FODM453R2 [FAIRCHILD]

5-Pin Mini Flat Package High Speed Transistor Optocoupler; 5引脚微型扁平封装高速晶体管光耦
FODM453R2
型号: FODM453R2
厂家: FAIRCHILD SEMICONDUCTOR    FAIRCHILD SEMICONDUCTOR
描述:

5-Pin Mini Flat Package High Speed Transistor Optocoupler
5引脚微型扁平封装高速晶体管光耦

晶体 光电 晶体管 输出元件 局域网
文件: 总14页 (文件大小:366K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
July 2010  
FODM452, FODM453  
5-Pin Mini Flat Package High Speed Transistor  
Optocoupler  
Features  
Description  
Compact 5-pin mini flat package  
High speed-1 MBit/s  
The FODM452 and FODM453 optocouplers consist of  
an AlGaAs LED optically coupled to a high speed photo-  
detector transistor. The devices are housed in a compact  
5-pin mini flat package for optimum mounting density.  
The FODM453 features a high CMR rating for optimum  
Superior CMR-15kV/µs at V  
= 1500V (FODM453)  
CM  
Performance guaranteed over temperature (0–70°C)  
U.L. recognized (File # E90700)  
common mode transient immunity.  
VDE0884 recognized (File # 136480)  
– Ordering option V, e.g., FODM452V  
Related Resources  
260°C reflow capability for Pb-free assembly  
www.fairchildsemi.com/products/opto/  
Applications  
Line receivers  
www.fairchildsemi.com/pf/FO/FODM611.html  
www.fairchildsemi.com/pf/FO/FODM8061.html  
www.fairchildsemi.com/pf/FO/FODM8071.html  
Pulse transformer replacement  
Output interface to CMOS-LSTTL-TTL  
Wide bandwidth analog coupling  
Functional Schematic  
Truth Table  
VCC  
ANODE  
1
6
5
LED  
Off  
Output  
High  
VO  
On  
Low  
CATHODE  
GND  
3
4
©2003 Fairchild Semiconductor Corporation  
FODM452, FODM453 Rev. 1.0.5  
www.fairchildsemi.com  
Pin Definitions  
Number  
Name  
ANODE  
CATHODE  
GND  
Function Description  
1
3
4
5
6
Anode  
Cathode  
Output Ground  
Output Voltage  
Output Supply Voltage  
V
O
V
CC  
Safety and Insulation Ratings for Mini-Flat Package (SO5 Pin)  
As per IEC60747-5-2 (Pending Certification). This optocoupler is suitable for “safe electrical insulation” only within the  
safety limit data. Compliance with the safety ratings shall be ensured by means of protective circuits.  
Symbol  
Parameter  
Installation Classifications per DIN VDE 0110/1.89 Table 1  
For rated main voltage < 150Vrms  
For rated main voltage < 300Vrms  
Climatic Classification  
Min.  
Typ.  
Max.  
Unit  
I-IV  
I-III  
40/85/21  
2
Pollution Degree (DIN VDE 0110/1.89)  
Comparative Tracking Index  
CTI  
175  
V
Input to Output Test Voltage, Method b,  
1060  
PR  
VIORM x 1.875 = V , 100% Production Test with  
PR  
t
= 1 sec, Partial Discharge < 5 pC  
m
V
Input to Output Test Voltage, Method a,  
VIORM x 1.5 = V , Type and Sample Test with  
848  
PR  
PR  
t
= 60 sec, Partial Discharge < 5 pC  
m
V
Max Working Insulation Voltage  
Highest Allowable Over Voltage  
External Creepage  
565  
4000  
5.0  
V
V
IORM  
peak  
V
IOTM  
peak  
mm  
mm  
mm  
°C  
External Clearance  
5.0  
Insulation thickness  
0.5  
T
Safety Limit Values, Maximum Values allowed in the event  
of a failure, Case Temperature  
150  
Case  
9
R
Insulation Resistance at T , V = 500V  
10  
IO  
S
IO  
©2003 Fairchild Semiconductor Corporation  
FODM452, FODM453 Rev. 1.0.5  
www.fairchildsemi.com  
2
Absolute Maximum Ratings (T = 25°C unless otherwise noted)  
A
Stresses exceeding the absolute maximum ratings may damage the device. The device may not function or be  
operable above the recommended operating conditions and stressing the parts to these levels is not recommended.  
In addition, extended exposure to stresses above the recommended operating conditions may affect device reliability.  
The absolute maximum ratings are stress ratings only.  
Symbol  
Parameter  
Value  
Units  
°C  
T
Storage Temperature  
Operating Temperature  
-40 to +125  
-40 to +85  
STG  
T
°C  
OPR  
EMITTER  
I (avg)  
DC/Average Forward Input Current  
25  
50  
1.0  
5
mA  
mA  
A
F
I (pk)  
Peak Forward Input Current (50% duty cycle, 1ms P.W.)  
Peak Transient Input Current (1µs P.W., 300pps)  
Reverse Input Voltage  
F
I (trans)  
F
V
P
V
R
D
Input Power Dissipation  
45  
mW  
(No derating required over specified operating temp range)  
DETECTOR  
I
(avg)  
(pk)  
Average Output Current  
Peak Output Current  
Supply Voltage  
8
mA  
mA  
V
O
I
16  
O
V
-0.5 to 30  
-0.5 to 20  
100  
CC  
V
Output Voltage  
V
O
P
Output Power Dissipation  
mW  
D
(No derating required over specified operating temp range)  
©2003 Fairchild Semiconductor Corporation  
FODM452, FODM453 Rev. 1.0.5  
www.fairchildsemi.com  
3
Electrical Characteristics (T = 0 to 70°C unless otherwise specified)  
A
Individual Component Characteristics  
Symbol  
EMITTER  
Parameter  
Test Conditions  
Min. Typ.* Max. Unit  
V
Input Forward Voltage  
I = 16mA, T = 25°C  
1.60  
1.7  
1.8  
V
F
F
A
I = 16mA  
F
B
Input Reverse Breakdown Voltage  
I
= 10µA  
5.0  
V
VR  
R
V /T  
Temperature Coefficient of  
Forward Voltage  
I = 16mA  
-1.8  
mV/°C  
F
A
F
DETECTOR  
I
Logic High Output Current  
I = 0mA, V = V = 5.5V, T =25°C  
.001  
.001  
0.5  
1
µA  
OH  
F
O
CC  
A
I = 0 mA, V = V = 15V, T =25°C  
F
O
CC  
A
I = 0mA, V = V = 15V  
50  
200  
1
F
O
CC  
I
Logic Low Supply Current  
Logic high supply current  
I = 16mA, V = Open, V = 15V  
100  
µA  
µA  
CCL  
F
O
CC  
I
I = 0 mA, V = Open, V = 15V,  
0.05  
CCH  
F
O
CC  
T = 25°C  
A
I = 0mA, V = Open, V = 15V  
2
F
O
CC  
Transfer Characteristics  
Symbol  
COUPLED  
CTR  
Parameter  
Test Conditions  
Min. Typ.* Max Unit  
(1)  
Current Transfer Ratio  
I = 16mA, V = 4.5V  
T = 25°C V =0.4V  
20  
15  
50  
%
V
F
CC  
A
OL  
V
=0.5V  
OL  
V
Logic LOW Output  
Voltage  
I = 16mA, I = 3mA, V = 4.5V, T =2 5°C  
0.4  
0.5  
OL  
F
O
CC  
A
I = 16mA, I = 2.4mA, V = 4.5 V  
F
O
CC  
Switching Characteristics (V = 5V)  
CC  
Symbol  
Parameter  
Test Conditions  
Device Min. Typ.* Max. Unit  
(2)  
T
T
Propagation Delay  
Time to Logic LOW  
R = 1.9k, I = 16mA, T = 25°C (Fig. 9)  
0.40  
0.8  
1.0  
0.8  
1.0  
µs  
µs  
PHL  
PLH  
L
F
A
(2)  
R = 1.9k, I = 16mA (Fig. 9)  
L
F
(2)  
Propagation Delay  
Time to Logic HIGH  
R = 1.9k, I = 16mA, T = 25°C (Fig. 9)  
0.35  
µs  
L
F
A
(2)  
R = 1.9k, I = 16mA (Fig. 9)  
µs  
L
F
|CM |  
Common Mode  
Transient Immunity  
at Logic HIGH  
I = 0mA, V  
= 10V , R = 1.9k,  
FODM452  
FODM453  
5
15  
40  
KV/µs  
H
F
CM  
P-P  
L
(3)  
T = 25°C (Fig. 10)  
A
I = 0mA, V  
= 1500V , R = 1.9kΩ  
15  
KV/µs  
KV/µs  
KV/µs  
MHz  
F
CM  
(3)  
P-P  
L
T = 25°C (Fig. 10)  
A
|CM |  
Common Mode  
Transient Immunity  
at Logic LOW  
I = 16mA, V  
= 10V , R = 1.9k,  
FODM452  
FODM453  
5
15  
40  
3
L
F
CM  
P-P  
L
(3)  
T = 25°C (Fig. 10)  
A
I = 16mA, V  
= 1500V , R = 1.9k,  
15  
F
CM  
P-P  
L
(3)  
T = 25°C (Fig. 10)  
A
BW  
Bandwidth  
R = 100Ω  
L
Isolation Characteristics  
Symbol Characteristics  
Test Conditions  
Min. Typ.* Max. Unit  
(4)  
V
Withstand Insulation Test Voltage  
Capacitance (Input to Output)  
RH 50%, T = 25°C, t = 1 min.  
3750  
V
RMS  
ISO  
A
(4)  
C
f = 1MHz  
0.2  
pF  
I-O  
*All Typicals at T = 25°C  
A
©2003 Fairchild Semiconductor Corporation  
FODM452, FODM453 Rev. 1.0.5  
www.fairchildsemi.com  
4
Notes:  
1. Current Transfer Ratio is defined as a ratio of output collector current, I , to the forward LED input current, I ,  
O
F
times 100%.  
2. The 1.9kload represents 1 TTL unit load of 1.6mA and 5.6kpull-up resistor.  
3. Common mode transient immunity in logic high level is the maximum tolerable (positive) dV /dt on the  
cm  
leading edge of the common mode pulse signal V , to assure that the output will remain in a logic high state  
CM  
(i.e., V > 2.0V). Common mode transient immunity in logic low level is the maximum tolerable (negative) dV /dt  
O
cm  
on the trailing edge of the common mode pulse signal, V , to assure that the output will remain in a logic low  
CM  
state (i.e., V < 0.8V).  
O
4. Device is considered a two terminal device: Pins 1, and 3 are shorted together and Pins 4, 5, and 6 are shorted  
together.  
©2003 Fairchild Semiconductor Corporation  
FODM452, FODM453 Rev. 1.0.5  
www.fairchildsemi.com  
5
Typical Performance Curves  
Fig. 1 Input Forward Current vs Forward Voltage  
Fig. 2 Normalized Current Transfer Ratio vs. Input Current  
100  
10  
1.20  
1.15  
1.10  
1.05  
1.00  
0.95  
0.90  
V
V
= 0.4V  
O
T
= 25°C  
A
= 5V  
CC  
T
= 25°C  
A
Normalized to IF = 16mA  
1
0.1  
0.01  
0.001  
1.1  
1.2  
1.3  
1.4  
1.5  
1.6  
1.7  
1.8  
1
10  
VF – FORWARD CURRENT (mA)  
I
– INPUT CURRENT (mA)  
F
Fig. 3 Normalized Current Transfer Ratio  
vs. Ambient Temperature  
Fig. 4 Logic High Output Current  
vs. Ambient Temperature  
1.6  
1.4  
1.2  
1.0  
0.8  
0.6  
0.4  
0.2  
0.0  
IF = 16mA  
V
I
= V = 5V  
CC  
= 0V  
O
F
V
V
= 0.4V  
O
= 5V  
CC  
Normalized to T = 25°C  
A
10  
1
0.1  
-40  
-20  
0
20  
40  
60  
80  
100  
-40  
-20  
0
20  
40  
60  
80  
100  
T
– TEMPERATURE (°C)  
T
A
– AMBIENT TEMPERATURE  
A
Fig. 5 DC and Pulsed Transfer Characteristics  
Fig. 6 Propagation Delay vs. Load Resistance  
10  
14  
12  
T
V
= 25°C  
A
T
V
= 25°C  
= 5V  
A
CC  
= 5V  
CC  
I
F
I
F
= 16mA  
= 10mA  
I
F
= 40mA  
10  
8
35mA  
30mA  
t
PLH  
25mA  
20mA  
1
6
4
15mA  
t
PHL  
10mA  
5mA  
2
0
0.1  
0
2
4
6
8
10  
12  
14  
16  
1
2
3
4
5
6
7
8
9 10  
V
O
– OUTPUT VOLTAGE (V)  
R
– LOAD RESISTANCE (k)  
L
©2003 Fairchild Semiconductor Corporation  
FODM452, FODM453 Rev. 1.0.5  
www.fairchildsemi.com  
6
Typical Performance Curves (Continued)  
Fig. 8 Frequency Response  
Fig. 7 Propagation Delay vs. Ambient Temperature  
1400  
5
0
I
V
T
= 16mA  
= 5V  
I
V
R
= 16mA  
= 5V  
F
CC  
F
CC  
= 25°C  
= 1.9kΩ  
1200  
1000  
800  
A
L
R
= 220Ω  
L
R
= 100Ω  
L
-5  
600  
R
= 470Ω  
L
t
PHL  
400  
-10  
-15  
t
PLH  
R
= 1kΩ  
L
200  
0
-40  
-20  
0
20  
40  
60  
80  
100  
0.01  
0.1  
1
10  
T
– AMBIENT TEMPERATURE (°C)  
f – FREQUENCY (MHz)  
A
©2003 Fairchild Semiconductor Corporation  
FODM452, FODM453 Rev. 1.0.5  
www.fairchildsemi.com  
7
Pulse  
Generator  
tr = 5ns  
ZO= 50  
10% D.C.  
I/f< 100µs  
Noise  
Shield  
IF  
+
VCC  
+5 V  
VO  
1
3
6
5
4
RL  
VO  
0.1 µF  
C
L = 1.5 µF  
IF Monitor  
GND  
Rm  
IF  
0
5 V  
VO  
1.5 V  
1.5 V  
VOL  
TPHL  
TPLH  
Fig. 9 Switching Time Test Circuit  
IF  
Noise  
Shield  
+
VCC  
+5 V  
1
3
6
5
4
RL  
A
VO  
VO  
0.1 µF  
B
VFF  
GND  
-
VCM  
-
+
Pulse Gen  
VCM 10 V  
0 V  
90% 90%  
10%  
tr  
10%  
tf  
VO  
5 V  
Switch at A : IF = 0 mA  
VO  
VOL  
Switch at A : IF = 16 mA  
Fig. 10 Common Mode Immunity Test Circuit  
©2003 Fairchild Semiconductor Corporation  
FODM452, FODM453 Rev. 1.0.5  
www.fairchildsemi.com  
8
Package Dimensions  
Notes:  
1. No standard applies to this package.  
2. All dimensions are in millimeters.  
3. Dimensions are exclusive of burrs, mold flash, and tie bar extrusion.  
4. Drawings filesname and revision: MKT-MFP05A.  
Package drawings are provided as a service to customers considering Fairchild components. Drawings may change in any manner  
without notice. Please note the revision and/or date on the drawing and contact a Fairchild Semiconductor representative to verify or  
obtain the most recent revision. Package specifications do not expand the terms of Fairchild’s worldwide terms and conditions,  
specifically the warranty therein, which covers Fairchild products.  
Always visit Fairchild Semiconductor’s online packaging area for the most recent package drawings:  
http://www.fairchildsemi.com/packaging/  
©2003 Fairchild Semiconductor Corporation  
FODM452, FODM453 Rev. 1.0.5  
www.fairchildsemi.com  
9
Footprint Drawing for PCB Layout  
0.61  
1.27 1.27 1.27  
Device  
‘A’  
Device  
5.05  
7.95  
‘B  
Pin1  
Pin1  
1.45  
2.54  
End Stacking Configuration  
Unutilized Solder Pad  
Dimensions in millimeters  
©2003 Fairchild Semiconductor Corporation  
FODM452, FODM453 Rev. 1.0.5  
www.fairchildsemi.com  
10  
Tape and Reel Dimensions  
P
2
D0  
P
0
t
K0  
E
A0  
W
W1  
B0  
F
d
D1  
P
2.54 Pitch  
Description  
Symbol  
Dimensions (mm)  
12.00 +0.30/-0.10  
0.30 ±0.05  
Tape Width  
W
t
Tape Thickness  
Sprocket Hole Pitch  
Sprocket Hole Diameter  
Sprocket Hole Location  
Pocket Location  
P0  
D0  
E
4.00 ±0.10  
1.50 +0.10/-0.0  
1.75 ±0.10  
F
5.50 ±0.10  
P2  
P
2.00 ±0.10  
Pocket Pitch  
8.00 ±0.10  
Pocket Dimension  
A0  
B0  
K0  
D1  
W1  
d
4.40 ±0.10  
7.30 ±0.10  
2.30 ±0.10  
Pocket Hole Diameter  
Cover Tape Width  
1.50 Min.  
9.20  
Cover Tape Thickness  
0.065 ±0.010  
Max. Component Rotation or Tilt  
Devices Per Reel  
10° Max.  
2500  
Reel Diameter  
330mm (13")  
©2003 Fairchild Semiconductor Corporation  
FODM452, FODM453 Rev. 1.0.5  
www.fairchildsemi.com  
11  
Ordering Information  
Order Entry Identifier  
(example)  
Option  
R2  
Description  
FODM452R2  
FODM452V  
Tape and Reel (2500 per reel)  
V
IEC60747-5-2  
R2V  
FODM452R2V  
IEC60747-5-2, Tape and Reel (2500 per reel)  
Marking Information  
1
2
M452  
6
V X YY M  
5
3
4
Definitions  
1
Fairchild logo  
Device number  
2
IEC60747-5-2 mark (Note: Only appears on parts ordered  
with VDE option – See order entry table)  
3
4
5
6
One digit year code, e.g., ‘7’  
Two digit work week ranging from ‘01’ to ‘53’  
Assembly package code  
©2003 Fairchild Semiconductor Corporation  
FODM452, FODM453 Rev. 1.0.5  
www.fairchildsemi.com  
12  
Reflow Profile  
Max. Ramp-up Rate = 3°C/S  
Max. Ramp-down Rate = 6°C/S  
T
P
260  
240  
220  
200  
180  
160  
140  
120  
100  
80  
t
P
T
L
Tsmax  
t
L
Preheat Area  
Tsmin  
t
s
60  
40  
20  
0
120  
Time 25°C to Peak  
240  
360  
Time (seconds)  
Profile Freature  
Pb-Free Assembly Profile  
150°C  
Temperature Min. (Tsmin)  
Temperature Max. (Tsmax)  
200°C  
Time (t ) from (Tsmin to Tsmax)  
60–120 seconds  
3°C/second max.  
217°C  
S
Ramp-up Rate (t to t )  
L
P
Liquidous Temperature (T )  
L
Time (t ) Maintained Above (T )  
60–150 seconds  
260°C +0°C / –5°C  
30 seconds  
L
L
Peak Body Package Temperature  
Time (t ) within 5°C of 260°C  
P
Ramp-down Rate (T to T )  
6°C/second max.  
8 minutes max.  
P
L
Time 25°C to Peak Temperature  
©2003 Fairchild Semiconductor Corporation  
FODM452, FODM453 Rev. 1.0.5  
www.fairchildsemi.com  
13  
TRADEMARKS  
The following includes registered and unregistered trademarks and service marks, owned by Fairchild Semiconductor and/or its global subsidiaries, and is not  
intended to be an exhaustive list of all such trademarks.  
®
*
AccuPower  
Auto-SPM™  
F-PFS™  
Power-SPM™  
PowerTrench®  
PowerXS™  
FRFET®  
The Power Franchise®  
Build it Now™  
CorePLUS™  
CorePOWER™  
CROSSVOLT™  
CTL™  
Global Power ResourceSM  
Green FPS™  
Green FPSe-Series™  
Gmax™  
GTO™  
IntelliMAX™  
ISOPLANAR™  
MegaBuck™  
MICROCOUPLER™  
MicroFET™  
Programmable Active Droop™  
QFET®  
QS™  
TinyBoost™  
TinyBuck™  
Quiet Series™  
RapidConfigure™  
TinyCalc™  
Current Transfer Logic™  
DEUXPEED®  
Dual Cool™  
TinyLogic®  
TINYOPTO™  
TinyPower™  
TinyPWM™  
TinyWire™  
TriFault Detect™  
TRUECURRENT*  
" SerDes™  
Saving our world, 1mW/W/kW at a time™  
SignalWise™  
SmartMax™  
EcoSPARK®  
n
EfficientMax™  
ESBC™  
MicroPak™  
SMART START™  
®
SPM®  
MicroPak2™  
MillerDrive™  
MotionMax™  
Motion-SPM™  
OptoHiT™  
Fairchild®  
STEALTH™  
SuperFET™  
SuperSOT-3  
SuperSOT-6  
SuperSOT-8  
SupreMOS®  
Fairchild Semiconductor®  
FACT Quiet Series™  
FACT®  
OPTOLOGIC®  
UHC®  
FAST®  
OPTOPLANAR®  
Ultra FRFET™  
UniFET™  
VCX™  
FastvCore™  
®
SyncFET™  
Sync-Lock™  
FETBench™  
FlashWriter®  
*
PDP SPM™  
VisualMax™  
XS™  
FPS™  
* Trademarks of System General Corporation, used under license by Fairchild Semiconductor.  
DISCLAIMER  
FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER NOTICE TO ANY PRODUCTS HEREIN TO IMPROVE  
RELIABILITY, FUNCTION, OR DESIGN. FAIRCHILD DOES NOT ASSUME ANYLIABILITY ARISING OUT OF THE APPLICATION OR USE OF ANY PRODUCT  
OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT RIGHTS, NOR THE RIGHTS OF OTHERS. THESE  
SPECIFICATIONS DO NOT EXPAND THE TERMS OF FAIRCHILD’S WORLDWIDE TERMS AND CONDITIONS, SPECIFICALLY THE WARRANTY THEREIN,  
WHICH COVERS THESE PRODUCTS.  
LIFE SUPPORT POLICY  
FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE  
EXPRESS WRITTEN APPROVAL OF FAIRCHILD SEMICONDUCTOR CORPORATION.  
As used herein:  
1. Life support devices or systems are devices or systems which, (a)  
are intended for surgical implant into the body or (b) support or  
sustain life, and (c) whose failure to perform when properly used in  
accordance with instructions for use provided in the labeling, can be  
reasonably expected to result in a significant injury of the user.  
2. A critical component in any component of a life support, device, or  
system whose failure to perform can be reasonably expected to  
cause the failure of the life support device or system, or to affect its  
safety or effectiveness.  
ANTI-COUNTERFEITING POLICY  
Fairchild Semiconductor Corporation's Anti-Counterfeiting Policy. Fairchild's Anti-Counterfeiting Policy is also stated on ourexternal website, www.fairchildsemi.com,  
under Sales Support.  
Counterfeiting of semiconductor parts is a growing problem in the industry. All manufacturers of semiconductor products are experiencing counterfeiting of their  
parts. Customers who inadvertently purchase counterfeit parts experience many problems such as loss of brand reputation, substandard performance, failed  
applications, and increased cost of production and manufacturing delays. Fairchild is taking strong measures to protect ourselves and our customers from the  
proliferation of counterfeit parts. Fairchild strongly encourages customers to purchase Fairchild parts either directly from Fairchild or from Authorized Fairchild  
Distributors who are listed by country on our web page cited above. Products customers buy either from Fairchild directly or from Authorized Fairchild Distributors  
are genuine parts, have full traceability, meet Fairchild's quality standards for handling and storage and provide access to Fairchild's full range of up-to-date technical  
and product information. Fairchild and our Authorized Distributors will stand behind all warranties and will appropriately address any warranty issues that may arise.  
Fairchild will not provide any warranty coverage or other assistance for parts bought from Unauthorized Sources. Fairchild is committed to combat this global  
problem and encourage our customers to do their part in stopping this practice by buying direct or from authorized distributors.  
PRODUCT STATUS DEFINITIONS  
Definition of Terms  
Datasheet  
Product Status  
Definition  
Identification  
Datasheet contains the design specifications for product development. Specifications may change  
in any manner without notice.  
Advance Information  
Preliminary  
Formative / In Design  
First Production  
Datasheet contains preliminary data; supplementary data will be published at a later date. Fairchild  
Semiconductor reserves the right to make changes at any time without notice to improve design.  
Datasheet contains final specifications. Fairchild Semiconductor reserves the right to make  
changes at any time without notice to improve the design.  
No Identification Needed Full Production  
Obsolete Not In Production  
Datasheet contains specifications on a product that is discontinued by Fairchild Semiconductor.  
The datasheet is for reference information only.  
Rev. I49  
©2003 Fairchild Semiconductor Corporation  
FODM452, FODM453 Rev. 1.0.5  
www.fairchildsemi.com  
14  

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