CM1236-08DE [ONSEMI]

PicoGuard XS® ESD Clamp Array For High Speed Data Line Protection; 的PicoGuard XS® ESD钳位阵列高速数据线路保护
CM1236-08DE
型号: CM1236-08DE
厂家: ONSEMI    ONSEMI
描述:

PicoGuard XS® ESD Clamp Array For High Speed Data Line Protection
的PicoGuard XS® ESD钳位阵列高速数据线路保护

数据线路滤波器 过滤器 二极管
文件: 总14页 (文件大小:266K)
中文:  中文翻译
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PicoGuard XS® ESD Clamp Array For High  
Speed Data Line Protection  
CM1236  
Features  
Product Description  
ESD protection for 4 pairs of differential  
channels  
The PicoGuard XS protection family is specifically  
designed for next generation deep sub-micron high  
speed data line protection.  
ESD protection to:  
IEC61000-4-2 Level 4 (ESD) at 8kV con-  
tact discharge  
The CM1236 is ideal for protecting systems with  
high data and clock rates or for circuits requiring low  
capacitive loading and tightly controlled signal  
skews (with channel-to-channel matching at 2% max  
deviation).  
IEC61000-4-4 (EFT) 40A (5/50ns)  
IEC61000-4-5 (Lighting) 3.5A (8/20µs)  
Pass-through impedance matched clamp  
architecture  
Flow-through routing for high-speed signal integ-  
rity  
Minimal line capacitance change with  
temperature and voltage  
The device is particularly well-suited for protecting  
systems using high-speed ports such as DisplayPort  
or HDMI, along with corresponding ports in  
removable storage, digital camcorders, DVD-RW  
drives and other applications where extremely low  
loading capacitance with ESD protection are  
required.  
100matched impedance for each paired  
differential channel  
Each I/O pin can withstand over 1000 ESD  
strikes*  
RoHS compliant (lead-free) TDFN-16 package  
The CM1236 also features easily routed "pass-  
through" pinouts in a RoHS compliant (lead-free),16-  
lead TDFN, small footprint package.  
Applications  
DVI, DisplayPort, and HDMI ports in notebooks,  
set top boxes, digital TVs, and LCD displays  
General purpose high-speed data line ESD  
protection  
©2010 SCILLC. All rights reserved.  
April 2010 – Rev. 3  
Publication Order Number:  
CM1236/D  
CM1236  
Block Diagram  
*Standard test condition is IEC61000-4-2 level 4 test circuit with each pin subjected to 8kV contact discharge for 1000 pulses. Discharges are timed at 1 second intervals and all 1000 strikes are completed in one continuous  
test run. The part is then subjected to standard production test to verify that all of the tested parameters are within spec after the 1000 strikes.  
PicoGuard XS ESD Protection Architecture  
Conceptually, an ESD protection device performs the following actions upon an ESD strike discharge into a  
protected ASIC (see Figure 1):  
1. When an ESD potential is applied to the system under test (contact or air-discharge), Kirchoff’s Current Law  
(KCL) dictates that the Electrical Overstress (EOS) currents will immediately divide throughout the circuit,  
based on the dynamic impedance of each path.  
2. Ideally, the classic shunt ESD clamp will switch within 1ns to a low-impedance path and return the majority of  
the EOS current to the chassis shield/reference ground. In actuality, if the ESD component's response time  
(tCLAMP) is slower than the ASIC it is protecting, or if the Dynamic Clamping Resistance (RDYN) is not signifi-  
cantly lower than the ASIC's I/O cell circuitry, then the ASIC will have to absorb a large amount of the EOS  
energy, and be more likely to fail.  
3. Subsequent to the ESD/EOS event, both devices must immediately return to their original specifications, and  
be ready for an additional strike. Any deterioration in parasitics or clamping capability should be considered a  
failure, since it can then affect signal integrity or subsequent protection capability. (This is known as "multi-  
strike" capability.)  
Rev. 3 | Page 2 of 14 | www.onsemi.com  
CM1236  
In the CM1236 PicoGuard XS architecture, the signal line leading the connector to the ASIC routes through the  
CM1236 chip which provides 100matched differential channel characteristic impedance that helps optimize  
100load impedance applications such as the HDMI high speed data lines.  
Note:When each of the channels are used individually for single-ended signal lines protection, the individual  
channel provides 50characteristic impedance matching.  
The load impedance matching feature of the CM1236 helps to simplify system designer’s PCB layout  
considerations in impedance matching and also eliminates associated passive components.  
The route through the PicoGuard XS architecture enables the CM1236 to provide matched impedance for the  
signal path between the connector and the ASIC. Besides this function, this circuit arrangement also changes the  
way the parasitic inductance interacts with the ESD protection circuit and helps reduce the IRESIDUAL current to the  
ASIC.  
Figure 1. Standard ESD Protection Device Block Diagram  
Rev. 3 | Page 3 of 14 | www.onsemi.com  
CM1236  
The PicoGuard XS Architecture Advantages  
Figure 2 illustrates a standard ESD protection device. The inductor element represents the parasitic inductance  
arising from the bond wire and the PCB trace leading to the ESD protection diodes.  
Figure 2. Standard ESD Protection Model  
Figure 3 illustrates a standard ESD protection device. The inductor element represents the parasitic inductance  
arising from the bond wire and the PCB trace leading to the ESD protection diodes.  
Figure 3. CM1234 PicoGuard XS ESD Protection Model  
Rev. 3 | Page 4 of 14 | www.onsemi.com  
CM1236  
CM1236 Inductor Elements  
In the CM1236 PicoGuard XS architecture, the inductor elements and ESD protection diodes interact differently  
compared to the standard ESD model.  
In the standard ESD protection device model, the inductive element presents high impedance against high slew  
rate strike voltage, i.e. during an ESD strike. The impedance increases the resistance of the conduction path  
leading to the ESD protection element. This limits the speed that the ESD pulse can discharge through the ESD  
protection element.  
In the PicoGuard XS architecture, the inductive elements are in series to the conduction path leading to the  
protected device. The elements actually help to limit the current and voltage striking the protected device.  
First the reactance of the inductive element, L1, on the connector side when an ESD strike occurs, acts in the  
opposite direction of the ESD striking current. This helps limit the peak striking voltage. Then the reactance of the  
inductive element, L2, on the ASIC side forces this limited ESD strike current to be shunted through the ESD  
protection diodes. At the same time, the voltage drop across both series element acts to lower the clamping  
voltage at the protected device terminal.  
Through this arrangement, the inductive elements also tune the impedance of the ESD protection element by  
cancelling the capacitive load presented by the ESD diodes to the signal line. This improves the signal integrity  
and makes the overall ESD protection device more transparent to the high bandwidth data signals passing  
through the channel.  
The innovative PicoGuard XS architecture turns the disadvantages of the parasitic inductive elements into useful  
components that help to limit the ESD current strike to the protected device and also improves the signal integrity  
of the system by balancing the capacitive loading effects of the ESD diodes. At the same time, this architecture  
provides an impedance matched signal path for 50loading applications.  
Board designs can take advantage of precision internal component matching for improved signal integrity, which  
is not otherwise possible with discrete components at the system level. This helps to simplify the PCB layout  
considerations by the system designer and eliminates the associated passive components for load matching that  
is normally required with standard ESD protection circuits.  
Each ESD channel consists of a pair of diodes in series which steer the positive or negative ESD current pulse to  
either the Zener diode or to ground. This embedded Zener diode also serves to eliminate the need for a separate  
bypass capacitor to absorb positive ESD strikes to ground. The CM1236 protects against ESD pulses up to 8kv  
contact per the IEC 61000-4-2 standard.  
Rev. 3 | Page 5 of 14 | www.onsemi.com  
CM1236  
PIN DESCRIPTIONS  
Pin  
1
Name  
In_1+  
In_1-  
Description  
Bidrectional Clamp to ASIC (inside system)  
Bidrectional Clamp to ASIC (inside system)  
Bidrectional Clamp to ASIC (inside system)  
Bidrectional Clamp to ASIC (inside system)  
Bidrectional Clamp to ASIC (inside system)  
Bidrectional Clamp to ASIC (inside system)  
Bidrectional Clamp to ASIC (inside system)  
Bidrectional Clamp to ASIC (inside system)  
Bidrectional Clamp to Connector (outside system)  
Bidrectional Clamp to Connector (outside system)  
Bidrectional Clamp to Connector (outside system)  
Bidrectional Clamp to Connector (outside system)  
Bidrectional Clamp to Connector (outside system)  
Bidrectional Clamp to Connector (outside system)  
Bidrectional Clamp to Connector (outside system)  
Bidrectional Clamp to Connector (outside system)  
Ground return to shield  
2
3
In_2+  
In_2-  
4
5
In_3+  
In_3-  
6
7
In_4+  
In_4-  
8
9
Out_4-  
Out_4+  
Out_3-  
Out_3+  
Out_2-  
Out_2+  
Out_1-  
Out_1+  
GND  
10  
11  
12  
13  
14  
15  
16  
PAD  
Rev. 3 | Page 6 of 14 | www.onsemi.com  
CM1236  
Ordering Information  
PART NUMBERING INFORMATION  
ORDERING PART NUMBER  
(LEAD-FREE FINISH)  
PIN  
PACKAGE  
TDFN-16  
PART MARKING  
16  
CM1236-08  
CM1236-08DE  
Note 1: Parts are shipped in Tape & Reel form unless otherwise specified.  
Specifications  
ABSOLUTE MAXIMUM RATINGS*  
PARAMETER  
RATING  
-40 to +85  
-65 to +150  
6
UNITS  
Operating Temperature Range  
Storage Temperature Range  
°C  
°C  
V
Breakdown Voltage  
(Positive)  
*Exposure to absolute maximum rating conditions for extended periods may affect device reliability.  
Rev. 3 | Page 7 of 14 | www.onsemi.com  
CM1236  
ELECTRICAL OPERATING CHARACTERISTICS (SEE NOTE 1)  
SYMBOL PARAMETER  
CONDITIONS  
MIN  
TYP  
MAX UNITS  
VIN  
IIN  
I/O Voltage Relative to GND  
-0.5  
5.5  
V
Continuous Current through signal pins  
(IN to OUT) 1000 Hr  
100  
0.1  
mA  
IF  
Channel Leakage Current  
TA = 25°C; VN = 0V, VTEST = 5V  
1.0  
µA  
VESD  
ESD Protection - Peak Discharge Voltage  
at any channel input, in system:  
Contact discharge per IEC 61000-4-2  
Standard  
TA = 25°C  
8
kV  
A
IRES  
Residual ESD Peak Current on RDUP  
(Resistance of Device Under Protection)  
IEC 61000-4-2 8kV;  
RDUP = 5TA = 25°C  
3.0  
VCL  
Channel Clamp Voltage  
(Channel clamp voltage per  
IEC 61000-4-5 Standard)  
Positive Transients  
IPP = 1A, TA = 25°C,  
tP = 8/20µS;  
+9.2  
-1.6  
V
V
Negative Transients  
RDYN  
Dynamic Resistance  
Positive Transients  
Negative Transients  
IPP = 1A, TA = 25ºC;  
tP = 8/20  
0.6  
0.5  
µ
S
Differential Impedance  
97  
107  
TDR excursion from 100Ω  
characteristic impedance trans-  
mission line;  
ZTDR  
TR = 200ps; Note 2 and Note 3  
Zo  
Differential Channels pair characteristic  
impedance  
TR = 200ps;  
Note 2 and Note 3  
100  
2
Channel-to-Channel Impedance Match (Dif- TR = 200ps; TA = 25ºC  
ferential)  
%
Zo  
;
Note 2 and Note 3  
Note 1: All parameters specified at TA = –40°C to +85°C unless otherwise noted.  
Note 2: Impedance values for deviation from continuous 100uncompensated differential microstrip, with typical layout as  
measured via TDR with 200ps effective incident risetime. See Figure 7.  
Rev. 3 | Page 8 of 14 | www.onsemi.com  
CM1236  
Performance Information  
Graphical Comparison and Test Setup  
Figure 4 shows that the CM1236 (PicoGuard XS ESD protector) lowers the peak voltage and clamping voltage by  
45% across a wide range of loading conditions in comparison to a standard ESD protection device. Figure 5 also  
indicates that the DUP/ASIC protected by the CM1236 dissipates less energy than a standard ESD protection  
device. This data was derived using the test setups shown in Figure 6.  
Figure 4. VCLAMP vs. RDUP* (ASIC) – 8kV Contract Strike  
Figure 5. IRESIDUAL vs RDUP* (ASIC) – 8kV Contract Strike  
* RDUP is the emulated Dynamic Resistance (load) of the Device Under Protection (DUP). See Figure 6.  
Rev. 3 | Page 9 of 14 | www.onsemi.com  
CM1236  
Figure 6. Test Setups: Standard Device (Left) and CM1235 (Right)  
Figure 7. Typical Channel TDR Measured Across Out_x and In_x Per Each Differential Channels Pair  
(Typical 200ps Incident Rise Time)  
Rev. 3 | Page 10 of 14 | www.onsemi.com  
CM1236  
CM1236 Application and Guidelines  
As a general rule, the CM1236 ESD protection array should be located as close as possible to the point of entry  
of expected electrostatic discharges with minimum PCB trace lengths to the ground planes and between the sig-  
nal input and the ESD device to minimize stray series inductance.  
Figure 8. Application of Positive ESD Pulse Between Input Channel and Ground  
Figure 9. Typical PCB Layout  
Additional Information  
See also California Micro Devices Application Note AP209, “Design Considerations for ESD Protection,” in the  
Applications section at www.calmicro.com.  
Rev. 3 | Page 11 of 14 | www.onsemi.com  
CM1236  
Mechanical Details  
TDFN-16 Mechanical Specifications, 0.75mm  
The 16-lead, 6.0x4.0mm, 0.75mm pitch TDFN package dimensions are presented below.  
PACKAGE DIMENSIONS  
TDFN  
Package  
MO-229C*  
JEDEC  
No.  
16  
Leads  
Dim.  
Millimeters  
Inches  
Min  
Nom Max  
Min  
Nom Max  
0.70  
0.75  
0.02  
0.80 0.028 0.030 0.031  
0.05 0.000 0.001 0.002  
A
A1  
A3  
b
0.00  
0.175 0.200 0.225 0.007 0.008 0.009  
0.20  
5.90  
5.05  
3.90  
1.75  
0.25  
6.00  
0.30 0.008 0.010 0.012  
6.10 0.232 0.236 0.240  
5.15 0.199 0.201 0.203  
4.10 0.153 0.157 0.161  
1.85 0.012 0.016 0.020  
0.029 BSC  
D
5.10  
D2  
E
4.00  
1.80  
E2  
e
0.75 BSC  
0.70 REF  
0.40  
0.028 REF  
K
0.35  
0.45 0.014 0.016 0.018  
3000 pieces  
L
# per  
tape and  
reel  
Controlling dimension: millimeters  
This package is compliant with JEDEC standard MO-229C with  
*
the exception of the D, D2, E, E2, K and L dimensions as called  
out in the table above.  
Dimensions for 16-Lead, 0.75mm pitch  
TDFN package  
Rev. 3 | Page 12 of 14 | www.onsemi.com  
CM1236  
Tape and Reel Specifications  
PACKAGE SIZE  
(mm)  
POCKET SIZE (mm) TAPE WIDTH  
W
REEL  
DIAMETER  
QTY PER  
REEL  
PART NUMBER  
B0 X A0 X K0  
P0  
P1  
CM1236  
6.00 X 4.00 X 0.75  
6.30 X 4.30 X 1.10  
12mm  
330mm (13")  
3000  
4mm 8mm  
Rev. 3 | Page 13 of 14 | www.onsemi.com  
CM1236  
ON Semiconductor and  
are registered trademarks of Semiconductor Components Industries, LLC (SCILLC). SCILLC reserves the right to make changes without further  
notice to any products herein. SCILLC makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does SCILLC  
assume any liability arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, conse-  
quential or incidental damages. “Typical” parameters which may be provided in SCILLC data sheets and/or specifications can and do vary in different applications and actual  
performance may vary over time. All operating parameters, including “Typicals” must be validated for each customer application by customer's technical experts. SCILLC  
does not convey any license under its patent rights nor the rights of others. SCILLC products are not designed, intended, or authorized for use as components in systems  
intended for surgical implant into the body, or other applications intended to support or sustain life, or for any other application in which the failure of the SCILLC product  
could create a situation where personal injury or death may occur. Should Buyer purchase or use SCILLC products for any such unintended or unauthorized application,  
Buyer shall indemnify and hold SCILLC and its officers, employees, subsidiaries, affiliates, and distributors harmless against all claims, costs, damages, and expenses, and  
reasonable attorney fees arising out of, directly or indirectly, any claim of personal injury or death associated with such unintended or unauthorized use, even if such claim  
alleges that SCILLC was negligent regarding the design or manufacture of the part. SCILLC is an Equal Opportunity/Affirmative Action Employer. This literature is subject to  
all applicable copyright laws and is not for resale in any manner.  
PUBLICATION ORDERING INFORMATION  
LITERATURE FULFILLMENT:  
N. American Technical Support: 800-282-9855  
Toll Free USA/Canada  
ON Semiconductor Website: www.onsemi.com  
Order Literature: http://www.onsemi.com/orderlit  
Literature Distribution Center for ON Semiconductor  
P.O. Box 5163, Denver, Colorado 80217 USA  
Phone: 303-675-2175 or 800-344-3860 Toll Free USA/Canada  
Fax: 303-675-2176 or 800-344-3867 Toll Free USA/Canada  
Email: orderlit@onsemi.com  
Europe, Middle East and Africa Technical Support:  
Phone: 421 33 790 2910  
Japan Customer Focus Center  
Phone: 81-3-5773-3850  
For additional information, please contact your local-  
Sales Representative  
Rev. 3 | Page 14 of 14 | www.onsemi.com  

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