AD768ARCHIPS [ADI]

暂无描述;
AD768ARCHIPS
型号: AD768ARCHIPS
厂家: ADI    ADI
描述:

暂无描述

转换器
文件: 总20页 (文件大小:336K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
16-Bit, 30 MSPS  
D/A Converter  
a
AD768  
FUNCTIO NAL BLO CK D IAGRAM  
FEATURES  
30 MSPS Update Rate  
16-Bit Resolution  
Linearity: 1/ 2 LSB DNL @ 14 Bits  
1 LSB INL @ 14 Bits  
Fast Settling: 25 ns Full-Scale Settling to 0.025%  
SFDR @ 1 MHz Output: 86 dBc  
THD @ 1 MHz Output: 71 dBc  
Low Glitch Im pulse: 35 pV-s  
Pow er Dissipation: 465 m W  
On-Chip 2.5 V Reference  
V
DD  
DCOM  
(MSB)  
DB15  
AD768  
MSBs: SEGMENTED  
CURRENT SOURCES  
AND SWITCHES  
MSB  
DECODER  
AND  
EDGE-  
TRIGGERED  
BIT  
LSBs:  
IOUTA  
IOUTB  
CURRENT SOURCES,  
SWITCHES, AND  
1kR-2R  
1k  
1k  
LADDERS  
LATCHES  
LADCOM  
Edge-Triggered Latches  
Multiplying Reference Capability  
2.5V  
BANDGAP  
REFERENCE  
CONTROL  
AMP  
V
EE  
DB0  
APPLICATIONS  
(LSB)  
Arbitrary Waveform Generation  
Com m unications Waveform Reconstruction  
Vector Stroke Display  
NR  
CLOCK  
IREFIN  
NC REFCOM REFOUT  
P RO D UCT D ESCRIP TIO N  
P RO D UCT H IGH LIGH TS  
T he AD768 is a 16-bit, high speed digital-to-analog converter  
(DAC) that offers exceptional ac and dc performance. T he  
AD768 is manufactured on ADI’s Advanced Bipolar CMOS  
(ABCMOS) process, combining the speed of bipolar transistors,  
the accuracy of laser-trimmable thin film resistors, and the effi-  
ciency of CMOS logic. A segmented current source architecture  
is combined with a proprietary switching technique to reduce  
glitch energy and maximize dynamic accuracy. Edge triggered  
input latches and a temperature compensated bandgap reference  
have been integrated to provide a complete monolithic DAC  
solution.  
1. T he low glitch and fast settling time provide outstanding  
dynamic performance for waveform reconstruction or digital  
synthesis requirements, including communications.  
2. T he excellent dc accuracy of the AD768 makes it suitable for  
high speed A/D conversion applications.  
3. On-chip, edge-triggered input CMOS latches interface  
readily to CMOS logic families. T he AD768 can support up-  
date rates up to 40 MSPS.  
4. A temperature compensated, 2.5 V bandgap reference is  
included on-chip allowing for generation of the reference  
input current with the use of a single external resistor. An ex-  
ternal reference may also be used.  
T he AD768 is a current-output DAC with a nominal full-scale  
output current of 20 mA and a 1 koutput impedance. Differ-  
ential current outputs are provided to support single-ended  
or differential applications. T he current outputs may be tied  
directly to an output resistor to provide a voltage output, or fed  
to the summing junction of a high speed amplifier to provide a  
buffered voltage output. Also, the differential outputs may be  
interfaced to a transformer or differential amplifier.  
5. T he current output(s) of the AD768 may be used singly or  
differentially, either into a load resistor, external op amp  
summing junction or transformer.  
6. Proper selection of an external resistor and compensation  
capacitor allow the performance-conscious user to optimize  
the AD768 reference level and bandwidth for the target  
application.  
T he on-chip reference and control amplifier are configured for  
maximum accuracy and flexibility. T he AD768 can be driven by  
the on-chip reference or by a variety of external reference volt-  
ages based on the selection of an external resistor. An external  
capacitor allows the user to optimally trade off reference band-  
width and noise performance.  
T he AD768 operates on ±5 V supplies, typically consuming  
465 mW of power. T he AD768 is available in a 28-pin SOIC  
package and is specified for operation over the industrial tem-  
perature range.  
REV. B  
Inform ation furnished by Analog Devices is believed to be accurate and  
reliable. However, no responsibility is assum ed by Analog Devices for its  
use, nor for any infringem ents of patents or other rights of third parties  
which m ay result from its use. No license is granted by im plication or  
otherwise under any patent or patent rights of Analog Devices.  
© Analog Devices, Inc., 1996  
One Technology Way, P.O. Box 9106, Norw ood, MA 02062-9106, U.S.A.  
Tel: 617/ 329-4700  
Fax: 617/ 326-8703  
(T to TMAX , V = +5.0 V, V = 5.0 V, LADCOM, REFCOM, DCOM = 0 V, IREFIN = 5 mA,  
MIN  
DD  
EE  
CLOCK = 10 MHz, unless otherwise noted)  
AD768–SPECIFICATIONS  
P aram eter  
Min  
Typ  
Max  
Units  
RESOLUT ION  
16  
Bits  
DC ACCURACY1  
Linearity Error  
TA = +25°C  
TMIN to TMAX  
Differential Nonlinearity  
–8  
–8  
±4  
±2  
+8  
+8  
LSB  
LSB  
TA = +25°C  
TMIN to TMAX  
–6  
–8  
+6  
+8  
LSB  
LSB  
Monotonicity (13-Bit)  
GUARANT EED OVER RAT ED SPECIFICAT ION T EMPERAT URE RANGE  
ANALOG OUT PUT  
Offset Error  
–0.2  
–1.0  
+0.2  
+1.0  
% of FSR  
% of FSR  
mA  
V
kΩ  
pF  
Gain Error  
Full-Scale Output Current2  
Output Compliance Range  
Output Resistance  
Output Capacitance  
20  
–1.2  
0.8  
+5.0  
1.2  
1.0  
3
REFERENCE OUT PUT  
Reference Voltage  
2.475  
1
2.5  
+5.0  
2.525  
+15  
V
mA  
Reference Output Current3  
REFERENCE INPUT  
Reference Input Current  
5
7
mA  
Reference Bandwidth4  
Small Signal, IREF = 5 mA ± 0.1 mA  
Large Signal, IREF = 4 mA ± 2 mA  
28  
9
MHz  
MHz  
T EMPERAT URE COEFFICIENT S  
Unipolar Offset Drift  
Gain Drift5  
–5  
+5  
ppm of FSR/oC  
ppm of FSR/oC  
ppm of FSR/oC  
ppm/oC  
–20  
–40  
–30  
+20  
+40  
+30  
Gain Drift6  
Reference Voltage Drift  
DYNAMIC PERFORMANCE7  
Maximum Output Update Rate  
Output Settling T ime (tST) (to 0.025%)  
30  
40  
25  
10  
35  
5
5
3
MSPS  
ns  
ns  
pV-s  
ns  
ns  
nV/Hz  
%
Degree  
35  
Output Propagation Delay (tPD  
Glitch Impulse  
)
Output Rise T ime (10% to 90%)  
Output Fall T ime (10% to 90%)  
Output Noise (DB0–DB15 High, into 50 )  
Differential Gain Error  
0.01  
0.01  
Differential Phase Error  
DIGIT AL INPUT S  
Logic “1” Voltage  
Logic “0” Voltage  
Logic “1” Current  
Logic “0” Current  
Input Capacitance  
Input Setup T ime (tS)  
Input Hold T ime (tH)  
3.5  
V
V
1.5  
+10  
+10  
–10  
–10  
µA  
µA  
pF  
ns  
ns  
ns  
10  
10  
5
10  
Latch Pulse Width (tLPW  
)
AC LINEARIT Y7  
Spurious-Free Dynamic Range (SFDR Within a Window)  
FOUT = 1.002 MHz; CLOCK = 10 MHz; 2 MHz Span  
FOUT = 1.002 MHz; CLOCK = 20 MHz; 2 MHz Span  
FOUT = 5.002 MHz; CLOCK = 30 MHz; 10 MHz Span  
Spurious-Free Dynamic Range (SFDR to Nyquist)  
FOUT = 1.002 MHz; CLOCK = 10 MHz  
86  
85  
78  
79  
dB  
dB  
dB  
74  
73  
67  
70  
dB  
dB  
dB  
FOUT = 1.002 MHz; CLOCK = 20 MHz  
FOUT = 5.002 MHz; CLOCK = 30 MHz  
T otal Harmonic Distortion (T HD)  
FOUT = 1.002 MHz; CLOCK = 10 MHz  
FOUT = 1.002 MHz; CLOCK = 20 MHz  
FOUT = 5.002 MHz; CLOCK = 30 MHz  
–71  
–66  
–61  
–68  
dB  
dB  
dB  
–2–  
REV. B  
AD768  
P aram eter  
Min  
Typ  
Max  
Units  
POWER SUPPLY  
Positive Voltage Range  
4.75  
–5.25  
5
5.25  
–4.75  
40  
73  
600  
+0.2  
V
V
mA  
mA  
mW  
Negative Voltage Range  
Positive Supply Current  
Negative Supply Current  
Nominal Power Dissipation  
Power Supply Rejection Ratio (PSRR)  
–5  
30  
63  
465  
–0.2  
–40  
% of FSR/V  
OPERAT ING RANGE  
+85  
°C  
NOT ES  
1Measured at IOUT A, driving a virtual ground.  
2Nominal FS output current is 4× the current at IREFIN. T herefore, nominal FS current is 20 mA when IREFIN = 5 mA.  
3Output current is defined as total current available for IREFIN and any external load.  
4Reference bandwidth is a function of external cap at NR pin. Refer to compensation section of data sheet for details.  
5Excludes internal reference drift.  
6Includes internal reference drift.  
7Measured as unbuffered voltage output (1 V range) with FS current into 50 load at IOUT B.  
Specifications subject to change without notice.  
ABSO LUTE MAXIMUM RATINGS*  
P aram eter  
with Respect to  
Min Max  
Units  
Positive Supply Voltage (VDD  
Negative Supply Voltage (VEE  
)
)
DCOM, REFCOM, LADCOM 0.5 +6.0  
DCOM, REFCOM, LADCOM 6.0 +0.5  
V
V
Analog-to-Other Grounds (REFCOM) DCOM, LADCOM  
–0.5 +0.5  
–0.5 +0.5  
V
V
V
Digital-to-Other Grounds (DCOM)  
Reference Output (REFOUT )  
LADCOM, REFCOM  
REFCOM  
VDD + 0.5  
Reference Input Current (IREFIN)  
Digital Inputs (DB0–DB15, CLOCK) DCOM  
Analog Outputs (IOUT A, IOUT B)  
Maximum Junction T emperature  
Storage T emperature  
+7.5  
–0.5 VDD + 0.5  
–2.0 +5.0  
+150  
mA  
V
V
°C  
°C  
°C  
LADCOM  
–65  
+150  
+300  
Lead T emperature  
*Stresses above those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. T his is a stress  
rating only and functional operation of the device at these or any other conditions above those indicated in the operational  
sections of this specification is not implied. Exposure to absolute maximum rating for extended periods may affect device  
reliability.  
DB0–DB15  
O RD ERING GUID E  
tS  
tH  
P ackage  
O ption  
CLOCK  
Model  
P ackage D escription  
tLPW  
tPD  
AD768AR  
AD768ACHIPS  
AD768-EB  
28-Pin 300 mil SOIC  
Die  
AD768 Evaluation Board  
R-28  
tST  
0.025%  
IOUTA  
OR  
IOUTB  
0.025%  
Tim ing Diagram  
CAUTIO N  
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily  
accumulate on the human body and test equipment and can discharge without detection.  
Although the AD768 features proprietary ESD protection circuitry, permanent damage may  
occur on devices subjected to high energy electrostatic discharges. T herefore, proper ESD  
precautions are recommended to avoid performance degradation or loss of functionality.  
WARNING!  
ESD SENSITIVE DEVICE  
REV. B  
–3–  
AD768  
1
(T = +25؇C, V = +5.0 V, V = 5.0 V, IREFIN = 5 mA, unless otherwise noted)  
WAFER TEST LIMITS  
A
DD  
EE  
P aram eter  
AD 768ACH IP S Lim it  
Units  
Integral Nonlinearity2  
Differential Nonlinearity2  
Offset Error  
±8  
±6  
±0.2  
±1.0  
±1.0  
40  
LSB max  
LSB max  
% FSR max  
% FSR max  
% of nom. 2.5 V max  
mA max  
Gain Error  
Reference Voltage  
Positive Supply Current  
Negative Supply Current  
Power Dissipation  
73  
600  
mA max  
mW max  
NOT ES  
1Electrical test are performed at wafer probe to the limits shown. Due to variations in assembly methods and normal  
yield loss, yield after packaging is not guaranteed for standard product dice.  
2Limits extrapolated from testing of individual bit errors.  
3Die offers latch control pad. Edge triggered latches become level triggered when latch control and clock pads are high.  
4Die substrate is connected to VEE.  
P IN D ESCRIP TIO NS  
P in No.  
Sym bol  
Type  
Nam e and Function  
1
2
3
4
5
6
7
IOUT A  
NR  
REFOUT  
NC  
REFCOM  
IREFIN  
DB0  
DB1–DB7  
DCOM  
CLOCK  
DB8–DB14  
DB15  
AO  
AI  
AO  
NC  
P
AI  
DI  
DI  
P
DI  
DI  
DI  
P
DAC Current Output. Full-scale current when all data bits are 1s.  
Noise Reduction Node. Add capacitor for noise reduction.  
Reference Output Voltage. Nominal value is 2.5 V.  
No Connect. Reserved for internal use.  
Reference Ground.  
Reference Input Current. Nominal is 5 mA. DAC full-scale is 4× this current.  
Data Bit 0 (LSB).  
Data Bits 1–7.  
8–14  
15  
16  
17–23  
24  
25  
26  
27  
28  
Digital Ground.  
Clock Input. Data latched on positive edge of clock.  
Data Bits 8–14.  
Data Bit 15 (MSB).  
VDD  
VEE  
IOUT B  
LADCOM  
Positive Supply Voltage. Nominal is +5 V.  
Negative Supply Voltage. Nominal is –5 V.  
Complementary DAC Current Output. Full-scale current when all data bits are 0s.  
DAC Ladder Common.  
P
AO  
P
T ype: AI = Analog Input; DI = Digital Input; AO = Analog Output; P = Power.  
D ICE CH ARACTERISTICS3, 4  
P IN CO NFIGURATIO N  
V
V
DD  
DB15  
DB14 DB13 DB12 DB11 DB10  
DD  
LADCOM  
IOUTB  
IOUTA  
NR  
1
2
28  
27  
26  
25  
24  
23  
22  
21  
20  
19  
18  
17  
16  
15  
DB9  
DB8  
V
V
EE  
REFOUT  
NC  
3
V
V
(–5V)  
(+5V)  
EE  
EE  
4
DD  
REFCOM  
IREFIN  
(LSB) DB0  
DB15 (MSB)  
5
IOUTB  
CLOCK  
6
DB14  
DB13  
DB12  
AD768  
TOP VIEW  
(Not to Scale)  
LATCH CONTROL  
DCOM  
7
LADCOM  
IOUTA  
8
DB1  
DB2  
DB3  
9
DB11  
DB10  
DB9  
DB7  
DB6  
DB5  
NR  
10  
11  
12  
13  
14  
DB4  
DB5  
DB6  
DB7  
REFOUT  
DB8  
NC  
CLOCK  
DCOM  
REFCOM IREFIN  
DB0  
DB1  
DB2  
DB3 DB4  
NC = NO CONNECT  
Die Size:  
0.1106 × 0.1417 inch, 15,672 sq. m ils  
(2.81 × 3.60 m m , 10.116 sq. m m )  
–4–  
REV. B  
AD768  
D EFINITIO NS O F SP ECIFICATIO NS  
Tem per atur e D r ift  
Linear ity Er r or (Also Called Integr al Nonlinear ity or INL)  
Linearity error is defined as the maximum deviation of the ac-  
tual analog output from the ideal output, determined by a  
straight line drawn from zero to full scale.  
T emperature drift is specified as the maximum change from the  
ambient (+25°C) value to the value at either TMIN or TMAX. For  
offset and gain drift, the drift is reported in ppm of full-scale  
range (FSR) per degree C. For reference drift, the drift is re-  
ported in ppm per degree C.  
D iffer ential Nonlinear ity (or D NL)  
DNL is the measure of the variation in analog value, normalized  
to full scale, associated with a 1 LSB change in digital input code.  
P ower Supply Rejection  
T he maximum change in the full-scale output as the supplies  
are varied from nominal to minimum and maximum specified  
voltages.  
Monotonicity  
A D/A converter is monotonic if the output either increases or  
remains constant as the digital input increases.  
Settling Tim e  
T he time required for the output to reach and remain within a  
specified error band about its final value, measured from the  
start of the output transition.  
O ffset Er r or  
T he deviation of the output current from the ideal of zero is  
called offset error. For IOUT A, 0 mA output is expected when  
the inputs are all 0s. For IOUT B, 0 mA output is expected  
when all inputs are set to 1s.  
Spur ious-Fr ee D ynam ic Range  
T he difference, in dB, between the rms amplitude of the  
input signal and the peak spurious signal over the specified  
bandwidth.  
Gain Er r or  
T he difference between the actual and ideal output span. T he  
actual span is determined by the output when all inputs are set  
to 1s minus the output when all inputs are set to 0s. T he ideal  
output current span is 4× the current applied to the IREFIN pin.  
Total H ar m onic D istor tion  
T HD is the ratio of the rms sum of the first six harmonic com-  
ponents to the rms value of the measured input signal. It is ex-  
pressed as a percentage or in decibels (dB).  
O utput Com pliance Range  
T he range of allowable voltage at the output of a current-output  
DAC. Operation beyond the maximum compliance limits may  
cause either output stage saturation or breakdown, resulting in  
nonlinear performance.  
Glitch Im pulse  
Asymmetrical switching times in a DAC give rise to undesired  
output transients which are quantified by a glitch impulse. It is  
specified as the net area of the glitch in pV-sec.  
C
REFCOMP  
R
500Ω  
REF  
1µF  
4
3
6
NC  
REFOUT  
REFIN  
IOUTA  
V
1
IOUTA  
DD  
+2.5V REF  
25  
+5V  
5mA  
IOUTB  
27  
IOUTB  
LOAD  
1µF  
1µF  
REFCOM  
NR  
R
R
1kΩ  
5
2
LAD  
1kΩ  
R
LAD  
50Ω  
1µF  
50Ω  
LADCOM  
28  
C
V
NR  
EE  
26  
15  
–5V  
SEGMENTED  
CURRENT  
SOURCES  
DCOM  
AD768  
CURRENT SOURCES  
AND R-2R LADDER  
CLOCK  
MSB DECODE  
& LATCHES  
CLOCK  
16  
LATCHES – LOWER 12 BITS  
24  
23  
22  
21  
20  
19 18  
17  
14  
13 12  
11 10  
9
8
7
Figure 1. Functional Block Diagram and Basic Hookup  
FUNCTIO NAL D ESCRIP TIO N  
T he digital interface offers CMOS compatible edge-triggered  
input latches that interface readily to CMOS logic and supports  
clock rates up to 40 MSPS. A temperature compensated 2.5 V  
bandgap reference is integrated on-chip to drive the AD768 ref-  
erence input current with the use of a single external resistor.  
T he functional block diagram in Figure 1 is a simple representa-  
tion of the internal circuitry to aid the understanding of the  
AD768s operation. T he DAC transfer function is described,  
and followed by a detailed description of each key portion of the  
circuit. T ypical circuit configurations are shown in the section  
APPLYING T HE AD768.  
T he AD768 is a current-output DAC with a nominal full-scale  
current of 20 mA and a 1 koutput impedance. Differential  
outputs are provided to support single-ended or differential  
applications. T he DAC architecture combines segmented cur-  
rent sources for the top four bits (MSBs) and a 1 kR-2R lad-  
der for the lower 12 bits (LSBs). T he DAC current sources are  
implemented with laser-trimmable thin film resistors for excel-  
lent dc linearity. A proprietary switching technique is utilized to  
reduce glitch energy and maximize dynamic accuracy.  
REV. B  
–5–  
AD768  
D AC TRANSFER FUNCTIO N  
550  
500  
450  
400  
350  
300  
T he AD768 may be used in either current-output mode with the  
output connected to a virtual ground, or voltage-output mode  
with the output connected to a resistive load.  
In current output mode,  
IOUT = (DAC CODE/65536) × (IREFIN × 4)  
In voltage output mode,  
VOUT = IOUT × RLOADʈRLAD  
where:  
DAC CODE is the decimal representation of the DAC inputs;  
an integer between 0 and 65535.  
IREFIN is the current applied at the IREFIN pin, determined by  
1.0  
2.0  
3.0  
4.0  
– mA  
5.0  
6.0  
7.0  
VREF/RREF  
.
I
REFIN  
Substituting for IOUT and IREFIN  
,
Figure 3. Power Dissipation vs. IREFIN Current  
VOUT = –VREF × (DAC CODE/65536) × 4 × [(RLOADʈRLAD)/RREF  
]
Note the AD768 is optimized for operation at an input current  
of 5 mA. Both linearity and dynamic performance at other input  
currents may be somewhat degraded. Figure 4 shows typical dc  
linearity over a range of input currents. Figure 5 shows typical  
SFDR (to Nyquist) performance over a range of input currents  
and CLOCK input rates for a 1 MHz output frequency.  
T hese equations clarify an important aspect of the AD768  
transfer function; the full-scale current output of the DAC is  
proportional to a current input. T he voltage output is then a  
function of the ratio of (RLOADʈRLAD)/RREF, allowing for cancel-  
lation of resistor drift by selection of resistors with matched  
characteristics.  
10  
9
REFERENCE INP UT  
T he IREFIN pin is a current input node with low impedance to  
REFCOM. T his input current sets the magnitude of the DAC  
current sources such that the full-scale output current is exactly  
four times the current applied at IREFIN. For the nominal in-  
put current of 5 mA, the nominal full-scale output current is  
20 mA.  
8
7
6
5
INL  
T he 5 mA reference input current can be generated from the  
on-chip 2.5 V reference with an external resistor of 500 from  
REFOUT to IREFIN. If desired, a variety of external reference  
voltages may be used based on the selection of an appropriate  
resistor. However, to maintain stability of the reference ampli-  
fier, the external impedance at IREFIN must be kept below  
1 k.  
4
3
2
DNL  
1
0
1.0  
2.0  
3.0  
4.0  
– mA  
5.0  
6.0  
7.0  
I
REFIN  
5
6
REFCOM  
IREFIN  
Figure 4. INL/DNL vs. IREFIN Current  
–85  
–80  
–75  
–70  
–65  
IFB  
5mA  
CLOCK = 10 MSPS  
CLOCK = 20 MSPS  
V
V
EE  
EE  
Figure 2. Equivalent Reference Input Circuit  
T he IREFIN current can be varied from 1 mA to 7 mA which  
subsequently will result in a proportional change in the DAC  
full-scale. Since the operating currents within the DAC vary  
with IREFIN, so does the power dissipation. Figure 3 illustrates  
that relationship.  
CLOCK = 30 MSPS  
CLOCK = 40 MSPS  
–60  
–55  
1.0  
2.0  
3.0  
4.0  
– mA  
5.0  
6.0  
7.0  
I
REFIN  
Figure 5. SFDR (to Nyquist) vs. IREFIN @ FOUT = 1 MHz  
–6–  
REV. B  
AD768  
REFERENCE O UTP UT  
100M  
10M  
T he internal 2.5 V bandgap reference is provided for generation  
of the IREFIN current, and must be compensated externally with  
a capacitor of 0.1 µF or greater from REFOUT to REFCOM. If  
an external reference is used, REFOUT should be tied directly  
to the positive supply voltage, VDD. T his effectively turns off the  
internal reference, eliminating the need for the external capaci-  
tor at REFOUT . T he reference is specified to drive a nominal  
load of 5 mA with a maximum of 15 mA. Operation with a  
heavier load will result in degradation of supply rejection and  
reference voltage accuracy. T herefore, the reference output  
should be buffered with an amplifier when additional load cur-  
rent is required. A properly sized pull-up resistor can also be  
used to source additional current to the load. T he resistors value  
should be selected such that REFOUT will always source a  
minimum of 5 mA to IREFIN and the additional load.  
1M  
100k  
10k  
1k  
10p  
100p  
1n  
10n  
100n  
1µ  
NOISE REDUCTION CAPACITOR – F  
Figure 7. External Noise Reduction Capacitor vs. –3 dB  
Bandwidth  
AD768  
IREFIN  
500Ω  
6
3
T he sensitivity of the NR node requires that care be taken in  
capacitor placement. T he capacitor should be located as physi-  
cally close to the package pins as possible and lead lengths  
should be minimized. For this purpose, the use of a chip  
capacitor is recommended. For applications that do not require  
high frequency modulation at IREFIN, it is recommended that  
REFOUT  
C
REFCOMP  
1µF  
5
REFCOM  
a capacitor on the order of 1 µF be connected from NR to VEE  
.
Figure 6. Typical Reference Hookup  
TEMP ERATURE CO NSID ERATIO NS  
If the reference input is purely dc, noise may be minimized with  
multiple capacitors, such as 1 µF and 0.1 µF, to more effectively  
filter both high and low frequency disturbances.  
Note that the reference plays a key role in the overall tempera-  
ture performance of the AD768. Any drift of IREFIN shows up  
directly in IOUT . When the output is taken as a current, the drift  
of IREFIN (which depends on both VREF and RREF) must be mini-  
mized. T his can be done by using the internal temperature com-  
pensated reference for VREF and a low temperature coefficient  
resistor for RREF. If the output is taken as a voltage, it is a func-  
tion of a resistor ratio, not an absolute resistor value. By select-  
ing resistors with matched temperature coefficients for RREF  
and RLOAD, the drift in the resistor values will cancel, providing  
optimal drift performance.  
ANALO G O UTP UTS  
T he AD768 offers two analog outputs; IOUT A is trimmed for  
optimal INL and DNL performance and has a full-scale output  
when all bits are high. For applications that require the specified  
dc accuracy, IOUT A should be used. IOUT B is the comple-  
mentary output with full-scale output when all bits are low.  
Both IOUT A and IOUT B provide similar dynamic perfor-  
mance. Refer to Figures 8 and 9 for typical INL and DNL per-  
formance curves. T he outputs can also be used differentially.  
Refer to the section “Applying the AD768” for examples of vari-  
ous output configurations.  
REFERENCE NO ISE RED UCTIO N AND MULTIP LYING  
BAND WID TH  
8
6
For application flexibility and multiplying capabilities, the refer-  
ence amplifier is designed to offer adjustable bandwidth that can  
be reduced by connecting an external capacitor from the NR  
node to the negative supply pin, VEE. T his capacitor limits the  
bandwidth and acts as a filter to reduce the noise contribution  
from the reference amplifier.  
4
2
0
T he noise reduction capacitor, CNR, is not required for stability  
and does not affect the settling time of the DAC output. With-  
out this capacitor, the IREFIN bandwidth is 15 MHz allowing  
high frequency modulation of the DAC full-scale range through  
the reference input node. Figure 7 shows the relationship be-  
tween the external noise reduction capacitor and the –3 dB  
bandwidth of the reference amplifier.  
–2  
–4  
–6  
–8  
0
5
10 15 20 25 30 35 40 45 50 55 60 65  
DIGITAL INPUT CODE – k  
Figure 8. Typical INL Perform ance  
REV. B  
–7–  
AD768  
8
6
LADCOM  
28  
IOUTB  
27  
IOUTA  
1
1kΩ  
1kΩ  
4
3pF  
3pF  
2
I
I
OUT  
OUT  
IREFIN  
x2.75  
0
26  
–2  
–4  
–6  
–8  
V
EE  
Figure 10. Equivalent Analog Output Circuit  
D IGITAL INP UTS  
0
5
10 15 20 25 30 35 40 45 50 55 60 65  
DIGITAL INPUT CODE – k  
T he AD768 digital inputs consist of 16 data input pins and a  
clock pin. T he 16-bit parallel data inputs follow standard posi-  
tive binary coding, where DB15 is the most significant bit  
(MSB) and DB0 is the least significant bit (LSB). IOUT A pro-  
duces full-scale output current when all data bits are at logic 1.  
IOUT B is the complementary output, with full-scale when all  
data bits are at logic 0. T he full-scale current is split between  
the two outputs as a function of the input code.  
Figure 9. Typical DNL Perform ance  
T he outputs have a compliance range of –1.2 V to +5.0 V with  
respect to LADCOM. T he current steering output stages will  
remain functional over this range. Operation beyond the maxi-  
mum compliance limits may cause either output stage saturation  
or breakdown, resulting in nonlinear performance. T he rated dc  
and ac performance specifications are for an output voltage of  
0 V to –1 V.  
T he digital interface is implemented using an edge-triggered  
master slave latch. T he DAC output is updated following the  
rising edge of the clock, and is designed to support a clock rate  
as high as 40 MSPS. T he clock can be operated at any duty  
cycle that meets the specified minimum latch pulse width. T he  
setup and hold times can also be varied within the clock cycle as  
long as the specified minimums are met, although the location  
of these transition edges may affect digital feedthrough. T he  
digital inputs are CMOS compatible with logic thresholds set to  
approximately half the positive supply voltage. T he small input  
current requirements allow for easy interfacing to unbuffered  
CMOS logic. Figure 11 shows the equivalent digital input  
circuit.  
T he current in LADCOM is proportional to IREFIN and has been  
carefully configured to be independent of digital code when the  
output is connected to a virtual ground. T his minimizes any det-  
rimental effects of ladder ground resistance on linearity. For  
optimal dc linearity, IOUT A should be connected directly to a  
virtual ground, and IOUT B should be grounded. An example of  
this configuration is provided in the section “Buffered Voltage  
Output.” If IOUT A is driving a resistive load directly, then  
IOUT B should be terminated with an equal impedance. T his  
will ensure the current in LADCOM remains constant with digi-  
tal code, and is recommended for improved dc linearity in the  
unbuffered voltage output configuration.  
V
CC  
V
CC  
As shown in Figure 10, there is an equivalent output impedance  
of 1 kin parallel with 3 pF at each output terminal. If the out-  
put voltage deviates from the ladder common voltage, an error  
current flows through this 1 kimpedance. T his is a linear effect  
which does not change with input code, so it appears as a gain  
error. With 50 output termination, the resulting gain error is  
approximately –5%. An example of this configuration is pro-  
vided in the section Unbuffered Voltage Output.  
DIGITAL  
INPUT  
DCOM  
V
EE  
Figure 11. Equivalent Digital Input Circuit  
Digital input signals to the DAC should be isolated from the  
analog output as much as possible. Interconnect distances to the  
DAC inputs should be kept as short as possible. T ermination  
resistors may improve performance if the digital lines become  
too long. T o minimize digital feedthrough, the inputs should be  
free from glitches and ringing, and may be further improved  
with a reduction of edge speed.  
–8–  
REV. B  
Typical Performance Curves––AD768  
–0.470  
–0.472  
1.00  
0.90  
0.80  
0.70  
0.60  
0.50  
0.40  
0.30  
0.20  
0.10  
–0.9405  
–0.9415  
–0.9424  
–0.9433  
–0.9443  
–0.9453  
–0.9462  
–0.9472  
–0.9481  
–0.9498  
–0.9500  
0.2  
R
= 50Ω  
= 0 TO –1V  
R
= 50Ω  
L
L
V
OUT  
V
= 0 TO –1V  
OUT  
R
= 50Ω  
= 0 TO –1V  
L
0.0  
V
OUT  
–0.474  
–0.476  
–0.478  
–0.480  
–0.482  
–0.2  
–0.4  
–0.6  
–0.8  
–1.0  
0.05  
0.025  
TIME – 5ns/Div  
12 14 16 18 20 22 24 26 28 30 32 34 36  
TIME – ns  
TIME – 2ns/Div  
Figure 14. Rise and Fall  
Characteristics  
Figure 13. Glitch Im pulse at Major  
Carry  
Figure 12. Settling Tim e  
0
0
–20  
–80  
CLOCK = 10MHz  
R
V
= 50Ω  
L
F
= 1.002MHz  
CLOCK = 10MHz  
OUT  
= 0 TO –1V  
OUT  
–75  
–70  
–65  
–60  
–55  
–50  
–20  
–40  
F
= 1.002MHz  
OUT  
AMPLITUDE = 0dBm  
AMPLITUDE = 0dBm  
OUTPUT IOUTB  
R
L
= 50Ω  
–40  
–60  
–60  
–80  
–80  
–100  
–100  
10k  
1.0M  
FREQUENCY – Hz  
2.0M  
4
5
6
7
8
9 10  
20  
30  
40  
0.1  
1
2
3
4
5
FREQUENCY – MHz  
FREQUENCY – MHz  
Figure 15. THD vs. Clock Frequency  
at FOUT = 1 MHz  
Figure 16. Typical Spectral  
Perform ance  
Figure 17. Typical SFDR  
(With a Window)  
–80  
0
–20  
–86  
CLOCK = 10 MHz  
FOUT1 = 240 kHz  
FOUT2 = 260 kHz  
AMPLITUDE = –6.0 dB FS  
PER TONE  
OUTPUT IOUTB  
CLOCK = 30MHz  
CLOCK = 1MHz  
CLOCK = 10MHz  
–82  
–75  
–70  
–65  
–60  
–78  
RL = 50Ω  
–74  
–40  
CLOCK = 10MHz  
CLOCK = 20MHz  
CLOCK = 30MHz  
–70  
–66  
–62  
–58  
–60  
CLOCK = 40MHz  
–80  
–55  
–50  
–54  
CLOCK = 20MHz  
–100  
–50  
0.01  
0.1  
1
10  
150  
190  
230  
270  
310  
350  
10  
1
FREQUENCY – MHz  
FREQUENCY – Hz  
FREQUENCY – MHz  
Figure 18. SFDR (Within a Window)  
vs. FOUT  
Figure 19. THD vs. FOUT  
Figure 20. Interm odulation  
Distortion  
REV. B  
–9–  
AD768  
AP P LYING TH E AD 768  
DAC output is the parallel combination of the AD768’s output  
impedance, RL, and bias resistor RB. T he nominal output swing  
with the values given in Figure 22 is ±0.5 V assuming RB >> RL.  
T he gain of the circuit will be a function of the tolerances of the  
impedances RLAD, RB, and RL.  
O UTP UT CO NFIGURATIO NS  
T he following sections illustrate some typical output configura-  
tions for the AD768. While most figures take the output at  
IOUT A, IOUT B can be interchanged in all cases. Unless other-  
wise noted, it is assumed that IREFIN and full-scale currents are  
set to nominal values.  
Choosing the value of RB and C will depend primarily on the  
desired –3 dB high pass cutoff frequency and the bias current,  
IB, of the subsequent stage connected to RB. T he –3 dB fre-  
quency can be approximated by the equation,  
For application that require the specified dc accuracies, proper  
resistor selection is required. In addition to absolute resistor tol-  
erances, resistor self-heating can result in unexpected errors. For  
optimal INL, the buffered voltage output is recommended as  
shown in Figure 23. In this configuration, self-heating of RFB  
may cause a change in gain, producing a bow in the INL curve.  
T his effect can be minimized by selection of a low temperature  
coefficient resistor.  
f–3 dB = 1/[2 × π × (RB + RLʈRLAD) × C].  
T he dc offset of the output is a function of the bias current of  
the subsequent stage and the value of RB. For example, if  
C = 390 pF, RB = 20 k, and IB = 1.0 µA, the –3 dB frequency  
is approximately 20.4 kHz and the dc offset would be 20 mV.  
UNBUFFERED VO LTAGE O UTP UT CO NFIGURATIO NS  
Figure 21 shows the AD768 configured to provide a unipolar  
output range of approximately 0 V to –1 V. T he nominal full-  
scale current of 20 mA flows through the parallel combination  
of the 50 RL resistor and the 1 kDAC output resistance  
(from the R-2R ladder), for a combined 47.6 . T his produces  
an ideal full-scale voltage of –0.952 V with respect to LADCOM.  
In addition, the 1 kDAC output resistance has a tolerance of  
±20% which may vary the full-scale gain by ±1%. T his linear  
variation results in a gain error which can be easily compensated  
I
AD768  
B
C
IOUTA  
1
R
L
IOUTB  
27  
R
B
49.9Ω  
R
49.9Ω  
L
LADCOM  
28  
Figure 22. 0.5 V to –0.5 V Unbuffered AC-Coupled Output  
BUFFERED VO LTAGE O UTP UT CO NFIGURATIO NS  
Unipolar Configur ation  
for by adjusting IREFIN  
.
For positive output voltages, or voltage ranges greater than  
allowed by output compliance limits, some type of external  
buffer is needed. A wide variety of amplifiers may be selected  
based on considerations such as speed, accuracy and cost. T he  
AD9631 is an excellent choice when dynamic performance is  
important, offering low distortion up to 10 MHz. Figure 23  
shows the implementation of 0 V to +2 V full-scale unipolar  
buffered voltage output. T he amplifier establishes a summing  
node at ground for the DAC output. T he buffered output volt-  
age results from the DAC output current flowing through the  
amplifier’s feedback resistor, RFB. In this case, the 20 mA full-  
scale current across RFB (100 ) produces an output voltage  
range of 0 V through +2 V. T he same configuration using a pre-  
cision amplifier such as the AD845 is recommended for optimal  
dc linearity.  
AD768  
IOUTA  
1
R
49.9Ω  
L
VA  
VB  
LADCOM  
IOUTB  
28  
27  
R
L
49.9Ω  
Figure 21. 0 V to –1 V Unbuffered Voltage Output  
In this configuration, it is important to note the restrictions from  
the output compliance limits. T he maximum negative voltage  
compliance is –1.2 V, prohibiting use of a 100 load to produce  
a 0 V to –2 V output swing. One additional consideration for  
operation in this mode is integral nonlinearity. As the voltage at  
the output node changes, the finite output impedance of the  
DAC current steering switches gives rise to small changes in the  
output current that vary with output voltage, producing a bow  
(up to 8 LSBs) in the INL. For optimal INL performance, the  
buffered voltage output mode is recommended.  
R
FB  
100Ω  
AD768  
IOUTA  
1
A1  
IOUTB  
27  
28  
T he INL is also slightly dependent on the termination of the  
unused output (IOUT B) as described in the ANALOG OUT -  
PUT section. T o eliminate this effect, IOUT B should be termi-  
nated with the same impedance as IOUT A, so both outputs see  
the same resistive divider to ground. T his will keep the current  
in LADCOM constant, minimizing any code-dependent IR  
drops within the DAC ladder that may give rise to additional  
nonlinearities.  
LADCOM  
Figure 23. Unipolar 0 V to +2 V Buffered Voltage Output  
Buffer ed O utput Using a Cur r ent D ivider  
T he configuration shown in Figure 23 may not be possible in  
cases where the amplifier cannot supply the requisite 20 mA  
feedback current. As an alternative, Figure 24 shows amplifier  
A1 in conjunction with a resistive current divider. T he values of  
RFF and RL are chosen to limit the current, I3, which must be  
supplied by A1. Current, I2, is shunted to ground through resis-  
tor, RL. T he parallel combination of RFF and RL should not ex-  
ceed 60 to avoid exceeding the specified compliance voltage.  
AC-Coupled O utput  
Configuring the output as shown in Figure 22 provides a bipolar  
output signal from the AD768 without requiring the use of a  
summing amplifier. T he ac load impedance presented to the  
–10–  
REV. B  
AD768  
primary side is multiplied by a factor of 4 (i.e., in this case  
200 ). T o avoid dc current from flowing into the R-2R ladder  
of the DAC, the center tap of the transformer should be con-  
nected to LADCOM.  
For the values given in Figure 24, I3 equals 4 mA, which results  
in a nominal unipolar output swing of 0 V to 2 V. Note, since  
A1 has an inverting gain of approximately –4 and a noise gain of  
+5, A1’s distortion and noise performance should be considered.  
R
500Ω  
In order to comply with the minimum voltage compliance of  
–1.2 V, the maximum differential resistance seen between  
IOUT A and IOUT B should not exceed 240 . Note that the  
differential resistance consists of the load RL, referred to the  
primary side of the transformer in parallel with any added differ-  
ential resistance, RDIFF, across the two outputs. RDIFF is typically  
added to the primary side of the transformer to match the effec-  
tive primary source impedance to the load (i.e., in this case  
200 ).  
FB  
R
FF  
100Ω  
AD768  
I
I
3
1
IOUTA  
1
A1  
I
2
R
24.9Ω  
L
IOUTB  
27  
R
P
20Ω  
LADCOM  
28  
Figure 24. 0 V to 2 V Buffered Unipolar Output Using a  
Current Divider  
AD768  
IOUTA  
1
Bipolar Configur ation  
Bipolar mode is accomplished by providing an offset current,  
R
DIFF  
200Ω  
R
50Ω  
T1  
L
I
BIPOLAR, to the I/V amplifier’s (A1) summing junction. By set-  
ting IBIPOLAR to exactly half the full-scale current flowing  
IOUTB  
27  
28  
4:1 IMPEDANCE  
RATIO  
through RFB, the resulting output voltage will be symmetrical  
about the summing junction voltage, typically ground. Figure 25  
shows the implementation for a bipolar ±2.5 V buffered voltage  
output. T he resistor divider sets the full-scale current for IDAC to  
5 mA. T he internal 2.5 V reference generates a 2.5 mA IBIPOLAR  
current across RBIP. An output voltage of 0 V is produced when  
the DAC is set to half scale (100. . .0) such that the 2.5 mA cur-  
rent, IDAC, is exactly offset by IBIPOLAR. As the DAC is varied  
from zero to full-scale, the output voltage swings from –2.5 V to  
+2.5 V. Note, in configurations that require more than 15 mA  
of total current from REFOUT , an external buffer is required.  
LADCOM  
T1 = MINI-CIRCUITS T4-6T  
Figure 26. Differential Output Using a Transform er  
D C CO UP LING VIA AN AMP LIFIER  
A dc differential to single-ended conversion can be easily ac-  
complished using the circuit shown in Figure 27. T his circuit  
will attenuate both ac and dc common-mode error sources due  
to the differential nature of the circuit. T hus, common-mode  
noise (i.e., clock feedthrough) as well as dc unipolar offset errors  
will be significantly reduced. Also, excellent temperature stabil-  
ity can be obtained by using temperature tracking, thin film  
resistors for R and RREF. T he design equations for the circuit are  
provided such that the voltage output swing and IREF can be  
optimized for a given application.  
Op amps such as the AD811, AD8001, and AD9631 are good  
selections for superior dynamic performance. In dc applications,  
op amps such as the AD845 or AD797 may be more appropriate.  
R
BIP  
1kΩ  
AD768  
REFOUT  
3
R
FB  
R*  
C
1kΩ  
I
BIPOLAR  
AD768  
I
IOUTA  
1
DAC  
75Ω  
V
= ±4 I  
R
OUT  
REF  
=
IOUTA  
IOUTB  
1
A1  
V
2.5V  
OUT  
WHERE I  
A1  
REF  
IOUTB  
27  
R
REF  
24.9Ω  
27  
R*  
R
P
V
± 2V  
OUT  
R = 200Ω  
= 5 x 200Ω  
20Ω  
LADCOM  
REFIN  
28  
6
LADCOM  
28  
R
REF  
R
REF  
*
I
*OHMTEK TDP-1403  
REF  
Figure 25. Bipolar ±2.5 V Buffered Voltage Output  
REFOUT  
3
D IFFERENTIAL O UTP UT CO NFIGURATIO NS  
Figure 27. DC Differential to Single-Ended Conversion  
AC Coupling via a Tr ansfor m er  
Applications that do not require baseband operation typically  
use transformer coupling. T ransformer coupling the comple-  
mentary outputs of the AD768 to a load has the inherent benefit  
of providing electrical isolation while consuming no additional  
power. Also, a properly applied transformer should not degrade  
the AD768s output signal with respect to noise and distortion,  
since the transformer is a passive device. Figure 26 shows a  
center-tapped output transformer that provides the necessary dc  
load conditions at the outputs IOUT A and IOUT B to drive a  
±0.5 V signal into a 50 load. In this particular circuit, the cen-  
ter-tapped transformer has an impedance ratio of 4 that corre-  
sponds to a turns ratio of 2. Hence, any load, RL, referred to the  
P O WER AND GRO UND ING CO NSID ERATIO NS  
In systems seeking to simultaneously achieve high speed and  
high accuracy, the implementation and construction of the  
printed circuit board design is often as important as the circuit  
design. Proper RF techniques must be used in device selection,  
placement and routing, and supply bypassing and grounding.  
Maintaining low noise on power supplies and ground is critical  
to obtaining optimum results from the AD768. Figure 28 pro-  
vides an illustration of the recommended printed circuit board  
ground plane layout which is implemented on the AD768 evalu-  
ation board.  
REV. B  
–11–  
AD768  
Figure 28. Printed Circuit Board Ground Plane Layout  
Figure 29. Printed Circuit Board Power Plane Layout  
–12–  
REV. B  
AD768  
If properly implemented, ground planes can perform a host of  
functions on high speed circuit boards: bypassing, shielding,  
current transport, etc. In mixed signal design, the analog and  
digital portions of the board should be distinct from each other,  
with the analog ground plane confined to the areas covering  
analog signal traces and the digital ground plane confined to  
areas covering the digital interconnects.  
A clean digital supply may be generated using the circuit shown  
in Figure 30. T he circuit consists of a differential LC filter with  
separate power supply and return lines. Lower noise can be at-  
tained using low ESR (Equivalent Series Resistance) type elec-  
trolytic and tantalum capacitors.  
FERRITE  
BEADS  
TTL/CMOS  
LOGIC  
CIRCUITS  
All analog ground pins of the DAC, reference, and other analog  
output components, should be tied directly to the analog ground  
plane. T he two ground planes should be connected by a path  
1/4 to 1/2 inch wide underneath or within 1/2 inch of the DAC  
as shown in Figure 28. Care should be taken to ensure that the  
ground plane is uninterrupted over crucial signal paths. On the  
digital side, this includes the digital input lines running to the  
DAC as well as any clock signals. On the analog side, this in-  
cludes the DAC output signal, reference signal, and the supply  
feeders.  
V
DD  
100µF  
ELECT.  
10–20µF  
TANT.  
0.1µF  
CER.  
DCOM  
+5V  
DGND  
+5V  
POWER SUPPLY  
Figure 30. Differential LC Filter for Single +5 V  
Applications  
T he use of wide runs or planes in the routing of power lines is  
also recommended. T his serves the dual role of providing a low  
series impedance power supply to the part, as well as, providing  
some “free” capacitive decoupling to the appropriate ground  
plane. Figure 29 illustrates the power plane layout used in the  
AD768 evaluation board. T he AD768 evaluation board uses a  
four layer P.C. board which illustrates good layout practices as  
discussed above.  
AP P LICATIO NS  
USING TH E AD 768 AS A MULTIP LYING D AC  
T he AD768 can be easily configured as a multiplying DAC  
since IREFIN can be modulated from 1 mA to 7 mA. T he refer-  
ence amplifier sets the maximum multiplying bandwidth to 15  
MHz, while any external capacitor to the NR node serves to  
limit the bandwidth according to Figure 7. IREFIN can be easily  
modulated by properly scaling and summing into the IREFIN  
node the modulating signal. Figure 31 demonstrates how the  
modulating signal VMOD can be properly scaled and converted  
to a current via RREFMOD such that its peak current does not ex-  
ceed 3.0 mA. Figure 32 shows the AD768’s typical distortion  
versus the reference channel frequency.  
It is essential that care be taken in the layout of signal and  
power ground interconnects to avoid inducing extraneous volt-  
age drops in the signal ground paths. It is recommended that all  
connections be short, direct and as physically close to the pack-  
age as possible, in order to minimize the sharing of conduction  
paths between different currents. When runs exceed an inch in  
length, some type of termination resistor should be considered.  
T he necessity and value of this resistor will be dependent upon  
the logic family used.  
AD768  
IREFIN  
R
REFMOD  
VMOD  
6
3
R
REF  
625Ω  
For maximum ac performance, the DAC should be mounted  
directly to the circuit board; sockets should be avoided since  
they introduce unwanted capacitive coupling between adjacent  
pins of the device.  
REFOUT  
1µF  
VMOD  
≤ ±3.0mA  
R
REFMOD  
P O WER SUP P LY AND D ECO UP LING  
One of the most important external components associated with  
high speed designs are the capacitors used to bypass the power  
supplies. Both selection and placement of these capacitors can  
be critical and, to a large extent, dependent upon the specifics of  
the system configuration. T he dominant consideration in the  
selection of bypass capacitors for the AD768 is the minimization  
of the series resistance and inductance. Many capacitors will  
begin to look inductive at 20 MHz and above. Ceramic and film  
type capacitors generally feature lower series inductance than  
tantalum or electrolytic types.  
Figure 31. Typical Multiplying DAC Application  
–75  
–70  
–65  
–60  
–55  
–50  
–45  
–40  
I
= 5.0+/–1 mA  
= 4.0+/–2 mA  
REF  
I
REF  
It is recommended that each power supply to the AD768 be de-  
coupled by a 0.1 µF capacitor located as close to the device pins  
as possible. Surface-mount chip capacitors, by virtue of their  
low parasitic inductance, are preferable to through-hole types.  
Some series inductance between the DAC supply pins and the  
power supply plane may help to provide additional filtering of  
high frequency power supply noise. T his inductance can be gen-  
erated by using small ferrite beads.  
I
= 4.0+/–3 mA  
REF  
250  
500  
750 1000 1250 1500 1750 2000 2250 2500  
FREQUENCY – kHz  
Figure 32. Reference Channel Distortion vs. Frequency  
REV. B  
–13–  
AD768  
1.5  
1.0  
AD 768 IN MULTITO NE TRANSMITTERS (FO R AD SL)  
Communications applications frequently require aspects of  
component performance that differ significantly from the  
simple, single tone signals used in typical SNR and T HD tests.  
T his is particularly true for spread-spectrum and frequency divi-  
sion multiplexed (FDM) type signals, where information con-  
tent is held in a number of small signal components spread  
across the frequency band. In these applications, a combination  
of wide dynamic range, good fine-scale linearity, and low inter-  
modulation distortion is required. Unfortunately, a part’s full  
scale SNR and T HD performance may not be a reliable indica-  
tor of how it will perform in these multitone applications.  
0.5  
0
–0.5  
–1.0  
–1.5  
One example of an FDM communications system is the DMT  
(discrete multitone) ADSL (Asymmetrical Digital Subscriber  
Line) standard currently being considered by ANSI. Figure 33  
shows a block diagram of a transmitter function.  
TIME – 25µs/DIV  
Figure 34b. Tim e Dom ain Output Signal of ADSL Test  
Vector  
T he digital bits are used to QAM modulate each of approxi-  
mately 200 discrete tones. An inverse FFT turns this modu-  
lated frequency domain information into 512 time points at a  
2.2 MSPS sample rate. T hese time points are then put through  
an FIR interpolation filter to upsample (in this case to 4.4 MSPS).  
The bit stream is run through the AD768, which is followed by  
a 4th order analog smoothing filter, then run to the line-driving  
circuitry  
T able I and II show the available SNR and T HD at the output  
of the filter vs. frequency bin for the ADSL application. T he  
AD768s combination of 16-bit dynamic range and 14-bit lin-  
earity provides excellent performance for the DMT signal. Its  
fast input rate would support even faster rates of oversampling,  
if one were interested in trading off digital filter complexity in  
the interpolator for a simplified analog filter.  
1024 TIME  
POINTS  
@ 4.4MSPS  
BIT  
STREAM  
512 TIME  
POINTS  
256  
MODULATED  
2X  
INTERPOLATOR  
FIR  
INVERSE  
FFT  
QAM  
ENCODER  
FREQUENCY  
BINS  
@ 2.2MSPS  
Table I. SNR vs. Frequency  
Frequency  
SNR  
4TH ORDER  
SMOOTHING  
FILTER  
AD768  
+BUFFER  
TO  
TRANSMITTER  
151 kHz  
349 kHz  
500 kHz  
1 MHz  
70.1 dB  
69.7 dB  
69.4 dB  
69.8 dB  
Figure 33. Typical DMT ADSL Transm it Chain  
Figure 34a shows a frequency domain representation of a test  
vector run through this system, while 34b shows the time do-  
main representation. (Clearly the frequency domain picture is  
more informative.) We wish to optimize the SINAD of each  
4 kHz frequency band: this is a function of both noise  
(wideband and quantization) and distortion (simple harmonic  
and intermod).  
Table II. TH D vs. Frequency  
Frequency  
TH D  
160 kHz  
418 kHz  
640 kHz  
893 kHz  
–68.9 dBc  
–64.0 dBc  
–64.3 dBc  
–63.8 dBc  
0
–20  
–40  
–60  
–80  
1.1M  
0
FREQUENCY – Hz  
Figure 34a. Output Spectrum of ADSL Test Vector  
–14–  
REV. B  
AD768  
AD 768 EVALUATIO N BO ARD  
JP1. Buffered op amp output “A”. Jumper JP1 should be  
installed if the buffered op amp output is desired. When JP 1  
is in stalled, JP 2 an d JP 3 m u st be r em oved for proper  
operation. T he output, available on the “A” connector, has a  
nominal voltage swing of 0 V to 2 V and is in-phase with the  
digital input. T his is the factory default setting.  
GENERAL D ESCRIP TIO N  
T he AD768-EB is an evaluation board for the AD768 16-bit  
30 Msps D/A converter. Careful attention to layout and circuit  
design combined with analog and digital prototyping areas al-  
lows the user to easily and effectively evaluate the AD768 in any  
application where high resolution, high speed conversion is  
required.  
JP 2. Bipolar 50 transformer output. If jumper JP2 is in-  
stalled, a transformer coupled output is available on the “A”  
connector. When JP 2 is installed, JP 1 and JP 3 m ust be r e-  
m oved for proper operation. T he transformer acts both as a  
differential-to-single-ended converter and as an impedance  
transformer. For proper operation, the tr ansfor m er m ust be  
ter m inated with a 50 r esistor. R2 must be replaced with  
the 100 resistor, R7. An additional 100 resistor and the  
transformer are included with the AD768-EB. T he additional  
100 resistor must be soldered into the appropriate position la-  
beled “R3” and the transformer must be inserted into the  
socket labeled “T 1.” T he nominal output voltage into a 50 Ω  
load is 1 V p-p centered on a common-mode voltage of 0 V.  
T he digital inputs to the AD768-EB may be driven directly us-  
ing the standard 40-pin IDC connector. An external clock is  
also required. T hese signals may be applied from a user’s  
bench, or they can be generated from a circuit built on the  
prototyping area. T he analog outputs from the AD768-EB are  
available on BNC connectors. T hese outputs may be configured  
to use either resistors, op amps, or a transformer.  
O P ERATING P RO CED URE AND FUNCTIO NAL  
D ESCRIP TIO N  
P ower  
Power may be supplied to the AD768-EB by applying either  
wires or banana plugs to the metal binding posts included on the  
printed circuit board.  
JP 3. Resistor output “A.” JP3 is used to connect the resistor  
R2 to the “A” output. U2 should be removed from its socket.  
Using a 24.9 resistor for R2, the output is an unbuffered 0 V  
to –0.5 V output that is out of phase with the digital input. Re-  
sistor R2 may be replaced with other values, but careful atten-  
tion to the recommended output compliance range should be  
observed. When JP 3 is installed, JP 1 and JP 2 m ust be r e-  
m oved for pr oper oper ation.  
D GND . Digital Ground. T he digital ground and the analog  
ground are connected together underneath the AD768. Optimal  
performance can be obtained with separate analog and digital  
supplies. For evaluation purposes, a single-supply which makes  
a second analog and digital ground connection at the supply is  
acceptable.  
JP 4. Resistor output “B.” JP4 is used to connect the resistor  
R3 to the “A” output. U3 should be removed from its socket.  
T he AD768-EB is shipped from the factory with resistor R3  
shorted to ground. A different value selected by the user can be  
installed for R3 to generate an unbuffered output that is in-  
phase with the digital input. Careful attention to the recom-  
mended output compliance range should be observed when  
selecting the value of R3. When JP 4 is installed, JP 5 m ust  
be r em oved for pr oper oper ation.  
+5D . T he +5 V (±5%) digital supply should be capable of sup-  
plying 50 mA.  
–5A. T he –5 V (±5%) analog supply should be capable of sup-  
plying –75 mA.  
AGND . Analog ground. T he analog ground and the digital  
ground are connected together underneath the AD768. Optimal  
performance can be obtained with separate analog and digital  
supplies. For evaluation purposes, a single-supply which makes  
a second analog and digital ground connection at the supply is  
acceptable.  
JP 5. Buffered op amp output “B.” Jumper JP5 should be in-  
stalled if the buffered op amp output is desired. When JP 5 is  
installed, JP 4 m ust be r em oved for pr oper oper ation.  
T he output is available on the “B” connector and has a nominal  
voltage swing determined by the combination of resistors R3,  
R9, and R10. T his op amp is not provided with the AD768-EB.  
VEE. Negative analog supply; typically –5 V to –15 V. T his  
supply is used as the negative supply rail for the external op  
amps. For the AD811 supplied with the AD768-EB, a supply  
capable of supplying –20 mA (excluding external load require-  
ments) is required.  
Refer ence  
Either the internal reference of the AD768 or an external refer-  
ence may be selected on the AD768-EB. R12 is used to adjust  
the full-scale output current of the AD768.  
+VCC  
. Positive analog supply; typically +5 V to +15 V. T his  
supply is used as the positive supply rail for the external op  
amps. For the AD811 supplied with the AD768-EB, a supply  
capable of supplying +20 mA (excluding external load require-  
ments) is required.  
SW2. Internal/External reference select switch. When SW2 is  
in position 1, the internal reference of the AD768 is selected.  
When SW2 is in position 2, an external reference must be pro-  
vided by the user.  
Analog O utputs  
T he analog output(s) from the AD768-EB are available on BNC  
jacks “A” and “B.” T he complementary current outputs from  
the AD768 can be configured using either resistors, op amps, or  
a transformer. Only the “A” portion of the AD768-EB is popu-  
lated and shipped from the factory. T he “B” side, or comple-  
mentary output, may be populated by the user if so desired.  
Level-Shifting the Analog O utput  
Resistor sockets R8 and R6 can be populated with an appropri-  
ately valued resistor to add dc offset current to an output which  
uses the op amp configuration. As an example, to generate a  
bipolar output signal, a 1.25 kresistor installed into the “R8”  
socket level-shifts the normally unipolar output by –1 V. T he  
factory defaults for R8 and R6 are open circuits.  
REV. B  
–15–  
AD768  
Clock Input  
Table III. Sum m ary of Jum per Functionality  
An external sample clock must be provided to either the BNC  
connector labeled “CLOCK” or on Pin 33 of the IDC connec-  
tor. T his clock must comply with the logic levels outlined in the  
AD768 data sheet. T he “CLOCK” input is terminated with a  
removable 51 resistor. T he IDC connector clock connection  
is unterminated.  
Installed  
Jum per Function  
Jumper  
JP1  
JP2  
JP3 (ST BY)  
JP4  
JP5  
Buffered Output A  
50 T ransformer Output  
Unbuffered Output A  
Unbuffered Output B  
Buffered Output B  
SW1. Clock source select switch. When SW1 is in position 1, Pin  
33 of the IDC connected is applied to the CLOCK input of the  
AD768. When SW2 is in position 2, the “CLOCK” BNC connec-  
tor is applied to the CLOCK input of the AD768.  
Table IV. AD 768-EB P arts List  
Value / P art Type P ackage  
D igital Inputs  
T he digital inputs of the AD768, DB0–DB15, are available via  
J1, a 40-pin IDC connector. T hese inputs should comply with  
the specifications given in the AD768 data sheet.  
Reference  
Qty/Bd  
U1  
U2  
T 1  
AD768  
AD811  
28-Pin SOIC  
1
1
1
Layout Consider ations  
8-Pin DIP  
Figures 28 and 29 show the AD768-EB ground and power  
plane layouts. Figures 35–38 show the schematic diagram, trace  
routing, silk screening, and component layout for the AD768 4  
layer evaluation board.  
Mini-Circuits  
T 4–6T  
Not Installed  
A, B, CLOCK BNC JACKs,  
Small  
Small, Vertical  
3
Separate ground and power planes have several advantages for  
high speed layouts. (For further information outlining these  
advantages, see the application note “Design and Layout of a  
Video Graphics System for Reduced EMI” [E1309] available  
from Analog Devices [(617) 461-3392].) A solid ground plane  
can be used if the digital return current can be routed such that  
it does not modulate the analog ground plane. If this is not pos-  
sible, it may be necessary to split the ground plane in order to  
force currents to flow in a controlled direction. T his type of  
grounding scheme is shown in the Figure 28. T he ground plane  
is separated into analog and digital planes that are joined  
together under the AD768. In any case, the AD768 should be  
treated as an analog component and a common ground connec-  
tion should be made underneath the AD768 despite some pins  
being labeled “digital” ground and some as “analog” ground.  
JP1–5  
SW1, 2  
J1  
Header  
2-Pin  
5
2
1
SPDT , Secme  
0.1" × 0.3"  
40-Pin IDC  
Connector  
R.A., Male,  
w/ Latches  
R1  
R2  
500 Ω  
1/4 W, 0.01%,  
Vishay  
1
1
25 Ω  
1/4 W, 0.01%,  
Vishay  
R3, R13–21, &  
R23–29  
Wire Jumpers  
17  
1
A complete parts list for the AD768 evaluation board is given in  
T able IV.  
R5  
500 Ω  
1/4 W, 0.01%,  
Vishay  
R7  
100 Ω  
1/4 W, 0.01%,  
Vishay  
1
R11  
51 Ω  
1/8 W, 5%, Carbon  
3266 W  
1
1
4
R12  
10 kPot.  
C1–4  
1 µF Ceram. Cap. Leaded  
0.1 µF Chip Cap,  
C5–8, C10, 12,  
14, & C16–19  
1206  
11  
4
C9, 11, 13, 15 22 µF T ant. Cap., T eardrop,  
25 V 0.1" Spacing  
–16–  
REV. B  
AD768  
R5  
499  
A
B
50  
JP5  
1
1
R10  
499  
+V  
CC  
C5  
0.1µF  
2
2
U2  
2
7
+V  
CC  
C7  
50  
JP1  
JP2  
A
6
0.1µF  
AD811  
4
U3  
3
C6  
0.1µF  
2
3
7
A
6
AD811  
4
A
T1  
4:1  
3
1
C8  
0.1µF  
A
A
–V  
EE  
A
4
5
6
JP3  
JP4  
–V  
EE  
A
R7  
100  
–V  
R2  
24.9  
R3  
24.9  
EE  
C9  
C10  
47µF, 25V  
0.1µF  
R9  
100  
R8  
R6  
A
+V  
CC  
C11  
47µF, 25V  
C12  
0.1µF  
A
–5A  
+5D  
C13  
47µF, 25V  
C14  
0.1µF  
U1  
C17  
0.1µF  
A
C3  
1µF  
C2  
1µF  
C18  
0.1µF  
R12  
10k  
AD768  
1
2
28  
27  
26  
25  
24  
23  
22  
21  
20  
19  
18  
17  
16  
15  
LADCOM  
IOUTA  
NR  
A
A
IOUTB  
A
3
C4  
1µF  
C19  
0.1µF  
C15  
47µF, 25V  
C16  
0.1µF  
(–5V) V  
REFOUT  
NC  
EE  
C1  
1µF  
4
1
2
(+5V) V  
DD  
5
R21  
0
0
0
0
0
0
0
0
R1  
499  
SW2  
J1  
J1  
J1  
J1  
J1  
J1  
J1  
J1  
1
3
REFCOM  
IREFIN  
DB0 (LSB)  
DB1  
(MSB) DB15  
DB14  
6
R23  
R24  
R25  
R26  
R27  
R28  
R29  
TP1  
7
R13  
R14  
R15  
R16  
R17  
R18  
R19  
R20  
0
0
0
0
0
0
0
0
J1 31  
J1 29  
J1 27  
J1 25  
J1 23  
J1 21  
J1 19  
J1 17  
5
DB13  
8
7
DB12  
9
9
DB2  
DB11  
10  
11  
12  
13  
14  
11  
13  
15  
DB3  
DB10  
DB4  
DB9  
DB5  
DB8  
DB6  
CLOCK  
DCOM  
DB7  
33  
J1  
1
2
SW1  
CLOCK  
1
R11  
50  
2
J1  
J1  
J1  
J1  
J1  
J1  
J1  
J1 16  
J1 18  
J1 20  
J1 22  
J1 24  
J1 26  
J1 28  
J1 30  
J1 32  
J1 34  
J1 36  
J1 38  
J1 40  
2
4
DGND  
6
AGND CONNECTED TO DGND  
ON GND PLANE UNDER U1  
IN BETWEEN PINS 5 AND 25  
8
10  
12  
14  
AGND  
A
Figure 35. AD768 Evaluation Board Schem atic  
REV. B  
–17–  
AD768  
Figure 36. Silkscreen Layer (Not to Scale)  
–18–  
REV. B  
AD768  
Figure 37. Com ponent Side PCB Layout (Not to Scale)  
Figure 38. Solder Side PCB Layout (Not to Scale)  
REV. B  
–19–  
AD768  
O UTLINE D IMENSIO NS  
D imensions shown in inches and (mm).  
R-28  
300 Mil 28-P in SO IC  
0.7125 (18.10)  
0.6969 (17.70)  
28  
15  
0.2992 (7.60)  
0.2914 (7.40)  
0.4193 (10.65)  
0.3937 (10.00)  
1
14  
PIN 1  
0.1043 (2.65)  
0.0926 (2.35)  
0.0291 (0.74)  
x 45°  
0.0098 (0.25)  
0.0500 (1.27)  
0.0157 (0.40)  
8°  
0°  
0.0500  
(1.27)  
BSC  
0.0192 (0.49)  
0.0138 (0.35)  
0.0118 (0.30)  
0.0040 (0.10)  
SEATING  
PLANE  
0.0125 (0.32)  
0.0091 (0.23)  
–20–  
REV. B  

相关型号:

AD768ARZ

16-Bit, 30 MSPS D/A Converter
ADI

AD768ARZ-REEL

16-Bit, 30 MSPS D/A Converter
ADI

AD7690

16-Bit, +/-0.65 LSB INL, 500 kSPS PulSAR Differential ADC in MSOP/QFN
ADI

AD76901

14-Bit, 500 kSPS PulSAR ADC in MSOP
ADI

AD7690BCPZRL

1-CH 18-BIT SUCCESSIVE APPROXIMATION ADC, SERIAL ACCESS, PDSO10, 3 X 3 MM, ROHS COMPLIANT, LFCSP-10
ADI

AD7690BCPZRL7

18-Bit, 1.5 LSB INL, 400 kSPS PulSAR® Differential ADC in MSOP/QFN
ADI

AD7690BRMZ

18-Bit, 1.5 LSB INL, 400 kSPS PulSAR® Differential ADC in MSOP/QFN
ADI

AD7690BRMZ-RL7

18-Bit, 1.5 LSB INL, 400 kSPS PulSAR® Differential ADC in MSOP/QFN
ADI

AD7691

18-Bit, 1.5 LSB INL, 250 kSPS PulSAR Differential ADC in MSOP/QFN
ADI

AD76911

14-Bit, 500 kSPS PulSAR ADC in MSOP
ADI

AD7691BCPZRL

250 kSPS PulSAR Differential ADC in MSOP/LFCSP
ADI

AD7691BCPZRL7

250 kSPS PulSAR Differential ADC in MSOP/LFCSP
ADI