AOL1420_08 [AOS]

N-Channel Enhancement Mode Field Effect Transistor; N沟道增强型网络场效晶体管
AOL1420_08
型号: AOL1420_08
厂家: ALPHA & OMEGA SEMICONDUCTORS    ALPHA & OMEGA SEMICONDUCTORS
描述:

N-Channel Enhancement Mode Field Effect Transistor
N沟道增强型网络场效晶体管

晶体 晶体管
文件: 总6页 (文件大小:240K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
AOL1420  
N-Channel Enhancement Mode Field Effect Transistor  
General Description  
Features  
The AOL1420 uses advanced trench technology to  
provide excellent RDS(ON), low gate charge and low  
gate resistance. This device is ideally suited for use  
as a low side switch in CPU core power conversion.  
VDS (V) = 30V  
ID = 85A (VGS = 10V)  
R
R
DS(ON) < 3.7m(VGS = 10V)  
DS(ON) < 5.5m(VGS = 4.5V)  
-RoHS Compliant  
-Halogen and Antimony Free Green Device*  
UIS Tested  
Rg,Ciss,Coss,Crss Tested  
Ultra SO-8TM Top View  
D
S
D
Bottom tab  
connected to  
drain  
G
S
G
Absolute Maximum Ratings TA=25°C unless otherwise noted  
Parameter  
Symbol  
VDS  
Maximum  
30  
Units  
Drain-Source Voltage  
Gate-Source Voltage  
V
V
VGS  
±20  
85  
TC=25°C G  
TC=100°C B  
Continuous Drain  
Current B,G  
ID  
63  
A
Pulsed Drain Current  
IDM  
150  
19  
TA=25°C  
TA=70°C  
Continuous Drain  
Current G  
Avalanche Current C  
IDSM  
IAR  
15  
30  
A
Repetitive avalanche energy L=0.1mHC  
EAR  
112  
100  
50  
mJ  
TC=25°C  
PD  
W
Power Dissipation B  
TC=100°C  
TA=25°C  
2.08  
1.3  
PDSM  
W
Power Dissipation A  
TA=70°C  
Junction and Storage Temperature Range TJ, TSTG  
-55 to 175  
°C  
Thermal Characteristics  
Parameter  
Symbol  
Typ  
Max  
Units  
Maximum Junction-to-Ambient A  
t ≤ 10s  
19.6  
25  
°C/W  
RθJA  
Maximum Junction-to-Ambient A  
Steady-State  
50  
60  
°C/W  
°C/W  
Maximum Junction-to-Case C  
Steady-State  
RθJC  
0.9  
1.5  
Alpha & Omega Semiconductor, Ltd.  
www.aosmd.com  
AOL1420  
Electrical Characteristics (TJ=25°C unless otherwise noted)  
Symbol  
Parameter  
Conditions  
Min  
Typ  
Max Units  
STATIC PARAMETERS  
ID=250µA, VGS=0V  
BVDSS  
Drain-Source Breakdown Voltage  
30  
V
VDS=24V, VGS=0V  
1
IDSS  
Zero Gate Voltage Drain Current  
µA  
5
TJ=55°C  
VDS=0V, VGS= ±20V  
VDS=VGS ID=250µA  
VGS=10V, VDS=5V  
IGSS  
Gate-Body leakage current  
Gate Threshold Voltage  
On state drain current  
100  
3
nA  
V
VGS(th)  
ID(ON)  
1
1.8  
85  
A
V
GS=10V, ID=20A  
2.9  
4.4  
3.7  
5.5  
5.5  
mΩ  
RDS(ON)  
Static Drain-Source On-Resistance  
TJ=125°C  
VGS=4.5V, ID=20A  
DS=5V, ID=20A  
IS=1A,VGS=0V  
4.4  
mΩ  
S
V
gFS  
VSD  
IS  
Forward Transconductance  
Diode Forward Voltage  
106  
0.72  
1
V
Maximum Body-Diode Continuous Current  
85  
A
DYNAMIC PARAMETERS  
Ciss  
Coss  
Crss  
Rg  
Input Capacitance  
3700 4400  
700  
pF  
pF  
pF  
V
GS=0V, VDS=15V, f=1MHz  
Output Capacitance  
Reverse Transfer Capacitance  
Gate resistance  
390  
VGS=0V, VDS=0V, f=1MHz  
0.54  
0.7  
SWITCHING PARAMETERS  
Qg(10V) Total Gate Charge  
Qg(4.5V) Total Gate Charge  
63  
33  
76  
40  
nC  
nC  
nC  
nC  
ns  
V
GS=4.5V, VDS=15V, ID=20A  
Qgs  
Qgd  
tD(on)  
tr  
Gate Source Charge  
8.6  
17.6  
12  
Gate Drain Charge  
Turn-On DelayTime  
Turn-On Rise Time  
VGS=10V, VDS=15V, RL=0.75,  
GEN=3Ω  
15.5  
40  
ns  
R
tD(off)  
tf  
Turn-Off DelayTime  
ns  
Turn-Off Fall Time  
14  
ns  
trr  
IF=20A, dI/dt=100A/µs  
IF=20A, dI/dt=100A/µs  
34  
Body Diode Reverse Recovery Time  
Body Diode Reverse Recovery Charge  
41  
ns  
Qrr  
30  
nC  
A: The value of RθJA is measured with the device in a still air environment with T A =25°C.  
B. The power dissipation PD is based on TJ(MAX)=175°C, using junction-to-case thermal resistance, and is more useful in setting the upper  
dissipation limit for cases where additional heatsinking is used.  
C: Repetitive rating, pulse width limited by junction temperature TJ(MAX)=175°C.  
D. The RθJA is the sum of the thermal impedence from junction to case RθJC and case to ambient.  
E. The static characteristics in Figures 1 to 6 are obtained using <300 µs pulses, duty cycle 0.5% max.  
F. These curves are based on the junction-to-case thermal impedence which is measured with the device mounted to a large heatsink, assuming  
a maximum junction temperature of TJ(MAX)=175°C.  
G. The maximum current rating is limited by bond-wires.  
* This device is guaranteed green after date code 8P11 (June 1ST 2008)  
Rev3: Jun 2008  
THIS PRODUCT HAS BEEN DESIGNED AND QUALIFIED FOR THE CONSUMER MARKET. APPLICATIONS OR USES AS CRITICAL  
COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS ARE NOT AUTHORIZED. AOS DOES NOT ASSUME ANY LIABILITY ARISING  
OUT OF SUCH APPLICATIONS OR USES OF ITS PRODUCTS. AOS RESERVES THE RIGHT TO IMPROVE PRODUCT DESIGN,  
FUNCTIONS AND RELIABILITY WITHOUT NOTICE.  
Alpha & Omega Semiconductor, Ltd.  
www.aosmd.com  
AOL1420  
TYPICAL ELECTRICAL AND THERMAL CHARACTERISTICS  
60  
150  
VDS=5V  
50  
125  
10V  
40  
4.0V  
125°C  
100  
75  
50  
25  
0
30  
20  
10  
0
25°C  
3.5V  
2
VGS=3V  
1.5  
2
2.5  
3
3.5  
4
4.5  
0
1
3
4
5
VGS(Volts)  
V
DS (Volts)  
Figure 2: Transfer Characteristics  
Fig 1: On-Region Characteristics  
8
7
6
5
4
3
1.6  
ID=20A  
1.4  
1.2  
1
VGS=10V  
VGS=4.5V  
VGS=4.5V  
VGS=10V  
2
0
0.8  
10  
20  
30  
D (A)  
40  
50  
60  
0
25  
50  
75  
100  
125  
150  
175  
I
Temperature (°C)  
Figure 3: On-Resistance vs. Drain Current and  
Gate Voltage  
Figure 4: On-Resistance vs. Junction  
Temperature  
8
6
4
2
0
1.0E+02  
1.0E+01  
1.0E+00  
1.0E-01  
1.0E-02  
1.0E-03  
1.0E-04  
1.0E-05  
125°C  
125°C  
25°C  
ID=20A  
25°C  
0.0  
0.2  
0.4  
0.6  
0.8  
1.0  
1.2  
2
4
6
8
10  
VSD (Volts)  
V
GS (Volts)  
Figure 6: Body-Diode Characteristics  
Figure 5: On-Resistance vs. Gate-Source Voltage  
Alpha & Omega Semiconductor, Ltd.  
www.aosmd.com  
AOL1420  
TYPICAL ELECTRICAL AND THERMAL CHARACTERISTICS  
5000  
10  
8
VDS=15V  
ID=20A  
Ciss  
4000  
3000  
2000  
1000  
0
6
4
Coss  
2
Crss  
0
0
10  
20  
30  
Qg (nC)  
Figure 7: Gate-Charge Characteristics  
40  
50  
60  
70  
0
5
10  
15  
VDS (Volts)  
20  
25  
30  
Figure 8: Capacitance Characteristics  
1000  
100  
10  
1000  
800  
600  
400  
200  
0
TJ(Max)=175°C  
TC=25°C  
10µs  
100µs  
RDS(ON)  
limited  
1ms  
10ms  
DC  
TJ(Max)=175°C  
TC=25°C  
1
0.1  
0.0001 0.001 0.01  
0.1  
1
10  
100  
0.1  
1
10  
100  
Pulse Width (s)  
V
DS (Volts)  
Figure 10: Single Pulse Power Rating Junction-to-  
Ambient (Note F)  
Figure 9: Maximum Forward Biased Safe  
Operating Area (Note F)  
10  
D=Ton/T  
J,PK=TC+PDM.ZθJC.RθJC  
RθJA=1.5°C/W  
In descending order  
D=0.5, 0.3, 0.1, 0.05, 0.02, 0.01, single pulse  
T
1
0.1  
0.01  
PD  
Ton  
T
Single Pulse  
0.001  
0.00001  
0.0001  
0.001  
0.01  
Pulse Width (s)  
Figure 11: Normalized Maximum Transient Thermal Impedance (Note F)  
0.1  
1
10  
100  
Alpha & Omega Semiconductor, Ltd.  
www.aosmd.com  
AOL1420  
TYPICAL ELECTRICAL AND THERMAL CHARACTERISTICS  
120  
100  
80  
60  
40  
20  
0
120  
100  
80  
60  
40  
20  
0
TA=25°C  
L ID  
tA  
=
BV VDD  
0.00001  
0.0001  
Time in avalanche, tA (s)  
Figure 12: Single Pulse Avalanche capability  
0.001  
0.01  
0
25  
50  
75  
TCASE (°C)  
Figure 13: Power De-rating (Note B)  
100  
125  
150  
175  
100  
80  
60  
40  
20  
0
100  
80  
60  
40  
20  
0
0.01  
0.1  
1
10  
100  
1000  
0
25  
50  
75  
100  
125  
150  
175  
T
CASE (°C)  
Pulse Width (s)  
Figure 15: Single Pulse Power Rating Junction-to-  
Ambient (Note H)  
Figure 14: Current De-rating (Note B)  
10  
1
In descending order  
D=0.5, 0.3, 0.1, 0.05, 0.02, 0.01, single pulse  
0.1  
D=Ton/T  
D=Ton/T  
0.01  
TJ,PK=TA+PDM.ZθJA.RθJA  
RθJA=60 °C/W  
TJ,PK=TA+PDM.ZθJA.RθJA  
RθJA=60°C/W  
Single Pulse  
0.0001  
0.001  
0.00001  
0.001  
0.01  
0.1  
1
10  
100  
1000  
Pulse Width (s)  
Figure 16: Normalized Maximum Transient Thermal Impedance (Note H)  
Alpha & Omega Semiconductor, Ltd.  
www.aosmd.com  
AOL1420  
Gate Charge Test Circuit &Waveform  
Vgs  
Qg  
10V  
+
VDC  
+
Qgs  
Qgd  
Vds  
VDC  
-
-
DUT  
Vgs  
Vds  
Ig  
Charge  
Resistive Switching Test Circuit & Waveforms  
RL  
Vds  
90%  
10%  
+
DUT  
Vdd  
Vgs  
VDC  
Rg  
-
Vgs  
Vgs  
t d(on)  
t
r
t d(off)  
t
f
t on  
toff  
Unclamped Inductive Switching (UIS) Test Circuit& Waveforms  
L
2
EAR=1/2LI  
AR  
BVDSS  
Vds  
Id  
Vds  
+
Vgs  
Vdd  
IAR  
Vgs  
VDC  
Id  
Rg  
-
DUT  
Vgs  
Vgs  
Diode RecoveryTest Circuit &Waveforms  
Qrr=- Idt  
Vds +  
DUT  
Vgs  
Isd  
Vds -  
Ig  
trr  
L
IF  
Isd  
dI/dt  
+
IRM  
Vdd  
Vgs  
VDC  
Vdd  
-
Vds  
Alpha & Omega Semiconductor, Ltd.  
www.aosmd.com  

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