AO4926 [AOS]

Asymmetric Dual N-Channel Enhancement Mode Field Effect Transistor; 非对称双N沟道增强型场效应晶体管
AO4926
型号: AO4926
厂家: ALPHA & OMEGA SEMICONDUCTORS    ALPHA & OMEGA SEMICONDUCTORS
描述:

Asymmetric Dual N-Channel Enhancement Mode Field Effect Transistor
非对称双N沟道增强型场效应晶体管

晶体 晶体管 场效应晶体管
文件: 总8页 (文件大小:242K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
AO4926  
Asymmetric Dual N-Channel Enhancement Mode Field Effect Transistor  
TM  
SRFET  
Features  
General Description  
FET1  
FET2  
VDS(V) = 30V  
ID=7.3A (VGS = 10V)  
The AO4926 uses advanced trench technology to provide  
excellent R DS(ON) and low gate charge. The two  
MOSFETs make a compact and efficient switch and  
synchronous rectifier combination for use in DC-DC  
converters. A monolithically integrated Schottky diode in  
parallel with the synchronous MOSFET to boost efficiency  
further. Standard Product AO4926 is Pb-free (meets  
ROHS & Sony 259 specifications).  
V
DS (V) = 30V  
ID = 9.5A  
R
DS(ON) < 13.5m<24mΩ  
(VGS = 10V)  
(VGS = 4.5V)  
RDS(ON) < 16mΩ  
<29mΩ  
UIS TESTED!  
Rg,Ciss,Coss,Crss Tested  
SOIC-8  
SRFETTM  
Soft Recovery MOSFET:  
Integrated Schottky Diode  
Absolute Maximum Ratings TA=25°C unless otherwise noted  
Parameter  
Symbol  
Max FET1 Max FET2  
Units  
VDS  
Drain-Source Voltage  
Gate-Source Voltage  
Continuous Drain  
Current AF  
Pulsed Drain Current B  
Avalanche Current B  
30  
±12  
9.5  
7.8  
40  
30  
±12  
7.3  
5.9  
40  
V
V
VGS  
TA=25°C  
TA=70°C  
A
IDSM  
IDM  
A
A
IAR  
22  
12  
Repetitive avalanche energy L=0.3mH B  
EAR  
73  
22  
mJ  
TA=25°C  
2.0  
1.3  
2.0  
1.3  
PDSM  
W
Power Dissipation  
TA=70°C  
TJ, TSTG  
Junction and Storage Temperature Range  
-55 to 150 -55 to 150  
°C  
Thermal Characteristics FET1  
Parameter  
Maximum Junction-to-Ambient A  
Maximum Junction-to-Ambient A  
Maximum Junction-to-Lead C  
Symbol  
Typ  
48  
Max  
62.5  
90  
Units  
°C/W  
°C/W  
°C/W  
t 10s  
RθJA  
Steady-State  
Steady-State  
74  
32  
RθJL  
40  
Thermal Characteristics FET2  
Parameter  
Maximum Junction-to-Ambient A  
Maximum Junction-to-Ambient A  
Maximum Junction-to-Lead C  
Symbol  
Typ  
48  
Max  
62.5  
90  
Units  
°C/W  
°C/W  
°C/W  
t 10s  
RθJA  
Steady-State  
Steady-State  
74  
32  
RθJL  
40  
Alpha & Omega Semiconductor, Ltd.  
www.aosmd.com  
AO4926  
FET1 Electrical Characteristics (TJ=25°C unless otherwise noted)  
Symbol  
Parameter  
Conditions  
Min  
Typ  
Max Units  
STATIC PARAMETERS  
BVDSS  
Drain-Source Breakdown Voltage  
ID=250uA, VGS=0V  
VDS=30V, VGS=0V  
30  
V
0.02  
10  
0.1  
mA  
20  
IDSS  
Zero Gate Voltage Drain Current  
TJ=125°C  
TJ=125°C  
µA  
IGSS  
Gate-Body leakage current  
Gate Threshold Voltage  
On state drain current  
VDS=0V, VGS= ±12V  
VDS=VGS ID=250µA  
VGS=4.5V, VDS=5V  
VGS=10V, ID=9.5A  
0.1  
VGS(th)  
ID(ON)  
1.5  
40  
1.8  
2.4  
V
A
11  
17.1  
13  
13.5  
21.3  
16.0  
mΩ  
mΩ  
RDS(ON)  
Static Drain-Source On-Resistance  
VGS=4.5V, ID=7A  
gFS  
VSD  
IS  
Forward Transconductance  
Diode Forward Voltage  
V
DS=5V, ID=9.5A  
78  
S
V
A
IS=1A,VGS=0V  
0.38  
0.5  
4
Maximum Body-Diode + Schottky Continuous Current  
DYNAMIC PARAMETERS  
Ciss  
Coss  
Crss  
Rg  
Input Capacitance  
1980 2574  
pF  
pF  
pF  
VGS=0V, VDS=15V, f=1MHz  
Output Capacitance  
Reverse Transfer Capacitance  
Gate resistance  
317  
111  
VGS=0V, VDS=0V, f=1MHz  
1.3  
2.0  
SWITCHING PARAMETERS  
Qg(10V)  
Total Gate Charge  
Total Gate Charge  
Gate Source Charge  
Gate Drain Charge  
Turn-On DelayTime  
Turn-On Rise Time  
Turn-Off DelayTime  
Turn-Off Fall Time  
33.0  
15.0  
5.3  
6.0  
5.5  
5.5  
27.0  
4.3  
11  
43  
20  
Qg(4.5V)  
Qgs  
Qgd  
tD(on)  
tr  
nC  
nC  
nC  
ns  
ns  
ns  
ns  
V
GS=10V, VDS=15V, ID=9A  
VGS=10V, VDS=15V, RL=1.6,  
GEN=3Ω  
R
tD(off)  
tf  
trr  
IF=9.5A, dI/dt=300A/µs  
IF=9.5A, dI/dt=300A/µs  
Body Diode Reverse Recovery Time  
Body Diode Reverse Recovery Charge  
13  
ns  
Qrr  
7
nC  
A: The value of RθJA is measured with the device mounted on 1in 2 FR-4 board with 2oz. Copper, in a still air environment with TA=25°C. The  
value in any given application depends on the user's specific board design.  
B: Repetitive rating, pulse width limited by junction temperature TJ(MAX)=150°C.  
C. The R θJA is the sum of the thermal impedence from junction to lead R θJL and lead to ambient.  
D. The static characteristics in Figures 1 to 6 are obtained using <300 µs pulses, duty cycle 0.5% max.  
E. These tests are performed with the device mounted on 1 in 2 FR-4 board with 2oz. Copper, in a still air environment with T A=25°C. The SOA  
curve provides a single pulse rating.  
F. The current rating is based on the t 10s thermal resistance rating.  
Rev1: June 2007  
THIS PRODUCT HAS BEEN DESIGNED AND QUALIFIED FOR THE CONSUMER MARKET. APPLICATIONS OR USES AS CRITICAL  
COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS ARE NOT AUTHORIZED. AOS DOES NOT ASSUME ANY LIABILITY ARISING  
OUT OF SUCH APPLICATIONS OR USES OF ITS PRODUCTS. AOS RESERVES THE RIGHT TO IMPROVE PRODUCT DESIGN,  
FUNCTIONS AND RELIABILITY WITHOUT NOTICE.  
Alpha & Omega Semiconductor, Ltd.  
www.aosmd.com  
AO4926  
FET1 TYPICAL ELECTRICAL AND THERMAL CHARACTERISTICS  
100  
80  
60  
40  
20  
0
30  
25  
20  
15  
10  
5
VDS=5V  
10V  
6V  
4.5V  
VGS=3.5V  
125°  
25°C  
3
0
0
1
2
3
4
5
1
1.5  
2
2.5  
VGS(Volts)  
3.5  
4
VDS (Volts)  
Figure 1: On-Region Characteristics  
Figure 2: Transfer Characteristics  
16  
14  
12  
10  
8
2
VGS=10V  
ID=9.5A  
1.8  
1.6  
1.4  
1.2  
1
VGS=4.5V  
VGS=4.5V  
ID=7A  
VGS=10V  
0.8  
0
5
10  
15  
20  
25  
30  
0
30  
60  
90  
120  
150  
180  
I
D (A)  
Temperature (°C)  
Figure 4: On-Resistance vs. Junction  
Temperature  
Figure 3: On-Resistance vs. Drain Current and  
Gate Voltage  
30  
1.0E+02  
1.0E+01  
1.0E+00  
1.0E-01  
1.0E-02  
1.0E-03  
1.0E-04  
1.0E-05  
ID=9.5A  
125°C  
125°C  
25  
20  
15  
10  
5
25°C  
25°C  
0.0  
0.2  
0.4  
VSD (Volts)  
Figure 6: Body-Diode Characteristics  
0.6  
0.8  
1.0  
2
4
6
8
10  
V
GS (Volts)  
Figure 5: On-Resistance vs. Gate-Source Voltage  
Alpha & Omega Semiconductor, Ltd.  
www.aosmd.com  
AO4926  
FET1 TYPICAL ELECTRICAL AND THERMAL CHARACTERISTICS  
3000  
2500  
2000  
1500  
1000  
500  
10  
8
Ciss  
VDS=15V  
ID=9.5A  
6
4
Crss  
2
Coss  
0
0
0
5
10  
15  
20  
25  
30  
35  
40  
0
5
10  
15  
VDS (Volts)  
20  
25  
30  
Qg (nC)  
Figure 7: Gate-Charge Characteristics  
Figure 8: Capacitance Characteristics  
100.0  
100  
10µs  
90  
80  
70  
60  
50  
40  
30  
20  
10  
0
100µs  
TJ(Max)=150°C  
TA=25°C  
10.0  
RDS(ON)  
10ms  
limited  
1ms  
1.0  
10s  
1s  
DC  
0.1  
TJ(Max)=150°C  
TA=25°C  
0.0  
0.01  
0.1  
1
10  
100  
0.0001 0.001  
0.01  
0.1  
1
10  
100  
V
DS (Volts)  
Pulse Width (s)  
Figure10: Single Pulse Power Rating Junction-to-  
Ambient (Note E)  
Figure 9: Maximum Forward Biased Safe  
Operating Area (Note E)  
10  
1
D=Ton/T  
In descending order  
D=0.5, 0.3, 0.1, 0.05, 0.02, 0.01, single pulse  
TJ,PK=TA+PDM.ZθJA.RθJA  
RθJA=62.5°C/W  
PD  
0.1  
Ton  
T
Single Pulse  
0.01  
0.00001  
0.0001  
0.001  
0.01  
0.1  
1
10  
100  
1000  
Pulse Width (s)  
Figure 11: Normalized Maximum Transient Thermal Impedance (Note E)  
Alpha & Omega Semiconductor, Ltd.  
www.aosmd.com  
AO4926  
FET1 TYPICAL ELECTRICAL AND THERMAL CHARACTERISTICS  
1.0E-01  
1
0.9  
1.0E-02  
20A  
0.8  
VDS=24V  
0.7  
0.6  
0.5  
0.4  
0.3  
0.2  
0.1  
0
1.0E-03  
1.0E-04  
1.0E-05  
1.0E-06  
VDS=12V  
10A  
5A  
IS=1A  
0
50  
100  
Temperature (°C)  
Figure 12: Diode Reverse Leakage Current vs.  
150  
200  
0
50  
100  
150  
200  
Temperature (°C)  
Figure 13: Diode Forward voltage vs. Junction  
Temperature  
Junction Temperature  
25  
20  
15  
10  
5
8
6
4
2
0
15  
2.5  
2
125ºC  
di/dt=800A/us  
di/dt=800A/us  
125ºC  
12  
9
25ºC  
1.5  
1
Qrr  
Irm  
trr  
125ºC  
25ºC  
25ºC  
6
25ºC  
S
3
0.5  
0
125ºC  
0
0
0
5
10  
15  
20  
25  
30  
0
5
10  
15  
20  
25  
30  
Is (A)  
Is (A)  
Figure 15: Diode Reverse Recovery Time and Soft  
Coefficient vs. Conduction Current  
Figure 14: Diode Reverse Recovery Charge and  
Peak Current vs. Conduction Current  
25  
10  
9
8
7
6
5
4
3
2
1
0
18  
15  
12  
9
3
125ºC  
25ºC  
Is=20A  
125ºC  
2.5  
2
20  
15  
10  
5
Is=20A  
25ºC  
1.5  
1
trr  
125º  
25ºC  
25ºC  
6
Qrr  
Irm  
3
0.5  
0
S
125ºC  
0
0
0
200  
400  
600  
800  
1000  
0
200  
400  
600  
800  
1000  
di/dt (A)  
di/dt (A)  
Figure 16: Diode Reverse Recovery Charge and  
Peak Current vs. di/dt  
Figure 17: Diode Reverse Recovery Time and Soft  
Coefficient vs. di/dt  
Alpha & Omega Semiconductor, Ltd.  
www.aosmd.com  
AO4926  
FET2 Electrical Characteristics (TJ=25°C unless otherwise noted)  
Symbol  
Parameter  
Conditions  
Min  
Typ  
Max Units  
STATIC PARAMETERS  
ID=250µA, VGS=0V  
BVDSS  
Drain-Source Breakdown Voltage  
30  
V
V
DS=30V, VGS=0V  
0.002  
1
IDSS  
Zero Gate Voltage Drain Current  
µA  
5
TJ=55°C  
VDS=0V, VGS= ±12V  
IGSS  
Gate-Body leakage current  
Gate Threshold Voltage  
On state drain current  
100  
1.5  
nA  
V
V
V
V
DS=VGS ID=250µA  
GS=4.5V, VDS=5V  
GS=10V, ID=7.3A  
VGS(th)  
ID(ON)  
0.7  
40  
1
A
20  
28  
24  
35  
29  
48  
mΩ  
TJ=125°C  
RDS(ON)  
Static Drain-Source On-Resistance  
VGS=4.5V, ID=6A  
VGS=2.5V, ID=5A  
VDS=5V, ID=7.3A  
IS=1A,VGS=0V  
23.5  
34.7  
26  
mΩ  
mΩ  
S
gFS  
VSD  
IS  
Forward Transconductance  
Diode Forward Voltage  
0.71  
1
V
Maximum Body-Diode Continuous Current  
2.8  
A
DYNAMIC PARAMETERS  
Ciss  
Coss  
Crss  
Rg  
Input Capacitance  
900  
88  
1100  
pF  
pF  
pF  
VGS=0V, VDS=15V, f=1MHz  
Output Capacitance  
Reverse Transfer Capacitance  
Gate resistance  
65  
VGS=0V, VDS=0V, f=1MHz  
0.95  
1.5  
12  
SWITCHING PARAMETERS  
Qg  
Qgs  
Qgd  
tD(on)  
tr  
Total Gate Charge  
Gate Source Charge  
Gate Drain Charge  
Turn-On DelayTime  
Turn-On Rise Time  
Turn-Off DelayTime  
Turn-Off Fall Time  
10  
1.8  
3.75  
3.2  
3.5  
21.5  
2.7  
16.8  
8
nC  
nC  
nC  
ns  
ns  
ns  
ns  
VGS=4.5V, VDS=15V, ID=7.3A  
V
GS=10V, VDS=15V, RL=2,  
RGEN=6Ω  
tD(off)  
tf  
trr  
IF=7.3A, dI/dt=100A/µs  
IF=7.3A, dI/dt=100A/µs  
21  
Body Diode Reverse Recovery Time  
Body Diode Reverse Recovery Charge  
ns  
Qrr  
nC  
A: The value of R θJA is measured with the device mounted on 1in 2 FR-4 board with 2oz. Copper, in a still air environment with T A=25°C. The  
value in any given application depends on the user's specific board design. The current rating is based on the t ≤ 10s thermal resistance rating.  
B: Repetitive rating, pulse width limited by junction temperature.  
C. The R θJA is the sum of the thermal impedence from junction to lead R θJL and lead to ambient.  
D. The static characteristics in Figures 1 to 6 are obtained using <300 µs pulses, duty cycle 0.5% max.  
E. These tests are performed with the device mounted on 1 in 2 FR-4 board with 2oz. Copper, in a still air environment with T A=25°C. The SOA  
curve provides a single pulse rating.  
Rev 1: June 2007  
THIS PRODUCT HAS BEEN DESIGNED AND QUALIFIED FOR THE CONSUMER MARKET. APPLICATIONS OR USES AS CRITICAL  
COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS ARE NOT AUTHORIZED. AOS DOES NOT ASSUME ANY LIABILITY ARISING  
OUT OF SUCH APPLICATIONS OR USES OF ITS PRODUCTS. AOS RESERVES THE RIGHT TO IMPROVE PRODUCT DESIGN,  
FUNCTIONS AND RELIABILITY WITHOUT NOTICE.  
Alpha & Omega Semiconductor, Ltd.  
www.aosmd.com  
AO4926  
FET2 TYPICAL ELECTRICAL AND THERMAL CHARACTERISTICS  
60  
50  
40  
30  
20  
10  
0
20  
16  
12  
8
10V  
VDS=5V  
4.5V  
3V  
125°C  
2.5V  
25°C  
4
VGS=2V  
0
0
1
2
3
4
5
0
0.5  
1
1.5  
2
2.5  
3
V
DS (Volts)  
VGS(Volts)  
Figure 1: On-Region Characteristics  
Figure 2: Transfer Characteristics  
30  
25  
20  
15  
1.8  
1.5  
1.2  
0.9  
0.6  
ID=6A  
VGS=4.5V  
V
GS=4.5V  
VGS=10V  
ID=7.3A  
VGS=10V  
0
5
10  
15  
20  
-50 -25  
0
25 50 75 100 125 150 175  
ID (A)  
Temperature (°C)  
Figure 3: On-Resistance vs. Drain Current and  
Gate Voltage  
Figure 4: On-Resistance vs. Junction  
Temperature  
60  
1.0E+01  
1.0E+00  
1.0E-01  
1.0E-02  
1.0E-03  
55  
50  
45  
40  
35  
30  
ID=7.3A  
125°C  
125°C  
25°C
25  
20  
1.0E-04  
1.0E-05  
25°C
15  
1.0E-06  
10  
0.0  
0.2  
0.4  
0.6  
0.8  
1.0  
1.2  
0
2
4
6
8
10  
V
SD (Volts)  
VGS (Volts)  
Figure 5: On-Resistance vs. Gate-Source Voltage  
Figure 6: Body-Diode Characteristics  
Alpha & Omega Semiconductor, Ltd.  
www.aosmd.com  
AO4926  
FET2 TYPICAL ELECTRICAL AND THERMAL CHARACTERISTICS  
1400  
1200  
1000  
800  
600  
400  
200  
0
5
4
3
2
1
0
VDS=15V  
ID=7.3A  
Ciss  
Crss  
Coss  
0
2
4
6
8
10  
12  
0
5
10  
15  
DS (Volts)  
20  
25  
30  
Qg (nC)  
Figure 7: Gate-Charge Characteristics  
V
Figure 8: Capacitance Characteristics  
100.00  
10.00  
1.00  
50  
10µs  
TJ(Max)=150°C  
TA=25°C  
100µs  
40  
30  
20  
10  
0
RDS(ON)  
limited  
1ms  
1s  
10s  
DC  
0.10  
TJ(Max)=150°C  
TA=25°C  
0.01  
0.0001 0.001 0.01  
0.1  
1
10  
100  
1000  
0.01  
0.1  
1
10  
100  
Pulse Width (s)  
V
DS (Volts)  
Figure 10: Single Pulse Power Rating Junction-to-  
Ambient (Note E)  
Figure 9: Maximum Forward Biased Safe  
Operating Area (Note E)  
10  
In descending order  
D=0.5, 0.3, 0.1, 0.05, 0.02, 0.01, single pulse  
1
0.1  
P
D
D=Ton/T  
G  
0.01  
TJ,PK=TA+PDM.ZθJA.RθJA  
Ton  
RθJA=62.5°C/W  
T
Single Pulse  
0.001  
0.00001  
0.0001  
0.001  
0.01  
0.1  
1
10  
100  
1000  
Pulse Width (s)  
Figure 11: Normalized Maximum Transient Thermal Impedance (Note E)  
Alpha & Omega Semiconductor, Ltd.  
www.aosmd.com  

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