HS0-OP470AEH-Q [RENESAS]

QUAD OP-AMP, 2100uV OFFSET-MAX, 8MHz BAND WIDTH, UUC14;
HS0-OP470AEH-Q
型号: HS0-OP470AEH-Q
厂家: RENESAS TECHNOLOGY CORP    RENESAS TECHNOLOGY CORP
描述:

QUAD OP-AMP, 2100uV OFFSET-MAX, 8MHz BAND WIDTH, UUC14

放大器
文件: 总4页 (文件大小:165K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
Radiation Hardened, Very Low Noise Quad Operational  
Amplifiers  
HS-OP470ARH, HS-OP470AEH  
Features  
The HS-OP470ARH, HS-OP470AEH are a radiation hardened,  
monolithic quad operational amplifiers that provide highly  
reliable performance in harsh radiation environments. Excellent  
noise characteristics coupled with a unique array of dynamic  
specifications make these amplifiers well-suited for a variety of  
satellite system applications. Dielectrically isolated, bipolar  
processing makes these devices immune to Single Event  
Latch-up.  
• Electrically screened to SMD # 5962-98533  
• QML Qualified Per MIL-PRF-38535 requirements  
• Radiation environment  
- High dose rate (50-300rad(Si)/s). . . . . . . . . . . 100krad(Si)  
- Low dose rate (0.01rad(Si)/s) . . . . . . . . . . . . . . .50krad(Si)  
• Low noise  
- At 1kHz . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4.3nV/Hz (Typ)  
- At 1kHz . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0.6pA/Hz (Typ)  
The HS-OP470ARH, HS-OP470AEH shows almost no change in  
offset voltage after exposure to 100krad(Si) gamma radiation,  
with only a minor increase in current. Complementing these  
specifications is a post radiation open loop gain in excess of  
40kV/V.  
• Low offset voltage . . . . . . . . . . . . . . . . . . . . . . . . .2.1mV (Max)  
• High slew rate . . . . . . . . . . . . . . . . . . . . . . . . . . .1.7V/µs (Min)  
• Gain bandwidth product . . . . . . . . . . . . . . . . . . . .8.0MHz (Typ)  
These quad operational amplifiers are available in an industry  
standard pinout, allowing for immediate interchangeability  
with most other quad operational amplifiers.  
Applications  
• High Q, active filters  
• Voltage regulators  
• Integrators  
Pin Configuration  
HS-OP407ARH, HS-OP470AEH  
(14 LD FLATPACK)  
TOP VIEW  
• Signal generators  
• Voltage references  
• Space environments  
1
2
3
4
5
6
7
14  
13  
OUT 1  
-IN1  
OUT 4  
-IN4  
12  
11  
10  
+IN1  
V+  
+IN4  
V-  
+IN2  
-IN2  
+IN3  
-IN3  
9
8
OUT 2  
OUT 3  
August 8, 2013  
FN4471.2  
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures.  
1-888-INTERSIL or 1-888-468-3774 |Copyright Intersil Americas LLC 2002, 2013. All Rights Reserved  
Intersil (and design) is a trademark owned by Intersil Corporation or one of its subsidiaries.  
All other trademarks mentioned are the property of their respective owners.  
1
HS-OP470ARH, HS-OP470AEH  
Ordering Information  
PACKAGE  
(RoHS Compliant)  
(Note 2)  
PART NUMBER  
(Note 1)  
TEMP. RANGE  
(°C)  
PKG.  
DWG. #  
ORDERING/SMD NUMBER  
5962R9853301VXC  
5962R9853302VXC  
5962R9853301V9A  
5962R9853302V9A  
HS0-OP470ARH/SAMPLE  
5962R9853301QXC  
HS9-OP470ARH/PROTO  
HS-OP470ARHEV1Z  
PART MARKING  
Q 5962R98 53301VXC  
Q 5962R98 53302VXC  
HS9-OP470ARH-Q  
HS9-OP470AEH-Q  
-55 to +125  
-55 to +125  
14 Ld Flatpack  
14 Ld Flatpack  
Die  
K14.A  
K14.A  
HS0-OP470ARH-Q  
-55 to +125  
HS0-OP470AEH-Q  
-55 to +125  
Die  
HS0-OP470ARH/SAMPLE  
HS9-OP470ARH-8  
-55 to +125  
Die  
-55 to +125  
Q 5962R98 53301QXC  
HS9-OP470ARH/PROTO  
14 Ld Flatpack  
14 Ld Flatpack  
K14.A  
K14.A  
HS9-OP470ARH/PROTO  
HS-OP470ARHEV1Z  
-55 to +125  
Evaluation Board  
1. Specifications for Rad Hard QML devices are controlled by the Defense Logistics Agency Land and Maritime (DLA). The SMD numbers listed in  
the“Ordering Information” table must be used when ordering.  
2. These Intersil Pb-free Hermetic packaged products employ 100% Au plate - e4 termination finish, which is RoHS compliant and compatible with  
both SnPb and Pb-free soldering operations.  
FN4471.2  
August 8, 2013  
2
HS-OP470ARH, HS-OP470AEH  
PASSIVATION:  
Die Characteristics  
Type: Nitride (SI3N4) over Silox (SIO2, 5% Phos.)  
Silox Thickness: 12kÅ ±2kÅ  
Nitride Thickness: 3.5kÅ ±1.5kÅ  
DIE DIMENSIONS:  
95 mils x 99 mils x 19 mils ±1 mil  
(2420µm x 2530µm x 483µm ±25.4µm)  
WORST CASE CURRENT DENSITY:  
METALLIZATION:  
5
2
<2.0 x 10 A/cm  
Type: Al, 1% Cu  
Thickness: 16kÅ ±2kÅ  
TRANSISTOR COUNT:  
175  
SUBSTRATE POTENTIAL (Powered Up):  
PROCESS:  
Unbiased  
BACKSIDE FINISH:  
Silicon  
Bipolar Dielectric Isolation  
Metallization Mask Layout  
HS-OP470ARH, HS-OP470AEH  
+IN2  
V+  
+IN1  
-IN1  
-IN2  
OUT1  
OUT4  
OUT2  
OUT3  
-IN3  
-IN4  
+IN3  
V-  
+IN4  
For additional products, see www.intersil.com/en/products.html  
Intersil products are manufactured, assembled and tested utilizing ISO9000 quality systems as noted  
in the quality certifications found at www.intersil.com/en/support/qualandreliability.html  
Intersil products are sold by description only. Intersil Corporation reserves the right to make changes in circuit design, software and/or specifications at any time  
without notice. Accordingly, the reader is cautioned to verify that data sheets are current before placing orders. Information furnished by Intersil is believed to be  
accurate and reliable. However, no responsibility is assumed by Intersil or its subsidiaries for its use; nor for any infringements of patents or other rights of third  
parties which may result from its use. No license is granted by implication or otherwise under any patent or patent rights of Intersil or its subsidiaries.  
For information regarding Intersil Corporation and its products, see www.intersil.com  
FN4471.2  
August 8, 2013  
3
HS-OP470ARH, HS-OP470AEH  
Ceramic Metal Seal Flatpack Packages (Flatpack)  
K14.A MIL-STD-1835 CDFP3-F14 (F-2A, CONFIGURATION B)  
14 LEAD CERAMIC METAL SEAL FLATPACK PACKAGE  
A
A
e
INCHES MILLIMETERS  
MIN  
PIN NO. 1  
ID AREA  
SYMBOL  
MAX  
0.115  
0.022  
0.019  
0.009  
0.006  
0.390  
0.260  
0.290  
-
MIN  
1.14  
0.38  
0.38  
0.10  
0.10  
-
MAX  
2.92  
0.56  
0.48  
0.23  
0.15  
9.91  
6.60  
7.11  
-
NOTES  
D
A
b
0.045  
0.015  
0.015  
0.004  
0.004  
-
-
-
-A-  
-B-  
S1  
b1  
c
-
-
b
c1  
D
-
E1  
3
-
0.004  
Q
H
A - B  
D
0.036  
H
A - B  
D
S
M
S
S
M
S
C
E
0.235  
-
5.97  
-
E
E1  
E2  
E3  
e
3
-
-D-  
A
0.125  
0.030  
3.18  
0.76  
-H-  
-C-  
-
-
7
-
L
E2  
L
E3  
E3  
0.050 BSC  
1.27 BSC  
SEATING AND  
BASE PLANE  
c1  
LEAD FINISH  
k
0.008  
0.270  
0.026  
0.005  
-
0.015  
0.370  
0.045  
-
0.20  
6.86  
0.66  
0.13  
-
0.38  
9.40  
1.14  
-
2
-
L
BASE  
METAL  
Q
S1  
M
N
8
6
-
(c)  
b1  
0.0015  
0.04  
M
M
(b)  
14  
14  
-
SECTION A-A  
Rev. 0 5/18/94  
NOTES:  
1. Index area: A notch or a pin one identification mark shall be located  
adjacent to pin one and shall be located within the shaded area  
shown. The manufacturer’s identification shall not be used as a pin  
one identification mark. Alternately, a tab (dimension k) may be  
used to identify pin one.  
2. If a pin one identification mark is used in addition to a tab, the limits  
of dimension k do not apply.  
3. This dimension allows for off-center lid, meniscus, and glass over-  
run.  
4. Dimensions b1 and c1 apply to lead base metal only. Dimension M  
applies to lead plating and finish thickness. The maximum limits of  
lead dimensions b and c or M shall be measured at the centroid of  
the finished lead surfaces, when solder dip or tin plate lead finish is  
applied.  
5. N is the maximum number of terminal positions.  
6. Measure dimension S1 at all four corners.  
7. For bottom-brazed lead packages, no organic or polymeric materi-  
als shall be molded to the bottom of the package to cover the leads.  
8. Dimension Q shall be measured at the point of exit (beyond the me-  
niscus) of the lead from the body. Dimension Q minimum shall be  
reduced by 0.0015 inch (0.038mm) maximum when solder dip lead  
finish is applied.  
9. Dimensioning and tolerancing per ANSI Y14.5M - 1982.  
10. Controlling dimension: INCH.  
FN4471.2  
August 8, 2013  
4

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