ADIS16060/PCBZ [ADI]
Wide Bandwidth Yaw Rate Gyroscope with SPI; 宽带宽偏航角速度陀螺仪，采用SPI
| 型号： | ADIS16060/PCBZ |
| 厂家： | 
ADI |
| 描述： | Wide Bandwidth Yaw Rate Gyroscope with SPI |
| 文件： | 总12页 (文件大小：351K) |
| 中文： | 中文翻译 | 下载： | 下载PDF数据表文档文件 |
Wide Bandwidth
Yaw Rate Gyroscope with SPI
ADIS16060
FEATURES
GENERAL DESCRIPTION
Complete angular rate digital gyroscope
14-bit resolution
Scalable measurement range
Initial range: 80ꢀ°sec ꢁtypical)
Increase range with external resistor
Z-axis ꢁyaw rate) response
The ADIS16060 is a yaw rate gyroscope with an integrated
serial peripheral interface (SPI). It features an externally
selectable bandwidth response and scalable dynamic range.
The SPI port provides access to the rate sensor, an internal
temperature sensor, and two external analog signals (using
internal ADC). The digital data available at the SPI port is
proportional to the angular rate about the axis that is normal
to the top surface of the package.
SPI digital output interface
High vibration rejection over wide frequency
2000 g-powered shock survivability
1 kHz bandwidth
Selectable using external capacitor
Externally controlled self-test
Internal temperature sensor output
Dual auxiliary 14-bit ADC inputs
Absolute rate output for precision applications
5 V single-supply operation
An additional output pin provides a precision voltage reference.
A digital self-test function electromechanically excites the sensor
to test the operation of the sensor and the signal-conditioning
circuits.
The ADIS16060 is available in an 8.2 mm × 8.2 mm × 5.2 mm,
16-terminal, peripheral land grid array (LGA) package.
8.2 mm × 8.2 mm × 5.2 mm package
−40ꢀC to +105ꢀC operation
RoHS compliant
APPLICATIONS
Platform stabilization
Image stabilization
Guidance and control
Inertia measurement units
Robotics
FUNCTIONAL BLOCK DIAGRAM
FILT
RATE
V
CC
ADIS16060
RATE
SENSOR
SCLK
DIN
14-BIT
ADC
TEMPERATURE
SENSOR
DOUT
MUX
DIGITAL
CONTROL
MSEL1
MSEL2
AIN1
AIN2
GND
Figure 1.
Rev. 0
Information furnished by Analog Devices is believed to be accurate and reliable. However, no
responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other
rights of third parties that may result from its use. Specifications subject to change without notice. No
license is granted by implication or otherwise under any patent or patent rights of Analog Devices.
Trademarks and registeredtrademarks arethe property of their respective owners.
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A.
Tel: 781.329.4700
Fax: 781.461.3113
www.analog.com
©2008 Analog Devices, Inc. All rights reserved.
ADIS16060
TABLE OF CONTENTS
Features .............................................................................................. 1
Basic Operation .............................................................................. 10
Serial Peripheral Interface (SPI)............................................... 10
Output Data Formatting............................................................ 10
ADC Conversion........................................................................ 10
Applications Information.............................................................. 11
Supply and Common Considerations ..................................... 11
Setting Bandwidth...................................................................... 11
Increasing Measurement Range ............................................... 11
Dynamic Digital Sensitivity Scaling ........................................ 11
Temperature Measurements ..................................................... 11
Self-Test Function ...................................................................... 11
Outline Dimensions....................................................................... 12
Ordering Guide .......................................................................... 12
Applications....................................................................................... 1
General Description......................................................................... 1
Functional Block Diagram .............................................................. 1
Revision History ............................................................................... 2
Specifications..................................................................................... 3
Timing Specifications .................................................................. 5
Absolute Maximum Ratings............................................................ 6
ESD Caution.................................................................................. 6
Pin Configuration and Function Descriptions............................. 7
Typical Performance Characteristics ............................................. 8
Theory of Operation ........................................................................ 9
Analog-to-Digital Converter Input............................................ 9
Rate Sensitive Axis ....................................................................... 9
REVISION HISTORY
1/08—Revision 0: Initial Version
Rev. 0 | Page 2 of 12
ADIS16060
SPECIFICATIONS
TA = 25°C, VCC = 5 V, angular rate = 0°/sec, COUT = 0.01 μF, 1 g, unless otherwise noted.
Table 1.
Parameter
SENSITIVITY
Dynamic Range2
Initial
Conditions
Min1
Typ
Max
Unit
Full-scale range over specifications range
Clockwise rotation is positive output,
TA = −40°C to +ꢀ±°C
±±0
0.0110
±ꢀ0
°/sec
0.0122
0.0134
°/sec/LSB
Change Over Temperature3
Nonlinearity
VCC = 4.7± V to ±.2± V
Best fit straight line
±3
0.1
%
°/sec
NULL
Initial
Nominal 0°/sec output is ꢀ192 LSB
VCC = 4.7± V to ±.2± V
Power on to ±0.±°/sec of final value
Any axis
−44
+44
°/sec
°/sec/°C
ms
°/sec/g
°/sec/V
Change Over Temperature3
±0.11
10
±0.1
±0.±
Turn-On Time
Linear Acceleration Effect
Voltage Sensitivity
VCC = 4.7± V to ±.2± V
NOISE PERFORMANCE
Rate Noise Density
FREQUENCY RESPONSE
3 dB Bandwidth (User-Selectable)4
Sensor Resonant Frequency
SELF-TEST RESPONSE
Positive Self-Test±
@ 2±°C
0.04
14.±
°/sec/√Hz
COUT = 0 μF
1
1000
ꢀ6ꢀ4
Hz
kHz
See Table ±
See Table ±
+6226
−6226
LSB
LSB
Negative Self-Test±
TEMPERATURE SENSOR
Reading at 29ꢀ K
Scale Factor
7700
ꢀ192
0.034
LSB
K/LSB
Proportional to absolute temperature
LOGIC INPUTS
Input High Voltage, VINH
Input Low Voltage, VINL
Input Current, IIN
Input Capacitance, CIN (DIN)
Input Capacitance, CIN (MSEL1, MSEL2 )
0.7 × VCC
−1
V
V
μA
pF
pF
0.ꢀ
+1
Typically 10 nA
For VIN < VCC
ꢀ
±
ANALOG INPUTS
Resolution
14
Bits
Integral Nonlinearity
Differential Nonlinearity
Offset Error
Best fit straight line
No missing codes to 13 bits
−6
−1
−10
+6
+6
+10
LSB
LSB
mV
Offset Error Temperature Drift
Gain Error
Gain Error Temperature Drift
Input Voltage Range
Leakage Current
±0.3
±0.3
1
ppm/°C
mV
ppm/°C
V
−40
0
+40
VCC
nA
DIGITAL OUTPUTS
Output High Voltage, VOH
Output Low Voltage, VOL
CONVERSION RATE
Conversion Time
ISOURCE = ±00 μA
ISINK = ±00 μA
VCC − 0.3
V
V
0.4
10
μs
Throughput Rate
100
kSPS
Rev. 0 | Page 3 of 12
ADIS16060
Parameter
Conditions
Min1
Typ
Max
Unit
POWER SUPPLY
VCC
VCC Quiescent Supply Current
Power Dissipation
TEMPERATURE RANGE
All at TA = −40°C to +ꢀ±°C
4.7±
±
4.3
22
±.2±
6.±
33
V
VCC @ ± V, ±0 kSPS sample rate
VCC @ ± V, ±0 kSPS sample rate
Operation
mA
mW
°C
−40
+10±
1 All minimum and maximum specifications are guaranteed. Typical specifications are neither tested nor guaranteed.
2 Dynamic range is the maximum full-scale measurement range possible, including output swing range, initial offset, sensitivity, offset drift, and sensitivity drift at ± V supply.
3 Defined as the output change from ambient to maximum temperature, or ambient to minimum temperature.
4 Frequency at which the response is 3 dB down from dc response. Bandwidth = 1/(2 × π × 200 kΩ × COUT). For COUT = 0.01 μF, bandwidth = ꢀ0 Hz.
± Self-test response varies with temperature.
Rev. 0 | Page 4 of 12
ADIS16060
TIMING SPECIFICATIONS
TA = 25°C, angular rate = 0°/sec, unless otherwise noted.1
Table 2. Read/Output Sequence
Parameter
Figure Reference
Symbol
Min
Typ
Max
2.9
100
0
Unit
MHz
kHz
μs
Serial Clock Frequency
Throughput Rate
See Figure 2
See Figure 2
See Figure 2
See Figure 2
See Figure 2
See Figure 2
See Figure 2
See Figure 2
See Figure 2
See Figure 3
See Figure 3
See Figure 3
tCYC
tCSD
tSUCS
tHDO
tDIS
tEN
tACQ
tF
tR
t±
t7
t6
MSEL1 Falling to SCLK Low
MSEL1 Falling to SCLK Rising
SCLK Falling to Data Remains Valid
MSEL1 Rising Edge to DOUT High Impedance
SCLK Falling to Data Valid
Acquisition Time
DOUT Fall Time
DOUT Rise Time
Data Setup Time
SCLK Falling Edge to MSEL2 Rising Edge
Data Hold Time
20
±
ns
16
14
16
ns
ns
100
±0
ns
ns
ns
ns
ns
ns
ns
400
11
11
±
2±
2±
±
0
4.±
0
1 Guaranteed by design. All input signals are specified with tR = tF = ± ns (10% to 90% of VCC) and timed from a voltage level of 1.6 V. The ± V operating range spans from
4.7± V to ±.2± V.
Timing Diagrams
tCYC
COMPLETE CYCLE
MSEL1
tSUCS
tACQ
POWER DOWN
1
4
5
SCLK
DOUT
tCSD
HIGH-Z
tEN
tHDO
tDIS
HIGH-Z
0
D13 D12 D11 D10 D9 D8 D7 D6 D5 D4 D3 D2 D1 D0
0
(MSB) (LSB)
NOTE:
A MINIMUM OF 20 CLOCK CYCLES ARE REQUIRED FOR 14-BIT CONVERSION.
Figure 2. Serial Interface Timing Diagram–Read/Output Sequence (CPOL = 0, CPHA = 0)
t7
t5
MSEL2
t6
SCLK
DIN
DB7 DB6 DB5 DB4 DB3 DB2 DB1 DB0
NOTE:
THE LAST EIGHT BITS CLOCKED IN ARE LATCHED WITH THE RISING EDGE OF THE MSEL2 LINE.
Figure 3. Serial interface Timing–Input/Configuration Sequence (CPOL = 0, CPHA = 1)
Rev. 0 | Page ± of 12
ADIS16060
ABSOLUTE MAXIMUM RATINGS
Table 3.
Parameter
Acceleration (Any Axis, Unpowered, 0.± ms)
Acceleration (Any Axis, Powered, 0.± ms)
VCC to GND
Stresses above those listed under the Absolute Maximum
Ratings may cause permanent damage to the device. This is a
stress rating only; functional operation of the device at these or
any other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
Rating
2000 g
2000 g
−0.3 V to +6.0 V
−0.3 V to VCC + 0.3 V
−0.3 V to VCC + 0.3 V
−0.3 V to +7.0 V
−0.3V to VCC + 0.3 V
−40°C to +10±°C
−6±°C to +1±0°C
VCC to GND
Analog Input Voltage to GND
Digital Input Voltage to GND
Digital Output Voltage to GND
Operating Temperature Range
Storage Temperature Range
Drops onto hard surfaces can cause shocks of greater than
2000 g and exceed the absolute maximum rating of the device.
Care should be exercised in handling the device to avoid damage.
ESD CAUTION
Rev. 0 | Page 6 of 12
ADIS16060
PIN CONFIGURATION AND FUNCTION DESCRIPTIONS
16
15
14
13
3.6865 BSC
8×
DIN
GND
GND
2.5050 BSC
8×
PIN 1
INDICATOR
0.6700 BSC
12×
SCLK
DOUT
NC
GND
AIN2
7.373 BSC 5.010 BSC
2×
4×
5
6
7
8
NOTES
1. NC = NO CONNECT
2. THIS IS NOT AN ACTUAL “TOP VIEW,” AS THE PINS ARE NOT VISIBLE FROM THE
TOP. THIS IS A LAYOUT VIEW, WHICH REPRESENTS THE PIN CONFIGURATION, IF
THE PACKAGE IS LOOKED THROUGH FROM THE TOP. THIS CONFIGURATION IS
PROVIDED FOR PCB LAYOUT PURPOSES.
1.000 BSC
16×
0.5000 BSC
16×
Figure 4. Pin Configuration
Figure 5. Second-Level Assembly Pad Layout
Table 4. Pin Function Descriptions
Pin No.
Mnemonic
Type1 Description
1
2
3
4
DIN
I
I
O
SPI Data Input.
SPI Serial Clock.
SPI Data Output.
No Connect.
SCLK
DOUT
NC
±
6
RATE
FILT
O
I
Buffered Analog Output. Represents the angular rate signal.
External Capacitor Connection to Control Bandwidth.
7
ꢀ
9
10
11
12
13
14
1±
16
VCC
S
I
I
S
S
S
S
S
I
Power Supply.
External Analog Input Channel 1.
External Analog Input Channel 2.
Ground.
Ground.
Ground.
Ground.
Power Supply.
AIN1
AIN2
GND
GND
GND
GND
VCC
MSEL2
SPI, Mode Select 2. Used for data input functions.
SPI, Mode Select 1. Used for data output functions.
MSEL1
I
1 I = input; O = output; S = power supply.
Rev. 0 | Page 7 of 12
ADIS16060
TYPICAL PERFORMANCE CHARACTERISTICS
0.18
6800
6600
6400
6200
6000
5800
5600
5400
5200
5000
4800
0.16
0.14
0.12
0.10
0.08
0.06
0.04
0.02
0
–60
–40
–20
0
20
40
60
80
100
120
BIAS (°/sec)
TEMPERATURE (°C)
Figure 6. Initial Bias Error Distribution, 25°C, VCC = 5 V
Figure 9. Positive Self-Test Response vs. Temperature, VCC = 5 V
0.30
0.25
0.20
0.15
0.10
0.05
0
–4800
–5000
–5200
–5400
–5600
–5800
–6000
–6200
–6400
–6600
–6800
–60
–40
–20
0
20
40
60
80
100
120
TEMPERATURE (°C)
BIAS DRIFT OVER TEMPERATURE (°/sec/°C)
Figure 7. Bias Drift Over −40°C to +85°C, VCC = 5 V
Figure 10. Negative Self-Test Output Response vs. Temperature, VCC = 5 V
0.1
0.04
0.03
0.02
0.01
µ + 1σ
0.01
0
µ
–0.01
–0.02
µ – 1σ
–0.03
0.001
–0.04
1
10
100
1000
–60
–40
–20
0
20
40
60
80
100
120
Tau (°C)
TEMPERATURE (°C)
Figure 11. Allen Variance, 25°C, VCC = 5 V
Figure 8. Sensitivity Drift vs. Temperature, VCC = 5 V
Rev. 0 | Page ꢀ of 12
ADIS16060
THEORY OF OPERATION
The ADIS16060 operates on the principle of a resonator
gyroscope. Two polysilicon sensing structures each contain a
dither frame that is electrostatically driven to resonance. This
generates the necessary velocity element to produce a Coriolis
force while rotating. At two of the outer extremes of each frame,
orthogonal to the dither motion, are movable fingers that are
placed between fixed pickoff fingers to form a capacitive pickoff
structure that senses Coriolis motion.
During the acquisition phase, the impedance model for AINx is a
parallel combination of the capacitor CPIN and the network formed
by the series connection of RIN and CIN. CPIN is primarily the pin
capacitance. RIN is typically 600 Ω and is a lumped component
made up of some serial resistors and the on resistance of the
switches. CIN is typically 30 pF and mainly functions as the
ADC sampling capacitor.
During the conversion phase, when the switches are open, the
input impedance is limited to CPIN. RIN and CIN make a 1-pole,
low-pass filter that reduces undesirable aliasing effects and
limits the noise.
The resulting signal is fed to a series of gain and demodulation
stages that produce the electrical rate signal output. The rate
signal is then converted to a digital representation of the output
on the SPI pins. The dual-sensor design provides linear acceleration
(vibration, shock) rejection. Fabricating the sensor with the signal-
conditioning electronics preserves signal integrity in noisy
environments.
When the source impedance of the driving circuit is low, the
ADC input can be driven directly. Large source impedances
significantly affect the ac performance, especially THD. The dc
performances are less sensitive to the input impedance.
The electrostatic resonator requires 14 V to 16 V for operation.
Because only 5 V is typically available in most applications, a charge
pump is included on chip. After the demodulation stage, a single-
pole, low-pass filter on the chip is used to limit high frequency
artifacts before final amplification. The frequency response is
dominated by the second low-pass filter, which is set by adding
capacitance across RATE and FILT.
RATE SENSITIVE AXIS
RATE
AXIS
LONGITUDINAL
POSITIVE
AXIS
MEASUREMENT
DIRECTION
8
5
4
1
LATERAL
AXIS
ANALOG-TO-DIGITAL CONVERTER INPUT
Figure 13. Rate Signal Increases with Clockwise Rotation
Figure 12 shows an equivalent circuit of the input structure of
the ADIS16060 auxiliary ADC.
The two diodes, D1 and D2, provide ESD protection for the analog
inputs, AINx (AIN1 and AIN2). Care must be taken to ensure
that the analog input signal does not exceed the supply rails by
more than 0.3 V, because exceeding this level causes these diodes to
become forward-biased and to start conducting current. However,
these diodes can handle a forward-biased current of 130 mA
maximum. For instance, these conditions may eventually occur
when the input signals exceed either VCC or GND.
VDD
D1
D2
C
IN
R
IN
AINx
GND
C
PIN
Figure 12. Equivalent Analog Input Circuit
Rev. 0 | Page 9 of 12
ADIS16060
BASIC OPERATION
The ADIS16060 is designed for simple integration into indus-
trial system designs, requiring only a 5 V power supply, two
mode select lines, and three serial communications lines. The
SPI handles all digital I/O communication in the ADIS16060.
Output Data Access
Use Table 2 and Figure 2 to determine the appropriate timing
considerations for reading output data.
OUTPUT DATA FORMATTING
SERIAL PERIPHERAL INTERFACE ꢁSPI)
All of the output data is in an offset-binary format, which in
this case, means that the ideal output for a zero rate condition is
8192 codes. If the sensitivity is equal to +0.0122°/sec/LSB, a rate
of +10°/sec results in a change of 820 codes, and a digital rate
output of 9012 codes. If an offset error of −20°/sec is introduced,
the output is reduced by 1639 codes (if typical sensitivity is
assumed), resulting in a digital rate output of 6552 codes.
The ADIS16060 SPI port includes five signals: Mode Select 1
MSEL1
MSEL2
(
), Mode Select 2 (
), serial clock (SCLK), data
MSEL1
input (DIN), and data output (DOUT). The
when reading data out of the sensor (DOUT), and the
line is used when configuring the sensor (DIN).
line is used
MSEL2
Selecting Output Data
ADC CONVERSION
Refer to Table 5 to determine the appropriate DIN bit sequence
based on the required data source. Table 2 and Figure 3 provide
the necessary timing details for the input configuration sequence.
The internal successive approximation ADC begins the conversion
MSEL1
process on the falling edge of
and starts to place data
MSB first on the DOUT line at the 6th falling edge of SCLK, as
shown in Figure 2. The entire conversion process takes 20 SCLK
MSEL2
After the
goes high, the last eight DIN bits are loaded
into the internal control register, which represents DB0 to DB7
in Table 5.
MSEL1
cycles. After
goes high, the acquisition process starts in
preparation for the next conversion cycle.
Table 5. DIN Configuration Bit Assignments
Action
DB7
DB6
DB5
DB4
DB3
DB2
DB1
DB0
Measure Angular Rate (Gyro)
Measure Temperature
Measure AIN2
Measure AIN1
Set Positive Self-Test and Output for Angular Rate
Set Negative Self-Test and Output for Angular Rate
0
0
1
0
0
0
0
0
0
1
0
0
1
0
0
0
1
1
0
1
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
1
0
0
0
0
0
0
1
Rev. 0 | Page 10 of 12
ADIS16060
APPLICATIONS INFORMATION
1
0.1
SUPPLY AND COMMON CONSIDERATIONS
Power supply noise and transient behaviors can influence the
accuracy and stability of any sensor-based measurement system.
The ADIS16060 provides 0.2 μF of decoupling capacitance on
the VCC pin. Depending on the level of noise present in the
power supply of the system, the ADIS16060 may not require
any additional decoupling capacitance for this supply.
0.01
SETTING BANDWIDTH
0.001
External Capacitor COUT is used in combination with the on-
chip ROUT resistor to create a low-pass filter to limit the
bandwidth of the ADIS16060 rate response. The –3 dB
frequency set by ROUT and COUT is
0.0001
10
100
1k
10k
100k
FREQUENCY (Hz)
1
fOUT
=
Figure 14. Noise Spectral Density with 2-Pole, Low-Pass Filter (40 Hz and 250 Hz)
(
2 × π × ROUT ×COUT
)
DYNAMIC DIGITAL SENSITIVITY SCALING
and can be well controlled because ROUT has been trimmed
during manufacturing to be 200 kΩ 5ꢀ. Setting the range
with an external resistor impacts ROUT as follows:
This device supports in-system, dynamic, digital sensitivity scaling.
TEMPERATURE MEASUREMENTS
200 kꢁ × REXT
)
When using the temperature sensor, an acquisition time of
greater than 40 ꢂs helps to ensure proper setting and measurement
accuracy. See Table 2 and Figure 2 for details on the definition
of acquisition time.
ROUT
=
(
200 kꢁ + REXT
In general, an additional hardware or software filter is added to
attenuate high frequency noise arising from demodulation spikes
at the gyro’s 14 kHz resonant frequency. The noise spikes at 14 kHz
can be clearly seen in the power spectral density curve shown in
Figure 14.
SELF-TEST FUNCTION
Exercising the self-test function is simple, as shown in this
example.
1. Configure using DIN = 00100010 (positive self-test,
rate selected).
2. Read output.
3. Configure using DIN = 00100000 (positive self-test off,
rate selected)
4. Read output.
5. Calculate the difference between Step 2 and Step 4, and
compare this with the specified self-test output changes in
the Specifications section.
INCREASING MEASUREMENT RANGE
Scaling the measurement range requires the addition of a single
resistor, connected across the RATE and FILT pins. The following
equation provides the proper relationship for selecting the
appropriate resistor:
200 kꢁ
REXT
=
Δ −1
where Δ is the increase in range.
Exercising the negative self-test requires changing the sequence
in Step 1 to DIN = 00100001.
Rev. 0 | Page 11 of 12
ADIS16060
OUTLINE DIMENSIONS
5.010
BSC
(4×)
PIN 1
INDICATOR
2.505
BSC
(8×)
8.35
MAX
0.873 BSC
(16×)
13
16
12
1
7.373
BSC
(2×)
8.20
TYP
0.797 BSC
(12×)
9
4
8
5
0.373 BSC
(16×)
0.200
MIN
(ALL SIDES)
BOTTOM VIEW
TOP VIEW
7.00
TYP
5.20
MAX
SIDE VIEW
Figure 15. 16-Terminal Stacked Land Grid Array [LGA]
(CC-16-1)
Dimensions shown in millimeters
ORDERING GUIDE
Model
Temperature Range
Package Description
Package Option
ADIS16060BCCZ1
ADIS16060/PCBZ1
1 Z = RoHS Compliant Part.
−40°C to +10±°C
16-Terminal Stacked Land Grid Array (LGA)
Evaluation Board
CC-16-1
©2008 Analog Devices, Inc. All rights reserved. Trademarks and
registered trademarks are the property of their respective owners.
D07103-0-1°08ꢁ0)
Rev. 0 | Page 12 of 12
相关型号：
ADIS16100ACC
IC SPECIALTY ANALOG CIRCUIT, PBGA16, 8.20 X 8.20 MM, 5.20 MM HEIGHT, LGA-16, Analog IC:Other
ADI
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