BQ26500PW [TI]

SINGLE-CELL LI-ION AND BATTERY GAS GAUGE IC FOR HANDHELD APPLICATIONS; 单节锂离子电池和电池电量监测计IC为手持式应用
BQ26500PW
型号: BQ26500PW
厂家: TEXAS INSTRUMENTS    TEXAS INSTRUMENTS
描述:

SINGLE-CELL LI-ION AND BATTERY GAS GAUGE IC FOR HANDHELD APPLICATIONS
单节锂离子电池和电池电量监测计IC为手持式应用

电池
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SLUS567A − JUNE, 2003 − REVISED OCTOBER 2003  
ꢘꢐꢜ ꢈꢋꢖꢝ  
t  
FEATURES  
APPLICATIONS  
D
Reports Accurate State-of-Charge in Li-Ion  
and Li-Pol Cells, No System Processor  
Calculations Needed  
D
D
D
D
D
D
PDAs  
Smart Phones  
MP3 Players  
D
D
Reports Cell Temperature and Voltage  
Digital Cameras  
High-Accuracy Coulometric Charge and  
Discharge Current Integration with  
Automatic Offset Cancellation  
Internet Appliances  
Handheld Devices  
D
D
D
Requires No Offset Calibration  
Programmable Input/Output Port  
DESCRIPTION  
Internal Time-Base Eliminates External  
Crystal Oscillator  
The bq26500, the first in the bqJUNIORt family  
of advanced gas gauge device for handhald  
applications, is a highly accurate standalone  
single-cell Li-Ion and Li-Pol battery capacity  
monitoring and reporting device targeted at space  
limited portable applications. The device monitors  
a voltage drop across a small current sense  
resistor connected in series with the battery to  
determine charge and discharge activity of the  
battery. Compensations for battery temperature,  
self-discharge, and rate of discharge are applied  
to the charge counter to provide available capacity  
across a wide range of operating conditions.  
Battery capacity is automatically recalibrated, or  
learned, in the course of a discharge cycle from full  
to empty. Internal registers include available  
capacity, cell temperature and voltage,  
state-of-charge, and status and control registers.  
D
Four Automatic Low-Power Operating Modes  
− Active: < 100 µA  
− Sleep: < 2.5 µA  
− Ship: < 1.7 µA  
− Hibernate: < 1.5 µA  
Small 8-Pin TSSOP Package  
D
SIMPLIFIED APPLICATION  
PACK+  
UDG−03038  
Li-Ion  
or  
Li-Pol  
+
bq26500  
1
2
3
4
RBI GPIO  
VCC SRP  
VSS SRN  
HDQ BAT  
8
7
6
5
The bq26500 can operate directly from single-cell  
Li-Ion and Li-Pol batteries and communicates to  
the system over a simple one-wire bi-directional  
serial interface. The 5-kbits/s HDQ bus interface  
reduces communication overhead in the external  
microcontroller.  
HDQ  
Protection  
Controller  
PACK−  
Battery Pack  
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of  
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.  
ꢔꢩ  
Copyright 2003, Texas Instruments Incorporated  
ꢥ ꢩ ꢦ ꢥꢞ ꢟꢲ ꢡꢠ ꢤ ꢫꢫ ꢪꢤ ꢢ ꢤ ꢣ ꢩ ꢥ ꢩ ꢢ ꢦ ꢭ  
1
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SLUS567A − JUNE, 2003 − REVISED OCTOBER 2003  
ABSOLUTE MAXIMUM RATINGS  
over operating free-air temperature range unless otherwise noted  
(1)  
bq26500  
UNIT  
Supply voltage range, V  
CC  
(all with respect to V  
)
SS  
−0.3 to 7.0  
Input voltage range at SRP, SRN, RBI, and BAT (all with respect to V  
)
−0.3 to V  
+ 0.3 V  
SS  
CC  
V
HDQ, GPIO (with respect to V  
)
−0.3 to 7.0  
SS  
Input voltage  
GPIO (with respect to V ) during EEPROM programming only  
SS  
−0.3 to 22.0  
5
Output sink current at GPIO, HDQ  
Operating free-air temperature range, T  
mA  
−20 to 70  
65°C to 150°C  
−40°C to 125°C  
300  
A
Storage temperature range, T  
stg  
°C  
Junction temperature range, T  
J
Lead temperature 1,6 mm (1/16 inch) from case for 10 seconds  
(1)  
Stresses beyond those listed under ”absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only,  
and functional operation of the device at these or any other conditions beyond those indicated under ”recommended operating conditions” is  
not implied. Exposure to Absolute Maximum Rated conditions for extended periods may affect device reliability  
RECOMMENDED OPERATING CONDITIONS  
MIN  
2.6  
−20  
−100  
NOM  
MAX  
4.5  
UNIT  
V
Supply voltage, V  
CC  
Operating free-air temperature, T  
70  
°C  
J
Input voltage range at SRP and SRN, (with respect to V  
)
100  
mV  
SS  
ELECTRICAL CHARACTERISTICS  
T = −20°C to 70°C, T = T 2.6 V V 4.5 V (unless otherwise noted)  
CC  
J
J
A,  
PARAMETER  
INPUT CURRENTS  
TEST CONDITIONS  
MIN  
TYP  
MAX  
UNIT  
I
Active current  
V
> V  
60  
1.2  
0.9  
0.6  
100  
2.5  
1.7  
1.5  
20  
CC(ACT)  
CC CC(min)  
I
Sleep current  
CC(SLP)  
µA  
I
Ship current  
CC(SHP)  
I
Hibernate current  
RBI current  
0 V < V  
CC  
< V  
(POR)  
CC(POR)  
RBI pin only,  
V
CC  
< V  
(POR)  
nA  
V
V
POR threshold  
POR threshold hysteresis  
2.05  
2.55  
(POR)  
100  
mV  
Input impedance on BAT pin  
10  
10  
MΩ  
Input impedance on SRP, SRN pins  
VOLTAGE MEASUREMENT  
Measurement range  
V
CC  
= V  
I(BAT)  
2.6  
4.5  
20  
V
Reported voltage resolution  
1
2
mV  
s
Reported accuracy  
Voltage update time  
−20  
TEMPERATURE MEASUREMENT  
Reported temperature resolution  
0.25  
2
°K  
Reported temperature accuracy  
Temperature update time  
−3  
3
s
2
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SLUS567A − JUNE, 2003 − REVISED OCTOBER 2003  
ELECTRICAL CHARACTERISTICS(continued)  
T = −20°C to 70°C, T = T 2.6 V V  
A, CC  
4.5 V (unless otherwise noted)  
J
J
PARAMETER  
TIME MEASUREMENT  
TEST CONDITIONS  
MIN  
TYP  
MAX  
UNIT  
f
f
Internal oscillator frequency  
Internal oscillator frequency  
−3.5%  
−2.5%  
+1.0%  
+1.0%  
+2.5%  
+2.5%  
OSC  
T
A
= 0°C to 50°C  
OSC  
CAPACITY MEASUREMENT  
Voltage-to-frequency converter offset  
Voltage-to-frequency converter gain  
15  
µV  
1%  
(3)  
variabilty  
Voltage-to-frequency input  
(V − V  
−100  
100  
mV  
)
SRN  
SRP  
(1)  
EEPROM PROGRAMMING (V  
CC  
3.0 V, 20°C T 35°C)  
A
t
t
t
Programming voltage rise time  
Programming voltage high time  
Programming voltage fall time  
Programming voltage  
1
1
RISE  
PROG  
FALL  
V
= 21 V  
20  
20  
100  
ms  
PROG  
V
Applied to GPIO pin  
Current into GPIO pin  
22  
3
V
PROG  
I
EEPROM programming current  
mA  
PROG  
IO PORT (GPIO) AND SERIAL INTERFACE (HDQ)  
V
V
V
V
High-level input voltage  
1.9  
IH  
Low-level input voltage  
0.7  
0.4  
0.4  
3
IL  
V
GPIO low-level output voltage  
HDQ low-level output voltage  
HDQ internal pull-down current  
I
I
= 0.3 mA  
= 2 mA  
OL  
OL  
OL  
OL  
I
µA  
HDQPD  
(2)  
STANDARD SERIAL COMMUNICATION (HDQ) TIMING  
t
t
t
t
t
t
t
t
t
Break timing  
190  
40  
(B)  
Break recovery time  
Host bit window timing  
Host sends 1 time  
(BR)  
190  
17  
(CYCH)  
(HW1)  
(HW0)  
(RSPS)  
(CYCD)  
(DW1)  
(DW0)  
50  
145  
320  
260  
50  
Host sends 0 time  
100  
190  
190  
32  
µs  
bq26500 to host response time  
bq26500 bit window timing  
bq26500 sends 1 time  
bq26500 sends 0 time  
80  
145  
(1)  
(2)  
(3)  
Maximum number of programming cycles on the EEPROM is 10 and data retention time is 10 years at T =85°C  
See Figure 1.  
Not a production tested parameter.  
A
The following timing diagrams describe break and break recovery timing (a), host transmitted bit timing (b),  
bq26500 transmitted bit timing (c), and bq26500 to host response timing (d).  
3
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SLUS567A − JUNE, 2003 − REVISED OCTOBER 2003  
(a)  
t
t
(BR)  
(B)  
(b)  
(c)  
t
t
(HW1)  
(DW1)  
t
t
(HW0)  
(DW0)  
t
t
(CYCD)  
(CYCH)  
(d)  
1−bit  
R/W  
7−Bit Address  
8−Bit Data  
Break  
UDG−03039  
t
(RSPS)  
Figure 1. HDQ Bit Timing Diagrams  
PIN ASSIGNMENTS  
TERMINAL  
I/O  
DESCRIPTION  
NAME  
BAT  
NO.  
5
I
Battery voltage sense input  
GPIO  
HDQ  
RBI  
8
I/O General-purpose input/output port  
I/O Single-wire HDQ serial interface  
4
1
I
I
I
I
I
Register back-up input  
SRN  
SRP  
VCC  
VSS  
6
Current sense input (negative)  
Current sense input (positive)  
7
2
V
supply input  
CC  
Ground input  
3
PW PACKAGE  
(TOP VIEW)  
1
2
3
4
8
7
6
5
RBI  
VCC  
VSS  
HDQ  
GPIO  
SRP  
SRN  
BAT  
AVAILABLE OPTIONS  
PACKAGED  
DEVICES  
T
A
MARKINGS  
(1)  
−20°C to 70°C  
bq26500PW  
26500  
(1)  
The PW package is available taped and reeled. Add R suffix to device type (e.g. bq26500PWR) to  
order quantities of 2,000 devices per reel.  
4
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SLUS567A − JUNE, 2003 − REVISED OCTOBER 2003  
PACK+  
R5  
1 MΩ  
Li-Ion  
+
or  
1
RBI  
GPIO  
8
Li-Pol  
C4  
0.1 µF  
bq26500  
R1  
100 kΩ  
2
3
4
VCC  
VSS  
HDQ  
SRP  
SRN  
BAT  
7
6
5
C3  
0.1 µF  
C1  
0.1 µF  
ESD Protection  
R
0.02Ω  
S
R4  
R3  
HDQ  
100 Ω  
100 Ω  
R2  
100 kΩ  
D1  
5.6 V  
Protection  
Controller  
C2  
0.1 µF  
PACK−  
Battery Pack  
UDG−03041  
Figure 2. Typical Application Circuit  
Temperature  
Compensated  
Precision Oscillator  
Bandgap  
Reference and  
Bias  
Clock  
Generator  
VCC  
2
4
8
HDQ  
System I/O  
and Control  
EEPROM  
GPIO  
SCPU  
SRP  
SRN  
7
6
Autocalibrating and  
Autocompensating  
VFC  
RAM  
1
3
RBI  
VSS  
Temperature  
Sensor  
ADC  
BAT  
5
UDG−03040  
Figure 3. Functional Block Diagram  
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APPLICATION INFORMATION  
FUNCTIONAL DESCRIPTION  
The bq26500 determines battery capacity by monitoring the amount of charge input to or removed from a Li-Ion  
or Li-Pol battery. The bq26500 measures discharge and charge currents, monitors the battery for low voltage  
thresholds, and compensates for temperature and self-discharge rate. Current is measured across a small  
value series resistor between the negative terminal of the battery and the pack ground (see R in Figure 2).  
S
Available capacity is reported with a resolution of 0.003/R (mAh). Time-to-empty (TTE) reporting in minutes  
S
at host-provided at-rate currents allow the requirements for host based calculations to be greatly reduced or  
eliminated; reading a single register pair provides useful and meaningful information to the application’s end  
user.  
Figure 2 shows a typical application circuit. Differential sense of the voltage across the current sense resistor,  
R , improves device performance, leading to an improvement in reported time-to-empty accuracy. In the typical  
S
application, the GPIO pin can be used as a general-purpose programmable I/O port. An internal pull-down on  
the HDQ line ensures that the device detects a logic “0” on the HDQ line and automatically enters the low power  
sleep mode when the system power is switched off or the pack is removed. A 100-kpull-up to V  
can be  
CC  
added to the HDQ line to disable this feature. The bq26500 can operate directly from a single Li-Ion or Li-Pol  
cell.  
Measurements  
As shown in the Figure 3, the bq26500 uses a fully differential, dynamically balanced voltage-to-frequency  
converter (VFC) for charge and discharge counting and an analog-to-digital converter (ADC) for battery voltage  
and temperature measurement. Both VFC and ADC are automatically compensated for offset. No user  
calibration or compensation is required.  
Charge and Discharge Counting  
The bq26500 uses a voltage-to-frequency converter (VFC) to perform a continuous integration of the voltage  
waveform across a small value sense resistor in the negative lead of the battery, as shown in Figure 2. The  
integration of the voltage across the sense resistor is the charge added or removed from the battery. Since the  
VFC directly integrates the waveform, the shape of the current waveform through the sense resistor has no  
effect on the measurement accuracy. The low-pass filter that feeds the sense resistor voltage to the bq26500  
SRP and SRN inputs serves to filter out system noise and does not affect the measurement accuracy, since  
the low-pass filter does not change the integrated value of the waveform.  
Offset Calibration  
The offset voltage of the VFC measurement must be very low to be able to measure small signal levels  
accurately. The bq26500 provides an auto-compensation feature to cancel the internal voltage offset error  
across SRP and SRN for maximum charge measurement accuracy.  
NOTE:NO CALIBRATION IS REQUIRED. See the Layout Considerations section for details on  
minimizing PCB induced offset across the SRP and SRN pins.  
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APPLICATION INFORMATION  
Digital Magnitude Filter  
The digital magnitude filter (DMF) threshold can be set in EEPROM to indicate a threshold below which any  
charge or discharge accumulation is ignored. This allows setting a threshold above the maximum VFC offset  
expected from the device and PCB combination. This ensures that when no charge or discharge current is  
present, the measured capacity change by the bq26500 is zero. Note that even a small PCB offset can add up  
to a large error over a long period. In addition to setting the threshold above the largest offset expected, the DMF  
should be set below the minimum signal level to be measured. Since the measured signal can only be measured  
as accurately as the VFC offset induced from the PCB, the sense resistor value should be large enough to allow  
the minimum current level to provide a signal level substantially higher than the maximum offset voltage.  
Conversely, the sense resistor must be small enough to meet the system requirement for insertion loss as well  
as keep the maximum voltage across the sense resistor below the 100-mV maximum that the VFC can  
accurately measure.  
The DMF threshold is programmed in EEPROM in increments of 6 µV. Programming a zero in the DMF value  
disables the DMF function and no VFC counts are ignored.  
Voltage  
The bq26500 monitors the battery voltage through the BAT pin and reports an offset corrected value through  
the internal registers. The bq26500 also monitors the voltage for the end-of-discharge voltage (EDV) thresholds.  
The EDV threshold levels are used to determine when the battery has reached an empty state.  
Temperature  
The bq26500 uses an integrated temperature sensor to monitor the pack temperature. The temperature  
measurements reported through the internal registers are used to adjust charge and discharge rate  
compensations, and self-discharge capacity loss estimation.  
RBI Input  
The register back-up input pin, RBI, is used with an external capacitor to provide backup potential to the internal  
registers when V drops below the power-on-reset voltage V . V is output on RBI when V is above  
CC  
(POR) CC  
CC  
V
, charging the capacitor. Figure 2 shows an optional 1-Mresistor from RBI pin to VCC. This allows the  
(POR)  
device to maintain RAM register data when the battery voltage is below V  
and above 1.3 V. The bq26500  
(POR)  
checks for RAM corruption by storing redundant copies of the high bytes of NAC and LMD. After a reset, the  
bq26500 compares the redundant NAC and LMD values and verifies the accuracy of 2 checkbyte values. If the  
redundant copies match and the checkbytes are correct, NAC and LMD are retained and the CI bit in FLAGS  
is left unchanged. If these checks are not correct, NAC is cleared, LMD is initialized from EEPROM, and the  
CI bit in FLAGS is set to “1”. All other RAM is initialized on all resets.  
Layout Considerations  
The auto-compensating VFC approach effectively cancels the internal offset voltage within the bq26500, but  
any external offset caused by PCB layout is not cancelled. This makes it critical to pay special attention to the  
PCB layout. To obtain optimal performance, the decoupling capacitor from V  
to V and the filter capacitors  
CC  
SS  
from SRP and SRN to V should be placed as closely as possible to the bq26500, with short trace runs to both  
SS  
signal and VSS pins. All low-current V connections should be kept separate from the high-current discharge  
SS  
path from the battery and should tie into the high current trace at a point directly next to the sense resistor. This  
should be a trace connection to the edge or inside of the sense resistor connection, so that no part of the V  
interconnections carry any load current and no portion of the high-current PCB trace is included in the effective  
SS  
sense resistor (i.e. Kelvin connection).  
7
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APPLICATION INFORMATION  
Gas Gauge Operation  
Figure 4 illustrates an operational overview of the gas gauge function.  
Discharge Current  
Self-Discharge Timer  
Charge Current  
INPUTS  
Temperature  
Compensation  
_
_
+
_
+
+
Nominal Available  
Charge (NAC)  
Last Measured  
Discharge (LMD)  
Learning Count  
Register (LCR)  
COMPUTATIONS  
Qualified  
Transfer  
Rate and  
Temperature  
Compensation  
Temperature, Voltage,  
Average Current,  
Other Data  
OUTPUTS  
Compensated  
Available Charge  
HDQ Interface  
UDG−03042  
Figure 4. Operational Overview  
The bq26500 measures the capacity of the battery during actual use conditions and updates the last measured  
discharge (LMD) register with the latest measured value. The bq26500 retains the learned LMD value unless  
a full reset occurs. By measuring the capacity that the battery delivers as it is discharged from full to the EDV1  
threshold without any disqualifying events, the bq26500 learns the capacity of the battery. During normal use  
conditions, the bq26500 should learn a new capacity only after a full discharge. Learning cycles are disqualified  
by several abnormal conditions (see list at end of section). In the event that a learning cycle occurs with a  
significant reduction in learned capacity, the new LMD value is restricted to a maximum LMD reduction during  
any single learning discharge of LMD/8. The capacity inaccurate (CI) bit in FLAGS is cleared after the first  
learning cycle. This bit remains cleared unless a full reset occurs.  
The battery-full condition is defined as nominal available capacity (NAC) = LMD. The valid discharge flag (VDQ)  
in the FLAGS register is set when this condition occurs and remains set until the learning discharge cycle  
completes or an event occurs that disqualifies the learning cycle.  
The learning discharge cycle completes when the battery is discharged to the condition where VOLT EDV1  
threshold. The EDV1 threshold should be set at a voltage that guarantees at least 6.25% of battery capacity  
below that threshold. The EDVF threshold should be set at a voltage that the system sees as the zero capacity  
battery voltage.  
The bq26500 does not learn the capacity between EDV1 and EDVF thresholds, but assumes that the capacity  
is 6.25% of LMD, so care should be taken to set EDV1 based on the characteristics of the battery. The measured  
LMD value is determined by measuring the capacity delivered from the battery from NAC=LMD until  
VOLT EDV1, plus LMD/16 to account for the 6.25% capacity remaining below the EDV1 threshold.  
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APPLICATION INFORMATION  
VDQ is cleared and a capacity learning cycle is disqualified by any of the following conditions:  
1. Cold temperature: Temperature less than or equal to the TOFF value programmed in the TCOMP register  
when the EDV1 threshold voltage is reached.  
2. Light load: Average current is less than or equal to 2 times the initial standby load (ISLC) when the EDV1  
threshold voltage is reached.  
3. Fast voltage drop: VOLT (EDV1 − 256 mV) when EDV1 is set.  
4. Excessive charging: Cumulative charge added is greater than 255 mAh during a learning discharge cycle  
(alternating discharge-charge-discharge before EDV1 is set).  
5. Reset: VDQ is cleared on reset.  
6. Excessive self-discharge: NAC reduction from self−discharge estimate exceeds 12.48%.  
7. Self-discharge at termination of learning cycle. If self-discharge estimate reduces NAC until NAC LMD/16.  
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APPLICATION INFORMATION  
Register Interface for bq26500  
The bq26500 stores all calculated information in RAM, which is backed up by the voltage present on the RBI  
pin. EEPROM registers store permanent user data. The memory map for bq26500 is shown in Table 1.  
Table 1. bq26500 Memory Map  
HDQ ADDRESS  
EEPROM Registers  
0x7F  
NAME  
FUNCTION (256 x High Byte + Low Byte)  
LSB VALUE  
TCOMP  
DCOMP  
ID3  
Temperature compensation constants, OR, ID#1  
0x7E  
Discharge rate compensation constants, OR, ID#2  
ID#3  
0x7D  
0x7C  
PKCFG  
TAPER  
DMFSD  
ISLC  
Pack configuration values  
(1)  
192 µV  
0x7B  
Charge termination taper current  
Digital magnitude filter and self-discharge rate constants  
Initial standby load current  
0x7A  
(1)  
6 µV  
0x79  
0x78  
SEDV1  
SEDVF  
ILMD  
Scaled EDV1 threshold  
0x77  
Scaled EDVF threshold  
(1)  
768 µVh  
0x76  
Initial last measured discharge high byte  
RAM Registers  
0x6F − 0x75  
0x6E  
RESERVED  
EE_EN  
EEPROM program enable  
0x14 − 0x6D  
0x13 − 0x12  
0x11 − 0x10  
0x0F − 0x0E  
0x0D − 0x0C  
0x0B  
RESERVED  
(1)  
LMD  
Last measured discharge high − low byte  
Temperature compensated CACD high – low byte  
Discharge compensated NAC high − low byte  
Nominal available capacity high − low byte  
Relative state of charge  
3 µVh  
(1)  
CACT  
CACD  
NAC  
3 µVh  
(1)  
3 µVh  
(1)  
3 µVh  
RSOC  
FLAGS  
VOLT  
TEMP  
ARTTE  
AR  
1%  
0x0A  
Status flags  
0x09 − 0x08  
0x07 − 0x06  
0x05 − 0x04  
0x03 − 0x02  
0x01  
Reported voltage high − low byte  
Reported temperature high − low byte  
At rate time-to-empty high − low byte  
At rate high − low byte  
1 mV  
0.25°K  
1 minute  
(1)  
3 µV  
MODE  
CTRL  
Device mode register  
0x00  
Device control register  
(1)  
Divide by R (m) to convert µV to mA or µVh to mAh.  
S
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APPLICATION INFORMATION  
REGISTER DESCRIPTIONS  
Device Control Register (CTRL) − Address 0x00  
The device control register is used by the host system to request special operations by the bq26500. The highest  
priority command set in the MODE register performs when the host writes data 0xA9 to the control register. The  
CTRL register is cleared when the action is complete. Note that writing any value other than 0xA9 has no effect.  
Mode Register (MODE) − Address 0x01  
BIT 7  
BIT 6  
BIT 5  
BIT 4  
BIT 3  
BIT 2  
BIT 1  
BIT 0  
NAME  
GPIEN  
GPSTAT  
WRTNAC  
DONE  
PRST  
POR  
FRST  
SHIP  
MODE  
REGISTER  
DESCRIPTION  
GPIEN sets the state of the GPIO pin. A “1” configures the GPIO pin as input, while a “0” configures the GPIO pin  
as an open-drain output. This bit is initialized to the value of bit 7 of the PKCFG register in the EEPROM  
GPIEN  
GPSTAT sets the state of the open drain output of the GPIO pin (GPIEN = 0). A “1” turns off the open drain out-  
put while a “0” turns the output on. This bit is set to 1 on POR. When the GPIO pin is an input (GPIEN=1), this bit  
returns the logic state of the GPIO pin.  
GPSTAT  
WRTNAC  
DONE  
WRTNAC is used to transfer data from the AR registers to the NAC registers. Other registers are updated as  
appropriate. This command is useful during the pack manufacture and test to initialize the gauge to match the  
estimated battery capacity. This bit is cleared on all resets.  
DONE is used to write NAC to LMD. Useful if the host uses a charge termination method that does not allow the  
monitor to detect the taper current. The host system could use this command when the charging is complete to  
force update of internal registers to a full battery condition. This bit is cleared on all resets.  
Partial reset. This command requests a full reset, except that the NAC, LMD, and the CI bit in FLAGS should not  
be restored to their initial values. This command is intended for manufacturing use. This bit is cleared on all re-  
sets.  
PRST  
The POR status bit is set to “1” by the bq26500 following a power-on-reset (POR). This is a flag to the host that  
V
was less than V and caused a reset. The bit is cleared to “0” by the bq26500 when a full charge condi-  
(POR)  
CC  
POR  
tion is reached or it may be cleared by the host. The host may set this bit, but it has no effect on the bq26500  
operation.  
Full reset. This command bit requests a full reset. A full reset re-initializes all RAM registers, including the NAC,  
LMD, and FLAGS registers. This command is intended for manufacturing use. This bit is cleared on all resets.  
FRST  
SHIP  
This command bit requests that the device should be put in ship mode. See the Power Modes section for a de-  
scription of the ship mode. This command is intended for manufacturing use. This bit is cleared on all resets.  
WRTNAC, DONE, PRST, FRST, and SHIP commands are prioritized in bit order. This means that WRTNAC  
(bit 5) has higher priority than DONE (bit 4); PRST (bit 3) has higher priority than FRST (bit 1), and so on. Only  
the highest priority mode set is enabled each time the CTRL register is written with data 0xA9, and the firmware  
clears all other mode bits and the CTRL register when that action is complete. The host system must make two  
writes for every mode to be enabled, one write to the mode register to set the appropriate bit and a second write  
to the CTRL register to signal that the mode should be enabled.  
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APPLICATION INFORMATION  
At Rate Registers (ARH/ARL) − Address 0x02/0x03  
For the bq26500, the host writes the current value to this register for predictive calculation of time-to-empty. The  
device uses this value to predict the time-to-empty at any desired current. The current value written into this  
register pair is always assumed to be a discharge current. The value written to AR should be the predicted  
voltage across the sense resistor expressed in units of 3 µV per count.  
This register is also used during pack manufacturing to input a nominal available charge (NAC) value to set the  
NAC registers to the approximate initial pack capacity value.  
At Rate Time to Empty Registers (ARTTEL/ARTTEH) − Address 0x04/0x05  
Predicted time-to-empty, in minutes, at user entered discharge rate. The discharge current used in the  
calculation is entered by the host system in the at-rate (AR) registers. The at-rate capacitance (ARCAP) value  
used may be larger or smaller than CACT. It is computed using the same formulas as CACT, except the  
discharge compensation is computed using AR, instead of average discharge current (AI), for the discharge  
rate. The equation used to predict at rate time-to-empty is:  
ARCAP  
ARTTE + 60   
AR  
(1)  
The host system has read only access to this register pair.  
Reported Temperature Registers (TEMPL/TEMPH) − Address 0x06/0x07  
The TEMPH and the TEMPL registers contain the reported die temperature. The temperature is expressed in  
units of 0.25°K per count and updated every 2 seconds. The equation to calculate reported pack temperature  
is:  
T
+ 0.25   (256   TEMPH ) TEMPL)  
PACK  
(2)  
The host system has read-only access to this register pair.  
Reported Battery Voltage Registers (VOLTL/VOLTH) − Address 0x08/0x09  
The VOLTH and the VOLTL low-byte registers contain the reported battery voltage measured on the BAT pin.  
Voltage is expressed in mV and is updated every two seconds. Reported voltage cannot exceed 5000 mV. The  
host system has read only access to this register pair.  
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APPLICATION INFORMATION  
Status Flag Register (FLAGS) − Address 0x0A  
BIT 7  
CHGS  
0
BIT 6  
NOACT  
0
BIT 5  
IMIN  
0
BIT 4  
CI  
BIT 3  
RSVD  
0
BIT 2  
VDQ  
0
BIT 1  
EDV1  
0
BIT 0  
EDVF  
0
NAME  
POR STATUS  
1
MODE  
DESCRIPTION  
REGISTER  
Charge-state flag. A “1” in the CHGS indicates a charge current (VSRP > VSRN). A “0” indicates a lack of charge  
activity. This bit should be read when the host system reads the average current register pair to determine the  
sign of the average current magnitude. This bit is cleared to “0” on all resets.  
CHGS  
No-activity flag. A “1” indicates that the voltage across R is less than the digital magnitude filter. See the Digital  
S
NOACT  
Magnitude Filter section for more information. This bit is cleared to ”0” on all resets.  
Li-ion taper current detection flag. A “1” indicates that the charge current has tapered to less than the taper value  
set in EEPROM and that the battery voltage is greater than or equal to the value selected by the QV0 and QV1  
bits in the PKCFG register (see EEPROM Data Registers description for more details). This bit is cleared to “0” on  
all resets.  
IMIN  
Capacity Inaccurate flag. A ”1” indicates that the firmware has not been through a valid learning cycle and is bas-  
ing all calculations on design values programmed into EEPROM. This bit will be set on a full reset and will only be  
cleared on a LMD update following a learning cycle.  
CI  
RSVD  
VDQ  
Reserved bit.  
Valid-discharge flag. A “1” indicates that the bq26500 has met all necessary requirements for a capacity learning  
discharge cycle. This bit clears to “0” on a LMD update or condition that disqualifies a learning cycle. This bit is  
cleared to “0” on all resets.  
End-of-discharge-voltage-1 flag. A “1” indicates that voltage on the BAT pin is less than or equal to the EDV1  
voltage programmed in EEPROM and the battery has less than or equal to 6.25% of LMD capacity remaining.  
LMD updates immediately if the VDQ bit is set when this bit transitions from 0 to 1. This bit is cleared to ”0” on all  
resets or when charging.  
EDV1  
EDVF  
End-of-discharge-voltage-final flag. A “1” indicates that the battery has discharged fully based on design capacity  
programmed in EEPROM. Used to define the empty capacity threshold. This bit is cleared to ”0” on all resets or  
when charging.  
The host system has read-only access to this register.  
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APPLICATION INFORMATION  
Relative State of Charge (RSOC) – Address 0x0B  
RSOC reports the battery charge as a percentage of the last measured discharge value (LMD). This value  
should be used if the end equipment reports percentage rather than time-to-empty. The equation is:  
NAC  
LMD  
RSOC(%) + 100   
(3)  
The host system has read-only access to this register.  
Nominal Available Capacity Registers (NACL/NACH) – Address 0x0C/0x0D  
Uncompensated available capacity in the battery. NAC is reported in counts of 3 µVh. This register pair  
increments during charge (V > V ) and decrements during discharge (V < V ). The NAC registers  
SRP  
SRN  
SRP  
SRN  
are cleared when the BAT voltage is less than or equal to EDVF while discharging. The NAC registers are  
cleared during reset or power-on-reset (POR), if RAM corruption is detected. The register value is retained after  
a reset if RAM corruption is not detected. The host system has read only access to this register pair.  
Discharge Rate Compensated Available Capacity Registers (CACDL/CACDH) – Address 0x0E/0x0F  
Available capacity in the battery, compensated for discharge rate. CACD is reported in counts of 3 µVh. This  
register pair follows NAC during charge and discharge by an amount computed from the measured discharge  
rate and the discharge rate compensation value programmed into EEPROM. CACD is not allowed to increase  
while discharging, so that if the discharge rate decreases, the available capacity does not increase. CACD  
equals NAC if the CHGS bit is “1”. If CHGS is “0”, CACD is the smaller of the previous and new computed  
values. The host system has read-only access to this register pair.  
Temperature Compensated CACD Registers (CACTL/CACTH) – Address 0x10/0x11  
Available capacity in the battery, compensated for discharge rate and temperature. CACT is reported in counts  
of 3 µVh. This register pair follows CACD during both charge and discharge unless the temperature is less than  
the threshold programmed into EEPROM. Once the temperature falls below the programmed threshold, the  
CACT value is reduced from CACD by an amount computed from ILMD and the temperature compensation  
constants programmed into EEPROM. The host system has read only access to this register pair.  
Last Measured Discharge Registers (LMDL/LMDH) – Address 0x12/0x13  
Last measured discharge, used as a measured full reference, is based on the measured discharge capacity  
of the battery from full to empty. LMD is reported in counts of 3 µVh.The firmware updates LMD on a valid  
capacity learning cycle, which is defined as the battery reaching the EDV1 level while the VDQ bit is set. Used  
with NAC register values to calculate relative state of charge (RSOC). The host system has read only access  
to this register pair.  
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APPLICATION INFORMATION  
Reserved Registers  
The addresses 0x14 – 0x6D and addresses 0x6F – 0x75 are reserved and cannot be written by the host.  
EEPROM Enable Register (EE_EN) – Address 0x6E  
Register used to enable host writes to EEPROM data locations (addresses 0x76 – 0x7F). Host must write data  
0xDD to this register to enable EEPROM programming. See the Programming the EEPROM section for further  
information on programming the EEPROM bytes.  
EEPROM Data Registers (EE_DATA) – Address 0x76 – 0x7F  
The EEPROM data registers contain information vital to the performance of the device. These registers are to  
be programmed during pack manufacturing to allow flexibility in the design values of the battery to be monitored.  
The EEPROM data registers are listed in Table 2. Detailed descriptions of what should be programmed follows.  
See Programming the EEPROM for detailed information on writing the values to EEPROM.  
Table 2. bq26500 EEPROM Memory Map  
ADDRESS  
0x7F  
NAME  
TCOMP  
DCOMP  
ID3  
FUNCTION  
Temperature compensation constants, OR, ID#1  
Discharge rate compensation constants, OR, ID#2  
ID#3  
0x7E  
0x7D  
0x7C  
0x7B  
0x7A  
0x79  
PKCFG  
TAPER  
DMFSD  
ISLC  
Pack configuration values  
Charge termination taper current  
Digital magnitude filter and self-discharge rate constants  
Initial standby load current  
0x78  
SEDV1  
SEDVF  
ILMD  
Scaled EDV1 threshold  
0x77  
Scaled EDVF threshold  
0x76  
Initial last measured discharge high byte  
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APPLICATION INFORMATION  
Initial Last Measured Discharge High Byte (ILMD) – Address 0x76  
This register contains the scaled design capacity of the battery to be monitored. The equation to calculate the  
initial LMD is:  
Design Capacity (mAh)   R (mW)  
S
ILMD +  
(
256   3 mVh)  
(4)  
where R is the value of the sense resistor used in the system. This value is used as the high byte for the initial  
S
LMD values. The initial low byte value is “0”.  
Scaled EDVF Threshold (SEDVF) – Address 0x77  
This register contains the scaled value of the threshold for zero battery capacity. To calculate the value to  
program, use the following equation:  
Design EDVF (mV)  
SEDVF +  
* 256  
8
(5)  
Scaled EDV1 Threshold (SEDV1) – Address 0x78  
This register contains the scaled value of the voltage when the battery has 6.25% remaining capacity. When  
the battery reaches this threshold during a valid discharge, the device learns the full battery capacity, including  
the remaining 6.25%. To calculate the value to program, use the following equation:  
Design EDV1 (mV)  
SEDV1 +  
* 256  
8
(6)  
Initial Standby Load Current (ISLC) – Address 0x79  
This register contains the scaled end equipment design standby current. A capacity learning cycle is disqualified  
if average current is less than or equal to two times the initial standby load when the EDV1 threshold voltage  
is reached. The equation for programming this value is:  
Design Standby Current (mA)   R (mW)  
S
ISLC +  
6 (mV)  
(7)  
where R is the value of the sense resistor used in the system.  
S
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APPLICATION INFORMATION  
Digital Magnitude Filter and Self-Discharge Values (DMFSD) – Address 0x7A  
BIT 7  
BIT 6  
BIT 5  
BIT 4  
BIT 3  
BIT 2  
BIT 1  
BIT 0  
NAME  
DMF[3]  
DMF[2]  
DMF[1]  
DMF[0]  
SD[3]  
SD[2]  
SD[1]  
SD[0]  
MODE  
REGISTER  
DMF[3]  
DESCRIPTION  
Sets the digital magnitude filter (DMF) threshold. See Digital Magnitude Filter section for more information on the  
function of the DMF. The value to be programmed is:  
DMF[2]  
DMF[1]  
Design Threshold  
DMF[0]  
DMF[3 : 0] +  
, mV  
6
Sets the self-discharge rate %/day value at 25°C. NAC is reduced with an estimated self-discharge correction to  
adjust for the expected self-discharge of the battery. This estimation is only performed when the battery is not  
being charged. The rate programmed in EEPROM for DMFSD determines the self-discharge when 20°C  
TEMP < 30°C. The self-discharge estimation is doubled for each 10°C decade hotter than the 20°C−30°C  
decade, up to a maximum of 16 times the programmed rate for TEMP 60°C and is halved for each 10°C  
decade colder than the 20°C−30°C decade, down to a minimum of one-quarter the programmed rate for TEMP <  
0°C. The self-discharge estimation is performed by reducing NAC by NAC/512 at a time interval that achieves  
the desired estimation. If DMFSD is programmed with 12 decimal, the self-discharge rate is 0.195% per day in  
the 20°C−30°C decade. This is accomplished by reducing NAC by NAC/512 (100/512 = 0.195%) a single time  
every 24 hours. If temperature rises by 10°C, the 0.195% NAC reduction is made every 12 hours. The value to  
be programmed is:  
SD[3]  
SD[2]  
SD[1]  
SD[0]  
2.34  
, %/day  
SD[3 : 0] +  
Design SD  
Taper Current (TAPER) − Address 0x7B  
This register contains the scaled end equipment design charge taper current. This value, in addition to battery  
voltage, is used to determine when the battery has reached a full charge state. The equation for programming  
this value is:  
I
(mA)   R (mW)  
TAPER  
S
TAPER +  
192 (mV)  
(8)  
where R is the value of the sense resistor used in the system.  
S
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APPLICATION INFORMATION  
Pack Configuration (PKCFG) − Address 0x7C  
BIT 7  
BIT 6  
BIT 5  
BIT 4  
BIT 3  
BIT 2  
BIT 1  
BIT 0  
NAME  
GPIEN  
QV1  
QV0  
RSVD  
RSVD  
RSVD  
DCFIX  
TCFIX  
PKCFG  
REGISTER  
DESCRIPTION  
Allows the pack manufacturer to set the state of the GPIO pin on initial power up. If the bit is “0”, the GPIEN bit is  
cleared on reset and the GPIO pin acts as a high impedance output. If the bit is “1”, the GPIEN bit is set on reset  
and the GPIO pin acts as an input. The state of the GPIO pin can then be read through the GPSTAT bit in the  
MODE register.  
GPIEN  
QV1  
These bits set the end voltage for charge termination. The terminating voltage is set as shown in Table 3.  
No function.  
QV2  
RSVD  
Fixed discharge compensation. Normal discharge rate compensation (DCOMP register) is used if this bit is set to  
“0”. If this bit is set to “1”, the device assumes a fixed value of 0x42 for DCOMP, giving a discharge rate  
compensation gain of 6.25% with a compensation threshold of C/4. Setting the bit to “1” frees the EEPROM  
location of 0x7E for use as a programmable identification byte.  
DCFIX  
TCFIX  
Fixed temperature compensation. Normal temperature compensation (TCOMP register) is used if this bit is set to  
“0”. If this bit is set to “1”, the device assumes a fixed value of 0x7C for TCOMP, giving a temperature  
compensation gain of 0.68% of Design Capacity/°C with an offset of 12°C. Setting this bit to “1” frees the  
EEPROM location of 0x7F for use as a programmable identification byte.  
Table 3. Charge Termination Voltage Settings  
QV1  
QV2  
VOLTAGE (mV)  
3968  
0
0
1
1
0
1
0
1
4016  
4064  
4112  
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APPLICATION INFORMATION  
Identification Byte #3 (ID3) − Address 0x7D  
This register may be programmed to any desired value.The contents do not affect the operation of the bq26500.  
Discharge Rate Compensation Constants (DCOMP) or ID2 − Address 0x7E  
This register is used to set the compensation coefficients for discharge rate. These coefficients are applied to  
the nominal available charge (NAC) to more accurately predict capacity at high discharge rates.  
BIT 7  
BIT 6  
BIT 5  
BIT 4  
BIT 3  
BIT 2  
BIT 1  
BIT 0  
NAME  
DCGN[5]  
DCGN[4]  
DCGN[3]  
DCGN[2]  
DCGN[1]  
DCGN[0] DCOFF[1] DCOFF[0]  
MODE  
REGISTER  
DCGN[5]  
DESCRIPTION  
DCGN[4]  
DCGN[3]  
DCGN[2]  
DCGN[1]  
DCGN[0]  
DCOFF[1]  
DCOFF[0]  
Discharge rate compensation gain. Used to set the slope of the discharge capacity compensation as a  
percentage of discharge current. The gain factor adjustment is in increments of 0.39% of discharge current in  
excess of the DCOFF value. The equation for programming the value is:  
DCGN[5:0] = 2.56 × design discharge compensation gain %  
These bits set the discharge threshold of compensating the nominal available charge for discharge rate. The  
threshold is set as shown in Table 4.  
Table 4. Discharge Rate Compensation Thresholds  
DCOFF  
THRESHOLD  
DCOFF[1]  
DCOFF[0]  
0
0
1
1
0
1
0
1
0
LMD/2  
LMD/4  
LMD/8  
Discharge compensation, DCMP, is computed from these coefficients as follows:  
DCGN   (AI * DCOFF)  
DCMP +  
256  
(9)  
where DCMP is restricted to 0. AI is the average discharge current. The CACD register then takes on the value:  
CACD + NAC * (DCMP * DCMPADJ), if DCMP u DCMPADJ or  
CACD + NAC, if DCMP v DCMPADJ  
(10)  
(11)  
where DCMPADJ is the value of DCMP at a previous EDV1 detection. This allows the compensation for CACD  
to adapt as the LMD value is learned.  
If PKCFG[1]=1, the device assumes a fixed value of 0x42 for DCOMP, giving a discharge rate compensation  
gain of 6.25% with a compensation threshold of C/4. This frees the EEPROM location of 0x7E for a user-defined  
identification byte, ID2.  
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APPLICATION INFORMATION  
Temperature Compensation Constants (TCOMP) or ID1 – Address 0x7F  
This register is used to set the compensation coefficients for temperature. These coefficients are applied to the  
discharge rate compensated available charge (CACD) to more accurately predict capacity available at cold  
temperature.  
BIT 7  
BIT 6  
BIT 5  
BIT 4  
BIT 3  
BIT 2  
BIT 1  
BIT 0  
NAME  
TCGN[3]  
TCGN[2]  
TCGN[1]  
TCGN[0]  
TOFF[3]  
TOFF[2]  
TOFF[1]  
TOFF[0]  
MODE  
REGISTER  
TCGN[3]  
DESCRIPTION  
Temperature compensation gain. Used to set the slope of the compensation as a percentage of design capacity  
TCGN[2]  
TCGN[1]  
TCGN[0]  
TOFF[3]  
TOFF[2]  
TOFF[1]  
TOFF[0]  
(DC) decrease per °C. The equation for programming the value is:  
TCGN[3:0] = 10.24 × design temp compensation gain % DC/°C  
Temperature compensation offset. Used to set the offset of the compensation. The temperature threshold is also  
used as the cold temperature disqualification for learning cycle even if TCGN=0. The equation for programming  
the value is:  
TOFF[3:0] = design temp compensation offset (°K) − 273  
Temperature compensation, TCMP, is computed from these coefficients as follows:  
ILMD   (273 ) TOFF * T)  
TCMP + TCGN   
4
(12)  
where T is the temperature in °K and T < 273 + TOFF. TCMP = 0 if T 273 + TOFF. CACT is then computed  
as follows:  
CACT + CACD * (TCMP * TCMPADJ)  
(13)  
where TEMPADJ is the value of TCMP at EDV1 or is equal to zero, depending on whether the EDV1 condition  
or full condition respectively, occurred last.  
If PKCFG[0]=1, the device assumes a fixed value of 0x7C for TCOMP, giving a temperature compensation gain  
of 0.68% DC/°C with an offset of 12°C. This frees the EEPROM location of 0x7F for a user-defined identification  
byte, ID1.  
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APPLICATION INFORMATION  
POWER MODES  
The bq26500 has four power modes: active, sleep, ship, and hibernate. Figure 5 shows the flow that moves the  
device between the active, sleep, and ship modes. Hibernate is a special mode not included in the flow. Detailed  
explanations of each mode follow the diagram.  
Active Mode  
NO  
HDQ low for  
16 seconds?  
YES  
NO  
V
Rs  
below DMF  
threshold?  
Ship Enabled?  
NO  
YES  
YES  
Sleep Mode  
Ship Mode  
NO  
HDQ pulled  
high?  
HDQ pulled  
high?  
4 hour wake?  
YES  
NO  
NO  
YES  
YES  
NO  
1st, 4th, 7th, etc.  
wakeup?  
Device enters  
active mode for  
16 seconds  
YES  
Figure 5. Power Mode Flow Chart  
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APPLICATION INFORMATION  
Active Mode  
During normal operation, the device is in active mode, which corresponds to the highest power consumption.  
Normal gas gauging is performed in this mode. If system requirements mandate that bq26500 should not enter  
sleep or ship modes then an external pull-up resistor between V  
and HDQ is required on the bq26500 side  
CC  
of the system. The resistor value chosen should be small enough to force a logic “1” on HDQ even with the HDQ  
internal pull-down current and any external ESD protection circuitry loading.  
Sleep Mode  
This low power mode is entered when the HDQ line is pulled low for at least 16 seconds and the charge or  
discharge activity is below the digital magnitude filter. It may take up to 30 minutes to determine the no-activity  
condition after charge or discharge current is removed. Normal gas gauging ceases, but battery self-discharge,  
based on the temperature when the device entered sleep mode, is maintained internally. The device wakes  
every 4 hours to perform a temperature conversion and will go back to sleep after 16 seconds if the HDQ line  
is still low. bq26500 has an internal pull-down device that sinks less than I  
sleep mode if the battery pack is pulled from the system and there is not a pull-up mechanism present.  
, allowing the device to enter  
HDQPD  
When the device wakes the first time to perform a temperature update, it stays in active mode long enough to  
confirm that the charge or discharge activity is still below the digital magnitude filter threshold. This is meant  
to minimize possible error if the battery pack is removed from the end equipment and is later re-inserted without  
a transition on the HDQ line. This is only an issue if the system has some current drain from the battery even  
though HDQ is pulled low. The activity check will take 15 minutes to complete. The device reenters sleep mode  
if the activity is below the digital magnitude filter threshold. The device repeats the activity check every 3  
wakeups (12 hours).  
When the HDQ line is pulled high, the device leaves the sleep mode. The device enters the sleep mode again  
only after the HDQ line is pulled low for at least 16 seconds and the charge/discharge activity is below the digital  
magnitude filter threshold. If the DMF threshold is set to zero and HDQ line is pulled low, the device enters sleep  
mode if the VFC activity is less than 2 counts in 15 minutes. This is equivalent to approximately 24 µV across  
the current-sense resistor.  
A 100-kpull-up resistor from HDQ to V  
can be added in the battery pack to disable the sleep function.  
CC  
Ship Mode  
This low power mode is to be used when the pack manufacturer has completed assembly and test of the pack.  
The ship mode is enabled by setting the SHIP bit in the MODE register and issuing the control command (data  
0xA9 to register 0x00). Ship mode is entered only after the ship mode is enabled and the HDQ line has been  
pulled low for 16 seconds. This allows the pack manufacturer to enable the ship mode and pull the pack from  
the test equipment without any additional overhead. After the ship mode has been enabled but before the device  
has entered ship mode, transients on the HDQ line do not cause the device to stay in active mode.  
All device functionality stops in ship mode and it does not start again until the HDQ line is pulled high (by plugging  
it into the end equipment) or the battery voltage drops below and then rises above the V  
threshold. Care  
(POR)  
should be taken to ensure that there are no glitches on the HDQ line after the device enters ship mode or else  
the device enters the active mode. It enters sleep if HDQ remains low, but does not re-enter ship mode unless  
another ship mode command is sent.  
22  
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ꢀꢁ ꢂꢃ ꢄꢅ ꢅ  
SLUS567A − JUNE, 2003 − REVISED OCTOBER 2003  
APPLICATION INFORMATION  
Hibernate Mode  
The device enters hibernate mode when V  
drops below V  
and there is a voltage source connected to  
CC  
(POR)  
the RBI pin. V  
must be raised above V  
in order to exit the hibernate mode. This mode retains RAM  
CC  
(POR)  
integrity and allows retention of remaining capacity, learned LMD, and the CI flag.  
PROGRAMMING THE EEPROM  
The bq26500 has 10 bytes of EEPROM that are used for firmware control and application data (see the Register  
Descriptions section for more information). Programming the EEPROM through the HDQ pin should take place  
during pack manufacturing, as a 21-V pulse is needed on the GPIO pin. The programming mode must be  
enabled prior to writing any values to the EEPROM locations. The programming mode is enabled by writing to  
the EE_EN register (address 0x6E) with data 0xDD. Once the programming mode is enabled, the desired data  
can be written to the appropriate address. Figure 6 shows the method for programming all locations.  
Host enables EEPROM programming  
mode / write data 0xDD to address 0x6E  
Host writes data addresses  
0x76 to 0x7F  
Host reads data  
address to be programmed  
V
pulse applied to  
(PROG)  
GPIO pin for t  
(PROG)  
Host increments  
address and reads  
No  
Programmed  
0x7F?  
Yes  
Write data 0x00 to address 0x6E  
Figure 6. EEPROM Programming Flow Chart  
It is not required that addresses 0x76 − 0x7F be programmed at the same time or in any particular order. The  
programming method illustrated in Figure 6 can be used to program any of the bytes as long as the sequence  
of enable, write, read, apply programming pulse, and disable is followed.  
23  
www.ti.com  
ꢀ ꢁ ꢂ ꢃꢄ ꢅ ꢅ  
SLUS567A − JUNE, 2003 − REVISED OCTOBER 2003  
APPLICATION INFORMATION  
COMMUNICATING WITH THE bq26500  
The bq26500 includes a single-wire HDQ serial data interface. Host processors, configured for either polled or  
interrupt processing, can use the interface to access various bq26500 registers. The HDQ pin is an open drain  
device, which requires an external pull-up resistor. The interface uses a command-based protocol, where the  
host processor sends a command byte to the bq26500. The command directs the bq26500 to either store the  
next eight bits of data received to a register specified by the command byte, or to output the eight bits of data  
from a register specified by the command byte.  
The communication protocol is asynchronous return-to-one and is referenced to V . Command and data bytes  
SS  
consist of a stream of eight bits that have a maximum transmission rate of 5 Kbits/s. The least-significant bit  
of a command or data byte is transmitted first. Data input from the bq26500 may be sampled using the  
pulse-width capture timers available on some microcontrollers. A UART can also be configured to communicate  
with the bq26500.  
If a communication time-out occurs (for example, if the host waits longer than t  
for the bq26500 to  
(RSPS)  
respond) or if this is the first access command, then a BREAK should be sent by the host. The host may then  
resend the command. The bq26500 detects a BREAK when the HDQ pin is driven to a logic-low state for a time  
t
or greater when the bus is free. If the host sends a BREAK when the bq26500 is transmitting a bit, it is  
(B)  
possible that the BREAK would be ignored. Best practice is to hold all BREAK transmissions for twice the  
minimum time listed in the HDQ specification table. The HDQ pin then returns to its normal ready-high logic state  
for a time t  
.The bq26500 is then ready for a command from the host processor.  
(BR)  
The return-to-one data-bit frame consists of three distinct sections:  
1. The first section starts the transmission by either the host or the bq26500 taking the HDQ pin to a logic-low  
state for a period equal to t  
or t  
.
(HW1)  
(DW1)  
2. The next section is the actual data transmission, where the data should be valid for t  
− t  
or t  
(HW0) (HW1)  
(DW0)  
t
.
(DW1)  
3. The final section stops the transmission by returning the HDQ pin to a logic-high state and holding it high  
until the time from bit start to bit end is equal to t or t  
.
(CYCD)  
(CYCH)  
The HDQ line may remain high for an indefinite period of time between each bit of address or between each  
bit of data on a write cycle. After the last bit of address is sent on a read cycle, the bq26500 starts outputting  
the data after t  
with timing as specified. The serial communication timing specification and illustration  
(RSPS)  
sections give the timings for data and break communication. Communication with the bq26500 always occurs  
with the least-significant bit being transmitted first.  
Plugging in the battery pack may be seen as the start of a communication due to contact bounce. It is  
recommended that each communication or string of communications be preceded by a break to reset the HDQ  
engine.  
24  
www.ti.com  
ꢀꢁ ꢂꢃ ꢄꢅ ꢅ  
SLUS567A − JUNE, 2003 − REVISED OCTOBER 2003  
APPLICATION INFORMATION  
Command Byte  
The command byte of the bq26500 consists of eight contiguous valid command bits. The command byte  
contains two fields: W/R command and address. The command byte values are shown in the following table:  
BIT 7  
BIT 6  
BIT 5  
BIT 4  
BIT 3  
BIT 2  
BIT 1  
BIT 0  
NAME  
W/R  
AD6  
AD5  
AD4  
AD3  
AD2  
AD1  
AD0  
MODE  
REGISTER  
DESCRIPTION  
W/R indicates whether the command bytes is a read or write command. A “1” indicates a write command and  
that the following eight bits should be written to the register specified by the address field of the command byte,  
while a “0” indicates that the command is a read. On a read command, the bq26500 outputs the requested  
register contents specified by the address field portion of the command Byte.  
W/R  
AD[6]  
AD[5]  
AD[4]  
AD[3]  
AD[2]  
AD[1]  
AD[0]  
The seven bits labeled AD6 through AD0 containing the address portion of the register to be accessed  
Reading 16 bit Registers  
Since 16-bit values are only read 8 bits at a time with the HDQ interface, it is possible that the device may update  
the register value between the time the host reads the first and second bytes. To prevent any system issues,  
any 16-bit values read by the host should be read using the following protocol. The entire read sequence should  
complete in less than 0.8 s, the fastest rate at which any register pair is updated.  
1. Read high byte (H0)  
2. Read low byte (L0)  
3. Read high byte (H1)  
4. If H1 = H0, then valid result is H0, L0  
5. Otherwise, read low byte (L1) and valid result is H1, L1.  
25  
www.ti.com  
MECHANICAL DATA  
MTSS001C – JANUARY 1995 – REVISED FEBRUARY 1999  
PW (R-PDSO-G**)  
PLASTIC SMALL-OUTLINE PACKAGE  
14 PINS SHOWN  
0,30  
0,19  
M
0,10  
0,65  
14  
8
0,15 NOM  
4,50  
4,30  
6,60  
6,20  
Gage Plane  
0,25  
1
7
0°8°  
A
0,75  
0,50  
Seating Plane  
0,10  
0,15  
0,05  
1,20 MAX  
PINS **  
8
14  
16  
20  
24  
28  
DIM  
3,10  
2,90  
5,10  
4,90  
5,10  
4,90  
6,60  
6,40  
7,90  
9,80  
9,60  
A MAX  
A MIN  
7,70  
4040064/F 01/97  
NOTES: A. All linear dimensions are in millimeters.  
B. This drawing is subject to change without notice.  
C. Body dimensions do not include mold flash or protrusion not to exceed 0,15.  
D. Falls within JEDEC MO-153  
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  
IMPORTANT NOTICE  
Texas Instruments Incorporated and its subsidiaries (TI) reserve the right to make corrections, modifications,  
enhancements, improvements, and other changes to its products and services at any time and to discontinue  
any product or service without notice. Customers should obtain the latest relevant information before placing  
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TI warrants performance of its hardware products to the specifications applicable at the time of sale in  
accordance with TI’s standard warranty. Testing and other quality control techniques are used to the extent TI  
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parameters of each product is not necessarily performed.  
TI assumes no liability for applications assistance or customer product design. Customers are responsible for  
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amplifier.ti.com  
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dataconverter.ti.com  
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dsp.ti.com  
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www.ti.com/broadband  
www.ti.com/digitalcontrol  
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Copyright 2003, Texas Instruments Incorporated  

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