NXH100B120H3Q0SG [ONSEMI]

Power Integrated Module, Dual Boost, 1200 V, 50 A IGBT + 1200 V, 20 A SiC Diode.;
NXH100B120H3Q0SG
型号: NXH100B120H3Q0SG
厂家: ONSEMI    ONSEMI
描述:

Power Integrated Module, Dual Boost, 1200 V, 50 A IGBT + 1200 V, 20 A SiC Diode.

双极性晶体管
文件: 总16页 (文件大小:1501K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
DATA SHEET  
www.onsemi.com  
Si/SiC Hybrid Modules –  
EliteSiC, Dual Boost,  
1200 V, 50 A IGBT + 1200 V,  
20 A SiC Diode, Q0 Package  
Q0BOOST  
CASE 180AJ  
SOLDER PINS  
Q0BOOST  
CASE 180BF  
PRESSFIT PINS  
NXH100B120H3Q0,  
NXH100B120H3Q0PG-R  
The NXH100B120H3Q0 is a power module containing a dual boost  
stage. The integrated field stop trench IGBTs and SiC Diodes provide  
lower conduction losses and switching losses, enabling designers to  
achieve high efficiency and superior reliability.  
MARKING DIAGRAM  
NXH100B120H3Q0xxG  
ATYYWW  
Features  
xx  
= P, PT, S or ST  
1200 V Ultra Field Stop IGBTs  
Low Reverse Recovery and Fast Switching SiC Diodes  
1600 V Bypass and Antiparallel Diodes  
Low Inductive Layout  
YYWW = Year and Work Week Code  
A
T
= Assembly Site Code  
= Test Site Code  
= PbFree Package  
G
Solderable Pins or PressFit Pins  
Thermistor  
PIN CONNECTIONS  
Options with PreApplied Thermal Interface Material (TIM) and  
Without PreApplied TIM  
Typical Applications  
Solar Inverter  
Uninterruptible Power Supplies  
Energy Storage Systems  
ORDERING INFORMATION  
See detailed ordering and shipping information on page 4 of  
this data sheet.  
Figure 1. NXH100B120H3Q0xG/PGR Schematic  
Diagram  
© Semiconductor Components Industries, LLC, 2016  
1
Publication Order Number:  
March, 2023 Rev. 8  
NXH100B120H3Q0/D  
NXH100B120H3Q0, NXH100B120H3Q0PGR  
ABSOLUTE MAXIMUM RATINGS (Note 1) T = 25°C Unless Otherwise Noted  
J
Rating  
Symbol  
Value  
Unit  
BOOST IGBT  
CollectorEmitter Voltage  
GateEmitter Voltage  
V
1200  
20  
V
V
CES  
V
GE  
C1  
C2  
Continuous Collector Current @ T  
Continuous Collector Current @ T  
80°C (T = 175°C)  
I
61  
A
C <  
C <  
J
102°C (T = 175°C)  
I
50  
A
J
Pulsed Collector Current (T = 175°C)  
I
150  
186  
40  
150  
A
J
Cpulse  
Maximum Power Dissipation @ T = 80°C (T = 175°C)  
P
tot  
W
°C  
°C  
C
J
Minimum Operating Junction Temperature  
T
JMIN  
Maximum Operating Junction Temperature  
BOOST DIODE  
T
JMAX  
Peak Repetitive Reverse Voltage  
V
1200  
34  
V
A
RRM  
Continuous Forward Current @ T  
80°C (T = 175°C)  
I
C <  
C <  
J
F1  
Continuous Forward Current @ T  
132°C (T = 175°C)  
I
20  
A
J
F2  
Maximum Power Dissipation @ T = 80°C (T = 175°C)  
P
tot  
114  
185  
142  
40  
150  
W
A
C
J
Surge Forward Current (60 Hz single halfsine wave)  
I
FSM  
2
2
2
I t value (60 Hz single halfsine wave)  
I t  
A s  
Minimum Operating Junction Temperature  
Maximum Operating Junction Temperature  
BYPASS DIODE / IGBT PROTECTION DIODE  
Peak Repetitive Reverse Voltage  
T
JMIN  
°C  
°C  
T
JMAX  
V
RRM  
1600  
58  
V
A
Continuous Forward Current @ T  
Continuous Forward Current @ T  
80°C (T = 175°C)  
I
F1  
C <  
C <  
J
141°C (T = 175°C)  
I
F2  
25  
A
J
Repetitive Peak Forward Current (T = 175°C, t limited by T  
)
I
FRM  
75  
A
J
p
Jmax  
Maximum Power Dissipation @ T = 80°C (T = 175°C)  
P
tot  
91  
W
°C  
°C  
C
J
Minimum Operating Junction Temperature  
T
JMIN  
40  
150  
Maximum Operating Junction Temperature  
THERMAL PROPERTIES  
T
JMAX  
Storage Temperature range  
T
stg  
40 to 125  
°C  
INSULATION PROPERTIES  
Isolation test voltage, t = 1 sec, 60 Hz  
Creepage distance  
V
is  
3000  
12.7  
VRMS  
mm  
Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality  
should not be assumed, damage may occur and reliability may be affected.  
1. Refer to ELECTRICAL CHARACTERISTICS, RECOMMENDED OPERATING RANGES and/or APPLICATION INFORMATION for Safe  
Operating parameters.  
RECOMMENDED OPERATING RANGES  
Rating  
Symbol  
Min  
Max  
Unit  
Module Operating Junction Temperature  
TJ  
40  
150  
°C  
Functional operation above the stresses listed in the Recommended Operating Ranges is not implied. Extended exposure to stresses beyond  
the Recommended Operating Ranges limits may affect device reliability.  
www.onsemi.com  
2
NXH100B120H3Q0, NXH100B120H3Q0PGR  
ELECTRICAL CHARACTERISTICS T = 25°C Unless Otherwise Noted  
J
Parameter  
Test Conditions  
Symbol  
Min  
Typ  
Max  
Unit  
BOOST IGBT CHARACTERISTICS  
CollectorEmitter Cutoff Current  
CollectorEmitter Saturation Voltage  
V
V
V
V
V
= 0 V, V = 1200 V  
I
CES  
4.6  
200  
2.3  
mA  
GE  
GE  
GE  
GE  
GE  
CE  
V
V
1.77  
1.93  
5.27  
V
= 15 V, I = 50 A, T = 25°C  
CE(sat)  
C
J
= 15 V, I = 50 A, T = 150°C  
C
J
GateEmitter Threshold Voltage  
Gate Leakage Current  
Turnon Delay Time  
= V , I = 1 mA  
6.5  
800  
V
CE  
C
GE(TH)  
= 20 V, V = 0 V  
I
nA  
ns  
CE  
GES  
T = 25°C  
t
44  
J
d(on)  
V
R
= 700 V, I = 50 A V =  
15 V,  
CE  
G
C
GE  
Rise Time  
t
r
16  
= 4 W  
Turnoff Delay Time  
t
203  
23  
d(off)  
Fall Time  
t
f
Turnon Switching Loss per Pulse  
Turnoff Switching Loss per Pulse  
Turnon Delay Time  
E
on  
E
off  
700  
1500  
43  
T = 125°C  
t
ns  
J
d(on)  
V
R
= 700 V, I = 50 A V =  
15 V,  
CE  
G
C
GE  
Rise Time  
t
r
18  
= 4 W  
Turnoff Delay Time  
t
233  
58  
d(off)  
Fall Time  
t
f
Turnon Switching Loss per Pulse  
Turnoff Switching Loss per Pulse  
Input Capacitance  
E
on  
E
off  
800  
2600  
9075  
173  
147  
409  
0.51  
0.82  
V
V
= 20 V, V = 0 V, f = 10 kHz  
C
pF  
CE  
CE  
GE  
ies  
oes  
Output Capacitance  
C
Reverse Transfer Capacitance  
Total Gate Charge  
C
res  
= 600 V, I = 40 A, V = 15 V  
Q
g
nC  
C
GE  
Thermal Resistance chiptocase  
R
R
°C/W  
°C/W  
thJC  
thJH  
Thermal Resistance −  
chiptoheatsink  
Thermal grease, Thickness 100 mm,  
λ = 2.87 W/mK  
BOOST DIODE CHARACTERISTICS  
Diode Reverse Leakage Current  
Diode Forward Voltage  
V
= 1200 V  
I
1.44  
1.93  
15  
300  
1.8  
mA  
R
R
V
V
I = 20 A, T = 25°C  
F
F
J
I = 20 A, T = 150°C  
F
J
Reverse Recovery Time  
T = 25°C  
t
ns  
nC  
J
rr  
V
R
= 700 V, I = 50 A V  
=
=
15 V,  
15 V,  
CE  
C
GE  
Reverse Recovery Charge  
Q
rr  
RRM  
108  
11  
= 4 W  
G
Peak Reverse Recovery Current  
Peak Rate of Fall of Recovery Current  
Reverse Recovery Energy  
I
A
di/dt  
1500  
20  
A/ms  
mJ  
E
rr  
Reverse Recovery Time  
T = 125°C  
t
16  
ns  
J
rr  
V
R
= 700 V, I = 50 A V  
CE  
C GE  
Reverse Recovery Charge  
Q
rr  
RRM  
115  
12  
nC  
= 4 W  
G
Peak Reverse Recovery Current  
Peak Rate of Fall of Recovery Current  
Reverse Recovery Energy  
I
A
di/dt  
1400  
22  
A/ms  
mJ  
E
rr  
Thermal Resistance chiptocase  
R
0.83  
1.15  
°C/W  
°C/W  
thJC  
thJH  
Thermal Resistance chipto−  
heatsink  
Thermal grease, Thickness 100 mm,  
λ = 2.87 W/mK  
R
www.onsemi.com  
3
NXH100B120H3Q0, NXH100B120H3Q0PGR  
ELECTRICAL CHARACTERISTICS T = 25°C Unless Otherwise Noted  
J
Parameter  
BYPASS DIODE/IGBT PROTECTION DIODE CHARACTERISTICS  
Test Conditions  
Symbol  
Min  
Typ  
Max  
Unit  
Diode Reverse Leakage Current  
Diode Forward Voltage  
V
= 1600 V, T = 25°C  
I
R
100  
1.4  
mA  
R
J
V
F
1.0  
V
I = 25 A, T = 25°C  
F
J
I = 25 A, T = 150°C  
F
0.90  
1.04  
1.41  
J
Thermal Resistance chiptocase  
R
°C/W  
°C/W  
thJC  
thJH  
Thermal Resistance chipto−  
heatsink  
Thermal grease, Thickness 100 mm,  
λ = 2.87 W/mK  
R
THERMISTOR CHARACTERISTICS  
Nominal resistance  
Nominal resistance  
Deviation of R25  
R
22  
1486  
5
kW  
W
25  
T = 100°C  
R
100  
DR/R  
5  
%
Power dissipation  
Power dissipation constant  
Bvalue  
P
200  
2
mW  
mW/K  
K
D
B(25/50), tolerance 3%  
B(25/100), tolerance 3%  
3950  
3998  
Bvalue  
K
Product parametric performance is indicated in the Electrical Characteristics for the listed test conditions, unless otherwise noted. Product  
performance may not be indicated by the Electrical Characteristics if operated under different conditions.  
ORDERING INFORMATION  
Orderable Part Number  
Marking  
Package  
Shipping  
NXH100B120H3Q0PG,  
NXH100B120H3Q0PGR  
24 Units / Blister Tray  
NXH100B120H3Q0PG,  
NXH100B120H3Q0PGR  
Q0BOOST Case 180BF  
(PbFree and HalideFree)  
PressFit Pins  
NXH100B120H3Q0SG  
NXH100B120H3Q0PTG  
24 Units / Blister Tray  
24 Units / Blister Tray  
NXH100B120H3Q0SG  
NXH100B120H3Q0PTG  
Q0BOOST Case 180AJ  
(PbFree and HalideFree)  
Solder Pins  
Q0BOOST Case 180BF  
(PbFree and HalideFree)  
PressFit Pins, Thermal Interface Material (TIM)  
NXH100B120H3Q0STG  
24 Units / Blister Tray  
NXH100B120H3Q0STG  
Q0BOOST Case 180AJ  
(PbFree and HalideFree)  
Solder Pins, Thermal Interface Material (TIM)  
www.onsemi.com  
4
NXH100B120H3Q0, NXH100B120H3Q0PGR  
TYPICAL CHARACTERISTICS  
Boost IGBT & IGBT Protection Diode / Bypass Diode  
150  
150  
120  
T = 25°C  
J
T = 150°C  
J
V = 20 V  
GE  
V = 20 V  
GE  
120  
90  
V = 11 V  
GE  
V = 11 V  
GE  
90  
60  
60  
30  
0
30  
0
0
1
2
3
4
5
0
1
2
3
4
5
V , COLLECTOREMITTER VOLTAGE (V)  
CE  
V , COLLECTOREMITTER VOLTAGE (V)  
CE  
Figure 2. IGBT Typical Output Characteristics  
Figure 3. IGBT Typical Output Characteristics  
80  
70  
60  
50  
40  
30  
20  
150  
120  
90  
60  
150°C  
150°C  
25°C  
30  
0
10  
0
25°C  
0
2
4
6
8
10  
12  
0,0  
0,5  
1,0  
1,5  
V , GATEEMITTER VOLTAGE (V)  
GE  
V , FORWARD VOLTAGE (V)  
F
Figure 4. IGBT Typical Transfer Characteristics  
Figure 5. Diode Forward Characteristics  
Figure 7. RBSOA  
Figure 6. FBSOA  
www.onsemi.com  
5
NXH100B120H3Q0, NXH100B120H3Q0PGR  
TYPICAL CHARACTERISTICS  
Boost IGBT & IGBT Protection Diode / Bypass Diode  
Figure 8. Typical Switching Loss Eon vs. IC  
Figure 9. Typical Switching Loss Eon vs. RG  
Figure 11. Typical Switching Loss Eoff vs. RG  
Figure 10. Typical Switching Loss Eoff vs. IC  
Figure 13. Typical Switching Time Tdon vs. RG  
Figure 12. Typical Switching Time Tdon vs. IC  
www.onsemi.com  
6
NXH100B120H3Q0, NXH100B120H3Q0PGR  
TYPICAL PERFORMANCE CHARACTERISTICS  
Figure 14. Typical Switching Time Tdoff vs. IC  
Figure 15. Typical Switching Time Tdoff vs. RG  
Figure 16. Typical Switching Time Tron vs. IC  
Figure 17. Typical Switching Time Tron vs. RG  
Figure 18. Typical Switching Time Tf vs. IC  
Figure 19. Typical Switching Time Tf vs RG  
www.onsemi.com  
7
NXH100B120H3Q0, NXH100B120H3Q0PGR  
TYPICAL PERFORMANCE CHARACTERISTICS  
Figure 20. Typical Reverse Recovery Energy vs. IC  
Figure 21. Typical Reverse Recovery Energy vs. RG  
Figure 22. Typical Reverse Recovery Time vs. IC  
Figure 23. Typical Reverse Recovery Time vs. RG  
Figure 24. Typical Reverse Recovery Charge vs. IC  
Figure 25. Typical Reverse Recovery Charge vs. RG  
www.onsemi.com  
8
NXH100B120H3Q0, NXH100B120H3Q0PGR  
TYPICAL PERFORMANCE CHARACTERISTICS  
Figure 26. Typical Reverse Recovery Current  
Figure 27. Typical Reverse Recovery Current  
vs. IC  
vs. RG  
Figure 28. Typical di/dt vs. IC  
Figure 29. Typical di/dt vs.RG  
16  
V
CE  
= 600 V  
14  
12  
10  
I
V
= 40 A  
C
= 15 V  
GE  
8
6
4
2
0
0
100  
200  
300  
400  
500  
Qg, Gate Charge (nC)  
Figure 30. Gate Voltage vs. Gate Charge  
www.onsemi.com  
9
NXH100B120H3Q0, NXH100B120H3Q0PGR  
TYPICAL PERFORMANCE CHARACTERISTICS  
Figure 31. IGBT JunctiontoCase Transient Thermal Impedance  
www.onsemi.com  
10  
NXH100B120H3Q0, NXH100B120H3Q0PGR  
TYPICAL PERFORMANCE CHARACTERISTICS Boost Diode  
Figure 32. Diode JunctiontoCase Transient Thermal Impedance  
60  
150°C  
50  
25°C  
40  
30  
20  
10  
0
0
1
2
3
4
5
V , FORWARD VOLTAGE (V)  
F
Figure 33. Diode Forward Characteristic  
Figure 34. Diode JunctiontoCase Transient Thermal Impedance  
www.onsemi.com  
11  
MECHANICAL CASE OUTLINE  
PACKAGE DIMENSIONS  
PIM22, 55x32.5 / Q0BOOST  
CASE 180AJ  
ISSUE B  
DATE 08 NOV 2017  
GENERIC  
MARKING DIAGRAM*  
XXXXXXXXXXXXXXXXG  
ATYYWW  
XXXXX = Specific Device Code  
G
= PbFree Package  
AT  
= Assembly & Test Site Code  
YYWW = Year and Work Week Code  
*This information is generic. Please refer to device data  
sheet for actual part marking. PbFree indicator, “G” or  
microdot G”, may or may not be present. Some products  
may not follow the Generic Marking.  
Electronic versions are uncontrolled except when accessed directly from the Document Repository.  
Printed versions are uncontrolled except when stamped “CONTROLLED COPY” in red.  
DOCUMENT NUMBER:  
DESCRIPTION:  
98AON63481G  
PIM22 55X32.5 / Q0BOOST (SOLDER PIN)  
PAGE 1 OF 2  
ON Semiconductor and  
are trademarks of Semiconductor Components Industries, LLC dba ON Semiconductor or its subsidiaries in the United States and/or other countries.  
ON Semiconductor reserves the right to make changes without further notice to any products herein. ON Semiconductor makes no warranty, representation or guarantee regarding  
the suitability of its products for any particular purpose, nor does ON Semiconductor assume any liability arising out of the application or use of any product or circuit, and specifically  
disclaims any and all liability, including without limitation special, consequential or incidental damages. ON Semiconductor does not convey any license under its patent rights nor the  
rights of others.  
© Semiconductor Components Industries, LLC, 2019  
www.onsemi.com  
PIM22, 55x32.5 / Q0BOOST  
CASE 180AJ  
ISSUE B  
DATE 08 NOV 2017  
Electronic versions are uncontrolled except when accessed directly from the Document Repository.  
Printed versions are uncontrolled except when stamped “CONTROLLED COPY” in red.  
DOCUMENT NUMBER:  
DESCRIPTION:  
98AON63481G  
PIM22 55X32.5 / Q0BOOST (SOLDER PIN)  
PAGE 2 OF 2  
ON Semiconductor and  
are trademarks of Semiconductor Components Industries, LLC dba ON Semiconductor or its subsidiaries in the United States and/or other countries.  
ON Semiconductor reserves the right to make changes without further notice to any products herein. ON Semiconductor makes no warranty, representation or guarantee regarding  
the suitability of its products for any particular purpose, nor does ON Semiconductor assume any liability arising out of the application or use of any product or circuit, and specifically  
disclaims any and all liability, including without limitation special, consequential or incidental damages. ON Semiconductor does not convey any license under its patent rights nor the  
rights of others.  
© Semiconductor Components Industries, LLC, 2019  
www.onsemi.com  
MECHANICAL CASE OUTLINE  
PACKAGE DIMENSIONS  
PIM22 55x32.5 (PRESSFIT PIN)  
CASE 180BF  
ISSUE O  
DATE 21 MAY 2019  
Electronic versions are uncontrolled except when accessed directly from the Document Repository.  
Printed versions are uncontrolled except when stamped “CONTROLLED COPY” in red.  
DOCUMENT NUMBER:  
DESCRIPTION:  
98AON07824H  
PIM22 55x32.5 (PRESSFIT PIN)  
PAGE 1 OF 2  
ON Semiconductor and  
are trademarks of Semiconductor Components Industries, LLC dba ON Semiconductor or its subsidiaries in the United States and/or other countries.  
ON Semiconductor reserves the right to make changes without further notice to any products herein. ON Semiconductor makes no warranty, representation or guarantee regarding  
the suitability of its products for any particular purpose, nor does ON Semiconductor assume any liability arising out of the application or use of any product or circuit, and specifically  
disclaims any and all liability, including without limitation special, consequential or incidental damages. ON Semiconductor does not convey any license under its patent rights nor the  
rights of others.  
© Semiconductor Components Industries, LLC, 2018  
www.onsemi.com  
PIM22 55x32.5 (PRESSFIT PIN)  
CASE 180BF  
ISSUE O  
DATE 17 MAY 2019  
GENERIC  
MARKING DIAGRAM*  
XXXXXXXXXXXXXXXXXG  
ATYYWW  
XXXXX = Specific Device Code  
*This information is generic. Please refer to device data  
G
= PbFree Package  
sheet for actual part marking. PbFree indicator, “G” or  
microdot G”, may or may not be present. Some products  
may not follow the Generic Marking.  
AT  
= Assembly & Test Site Code  
YYWW = Year and Work Week Code  
Electronic versions are uncontrolled except when accessed directly from the Document Repository.  
Printed versions are uncontrolled except when stamped “CONTROLLED COPY” in red.  
DOCUMENT NUMBER:  
DESCRIPTION:  
98AON07824H  
PIM22 55x32.5 (PRESSFIT PIN)  
PAGE 2 OF 2  
ON Semiconductor and  
are trademarks of Semiconductor Components Industries, LLC dba ON Semiconductor or its subsidiaries in the United States and/or other countries.  
ON Semiconductor reserves the right to make changes without further notice to any products herein. ON Semiconductor makes no warranty, representation or guarantee regarding  
the suitability of its products for any particular purpose, nor does ON Semiconductor assume any liability arising out of the application or use of any product or circuit, and specifically  
disclaims any and all liability, including without limitation special, consequential or incidental damages. ON Semiconductor does not convey any license under its patent rights nor the  
rights of others.  
© Semiconductor Components Industries, LLC, 2018  
www.onsemi.com  
onsemi,  
, and other names, marks, and brands are registered and/or common law trademarks of Semiconductor Components Industries, LLC dba “onsemi” or its affiliates  
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NXH200T120H3Q2F2SG

Si/SiC Hybrid Module, Split T-Type NPC inverter 
ONSEMI

NXH200T120H3Q2F2STG

Si/SiC Hybrid Module, Split T-Type NPC inverter 
ONSEMI

NXH200T120H3Q2F2STNG

Si/SiC Hybrid Module, Split T-Type NPC inverter 
ONSEMI

NXH240B120H3Q1P1G

Si/SiC Hybrid Power Integrated Module (PIM), 3-channel Boost 
ONSEMI

NXH240B120H3Q1PG

电源集成模块 (PIM) 3 沟道,1200 V IGBT + SiC 升压,80 A IGBT 和 20 A SiC 二极管
ONSEMI

NXH240B120H3Q1S1G

Si/SiC Hybrid Power Integrated Module (PIM), 3-channel Boost 
ONSEMI

NXH240B120H3Q1SG

电源集成模块 (PIM) 3 沟道,1200 V IGBT + SiC 升压,80 A IGBT 和 20 A SiC 二极管
ONSEMI