TLP251(TP1) [TOSHIBA]

Optocoupler - IC Output, 1 CHANNEL LOGIC OUTPUT OPTOCOUPLER, DIP-8;
TLP251(TP1)
型号: TLP251(TP1)
厂家: TOSHIBA    TOSHIBA
描述:

Optocoupler - IC Output, 1 CHANNEL LOGIC OUTPUT OPTOCOUPLER, DIP-8

输出元件 光电
文件: 总8页 (文件大小:198K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
TLP251  
TOSHIBA Photocoupler GaAAs Ired & Photo-IC  
TLP251  
Inverter For Air Conditionor  
Unit in mm  
Induction Heating  
Transistor Inverter  
Power MOS FET Gate Drive  
IGBT Gate Drive  
The TOSHIBA TLP251 consists of a GaAAs light emitting diode and a  
integrated photodetector.  
This unit is 8-lead DIP package.  
TLP251 is suitable for gate driving circuit of IGBT or power MOS FET.  
Especially TLP251 is capable of “direct” gate drive of lower power IGBTs.  
(~15A)  
l Input threshold current: I =5mA(max.)  
F
l Supply current (I ): 11mA(max.)  
l Supply voltage (V ): 1035V  
CC  
CC  
TOSHIBA  
Weight: 0.54g  
1110C4  
l Output current (I ): ±0.4A(max.)  
O
l Switching time (t ): 1µs(max.)  
/ t  
pLH pHL  
l Isolation voltage: 2500Vrms(min.)  
l UL recognized: UL1577, file no.E67349  
Pin Configuration (top view)  
1
8
7
6
Schematic  
2
3
I
CC  
V
CC  
8
I
F
(T 1)  
r
4
5
2
3
V
F
6
1 : N.C.  
V
O
2 : Anode  
3 : Cathode  
4 : N.C.  
I
O
(T 2)  
r
GND  
5 : Gnd  
5
6 : V (Output)  
O
7 : N.C.  
8 : V  
CC  
A 0.1µF bypass capcitor must be connected  
between pin 8 and 5(see Note 5).  
Truth Table  
Tr1  
Tr2  
Input  
LED  
On  
Off  
On  
Off  
Off  
On  
1
2002-09-25  
TLP251  
Maximum Ratings (Ta = 25°C)  
Characteristic  
Symbol  
Rating  
20  
Unit  
mA  
Forward current  
I
F
Forward current derating  
I / Ta  
- 0.36  
mA / °C  
A
F
(Ta 70°C)  
Peak transient forward  
current  
I
1
FPT  
(Note 1)  
Reverse voltage  
V
5
V
R
Junction temperature  
Hpeak output current  
T
125  
°C  
j
(P 2.0µs, f 15kHz)  
I
- 0.4  
A
A
W
OPH  
(Note 2)  
(Note 2)  
Lpeak output current  
(P 2.0µs, f 15kHz)  
W
I
0.4  
OPL  
(Ta 70°C)  
35  
24  
35  
24  
Output voltage  
Supply voltage  
V
V
O
(Ta = 85°C)  
(Ta 70°C)  
(Ta = 85°C)  
V
V
CC  
Output voltage derating  
V / Ta  
- 0.73  
- 0.73  
V / °C  
V / °C  
O
(Ta 70°C)  
Supply voltage derating  
V / Ta  
CC  
(Ta 70°C)  
Junction temperature  
T
f
125  
25  
°C  
kHz  
°C  
j
Operating frequency  
(Note 3)  
Operating temperature range  
Storage temperature range  
Lead soldering temperature(10s)  
Isolation voltage (AC, 1min.,  
R.H.60%)  
T
-20~85  
-55~125  
260  
opr  
T
°C  
stg  
sol  
T
°C  
BV  
2500  
Vrms  
S
(Note 4)  
(Note 1) Pulse width P 1µs, 300pps  
W
(Note 2) Expornential waveform  
(Note 3) Expornential waveform, I  
-0.25A(2.0µs), I  
+0.25A(2.0µs)  
OPL  
OPH  
(Note 4) Device considerd a two terminal device: Pins 1, 2, 3 and 4 shorted together, and pins 5, 6,  
7 and 8 shorted together.  
(Note 5) A ceramic capacitor(0.1µF)should be connected from pin 8 to pin 5 to stabilize the  
operation of the high gain linear ampifier. Failure to provide the bypassing may impair the  
swiching property.The total lead length between capacitor and coupler should not  
exceed 1cm.  
2
2002-09-25  
TLP251  
Recommended Operating Conditions  
Characteristic  
Symbol  
Min.  
Typ.  
Max.  
Unit  
Input current, on  
I
7
0
10  
mA  
V
8
F(ON)  
Input voltage, off  
Supply voltage  
V
0.8  
F(OFF)  
V
10  
30  
70  
20  
85  
V
CC  
Peak output current  
I
/ I  
±0.1  
A
OPH OPL  
Operating temperature  
T
-20  
°C  
25  
opr  
Electrical Characteristics (Ta = 20~70°C, unless otherwise specified)  
Test  
Characteristic  
Symbol  
Cir-  
Test Condition  
Min.  
Typ.*  
Max.  
Unit  
cuit  
Input forward voltage  
V
I
I
= 10 mA , Ta = 25°C  
= 10 mA  
1.6  
1.8  
V
F
F
F
Temperature coefficient of  
forward voltage  
V / Ta  
-2.0  
mV / °C  
F
Input reverse current  
I
V
= 5V, Ta = 25°C  
R
10  
µA  
pF  
R
Input capacitance  
C
V = 0 , f = 1MHz , Ta = 25°C  
45  
250  
T
I
= 10mA  
= 4V  
=0  
F
Hlevel  
I
3
-0.1  
-0.25  
OPH  
V
=30V  
V
8
-
6  
CC  
Output current  
Output voltage  
A
V
(*1)  
I
F
Llevel  
Hlevel  
I
2
4
5
0.1  
0.2  
OPL  
V
= 2.5V  
6-5  
V
= +15V, V  
R = 200, I = 5mA  
= -15V  
EE1  
CC1  
L
V
OH  
11  
13.2  
F
V
= +15V, V  
R = 200, V = 0.8V  
= -15V  
EE1  
CC1  
L
V
Llevel  
Hlevel  
OL  
-14.5  
-12.5  
F
V
= 30V, I = 10mA  
F
CC  
7.5  
8
11  
I
Ta = 25°C  
CCH  
V
V
= 30V, I = 10mA  
F
CC  
mA  
mA  
Supply current  
= 30V, I = 0mA  
CC  
F
Llevel  
Output  
I
Ta = 25°C  
CCL  
V
= 30V, I = 0mA  
11  
5
CC  
F
Threshould input  
current  
V
= +15V, V  
R = 200, V > 0V  
= -15V  
CC1  
L
EE1  
I
FLH  
1.2  
L H”  
O
Output  
H L”  
Threshold input  
voltage  
V
= +15V, V  
= -15V  
CC1  
L
EE1  
V
FLH  
0.8  
10  
V
V
35  
R = 200, V < 0V  
O
Supply voltage  
V
CC  
Capacitance  
(input-output)  
Vs = 0 , f = 1MHz  
Ta = 25  
C
s
pF  
1.0  
2.0  
Vs = 500V, Ta = 25℃  
R.H. 60%  
12  
14  
R
s
1×10  
Resistance (input-output)  
* All typical values are at Ta=25°C  
10  
(*1): Duration of I time 50µs  
O
3
2002-09-25  
TLP251  
Switching Characteristics (Ta = 20~70°C, unless otherwise specified)  
Test  
Characteristic  
Symbol  
Cir-  
Test Condition  
Min.  
Typ.*  
Max.  
Unit  
µs  
cuit  
Propagation  
delay time  
LH  
HL  
t
t
0.25  
0.25  
1.0  
1.0  
pLH  
pHL  
I
V
= 8mA  
F
CC1  
= +15V, V  
= -15V  
EE1  
6
Output rise time  
Output fall time  
t
t
r
R = 200 Ω  
L
f
Common mode transient  
immunity at high level  
output  
V
V
= 600V, I = 8mA,  
F
CM  
CC  
C
7
7
-5000  
V / µs  
V / µs  
MH  
= 30V, Ta = 25℃  
Common mode transient  
immunity at low level  
output  
V
V
= 600V, I = 0mA,  
F
= 30V, Ta = 25℃  
CM  
CC  
C
5000  
ML  
*All typical values are at Ta=25  
4
2002-09-25  
TLP251  
Test Circuit 1:  
Test Circuit 2: I  
OPL  
8
1
1
8
5
0.1µF  
V
CC  
A
I
OPL  
4
4
V
6-5  
Test Circuit 3: I  
Test Circuit 4: V  
OPH  
OH  
8
8
1
1
V
V
CC1  
CC  
0.1µF  
V
0.1µF  
V
I
I
8-6  
F
F
R
L
A
V
OH  
I
OPH  
4
4
V
EE1  
Test Circuit 5: V  
OL  
8
1
V
CC1  
0.1µF  
V
V
F
R
L
V
OL  
4
V
EE1  
5
2002-09-25  
TLP251  
Test Circuit 6: t  
t
t t  
pLH, pHL, r, f  
8
I
F
t
r
t
f
I
F
0.1µF  
V
V
CC1  
V
80%  
OH  
O
R
L
V
GND  
O
80%  
V
OL  
t HL  
p
t LH  
p
100Ω  
V
EE1  
Test Circuit 7: C  
C
MH, ML  
8
1
I
0.1µF  
F
SW  
V
CC  
A
B
V
O
4
V
CM  
+
-
600V  
90%  
V
480(V)  
t (µs)  
r
CM  
10%  
C
C
=
ML  
t
t
f
r
SW: A(I = 8mA)  
F
480(V)  
t (µs)  
f
=
C
MH  
MH  
26V  
V
O
3V  
C
HL  
SW: B(I = 0)  
F
CML (CMH) is the maximum rate of rise (fall) of the common mode voltage that can be  
sustained with the output voltage in the low (high) state.  
6
2002-09-25  
TLP251  
I
– V  
V /V – I  
F F F  
F
F
100  
2.6  
2.4  
2.2  
2.0  
1.8  
Ta = 25 °C  
50  
30  
10  
5
3
1
0.5  
0.3  
0.1  
0.05  
0.03  
1.6  
1.4  
0.01  
1.4  
1.8  
2.0  
100  
100  
1
1.0  
1.2  
1.6  
0.1  
0.3  
3
5
10  
30  
0.5  
Forward voltage  
V
(V)  
Forward current  
I
F
(mA)  
F
I
Ta  
V
Ta  
F
CC  
40  
30  
20  
40  
30  
20  
10  
0
10  
0
20  
60  
20  
60  
0
40  
80  
0
40  
80  
100  
Ambient temperature Ta (°C)  
Ambient temperature Ta (°C)  
I
I
Ta  
OPH, OPL  
0.5  
0.4  
0.3  
0.2  
PW 2.0 µs, f 15 KHz  
0.1  
0
20  
60  
0
40  
80  
Ambient temperature Ta (°C)  
7
2002-09-25  
TLP251  
RESTRICTIONS ON PRODUCT USE  
000707EBC  
·
TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor  
devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical  
stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of  
safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of  
such TOSHIBA products could cause loss of human life, bodily injury or damage to property.  
In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as  
set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and  
conditions set forth in the “Handling Guide for Semiconductor Devices,” or “TOSHIBA Semiconductor Reliability  
Handbook” etc..  
·
The TOSHIBA products listed in this document are intended for usage in general electronics applications  
(computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances,  
etc.). These TOSHIBA products are neither intended nor warranted for usage in equipment that requires  
extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or  
bodily injury (“Unintended Usage”). Unintended Usage include atomic energy control instruments, airplane or  
spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments,  
medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in this  
document shall be made at the customer’s own risk.  
·
Gallium arsenide (GaAs) is a substance used in the products described in this document. GaAs dust and fumes  
are toxic. Do not break, cut or pulverize the product, or use chemicals to dissolve them. When disposing of the  
products, follow the appropriate regulations. Do not dispose of the products with other industrial waste or with  
domestic garbage.  
·
·
The products described in this document are subject to the foreign exchange and foreign trade laws.  
The information contained herein is presented only as a guide for the applications of our products. No  
responsibility is assumed by TOSHIBA CORPORATION for any infringements of intellectual property or other  
rights of the third parties which may result from its use. No license is granted by implication or otherwise under  
any intellectual property or other rights of TOSHIBA CORPORATION or others.  
·
The information contained herein is subject to change without notice.  
8
2002-09-25  

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