ADIS16006CCCZ [ADI]
Dual-Axis +-5 Accelerometer with SPI Interface; 双轴+ -5加速度计采用SPI接口
| 型号： | ADIS16006CCCZ |
| 厂家： | 
ADI |
| 描述： | Dual-Axis +-5 Accelerometer with SPI Interface |
| 文件： | 总16页 (文件大小：322K) |
| 中文： | 中文翻译 | 下载： | 下载PDF数据表文档文件 |
Dual-Axis ± ± g Accelerometer
with SPI Interface
ADIS16006
FEATURES
GENERAL DESCRIPTION
Dual-axis accelerometer
SPI® digital output interface
Internal temperature sensor
Highly integrated; minimal external components
Bandwidth externally selectable
1.9 mg resolution at 60 Hz
Externally controlled electrostatic self-test
3.0 V to 5.25 V single-supply operation
Low power: <2 mA
The ADIS16006 is a low cost, low power, complete dual-axis
accelerometer with an integrated serial peripheral interface
(SPI). An integrated temperature sensor is also available on the
SPI interface. The ADIS16006 measures acceleration with a full-
scale range of ±± g (minimum). The ADIS16006 can measure
both dynamic acceleration (that is, vibration) and static accel-
eration (that is, gravity).
The typical noise floor is 200 μg/√Hz, allowing signals below
1.9 mg (60 Hz bandwidth) to be resolved.
3500 g shock survival
7.2 mm × 7.2 mm × 3.6 mm package
The bandwidth of the accelerometer is set with optional
capacitors, CX and CY, at the XFILT and YFILT pins. Digital
output data for both axes is available via the serial interface.
APPLICATIONS
Industrial vibration/motion sensing
Platform stabilization
Dual-axis tilt sensing
An externally driven self-test pin (ST) allows the user to verify
the accelerometer functionality.
The ADIS16006 is available in a 7.2 mm × 7.2 mm × 3.6 mm,
12-terminal LGA package.
Tracking, recording, analysis devices
Alarms, security devices
FUNCTIONAL BLOCK DIAGRAM
V
CC
ADIS16006
SCLK
DUAL-AXIS
±5g
ACCELEROMETER
DIN
SERIAL
INTERFACE
DOUT
CS
C
DC
TCS
TEMP
SENSOR
COM
ST
YFILT
XFILT
C
C
X
Y
Figure 1.
Rev. 0
Information furnished by Analog Devices is believed to be accurate and reliable. However, no
responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other
rights of third parties that may result from its use. Specifications subject to change without notice. No
license is granted by implication or otherwise under any patent or patent rights of Analog Devices.
Trademarks and registeredtrademarks arethe property of their respective owners.
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A.
Tel: 781.329.4700
Fax: 781.461.3113
www.analog.com
©2006 Analog Devices, Inc. All rights reserved.
ADIS16006
TABLE OF CONTENTS
Features .............................................................................................. 1
Self-Test ....................................................................................... 11
Serial Interface............................................................................ 11
Accelerometer Serial Interface.................................................. 11
Temperature Sensor Serial Interface........................................ 12
Power Supply Decoupling ......................................................... 12
Setting the Bandwidth ............................................................... 13
Applications....................................................................................... 1
General Description......................................................................... 1
Functional Block Diagram .............................................................. 1
Revision History ............................................................................... 2
Specifications..................................................................................... 3
Timing Characteristics ................................................................ 4
Circuit and Timing Diagrams..................................................... 4
Absolute Maximum Ratings............................................................ 6
ESD Caution.................................................................................. 6
Pin Configuration and Function Descriptions............................. 7
Typical Performance Characteristics ............................................. 8
Theory of Operation ...................................................................... 11
Selecting Filter Characteristics:
The Noise/Bandwidth Trade-Off ............................................. 13
Applications..................................................................................... 14
Second Level Assembly ............................................................. 14
Outline Dimensions....................................................................... 15
Ordering Guide .......................................................................... 15
REVISION HISTORY
3/06—Revision 0: Initial Version
Rev. 0 | Page 2 of 16
ADIS16006
SPECIFICATIONS
TA = −40°C to +12±°C, VCC = ± V, CX = CY = 0 μF, acceleration = 0 g, unless otherwise noted. All minimum and maximum specifications
are guaranteed. Typical specifications are not guaranteed.
Table 1.
Parameter
Conditions
Min
Typ
Max
Unit
ACCELEROMETER SENSOR INPUT
Measurement Range1
Nonlinearity
Package Alignment Error
Alignment Error
Each axis
±±
g
%
% of full scale
X sensor to Y sensor
Each axis
±0.±
±1.±
±0.1
±1.±
±ꢀ.±
degrees
degrees
%
Cross Axis Sensitivity
±3
ACCELEROMETER SENSITIVITY
Sensitivity at XFILT, YFILT
Sensitivity Change due to Temperatureꢀ
ZERO g BIAS LEVEL
ꢀ4ꢀ
ꢀ±6
±0.3
ꢀ7ꢀ
LSB/g
%
Delta from ꢀ±°C
Each axis
0 g Voltage at XFILT, YFILT
0 g Offset vs. Temperature
ACCELEROMETER NOISE PERFORMANCE
Noise Density
190±
ꢀ048
±0.1
ꢀ190
LSB
LSB/°C
@ ꢀ±°C
ꢀ00
μg/√Hz rms
ACCELEROMETER FREQUENCY RESPONSE3, 4
CX, CY Range
RFILT Tolerance
0
ꢀ4
10
40
μF
kΩ
3ꢀ
Sensor Bandwidth
CX = 0μF, CY = 0μF
ꢀ.ꢀ6
±.±
kHz
kHz
Sensor Resonant Frequency
ACCELEROMETER SELF-TEST
Logic Input Low
Logic Input High
ST Input Resistance to COM
0.ꢀ × VCC
307
V
V
kΩ
LSB
0.8 × VCC
30
10ꢀ
±0
ꢀ0±
±
Output Change at XOUT, YOUT
Self-Test 0 to Self-Test 1
VCC = 3 V to ±.ꢀ± V
TEMPERATURE SENSOR
Accuracy
Resolution
Update Rate
Temperature Conversion Time
DIGITAL INPUT
±ꢀ
10
400
ꢀ±
°C
Bits
μs
μs
Input High Voltage (VINH
)
VCC = 4.7± V to ±.ꢀ± V
VCC = 3.0 V to 3.6 V
VCC = 3.0 V to ±.ꢀ± V
VIN = 0 V or VCC
ꢀ.4
ꢀ.1
V
V
V
μA
pF
Input Low Voltage (VINL
)
0.8
10
Input Current
Input Capacitance
DIGITAL OUTPUT
−10
1
10
Output High Voltage (VOH
)
ISOURCE = ꢀ00 μA, VCC = 3.0 V to ±.ꢀ± V
ISINK = ꢀ00 μA
VCC − 0.±
V
V
Output Low Voltage (VOL
)
0.4
Rev. 0 | Page 3 of 16
ADIS16006
Parameter
Conditions
Min
Typ
Max
Unit
POWER SUPPLY
Operating Voltage Range
Quiescent Supply Current
Power-Down Current
Turn-On Time6
3.0
±.ꢀ±
1.9
V
FSCLK = ±0 kSPS
CX, CY = 0.1 μF
1.±
1.0
ꢀ0
mA
mA
ms
1 Guaranteed by measurement of initial offset and sensitivity.
ꢀ Defined as the output change from ambient to maximum temperature or ambient to minimum temperature.
3 Actual bandwidth response controlled by user-supplied external capacitor (CX, CY).
4
See the Setting the Bandwidth section for more information on how to reduce the bandwidth.
± Self-test response changes as the square of VCC.
6 Larger values of CX and CY increase turn-on time. Turn-on time is approximately (160 × (0.00ꢀꢀ + CX or CY) + 4) in milliseconds, where CX and CY are in ꢁF.
TIMING CHARACTERISTICS
TA = −40°C to +12±°C, acceleration = 0 g, unless otherwise noted.
Table 2.
Parameter1, ꢀ
VCC = 3.3 V
VCC = 5 V
Unit
Description
3
fSCLK
10
ꢀ
10
ꢀ
kHz min
MHz max
tCONVERT
tACQ
14.± × tSCLK
1.± × tSCLK
10
14.± × tSCLK
1.± × tSCLK
10
Throughput time = tCONVERT + tACQ = 16 × tSCLK
TCS/CS to SCLK setup time
t1
ns min
ns max
ns max
ns min
ns min
ns min
ns min
ns max
μs typ
4
tꢀ
60
30
Delay from TCS/CS until DOUT three-state disabled
Data access time after SCLK falling edge
Data setup time prior to SCLK rising edge
Data hold time after SCLK rising edge
SCLK high pulse width
4
t3
100
ꢀ0
ꢀ0
0.4 × tSCLK
0.4 × tSCLK
80
7±
ꢀ0
ꢀ0
0.4 × tSCLK
0.4 × tSCLK
80
t4
t±
t6
t7
SCLK low pulse width
TCS/CS rising edge to DOUT high impedance
±
t8
t9
±
±
Power-up time from shutdown
1 Guaranteed by design. All input signals are specified with tR and tF = ± ns (10% to 90% of VCC) and timed from a voltage level of 1.6 V. The 3.3 V operating range spans
from 3.0 V to 3.6 V. The ± V operating range spans from 4.7± V to ±.ꢀ± V.
ꢀ See Figure 3 and Figure 4.
3 Mark/space ratio for the SCLK input is 40/60 to 60/40.
4 Measured with the load circuit in Figure ꢀ and defined as the time required for the output to cross 0.4 V or ꢀ.0 V with VCC = 3.3 V and time for an output to cross 0.8 V or
ꢀ.4 V with VCC = ±.0 V.
± t8 is derived from the measured time taken by the data outputs to change 0.± V when loaded with the circuit in Figure ꢀ. The measured number is then extrapolated
back to remove the effects of charging or discharging the ±0 pF capacitor. This means that the time, t8, quoted in the Timing Characteristics is the true bus relinquish
time of the part and is independent of the bus loading.
CIRCUIT AND TIMING DIAGRAMS
200µA
I
OL
TO OUTPUT
PIN
1.6V
C
L
50pF
200µA
I
OH
Figure 2. Load Circuit for Digital Output Timing Specifications
Rev. 0 | Page 4 of 16
ADIS16006
tACQ
tCONVERT
CS
t6
t1
1
5
6
15
SCLK
DOUT
2
3
4
16
t2
THREE-STATE
t7
t8
t3
THREE-STATE
4 LEADING ZEROS
DB11
DB10
DB9
DB0
t4
t5
DON’T
CARE
DIN
ZERO
ZERO
ZERO
ADD0
ONE
ZERO
PM0
Figure 3. Accelerometer Serial Interface Timing Diagram
TCS
t6
t1
1
11
15
SCLK
DOUT
2
3
4
16
t3
t7
t8
THREE-
STATE
THREE-STATE
LEADING
ZERO
DB0
DB9
DB8
DIN
Figure 4. Temperature Serial Interface Timing Diagram
Rev. 0 | Page ± of 16
ADIS16006
ABSOLUTE MAXIMUM RATINGS
Table 3.
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
Parameter
Rating
Acceleration (Any Axis, Unpowered) 3±00 g
Acceleration (Any Axis, Powered)
3±00 g
VCC
−0.3 V to +7.0 V
All Other Pins
(COM − 0.3 V) to
(VCC + 0.3 V)
Output Short-Circuit Duration
(Any Pin to Common)
Indefinite
Operating Temperature Range
Storage Temperature
−40°C to +1ꢀ±°C
−6±°C to +1±0°C
Table 4. Package Characteristics
Package Type
θCA
θJC
Device Weight
0.3 grams
1ꢀ-Lead LGA
ꢀ00°C/W
ꢀ±°C/W
ESD CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on
the human body and test equipment and can discharge without detection. Although this product features
proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy
electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance
degradation or loss of functionality.
1.0755
8× BSC
0.670
8× BSC
5.873
2×
1.127
12× BSC
0.500
12× BSC
Figure 5. Second Level Assembly Pad Layout
Rev. 0 | Page 6 of 16
ADIS16006
PIN CONFIGURATION AND FUNCTION DESCRIPTIONS
12
11
10
1
2
3
9
8
7
TCS
DOUT
DIN
XFILT
YFILT
NC
ADIS16006
TOP VIEW
(Not to Scale)
4
5
6
NC = NO CONNECT
Figure 6. Pin Configuration
Table 5. Pin Function Descriptions
Pin No. Mnemonic Description
1
ꢀ
3
TCS
Temperature Chip Select. Active low logic input. This input frames the serial data transfer for the temperature
sensor output.
Data Out, Logic Output. The conversion of the ADIS16006 is provided on this output as a serial data stream.
The bits are clocked out on the falling edge of the SCLK input.
Data In, Logic Input. Data to be written into the ADIS16006’s control register is provided on this input and
is clocked into the register on the rising edge of SCLK.
DOUT
DIN
4
±, 7
6
COM
NC
ST
Common. Reference point for all circuitry on the ADIS16006.
No Connect.
Self-Test Input. Active high logic input. Simulates a nominal 0.7± g test input for diagnostic purpose.
8
YFILT
Y Channel Filter Node. Used in conjunction with an optional external capacitor to band limit the noise
contribution from the accelerometer.
9
XFILT
CS
X Channel Filter Node. Used in conjunction with an optional external capacitor to band limit the noise
contribution from the accelerometer.
Chip Select. Active low logic input. This input provides the dual function of initiating the accelerometer
conversions on the ADIS16006 and framing the serial data transfer for the accelerometer output.
10
11
1ꢀ
VCC
SCLK
Power Supply Input. The VCC range for the ADIS16006 is 3.0 V to ±.ꢀ± V.
Serial Clock, Logic Input. SCLK provides the serial clock for accessing data from the part and writing serial data
to the control register. This clock input is also used as the clock source for the ADIS16006’s conversion process.
Rev. 0 | Page 7 of 16
ADIS16006
TYPICAL PERFORMANCE CHARACTERISTICS
25
20
15
10
5
AVERAGE = 2040.66
STANDARD DEVIATION = 23.19
262
261
B3-Y
B3-X
260
B1-Y
B5-X
259
B2-X
B1-X
258
257
B5-Y
B4-X
B2-Y
B4-Y
256
255
254
0
–50
–25
0
25
50
75
100
125
150
TEMPERATURE (°C)
OUTPUT (LSB)
Figure 10. X-Axis 0 g Bias at 25°C
Figure 7. Sensitivity vs. Temperature ( 1 g Stimulus)
40
35
30
25
20
15
10
5
AVERAGE = 2055.875
STANDARD DEVIATION = 6.464
2048
2046
2044
2042
2040
2038
5.25V
AVG AT 5.25V
AVG AT 4.75V
AVG AT 3.60V
AVG AT 3.30V
AVG AT 3.00V
0
–40
–20
0
20
40
60
80
100
120
TEMPERATURE (°C)
OUTPUT (LSB)
Figure 11. Y-Axis 0 g Bias at 25°C
Figure 8. X-Axis 0 g Bias vs. Temperature
2048
2047
2046
2045
2044
2043
2042
2041
2040
2039
2038
60
50
40
30
20
10
0
+125°C
+25°C
–40°C
3.0
3.5
4.0
4.5
5.0
5.5
80 85 90 95 100 105 110 115 120 125 130 135 140
V
(V)
NOISE (µg/ Hz)
CC
Figure 12. Noise (X-Axis) at VCC = 5 V, 25°C
Figure 9. X-Axis 0 g Bias vs. Supply Voltage
Rev. 0 | Page 8 of 16
ADIS16006
45
40
35
30
25
20
15
10
5
250
200
150
100
50
AVG AT 5.25V
AVG AT 5.00V
AVG AT 4.75V
AVG AT 3.60V
AVG AT 3.30V
AVG AT 3.00V
0
0
80 85 90 95 100 105 110 115 120 125 130 135 140
–50
0
50
100
150
NOISE (µg/ Hz)
TEMPERATURE (°C)
Figure 13. Noise (Y-Axis) at VCC = 5 V, 25°C
Figure 16. Self-Test X-Axis vs. Temperature
40
35
30
25
20
15
10
5
250
230
210
190
170
150
130
110
90
AVERAGE = 202.2137
STANDARD DEVIATION = 12.09035
+125°C
+25°C
–40°C
70
0
50
110
130
150
170
190
210
230
250
270
290
3.0
3.5
4.0
4.5
5.0
5.5
OUTPUT (LSB)
V
(V)
CC
Figure 14. X-Axis Self-Test at 25°C, VCC = 5 V
Figure 17. Self-Test X-Axis vs. Supply Voltage
40
35
30
25
20
15
10
5
1.8
1.7
1.6
1.5
1.4
1.3
1.2
1.1
1.0
AVERAGE = 82.89281
STANDARD DEVIATION = 4.908012
+125°C
+25°C
–40°C
0
40 45 50 55 60 65 70 75 80 85 90 95 100 105 110
OUTPUT (LSB)
3.0
3.5
4.0
4.5
5.0
5.5
V
(V)
CC
Figure 15. X-Axis Self-Test at 25°C, VCC = 3.3 V
Figure 18. Supply Current vs. Supply Voltage
Rev. 0 | Page 9 of 16
ADIS16006
1.3
1.2
1.1
1.0
0.9
0.8
0.7
0.6
45
35
25
15
5
V
V
= 5.0V
= 3.3V
CC
CC
+125°C
+25°C
–40°C
–5
3.0
3.5
4.0
4.5
5.0
5.5
1.15 1.19 1.23 1.27 1.31 1.35 1.39 1.43 1.47 1.51 1.55 1.59
CURRENT (mA)
V
(V)
CC
Figure 19. Supply Current at 25°C
Figure 21. Power-Down Supply Current vs. Supply Voltage
0.6
60
50
40
30
20
10
0
V
V
= 5.0V
= 3.3V
CC
0.4
0.2
0
CC
–0.2
–0.4
–0.6
–0.8
–1.0
1
10
100
0.70 0.74 0.78 0.82 0.86 0.90 0.94 0.98 1.02 1.06 1.10
CURRENT (mA)
FREQUENCY (MHz)
Figure 20. Power-Down Supply Current
Figure 22. Sampling Error vs. Sampling Frequency
Rev. 0 | Page 10 of 16
ADIS16006
THEORY OF OPERATION
Accelerometer Control Register
MSB
The ADIS16006 is a low cost, low power, complete dual-axis
accelerometer with an integrated serial peripheral interface
(SPI) and an integrated temperature sensor whose output is
also available on the SPI interface. The ADIS16006 is capable
of measuring acceleration with a full-scale range of ±± g
(minimum). The ADIS16006 can measure both dynamic
acceleration (that is, vibration) and static acceleration (that is,
gravity).
LSB
PM0
DONTC
ZERO
ZERO
ZERO
ZERO
ONE
ZERO
Table 6. Accelerometer Control Register Bit Functions
Bit
Mnemonic Comments
DONTC Don’t care. Can be 1 or 0.
These bits should be held low.
7
6, ±, 4 ZERO
SELF-TEST
3
ADD0
This address bit selects the X-axis or Y-axis
outputs. A 0 selects the X-axis; a 1 selects
the Y-axis.
The ST pin controls the self-test feature. When this pin is set to
VCC, an electrostatic force is exerted on the beam of the acceler-
ometer. The resulting movement of the beam allows the user to
test if the accelerometer is functional. The typical change in
output is 801 mg (corresponding to 20± LSB) for VCC = ±.0 V.
This pin may be left open-circuit or connected to common in
normal use. The ST pin should never be exposed to voltage
greater than VCC + 0.3 V. If the system design is such that this
condition cannot be guaranteed (that is, multiple supply voltages
present), a low VF clamping diode between ST and VCC is
recommended.
ꢀ
1
0
ONE
ZERO
PM0
This bit should be held high.
This bit should be held low.
This bit selects the operation mode for
the accelerometer; set to 0 for normal
operation and 1 for power-down mode.
Power-Down
By setting PM0 to 1 when updating the accelerometer control
register, the ADIS16006 is put into a shutdown mode. The
information stored in the control register is maintained during
shutdown. The ADIS16006 changes modes as soon as the control
register is updated. Therefore, if the part is in shutdown mode
and PM0 is changed to 0, the part powers up on the 16th SCLK
rising edge.
SERIAL INTERFACE
CS
The serial interface on the ADIS16006 consists of five wires:
,
TCS
, SCLK, DIN, and DOUT. Both accelerometer axes and the
temperature sensor data are available on the serial interface.
CS TCS
are used to select the accelerometer or tem-
ADD0
The
and
By setting ADD0 to 0 when updating the accelerometer control
register, the X-axis output is selected. By setting ADD0 to 1, the
Y-axis output is selected.
CS
TCS
cannot be
perature sensor outputs, respectively.
active at the same time.
and
The SCLK input provides access to data from the internal data
registers.
ZERO
ZERO is defined as the logic low level.
ACCELEROMETER SERIAL INTERFACE
ONE
Figure 3 shows the detailed timing diagram for serial interfacing to
the accelerometer in the ADIS16006. The serial clock provides
ONE is defined as the logic high level.
CS
the conversion clock.
initiates the conversion process and
DONTC
data transfer and also frames the serial data transfer for the
accelerometer output. The accelerometer output is sampled on
the second rising edge of the SCLK input after the falling edge
DONTC is defined as don’t care and can be a low or high logic
level.
Accelerometer Conversion Details
CS
of the . The conversion requires 16 SCLK cycles to complete.
CS CS
remains low, the next digital conversion is initiated. The details
for the control register bit functions are shown in Table 6.
Every time the accelerometer is sampled, the sampling function
discharges the internal CX or CY filtering capacitors by up to 2%
of their initial values (assuming no additional external filtering
capacitors have been added). The recovery time for the filter
capacitor to recharge is approximately 10 μs. Thus, sampling the
accelerometer at a rate of 10 kSPS or less does not induce a
sampling error. However, as sampling frequencies increase
above 10 kSPS, one can expect sampling errors to attenuate the
actual acceleration levels.
The rising edge of
puts the bus back into three-state. If
Rev. 0 | Page 11 of 16
ADIS16006
TCS
Note that if the
the same temperature value is output onto the DOUT line every
TCS
is brought low every 3±0 μs (±30%) or less,
TEMPERATURE SENSOR SERIAL INTERFACE
Read Operation
time without changing. It is recommended that the
be brought low every 3±0 μs (±30%) or less. The ±30% covers
process variation. The
outside this range.
line not
Figure 4 shows the timing diagram for a serial read from the
TCS
temperature sensor. The
line enables the SCLK input.
TCS
should become active (high to low)
Ten bits of data and a leading 0 are transferred during a read
operation. Read operations occur during streams of 16 clock
pulses. The serial data can be received into two bytes to
accommodate the entire 10-bit data stream. If only eight bits
of resolution are required, then the data can be received into
a single byte. At the end of the read operation, the DOUT line
remains in the state of the last bit of data clocked out until
goes high, at which time the DOUT line from the temperature
sensor goes three-state.
The device is designed to autoconvert every 3±0 μs. If the
temperature sensor is accessed during the conversion process,
an internal signal is generated to prevent any update of the
temperature value register during the conversion. This prevents
the user from reading back spurious data. The design of this
feature results in this internal lockout signal being reset only at
TCS
TCS
the start of the next autoconversion. Therefore, if the
goes active before the internal lockout signal is reset to its
inactive mode, the internal lockout signal is not reset. To ensure
TCS
line
Write Operation
Figure 4 also shows the timing diagram for the serial write to
the temperature sensor. The write operation takes place at the
same time as the read operation. Data is clocked into the
control register on the rising edge of SCLK. DIN should remain
low for the entire cycle.
that no lockout signal is set, bring
low at a greater time
than 3±0 μs (±30%). As a result, the temperature sensor is not
interrupted during a conversion process.
In the automatic conversion mode, every time a read or write
operation takes place, the internal clock oscillator is restarted at
the end of the read or write operation. The result of the conversion
is typically available 2± μs later. Reading from the device before
conversion is complete provides the same set of data.
Temperature Sensor Control Register
MSB
LSB
ZERO
ZERO
ZERO
ZERO
ZERO
ZERO
ZERO
ZERO
Table 8. Temperature Sensor Data Format
Table 7. Temperature Sensor Control Register Bit Functions
Temperature
Digital Output (DB9 … DB0)
Bit
Mnemonic
Comments
–40°C
11 0110 0000
7 to 0
ZERO
All bits should be held low.
–ꢀ±°C
11 1001 1100
ZERO
–0.ꢀ±°C
0°C
11 1111 1111
00 0000 0000
ZERO is defined as the logic low level.
+0.ꢀ±°C
+10°C
+ꢀ±°C
+±0°C
+7±°C
00 0000 0001
00 0010 1000
00 0110 0100
00 1100 1000
Output Data format
The output data format for the temperature sensor is twos
complement. Table 8 shows the relationship between the digital
output and the temperature.
01 0010 1100
+100°C
+1ꢀ±°C
01 1001 0000
01 1111 0100
Temperature Sensor Conversion Details
The ADIS16006 features a 10-bit digital temperature sensor that
allows accurate measurement of the ambient device temperature.
POWER SUPPLY DECOUPLING
The conversion clock for the temperature sensor is internally
generated so no external clock is required except when reading
from and writing to the serial port. In normal mode, an internal
clock oscillator runs the automatic conversion sequence. A con-
version is initiated approximately every 3±0 μs. At this time,
the temperature sensor wakes up and performs a temperature
conversion. This temperature conversion typically takes 2± μs,
at which time the temperature sensor automatically shuts down.
The result of the most recent temperature conversion is avail-
able in the serial output register at any time. Once the conversion is
finished, an internal oscillator starts counting and is designed to
time out every 3±0 μs. The temperature sensor then powers up
and does a conversion.
The ADIS16006 integrates two decoupling capacitors that are
0.047 ꢀF in value. For local operation of the ADIS16006, no
additional power supply decoupling capacitance is required.
However, if the system power supply presents a substantial
amount of noise, additional filtering can be required. If
additional capacitors are required, connect the ground terminal
of each of these capacitors directly to the underlying ground
plane. Finally, note that all analog and digital grounds should be
referenced to the same system ground reference point.
Rev. 0 | Page 1ꢀ of 16
ADIS16006
SETTING THE BANDWIDTH
With the single pole roll-off characteristic, the typical noise of
the ADIS16006 is determined by
The ADIS16006 has provisions for band limiting the acceler-
ometer. Capacitors can be added at the XFILT and YFILT pins
to implement further low-pass filtering for antialiasing and
noise reduction. The equation for the 3 dB bandwidth is
rmsNoise = (200 μg/root Hz) x (root (BW x 1.±7))
At 100 Hz, the noise is
F
−3dB = 1/(2π(32 kΩ) × (C(XFILT, YFILT) + 2200 pF))
or more simply,
−3dB = ± μF/(C(XFILT, YFILT) + 2200 pF)
rmsNoise = (200 μg/root Hz) x (root (100 x 1.±7)) =2.± mg
Often, the peak value of the noise is desired. Peak-to-peak noise
can be estimated only by statistical methods. Table 10 is useful
for estimating the probabilities of exceeding various peak
values, given the rms value.
F
The tolerance of the internal resistor (RFILT) can vary typically as
much as ±2±% of its nominal value (32 kΩ); thus, the bandwidth
varies accordingly.
Table 10. Estimation of Peak-to-Peak Noise
Peak-to-Peak Percentage of Time That Noise Exceeds
Value
Nominal Peak-to-Peak Value
A minimum capacitance of 0 pF for CXFILT and CYFILT is
allowable.
ꢀ × rms
4 × rms
6 × rms
8 × rms
3ꢀ%
4.6%
0.ꢀ7%
0.006%
Table 9. Filter Capacitor Selection, CXFILT and CYFILT
Bandwidth (Hz)
Capacitor (μF)
1
4.7
10
±0
100
ꢀ00
400
ꢀꢀ±0
0.47
0.10
0.047
0.0ꢀꢀ
0.01
0
12
11
10
DIGITAL OUTPUT (IN LSBs)
X-AXIS: 1792
Y-AXIS: 2048
4
5
6
9
8
7
3
2
1
SELECTING FILTER CHARACTERISTICS:
THE NOISE/BANDWIDTH TRADE-OFF
DIGITAL OUTPUT (IN LSBs)
X-AXIS: 2048
DIGITAL OUTPUT (IN LSBs)
X-AXIS: 2048
Top View
Not to Scale
The accelerometer bandwidth selected ultimately determines
the measurement resolution (smallest detectable acceleration).
Filtering can be used to lower the noise floor, which improves
the resolution of the accelerometer. Resolution is dependent on
the analog filter bandwidth at XFILT and YFILT.
Y-AXIS: 2304
Y-AXIS: 1792
1
2
3
7
8
9
6
5
4
DIGITAL OUTPUT (IN LSBs)
X-AXIS: 2304
DIGITAL OUTPUT (IN LSBs)
X-AXIS: 2048
The ADIS16006 has a typical bandwidth of 2.2± kHz with no
external filtering. The analog bandwidth may be further
decreased to reduce noise and improve resolution.
Y-AXIS: 2048
Y-AXIS: 2048
10
11
12
The ADIS16006 noise has the characteristics of white Gaussian
noise, which contributes equally at all frequencies and is described
in terms of μg/√Hz (that is, the noise is proportional to the
square root of the accelerometer’s bandwidth). The user should
limit bandwidth to the lowest frequency needed by the applica-
tion to maximize the resolution and dynamic range of the
accelerometer.
Figure 23. Output Response vs. Orientation
Rev. 0 | Page 13 of 16
ADIS16006
APPLICATIONS
SECOND LEVEL ASSEMBLY
Table 11.
Condition
The ADIS16006 can be attached to the second-level assembly
board using SN63 (or equivalent) or lead-free solder. Figure 24
and Table 11 provide acceptable solder reflow profiles for each
solder type. Note that these profiles cannot be the optimum
profile for the user’s application. In no case shall 260°C be
exceeded. It is recommended that the user develop a reflow
profile based upon the specific application. In general, keep
in mind the lowest peak temperature and shortest dwell time
above the melt temperature of the solder result in less shock
and stress to the product. In addition, evaluating the cooling
rate and peak temperature can result in a more reliable assembly.
Profile Feature
Sn63/Pb37 Pb-free
3°C/sec max 3°C/sec max
Average Ramp Rate (TL to TP)
Preheat
Minimum Temperature (TSMIN
)
)
100°C
1±0°C
1±0°C
ꢀ00°C
Maximum Temperature (TSMAX
60 sec to
1ꢀ0 sec
60 sec to
1±0 sec
Time (TSMIN to TSMAX) (ts)
TSMAX to TL
Ramp-Up Rate
3°C/sec
3°C/sec
Time Maintained
Above Liquidous (TL)
CRITICAL ZONE
Liquidous Temperature (TL)
Time (tL)
183°C
60 sec to
1±0 sec
ꢀ17°C
60 sec to
1±0 sec
T
TO T
tP
L
P
T
P
RAMP-UP
T
L
Peak Temperature (TP)
ꢀ40°C +
0°C/−±°C
ꢀ60°C +
0°C/−±°C
tL
T
SMAX
T
Time Within ±°C of Actual Peak
Temperature (tp)
10 sec to
30 sec
ꢀ0 sec to
40 sec
SMIN
tS
Ramp-Down Rate
6°C/sec max 6°C/sec max
6 min max 8 min max
RAMP-DOWN
PREHEAT
Time ꢀ±°C to Peak Temperature
t
25°C TO PEAK
TIME
Figure 24. Acceptable Solder Reflow Profiles
Rev. 0 | Page 14 of 16
ADIS16006
OUTLINE DIMENSIONS
7.33 MAX
SQ
1.3025
BSC
PIN 1
INDICATOR
10
12
1.00
BSC
9
7
1
PIN 1
INDICATOR
0.797
BSC
3
6
4
BOTTOM VIEW
0.373 BSC
(12 PLCS)
TOP VIEW
5.00 TYP
0.227 BSC
(4 PLCS)
3.60
MAX
SIDE VIEW
Figure 25. 12-Terminal Land Grid Array [LGA]
(CC-12-1)
Dimensions shown in millimeters
ORDERING GUIDE
Model
ADIS16006CCCZ1
Temperature Range
Package Description
Package Option
CC-1ꢀ-1
−40°C to +1ꢀ±°C
1ꢀ-Terminal Land Grid Array (LGA)
Evaluation Board
ADIS16006/PCB
1 Z = Pb-free part.
Rev. 0 | Page 1± of 16
ADIS16006
NOTES
©2006 Analog Devices, Inc. All rights reserved. Trademarks and
registered trademarks are the property of their respective owners.
D05975-0-3/06(0)
Rev. 0 | Page 16 of 16
相关型号：
ADIS16100ACC
IC SPECIALTY ANALOG CIRCUIT, PBGA16, 8.20 X 8.20 MM, 5.20 MM HEIGHT, LGA-16, Analog IC:Other
ADI
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