HFS10N60S [SEMIHOW]

600V N-Channel MOSFET; 600V N沟道MOSFET
HFS10N60S
型号: HFS10N60S
厂家: SEMIHOW CO.,LTD.    SEMIHOW CO.,LTD.
描述:

600V N-Channel MOSFET
600V N沟道MOSFET

文件: 总7页 (文件大小:784K)
中文:  中文翻译
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Nov 2007  
BVDSS = 600 V  
DS(on) typ = 0.83 Ω  
R
HFS10N60S  
600V N-Channel MOSFET  
ID = 9.5 A  
TO-220F  
FEATURES  
1
2
3
Originative New Design  
Superior Avalanche Rugged Technology  
Robust Gate Oxide Technology  
Very Low Intrinsic Capacitances  
Excellent Switching Characteristics  
Unrivalled Gate Charge : 29 nC (Typ.)  
Extended Safe Operating Area  
Lower RDS(ON) : 0.67 Ω (Typ.) @VGS=10V  
100% Avalanche Tested  
1.Gate 2. Drain 3. Source  
Absolute Maximum Ratings  
TC=25unless otherwise specified  
Symbol  
Parameter  
Value  
Units  
V
VDSS  
Drain-Source Voltage  
Drain Current  
600  
9.5*  
5.7*  
38*  
±30  
700  
9.5  
ID  
– Continuous (TC = 25℃)  
– Continuous (TC = 100℃)  
A
Drain Current  
A
IDM  
VGS  
EAS  
IAR  
Drain Current  
– Pulsed  
(Note 1)  
A
Gate-Source Voltage  
V
Single Pulsed Avalanche Energy  
Avalanche Current  
(Note 2)  
(Note 1)  
(Note 1)  
(Note 3)  
mJ  
A
EAR  
dv/dt  
PD  
Repetitive Avalanche Energy  
Peak Diode Recovery dv/dt  
15.6  
4.5  
mJ  
V/ns  
Power Dissipation (TC = 25)  
- Derate above 25℃  
50  
0.4  
W
W/℃  
TJ, TSTG  
TL  
Operating and Storage Temperature Range  
-55 to +150  
Maximum lead temperature for soldering purposes,  
1/8” from case for 5 seconds  
300  
*Drain current limited by maximum junction temperature  
Thermal Resistance Characteristics  
Symbol  
Parameter  
Typ.  
Max.  
Units  
RθJC  
RθJA  
Junction-to-Case  
--  
--  
2.5  
℃/W  
Junction-to-Ambient  
62.5  
SEMIHOW REV.A0,Nov 2007  
Electrical Characteristics TC=25 °C unless otherwise specified  
Symbol  
Parameter  
Test Conditions  
Min  
Typ  
Max Units  
On Characteristics  
VGS  
--  
Gate Threshold Voltage  
VDS = VGS, ID = 250 ㎂  
2.0  
--  
4.0  
0.8  
V
RDS(ON) Static Drain-Source  
On-Resistance  
0.67  
V
GS = 10 V, ID = 4.75 A  
Off Characteristics  
BVDSS  
Drain-Source Breakdown Voltage VGS = 0 V, ID = 250 ㎂  
600  
--  
--  
--  
--  
V
ΔBVDSS Breakdown Voltage Temperature  
ID = 250 , Referenced to 25  
DS = 600 V, VGS = 0 V  
0.7  
V/℃  
/ΔTJ  
Coefficient  
IDSS  
--  
--  
--  
--  
1
V
Zero Gate Voltage Drain Current  
VDS = 480 V, TC = 125℃  
10  
IGSSF  
IGSSR  
Gate-Body Leakage Current,  
Forward  
VGS = 30 V, VDS = 0 V  
--  
--  
--  
--  
100  
Gate-Body Leakage Current,  
Reverse  
VGS = -30 V, VDS = 0 V  
-100  
Dynamic Characteristics  
Ciss  
Input Capacitance  
--  
--  
--  
1450 1885  
VDS = 25 V, VGS = 0 V,  
f = 1.0 MHz  
Coss  
Crss  
Output Capacitance  
145  
13  
190  
17  
Reverse Transfer Capacitance  
Switching Characteristics  
td(on)  
Turn-On Time  
--  
--  
--  
--  
--  
--  
--  
23  
69  
55  
150  
300  
165  
38  
VDS = 300 V, ID = 9.5 A,  
tr  
td(off)  
tf  
Turn-On Rise Time  
Turn-Off Delay Time  
Turn-Off Fall Time  
Total Gate Charge  
Gate-Source Charge  
Gate-Drain Charge  
RG = 25 Ω  
144  
77  
(Note 4,5)  
Qg  
29  
nC  
nC  
nC  
VDS = 480V, ID = 9.5 A,  
Qgs  
Qgd  
VGS = 10 V  
6.8  
10.3  
--  
(Note 4,5)  
--  
Source-Drain Diode Maximum Ratings and Characteristics  
IS  
Continuous Source-Drain Diode Forward Current  
Pulsed Source-Drain Diode Forward Current  
--  
--  
--  
--  
--  
--  
--  
9.5  
38  
1.4  
--  
A
ISM  
VSD  
trr  
Source-Drain Diode Forward Voltage IS = 9.5 A, VGS = 0 V  
--  
V
Reverse Recovery Time  
Reverse Recovery Charge  
420  
4.2  
μC  
IS = 9.5 A, VGS = 0 V  
diF/dt = 100 A/μs (Note 4)  
--  
Qrr  
Notes ;  
1. Repetitive Rating : Pulse width limited by maximum junction temperature  
2. L=14.2mH, IAS=9.5A, VDD=50V, RG=25, Starting TJ =25°C  
3. ISD≤9.5A, di/dt≤200A/μs, VDD≤BVDSS , Starting TJ =25 °C  
4. Pulse Test : Pulse Width ≤ 300μs, Duty Cycle ≤ 2%  
5. Essentially Independent of Operating Temperature  
SEMIHOW REV.A0,Nov 2007  
Typical Characteristics  
VDS, Drain-Source Voltage [V]  
VGS, Gate-Source Voltage [V]  
Figure 1. On Region Characteristics  
Figure 2. Transfer Characteristics  
2.0  
1.5  
1.0  
0.5  
0.0  
VGS = 10V  
VGS = 20V  
* Note : TJ = 25oC  
0
5
10  
15  
20  
25  
30  
35  
ID, Drain Current[A]  
VSD, Source-Drain Voltage [V]  
Figure 4. Body Diode Forward Voltage  
Variation with Source Current  
and Temperature  
Figure 3. On Resistance Variation vs  
Drain Current and Gate Voltage  
3000  
2500  
2000  
1500  
1000  
500  
12  
10  
8
C
iss = Cgs + Cgd (Cds = shorted)  
Coss = Cds + Cgd  
rss = Cgd  
VDS = 120V  
VDS = 300V  
C
C
iss  
VDS = 480V  
Coss  
6
Note ;  
1. VGS = 0 V  
4
C
2. f = 1 MHz  
rss  
2
* Note : ID = 9.5A  
0
10  
0
-1  
100  
101  
0
4
8
12  
16  
20  
24  
28  
32  
QG, Total Gate Charge [nC]  
VDS, Drain-Source Voltage [V]  
Figure 5. Capacitance Characteristics  
Figure 6. Gate Charge Characteristics  
SEMIHOW REV.A0,Nov 2007  
Typical Characteristics (continued)  
2.5  
2.0  
1.5  
1.0  
0.5  
0.0  
Note :  
1. VGS = 10 V  
2. ID = 4.75 A  
-100  
-50  
0
50  
100  
150  
200  
TJ, Junction Temperature [oC]  
TJ, Junction Temperature [oC]  
Figure 8. On-Resistance Variation  
vs Temperature  
Figure 7. Breakdown Voltage Variation  
vs Temperature  
102  
10  
8
Operation in This Area  
is Limited by R DS(on)  
10 µs  
100 µs  
101  
1 ms  
10 ms  
6
100 ms  
100  
DC  
4
-1  
10  
* Notes :  
2
1. TC = 25 o  
C
2. TJ = 150 o  
C
3. Single Pulse  
-2  
0
25  
10  
100  
101  
102  
103  
50  
75  
100  
125  
150  
VDS, Drain-Source Voltage [V]  
TC, Case Temperature [oC]  
Figure 9. Maximum Safe Operating Area  
Figure 10. Maximum Drain Current  
vs Case Temperature  
D=0.5  
100  
0.2  
0.1  
* Notes :  
1. ZθJC(t) = 2.5 oC/W Max.  
2. Duty Factor, D=t1/t2  
3. TJM - TC = PDM * ZθJC(t)  
0.05  
-1  
10  
0.02  
0.01  
PDM  
single pulse  
t1  
-2  
10  
t2  
-5  
10  
-4  
10  
-3  
10  
-2  
10  
-1  
10  
100  
101  
t1, Square Wave Pulse Duration [sec]  
Figure 11. Transient Thermal Response Curve  
SEMIHOW REV.A0,Nov 2007  
Fig 12. Gate Charge Test Circuit & Waveform  
VGS  
Same Type  
50KΩ  
as DUT  
Qg  
12V  
200nF  
10V  
300nF  
VDS  
VGS  
Qgs  
Qgd  
DUT  
3mA  
Charge  
Fig 13. Resistive Switching Test Circuit & Waveforms  
RL  
VDS  
90%  
VDS  
VDD  
( 0.5 rated VDS  
)
RG  
10%  
Vin  
DUT  
10V  
td(on)  
tr  
td(off)  
tf  
ton  
toff  
Fig 14. Unclamped Inductive Switching Test Circuit & Waveforms  
BVDSS  
--------------------  
BVDSS -- VDD  
L
1
2
2
----  
EAS  
=
LL IAS  
VDS  
VDD  
BVDSS  
IAS  
ID  
RG  
ID (t)  
VDD  
VDS (t)  
DUT  
10V  
t p  
Time  
SEMIHOW REV.A0,Nov 2007  
Fig 15. Peak Diode Recovery dv/dt Test Circuit & Waveforms  
DUT  
+
VDS  
_
IS  
L
Driver  
RG  
Same Type  
as DUT  
VDD  
VGS  
• dv/dt controlled by RG  
• IS controlled by pulse period  
Gate Pulse Width  
--------------------------  
VGS  
D =  
Gate Pulse Period  
10V  
( Driver )  
IFM , Body Diode Forward Current  
IS  
di/dt  
( DUT )  
IRM  
Body Diode Reverse Current  
Body Diode Recovery dv/dt  
Vf  
VDS  
( DUT )  
VDD  
Body Diode  
Forward Voltage Drop  
SEMIHOW REV.A0,Nov 2007  
Package Dimension  
TO-220F  
±0.20  
±0.20  
±0.20  
2.54  
±0.20  
0.70  
±0.20  
2.76  
1.47max  
±0.20  
±0.20  
0.50  
0.80  
2.54typ  
2.54typ  
SEMIHOW REV.A0,Nov 2007  

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