2SK3662_06 [TOSHIBA]

Silicon N Channel MOS Type Switching Regulator, DC−DC Converter, Motor Drive; 硅N沟道MOS型开关稳压器, DC- DC转换器,电机驱动器
2SK3662_06
型号: 2SK3662_06
厂家: TOSHIBA    TOSHIBA
描述:

Silicon N Channel MOS Type Switching Regulator, DC−DC Converter, Motor Drive
硅N沟道MOS型开关稳压器, DC- DC转换器,电机驱动器

驱动器 转换器 稳压器 开关 电机
文件: 总6页 (文件大小:189K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
2SK3662  
TOSHIBA Field Effect Transistor Silicon N Channel MOS Type (π-MOSII)  
2SK3662  
Switching Regulator, DCDC Converter, Motor Drive  
Applications  
Unit: mm  
Low drain-source ON resistance: R  
= 9.4 m(typ.)  
DS (ON)  
High forward transfer admittance: |Y | = 55 S (typ.)  
fs  
Low leakage current: I  
= 100 μA (max) (V  
= 60 V)  
DSS  
DS  
Enhancement mode : V = 1.3 to 2.5 V (V  
= 10 V, I = 1 mA)  
D
th  
DS  
Absolute Maximum Ratings (Ta = 25°C)  
Characteristics  
Drain-source voltage  
Symbol  
Rating  
Unit  
V
60  
60  
V
V
V
DSS  
Drain-gate voltage (R  
Gate-source voltage  
= 20 kΩ)  
V
GS  
DGR  
V
±20  
35  
GSS  
I
D
DC  
(Note 1)  
Drain current  
A
I
105  
35  
Pulse (Note 1)  
DP  
Drain power dissipation (Tc = 25°C)  
P
W
mJ  
A
D
JEDEC  
JEITA  
Single pulse avalanche energy  
E
I
204  
35  
AS  
SC-67  
2-10R1B  
(Note 2)  
Avalanche current  
AR  
TOSHIBA  
Repetitive avalanche energy  
Weight: 1.9 g (typ.)  
E
3.5  
mJ  
AR  
(Note 3)  
Channel temperature  
T
150  
°C  
°C  
ch  
Storage temperature range  
T
55 to 150  
stg  
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in  
temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e.  
operating temperature/current/voltage, etc.) are within the absolute maximum ratings. Please design the appropriate  
reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling Precautions”/Derating Concept and  
Methods) and individual reliability data (i.e. reliability test report and estimated failure rate, etc).  
Thermal Characteristics  
Characteristics  
Symbol  
Max  
Unit  
Thermal resistance, channel to case  
Thermal resistance, channel to ambient  
R
3.57  
62.5  
°C/ W  
°C/ W  
th (chc)  
R
th (cha)  
Note 1: Ensure that the channel temperature does not exceed 150°C.  
Note 2: = 25 V, T = 25°C (initial), L = 227 μH, I = 35 A, R = 25 Ω  
V
DD  
ch  
AR  
G
Note 3: Repetitive rating: pulse width limited by maximum channel temperature  
This transistor is an electrostatic-sensitive device. Please handle with caution.  
1
2006-11-17  
2SK3662  
Electrical Characteristics (Ta = 25°C)  
Characteristics  
Gate leakage current  
Symbol  
Test Condition  
= ±16 V, V = 0 V  
Min  
Typ.  
Max  
Unit  
I
V
V
60  
40  
1.3  
28  
±10  
100  
μA  
μA  
GSS  
GS  
DS  
DS  
Drain cut-off current  
I
= 60 V, V  
= 0 V  
DSS  
GS  
GS  
GS  
V
V
I
I
= 10 mA, V  
= 10 mA, V  
= 0 V  
(BR) DSS  
(BR) DSX  
D
D
Drain-source breakdown voltage  
Gate threshold voltage  
V
V
= −20 V  
V
V
V
V
V
= 10 V, I = 1 mA  
2.5  
19  
th  
DS  
GS  
GS  
DS  
D
= 4 V, ID = 18 A  
12.5  
9.4  
55  
Drain-source ON resistance  
R
mΩ  
S
DS (ON)  
= 10 V, I = 18 A  
12.5  
D
Forward transfer admittance  
Input capacitance  
|Y |  
fs  
= 10 V, I = 18 A  
D
C
C
5120  
300  
500  
iss  
V
= 10 V, V  
= 0 V, f = 1 MHz  
GS  
pF  
Reverse transfer capacitance  
Output capacitance  
DS  
rss  
C
oss  
I
= 18 A  
Rise time  
t
r
6
19  
D
10 V  
GS  
0 V  
V
OUT  
V
Turn-on time  
Switching time  
t
on  
ns  
Fall time  
t
f
20  
V
30 V  
DD  
Duty 1%, t = 10 μs  
Turn-off time  
t
115  
91  
w
off  
Total gate charge  
Q
g
(gate-source plus gate-drain)  
V
I
48 V, V  
DD  
= 35 A  
= 10 V,  
GS  
nC  
Gate-source charge  
Q
gs  
70  
21  
D
Gate-drain (“miller”) charge  
Q
gd  
Source-Drain Diode Ratings and Characteristics (Ta = 25°C)  
Characteristics  
Symbol  
Test Condition  
Min  
Typ.  
Max  
35  
Unit  
A
Continuous drain reverse current  
I
DR  
(Note 1)  
(Note 1)  
Pulse drain reverse current  
I
105  
A
DRP  
Forward voltage (diode)  
Reverse recovery time  
Reverse recovery charge  
V
I
I
= 35 A, V  
= 0 V  
60  
58  
1.5  
V
DS2F  
DR1 GS  
= 35 A, V = 0 V,  
GS  
t
ns  
nC  
rr  
DR  
dI /dt = 50 A/μs  
DR  
Q
rr  
Marking  
K3662  
Part No. (or abbreviation code)  
Lot No.  
A line indicates  
lead (Pb)-free package or  
lead (Pb)-free finish.  
2
2006-11-17  
2SK3662  
I
– V  
I
– V  
DS  
D
6
DS  
4
D
4
40  
30  
20  
10  
0
100  
80  
60  
40  
20  
0
6
Common source  
10  
3.5  
4.2  
Tc = 25°C  
Pulse test  
8
10  
3.8  
3.3  
3.6  
3.4  
V
= 3 V  
GS  
Common source  
Tc = 25°C  
V
= 3 V  
GS  
Pulse test  
0
0.2  
0.4  
0.6  
0.8  
1.0  
0
1
2
3
4
5
Drain-source voltage  
V
DS  
(V)  
Drain-source voltage  
V
DS  
(V)  
I
D
– V  
V
– V  
DS GS  
GS  
100  
80  
60  
40  
20  
0
1.0  
0.8  
0.6  
0.4  
0.2  
0
Common source  
= 10 V  
Common source  
Tc = 25°C  
V
DS  
Pulse test  
Pulse test  
I
= 35 A  
D
17  
9
100  
25  
Tc = −55°C  
0
1
2
3
4
5
0
4
8
12  
16  
20  
Gate-source voltage  
V
GS  
(V)  
Gate-source voltage  
V
GS  
(V)  
Y – I  
fs  
D
R
– I  
DS (ON)  
D
300  
100  
50  
30  
Common source  
Common source  
Tc = 25°C  
Pulse test  
V
= 10 V  
DS  
Pulse test  
Tc = 55°C  
4
10  
50  
30  
25  
100  
V
= 10 V  
GS  
5
3
10  
5
1
1
1
3
5
10  
30  
50  
100  
3
5
10  
30  
50  
100  
Drain current  
I
(A)  
Drain current  
I
(A)  
D
D
3
2006-11-17  
2SK3662  
R
Tc  
I
– V  
DR DS  
DS (ON)  
25  
20  
15  
10  
5
100  
10  
1
Common source  
Pulse test  
17 A, 9 A  
10  
5
I
= 35 A  
D
3
V
= 4 V  
GS  
V
= 10 V  
GS  
= 35 A, 17 A, 9 A  
I
D
Common source  
Tc = 25°C  
V
= 0 V  
GS  
Pulse test  
0
80  
40  
0
40  
80  
120  
160  
0
0.2 0.4 0.6 0.8 1.0 1.2 1.4 1.6  
Case temperature Tc (°C)  
Drain-source voltage  
V
DS  
(V)  
Capacitance – V  
V
Tc  
th  
DS  
10000  
1000  
100  
5
4
3
2
1
0
Common source  
= 10 V  
V
DS  
= 1 mA  
C
iss  
I
D
Pulse test  
C
oss  
C
rss  
Common source  
= 0 V  
V
GS  
f = 1 MHz  
Ta = 25°C  
80  
40  
0
40  
80  
120  
160  
10  
0.1  
Case temperature Tc (°C)  
1
10  
100  
Drain-source voltage  
V
DS  
(V)  
P
Tc  
Dynamic input/output characteristics  
D
40  
30  
20  
10  
0
80  
16  
Common source  
= 10 A  
Common source  
V
I
= 35 A  
D
DS  
= 1 mA  
I
Tc = 25°C  
Pulse test  
D
Pulse test  
60  
40  
20  
0
12  
8
V
DS  
12  
24  
V
= 48 V  
DD  
4
V
GS  
0
160  
0
40  
80  
120  
160  
0
40  
80  
120  
Case temperature Tc (°C)  
Total gate charge  
Q
(nC)  
g
4
2006-11-17  
2SK3662  
r
th  
– t  
w
3
1
Duty = 0.5  
0.3  
0.1  
0.2  
0.1  
0.05  
0.02  
P
DM  
0.03  
0.01  
0.00  
t
0.01  
Single pulse  
T
Duty = t/T  
R
= 3.57°C/W  
th (ch-c)  
10 μ  
100 μ  
1 m  
10 m  
100 m  
1
10  
Pulse width  
t
(S)  
w
Safe operating area  
E
– T  
ch  
AS  
300  
100  
250  
I
max (pulsed)*  
D
200  
150  
100  
50  
t = 1 ms*  
I
max (continuous)  
D
30  
10  
t = 10 ms*  
3
1
0
25  
* Single nonrepetitive pulse  
Tc = 25°C  
50  
75  
100  
125  
150  
0.3  
0.1  
Channel temperature (initial)  
T
(°C)  
ch  
Curves must be derated linearly  
with increase in temperature.  
V
max  
DSS  
0.1  
1
10  
100  
B
VDSS  
Drain-source voltage  
V
DS  
(V)  
15 V  
I
AR  
15 V  
V
V
DD  
DS  
Test circuit  
Waveform  
1
B
2
VDSS  
R
V
= 25 Ω  
G
=
L I ⋅  
Ε
AS  
2
B
V
= 25 V, L = 227 μH  
VDSS  
DD  
DD  
5
2006-11-17  
2SK3662  
RESTRICTIONS ON PRODUCT USE  
20070701-EN  
The information contained herein is subject to change without notice.  
TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor  
devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical  
stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of  
safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of  
such TOSHIBA products could cause loss of human life, bodily injury or damage to property.  
In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as  
set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and  
conditions set forth in the “Handling Guide for Semiconductor Devices,” or “TOSHIBA Semiconductor Reliability  
Handbook” etc.  
The TOSHIBA products listed in this document are intended for usage in general electronics applications  
(computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances,  
etc.).These TOSHIBA products are neither intended nor warranted for usage in equipment that requires  
extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or  
bodily injury (“Unintended Usage”). Unintended Usage include atomic energy control instruments, airplane or  
spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments,  
medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in his  
document shall be made at the customer’s own risk.  
The products described in this document shall not be used or embedded to any downstream products of which  
manufacture, use and/or sale are prohibited under any applicable laws and regulations.  
The information contained herein is presented only as a guide for the applications of our products. No  
responsibility is assumed by TOSHIBA for any infringements of patents or other rights of the third parties which  
may result from its use. No license is granted by implication or otherwise under any patents or other rights of  
TOSHIBA or the third parties.  
Please contact your sales representative for product-by-product details in this document regarding RoHS  
compatibility. Please use these products in this document in compliance with all applicable laws and regulations  
that regulate the inclusion or use of controlled substances. Toshiba assumes no liability for damage or losses  
occurring as a result of noncompliance with applicable laws and regulations.  
6
2006-11-17  

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