ADS5541IPAP [TI]

14-Bit, 105MSPS Analog-To-Digital Converter;
ADS5541IPAP
型号: ADS5541IPAP
厂家: TEXAS INSTRUMENTS    TEXAS INSTRUMENTS
描述:

14-Bit, 105MSPS Analog-To-Digital Converter

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Production Data  
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SBAS307CMAY 2004REVISED FEBRUARY 2007  
14-Bit, 105MSPS  
Analog-To-Digital Converter  
FEATURES  
DESCRIPTION  
14-Bit Resolution  
The ADS5541 is  
a
high-performance, 14-bit,  
105MSPS analog-to-digital converter (ADC). To  
provide a complete converter solution, it includes a  
high-bandwidth linear sample-and-hold stage (S&H)  
and internal reference. Designed for applications  
demanding the highest speed and highest dynamic  
performance in a small space, the ADS5541 has  
excellent analog power dissipation of 571mW at 3.3V  
single-supply voltage. This allows an even higher  
system integration density. The provided internal  
reference simplifies system design requirements.  
The parallel CMOS compatible outputs ensure  
seamless interfacing with common logic.  
105MSPS Sample Rate  
High SNR: 72dBFS at 100MHz fIN  
High SFDR: 86dBc at 100MHz fIN  
2.3VPP Differential Input Voltage  
Internal Voltage Reference  
3.3V Single-Supply Voltage  
Analog Power Dissipation: 571mW  
Serial Programming Interface  
TQFP-64 PowerPAD™ Package  
Pin-Compatible With:  
The ADS5541 is available in a TQFP-64 PowerPAD  
package over the industrial temperature range.  
ADS5500 (14-Bit, 125MSPS)  
ADS5542 (14-Bit, 80MSPS)  
ADS5520 (12-Bit, 125MSPS)  
ADS5521 (12-Bit, 105MSPS)  
ADS5522 (12-Bit, 80MSPS)  
ADS5500 PRODUCT FAMILY  
80MSPS  
ADS5522  
ADS5542  
105MSPS  
ADS5521  
ADS5541  
125MSPS  
ADS5542  
ADS5500  
12-Bit  
14-Bit  
Recommended Op Amps:  
OPA695, OPA847, THS3202, THS3201,  
THS4503, THS4509, THS9001  
AV  
DD  
DRV  
DD  
CLK+  
CLK−  
Timing Circuitry  
CLKOUT  
APPLICATIONS  
CM  
Wireless Communication  
14-Bit  
Pipeline  
ADC  
D0  
Digital  
Error  
Correction  
V
IN+  
.
.
.
Output  
Control  
Communication Receivers  
Base Station Infrastructure  
S&H  
V
IN−  
D13  
Core  
OVR  
DFS  
Test and Measurement Instrumentation  
Single and Multichannel Digital Receivers  
Communication Instrumentation  
Internal  
Reference  
Control Logic  
Serial Programming Register  
ADS5541  
A
GND  
SEN  
SDATA SCLK  
DR  
GND  
Radar, Infrared  
Video and Imaging  
Medical Equipment  
Military Equipment  
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas  
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.  
PowerPAD is a trademark of Texas Instruments.  
All other trademarks are the property of their respective owners.  
PRODUCTION DATA information is current as of publication date.  
Products conform to specifications per the terms of the Texas  
Instruments standard warranty. Production processing does not  
necessarily include testing of all parameters.  
Copyright © 2004–2007, Texas Instruments Incorporated  
Production Data  
ADS5541  
www.ti.com  
SBAS307CMAY 2004REVISED FEBRUARY 2007  
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with  
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.  
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be  
more susceptible to damage because very small parametric changes could cause the device not to meet its published  
specifications.  
ORDERING INFORMATION(1)  
SPECIFIED  
PACKAGE  
TEMPERATURE  
RANGE  
PACKAGE  
MARKING  
ORDERING  
NUMBER  
TRANSPORT  
MEDIA, QUANTITY  
PRODUCT PACKAGE-LEAD(2) DESIGNATOR  
ADS5541IPAP  
Tray, 160  
HTQFP-64  
PowerPAD  
ADS5541  
PAP  
–40°C to +85°C  
ADS5541I  
ADS5541IPAPR  
Tape and Reel, 1000  
(1) For the most current package and ordering information see the Package Option Addendum at the end of this document, or see the TI  
web site at www.ti.com.  
(2) Thermal pad size: 3.5mm × 3.5mm (min), 4mm × 4mm (max). θJA = 21.47°C/W and θJC = 2.99°C/W, when used with 2 oz. copper trace  
and pad soldered directly to a JEDEC standard, four-layer, 3in × 3in PCB.  
ABSOLUTE MAXIMUM RATINGS(1)  
Over operating free-air temperature range, unless otherwise noted.  
ADS5541  
UNIT  
V
AVDD to AGND, DRVDD to DRGND  
AGND to DRGND  
–0.3 to 3.7  
Supply Voltage  
±0.1  
–0.3 to minimum (AVDD + 0.3, +3.6)  
–0.3 to DRVDD  
–0.3 to DRVDD  
–40 to 85  
V
(2)(3)  
Analog input to AGND  
Logic input to DRGND  
V
V
Digital data output to DRGND  
Operating temperature range  
Junction temperature  
V
°C  
°C  
°C  
105  
Storage temperature range  
–65 to 150  
(1) Stresses above these ratings may cause permanent damage. Exposure to absolute maximum conditions for extended periods may  
degrade device reliability. These are stress ratings only, and functional operation of the device at these or any other conditions beyond  
those specified is not implied.  
(2) If the input signal can exceed 3.6V, then a resistor greater than or equal to 25should be added in series with each of the analog input  
pins to support input voltages up to 3.8V. For input voltages above 3.8V, the device can only handle transients and the duty cycle of the  
overshoot should be limited to less than 5% for inputs up to 3.9V.  
(3) The overshoot duty cycle can be defined as the ratio of the total time of overshoot to the total intended device lifetime, expressed as a  
percentage. The total time of overshoot is the integrated time of all overshoot occurences over the lifetime of the device.  
2
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ADS5541  
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SBAS307CMAY 2004REVISED FEBRUARY 2007  
RECOMMENDED OPERATING CONDITIONS  
ADS5541  
MIN  
TYP  
MAX  
UNIT  
Supplies  
Analog supply voltage, AVDD  
Output driver supply voltage, DRVDD  
Analog Input  
3
3
3.3  
3.3  
3.6  
3.6  
V
V
Differential input range  
2.3  
VPP  
V
(1)  
Input common-mode voltage, VCM  
1.45  
1.55  
1.65  
Digital Output  
Maximum output load  
Clock Input  
10  
pF  
DLL ON  
ADCLK input sample rate (sine wave) 1/tC  
DLL OFF  
60  
2
105  
80  
MSPS  
VPP  
Clock amplitude, sine wave, differential(2)  
Clock duty cycle(3)  
1
3
50%  
Open free-air temperature range  
–40  
85  
°C  
(1) Input common-mode should be connected to CM.  
(2) See Figure 49 for more information.  
(3) See Figure 48 for more information.  
ELECTRICAL CHARACTERISTICS  
At TA = +25°C, min and max specified over the full temperature range of –40°C to +85°C, AVDD = DRVDD = 3.3V, sampling rate = 105MSPS,  
50% clock duty cycle, DLL On, 3VPP differential clock, and –1dBFS differential input, unless otherwise noted.  
ADS5541  
PARAMETER  
CONDITIONS  
MIN  
TYP  
MAX  
UNIT  
Resolution  
14  
Bits  
Analog Inputs  
Differential input range  
2.3  
6.6  
4
VPP  
Differential input impedance  
Differential input capacitance  
Analog input common-mode current (per input)  
Analog input bandwidth  
See Figure 39  
See Figure 39  
k  
pF  
250  
750  
4
µA  
Source impedance = 50Ω  
MHz  
Voltage overload recovery time  
Internal Reference Voltages  
Reference bottom voltage, VREFM  
Reference top voltage, VREFP  
Reference error  
Clock cycles  
0.95  
2.1  
V
V
–4  
±0.9  
1.55  
4
%
V
Common-mode voltage output, VCM  
Dynamic DC Characteristics and Accuracy  
No missing codes  
1.5  
1.6  
Tested  
±0.25  
±2.5  
Differential nonlinearity error, DNL  
Integral nonlinearity error, INL  
Offset error  
fIN = 55 MHz  
fIN = 55 MHz  
–0.9  
–5  
1.1  
5
LSB  
LSB  
–11  
±1.5  
11  
mV  
Offset temperature coefficient  
DC power-supply rejection ratio, DC PSRR  
Gain error(1)  
0.02  
mV/°C  
mV/V  
%FS  
%/°C  
offset error/AVDD from AVDD = 3 V to AVDD = 3.6V  
0.25  
–2  
±0.3  
2
Gain temperature coefficient  
–0.02  
(1) Gain error is specified by design and characterization; it is not tested in production.  
3
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ADS5541  
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SBAS307CMAY 2004REVISED FEBRUARY 2007  
ELECTRICAL CHARACTERISTICS (continued)  
At TA = +25°C, min and max specified over the full temperature range of –40°C to +85°C, AVDD = DRVDD = 3.3V, sampling rate = 105MSPS,  
50% clock duty cycle, DLL On, 3VPP differential clock, and –1dBFS differential input, unless otherwise noted.  
ADS5541  
PARAMETER  
CONDITIONS  
MIN  
TYP  
MAX  
UNIT  
Dynamic AC Characteristics  
fIN = 10MHz  
fIN = 55MHz  
73.6  
72.7  
71.9  
72.5  
72  
+25°C to +85°C  
71.7  
70.5  
Full temperature range  
Signal-to-noise ratio. SNR  
fIN = 70MHz  
fIN = 100MHz  
fIN = 150MHz  
fIN = 220MHz  
dBFS  
LSB  
dBc  
71  
69  
RMS idle channel noise  
Input tied to common-mode  
fIN = 10MHz  
1.03  
84  
+25°C  
78.3  
76.3  
86  
fIN = 55MHz  
Full temperature range  
85  
Spurious-free dynamic range, SFDR  
fIN = 70MHz  
fIN = 100MHz  
fIN = 150MHz  
fIN = 220MHz  
fIN = 10MHz  
82  
86  
75  
72  
90  
+25°C  
78.3  
76.3  
86  
fIN = 55MHz  
Full temperature range  
85  
Second-harmonic, HD2  
fIN = 70MHz  
fIN = 100MHz  
fIN = 150MHz  
fIN = 220MHz  
fIN = 10MHz  
82  
dBc  
88  
75  
72  
84  
+25°C  
78.3  
76.3  
89  
fIN = 55MHz  
Full temperature range  
88  
Third-harmonic, HD3  
fIN = 70MHz  
fIN = 100MHz  
fIN = 150MHz  
fIN = 220MHz  
fIN = 55MHz  
fIN = 10MHz  
82  
dBc  
dBc  
86  
80  
78  
Worst-harmonic/spur (other than HD2 and HD3)  
Signal-to-noise + distortion, SINAD  
87  
72.6  
72  
+25°C  
70.7  
69.5  
fIN = 55MHz  
Full temperature range  
71  
fIN = 70MHz  
fIN = 100MHz  
fIN = 150MHz  
fIN = 220MHz  
fIN = 10MHz  
71.8  
71.2  
70  
dBFS  
67  
80  
+25°C  
76.5  
74.5  
83  
fIN = 55MHz  
Full temperature range  
82  
Total harmonic distortion, THD  
Effective number of bits, ENOB  
fIN = 70MHz  
fIN = 100MHz  
fIN = 150MHz  
fIN = 220MHz  
fIN = 55MHz  
79  
dBc  
Bits  
84  
74  
70.5  
11.7  
4
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ADS5541  
www.ti.com  
SBAS307CMAY 2004REVISED FEBRUARY 2007  
ELECTRICAL CHARACTERISTICS (continued)  
At TA = +25°C, min and max specified over the full temperature range of –40°C to +85°C, AVDD = DRVDD = 3.3V, sampling rate = 105MSPS,  
50% clock duty cycle, DLL On, 3VPP differential clock, and –1dBFS differential input, unless otherwise noted.  
ADS5541  
PARAMETER  
CONDITIONS  
MIN  
TYP  
MAX  
UNIT  
Dynamic AC Characteristics (continued)  
f = 10.1MHz, 15.1MHz (–7dBFS each tone)  
f = 50.1MHz, 55.1MHz (–7dBFS each tone)  
f = 150.1MHz, 155.1MHz (–7dBFS each tone)  
94  
96  
Two-tone intermodulation distortion, IMD  
dBFS  
84.7  
Power Supply  
Total supply current, ICC  
Analog supply current, IAVDD  
Output buffer supply current, IDRVDD  
fIN = 55MHz  
fIN = 55MHz  
fIN = 55MHz  
Analog only  
224  
173  
51  
250  
185  
65  
mA  
mA  
mA  
571  
611  
Power dissipation  
Standby power  
mW  
mW  
Output buffer power with 10pF load  
on digital output to ground  
168  
180  
215  
250  
With Clocks running  
DIGITAL CHARACTERISTICS  
Valid over full temperature range of TMIN = –40°C to TMAX = +85°C, and AVDD = DRVDD = 3.3V, unless otherwise noted.  
ADS5541  
PARAMETER  
CONDITIONS  
MIN  
TYP  
MAX  
UNIT  
Digital Inputs  
VIH  
VIL  
IIH  
High-level input voltage  
Low-level input voltage  
2.4  
V
0.8  
10  
10  
V
High-level input current  
Low-level input current  
Input current for RESET  
Input capacitance  
µA  
µA  
µA  
pF  
IIL  
–20  
4
Digital Outputs  
VOL  
VOH  
Low-level output voltage  
CLOAD = 10pF  
0.3  
3
0.4  
V
V
High-level output voltage  
Output capacitance  
CLOAD = 10pF  
2.8  
3
pF  
5
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ADS5541  
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SBAS307CMAY 2004REVISED FEBRUARY 2007  
N + 3  
N + 4  
N + 2  
Sample  
N
Analog  
Input  
Signal  
N + 1  
N + 17  
N + 16  
N + 14  
N + 15  
t
A
Input Clock  
t
START  
t
PDI  
Output Clock  
t
su  
Data Out  
(D0−D13)  
N − 17  
N − 16  
N − 15  
N − 14  
N − 13  
N − 3  
N − 2  
N − 1  
N
Data Invalid  
t
t
END  
h
17.5 Clock Cycles  
NOTE: It is recommended that the loading at CLKOUT and all data lines are accurately matched to ensure that the above  
timing matches closely with the specified values.  
Figure 1. Timing Diagram  
TIMING CHARACTERISTICS(1)(2)  
At TA = +25°C, min and max specified over the full temperature range of –40°C to +85°C, sampling rate = 105MSPS, 50%  
clock duty cycle, AVDD = DRVDD = 3.3V, and 3VPP differential clock, unless otherwise noted.  
ADS5541  
PARAMETER  
Switching Specification  
DESCRIPTION  
MIN  
TYP MAX  
UNIT  
tA  
Aperture delay  
Input CLK falling edge to data sampling point  
Uncertainty in sampling instant  
Data valid(3) to 50% of CLKOUT rising edge  
50% of CLKOUT rising edge to data becoming invalid(3)  
1
300  
2.8  
ns  
fs  
Aperture jitter (uncertainty)  
Data setup time  
tSU  
2.2  
2.2  
ns  
ns  
tH  
Data hold time  
2.5  
(4)(5)  
tSTART  
Input clock to output data  
valid start  
Input clock rising edge to data valid start delay  
Input clock rising edge to data valid end delay  
1.9  
7.3  
2.8  
ns  
ns  
(4)(5)  
tEND  
Input clock to output data  
valid end  
5.8  
tJIT  
Output clock jitter  
Uncertainty in CLKOUT rising edge, peak-to-peak  
Rise time of CLKOUT from 20% to 80% of DRVDD  
Fall time of CLKOUT from 80% to 20% of DRVDD  
175  
2
250  
2.2  
1.8  
5.5  
ps  
ns  
ns  
ns  
tRISE  
tFALL  
tPDI  
Output clock rise time  
Output clock fall time  
1.7  
4.7  
Input clock to output clock  
delay  
Input clock rising edge, zero crossing, to output clock  
rising edge 50%  
4
tR  
tF  
Data rise time  
Data fall time  
Data rise time measured from 20% to 80% of DRVDD  
Data fall time measured from 80% to 20% of DRVDD  
4.4  
3.3  
5.1  
3.8  
ns  
ns  
Output enable(OE) to data  
output delay  
Time required for outputs to have stable timings with  
regard to input clock(6) after OE is activated  
Clock  
cycles  
1000  
1000  
Time to valid data after coming out of software power  
down and stopping and restarting the clock  
Clock  
cycles  
Wakeup time  
Latency  
Clock  
cycles  
Time for a sample to propagate to the ADC outputs  
17.5  
(1) Timing parameters are ensured by design and characterization and not tested in production.  
(2) See Table 5 through Table 8 in the Application Information section for timing information at additional sampling frequencies.  
(3) Data valid refers to 2V for LOGIC high and 0.8V for LOGIC low.  
(4) See the Output Information section for details on using the input clock for data capture.  
(5) These specifications apply when the CLKOUT polarity is set to rising edge (according to Table 3). Add 1/2 clock period for the valid  
number for a falling edge CLKOUT polarity.  
(6) Data outputs are available within a clock from assertion of OE; however, it takes 1000 clock cycles to ensure stable timing with respect  
to input clock.  
6
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ADS5541  
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SBAS307CMAY 2004REVISED FEBRUARY 2007  
Power Supply  
(AV , DRV  
)
DD  
DD  
t . 10 ms  
1
t . 2 ms  
2
t . 2 ms  
3
SEN Active  
RESET (Pin 35)  
Figure 2. Reset Timing Diagram  
RESET TIMING CHARACTERISTICS  
Typical values given at TA = +25°C, min and max specified over the full temperature range of –40°C to +85°C, AVDD = DRVDD = 3.3V, and  
3VPP differential clock, unless otherwise noted.  
ADS5541  
PARAMETER  
DESCRIPTION  
MIN  
TYP  
MAX  
UNIT  
Switching Specification  
t1  
t2  
t3  
Power-on delay  
Reset pulse width  
Register write delay  
Power-up time  
Delay from power-on of AVDD and DRVDD to RESET pulse  
Pulse width of active RESET signal  
10  
2
ms  
µs  
Delay from RESET disable to SEN active  
2
µs  
Delay from power-up of AVDD and DRVDD to output stable  
40  
ms  
7
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SBAS307CMAY 2004REVISED FEBRUARY 2007  
SERIAL PROGRAMMING INTERFACE CHARACTERISTICS  
The ADS5541 has a three-wire serial interface. The device latches the serial data SDATA on the falling edge of  
serial clock SCLK when SEN is active.  
Serial shift of bits is enabled when SEN is low. SCLK shifts serial data at the falling edge.  
Minimum width of data stream for a valid loading is 16 clocks.  
Data is loaded at every 16th SCLK falling edge while SEN is low.  
In case the word length exceeds a multiple of 16 bits, the excess bits are ignored.  
Data can be loaded in multiples of 16-bit words within a single active SEN pulse.  
The first 4-bit nibble is the address of the register while the last 12 bits are the register contents.  
A3  
A2  
A1  
A0  
D11  
D10  
D9  
D0  
SDATA  
ADDRESS  
DATA  
MSB  
Figure 3. DATA Communication is 2-Byte, MSB First  
t
SLOADS  
t
SEN  
SLOADH  
t
t
t
SCLK  
WSCLK WSCLK  
SCLK  
t
t
h(D)  
su(D)  
SDATA  
MSB  
LSB  
MSB  
LSB  
16 x M  
Figure 4. Serial Programming Interface Timing Diagram  
Table 1. Serial Programming Interface Timing Characteristics  
ADS5541  
TYP(1)  
SYMBOL  
tSCLK  
PARAMETER  
SCLK period  
MIN(1)  
MAX(1)  
UNIT  
ns  
50  
25  
8
tWSCLK  
tSLOADS  
tSLOADH  
tSY(D)  
SCLK duty cycle  
SEN to SCLK setup time  
SCLK to SEN hold time  
Data setup time  
50  
75  
%
ns  
6
ns  
8
ns  
tH(D)  
Data hold time  
6
ns  
(1) Values are characterized, but not production tested.  
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Table 2. Serial Register Table(1)  
A3 A2 A1 A0 D11  
D10  
D9  
D8 D7 D6 D5 D4 D3 D2  
D1  
D0  
DESCRIPTION  
DLL  
CTRL  
Clock DLL  
Internal DLL is on; recommended for 60MSPS to 105MSPS  
clock speeds.  
1
1
1
1
0
0
1
1
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
1
0
0
Internal DLL is off; recommended for 2MSPS to 80MSPS  
clock speeds.  
TP<1> TP<0>  
Test Mode  
1
1
1
1
1
1
1
1
1
1
1
1
0
0
0
0
0
0
0
0
1
1
0
1
0
1
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
X
X
X
X
0
0
0
0
Normal mode of operation  
All outputs forced to 0  
All outputs forced to 1  
0
(2)(3)  
0
Each output bit toggles between 0 and 1.  
PDN  
0
Power Down  
1
1
1
1
1
1
1
1
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
X
X
0
0
Normal mode of operation  
1
Device is put in power-down (low-current) mode.  
(1) The register contents default to the appropriate setting for normal operation up on RESET.  
(2) The patterns given are applicable to the straight offset binary output format. If two's complement output format is selected, the test mode  
outputs will be the binary two's complement equivalent of these patterns as described in the Output Information section.  
(3) While each bit toggles between 1 and 0 in this mode, there is no assured phase relationship between the data bits D0–D13. For  
example, when D0 is a 1, D1 is not assured to be a 0, and vice-versa.  
Table 3. Data Format Select (DFS) Table  
DFS-PIN VOLTAGE (VDFS  
)
DATA FORMAT  
CLOCK OUTPUT POLARITY  
2
12  
V
  AV  
  AV  
V
t
  AV  
DD  
Straight Binary  
Data valid on rising edge  
DFS  
DD  
5
12  
4
12  
t V  
t V  
t
  AV  
  AV  
Two's Complement  
Straight Binary  
Data valid on rising edge  
Data valid on falling edge  
Data valid on falling edge  
DD  
DFS  
8
12  
7
12  
t
DD  
DD  
DFS  
10  
12  
u
  AV  
DD  
Two's Complement  
DFS  
9
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PIN CONFIGURATION  
PAP PACKAGE  
(TOP VIEW)  
64 63 62 61 60 59 58 57 56 55 54 53 52 51 50 49  
DRGND  
SCLK  
SDATA  
SEN  
DRGND  
D3  
1
2
48  
47  
46  
45  
44  
43  
42  
41  
40  
39  
38  
37  
36  
35  
34  
33  
D2  
3
D1  
4
AVDD  
AGND  
AVDD  
AGND  
AVDD  
CLKP  
CLKM  
AGND  
AGND  
AGND  
AVDD  
AGND  
D0 (LSB)  
CLKOUT  
DRGND  
OE  
5
6
7
ADS5541  
PowerPAD  
8
DFS  
(Connected to Analog Ground)  
9
AVDD  
AGND  
AVDD  
AGND  
RESET  
AVDD  
AVDD  
10  
11  
12  
13  
14  
15  
16  
17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32  
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PIN CONFIGURATION (continued)  
PIN ASSIGNMENTS(1)  
TERMINAL  
NO. OF  
NAME  
NO.  
PINS  
I/O  
DESCRIPTION  
AVDD  
5, 7, 9, 15, 22, 24, 26, 28, 33, 34, 37, 39  
12  
I
Analog power supply  
6, 8, 12–14, 16, 18, 21, 23, 25, 27, 32,  
36, 38  
AGND  
14  
I
Analog ground (PowerPAD must be connected to analog ground).  
DRVDD  
DRGND  
INP  
49, 58  
2
6
1
1
I
I
I
I
Output driver power supply  
Output driver ground  
1, 42, 48, 50, 57, 59  
19  
20  
Differential analog input (positive)  
Differential analog input (negative)  
INM  
Reference voltage (positive); 1µF capacitor in series with a 1Ω  
resistor to GND.  
REFP  
REFM  
29  
30  
1
1
O
O
Reference voltage (negative); 1µF capacitor in series with a 1Ω  
resistor to GND.  
IREF  
CM  
31  
1
1
I
O
I
Current set; 56kresistor to GND; do not connect capacitors.  
17  
Common-mode output voltage  
(2)  
RESET  
OE  
35  
1
Reset (active high); Internal 200kresistor to AVDD  
.
41  
1
I
Output enable (active high)(3)  
DFS  
40  
1
I
Data format and clock out polarity select(4)(3)  
Data converter differential input clock (positive)  
Data converter differential input clock (negative)  
Serial interface chip select(3)  
CLKP  
10  
1
I
CLKM  
11  
1
I
SEN  
4
1
I
SDATA  
SCLK  
3
1
I
Serial interface data(3)  
2
1
I
Serial interface clock(3)  
D0 (LSB)–D13 (MSB)  
OVR  
44–47, 51–56, 60–63  
12  
1
O
O
O
Parallel data output  
64  
43  
Over-range indicator bit  
CLKOUT  
1
CMOS clock out in sync with data  
(1) PowerPAD is connected to analog ground.  
(2) If RESET pin is unused, it must be tied to AGND and serial interface should be used to reset the device. See the serial programming  
interface section for details.  
(3) Pins OE, DFS, SEN, SDATA, and SCLK have internal clamping diodes to the DRVDD supply. Any external circuit driving these pins must  
also run off the same supply voltage as DRVDD  
.
(4) Table 3 defines the voltage levels for each mode selectable via the DFS pin.  
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DEFINITION OF SPECIFICATIONS  
Offset Error  
Analog Bandwidth  
The offset error is the difference, given in number of  
LSBs, between the ADC actual average idle channel  
output code and the ideal average idle channel  
output code. This quantity is often mapped into mV.  
The analog input frequency at which the power of the  
fundamental is reduced by 3dB with respect to the  
low frequency value.  
Aperture Delay  
Temperature Drift  
The delay in time between the falling edge of the  
input sampling clock and the actual time at which the  
sampling occurs.  
The temperature drift coefficient (with respect to gain  
error and offset error) specifies the change per  
degree Celsius of the parameter from TMIN to TMAX. It  
is calculated by dividing the maximum deviation of  
the parameter across the TMIN to TMAX range by the  
difference (TMAX – TMIN).  
Aperture Uncertainty (Jitter)  
The sample-to-sample variation in aperture delay.  
Clock Pulse Width/Duty Cycle  
Signal-to-Noise Ratio (SNR)  
The duty cycle of a clock signal is the ratio of the  
time the clock signal remains at a logic high (clock  
pulse width) to the period of the clock signal. Duty  
cycle is typically expressed as a percentage. A  
perfect differential sine wave clock results in a 50%  
duty cycle.  
SNR is the ratio of the power of the fundamental (PS)  
to the noise floor power (PN), excluding the power at  
dc and the first eight harmonics.  
PS  
10 PN  
SNR + 10Log  
(1)  
Maximum Conversion Rate  
SNR is either given in units of dBc (dB to carrier)  
when the absolute power of the fundamental is used  
as the reference or dBFS (dB to Full-Scale) when the  
power of the fundamental is extrapolated to the  
converter full-scale range.  
The maximum sampling rate at which certified  
operation is given. All parametric testing is performed  
at this sampling rate unless otherwise noted.  
Minimum Conversion Rate  
Signal-to-Noise and Distortion (SINAD)  
The minimum sampling rate at which the ADC  
functions.  
SINAD is the ratio of the power of the fundamental  
(PS) to the power of all the other spectral  
components including noise (PN) and distortion (PD),  
but excluding dc.  
Differential Nonlinearity (DNL)  
An ideal ADC exhibits code transitions at analog  
input values spaced exactly 1LSB apart. The DNL is  
the deviation of any single step from this ideal value,  
measured in units of LSBs.  
PS  
SINAD + 10Log  
10 PN ) PD  
(2)  
SINAD is either given in units of dBc (dB to carrier)  
when the absolute power of the fundamental is used  
as the reference or dBFS (dB to full-scale) when the  
power of the fundamental is extrapolated to the  
converter full-scale range.  
Integral Nonlinearity (INL)  
The INL is the deviation of the ADC transfer function  
from a best fit line determined by a least squares  
curve fit of that transfer function, measured in units  
of LSBs.  
Effective Number of Bits (ENOB)  
Gain Error  
The ENOB is  
a
measure of  
a
converter's  
performance as compared to the theoretical limit  
based on quantization noise.  
The gain error is the deviation of the ADC actual  
input full-scale range from its ideal value. The gain  
error is given as a percentage of the ideal input  
full-scale range. Gain error does not account for  
variations in the internal reference voltages (see the  
Electrical Characteristics section for limits on the  
variation of VREFP and VREFM).  
SINAD * 1.76  
ENOB +  
6.02  
(3)  
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Total Harmonic Distortion (THD)  
Reference Error  
THD is the ratio of the power of the fundamental (PS)  
to the power of the first eight harmonics (PD).  
The reference error is the variation of the actual  
reference voltage (VREFP – VREFM) from its ideal  
value. The reference error is typically given as a  
percentage.  
PS  
10 PD  
THD + 10Log  
(4)  
Voltage Overload Recovery Time  
THD is typically given in units of dBc (dB to carrier).  
The voltage overload recovery time is defined as the  
time required for the ADC to recover to within 1% of  
the full-scale range in response to an input voltage  
overload of 10% beyond the full-scale range.  
Spurious-Free Dynamic Range (SFDR)  
The ratio of the power of the fundamental to the  
highest other spectral component (either spur or  
harmonic). SFDR is typically given in units of dBc  
(dB to carrier).  
AC Power-Supply Rejection Ratio (AC PSRR)  
The ratio of output spectral power at a given  
frequency with respect to the injected ac-power on  
AVDD at that frequency. The rejected ac-input  
Two-Tone Intermodulation Distortion (IMD3)  
IMD3 is the ratio of the power of the fundamental (at  
frequencies f1 and f2) to the power of the worst  
spectral component at either frequency 2f1 – f2 or 2f2  
– f1. IMD3 is either given in units of dBc (dB to  
carrier) when the absolute power of the fundamental  
is used as the reference, or dBFS (dB to full scale)  
when the power of the fundamental is extrapolated to  
the converter full-scale range.  
amplitude should be limited to less than 100mVPP  
The PSRR is typically given in units of dB.  
.
DC Power-Supply Rejection Ration (DC PSRR)  
The DC PSSR is the ratio of the change in offset  
error to a change in analog supply voltage. The DC  
PSRR is typically given in units of mV/V.  
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TYPICAL CHARACTERISTICS  
At TA = +25°C, AVDD = DRVDD = 3.3V, sampling rate = 105MSPS, 50% clock duty cycle, DLL On, 3VPP differential clock, and  
–1dBFS differential input, unless otherwise noted.  
SPECTRAL PERFORMANCE  
(FFT for 4MHz Input Signal)  
SPECTRAL PERFORMANCE  
(FFT for 16MHz Input Signal)  
0
-20  
0
-20  
SFDR = 87.3dBc  
SFDR = 91.6dBc  
SNR = 73.9dBFS  
THD = 85.7dBc  
SNR = 74.3dBFS  
THD = 87.5dBc  
SINAD = 73.7dBFS  
SINAD = 74.1dBFS  
-40  
-40  
-60  
-60  
-80  
-80  
-100  
-120  
-100  
-120  
0
0
0
10  
20  
30  
40  
50  
0
0
0
10  
20  
30  
40  
50  
Frequency (MHz)  
Frequency (MHz)  
Figure 5.  
Figure 6.  
SPECTRAL PERFORMANCE  
(FFT for 55MHz Input Signal)  
SPECTRAL PERFORMANCE  
(FFT for 70MHz Input Signal)  
0
-20  
0
-20  
SFDR = 80.9dBc  
SFDR = 88.2dBc  
SNR = 73.1dBFS  
THD = 79.1dBc  
SNR = 73.5dBFS  
THD = 84.2dBc  
SINAD = 72.3dBFS  
SINAD = 73.2dBFS  
-40  
-40  
-60  
-60  
-80  
-80  
-100  
-120  
-100  
-120  
10  
20  
30  
40  
50  
10  
20  
30  
40  
50  
Frequency (MHz)  
Frequency (MHz)  
Figure 7.  
Figure 8.  
SPECTRAL PERFORMANCE  
(FFT for 100MHz Input Signal)  
SPECTRAL PERFORMANCE  
(FFT for 125MHz Input Signal)  
0
-20  
0
-20  
SFDR = 85.2dBc  
SFDR = 82.8dBc  
SNR = 72.3dBFS  
THD = 82.4dBc  
SNR = 72.1dBFS  
THD = 80.8dBc  
SINAD = 71.9dBFS  
SINAD = 71.7dBFS  
-40  
-40  
-60  
-60  
-80  
-80  
-100  
-120  
-100  
-120  
10  
20  
30  
40  
50  
10  
20  
30  
40  
50  
Frequency (MHz)  
Frequency (MHz)  
Figure 9.  
Figure 10.  
14  
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TYPICAL CHARACTERISTICS (continued)  
At TA = +25°C, AVDD = DRVDD = 3.3V, sampling rate = 105MSPS, 50% clock duty cycle, DLL On, 3VPP differential clock, and  
–1dBFS differential input, unless otherwise noted.  
SPECTRAL PERFORMANCE  
(FFT for 150MHz Input Signal)  
SPECTRAL PERFORMANCE  
(FFT for 220MHz Input Signal)  
0
-20  
0
-20  
SFDR = 74.3dBc  
SFDR = 73.1dBc  
SNR = 71.5dBFS  
THD = 74.1dBc  
SNR = 69.5dBFS  
THD = 72.5dBc  
SINAD = 68dBFS  
SINAD = 69.9dBFS  
-40  
-40  
-60  
-60  
-80  
-80  
-100  
-120  
-100  
-120  
0
10  
20  
30  
40  
50  
0
10  
20  
30  
40  
50  
Frequency (MHz)  
Frequency (MHz)  
Figure 11.  
Figure 12.  
SPECTRAL PERFORMANCE  
(FFT for 300MHz Input Signal)  
TWO-TONE INTERMODULATION  
0
-20  
0
-20  
SFDR = 65.1dBc  
f1 = 10.1MHz, 7dBFS  
f2 = 15.1MHz, 7dBFS  
IMD3 = 94.6dBFS  
SNR = 67.8dBFS  
THD = 64.3dBc  
SINAD = 63.4dBFS  
-40  
-40  
-60  
-60  
-80  
-80  
-100  
-120  
-100  
-120  
0
10  
20  
30  
40  
50  
0
10  
20  
30  
40  
50  
Frequency (MHz)  
Frequency (MHz)  
Figure 13.  
Figure 14.  
TWO-TONE INTERMODULATION  
TWO-TONE INTERMODULATION  
0
-20  
0
-20  
f1 = 150.1MHz, 7dBFS  
f2 = 155.1MHz, 7dBFS  
IMD = 84.7dBFS  
f1 = 50.1MHz, 7dBFS  
f2 = 55.1MHz, 7dBFS  
IMD = 96.6dBFS  
-40  
-40  
-60  
-60  
-80  
-80  
-100  
-120  
-100  
-120  
0
10  
20  
30  
40  
50  
0
10  
20  
30  
40  
50  
Frequency (MHz)  
Frequency (MHz)  
Figure 15.  
Figure 16.  
15  
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TYPICAL CHARACTERISTICS (continued)  
At TA = +25°C, AVDD = DRVDD = 3.3V, sampling rate = 105MSPS, 50% clock duty cycle, DLL On, 3VPP differential clock, and  
–1dBFS differential input, unless otherwise noted.  
DIFFERENTIAL NONLINEARITY  
INTEGRAL NONLINEARITY  
2.0  
1.5  
1.0  
0.8  
f
A
= 10 MHz  
f
A
= 10 MHz  
IN  
IN  
= −0.5 dBFS  
= −0.5 dBFS  
IN  
IN  
0.6  
1.0  
0.4  
0.5  
0.2  
0.0  
0.0  
−0.2  
−0.4  
−0.6  
−0.8  
−1.0  
−0.5  
−1.0  
−1.5  
−2.0  
0
2048 4096 6144 8192 10240 12288 14336 16384  
0
2048 4096 6144 8192 10240 12288 14336 16384  
Code  
Code  
Figure 17.  
Figure 18.  
SPURIOUS-FREE DYNAMIC RANGE vs  
INPUT FREQUENCY  
SIGNAL-TO-NOISE RATIO vs  
INPUT FREQUENCY  
95  
90  
85  
80  
75  
70  
65  
60  
75  
74  
73  
72  
71  
70  
69  
68  
67  
66  
65  
0
50  
100  
150  
200  
250  
300  
0
50  
100  
150  
200  
250  
300  
Input Frequency (MHz)  
Input Frequency (MHz)  
Figure 19.  
Figure 20.  
AC PERFORMANCE vs ANALOG SUPPLY VOLTAGE  
AC PERFORMANCE vs ANALOG SUPPLY VOLTAGE  
90  
76  
88  
86  
84  
82  
80  
78  
76  
74  
72  
70  
f
IN  
= 70 MHz  
f
IN  
= 150 MHz  
75  
74  
73  
72  
71  
70  
SFDR  
SFDR  
SNR  
SNR  
3.0  
3.1  
3.2  
3.3  
3.4  
3.5  
3.6  
3.0  
3.1  
3.2  
3.3  
3.4  
3.5  
3.6  
Analog Supply Voltage (V)  
Analog Supply Voltage (V)  
Figure 21.  
Figure 22.  
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TYPICAL CHARACTERISTICS (continued)  
At TA = +25°C, AVDD = DRVDD = 3.3V, sampling rate = 105MSPS, 50% clock duty cycle, DLL On, 3VPP differential clock, and  
–1dBFS differential input, unless otherwise noted.  
AC PERFORMANCE vs DIGITAL SUPPLY VOLTAGE  
AC PERFORMANCE vs DIGITAL SUPPLY VOLTAGE  
90  
80  
f
IN  
= 150MHz  
f
IN  
= 70 MHz  
88  
86  
84  
82  
80  
78  
76  
74  
72  
70  
78  
76  
74  
72  
70  
68  
66  
64  
62  
60  
SFDR  
SNR  
SFDR  
SNR  
3.0  
3.1  
3.2  
3.3  
3.4  
3.5  
3.6  
3.0  
3.1  
3.2  
3.3  
3.4  
3.5  
3.6  
Digital Supply Voltage (V)  
Digital Supply Voltage (V)  
Figure 23.  
Figure 24.  
POWER DISSIPATION vs SAMPLE RATE  
POWER DISSIPATION vs SAMPLE RATE  
600  
500  
400  
300  
200  
100  
0
600  
500  
400  
300  
200  
100  
0
f
IN  
= 70MHz  
f
IN  
= 150MHz  
Analog (DLL On)  
Analog (DLL On)  
Analog (DLL Off)  
Analog (DLL Off)  
I/O (DLL On)  
I/O (DLL On)  
I/O (DLL Off)  
I/O (DLL Off)  
0
10 20 30 40 50 60 70 80 90 100 110  
Sample Rate (MSPS)  
0
10 20 30 40 50 60 70 80 90 100 110  
Sample Rate (MSPS)  
Figure 25.  
Figure 26.  
AC PERFORMANCE vs FREE-AIR TEMPERATURE  
AC PERFORMANCE vs INPUT AMPLITUDE  
90  
88  
86  
84  
82  
80  
78  
76  
74  
72  
70  
100  
90  
80  
70  
60  
50  
40  
30  
20  
10  
0
−10  
−20  
−30  
f
IN  
= 70MHz  
f
IN  
= 70MHz  
SNR (dBFS)  
SFDR  
SFDR (dBc)  
SNR (dBc)  
SNR  
−40  
−15  
10  
35  
60  
85  
−100 −90 −80 −70 −60 −50 −40 −30 −20 −10  
0
Free-Air Temperature (°C)  
Input Amplitude (dBFS)  
Figure 27.  
Figure 28.  
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TYPICAL CHARACTERISTICS (continued)  
At TA = +25°C, AVDD = DRVDD = 3.3V, sampling rate = 105MSPS, 50% clock duty cycle, DLL On, 3VPP differential clock, and  
–1dBFS differential input, unless otherwise noted.  
AC PERFORMANCE vs INPUT AMPLITUDE  
AC PERFORMANCE vs INPUT AMPLITUDE  
100  
90  
80  
100  
90  
80  
f
IN  
= 150MHz  
f
IN  
= 220MHz  
SNR (dBFS)  
SNR (dBFS)  
70  
70  
60  
60  
50  
40  
50  
40  
SFDR (dBc)  
SFDR (dBc)  
30  
30  
SNR (dBc)  
SNR (dBc)  
20  
20  
10  
10  
0
0
−10  
−20  
−30  
−10  
−20  
−30  
−100 −90 −80 −70 −60 −50 −40 −30 −20 −10  
0
−100 −90 −80 −70 −60 −50 −40 −30 −20 −10  
0
Input Amplitude (dBFS)  
Input Amplitude (dBFS)  
Figure 29.  
Figure 30.  
AC PERFORMANCE vs DIFFERENTIAL CLOCK  
AMPLITUDE  
OUTPUT NOISE HISTOGRAM  
45  
95  
90  
85  
80  
75  
70  
65  
39.24  
f
IN  
= 70MHz  
40  
35  
30  
25  
20  
15  
10  
5
SFDR  
SNR  
0
8195 8196 8197 8198 8199 8200 8201 8201 8203  
0.0  
0.5  
1.0  
1.5  
2.0  
2.5  
3.0  
Code  
Differential Clock Amplitude (V)  
Figure 31.  
Figure 32.  
WCDMA CARRIER  
AC PERFORMANCE vs CLOCK DUTY CYCLE  
0
−20  
95  
90  
85  
80  
75  
70  
65  
SFDR  
f
IN  
= 20MHz  
−40  
−60  
−80  
−100  
−120  
−140  
SNR  
0
5
10 15 20 25 30 35 40 45 50  
Frequency (MHz)  
40  
45  
50  
55  
60  
Clock Duty Cycle (%)  
Figure 33.  
Figure 34.  
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TYPICAL CHARACTERISTICS  
At TA = +25°C, AVDD = DRVDD = 3.3V, sampling rate = 105MSPS, 50% clock duty cycle, DLL On, 3VPP differential clock, and  
–1dBFS differential input, unless otherwise noted.  
125  
69  
67  
70  
120  
115  
110  
105  
100  
95  
66  
70  
69  
70  
69  
68  
67  
68  
67  
66  
90  
66  
85  
70  
80  
75  
68  
70  
69  
67  
65  
70  
80  
66  
60  
20  
40  
60  
100  
120  
140  
160  
180  
200  
220  
Input Frequency (MHz)  
Figure 35. SIGNAL-TO-NOISE RATIO (SNR) (DLL On)  
125  
120  
115  
110  
105  
100  
95  
64  
67  
67  
68  
66  
67  
70  
65  
68  
68  
69  
69  
68  
67  
69  
66  
70  
67  
90  
69  
70  
68  
85  
66  
65  
64  
80  
75  
70  
66  
70  
69  
65  
67  
68  
60  
20  
40  
60  
80  
100  
120  
140  
160  
180  
200  
220  
Input Frequency (MHz)  
Figure 36. SIGNAL-TO-NOISE RATIO (SNR) (DLL Off)  
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TYPICAL CHARACTERISTICS (continued)  
At TA = +25°C, AVDD = DRVDD = 3.3V, sampling rate = 105MSPS, 50% clock duty cycle, DLL On, 3VPP differential clock, and  
–1dBFS differential input, unless otherwise noted.  
125  
86  
84  
80  
84  
78  
120  
115  
110  
105  
100  
95  
84  
84  
88  
86  
84  
82  
80  
78  
76  
74  
72  
82  
76  
76  
74  
82  
82  
82  
82  
82  
80  
86  
86  
78  
84  
84  
74  
84  
90  
86  
82  
85  
80  
84  
78  
76  
80  
84  
75  
74  
86  
84  
86  
70  
88  
65  
88  
84  
86  
82  
84  
82  
80  
140  
Input Frequency (MHz)  
76  
78  
84  
100  
60  
20  
40  
60  
80  
120  
160  
180  
200  
220  
Figure 37. SPURIOUS-FREE DYNAMIC RANGE (SFDR) (DLL On)  
125  
120  
115  
76  
76  
74  
80  
82  
78  
1
88  
86  
84  
82  
80  
78  
76  
74  
72  
78  
78  
110 1
105  
80  
82  
76  
84  
74  
84  
100 1
95  
86  
80  
84  
72  
82  
78  
90
85  
76  
88  
84  
74  
80
75  
80  
88  
82  
84  
84  
84  
86  
86  
78  
70
65  
86  
84  
82  
76  
60  
20  
40  
60  
80  
100  
120  
140  
160  
180  
200  
220  
Input Frequency (MHz)  
Figure 38. SPURIOUS-FREE DYNAMIC RANGE (SFDR) (DLL Off)  
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APPLICATION INFORMATION  
clock cycle. This process results in a data latency of  
17.5 clock cycles, after which the output data is  
available as a 14-bit parallel word, coded in either  
straight offset binary or binary two’s complement  
format.  
THEORY OF OPERATION  
The ADS5541 is a low-power, 14-bit, 105MSPS,  
CMOS, switched capacitor, pipeline ADC that  
operates from a single 3.3V supply. The conversion  
process is initiated by a falling edge of the external  
input clock. Once the signal is captured by the input  
S&H, the input sample is sequentially converted by a  
series of small resolution stages, with the outputs  
combined in a digital correction logic block. Both the  
rising and the falling clock edges are used to  
propagate the sample through the pipeline every half  
INPUT CONFIGURATION  
The analog input for the ADS5541 consists of a  
differential  
sample-and-hold  
architecture  
implemented using the switched capacitor technique  
shown in Figure 39.  
S
3a  
L1  
R1a  
C1a  
INP  
S
S
1a  
CP1  
CP3  
S
2
R3  
CA  
L2  
R1b  
C1b  
VINCM  
1V  
1b  
INM  
CP2  
CP4  
S
3b  
L , L : 6 nH − 10 nH effective  
1
2
R
1a  
, R : 5W − 8W  
1b  
C , C : 2.2 pF − 2.6 pF  
1a 1b  
CP , CP : 2.5 pF − 3.5 pF  
1
2
CP , CP : 1.2 pF − 1.8 pF  
3
4
C : 0.8 pF − 1.2 pF  
A
R : 80 W − 120 W  
3
Swithches: S , S  
On Resistance: 35 W − 50 W  
1a 1b:  
S : On Resistance: 7.5 W − 15 W  
2
S
, S : On Resistance: 40 W − 60 W  
3a 3b  
All switches OFF Resistance: 10 GW  
NOTE: All Switches are ON in sampling phase, which is approximately one-half of a clock period.  
Figure 39. Analog Input Stage  
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This differential input topology produces a high level  
of ac performance for high sampling rates. It also  
results in a very high usable input bandwidth,  
especially important for high intermediate-frequency  
(IF) or undersampling applications. The ADS5541  
requires each of the analog inputs (INP, INM) to be  
externally biased around the common-mode level of  
the internal circuitry (CM, pin 17). For a full-scale  
differential input, each of the differential lines of the  
input signal (pins 19 and 20) swing symmetrically  
between CM + 0.575V and CM – 0.575V. This  
means that each input is driven with a signal of up to  
CM ± 0.575V, so that each input has a maximum  
differential signal of 1.15VPP for a total differential  
input signal swing of 2.3VPP. The maximum swing is  
determined by the two reference voltages, the top  
reference (REFP, pin 29) and the bottom reference  
(REFM, pin 30).  
The single-ended signal is fed to the primary winding  
of an RF transformer. Placing a 25resistor in  
series with INP and INM is recommended to dampen  
ringing because of ADC kickback. Since the input  
signal must be biased around the common-mode  
voltage of the internal circuitry, the common-mode  
voltage (VCM) from the ADS5541 is connected to the  
center-tap of the secondary winding. To ensure a  
steady low-noise VCM reference, best performance is  
attained when the CM output (pin 17) is filtered to  
ground with a 10series resistor and parallel 0.1µF  
and 0.001µF low-inductance capacitors as illustrated  
in Figure 39.  
Output VCM (pin 17) is designed to directly drive the  
ADC input. When providing a custom CM level, be  
aware that the input structure of the ADC sinks a  
common-mode current in the order of 500µA (250µA  
per input) at 105MSPS. Equation 5 describes the  
dependency of the common-mode current and the  
sampling frequency:  
The ADS5541 gives optimum performance when the  
analog inputs are driven differentially. The circuit  
shown in Figure 40 illustrates one possible  
configuration using an RF transformer.  
500mA   fS (in MSPS)  
105 MSPS  
Where:  
fS > 2MSPS.  
(5)  
This equation helps to design the output capability  
and impedance of the driving circuit accordingly.  
R0  
Z0  
50  
25  
50  
INP  
1:1  
R
50  
AC Signal  
Source  
ADS5541  
25  
INM  
CM  
ADT11WT  
10  
µ
0.1 F  
1nF  
Figure 40. Transformer Input to Convert Single-Ended Signal to Differential Signal  
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When it is necessary to buffer or apply a gain to the  
incoming analog signal, it is possible to combine  
single-ended operational amplifiers with an RF  
transformer, or to use a differential input/output  
amplifier without a transformer, to drive the input of  
the ADS5541. Texas Instruments offers a wide  
selection of single-ended operational amplifiers  
(including the THS3201, THS3202, OPA847, and  
OPA695) that can be selected depending on the  
application. An RF gain block amplifier, such as  
Texas Instruments THS9001, can also be used with  
an RF transformer for high input frequency  
Figure 41 illustrates how RIN and CIN can be placed  
to isolate the signal source from the switching inputs  
of the ADC and to implement a low-pass RC filter to  
limit the input noise in the ADC. It is recommended  
that these components be included in the ADS5541  
circuit layout when any of the amplifier circuits  
discussed previously are used. The components  
allow fine-tuning of the circuit performance. Any  
mismatch between the differential lines of the  
ADS5541 input produces  
a
degradation in  
performance at high input frequencies, mainly  
characterized by an increase in the even-order  
harmonics. In this case, special care should be taken  
to keep as much electrical symmetry as possible  
between both inputs.  
applications. The THS4503 is  
a recommended  
differential input/output amplifier. Table 4 lists the  
recommended amplifiers.  
When using single-ended operational amplifiers  
(such as the THS3201, THS3202, OPA847, or  
OPA695) to provide gain, a three-amplifier circuit is  
recommended with one amplifier driving the primary  
of an RF transformer and one amplifier in each of the  
legs of the secondary driving the two differential  
inputs of the ADS5520. These three amplifier circuits  
minimize even-order harmonics. For high frequency  
inputs, an RF gain block amplifier can be used to  
Another possible configuration for lower-frequency  
signals is the use of differential input/output  
amplifiers that can simplify the driver circuit for  
applications requiring dc-coupling of the input.  
Flexible in their configurations (see Figure 42), such  
amplifiers can be used for single-ended-to-differential  
conversion signal amplification.  
drive  
a transformer primary; in this case, the  
transformer secondary connections can drive the  
input of the ADS5541 directly, as shown in  
Figure 40, or with the addition of the filter circuit  
shown in Figure 41.  
Table 4. Recommended Amplifiers to Drive the Input of the ADS5520  
INPUT SIGNAL FREQUENCY  
RECOMMENDED AMPLIFIER  
THS4503  
TYPE OF AMPLIFIER  
Differential In/Out Amp  
USE WITH TRANSFORMER  
DC to 20MHz  
DC to 50MHz  
No  
OPA847  
OPA695  
THS3201  
THS3202  
THS9001  
Operational Amp  
Operational Amp  
Operational Amp  
Operational Amp  
RF Gain Block  
Yes  
Yes  
Yes  
Yes  
Yes  
10MHz to 120MHz  
Over 100MHz  
+5V 5V  
RS  
RIN  
100  
µ
0.1 F  
VIN  
1:1  
INP  
INM  
OPA695  
RT  
100  
CIN  
1000pF  
ADS5541  
RIN  
R1  
400  
CM  
10  
AV = 8V/V  
(18dB)  
R2  
57.5  
µ
0.1 F  
Figure 41. Converting a Single-Ended Input Signal to a Differential Signal Using an RF Transformer  
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RS  
RG  
RF  
+5V  
RT  
+3.3V  
µ
µ
0.1 F  
10 F  
RIN  
RIN  
INP  
ADS5541  
VOCM  
14-Bit / 105MSPS  
INM  
µ
1 F  
THS4503  
CM  
µ
µ
0.1 F  
10 F  
10  
5V  
RG  
RF  
µ
0.1 F  
Figure 42. Using the THS4503 with the ADS5520  
Using the serial interface PDN bit to power down the  
device places the outputs in a high-impedance state  
and only the internal reference remains on to reduce  
the power-up time. The power-down mode reduces  
power dissipation to approximately 180mW.  
POWER-SUPPLY SEQUENCE  
The preferred mode of power-supply sequencing is  
to power up AVDD first, followed by DRVDD. Raising  
both supplies simultaneously is also  
a
valid  
power-supply sequence. In the event that DRVDD  
powers up before AVDD in the system, AVDD must  
power up within 10ms of DRVDD. Optionally, it is  
recommended to put a 2kresistor from REFP (pin  
29) to AVDD as shown in Figure 43. This  
configuration helps to make the device more robust  
to power supply ramp-up timings.  
REFERENCE CIRCUIT  
The ADS5541 has built-in internal reference  
generation, requiring no external circuitry on the  
printed circuit board (PCB). For optimum  
performance, it is best to connect both REFP and  
REFM to ground with a 1µF decoupling capacitor  
(the 1resistor shown in Figure 44 is optional). In  
addition, an external 56kresistor should be  
connected from IREF (pin 31) to AGND to set the  
proper current for the operation of the ADC, as  
shown in Figure 44. No capacitor should be  
connected between pin 31 and ground; only the  
56kresistor should be used.  
28  
29  
AVDD  
2k  
REFP  
1Ω  
1µF  
1  
REFP  
REFM  
IREF  
29  
30  
31  
1µF  
1µF  
1Ω  
Figure 43.  
POWER-DOWN  
The device enters power-down in one of two ways:  
either by reducing the clock speed or by setting the  
PDN bit via the serial programming interface. Using  
the reduced clock speed, power-down may be  
initiated for clock frequency below 2MSPS. The  
exact frequency at which the power-down occurs  
varies from device to device.  
56kΩ  
Figure 44. REFP, REFM, and IREF Connections  
for Optimum Performance  
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CLOCK INPUT  
The ADS5541 clock input can also be driven  
differentially, reducing susceptibility to  
common-mode noise. In this case, it is best to  
connect both clock inputs to the differential input  
clock signal with 0.01µF capacitors, as shown in  
Figure 47.  
The ADS5541 clock input can be driven with either a  
differential clock signal or a single-ended clock input,  
with little or no difference in performance between  
both configurations. The common-mode voltage of  
the clock inputs is set internally to CM (pin 17) using  
internal 5kresistors that connect CLKP (pin 10)  
and CLKM (pin 11) to CM (pin 17), as shown in  
Figure 45.  
µ
0.01 F  
CLKP  
ADS5541  
CLKM  
Differential Square Wave  
or Sine Wave  
(3VPP  
)
CM  
CM  
µ
0.01 F  
5 kW  
5 kW  
Figure 47. AC-Coupled, Differential Clock Input  
For high-input frequency sampling, it is  
CLKM  
CLKP  
recommended to use a clock source with low jitter.  
Additionally, the internal ADC core uses both edges  
of the clock for the conversion process. This means  
that, ideally, a 50% duty cycle should be provided.  
Figure 48 shows the performance variation of the  
ADC versus clock duty cycle.  
6 pF  
95  
f
IN  
= 20MHz  
SFDR  
3 pF  
3 pF  
90  
85  
80  
75  
70  
65  
Figure 45. Clock Inputs  
When driven with a single-ended CMOS clock input,  
it is best to connect CLKM (pin 11) to ground with a  
0.01µF capacitor, while CLKP is ac-coupled with a  
0.01µF capacitor to the clock source, as shown in  
Figure 46.  
SNR  
40  
45  
50  
Clock Duty Cycle (%)  
55  
60  
µ
0.01 F  
Square Wave  
or Sine Wave  
CLKP  
ADS5541  
Figure 48. AC Performance vs Clock Duty Cycle  
(3VPP  
)
CLKM  
µ
0.01  
F
Figure 46. AC-Coupled, Single-Ended Clock Input  
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Bandpass filtering of the source can help produce a  
50% duty cycle clock and reduce the effect of jitter.  
When using a sinusoidal clock, the clock jitter further  
improves as the amplitude is increased. In that  
sense, using a differential clock allows for the use of  
larger amplitudes without exceeding the supply rails  
and absolute maximum ratings of the ADC clock  
input. Figure 49 shows the performance variation of  
the device versus input clock amplitude. For detailed  
clocking schemes based on transformer or  
PECL-level clocks, see the ADS5541EVM User's  
Guide (SLWU010), available for download from  
www.ti.com.  
of the two modes, the device enters power-down  
mode if no clock or a slow clock is provided. The  
limit of the clock frequency where the device  
functions properly with default settings is ensured to  
be over 2MHz.  
OUTPUT INFORMATION  
The ADC provides 14 data outputs (D13 to D0, with  
D13 being the MSB and D0 the LSB), a data-ready  
signal (CLKOUT, pin 43), and an out-of-range  
indicator (OVR, pin 64) that equals '1' when the  
output reaches the full-scale limits.  
Two different output formats (straight offset binary or  
two's complement) and two different output clock  
polarities (latching output data on rising or falling  
edge of the output clock) can be selected by setting  
DFS (pin 40) to one of four different voltages.  
Table 3 details the four modes. In addition, output  
enable control (OE, pin 41, active high) is provided to  
put the outputs into a high-impedance state.  
95  
f
IN  
= 70MHz  
90  
85  
80  
75  
70  
65  
SFDR  
SNR  
In the event of an input voltage overdrive, the digital  
outputs go to the appropriate full-scale level. For a  
positive overdrive, the output code is 0x3FFF in  
straight offset binary output format, and 0x1FFF in  
two's complement output format. For a negative input  
overdrive, the output code is 0x0000 in straight offset  
binary output format, and 0x2000 in two's  
complement output format. These outputs to an  
overdrive signal are ensured through design and  
characterization  
0.0  
0.5  
1.0  
1.5  
2.0  
2.5  
3.0  
Differential Clock Amplitude (V)  
Figure 49. AC Performance vs Clock Amplitude  
INTERNAL DLL  
The output circuitry of the ADS5541, by design,  
minimizes the noise produced by the data switching  
transients, and, in particular, its coupling to the ADC  
analog circuitry. Output D4 (pin 51) senses the load  
capacitance and adjusts the drive capability of all the  
output pins of the ADC to maintain the same output  
slew rate described in the timing diagram of Figure 1.  
Care should be taken to ensure that all output lines  
(including CLKOUT) have nearly the same load as  
D4 (pin 51). This circuit also reduces the sensitivity  
of the output timing versus supply voltage or  
temperature. Placing external resistors in series with  
the outputs is not recommended.  
In order to achieve the fastest possible sampling  
rates with the ADS5541, the device uses an internal  
delay locked loop (DLL). The effective delay range of  
the DLL limits its use to sampling rates above  
60MSPS. In order to operate the device below  
60MSPS, the internal DLL must be shut off using the  
DLL OFF mode described in the Serial Programming  
Interface section. The Typical Characteristics show  
the performance obtained in both modes of  
operation: DLL ON (default) and DLL OFF. In either  
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The timing characteristics of the digital outputs  
change for sampling rates below the 105MSPS  
maximum sampling frequency. Table 5 and Table 6  
show the setup, hold, and input clocks to output data  
delays, and rise and fall times for different sampling  
frequencies with the DLL on and off, respectively.  
To use the input clock as the data capture clock, it is  
necessary to delay the input clock by a delay, td, that  
results in the desired setup or hold time. Use either  
of the following equations to calculate the value of tD.  
Desired setup time = tD– tSTART  
Desired hold time = tEND – tD  
Table 7 and Table 8 show the values of various  
timing parameters for lower sampling frequencies,  
both with DLL on and off.  
Table 5. Timing Characteristics at Additional Sampling Frequencies (DLL ON)  
tSU (ns)  
tH (ns)  
tSTART (ns)  
tEND (ns)  
tR (ns)  
tF (ns)  
fS  
(MSPS)  
MIN TYP MAX MIN TYP MAX MIN TYP MAX MIN TYP MAX MIN TYP MAX MIN TYP MAX  
80  
65  
2.8  
3.8  
3.7  
4.6  
2.8  
3.6  
3.3  
4.1  
0.5  
1.7  
0.8  
5.3  
5.3  
7.9  
8.5  
5.8  
6.7  
6.6  
7.2  
4.4  
5.5  
5.3  
6.4  
–0.5  
Table 6. Timing Characteristics at Additional Sampling Frequencies (DLL OFF)  
tSU (ns)  
tH (ns)  
tSTART (ns)  
tEND (ns)  
tR (ns)  
tF (ns)  
fS  
(MSPS)  
MIN TYP MAX MIN TYP MAX MIN TYP MAX MIN TYP MAX MIN TYP MAX MIN TYP MAX  
80  
65  
40  
20  
10  
2
3.2  
4.3  
8.5  
17  
4.2  
5.7  
11  
1.8  
2
3
3.8  
2.8  
5
4.5  
1.5  
2
8.4  
8.3  
11  
5.8  
6.6  
7.5  
7.5  
6.6  
7.2  
8
4.4  
5.5  
7.3  
7.6  
5.3  
6.4  
7.8  
8
3
11.8  
14.5  
21.6  
31  
2.6  
2.5  
4
3.5  
4.7  
6.5  
19  
–1  
8.9  
25.7  
51  
–9.8  
-30  
185  
9.5  
8
27  
-3  
11.5  
515  
284  
370  
8
320  
576  
50  
82  
75  
150  
Table 7. Timing Characteristics at Additional Sampling Frequencies (DLL ON)  
CLKOUT  
tRISE (ns)  
CLKOUT  
tFALL (ns)  
CLKOUT Jitter, Peak-to-Peak  
tJIT (ps)  
Input-to-Output Clock Delay  
tPDI (ns)  
fS  
(MSPS)  
MIN  
TYP  
2.5  
MAX  
2.8  
MIN  
TYP  
2.1  
MAX  
2.3  
MIN  
TYP  
210  
260  
MAX  
315  
MIN  
3.7  
TYP  
4.3  
MAX  
5.1  
80  
65  
3.1  
3.5  
2.6  
2.9  
380  
3.5  
4.1  
4.8  
Table 8. Timing Characteristics at Additional Sampling Frequencies (DLL OFF)  
CLKOUT Jitter,  
CLKOUT  
tRISE (ns)  
CLKOUT  
tFALL (ns)  
Peak-to-Peak  
tJIT (ps)  
Input-to-Output Clock Delay  
tPDI (ns)  
fS  
(MSPS)  
MIN  
TYP  
2.5  
3.1  
4.8  
8.3  
31  
MAX  
2.8  
3.5  
5.3  
9.5  
52  
MIN  
TYP  
2.1  
2.6  
4
MAX  
2.3  
2.9  
4.4  
8.2  
65  
MIN  
TYP  
210  
260  
445  
800  
2610  
MAX  
315  
MIN  
7.1  
7.8  
9.5  
13  
TYP  
8
MAX  
8.9  
80  
65  
40  
20  
2
380  
8.5  
9.4  
650  
10.4  
15.5  
551  
11.4  
18  
7.6  
36  
1200  
4400  
537  
567  
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SERIAL PROGRAMMING INTERFACE  
frame die pad (or thermal pad) is exposed on the  
bottom of the IC. This provides an extremely low  
thermal resistance path between the die and the  
exterior of the package. The thermal pad on the  
bottom of the IC can then be soldered directly to the  
PCB, using the PCB as a heatsink.  
The ADS5541 has internal registers for the  
programming of some of the modes described in the  
previous sections. The registers should be reset after  
power-up by applying a 2µs (minimum) high pulse on  
RESET (pin 35); this pulse also resets the entire  
ADC and sets the data outputs to low. This pin has a  
Assembly Process  
200kinternal pullup resistor to AVDD  
.
The  
1. Prepare the PCB top-side etch pattern  
including etch for the leads as well as the  
thermal pad as illustrated in the Mechanical  
Data section. The recommended thermal pad  
dimension is 8mm × 8mm.  
programming is done through a three-wire interface.  
Table 2 shows the different modes and the bit values  
to be written to the register to enable them.  
Note that some of these modes may modify the  
standard operation of the device and possibly vary  
the performance with respect to the typical data  
shown in this data sheet.  
2. Place a 5-by-5 array of thermal vias in the  
thermal pad area. These holes should be  
13mils in diameter. The small size prevents  
wicking of the solder through the holes.  
Applying a RESET signal is absolutely essential to  
set the internal registers to the default states for  
normal operation. If the hardware RESET function is  
not used in the system, the RESET pin must be tied  
to ground, and it is necessary to write the default  
values to the internal registers through the serial  
programming interface. The registers must be written  
in the following order.  
3. It is recommended to place a small number of  
25mil diameter holes under the package, but  
outside the thermal pad area to provide an  
additional heat path.  
4. Connect all holes (both those inside and  
outside the thermal pad area) to an internal  
copper plane (such as a ground plane).  
Write 9000h (Address 9, Data 000)  
Write A000h (Address A, Data 000)  
Write B000h (Address B, Data 000)  
Write C000h (Address C, Data 000)  
Write D000h (Address D, Data 000)  
Write E000h (Address E, Data 804)  
Write 0000h (Address 0, Data 000)  
Write 1000h (Address 1, Data 000)  
Write F000h (Address F, Data 000)  
5. Do not use the typical web or spoke via  
connection pattern when connecting the  
thermal vias to the ground plane. The spoke  
pattern increases the thermal resistance to the  
ground plane.  
6. The top-side solder mask should leave  
exposed the terminals of the package and the  
thermal pad area.  
7. Cover the entire bottom side of the PowerPAD  
vias to prevent solder wicking.  
8. Apply solder paste to the exposed thermal  
pad area and all of the package terminals.  
NOTE: This procedure is only required if a RESET  
pulse is not provided to the device.  
For more detailed information regarding the  
PowerPAD package and its thermal properties, see  
either the application brief SLMA004B (PowerPAD  
Made Easy) or technical brief SLMA002 (PowerPAD  
Thermally Enhanced Package).  
PowerPAD PACKAGE  
The PowerPAD package is a thermally-enhanced  
standard size IC package designed to eliminate the  
use of bulky heatsinks and slugs traditionally used in  
thermal packages. This package can be easily  
mounted using standard printed circuit board (PCB)  
assembly techniques, and can be removed and  
replaced using standard repair procedures.  
The PowerPAD package is designed so that the lead  
28  
Submit Documentation Feedback  
Production Data  
ADS5541  
www.ti.com  
SBAS307CMAY 2004REVISED FEBRUARY 2007  
Changes from B Revision (March 2006) to C Revision ................................................................................................. Page  
Added MIN and MAX values for offset error and gain error, footnote for gain error. ........................................................... 3  
29  
Submit Documentation Feedback  
PACKAGE OPTION ADDENDUM  
www.ti.com  
10-Jun-2014  
PACKAGING INFORMATION  
Orderable Device  
ADS5541IPAP  
Status Package Type Package Pins Package  
Eco Plan  
Lead/Ball Finish  
MSL Peak Temp  
Op Temp (°C)  
-40 to 85  
Device Marking  
Samples  
Drawing  
Qty  
(1)  
(2)  
(6)  
(3)  
(4/5)  
ACTIVE  
HTQFP  
HTQFP  
PAP  
64  
64  
160  
Green (RoHS  
& no Sb/Br)  
CU NIPDAU  
Level-3-260C-168 HR  
ADS5541I  
ADS5541I  
ADS5541IPAPR  
ACTIVE  
PAP  
1000  
Green (RoHS  
& no Sb/Br)  
CU NIPDAU  
Level-3-260C-168 HR  
-40 to 85  
(1) The marketing status values are defined as follows:  
ACTIVE: Product device recommended for new designs.  
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.  
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.  
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.  
OBSOLETE: TI has discontinued the production of the device.  
(2) Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS), Pb-Free (RoHS Exempt), or Green (RoHS & no Sb/Br) - please check http://www.ti.com/productcontent for the latest availability  
information and additional product content details.  
TBD: The Pb-Free/Green conversion plan has not been defined.  
Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements for all 6 substances, including the requirement that  
lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes.  
Pb-Free (RoHS Exempt): This component has a RoHS exemption for either 1) lead-based flip-chip solder bumps used between the die and package, or 2) lead-based die adhesive used between  
the die and leadframe. The component is otherwise considered Pb-Free (RoHS compatible) as defined above.  
Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame retardants (Br or Sb do not exceed 0.1% by weight  
in homogeneous material)  
(3) MSL, Peak Temp. - The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.  
(4) There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device.  
(5) Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation  
of the previous line and the two combined represent the entire Device Marking for that device.  
(6) Lead/Ball Finish - Orderable Devices may have multiple material finish options. Finish options are separated by a vertical ruled line. Lead/Ball Finish values may wrap to two lines if the finish  
value exceeds the maximum column width.  
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information  
provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and  
continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals.  
TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release.  
Addendum-Page 1  
PACKAGE OPTION ADDENDUM  
www.ti.com  
10-Jun-2014  
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.  
Addendum-Page 2  
PACKAGE MATERIALS INFORMATION  
www.ti.com  
14-Jul-2012  
TAPE AND REEL INFORMATION  
*All dimensions are nominal  
Device  
Package Package Pins  
Type Drawing  
SPQ  
Reel  
Reel  
A0  
B0  
K0  
P1  
W
Pin1  
Diameter Width (mm) (mm) (mm) (mm) (mm) Quadrant  
(mm) W1 (mm)  
ADS5541IPAPR  
HTQFP  
PAP  
64  
1000  
330.0  
24.4  
13.0  
13.0  
1.5  
16.0  
24.0  
Q2  
Pack Materials-Page 1  
PACKAGE MATERIALS INFORMATION  
www.ti.com  
14-Jul-2012  
*All dimensions are nominal  
Device  
Package Type Package Drawing Pins  
HTQFP PAP 64  
SPQ  
Length (mm) Width (mm) Height (mm)  
367.0 367.0 45.0  
ADS5541IPAPR  
1000  
Pack Materials-Page 2  
IMPORTANT NOTICE  
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changes to its semiconductor products and services per JESD46, latest issue, and to discontinue any product or service per JESD48, latest  
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TI warrants performance of its components to the specifications applicable at the time of sale, in accordance with the warranty in TI’s terms  
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TI assumes no liability for applications assistance or the design of Buyers’ products. Buyers are responsible for their products and  
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