FDS6679Z_NL [FAIRCHILD]

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FDS6679Z_NL
型号: FDS6679Z_NL
厂家: FAIRCHILD SEMICONDUCTOR    FAIRCHILD SEMICONDUCTOR
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晶体 小信号场效应晶体管 开关 光电二极管 PC
文件: 总5页 (文件大小:70K)
中文:  中文翻译
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May 2001  
FDS6679  
30 Volt P-Channel PowerTrenchÒ MOSFET  
General Description  
Features  
This P-Channel MOSFET has been designed  
specifically to improve the overall efficiency of DC/DC  
converters using either synchronous or conventional  
switching PWM controllers, and battery chargers.  
· –13 A, –30 V. RDS(ON) = 9 mW @ VGS = –10 V  
RDS(ON) = 13 mW @ VGS = – 4.5 V  
· Extended VGSS range (±25V) for battery applications  
These MOSFETs feature faster switching and lower  
gate charge than other MOSFETs with comparable  
RDS(ON) specifications.  
· High performance trench technology for extremely  
low RDS(ON)  
The result is a MOSFET that is easy and safer to drive  
(even at very high frequencies), and DC/DC power  
supply designs with higher overall efficiency.  
· High power and current handling capability  
D
D
5
6
7
8
4
3
2
1
D
D
G
S
S
SO-8  
S
Absolute Maximum Ratings TA=25oC unless otherwise noted  
Symbol  
VDSS  
Parameter  
Drain-Source Voltage  
Ratings  
Units  
V
–30  
VGSS  
ID  
Gate-Source Voltage  
V
A
±25  
–13  
Drain Current – Continuous  
– Pulsed  
(Note 1a)  
–50  
PD  
Power Dissipation for Single Operation  
(Note 1a)  
(Note 1b)  
2.5  
W
1.2  
(Note 1c)  
1.0  
TJ, TSTG  
Operating and Storage Junction Temperature Range  
–55 to +175  
°C  
Thermal Characteristics  
Thermal Resistance, Junction-to-Ambient  
Thermal Resistance, Junction-to-Case  
(Note 1a)  
(Note 1)  
50  
25  
RqJA  
°C/W  
°C/W  
RqJC  
Package Marking and Ordering Information  
Device Marking  
Device  
Reel Size  
Tape width  
Quantity  
FDS6679  
FDS6679  
13’’  
12mm  
2500 units  
FDS6679 Rev C (W)  
Ó2001 Fairchild Semiconductor Corporation  
Electrical Characteristics  
TA= 25°C unless otherwise noted  
Symbol  
Parameter  
Test Conditions  
Min Typ Max Units  
Off Characteristics  
BVDSS  
Drain–Source Breakdown Voltage VGS = 0 V, ID = –250 mA  
–30  
V
Breakdown Voltage Temperature  
Coefficient  
DBVDSS  
DTJ  
ID = –250 mA, Referenced to 25°C  
–23  
mV/°C  
IDSS  
Zero Gate Voltage Drain Current  
Gate–Body Leakage, Forward  
Gate–Body Leakage, Reverse  
VDS = –24 V, VGS = 0 V  
VGS = –25 V, VDS = 0 V  
VGS = –25 V, VDS = 0 V  
–1  
mA  
nA  
nA  
IGSSF  
IGSSR  
100  
–100  
On Characteristics  
(Note 2)  
VGS(th)  
Gate Threshold Voltage  
Gate Threshold Voltage  
Temperature Coefficient  
VDS = VGS, ID = –250 mA  
–1  
–1.6  
5
–3  
V
DVGS(th)  
DTJ  
RDS(on)  
ID = –250 mA, Referenced to 25°C  
mV/°C  
mW  
Static Drain–Source  
On–Resistance  
VGS = –10 V,  
ID = –13 A  
7.3  
10  
9.5  
9
13  
13  
VGS = –4.5 V, ID = –11 A  
VGS=–10 V, ID =–13 A, TJ=125°C  
ID(on)  
gFS  
On–State Drain Current  
VGS = –10 V,  
VDS = –5 V,  
VDS = –5 V  
ID = –13 A  
–50  
A
S
Forward Transconductance  
44  
Dynamic Characteristics  
C
Input Capacitance  
3939  
972  
pF  
pF  
pF  
iss  
VDS = –15 V,  
f = 1.0 MHz  
V GS = 0 V,  
Coss  
Output Capacitance  
C
rss  
Reverse Transfer Capacitance  
498  
Switching Characteristics (Note 2)  
td(on)  
tr  
td(off)  
tf  
Turn–On Delay Time  
Turn–On Rise Time  
Turn–Off Delay Time  
Turn–Off Fall Time  
Total Gate Charge  
Gate–Source Charge  
Gate–Drain Charge  
VDD = –15 V,  
VGS = –10 V,  
ID = –1 A,  
RGEN = 6 W  
19  
10  
34  
20  
ns  
ns  
110  
65  
176  
104  
100  
ns  
ns  
Qg  
VDS = –15 V,  
VGS = –10 V  
ID = –13 A,  
71  
nC  
nC  
nC  
Qgs  
Qgd  
12  
15  
Drain–Source Diode Characteristics and Maximum Ratings  
IS  
Maximum Continuous Drain–Source Diode Forward Current  
–2.1  
–1.2  
A
V
Drain–Source Diode Forward  
VSD  
VGS = 0 V, IS = –2.1 A (Note 2)  
–0.7  
Voltage  
Notes:  
1. RqJAis the sum of the junction-to-case and case-to-ambient thermal resistance where the case thermal reference is defined as the solder mounting surface of  
the drain pins. RqJCis guaranteed by design while RqCAis determined by the user's board design.  
a) 50°C/W (10 sec)  
62.5°C/W steady state  
when mounted on a  
b) 105°C/W when  
mounted on a .04 in  
pad of 2 oz copper  
c) 125°C/W when mounted on a  
minimum pad.  
2
2
1in pad of 2 oz  
copper  
Scale 1 : 1 on letter size paper  
2. Pulse Test: Pulse Width < 300ms, Duty Cycle < 2.0%  
FDS6679 Rev C(W)  
Typical Characteristics  
50  
3
2.6  
2.2  
1.8  
1.4  
1
VGS = -10V  
-4.0V  
-6.0V  
VGS = -3.0V  
40  
-3.5V  
-4.5V  
30  
-3.0V  
-3.5V  
20  
10  
0
-4.0V  
-4.5V  
-5.0V  
-6.0V  
-10V  
-2.5V  
0.6  
0
0.5  
1
1.5  
2
0
10  
20  
30  
40  
50  
-VDS , DRAIN TO SOURCE VOLTAGE (V)  
-ID, DIRAIN CURRENT (A)  
Figure 1. On-Region Characteristics.  
Figure 2. On-Resistance Variation with  
Drain Current and Gate Voltage.  
1.6  
0.04  
ID = -13A  
ID = -7.0A  
VGS = -10V  
1.4  
0.03  
0.02  
0.01  
0
TA = 125oC  
1.2  
1
TA = 25oC  
0.8  
0.6  
-50  
-25  
0
25  
50  
75  
100  
125  
150  
175  
2
2.5  
3
3.5  
4
4.5  
5
TJ, JUNCTION TEMPERATURE (oC)  
-VGS, GATE TO SOURCE VOLTAGE (V)  
Figure 3. On-Resistance Variation with  
Temperature.  
Figure 4. On-Resistance Variation with  
Gate-to-Source Voltage.  
50  
40  
30  
20  
10  
0
100  
VGS = 0V  
VDS = -5.0V  
10  
1
TA = 125oC  
25oC  
0.1  
-55oC  
TA = -125oC  
0.01  
0.001  
0.0001  
25oC  
-55oC  
1.5  
2
2.5  
3
3.5  
0
0.2  
-VSD  
0.4  
0.6  
0.8  
1
1.2  
-VGS, GATE TO SOURCE VOLTAGE (V)  
, BODY DIODE FORWARD VOLTAGE (V)  
Figure 5. Transfer Characteristics.  
Figure 6. Body Diode Forward Voltage Variation  
with Source Current and Temperature.  
FDS6679 Rev C(W)  
Typical Characteristics  
6000  
5000  
4000  
3000  
2000  
1000  
0
10  
VDS = -5V  
ID = -13A  
-10V  
f = 1 MHz  
VGS = 0 V  
8
6
4
2
0
-15V  
CISS  
COSS  
CRSS  
0
10  
20  
30  
40  
50  
60  
70  
80  
0
5
10  
15  
20  
25  
30  
Qg, GATE CHARGE (nC)  
-VDS, DRAIN TO SOURCE VOLTAGE (V)  
Figure 7. Gate Charge Characteristics.  
Figure 8. Capacitance Characteristics.  
100  
10  
50  
40  
30  
20  
10  
0
100ms  
SINGLE PULSE  
RqJA = 125°C/W  
TA = 25°C  
1ms  
10ms  
RDS(ON) LIMIT  
100ms  
1s  
10s  
1
DC  
VGS = -10V  
SINGLE PULSE  
0.1  
0.01  
Rq = 125oC/W  
JA  
TA = 25oC  
0.1  
1
10  
100  
0.001  
0.01  
0.1  
1
10  
100  
-VDS , DRAIN-SOURCE VOLTAGE (V)  
t1, TIME (sec)  
Figure 9. Maximum Safe Operating Area.  
Figure 10. Single Pulse Maximum  
Power Dissipation.  
1
D = 0.5  
RqJA(t) = r(t) + Rq  
JA  
0.2  
RqJA = 125oC/W  
0.1  
0.1  
0.05  
P(pk)  
0.02  
t1  
0.01  
t2  
0.01  
TJ - TA = P * RqJA(t)  
Duty Cycle, D = t1 / t2  
SINGLE PULSE  
0.001  
0.0001  
0.001  
0.01  
0.1  
1
10  
100  
1000  
t1, TIME (sec)  
Figure 11. Transient Thermal Response Curve.  
Thermal characterization performed using the conditions described in Note 1c.  
Transient thermal response will change depending on the circuit board design.  
FDS6679 Rev C(W)  
TRADEMARKS  
The following are registered and unregistered trademarks Fairchild Semiconductor owns or is authorized to use and is  
not intended to be an exhaustive list of all such trademarks.  
OPTOPLANAR™  
PACMAN™  
POP™  
PowerTrench  
QFET™  
QS™  
SuperSOT™-3  
SuperSOT™-6  
SuperSOT™-8  
SyncFET™  
TinyLogic™  
UHC™  
FAST  
FASTr™  
FRFET™  
GlobalOptoisolator™  
GTO™  
ACEx™  
Bottomless™  
CoolFET™  
CROSSVOLT™  
DenseTrench™  
DOME™  
HiSeC™  
ISOPLANAR™  
LittleFET™  
MicroFET™  
MICROWIRE™  
OPTOLOGIC™  
QT Optoelectronics™  
Quiet Series™  
SILENT SWITCHER  
SMART START™  
Stealth™  
UltraFET  
VCX™  
EcoSPARK™  
E2CMOSTM  
EnSignaTM  
FACT™  
FACT Quiet Series™  
DISCLAIMER  
FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER  
NOTICE TOANY PRODUCTS HEREIN TO IMPROVE RELIABILITY, FUNCTION OR DESIGN. FAIRCHILD  
DOES NOTASSUMEANY LIABILITYARISING OUT OF THEAPPLICATION OR USE OFANY PRODUCT  
OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT  
RIGHTS, NOR THE RIGHTS OF OTHERS.  
LIFE SUPPORT POLICY  
FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT  
DEVICES OR SYSTEMS WITHOUTTHE EXPRESS WRITTENAPPROVALOF FAIRCHILD SEMICONDUCTOR CORPORATION.  
As used herein:  
1. Life support devices or systems are devices or  
systems which, (a) are intended for surgical implant into  
the body, or (b) support or sustain life, or (c) whose  
failure to perform when properly used in accordance  
with instructions for use provided in the labeling, can be  
reasonably expected to result in significant injury to the  
user.  
2. A critical component is any component of a life  
support device or system whose failure to perform can  
be reasonably expected to cause the failure of the life  
support device or system, or to affect its safety or  
effectiveness.  
PRODUCT STATUS DEFINITIONS  
Definition of Terms  
Datasheet Identification  
Product Status  
Definition  
Advance Information  
Formative or  
In Design  
This datasheet contains the design specifications for  
product development. Specifications may change in  
any manner without notice.  
Preliminary  
First Production  
This datasheet contains preliminary data, and  
supplementary data will be published at a later date.  
Fairchild Semiconductor reserves the right to make  
changes at any time without notice in order to improve  
design.  
No Identification Needed  
Obsolete  
Full Production  
This datasheet contains final specifications. Fairchild  
Semiconductor reserves the right to make changes at  
any time without notice in order to improve design.  
Not In Production  
This datasheet contains specifications on a product  
that has been discontinued by Fairchild semiconductor.  
The datasheet is printed for reference information only.  
Rev. H2  

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