MRF6VP3450HR6 [FREESCALE]
RF Power Field Effect Transistors N-Channel Enhancement-Mode Lateral MOSFETs; 射频功率场效应晶体管N沟道增强模式横向的MOSFET型号: | MRF6VP3450HR6 |
厂家: | Freescale |
描述: | RF Power Field Effect Transistors N-Channel Enhancement-Mode Lateral MOSFETs |
文件: | 总18页 (文件大小:636K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
Document Number: MRF6VP3450H
Rev. 2, 9/2008
Freescale Semiconductor
Technical Data
RF Power Field Effect Transistors
MRF6VP3450HR6
MRF6VP3450HR5
MRF6VP3450HSR6
MRF6VP3450HSR5
N-Channel Enhancement-Mode Lateral MOSFETs
Designed for broadband commercial and industrial applications with
frequencies from 470 to 860 MHz. The high gain and broadband performance
of these devices make them ideal for large-signal, common-source amplifier
applications in 50 volt analog or digital television transmitter equipment.
• Typical DVB-T OFDM Performance: VDD = 50 Volts, IDQ = 1400 mA,
P
out = 90 Watts Avg., f = 860 MHz, 8K Mode, 64 QAM
860 MHz, 450 W, 50 V
LATERAL N-CHANNEL
BROADBAND
Power Gain — 22.5 dB
Drain Efficiency — 28%
ACPR @ 4 MHz Offset — -62 dBc @ 4 kHz Bandwidth
RF POWER MOSFETs
• Typical Broadband Two-Tone Performance: VDD = 50 Volts, IDQ = 1400 mA,
P
out = 450 Watts PEP, f = 470-860 MHz
Power Gain — 22 dB
Drain Efficiency — 44%
IM3 — -29 dBc
• Capable of Handling 10:1 VSWR, All Phase Angles, @ 50 Vdc, 860 MHz,
90 Watts Avg. (DVB-T OFDM Signal, 10 dB PAR, 7.61 MHz Channel
Bandwidth)
Features
CASE 375D-05, STYLE 1
NI-1230
MRF6VP3450HR6(HR5)
• Characterized with Series Equivalent Large-Signal Impedance Parameters
• Internally Input Matched for Ease of Use
• Qualified Up to a Maximum of 50 VDD Operation
• Integrated ESD Protection
• Excellent Thermal Stability
• Designed for Push-Pull Operation
• Greater Negative Gate-Source Voltage Range for Improved Class C
Operation
• RoHS Compliant
CASE 375E-04, STYLE 1
NI-1230S
MRF6VP3450HSR6(HSR5)
• In Tape and Reel. R6 Suffix = 150 Units per 56 mm, 13 inch Reel.
R5 Suffix = 50 Units per 56 mm, 13 inch Reel.
PARTS ARE PUSH-PULL
RF /V
RF /V
outA DSA
3
4
1
2
inA GSA
RF /V
inB GSB
RF /V
outB DSB
(Top View)
Figure 1. Pin Connections
Table 1. Maximum Ratings
Rating
Symbol
Value
-0.5, +110
-6.0, +10
- 65 to +150
150
Unit
Drain-Source Voltage
V
Vdc
Vdc
°C
DSS
Gate-Source Voltage
V
GS
Storage Temperature Range
Case Operating Temperature
Operating Junction Temperature
T
stg
T
°C
C
T
200
°C
J
© Freescale Semiconductor, Inc., 2008. All rights reserved.
Table 2. Thermal Characteristics
(1,2)
Characteristic
Symbol
Value
Unit
Thermal Resistance, Junction to Case
Case Temperature 80°C, 90 W CW
Case Temperature 62°C, 450 W Pulsed, 50 μsec Pulse Width, 2.5% Duty Cycle
R
θ
JC
0.27
0.04
°C/W
Table 3. ESD Protection Characteristics
Test Methodology
Class
Human Body Model (per JESD22-A114)
Machine Model (per EIA/JESD22-A115)
Charge Device Model (per JESD22-C101)
1B (Minimum)
B (Minimum)
IV (Minimum)
Table 4. Electrical Characteristics (T = 25°C unless otherwise noted)
C
Characteristic
Symbol
Min
Typ
Max
Unit
(3)
Off Characteristics
Gate-Source Leakage Current
(V = 5 Vdc, V = 0 Vdc)
I
—
110
—
—
—
—
—
10
—
10
10
μAdc
Vdc
GSS
GS
DS
Drain-Source Breakdown Voltage
(I = 50 mA, V = 0 Vdc)
V
(BR)DSS
D
GS
Zero Gate Voltage Drain Leakage Current
(V = 50 Vdc, V = 0 Vdc)
I
I
μAdc
μAdc
DSS
DSS
DS
GS
Zero Gate Voltage Drain Leakage Current
—
(V = 100 Vdc, V = 0 Vdc)
DS
GS
On Characteristics
(3)
Gate Threshold Voltage
(V = 10 Vdc, I = 320 μAdc)
V
1
2
1.6
2.6
2.5
3.5
—
Vdc
Vdc
Vdc
GS(th)
GS(Q)
DS(on)
DS
D
(4)
Gate Quiescent Voltage
(V = 50 Vdc, I = 1400 mAdc, Measured in Functional Test)
V
DD
D
(3)
Drain-Source On-Voltage
(V = 10 Vdc, I = 1.58 Adc)
V
—
0.25
GS
D
(3,5)
Dynamic Characteristics
Reverse Transfer Capacitance
(V = 50 Vdc 30 mV(rms)ac @ 1 MHz, V = 0 Vdc)
DS
C
—
—
—
0.92
54.5
373
—
—
—
pF
pF
pF
rss
GS
Output Capacitance
(V = 50 Vdc 30 mV(rms)ac @ 1 MHz, V = 0 Vdc)
DS
C
oss
GS
Input Capacitance
C
iss
(V = 50 Vdc, V = 0 Vdc 30 mV(rms)ac @ 1 MHz)
DS
GS
(4)
Functional Tests (In Freescale Broadband Test Fixture, 50 ohm system) V = 50 Vdc, I
= 1400 mA, P = 90 W Avg., f = 860 MHz,
out
DD
DQ
DVB-T OFDM Single Channel. ACPR measured in 7.61 MHz Channel Bandwidth @ 4 MHz Offset @ 4 kHz Bandwidth.
Power Gain
G
21.5
26
22.5
28
24.5
—
dB
%
ps
Drain Efficiency
η
D
Adjacent Channel Power Ratio
Input Return Loss
ACPR
IRL
—
-62
-4
-59
-2
dBc
dB
—
1. MTTF calculator available at http://www.freescale.com/rf. Select Software & Tools/Development Tools/Calculators to access
MTTF calculators by product.
2. Refer to AN1955, Thermal Measurement Methodology of RF Power Amplifiers. Go to http://www.freescale.com/rf.
Select Documentation/Application Notes - AN1955.
3. Each side of device measured separately.
4. Measurement made with device in push-pull configuration.
5. Part internally input matched.
(continued)
MRF6VP3450HR6 MRF6VP3450HR5 MRF6VP3450HSR6 MRF6VP3450HSR5
RF Device Data
Freescale Semiconductor
2
Table 4. Electrical Characteristics (T = 25°C unless otherwise noted) (continued)
C
Characteristic
Symbol
Min
Typ
Max
Unit
Typical Pulsed Performances (In Freescale Broadband Test Fixture, 50 ohm system) V = 50 Vdc, I = 1200 mA, P = 520 W,
DD
DQ
out
f = 470-860 MHz, 50 μsec Pulse Width, 2.5% Duty Cycle
Power Gain
G
—
—
—
—
20.5
50
—
—
—
—
dB
%
ps
Drain Efficiency
η
D
Input Return Loss
IRL
-3
dB
W
P
@ 1 dB Compression Point, Pulsed CW
P1dB
520
out
(f = 470-860 MHz)
Typical Two-Tone Performances (In Freescale Broadband Test Fixture, 50 ohm system) V = 50 Vdc, I
= 1400 mA, P = 450 W PEP,
out
DD
DQ
f = 470-860 MHz, 100 kHz Tone Spacing
Power Gain
G
—
—
—
—
22
44
—
—
—
—
dB
%
ps
Drain Efficiency
η
D
Intermodulation Distortion
Input Return Loss
IM3
IRL
-29
-2
dBc
dB
MRF6VP3450HR6 MRF6VP3450HR5 MRF6VP3450HSR6 MRF6VP3450HSR5
RF Device Data
Freescale Semiconductor
3
B1
R1
V
BIAS
+
Z19
R3
C24
C34 C44 C36 C38
Printed Balun Input
Z18
Z16
Z4
Z6
TOP
BOTTOM
Z2
Z8 Z10
Z12
Z14
RF
INPUT
Printed
Balun
Input
C1
C2
Z1
C3
Z13
C4
Z15
Z1
Z3
Z7
Z5
Z9 Z11
Z17
Z20
R4
B2
R2
Z21
V
BIAS
+
C25
C35 C45 C37 C39
Z25
V
SUPPLY
+
C26
C22
C40 C28
Z24
Z40
Z42
C13
Printed Balun Output
Z22
Z28
Z30
Z32 Z34
Z36
Z38
TOP
BOTTOM
C8
C7
RF
OUTPUT
Printed
Balun
Output
Z44
DUT
C5
C6
C11 C12
Z37
Z44
Z23
Z29
Z26
Z31
Z33 Z35
C14
Z39
Z43
Z41
C9
C10
Z27
C23
V
SUPPLY
+
C27
C41 C29
Z1
0.343″ x 0.065″ Microstrip
0.039″ x 0.200″ Microstrip
1.400″ x 0.590″ Microstrip
0.059″ x 0.118″ Microstrip
0.059″ x 0.118″ Microstrip
0.150″ x 0.394″ Microstrip
0.359″ x 0.394″ Microstrip
0.308″ x 0.394″ Microstrip
Z16, Z17
Z18, Z20
Z19, Z21
Z22, Z23
Z24, Z26
Z25, Z27
Z28, Z29
Z30, Z31
0.172″ x 0.465″ Microstrip
0.397″ x 0.059″ Microstrip
0.800″ x 0.059″ Microstrip
0.276″ x 0.465″ Microstrip
0.070″ x 0.157″ Microstrip
1.000″ x 0.157″ Microstrip
0.103″ x 0.392″ Microstrip
0.084″ x 0.392″ Microstrip
Z32, Z33
Z34, Z35
Z36, Z37
Z38, Z39
Z40, Z41
Z42, Z43
Z44
0.108″ x 0.392″ Microstrip
0.212″ x 0.388″ Microstrip
0.103″ x 0.388″ Microstrip
0.075″ x 0.157″ Microstrip
1.412″ x 0.071″ Microstrip
0.024″ x 0.087″ Microstrip
0.550″ x 0.065″ Microstrip
Z2, Z3
Z4, Z5
Z6, Z7
Z8, Z9
Z10, Z11
Z12, Z13
Z14, Z15
PCB
Taconic RF35, 0.031”, ε = 3.5
r
Figure 2. MRF6VP3450HR6(HSR6) Test Circuit Schematic
MRF6VP3450HR6 MRF6VP3450HR5 MRF6VP3450HSR6 MRF6VP3450HSR5
RF Device Data
Freescale Semiconductor
4
Table 5. MRF6VP3450HR6(HSR6) Test Circuit Component Designations and Values
Part
Description
Part Number
Manufacturer
Fair-Rite
B1, B2
C1, C2
C3
Short Ferrite Beads
2743019447
12 pF Chip Capacitors
ATC100B120GT500XT
ATC100B6R8BT500XT
ATC100B100GT500XT
ATC800B6R8BT500XT
ATC800B100J500XT
ATC800B4R7J500XT
ATC800B3R9J500XT
ATC100B331GT500XT
UUD1V220MCL1GS
EEVFK2A221M
ATC
6.8 pF Chip Capacitor
ATC
C4
10 pF Chip Capacitor
ATC
C5, C6, C8, C9
C7, C10, C13, C14
C11
6.8 pF Chip Capacitors
ATC
10 pF Chip Capacitors
ATC
4.7 pF Chip Capacitor
ATC
C12
3.9 pF Chip Capacitor
ATC
C22, C23
C24, C25
C26, C27
C28, C29
C34, C35
C36, C37
C38, C39
C40, C41
C44, C45
R1, R2
330 pF Chip Capacitors
22 μF Electrolytic Capacitors
220 μF, 100 V Electrolytic Capacitors
10 μF, 50 V Chip Capacitors
39 nF Chip Capacitors
ATC
Nichicon
Panasonic
TDK
C5750X5R1H106MT
ATC200B393KT50XT
ATC100B102JT500XT
ATC100B471JT500XT
HMK432BJ225KM-T
C3225X7R1H225MT
CRCW120610R0FKEA
CRCW12061R50FKEA
ATC
1000 pF Chip Capacitors
470 pF Chip Capacitors
2.2 μF, 100 V Chip Capacitors
2.2 μF, 50 V Chip Capacitors
10 Ω, 1/8 W Chip Resistors
1.5 Ω, 1/8 W Chip Resistors
ATC
ATC
Taiyo Yuden
TDK
Vishay
Vishay
R3, R4
MRF6VP3450HR6 MRF6VP3450HR5 MRF6VP3450HSR6 MRF6VP3450HSR5
RF Device Data
Freescale Semiconductor
5
MRF6VP3450H
C28
B1
R1
C24
C36
C34
C26
C40
R3
C38
C44
C22
C13
C6
C1
C2
C7
C8
C3
C4
C5
C9
C10
C11
C12
C14
C23
C45
R4
C41
C27
C29
C35
B2
C25
C37 C39
Rev. 4
R2
Figure 3. MRF6VP3450HR6(HSR6) Test Circuit Component Layout — Top
Figure 3a. MRF6VP3450HR6(HSR6) Test Circuit Component Layout — Bottom
MRF6VP3450HR6 MRF6VP3450HR5 MRF6VP3450HSR6 MRF6VP3450HSR5
RF Device Data
Freescale Semiconductor
6
TYPICAL CHARACTERISTICS
1000
100
10
100
C
iss
C
oss
T = 150_C
J
T = 175_C
J
10
Measured with 30 mV(rms)ac @ 1 MHz
= 0 Vdc
C
rss
T = 200_C
V
J
GS
T
= 25_C
C
1
1
0
10
20
30
40
50
1
10
V , DRAIN−SOURCE VOLTAGE (VOLTS)
DS
100
V
, DRAIN−SOURCE VOLTAGE (VOLTS)
DS
Note: Each side of device measured separately.
Figure 4. Capacitance versus Drain-Source Voltage
Note: Each side of device measured separately.
Figure 5. DC Safe Operating Area
24
23.5
23
67
66
65
64
63
62
61
60
59
58
57
56
55
54
53
52
60
55
50
45
40
V
= 50 Vdc, I = 1200 mA, f = 860 MHz
DQ
DD
Ideal
Pulse Width = 50 μsec, Duty Cycle = 2.5%
P3dB = 57.85 dBm (610 W)
22.5
22
P2dB = 57.65 dBm
(582 W)
21.5
21
35
30
25
20
15
10
5
G
ps
P1dB = 57.15 dBm
(519 W)
20.5
20
Actual
19.5
19
η
D
V
= 50 Vdc, I = 1200 mA, f = 860 MHz
DQ
DD
18.5
18
Pulse Width = 12 μsec, Duty Cycle = 1%
0
10
100
1000
30 31 32 33 34 35 36 37 38 39 40 41 42
P
, OUTPUT POWER (WATTS) PULSED
out
P , INPUT POWER (dBm)
in
Figure 6. Pulsed Power Gain and Drain Efficiency
versus Output Power
Figure 7. Pulsed CW Output Power versus
Input Power
24
23
22
21
20
19
18
25
24
23
22
21
20
19
70
60
50
40
30
20
10
0
25_C
V
= 50 Vdc, I = 1200 mA, f = 860 MHz
DQ
DD
Pulse Width = 50 μsec, Duty Cycle = 2.5%
−30_C
85_C
G
ps
T
= −30_C
C
50 V
45 V
V
= 40 V
η
D
DD
25_C
85_C
V
= 50 Vdc, I = 1200 mA, f = 860 MHz
DQ
DD
17
16
Pulse Width = 50 μsec, Duty Cycle = 2.5%
18
0
100
200
300
400
500
600
700
10
100
P , OUTPUT POWER (WATTS) PULSED
out
1000
P
, OUTPUT POWER (WATTS) PULSED
out
Figure 8. Pulsed Power Gain versus
Output Power
Figure 9. Pulsed Power Gain and Drain Efficiency
versus Output Power
MRF6VP3450HR6 MRF6VP3450HR5 MRF6VP3450HSR6 MRF6VP3450HSR5
RF Device Data
Freescale Semiconductor
7
TYPICAL CHARACTERISTICS — TWO-TONE
−20
−30
−40
−50
−60
−70
−80
−10
V
= 50 Vdc, P = 450 W (PEP), I = 1400 mA
out DQ
Two−Tone Measurements
DD
V
= 50 Vdc, I = 1400 mA, f1 = 854 MHz
DQ
f2 = 860 MHz, Two−Tone Measurements
DD
−20
3rd Order
−30
−40
−50
−60
−70
3rd Order
5th Order
5th Order
7th Order
7th Order
5
10
100
1000
0.1
1
10
60
P
, OUTPUT POWER (WATTS) PEP
out
TWO−TONE SPACING (MHz)
Figure 10. Intermodulation Distortion
Products versus Output Power
Figure 11. Intermodulation Distortion
Products versus Tone Spacing
23
22.8
22.6
22.4
22.2
−20
V
= 50 Vdc, f1 = 859.9 MHz, f2 = 860 MHz
Two−Tone Measurements, 100 kHz Tone Spacing
DD
−25
−30
−35
I
= 700 mA
DQ
I
= 1400 mA
DQ
975 mA
1075 mA
22
1075 mA
1250 mA
21.8
975 mA
−40
−45
−50
1250 mA
1400 mA
21.6
21.4
21.2
21
700 mA
V
= 50 Vdc, f1 = 859.9 MHz, f2 = 860 MHz
Two−Tone Measurements, 100 kHz Tone Spacing
DD
50
500
50
500
P
, OUTPUT POWER (WATTS) PEP
out
P
, OUTPUT POWER (WATTS) PEP
out
Figure 13. Third Order Intermodulation
Distortion versus Output Power
Figure 12. Two-Tone Power Gain versus
Output Power
MRF6VP3450HR6 MRF6VP3450HR5 MRF6VP3450HSR6 MRF6VP3450HSR5
RF Device Data
Freescale Semiconductor
8
TYPICAL CHARACTERISTICS — OFDM
100
10
−20
−30
−40
7.61 MHz
1
−50
4 kHz BW
4 kHz BW
−60
−70
−80
−90
0.1
0.01
ACPR Measured at 4 MHz Offset
from Center Frequency
8K Mode DVB−T OFDM
64 QAM Data Carrier Modulation
5 Symbols
8K Mode DVB−T OFDM
64 QAM Data Carrier Modulation, 5 Symbols
0.001
−100
−110
0.0001
0
2
4
6
8
10
12
−5
−4
−3
−2
−1
0
1
2
3
4
5
PEAK−TO−AVERAGE (dB)
f, FREQUENCY (MHz)
Figure 14. Single-Carrier DVB-T OFDM
Figure 15. 8K Mode DVB-T OFDM Spectrum
23
−50
V
= 50 Vdc, f = 860 MHz
DD
8K Mode OFDM, 64 QAM Data Carrier
Modulation, 5 Symbols
22.5
I
= 1400 mA
DQ
22
21.5
21
−60
975 mA
700 mA
I
= 700 mA
DQ
1250 mA
1075 mA
975 mA
V
= 50 Vdc, f = 860 MHz
DD
20.5
20
8K Mode OFDM, 64 QAM Data Carrier
Modulation, 5 Symbols
1400 mA
1250 mA
1075 mA
−70
20
100
200
20
100
P , OUTPUT POWER (WATTS) AVG.
out
200
P
, OUTPUT POWER (WATTS) AVG.
out
Figure 16. Single-Carrier DVB-T OFDM Power
Gain versus Output Power
Figure 17. Single-Carrier DVB-T OFDM ACPR
versus Output Power
65
−46
85_C
−48
V
= 50 Vdc, I = 1400 mA
DQ
DD
60
25_C
f = 860 MHz, 8K Mode OFDM
64 QAM Data Carrier Modulation
5 Symbols
−50
55
50
45
40
35
30
25
20
15
10
5
−30_C
−52
ACPR
−54
−56
−58
−60
−62
−64
−66
−68
−70
−72
η
D
T
= −30_C
85_C
C
G
ps
25_C
0
10
100
, OUTPUT POWER (WATTS) AVG.
300
P
out
Figure 18. Single-Carrier DVB-T OFDM ACPR Power
Gain and Drain Efficiency versus Output Power
MRF6VP3450HR6 MRF6VP3450HR5 MRF6VP3450HSR6 MRF6VP3450HSR5
RF Device Data
Freescale Semiconductor
9
TYPICAL CHARACTERISTICS — 470-860 MHz
23
60
G
ps
22.5
22
50
40
30
20
10
0
21.5
21
860 MHz
665 MHz
20.5
20
860 MHz
470 MHz
665 MHz
470 MHz
19.5
19
η
D
18.5
18
V
= 50 Vdc, I = 1200 mA
DQ
DD
17.5
17
Pulse Width = 50 μsec, Duty Cycle = 2.5%
10
100
1000
P
, OUTPUT POWER (WATTS) PULSED
out
Figure 19. Broadband Pulsed Power Gain and Drain
Efficiency versus Output Power — 470-860 MHz
27
26
25
24
23
22
21
20
19
18
70
60
50
40
V
= 50 Vdc, P = P1dB, I = 1200 mA
out DQ
DD
Pulse Width = 50 μsec, Duty Cycle = 2.5%
η
D
700
650
600
G
ps
550
500
450
30
20
P1dB
17
470 500 530 560 590 620 650 680 710 740 770 800 830 860
f, FREQUENCY (MHz)
Figure 20. Pulsed Power Gain and Drain Efficiency
versus Frequency at P1dB — 470-860 MHz
50
45
40
35
30
25
−50
−55
−60
−65
V
= 50 Vdc, I = 1400 mA, 8K Mode OFDM
DQ
64 QAM Data Carrier Modulation, 5 Symbols
DD
860 MHz
665 MHz
470 MHz
470 MHz
G
860 MHz
ps
20
15
10
5
665 MHz
ACPR
−70
−75
η
D
0
3
10
100
300
P
, OUTPUT POWER (WATTS) AVG.
out
Figure 21. Single-Carrier DVB-T OFDM ACPR, Power Gain
and Drain Efficiency versus Output Power — 470-860 MHz
MRF6VP3450HR6 MRF6VP3450HR5 MRF6VP3450HSR6 MRF6VP3450HSR5
RF Device Data
Freescale Semiconductor
10
TYPICAL CHARACTERISTICS — 470-860 MHz
24
23
22
21
36
34
G
ps
32
30
28
26
24
22
20
η
D
0
20
19
18
17
−2
−4
−6
−8
IRL
V
P
= 50 Vdc, I = 1400 mA
DQ
= 90 W Avg., 8K Mode OFDM
DD
out
64 QAM Data Carrier Modulation, 5 Symbols
16
470 500 530 560 590 620 650 680 710 740 770 800 830 860
f, FREQUENCY (MHz)
Figure 22. Single-Carrier DVB-T OFDM Power Gain, Drain Efficiency
and IRL versus Frequency — 470-860 MHz
TYPICAL CHARACTERISTICS
8
10
7
10
6
10
5
10
90
110
130
150
170
190
210
230
250
T , JUNCTION TEMPERATURE (°C)
J
This above graph displays calculated MTTF in hours when the device
is operated at V = 50 Vdc, P = 90 W Avg., and η = 28%.
DD
out
D
MTTF calculator available at http://www.freescale.com/rf. Select
Software & Tools/Development Tools/Calculators to access MTTF
calculators by product.
Figure 23. MTTF versus Junction Temperature
MRF6VP3450HR6 MRF6VP3450HR5 MRF6VP3450HSR6 MRF6VP3450HSR5
RF Device Data
Freescale Semiconductor
11
Z = 10 Ω
o
f = 860 MHz
Z
load
f = 470 MHz
f = 860 MHz
Z
source
f = 470 MHz
V
= 50 Vdc, I = 1400 mA, P = 90 W Avg.
DQ out
DD
f
Z
Z
load
W
source
W
MHz
470
650
860
2.81 - j1.88
6.46 + j1.21
3.90 + j2.09
5.52 + j2.34
7.46 + j2.26
2.60 + j3.73
Z
Z
=
=
Test circuit impedance as measured from
gate to gate, balanced configuration.
source
Test circuit impedance as measured from
drain to drain, balanced configuration.
load
Device
Under
Test
Output
Matching
Network
Input
Matching
Network
+
−
−
+
Z
Z
source
load
Figure 24. Series Equivalent Source and Load Impedance
MRF6VP3450HR6 MRF6VP3450HR5 MRF6VP3450HSR6 MRF6VP3450HSR5
RF Device Data
Freescale Semiconductor
12
PACKAGE DIMENSIONS
MRF6VP3450HR6 MRF6VP3450HR5 MRF6VP3450HSR6 MRF6VP3450HSR5
RF Device Data
Freescale Semiconductor
13
MRF6VP3450HR6 MRF6VP3450HR5 MRF6VP3450HSR6 MRF6VP3450HSR5
14
RF Device Data
Freescale Semiconductor
MRF6VP3450HR6 MRF6VP3450HR5 MRF6VP3450HSR6 MRF6VP3450HSR5
RF Device Data
Freescale Semiconductor
15
MRF6VP3450HR6 MRF6VP3450HR5 MRF6VP3450HSR6 MRF6VP3450HSR5
16
RF Device Data
Freescale Semiconductor
PRODUCT DOCUMENTATION
Refer to the following documents to aid your design process.
Application Notes
• AN1955: Thermal Measurement Methodology of RF Power Amplifiers
Engineering Bulletins
• EB212: Using Data Sheet Impedances for RF LDMOS Devices
REVISION HISTORY
The following table summarizes revisions to this document.
Revision
Date
Description
0
1
July 2008
Aug. 2008
•
•
Initial Release of Data Sheet
Corrected component designation part number for C34, 35 in Table 5. Test Circuit Component Designation
and Values, p. 5
•
•
Added Note to Fig. 4, Capacitance versus Drain-Source Voltage and Fig. 5, DC Safe Operating Area to
denote that each side of device is measured separately, p. 7
Adjusted imaginary component signs in Fig. 24, Series Equivalent Source and Load Impedance data table
and replotted data, p. 12
2
Sept. 2008
•
Fig. 24, Series Equivalent Source and Load Impedance, corrected Z
copy to read ”Test circuit
source
impedance as measured from gate to gate, balanced configuration” and Z
impedance as measured from gate to gate, balanced configuration”, p. 12
copy to read ”Test circuit
load
MRF6VP3450HR6 MRF6VP3450HR5 MRF6VP3450HSR6 MRF6VP3450HSR5
RF Device Data
Freescale Semiconductor
17
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Document Number: MRF6VP3450H
Rev. 2, 9/2008
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