FDS6680AS_NL [FAIRCHILD]
30V N-Channel PowerTrench SyncFET; 30V N沟道的PowerTrench SyncFET![FDS6680AS_NL](http://pdffile.icpdf.com/pdf1/p00074/img/icpdf/FDS6680_388886_icpdf.jpg)
型号: | FDS6680AS_NL |
厂家: | ![]() |
描述: | 30V N-Channel PowerTrench SyncFET |
文件: | 总8页 (文件大小:552K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
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March 2005
FDS6680AS
30V N-Channel PowerTrench® SyncFET™
General Description
Features
The FDS6680AS is designed to replace a single SO-8
MOSFET and Schottky diode in synchronous DC:DC
power supplies. This 30V MOSFET is designed to
maximize power conversion efficiency, providing a low
•
11.5 A, 30 V. RDS(ON) max= 10.0 mΩ @ VGS = 10 V
RDS(ON) max= 12.5 mΩ @ VGS = 4.5 V
•
•
•
Includes SyncFET Schottky body diode
Low gate charge (22nC typical)
RDS(ON)
and low gate charge.
The FDS6680AS
includes an integrated Schottky diode using Fairchild’s
monolithic SyncFET technology. The performance of
the FDS6680AS as the low-side switch in
a
synchronous rectifier is indistinguishable from the
performance of the FDS6680 in parallel with a Schottky
diode.
High performance trench technology for extremely low
RDS(ON) and fast switching
•
High power and current handling capability
Applications
• DC/DC converter
• Low side notebooks
D
D
D
5
6
7
8
4
3
2
1
D
G
S
S
SO-8
S
Absolute Maximum Ratings TA=25oC unless otherwise noted
Symbol
VDSS
Parameter
Drain-Source Voltage
Ratings
Units
V
30
VGSS
ID
Gate-Source Voltage
V
A
±20
Drain Current – Continuous
– Pulsed
(Note 1a)
11.5
50
PD
Power Dissipation for Single Operation
(Note 1a)
(Note 1b)
2.5
W
1.2
1
(Note 1c)
TJ, TSTG
Operating and Storage Junction Temperature Range
–55 to +150
°C
Thermal Characteristics
Thermal Resistance, Junction-to-Ambient
Thermal Resistance, Junction-to-Case
(Note 1a)
(Note 1)
50
25
RθJA
°C/W
°C/W
RθJC
Package Marking and Ordering Information
Device Marking
FDS6680AS
Device
Reel Size
13’’
Tape width
12mm
Quantity
FDS6680AS
2500 units
2500 units
FDS6680AS
FDS6680AS_NL (Note 4)
13’’
12mm
FDS6680AS Rev B(X)
©2005 Fairchild Semiconductor Corporation
Electrical Characteristics
TA = 25°C unless otherwise noted
Symbol
Parameter
Test Conditions
Min Typ Max Units
Off Characteristics
BVDSS
Drain–Source Breakdown Voltage
VGS = 0 V, ID = 1 mA
30
V
∆BVDSS
∆TJ
Breakdown Voltage Temperature
Coefficient
29
ID = 1 mA, Referenced to 25°C
mV/°C
IDSS
Zero Gate Voltage Drain Current
Gate–Body Leakage
VDS = 24 V,
VGS = 0 V
VDS = 0 V
500
µA
IGSS
nA
VGS = ±20 V,
±100
On Characteristics
(Note 2)
VGS(th)
Gate Threshold Voltage
VDS = VGS, ID = 1 mA
1
1.5
–3
3
V
∆VGS(th)
∆TJ
RDS(on)
Gate Threshold Voltage
Temperature Coefficient
ID = 1 mA, Referenced to 25°C
mV/°C
mΩ
Static Drain–Source
On–Resistance
VGS = 10 V,
VGS = 4.5 V,
ID = 11.5 A
ID = 9.5 A
8.4
10.3
12.3
10.0
12.5
15.5
V
GS=10 V, ID =11.5A, TJ=125°C
ID(on)
gFS
On–State Drain Current
VGS = 10 V,
VDS = 15 V,
VDS = 5 V
50
A
S
Forward Transconductance
ID = 11.5 A
48
Dynamic Characteristics
Ciss
Coss
Crss
RG
Input Capacitance
1240
350
120
1.4
pF
pF
pF
Ω
V
DS = 15 V,
V GS = 0 V,
Output Capacitance
Reverse Transfer Capacitance
Gate Resistance
f = 1.0 MHz
VGS = 15 mV,
f = 1.0 MHz
Switching Characteristics (Note 2)
td(on)
tr
td(off)
tf
td(on)
tr
td(off)
tf
Turn–On Delay Time
9
18
10
42
21
20
22
32
20
30
16
ns
ns
ns
ns
ns
ns
ns
ns
nC
nC
nC
nC
V
DS = 15 V,
ID = 1 A,
RGEN = 6 Ω
Turn–On Rise Time
5
VGS = 10 V,
Turn–Off Delay Time
Turn–Off Fall Time
27
11
11
12
18
11
22
12
3.5
3.4
Turn–On Delay Time
Turn–On Rise Time
V
DS = 15 V,
ID = 1 A,
RGEN = 6 Ω
VGS = 4.5 V,
Turn–Off Delay Time
Turn–Off Fall Time
Total Gate Charge at Vgs=10V
Total Gate Charge at Vgs=5V
Gate–Source Charge
Gate–Drain Charge
Qg
Qg
(TOT)
V
DD = 15 V, ID = 11.5 A,
Qgs
Qgd
FDS6680AS Rev B(X)
Electrical Characteristics
TA = 25°C unless otherwise noted
Symbol
Parameter
Test Conditions
Min Typ Max Units
Drain–Source Diode Characteristics and Maximum Ratings
IS
Maximum Continuous Drain–Source Diode Forward Current
3.5
0.7
A
V
VSD
Drain–Source Diode Forward
Voltage
VGS = 0 V, IS = 3.5 A
VGS = 0 V, IS = 7 A
IF = 11.5A,
(Note 2)
(Note 2)
0.5
0.6
18
Trr
Qrr
Diode Reverse Recovery Time
nS
nC
Diode Reverse Recovery Charge
diF/dt = 300 A/µs
(Note 3)
12
Notes:
1. RθJA is the sum of the junction-to-case and case-to-ambient thermal resistance where the case thermal reference is defined as the solder mounting surface of the
drain pins. RθJC is guaranteed by design while RθCA is determined by the user's board design.
a) 50°/W when
b) 105°/W when
c) 125°/W when mounted on a
minimum pad.
mounted on a 1 in2
pad of 2 oz copper
mounted on a .04 in2
pad of 2 oz copper
Scale 1 : 1 on letter size paper
2. Pulse Test: Pulse Width < 300µs, Duty Cycle < 2.0%
3. See “SyncFET Schottky body diode characteristics” below.
4. FDS6680AS_NL is a lead free product. The FDS6680AS_NL marking will appear on the reel label.
FDS6680AS Rev B(X)
Typical Characteristics
50
2
1.8
1.6
1.4
1.2
1
VGS = 10V
6.0V
3.5V
4.0V
4.5V
VGS = 3.0V
40
30
20
10
0
3.0V
3.5V
4.0V
4.5V
5.0V
6.0V
2.5V
10.0V
0.8
0
10
20
30
40
50
0
0.4
0.8
1.2
1.6
2
V
DS, DRAIN-SOURCE VOLTAGE (V)
ID, DRAIN CURRENT (A)
Figure 1. On-Region Characteristics.
Figure 2. On-Resistance Variation with
Drain Current and Gate Voltage.
1.4
1.2
1
0.05
0.04
0.03
0.02
0.01
0
ID = 11.5A
GS = 10V
ID = 6A
V
TA = 125oC
0.8
0.6
TA = 25oC
2
4
6
8
10
-50
-25
0
25
50
75
100
TJ, JUNCTION TEMPERATURE (oC)
VGS, GATE TO SOURCE VOLTAGE (V)
Figure 3. On-Resistance Variation with
Temperature.
Figure 4. On-Resistance Variation with
Gate-to-Source Voltage.
50
10
VGS = 0V
VDS = 5V
40
30
20
10
0
1
TA = 125oC
0.1
25oC
TA = 125oC
0.01
-55oC
-55oC
0.001
25oC
0.0001
0
0.2
0.4
0.6
0.8
1
1.5
2
2.5
3
3.5
4
VGS, GATE TO SOURCE VOLTAGE (V)
VSD, BODY DIODE FORWARD VOLTAGE (V)
Figure 5. Transfer Characteristics.
Figure 6. Body Diode Forward Voltage Variation
with Source Current and Temperature.
FDS6680AS Rev B(X)
Typical Characteristics (continued)
10
1800
1500
1200
900
600
300
0
f = 1MHz
VGS = 0 V
ID =11.5A
VDS = 10V
8
6
4
2
0
20V
Ciss
15V
Coss
Crss
0
5
10
15
20
25
0
5
10
15
20
25
30
Qg, GATE CHARGE (nC)
VDS, DRAIN TO SOURCE VOLTAGE (V)
Figure 7. Gate Charge Characteristics.
Figure 8. Capacitance Characteristics.
50
40
30
20
10
0
1000
100
10
SINGLE PULSE
RθJA = 125°C/W
TA = 25°C
RDS(ON) LIMIT
100 s
µ
1ms
10ms
100ms
1s
10s
DC
1
VGS = 10V
SINGLE PULSE
RθJA = 125oC/W
TA = 25oC
0.1
0.01
0.1
1
10
100
0.01
0.1
1
10
100
1000
V
DS, DRAIN-SOURCE VOLTAGE (V)
t1, TIME (sec)
Figure 9. Maximum Safe Operating Area.
Figure 10. Single Pulse Maximum
Power Dissipation.
1
D = 0.5
RθJA(t) = r(t) * Rθ
JA
0.2
RθJA = 125 °C/W
0.1
0.1
0.05
0.02
P(pk)
t1
0.01
t2
0.01
T
J - TA = P * RθJA(t)
SINGLE PULSE
Duty Cycle, D = t1 / t2
0.001
0.0001
0.001
0.01
0.1
1
10
100 1000
t1, TIME (sec)
Figure 11. Transient Thermal Response Curve.
Thermal characterization performed using the conditions described in Note 1c.
Transient thermal response will change depending on the circuit board design.
FDS6680AS Rev B(X)
Typical Characteristics (continued)
SyncFET Schottky Body Diode
Characteristics
Fairchild’s SyncFET process embeds a Schottky diode in
parallel with PowerTrench MOSFET. This diode exhibits
similar characteristics to a discrete external Schottky
diode in parallel with a MOSFET. Figure 12 shows the
reverse recovery characteristic of the FDS6680AS.
Schottky barrier diodes exhibit significant leakage at high
temperature and high reverse voltage. This will increase
the power in the device.
0.1
TA = 125oC
0.01
0.001
TA = 100oC
0.0001
0.00001
TA = 25oC
0.000001
0
5
10
15
20
25
30
VDS, REVERSE VOLTAGE (V)
Figure 14. SyncFET body diode reverse
leakage versus drain-source voltage and
temperature.
10nS/DIV
Figure 12. FDS6680AS SyncFET body diode
reverse recovery characteristic.
For comparison purposes, Figure 13 shows the reverse
recovery characteristics of the body diode of an
equivalent size MOSFET produced without SyncFET
(FDS6680).
0
10nS/div
Figure 13. Non-SyncFET (FDS6680) body
diode reverse recovery characteristic.
FDS6680AS Rev B(X)
Typical Characteristics
L
VDS
BVDSS
tP
VGS
RGE
VDS
VDD
+
-
IAS
DUT
VDD
0V
VGS
vary tP to obtain
required peak IAS
tp
IAS
0.01Ω
tAV
Figure 15. Unclamped Inductive Load Test
Figure 16. Unclamped Inductive
Waveforms
Circuit
Drain Current
Same type as
+
50kΩ
10V
10µF
-
1µF
+
VDD
QG(TOT)
-
VGS
10V
VGS
DUT
QGD
QGS
Ig(REF
Charge, (nC)
Figure 17. Gate Charge Test Circuit
Figure 18. Gate Charge Waveform
tON
td(ON)
tOFF
td(OFF
RL
t
VDS
tr
VDS
90%
90%
+
-
VGS
RGEN
10%
10%
0V
DUT
VDD
90%
50%
VGS
50%
VGS
Pulse Width ≤ 1µs
Duty Cycle ≤ 0.1%
10%
0V
Pulse Width
Figure 19. Switching Time Test
Circuit
Figure 20. Switching Time Waveforms
FDS6680AS Rev B(X)
TRADEMARKS
The following are registered and unregistered trademarks Fairchild Semiconductor owns or is authorized to use and is
not intended to be an exhaustive list of all such trademarks.
ACEx™
POP™
SPM™
Stealth™
SuperFET™
SuperSOT™-3
SuperSOT™-6
SuperSOT™-8
IntelliMAX™
ISOPLANAR™
LittleFET™
MICROCOUPLER™
MicroFET™
MicroPak™
MICROWIRE™
MSX™
FAST
ActiveArray™
Bottomless™
CoolFET™
CROSSVOLT™
DOME™
EcoSPARK™
E2CMOS™
EnSigna™
FACT™
Power247™
PowerEdge™
PowerSaver™
FASTr™
FPS™
FRFET™
GlobalOptoisolator™
GTO™
PowerTrench
QFET
QS™
SyncFET™
HiSeC™
I2C™
QT Optoelectronics™ TinyLogic
Quiet Series™
RapidConfigure™
RapidConnect™
µSerDes™
TINYOPTO™
TruTranslation™
UHC™
MSXPro™
OCX™
i-Lo™
ImpliedDisconnect™
FACT Quiet Series™
OCXPro™
OPTOLOGIC
UltraFET
Across the board. Around the world.™
SILENT SWITCHER UniFET™
SMART START™
VCX™
OPTOPLANAR™
PACMAN™
The Power Franchise
ProgrammableActive Droop™
DISCLAIMER
FAIRCHILD SEMICONDUCTOR RESERVESTHE RIGHTTO MAKE CHANGES WITHOUTFURTHER NOTICETOANY
PRODUCTS HEREINTO IMPROVE RELIABILITY, FUNCTION OR DESIGN. FAIRCHILD DOES NOTASSUMEANYLIABILITY
ARISING OUTOFTHEAPPLICATION OR USE OFANYPRODUCTOR CIRCUITDESCRIBED HEREIN; NEITHER DOES IT
CONVEYANYLICENSE UNDER ITS PATENTRIGHTS, NORTHE RIGHTS OF OTHERS.
LIFE SUPPORT POLICY
FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT
DEVICES OR SYSTEMS WITHOUTTHE EXPRESS WRITTENAPPROVALOF FAIRCHILD SEMICONDUCTOR CORPORATION.
As used herein:
1. Life support devices or systems are devices or
systems which, (a) are intended for surgical implant into
the body, or (b) support or sustain life, or (c) whose
failure to perform when properly used in accordance
with instructions for use provided in the labeling, can be
reasonably expected to result in significant injury to the
user.
2. A critical component is any component of a life
support device or system whose failure to perform can
be reasonably expected to cause the failure of the life
support device or system, or to affect its safety or
effectiveness.
PRODUCT STATUS DEFINITIONS
Definition of Terms
Datasheet Identification
Product Status
Definition
Advance Information
Formative or
In Design
This datasheet contains the design specifications for
product development. Specifications may change in
any manner without notice.
Preliminary
First Production
This datasheet contains preliminary data, and
supplementary data will be published at a later date.
Fairchild Semiconductor reserves the right to make
changes at any time without notice in order to improve
design.
No Identification Needed
Obsolete
Full Production
This datasheet contains final specifications. Fairchild
Semiconductor reserves the right to make changes at
any time without notice in order to improve design.
Not In Production
This datasheet contains specifications on a product
that has been discontinued by Fairchild semiconductor.
The datasheet is printed for reference information only.
Rev. I15
8
www.fairchildsemi.com
FDS6680AS Rev. A (X)
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