = +4.0V; V  
- = V = GND; F = Specified Clock Frequency at 50% Duty Cycle; C = 30pF;  
DD  
REF  
REF SS S L  
Unless Otherwise Specified.  
LIMITS  
GROUP A  
PARAMETERS  
SYMBOL  
CONDITIONS  
SUBGROUP  
TEMPERATURE  
MIN  
MAX  
UNIT  
DIGITAL INPUTS  
Input High Voltage  
o
V
1
2, 3  
1
+25 C  
2.0  
-
V
V
IH  
o
o
+125 C, -55 C  
2.0  
-
o
Input Low Voltage  
Logic Input Current  
V
I
+25 C  
-
-
-
-
0.8  
0.8  
±1  
±1  
V
IL  
o
o
2, 3  
1
+125 C, -55 C  
V
o
V
= 0V, +5V  
IN  
+25 C  
µA  
µA  
IN  
o
o
2, 3  
+125 C, -55 C  
DIGITAL OUTPUTS  
Output Leakage  
o
I
CE2 = 0V, V = 0V, 5V  
1
2, 3  
1
+25 C  
-
±1.0  
µA  
µA  
OZ  
O
o
o
+125 C, -55 C  
-
±1.0  
o
Output Logic Source Current  
Output Logic Sink Current  
I
V
V
= 4.5V  
= 0.4V  
+25 C  
-3.2  
-3.2  
3.2  
3.2  
-
-
-
-
mA  
mA  
mA  
mA  
OH  
O
O
o
o
2, 3  
1
+125 C, -55 C  
o
I
+25 C  
OL  
o
o
2, 3  
+125 C, -55 C  
POWER SUPPLY REJECTION  
Offset Error PSRR  
o
VOS  
FSE  
V
V
= 5V ±10%  
= 5V ±10%  
1
+25 C  
-
-
-
-
±1.0  
±1.5  
±1.0  
±1.5  
LSB  
LSB  
LSB  
LSB  
DD  
DD  
o
o
2, 3  
1
+125 C, -55 C  
o
Gain Error PSRR  
+25 C  
o
o
2, 3  
+125 C, -55 C  
POWER SUPPLY CURRENT  
Supply Current  
o
I
F
= 30MHz  
S
1
+25 C  
-
-
60  
75  
mA  
mA  
DD  
o
o
2, 3  
+125 C, -55 C  
NOTE:  
1. Dissipation rating assumes device is mounted with all leads soldered to printed circuit board.  
Spec Number 512031  
6-4  
Specifications HI-5701/883  
TABLE 2. AC ELECTRICAL PERFORMANCE CHARACTERISTICS  
Device Tested at: V = +5.0V; V  
+ = +4.0V; V  
- = V = GND; F = Specified Clock Frequency at 50% Duty Cycle; C = 30pF;  
DD  
REF  
REF SS S L  
Unless Otherwise Specified.  
LIMITS  
GROUP A  
PARAMETER  
SYMBOL  
CONDITIONS  
SUBGROUP  
TEMPERATURE  
MIN  
MAX  
-
UNIT  
MSPS  
MSPS  
ns  
o
Maximum Conversion Rate  
Data Output Enable Time  
Data Output Disable Time  
Data Output Delay  
No Missing Codes  
9
10, 11  
9
+25 C  
30  
30  
-
o
o
+125 C, -55 C  
-
o
t
+25 C  
20  
20  
20  
20  
20  
20  
-
EN  
o
o
10, 11  
9
+125 C, -55 C  
-
ns  
o
t
+25 C  
-
ns  
DIS  
o
o
10, 11  
9
+125 C, -55 C  
-
ns  
o
t
+25 C  
-
ns  
OD  
o
o
10, 11  
9
+125 C, -55 C  
-
ns  
o
Data Output Hold  
t
+25 C  
10  
5
ns  
H
o
o
10, 11  
+125 C, -55 C  
-
ns  
TABLE 3. ELECTRICAL PERFORMANCE CHARACTERISTICS (NOTE 1)  
Device Characterized at: V = +5.0V; V + = +4.0V; V - = V = GND; F = Specified Clock Frequency at 50% Duty Cycle; C = 30pF;  
DD  
REF  
REF  
SS  
S
L
Unless Otherwise Specified.  
LIMITS  
PARAMETER  
SYMBOL  
CONDITIONS  
No Missing Codes  
TEMPERATURE  
MIN  
MAX  
UNIT  
MSPS  
o
o
o
Minimum Conversion Rate  
NOTE:  
+25 C, +125 C, -55 C  
-
0.125  
1. Parameters listed in Table 3 are controlled via design or process parameters and are not directly tested at final production. These param-  
eters are lab characterized upon initial design release, or upon design changes. These parameters are guaranteed by characterization  
based upon data from multiple production runs which reflect lot to lot and within lot variation.  
TABLE 4. ELECTRICAL TEST REQUIREMENTS  
MIL-STD-883 TEST REQUIREMENTS  
Interim Electrical Parameters (Pre Burn-In)  
Final Electrical Test Parameters  
Group A Test Requirements  
Groups C and D Endpoints  
SUBGROUPS (SEE TABLES 1 AND 2)  
1
1 (Note 1), 2, 3, 9, 10, 11  
1, 2, 3, 9, 10, 11  
1
NOTE:  
1. PDA applies to Subgroup 1 only. No other subgroups are included in PDA.  
Spec Number 512031  
6-5  
HI-5701/883  
Die Characteristics  
DIE DIMENSIONS:  
2220µm x 3320µm x 19 ± 1mils  
METALLIZATION:  
Type: Si - Al  
Thickness: 11kÅ ± 1kÅ  
GLASSIVATION:  
Type: SiO2  
Thickness: 8kÅ ± 1kÅ  
DIE ATTACH:  
Material: Gold Silicon Eutectic Alloy  
Temperature: Ceramic DIP - 460oC (Max)  
WORST CASE CURRENT DENSITY:  
3.05 x 104 A/cm2  
Metallization Mask Layout  
HI-5701/883  
VSS  
1/2R  
D2  
CE2  
D1  
D0  
VDD  
CE1  
Spec Number 512031  
6-6  
HI-5701/883  
Timing Waveforms  
COMPARATOR DATA  
IS LATCHED  
ENCODED DATA IS  
LATCHED INTO THE  
OUTPUT REGISTERS  
CLOCK  
INPUT  
1
1
1
1
2
2
2
2
2
PHASE - HIGH  
CLOCK  
INPUT  
PHASE - LOW  
SAMPLE  
N-2  
SAMPLE  
N-1  
SAMPLE  
SAMPLE  
N+1  
SAMPLE  
N+2  
N
AUTO  
BALANCE  
tAB  
AUTO  
BALANCE  
AUTO  
BALANCE  
AUTO  
BALANCE  
ANALOG  
INPUT  
tAP  
tH  
tAJ  
tOD  
DATA  
OUTPUT  
DATA N-4  
DATA N-3  
DATA N-2  
DATA N-1  
DATA N  
FIGURE 1. INPUT-TO-OUTPUT TIMING  
CE1  
CE2  
tEN  
tDIS  
tEN  
tDIS  
HIGH  
HIGH  
D0 - D5  
DATA  
DATA  
DATA  
DATA  
IMPEDANCE  
IMPEDANCE  
HIGH  
OVF  
DATA  
IMPEDANCE  
FIGURE 2. OUTPUT ENABLE TIMING  
HI-5701/883 CerDIP  
Burn-In Circuit  
+5V  
1
2
3
4
5
6
7
8
9
18  
17  
16  
15  
14  
13  
12  
11  
10  
C1  
0.01µF/0.1µF  
CAP  
0V  
CLK  
+4V  
VIN  
C7  
CAP  
0.01µF/0.1µF  
0V  
NOTES:  
1. Power supply and the reference voltage input to be decoupled by 0.01µF in parallel with 1µF capacitor  
2. Clock input is a pulse with 1:10 duty cycle, approximately 100KHz and 0V to 4V amplitude  
3. V , analog input is a slow triangular waveform (F = 10KHz) and 0V to 4V amplitude  
IN  
IN  
4. All supplies to be protected with <7V zener diodes  
Spec Number 512031  
6-7  
HI-5701/883  
Packaging  
F18.3 MIL-STD-1835 GDIP1-T18 (D-6, CONFIGURATION A)  
18 LEAD FRIT SEAL DUAL-IN-LINE CERAMIC PACKAGE  
FRIT SEAL DUAL-IN-LINE CERAMIC PACKAGE  
c1  
LEAD FINISH  
INCHES MILLIMETERS  
MIN  
-A-  
-D-  
E
SYMBOL  
MAX  
0.200  
0.026  
0.023  
0.065  
0.045  
0.018  
0.015  
0.960  
0.310  
MIN  
-
MAX  
5.08  
0.66  
0.58  
1.65  
1.14  
0.46  
0.38  
24.38  
7.87  
NOTES  
BASE  
(c)  
METAL  
A
b
-
-
2
3
-
0.014  
0.014  
0.045  
0.023  
0.008  
0.008  
-
0.36  
0.36  
1.14  
0.58  
0.20  
0.20  
-
b1  
b1  
b2  
b3  
c
M
M
-B-  
(b)  
SECTION A-A  
4
2
3
5
5
-
S
S
S
D
bbb  
C
A - B  
D
c1  
D
BASE  
PLANE  
Q
A
-C-  
SEATING  
PLANE  
E
0.220  
5.59  
L
α
e
0.100 BSC  
2.54 BSC  
S1  
b2  
eA  
A
A
eA  
eA/2  
L
0.300 BSC  
0.150 BSC  
7.62 BSC  
3.81 BSC  
-
-
e
eA/2  
b
c
0.125  
0.200  
3.18  
5.08  
-
M
S
S
M
S
S
D
ccc  
C
A - B  
D
aaa  
C
A - B  
Q
0.015  
0.005  
0.005  
0.070  
0.38  
0.13  
0.13  
1.78  
6
7
S1  
S2  
α
-
-
-
-
o
o
o
o
90  
105  
90  
105  
-
-
aaa  
bbb  
ccc  
M
-
-
-
-
0.015  
0.030  
0.010  
0.0015  
-
-
-
-
0.38  
0.76  
0.25  
0.038  
-
NOTES:  
-
1. Index area: A notch or a pin one identification mark shall be located  
adjacent to pin one and shall be located within the shaded area  
shown. The manufacturer’s identification shall not be used as a pin  
one identification mark.  
2
8
N
18  
18  
5. This dimension allows for off-center lid, meniscus, and glass overrun.  
2. The maximum limits of lead dimensions b and c or M shall be mea-  
sured at the centroid of the finished lead surfaces, when solder dip  
or tin plate lead finish is applied.  
6. Dimension Q shall be measured from the seating plane to the base  
plane.  
3. Dimensions b1 and c1 apply to lead base metal only. Dimension M  
applies to lead plating and finish thickness.  
7. Measure dimension S1 at all four corners.  
8. N is the maximum number of terminal positions.  
9. Dimensioning and tolerancing per ANSI Y14.5M - 1982.  
10. Controlling Dimension: Inch.  
4. Corner leads (1, N, N/2, and N/2+1) may be configured with a partial  
lead paddle. For this configuration dimension b3 replaces dimension  
b1.  
All Intersil semiconductor products are manufactured, assembled and tested under ISO9000 quality systems certification.  
Intersil products are sold by description only. Intersil Corporation reserves the right to make changes in circuit design and/or specifications at any time without  
notice. Accordingly, the reader is cautioned to verify that data sheets are current before placing orders. Information furnished by Intersil is believed to be accurate  
and reliable. However, no responsibility is assumed by Intersil or its subsidiaries for its use; nor for any infringements of patents or other rights of third parties which  
may result from its use. No license is granted by implication or otherwise under any patent or patent rights of Intersil or its subsidiaries.  
For information regarding Intersil Corporation and its products, see web site http://www.intersil.com  
Spec Number 512031  
6-8  

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INTERSIL

HI-6010

ARINC 429 TRANSMITTER/RECEIVER FOR 8 BIT BUS
HOLTIC

HI-6010C

ARINC 429 TRANSMITTER/RECEIVER FOR 8 BIT BUS
HOLTIC

HI-6010CM-01

ARINC 429 TRANSMITTER/RECEIVER FOR 8 BIT BUS
HOLTIC

HI-6010CT

ARINC 429 TRANSMITTER/RECEIVER FOR 8 BIT BUS
HOLTIC

HI-6010J

ARINC 429 TRANSMITTER/RECEIVER FOR 8 BIT BUS
HOLTIC

HI-6010JF

ARINC 429 TRANSMITTER/RECEIVER FOR 8 BIT BUS
HOLTIC

HI-6010JT

ARINC 429 TRANSMITTER/RECEIVER FOR 8 BIT BUS
HOLTIC