HN7G08FE [TOSHIBA]

General-Purpose Amplifier Applications; 通用运算放大器应用
HN7G08FE
型号: HN7G08FE
厂家: TOSHIBA    TOSHIBA
描述:

General-Purpose Amplifier Applications
通用运算放大器应用

运算放大器
文件: 总6页 (文件大小:226K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
HN7G08FE  
TOSHIBA Multichip Discrete Device  
HN7G08FE  
Unit: mm  
General-Purpose Amplifier Applications  
Switching and Muting Switch Applications  
Q1  
Low saturation voltage: V  
(1) = 15 mV (typ.)  
CE (sat)  
@I = 10 mA/I = 0.5 mA  
C
B
Large collector current: I = 400 mA (max)  
C
Q1: 2SA1955F  
Q2: RN1106F  
(E1)  
1. EMITTER1  
2. BASE1  
3. COLLECTOR2  
4. EMITTER2  
5. BASE2  
(B1)  
(C2)  
(E2)  
(B2)  
(C1)  
Q1 Absolute Maximum Ratings (Ta = 25°C)  
Characteristic  
Symbol  
Rating  
Unit  
6. COLLECTOR1  
Collector-base voltage  
Collector-emitter voltage  
Emitter-base voltage  
Collector current  
V
V
V
15  
12  
5  
V
V
CBO  
CEO  
EBO  
JEDEC  
V
JEITA  
I
400  
50  
mA  
mA  
C
Base current  
I
B
TOSHIBA  
2-2J1E  
Weight: 0.003 g (typ.)  
Q2 Absolute Maximum Ratings (Ta = 25°C)  
Characteristic  
Symbol  
Rating  
Unit  
Collector-base voltage  
Collector-emitter voltage  
Emitter-base voltage  
Collector current  
V
V
V
50  
50  
5
V
V
CBO  
CEO  
EBO  
V
I
100  
mA  
C
Q1, Q2 Common Absolute Maximum Ratings (Ta = 25°C)  
Characteristic  
Symbol  
P *  
Rating  
Unit  
Collector power dissipation  
Junction temperature  
100  
150  
mW  
°C  
C
T
j
Storage temperature range  
T
stg  
55~150  
°C  
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the  
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if  
the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum  
ratings.  
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook  
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test  
report and estimated failure rate, etc).  
* Total rating.  
1
2007-11-01  
HN7G08FE  
Q1 Electrical Characteristics (Ta = 25°C)  
Test  
Circuit  
Characteristic  
Symbol  
Test Condition  
= 15 V, I = 0  
Min  
Typ.  
Max  
Unit  
Collector cutoff current  
Emitter cutoff current  
I
V
V
100  
100  
nA  
nA  
CBO  
CB  
EB  
E
I
=5 V, I = 0  
C
EBO  
DC current gain  
(Note)  
h
V
=2 V, I =10 mA  
300  
1000  
FE  
CE  
C
V
V
I
I
I
=10 mA, I =0.5 mA  
15  
30  
CE(sat) (1)  
CE(sat) (2)  
C
C
C
B
Collector-emitter  
saturation voltage  
mV  
=200 mA, I =10 mA  
110 250  
0.87 1.2  
B
Base-emitter saturation voltage  
Transition frequency  
V
=200 mA, I =10 mA  
V
BE(sat)  
B
f
V
V
=2 V, I =10 mA  
130  
4.2  
MHz  
pF  
T
CE  
CB  
C
Collector output capacitance  
C
=10 V, I = 0, f = 1 MHz  
E
ob  
Turn-on time  
t
40  
280  
65  
on  
Switching time  
ns  
Storage time  
Fall time  
t
stg  
t
f
I
= −I = 5 mA  
B2  
B1  
Note: hFE classification A(A): 300~600, B(B): 500~1000  
) marking symbol  
(
Q2 Electrical Characteristics (Ta = 25°C)  
Test  
Circuit  
Characteristic  
Collector cutoff current  
Emitter cutoff current  
Symbol  
Test Condition  
= 50 V, I = 0  
Min  
Typ.  
Max  
Unit  
I
I
V
V
V
V
100  
500  
CBO  
CEO  
CB  
CE  
EB  
CE  
E
nA  
= 50 V, I = 0  
B
I
= 5 V, I = 0  
0.074  
0.138  
mA  
EBO  
C
DC current gain  
h
= 5 V, I = 10 mA  
80  
FE  
C
Collector-emitter saturation voltage  
V
V
I
= 5 mA, I = 0.25 mA  
0.1  
0.3  
V
V
CE(sat)  
C
B
Input voltage (ON)  
V
V
= 0.2 V, I = 5 mA  
0.7  
1.3  
I (ON)  
CE  
C
Input voltage (OFF)  
Transition frequency  
Collector output capacitance  
Input resistor  
V
V
V
= 5 V, I = 0.1 mA  
0.5  
250  
3
0.8  
V
MHz  
pF  
I (OFF)  
CE  
CE  
CB  
C
f
= 10 V, I = 5 mA  
C
T
C
= 10 V, I = 0, f = 1 MHz  
E
ob  
3.29  
0.09  
4.7  
0.1  
6.11  
0.11  
kΩ  
R1  
R1/R2  
Resistor ratio  
Marking  
Equivalent Circuit (Top View)  
Type Name  
hFE Rank  
5
6
4
6
5
4
3
Q2  
76A  
Q1  
1
1
2
2
3
2
2007-11-01  
HN7G08FE  
Q1  
IC - VCE  
hFE - IC  
-0.5  
-0.4  
-0.3  
-0.2  
-0.1  
10000  
1000  
100  
-6  
-5  
COMMON EMITTER  
VCE = -2V  
-4  
Ta = 100°C  
-3  
25  
-2  
-1  
-25  
IB=-0.5mA  
COMMON EMITTER  
Ta = 25°C  
-
0
10  
-1  
-2  
-3  
-4  
-5  
-1  
-10  
-100  
-1000  
0
-0.1  
COLLECTOR CURRENT IC (A)  
COLLECTOR-EMITTER VOLTAGE VCE (V)  
VCE(sat) - IC  
VBE(sat) - IC  
-1000  
-100  
-10  
-10  
COMMON EMITTER  
IC/IB = 20  
Ta = 25  
COMMON EMITTER  
IC/IB = 20  
Ta = 100°C  
-25  
-1  
25  
-1  
-0.1  
-1  
-10  
-100  
-1000  
-1  
-10  
-100  
-1000  
-0.1  
-0.1  
COLLECTOR CURRENT IC (A)  
COLLECTOR CURRENT IC (A)  
IC - VBE  
Cob - VCB  
-1000  
100  
IE = 0  
f = 1MHz  
Ta = 25  
-100  
-10  
-1  
Ta = 100°C  
10  
-25  
25  
COMMON EMITTER  
VCE = -2V  
1
0
-0.4  
-0.8  
-1.2  
-1.6  
-1  
-10  
-100  
-0.1  
COLLECTOR-BASE VOLTAGE VCB (V)  
BASE-EMITTER VOLTAGE VBE (V)  
3
2007-11-01  
HN7G08FE  
Q2  
4
2007-11-01  
HN7G08FE  
(Q1, Q2 common)  
P * Ta  
C
200  
150  
100  
50  
0
0
25  
50  
75  
100  
125  
150  
175  
AMBIENT TEMPERATURE Ta (°C)  
*:Total rating  
5
2007-11-01  
HN7G08FE  
RESTRICTIONS ON PRODUCT USE  
20070701-EN GENERAL  
The information contained herein is subject to change without notice.  
TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor  
devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical  
stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of safety  
in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such  
TOSHIBA products could cause loss of human life, bodily injury or damage to property.  
In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as  
set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and  
conditions set forth in the “Handling Guide for Semiconductor Devices,” or “TOSHIBA Semiconductor Reliability  
Handbook” etc.  
The TOSHIBA products listed in this document are intended for usage in general electronics applications  
(computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances,  
etc.).These TOSHIBA products are neither intended nor warranted for usage in equipment that requires  
extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or  
bodily injury (“Unintended Usage”). Unintended Usage include atomic energy control instruments, airplane or  
spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments,  
medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in his  
document shall be made at the customer’s own risk.  
The products described in this document shall not be used or embedded to any downstream products of which  
manufacture, use and/or sale are prohibited under any applicable laws and regulations.  
The information contained herein is presented only as a guide for the applications of our products. No responsibility  
is assumed by TOSHIBA for any infringements of patents or other rights of the third parties which may result from  
its use. No license is granted by implication or otherwise under any patents or other rights of TOSHIBA or the third  
parties.  
Please contact your sales representative for product-by-product details in this document regarding RoHS  
compatibility. Please use these products in this document in compliance with all applicable laws and regulations  
that regulate the inclusion or use of controlled substances. Toshiba assumes no liability for damage or losses  
occurring as a result of noncompliance with applicable laws and regulations.  
6
2007-11-01  

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