HAT2197R [RENESAS]

Silicon N Channel Power MOS FET Power Switching; 硅N通道功率MOS FET电源开关
HAT2197R
型号: HAT2197R
厂家: RENESAS TECHNOLOGY CORP    RENESAS TECHNOLOGY CORP
描述:

Silicon N Channel Power MOS FET Power Switching
硅N通道功率MOS FET电源开关

开关 电源开关
文件: 总8页 (文件大小:90K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
HAT2197R  
Silicon N Channel Power MOS FET  
Power Switching  
REJ03G0061-0200Z  
Rev.2.00  
Apr.02.2004  
Features  
High speed switching  
Capable of 4.5 V gate drive  
Low drive current  
High density mounting  
Low on-resistance  
RDS(on) = 5.3 mtyp. (at VGS = 10 V)  
Outline  
SOP-8  
5
6
7
8
4
3
2
1
5 6  
7
8
D D  
D
D
4
G
1, 2, 3  
4
Source  
Gate  
5, 6, 7, 8 Drain  
S
1
S
2
S
3
Rev.2.00, Apr.02.2004, page 1 of 7  
HAT2197R  
Absolute Maximum Ratings  
(Ta = 25°C)  
Item  
Symbol  
VDSS  
VGSS  
ID  
Ratings  
30  
Unit  
V
Drain to source voltage  
Gate to source voltage  
Drain current  
±20  
V
16  
A
Note1  
Drain peak current  
ID(pulse)  
128  
A
Body-drain diode reverse drain current IDR  
16  
A
Note 2  
Note 2  
Avalanche current  
Avalanche energy  
Channel dissipation  
IAP  
16  
A
EAR  
Pch Note3  
25.6  
2.5  
mJ  
W
Channel to ambient thermal impedance θch-a Note3  
50  
°C/W  
°C  
°C  
Channel temperature  
Tch  
150  
Storage temperature  
Tstg  
–55 to +150  
Notes: 1. PW 10 µs, duty cycle 1%  
2. Value at Tch = 25°C, Rg 50 Ω  
3. When using the glass epoxy board (FR4 40 x 40 x 1.6 mm), PW 10s  
Electrical Characteristics  
(Ta = 25°C)  
Item  
Symbol Min  
Typ  
Max  
Unit  
Test Conditions  
Drain to source breakdown  
voltage  
V(BR)DSS 30  
V
ID = 10 mA, VGS = 0  
Gate to source leak current  
Zero gate voltage drain current  
Gate to source cutoff voltage  
Static drain to source on state  
resistance  
IGSS  
IDSS  
VGS(off)  
RDS(on)  
RDS(on)  
|yfs|  
1.0  
22  
± 0.1  
1
µA  
µA  
V
VGS = ±20 V, VDS = 0  
VDS = 30 V, VGS = 0  
VDS = 10 V, I D = 1 mA  
ID = 8 A, VGS = 10 V Note4  
ID = 8 A, VGS = 4.5 V Note4  
ID = 8 A, VDS = 10 V Note4  
VDS = 10 V  
2.5  
6.7  
9.9  
5.3  
6.8  
38  
mΩ  
mΩ  
S
Forward transfer admittance  
Input capacitance  
Ciss  
Coss  
Crss  
Rg  
2650  
610  
190  
1.2  
18  
pF  
pF  
pF  
Output capacitance  
Reverse transfer capacitance  
Gate Resistance  
VGS = 0  
f = 1 MHz  
Total gate charge  
Qg  
nC  
nC  
nC  
ns  
ns  
ns  
ns  
V
VDD = 10 V  
Gate to source charge  
Gate to drain charge  
Turn-on delay time  
Qgs  
Qgd  
td(on)  
tr  
7.5  
4.2  
10  
VGS = 4.5 V  
ID = 16 A  
VGS = 10 V, ID = 8 A  
VDD 10 V  
Rise time  
25  
Turn-off delay time  
td(off)  
tf  
45  
RL = 1.25 Ω  
Fall time  
4.2  
0.80  
30  
Rg = 4.7 Ω  
IF = 16 A, VGS = 0 Note4  
Body–drain diode forward voltage VDF  
1.04  
Body–drain diode reverse  
recovery time  
trr  
ns  
IF = 16 A, VGS = 0  
diF/ dt = 100 A/ µs  
Notes: 4. Pulse test  
Rev.2.00, Apr.02.2004, page 2 of 7  
HAT2197R  
Power vs. Temperature Derating  
Maximum Safe Operation Area  
500  
100  
4.0  
Test Condition :  
When using the glass epoxy board  
(FR4 40x40x1.6 mm), PW < 10 s  
10 µs  
3.0  
2.0  
1.0  
10  
1
Operation in  
this area is  
limited by R  
DS(on)  
0.1  
Ta = 25°C  
1 shot Pulse  
0.01  
0
0.1  
0.3  
1
3
10  
30  
100  
50  
100  
150  
200  
Drain to Source Voltage  
V
(V)  
DS  
Ambient Temperature Ta (°C)  
Note 4 :  
When using the glass epoxy board  
(FR4 40x40x1.6 mm)  
Typical Output Characteristics  
Typical Transfer Characteristics  
20  
16  
12  
8
20  
16  
12  
8
10 V  
Pulse Test  
V
= 10 V  
DS  
Pulse Test  
2.8 V  
2.6 V  
2.5 V  
Tc = 75°C  
V
GS  
= 2.4 V  
25°C  
4
4
–25°C  
0
0
5
1
2
3
Gate to Source Voltage  
4
(V)  
GS  
2
4
6
8
10  
V
Drain to Source Voltage  
V
(V)  
DS  
Drain to Source Saturation Voltage vs.  
Gate to Source Voltage  
Static Drain to Source on State Resistance  
vs. Drain Current  
100  
200  
160  
120  
80  
Pulse Test  
Pulse Test  
50  
20  
10  
5
V
GS  
= 4.5 V  
I
= 20 A  
10 A  
D
10 V  
40  
2
1
5 A  
16  
0
4
8
12  
Gate to Source Voltage  
20  
1
10  
Drain Current  
100  
1000  
V
(V)  
GS  
I
(A)  
D
Rev.2.00, Apr.02.2004, page 3 of 7  
HAT2197R  
Static Drain to Source on State Resistance  
vs. Temperature  
Forward Transfer Admittance vs.  
Drain Current  
1000  
100  
12  
10  
8
Pulse Test  
I
= 20 A  
D
Tc = –25°C  
5, 10 A  
V
= 4.5 V  
GS  
10  
1
25°C  
6
5 A, 10 A, 20 A  
75°C  
10 V  
4
2
V
= 10 V  
DS  
Pulse Test  
0.1 0.3  
3
30  
(A)  
-25  
0
25 50 75 100 125 150  
1
10  
100  
Case Temperature Tc (°C)  
Drain Current  
I
D
Body–Drain Diode Reverse  
Recovery Time  
Typical Capacitance vs.  
Drain to Source Voltage  
10000  
100  
50  
Ciss  
3000  
1000  
Coss  
300  
100  
Crss  
20  
10  
30  
10  
di/dt = 100 A/µs  
V
GS  
= 0  
V
GS  
= 0, Ta = 25°C  
f = 1 MHz  
0.1  
1
10  
100  
(A)  
0
5
10  
15  
20  
25 30  
Reverse Drain Current  
I
DR  
Drain to Source Voltage  
V
(V)  
DS  
Dynamic Input Characteristics  
= 16 A  
Switching Characteristics  
50  
40  
30  
20  
10  
20  
16  
12  
8
1000  
100  
I
V
= 10 V , V = 10 V  
DS  
D
GS  
Rg = 4.7 , duty < 1 %  
V
= 25 V  
10 V  
5 V  
DD  
t
r
V
GS  
t
d(off)  
V
DS  
t
d(on)  
10  
1
4
0
V
= 25 V  
10 V  
5 V  
DD  
t
f
0.1  
1
10  
100  
0
16  
32  
48  
64  
80  
Drain Current  
I
(A)  
Gate Charge Qg (nC)  
D
Rev.2.00, Apr.02.2004, page 4 of 7  
HAT2197R  
Maximum Avalanche Energy vs.  
Channel Temperature Derating  
Reverse Drain Current vs.  
Source to Drain Voltage  
20  
16  
12  
8
50  
40  
30  
20  
I
= 16 A  
= 15 V  
AP  
V
10 V  
DD  
duty < 0.1 %  
V
= 0 V  
Rg > 50  
GS  
5 V  
4
10  
0
Pulse Test  
1.6 2.0  
0
0.4  
0.8  
1.2  
25  
50  
75  
100  
125  
150  
Channel Temperature Tch (°C)  
Source to Drain Voltage  
V
(V)  
SD  
Normalized Transient Thermal Impedance vs. Pulse Width  
10  
D = 1  
0.5  
1
0.1  
0.1  
θ
θ
γ
θ
ch - f(t) = s (t) x ch - f  
ch - f = 83.3°C/W, Ta = 25°C  
0.01  
0.001  
When using the glass epoxy board  
(FR4 40 x 40 x 1.6 mm)  
PW  
T
P
DM  
D =  
PW  
T
0.0001  
100 µ  
1 m  
10 m  
100 m  
1
10  
100  
1000  
10000  
10 µ  
Pulse Width PW (s)  
Rev.2.00, Apr.02.2004, page 5 of 7  
HAT2197R  
Avalanche Test Circuit  
Avalanche Waveform  
V
DSS  
1
2
EAR  
=
L
IAP  
V
- V  
DD  
DSS  
2
L
V
DS  
Monitor  
I
AP  
Monitor  
V
(BR)DSS  
I
AP  
Rg  
V
V
DD  
D. U. T  
DS  
I
D
Vin  
15 V  
50Ω  
V
DD  
0
Switching Time Test Circuit  
Vin Monitor  
Switching Time Waveform  
Vout  
Monitor  
90%  
D.U.T.  
Rg  
10%  
10%  
Vin  
R
L
Vout  
10%  
V
DS  
= 10 V  
Vin  
10 V  
90%  
tr  
90%  
td(off)  
td(on)  
t
f
Rev.2.00, Apr.02.2004, page 6 of 7  
HAT2197R  
Package Dimensions  
As of January, 2003  
Unit: mm  
4.90  
5.3 Max  
8
5
1
4
+ 0.10  
– 0.30  
6.10  
0.75 Max  
1.27  
1.08  
0˚ – 8˚  
+ 0.67  
– 0.20  
0.60  
*0.42 0.08  
0.40 0.06  
0.15  
M
0.25  
Package Code  
JEDEC  
JEITA  
FP-8DA  
Conforms  
*Dimension including the plating thickness  
Base material dimension  
Mass (reference value)  
0.085 g  
Ordering Information  
Part Name  
Quantity  
Shipping Container  
HAT2197R-EL-E  
2500pcs  
Taping  
Note: For some grades, production may be terminated. Please contact the Renesas sales office to  
check the state of production before ordering the product.  
Rev.2.00, Apr.02.2004, page 7 of 7  
Sales Strategic Planning Div. Nippon Bldg., 2-6-2, Ohte-machi, Chiyoda-ku, Tokyo 100-0004, Japan  
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