854S14AKILFT [IDT]
Low Skew Clock Driver, 854S Series, 4 True Output(s), 0 Inverted Output(s), 4 X 4 MM, 0.95 MM HEIGHT, ROHS COMPLIANT, MO-220, VQFN-24;型号: | 854S14AKILFT |
厂家: | INTEGRATED DEVICE TECHNOLOGY |
描述: | Low Skew Clock Driver, 854S Series, 4 True Output(s), 0 Inverted Output(s), 4 X 4 MM, 0.95 MM HEIGHT, ROHS COMPLIANT, MO-220, VQFN-24 驱动 逻辑集成电路 |
文件: | 总14页 (文件大小:288K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
PRELIMINARY
LOW SKEW, 1-TO-4 DIFFERENTIAL-TO-
LVDS FANOUT BUFFER
ICS854S14I
GENERAL DESCRIPTION
FEATURES
The ICS854S14I is a high speed 1-to-4 Differential-
• Four differential LVDS outputs
ICS
HiPerClockS™
to-LVDS Fanout Buffer and is a member of the
HiPerClockS™ family of high performance clock
• IN, nIN pair can accept the following differential input levels:
LVPECL, LVDS, SSTL
solutions from IDT. The ICS854S14I is optimized
for high speed and very low output skew, making
• 50Ω internal input termination to VT
• Output frequency: 1.5GHz
it suitable for use in demanding applications such as SONET,
1 Gigabit and 10 Gigabit Ethernet, and Fibre Channel. The
internally terminated differential input and VREF_AC pin allow
other differential signal families such as LVPECL, LVDS, and
SSTL to be easily interfaced to the input with minimal use of
external components. The device also has output enable pins
which may be useful for system test and debug purposes.
• Output skew: 30ps (typical)
• Part-to-part skew: TBD
• Additive phase jitter, RMS: 0.135ps (typical)
• Propagation delay: 1.1ns (typical)
• 2.5V operating supply
APPLICATIONS:
• -40°C to 85°C ambient operating temperature
• Processor clock distribution
• Available in both standard (RoHS 5) and lead-free (RoHS 6)
packages
• 622MHz central office clock distribution
• High speed network routing
• Wireless basestations
• Serdes LVPECL output to FPGA LVDS input translator
• Fibre channel clock distribution
• AMC clock driver for ATCA systems
• Gigabit ethernet clock distibution
BLOCK DIAGRAM
PIN ASSIGNMENT
OE0
24 23 22 21 20 19
Q0
nQ0
1
2
3
18
17
16
GND
Q0
VDD
Q3
OE1
nQ0
nQ3
IN
nQ1
Q1
4
15 nQ2
14 Q2
Q1
50Ω
5
6
VT
nQ1
50Ω
13
VDD
GND
nIN
OE2
7
8
9 10 11 12
Q2
VREF_AC
nQ2
ICS854S14I
OE3
24-Lead VFQFN
Q3
4mm x 4mm x 0.95 package body
K Package
nQ3
Top View
The Preliminary Information presented herein represents a product in pre-production.The noted characteristics are based on initial product characterization
and/or qualification.Integrated DeviceTechnology, Incorporated (IDT) reserves the right to change any circuitry or specifications without notice.
IDT™ / ICS™ LVDS FANOUT BUFFER
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ICS854S14I
LOW SKEW, 1-TO-4 DIFFERENTIAL-TO-LVDS FANOUT BUFFER
PRELIMINARY
TABLE 1. PIN DESCRIPTIONS
Number
Name
GND
Type
Power
Description
1, 12, 13, 24
Power supply ground.
2, 3
Q0, nQ0
nQ1, Q1
VDD
Output
Output
Power
Input
Differential output pair. LVDS interface levels.
Differential output pair. LVDS interface levels.
Positive supply pins.
4, 5
6, 7, 18, 19
8
9
nIN
Inverting differential clock input. 50Ω internal input termination to VT.
Termination input.
VT
Input
10
IN
Input
Non-inverting differential clock input. 50Ω internal input termination to VT.
Reference voltage for AC-coupled applications.
Differential output pair. LVDS interface levels.
Differential output pair. LVDS interface levels.
11
VREF_AC
Q2, nQ2
nQ3, Q3
Output
Output
Output
14, 15
16, 17
Active high output enable. When logic HIGH, the output pair is enabled.
When logic LOW, the output pair is in a high impedance state. The OEx
pins have an internal pullup resistor so the default power-up state of the
outputs are enabled. LVCMOS/LVTTL interface levels.
20, 21,
22, 23
OE3, OE2,
OE1, OE0
Input
Pullup
NOTE: Pullup refers to internal input resistors. See Table 2, Pin Characteristics, for typical values.
TABLE 2. PIN CHARACTERISTICS
Symbol Parameter
Test Conditions
Minimum
Typical
Maximum
Units
RPULLUP
Input Pullup Resistor
51
kΩ
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LOW SKEW, 1-TO-4 DIFFERENTIAL-TO-LVDS FANOUT BUFFER
PRELIMINARY
TABLE 3. OEX TRUTH TABLE
Inputs
Outputs
IN
0
nIN
1
OE0
Q0
0
nQ0
1
1
1
0
1
0
1
0
X
IN
0
X
HI-Z
Q1
0
HI-Z
nQ1
1
nIN
1
OE1
1
1
0
1
1
0
X
IN
0
X
0
HI-Z
Q2
0
HI-Z
nQ2
1
nIN
1
OE2
1
1
0
1
1
0
X
IN
0
X
0
HI-Z
Q3
0
HI-Z
nQ3
1
nIN
1
OE3
1
1
0
1
1
0
X
X
0
HI-Z
HI-Z
IN
nIN
Enabled
Disabled
OE[0:3]
Q[0:3]
High Impedance State
nQ[0:3]
FIGURE 1. OE TIMING DIAGRAM
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LOW SKEW, 1-TO-4 DIFFERENTIAL-TO-LVDS FANOUT BUFFER
PRELIMINARY
ABSOLUTE MAXIMUM RATINGS
NOTE: Stresses beyond those listed under Absolute
Maximum Ratings may cause permanent damage to the
device.These ratings are stress specifications only. Functional op-
eration of product at these conditions or any conditions beyond
those listed in the DC Characteristics or AC Characteristics is not
implied. Exposure to absolute maximum rating conditions for ex-
tended periods may affect product reliability.
Supply Voltage, V
4.6V
DD
Inputs, V
-0.5V to VDD + 0.5 V
I
Outputs, IO (LVDS)
Continuous Current
Surge Current
10mA
15mA
Input Current, IN, nIN
50mA
VT Current, IVT
100mA
Input Sink/Source, IREF_AC
Operating Temperature Range, TA
Storage Temperature, TSTG
0.5mA
-40°C to +85°C
-65°C to 150°C
50.2°C (0 mps)
Package Thermal Impedance, θJA
(Junction-to-Ambient)
TABLE 4A. POWER SUPPLY DC CHARACTERISTICS, VDD = 2.5V 5ꢀ% TA = -40°C TO 85°C
Symbol Parameter
Test Conditions
Minimum
Typical
2.5
Maximum Units
VDD
IDD
Positive Supply Voltage
Power Supply Current
2.375
2.625
V
88
mA
TABLE 4B. LVCMOS/LVTTL DC CHARACTERISTICS, VDD = 2.5V 5ꢀ% TA = -40°C TO 85°C
Symbol Parameter
Test Conditions
Minimum Typical
Maximum Units
VIH
VIL
IIH
Input High Voltage
1.7
0
VDD + 0.3
V
V
Input Low Voltage
0.7
5
Input High Current OE[0:3]
VDD = VIN = 2.625V
µA
µA
IIL
Input Low Current
OE[0:3]
VDD = 2.625V, VIN = 0V
-150
TABLE 4C. DIFFERENTIAL DC CHARACTERISTICS, VDD = 2.5V 5ꢀ% TA = -40°C TO 85°C
Symbol Parameter
Test Conditions
IN-to-VT
Minimum
Typical
50
Maximum Units
RIN
Differential Input Resistance (IN, nIN)
40
1.2
0
60
VDD
Ω
V
VIH
Input High Voltage
Input Low Voltage
Input Voltage Swing
Reference Voltage
(IN, nIN)
(IN, nIN)
VIL
VIH - 0.15
2.8
V
VIN
0.15
V
VREF_AC
VDIFF_IN
IIN
VDD - 1.42 VDD - 1.37 VDD - 1.32
V
Differential Input Voltage Swing
Input Current% NOTE 1 (IN, nIN)
0.3
3.4
35
V
mA
NOTE 1: Guaranteed by design.
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TABLE 4D. LVDS DC CHARACTERISTICS, VDD = 2.5V 5ꢀ% TA = -40°C TO 85°C
Symbol Parameter
Test Conditions
Minimum
Typical
350
50
Maximum Units
VOD
Differential Output Voltage
mV
mV
V
Δ VOD
VOS
VOD Magnitude Change
Offset Voltage
1.2
Δ VOS
VOS Magnitude Change
50
mV
TABLE 5. AC CHARACTERISTICS, VDD = 2.5V 5ꢀ% TA = -40°C TO 85°C
Symbol Parameter
Condition
Minimum Typical Maximum Units
fMAX
Maximum Output Frequency
1.5
GHz
Propagation Delay% (Differential)%
NOTE 1
tPD
1.1
ns
tsk(o)
Output Skew% NOTE 2, 4
30
ps
ps
tsk(pp)
Part-to-Part Skew% NOTE 3, 4
TBD
Buffer Additive Phase Jitter, RMS%
refer to Additive Phase Jitter section
200MHz, Integration Range:
12kHz - 20MHz
tjit
0.135
170
ps
ps
tR/tF
Output Rise/Fall Time
20ꢀ to 80ꢀ
All parameters are measured at ≤ 1GHz unless otherwise noted.
NOTE 1: Measured from the differential input crossing point to the differential output crossing point.
NOTE 2: Defined as skew between outputs at the same supply voltage and with equal load conditions.
Measured at the output differential cross points.
NOTE 3: Defined as skew between outputs on different devices operating at the same supply voltages
and with equal load conditions. Using the same type of inputs on each device, the outputs are measured
at the differential cross points.
NOTE 4: This parameter is defined in accordance with JEDEC Standard 65.
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PARAMETER MEASUREMENT INFORMATION
VDD
SCOPE
Qx
VDD
nIN
2.5V 5ꢀ
POWER SUPPLY
VIN
+
Float GND –
VIH
LVDS
Cross Points
VIL
IN
nQx
GND
OUTPUT LOAD AC TEST CIRCUIT
DIFFERENTIAL INPUT LEVEL
nQx
PART 1
Qx
nQx
Qx
nQy
nQy
PART 2
Qy
Qy
tsk(pp)
tsk(o)
PART-TO-PART SKEW
OUTPUT SKEW
nIN
IN
80ꢀ
tF
80ꢀ
VOD
Clock
20ꢀ
20ꢀ
nQ0:nQ3
Outputs
tR
Q0:Q3
tPD
OUTPUT RISE/FALL TIME
PROPAGATION DELAY
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LOW SKEW, 1-TO-4 DIFFERENTIAL-TO-LVDS FANOUT BUFFER
PRELIMINARY
VDD
out
out
➤
VIN, VOUT
VDIFF_IN, VDIFF_OUT
DC Input
LVDS
400mV
(typical)
800mV
(typical)
VOS/Δ VOS
➤
SINGLE ENDED & DIFFERENTIAL INPUT VOLTAGE SWING
OFFSET VOLTAGE SETUP
VDD
➤
out
LVDS
DC Input
100
V
OD/Δ VOD
➤
out
DIFFERENTIAL OUTPUT VOLTAGE SETUP
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LOW SKEW, 1-TO-4 DIFFERENTIAL-TO-LVDS FANOUT BUFFER
PRELIMINARY
APPLICATION INFORMATION
LVPECL INPUT WITH BUILT-IN 50ΩTERMINATIONS INTERFACE
The IN /nIN with built-in 50Ω terminations accepts LVDS,
common driver types. The input interfaces suggested here are
examples only. If the driver is from another vendor, use their
termination recommendation. Please consult with the vendor
of the driver component to confirm the driver termination
requirements.
LVPECL, LVHSTL, CML, SSTL and other differential signals.
The signal must meet the V and V
input requirements.
PP
CMR
Figures 2A to 2F show interface examples for the HiPerClockS
IN/nIN input with built-in 50Ω terminations driven by the most
2.5V
2.5V
3.3V or 2.5V
2.5V
Zo = 50 Ohm
Zo = 50 Ohm
Zo = 50 Ohm
Zo = 50 Ohm
IN
IN
VT
nIN
VT
nIN
Receiver
With
Receiver
With
Built-In
50 Ohm
2.5V LVPECL
LVDS
R1
18
Built-In
50 Ohm
FIGURE 2A. HIPERCLOCKS IN/nIN INPUT WITH BUILT-IN 50Ω
FIGURE 2B. HIPERCLOCKS IN/nIN INPUT WITH BUILT-IN 50Ω
DRIVEN BY AN LVDS DRIVER
DRIVEN BY AN LVPECL DRIVER
2.5V
2.5V
2.5V
2.5V
Zo = 50 Ohm
Zo = 50 Ohm
Zo = 50 Ohm
Zo = 50 Ohm
IN
IN
VT
nIN
VT
nIN
Receiver
With
Receiver
With
CML - Built-in 50 Ohm Pull-up
CML - Open Collector
Built-In
50 Ohm
Built-In
50 Ohm
FIGURE 2D. HIPERCLOCKS IN/nIN INPUT WITH BUILT-IN 50Ω
DRIVEN BY A CML DRIVER WITH
FIGURE 2C. HIPERCLOCKS IN/nIN INPUT WITH BUILT-IN 50Ω
DRIVEN BY AN OPEN COLLECTOR CML DRIVER
BUILT-IN 50Ω PULLUP
2.5V
2.5V
3.3V
3.3V
Zo = 50 Ohm
Zo = 50 Ohm
C1
C2
3.3V LVPECL
3.3V CML with
Built-In Pullup
Zo = 50 Ohm
Zo = 50 Ohm
C1
C2
IN
IN
50 Ohm
50 Ohm
50 Ohm
50 Ohm
VT
VT
nIN
nIN
REF_AC
Receiver with Built-In 50Ω
REF_AC
Receiver with Built-In 50Ω
R5
100 - 200 Ohm
R5
100 - 200 Ohm
FIGURE 2E. HIPERCLOCKS IN/nIN INPUT WITH BUILT-IN 50Ω
FIGURE 2F. HIPERCLOCKS IN/nIN INPUT WITH BUILT-IN 50Ω
DRIVEN BY A 3.3V CML DRIVER WITH
BUILT-IN PULLUP
DRIVEN BY A 3.3V LVPECL DRIVER
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LOW SKEW, 1-TO-4 DIFFERENTIAL-TO-LVDS FANOUT BUFFER
PRELIMINARY
RECOMMENDATIONS FOR UNUSED INPUT AND OUTPUT PINS
INPUTS:
LVCMOS CONTROL PINS:
OUTPUTS:
LVDS Output
All control pins have internal pull-ups; additional resistance is
not required but can be added for additional protection. A 1kΩ
resistor can be used.
All unused LVDS outputs can be left floating. We recommend
that there is no trace attached. Both sides of the differential output
pair should either be left floating or terminated.
2.5V LVDS DRIVER TERMINATION
Figure 3 shows a typical termination for LVDS driver in
characteristic impedance of 100Ω differential (50Ω single)
transmission line environment. For buffer with multiple LVDS
driver, it is recommended to terminate the unused outputs.
2.5V
2.5V
LVDS_Driv er
+
R1
100
-
100Ω DifferentialTransmission Line
FIGURE 3. TYPICAL LVDS DRIVER TERMINATION
THERMAL RELEASE PATH
The expose metal pad provides heat transfer from the device to
the P.C. board. The expose metal pad is ground pad connected
to ground plane through thermal via. The exposed pad on the
device to the exposed metal pad on the PCB is contacted through
solder as shown in Figure 4. For further information, please refer
to the Application Note on Surface Mount Assembly of Amkor’s
Thermally /Electrically Enhance Leadframe Base Package, Amkor
Technology.
EXPOSED PAD
SOLDER
SOLDER MASK
SIGNAL
TRACE
SIGNAL
TRACE
GROUND PLANE
Expose Metal Pad
(GROUND PAD)
THERMAL VIA
FIGURE 4. P.C. BOARD FOR EXPOSED PAD THERMAL RELEASE PATH EXAMPLE
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LOW SKEW, 1-TO-4 DIFFERENTIAL-TO-LVDS FANOUT BUFFER
PRELIMINARY
POWER CONSIDERATIONS
This section provides information on power dissipation and junction temperature for the ICS854S14I.
Equations and example calculations are also provided.
1. Power Dissipation.
The total power dissipation for the ICS854S14I is the sum of the core power plus the power dissipated in the load(s).
The following is the power dissipation for V = 2.5V + 5ꢀ = 2.625V, which gives worst case results.
DD
•
Power_ = V
* I
= 2.625V * 88mA = 231mW
DD_MAX
MAX
DD_MAX
2. Junction Temperature.
Junction temperature, Tj, is the temperature at the junction of the bond wire and bond pad and directly affects the reliability of the
TM
device. The maximum recommended junction temperature for HiPerClockS devices is 125°C.
The equation for Tj is as follows: Tj = θJA * Pd_total + TA
Tj = Junction Temperature
θJA = Junction-to-Ambient Thermal Resistance
Pd_total = Total Device Power Dissipation (example calculation is in section 1 above)
TA = Ambient Temperature
In order to calculate junction temperature, the appropriate junction-to-ambient thermal resistance θJA must be used. Assuming a
moderate air flow of 1 meter per second and a multi-layer board, the appropriate value is 43.9°C/W per Table 6 below.
Therefore, Tj for an ambient temperature of 85°C with all outputs switching is:
85°C + 0.231W * 43.9°C/W = 95.1°C. This is well below the limit of 125°C.
This calculation is only an example. Tj will obviously vary depending on the number of loaded outputs, supply voltage, air flow, and
the type of board (single layer or multi-layer).
TABLE 6. THERMAL RESISTANCE θ FOR 24-PIN VFQFN, FORCED CONVECTION
JA
θ by Velocity (Meters per Second)
JA
0
1
2.5
39.3°C/W
Multi-Layer PCB, JEDEC Standard Test Boards
50.2°C/W
43.9°C/W
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RELIABILITY INFORMATION
TABLE 7. θ VS. AIR FLOW TABLE FOR 24 LEAD VFQFN
JA
θ vs. 0 Air Flow (Meters per Second)
JA
0
1
2.5
39.3°C/W
Multi-Layer PCB, JEDEC Standard Test Boards
50.2°C/W
43.9°C/W
TRANSISTOR COUNT
The transistor count for ICS854S14I is: 288
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PRELIMINARY
PACKAGE OUTLINE - K SUFFIX FOR 24 LEAD VFQFN
TABLE 8. PACKAGE DIMENSIONS FOR 24 LEAD VFQFN
JEDEC VARIATION
ALL DIMENSIONS IN MILLIMETERS
SYMBOL
MINIMUM
MAXIMUM
N
A
24
0.80
0
1.0
A1
A3
b
0.05
0.25 Reference
0.18
0.30
e
0.50 BASIC
ND
NE
D
6
6
4
D2
E
2.30
2.55
4
E2
L
2.30
0.30
2.55
0.50
Reference Document: JEDEC Publication 95, MO-220
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TABLE 9. ORDERING INFORMATION
Part/Order Number
854S14AKI
Marking
TBD
Package
Shipping Packaging
tube
Temperature
24 Lead VFQFN,
-40°C to 85°C
-40°C to 85°C
-40°C to 85°C
-40°C to 85°C
854S14AKT
TBD
24 Lead VFQFN
2500 tape & reel
tube
854S14AKILF
854S14AKILFT
S14AIL
S14AIL
24 Lead "Lead-Free" VFQFN
24 Lead "Lead-Free" VFQFN
2500 tape & reel
NOTE: Parts that are ordered with an "LF" suffix to the part number are the Pb-Free configuration and are RoHS compliant.
While the information presented herein has been checked for both accuracy and reliability, Integrated Device Technology, Incorporated (IDT) assumes no responsibility for either its use or for
infringement of any patents or other rights of third parties, which would result from its use. No other circuits, patents, or licenses are implied. This product is intended for use in normal commercial and
industrial applications. Any other applications such as those requiring high reliability or other extraordinary environmental requirements are not recommended without additional processing by IDT. IDT
reserves the right to change any circuitry or specifications without notice. IDT does not authorize or warrant any IDT product for use in life support devices or critical medical instruments.
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LOW SKEW, 1-TO-4 DIFFERENTIAL-TO-LVDS FANOUT BUFFER
PRELIMINARY
Innovate with IDT and accelerate your future networks. Contact:
www.IDT.com
For Sales
800-345-7015
408-284-8200
Fax: 408-284-2775
For Tech Support
netcom@idt.com
480-763-2056
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Integrated Device Technology, Inc.
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Integrated Device Technology
Singapore (1997) Pte. Ltd.
Reg. No. 199707558G
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Europe
IDT Europe, Limited
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800 345 7015
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+44 (0) 1372 363 339
Fax: +44 (0) 1372 378851
+65 6 887 5505
© 2006 Integrated Device Technology, Inc. All rights reserved. Product specifications subject to change without notice. IDT, the IDT logo, ICS and HiPerClockS are trademarks
of Integrated Device Technology, Inc. Accelerated Thinking is a service mark of Integrated Device Technology, Inc. All other brands, product names and marks are or may be
trademarks or registered trademarks used to identify products or services of their respective owners.
Printed in USA
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