2SK3456-S [NEC]

SWITCHING N-CHANNEL POWER MOSFET; 切换N沟道功率MOSFET
2SK3456-S
型号: 2SK3456-S
厂家: NEC    NEC
描述:

SWITCHING N-CHANNEL POWER MOSFET
切换N沟道功率MOSFET

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文件: 总8页 (文件大小:72K)
中文:  中文翻译
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DATA SHEET  
MOS FIELD EFFECT TRANSISTOR  
2SK3456  
SWITCHING  
N-CHANNEL POWER MOS FET  
DESCRIPTION  
ORDERING INFORMATION  
The 2SK3456 is N-channel DMOS FET device that  
features a low gate charge and excellent switching  
characteristics, designed for high voltage applications such  
as switching power supply, AC adapter.  
PART NUMBER  
2SK3456  
PACKAGE  
TO-220AB  
TO-262  
2SK3456-S  
2SK3456-ZJ  
TO-263  
FEATURES  
Low gate charge  
G
DD  
GS  
D
Q = 30 nC TYP. (V = 400 V, V = 10 V, I = 12 A)  
Gate voltage rating ±30 V  
Low on-state resistance  
DS(on)  
R
GS  
D
= 0.60 MAX. (V = 10 V, I = 6.0 A)  
Avalanche capability ratings  
Surface mount package available  
ABSOLUTE MAXIMUM RATINGS (TA = 25°C)  
GS  
DSS  
GSS  
Drain to Source Voltage (V = 0 V)  
V
500  
V
V
DS  
Gate to Source Voltage (V = 0 V)  
V
±30  
±12  
C
D(DC)  
D(pulse)  
T1  
Drain Current (DC) (T = 25°C)  
I
I
A
A
Drain Current (Pulse) Note1  
±36  
A
Total Power Dissipation (T = 25°C)  
P
P
1.5  
W
W
°C  
°C  
A
C
T2  
Total Power Dissipation (T = 25°C)  
100  
ch  
Channel Temperature  
T
150  
stg  
Storage Temperature  
T
55 to +150  
12  
Single Avalanche Current Note2  
Single Avalanche Energy Note2  
Notes 1. PW 10 µs, Duty Cycle 1%  
AS  
I
AS  
E
103  
mJ  
ch  
DD  
G
GS  
2. Starting T = 25°C, V = 150 V, R = 25 Ω, V = 20 0 V  
The information in this document is subject to change without notice. Before using this document, please  
confirm that this is the latest version.  
Not all devices/types available in every country. Please check with local NEC representative for  
availability and additional information.  
Document No.  
Date Published May 2002 NS CP(K)  
Printed in Japan  
D14753EJ1V0DS00 (1st edition)  
2000  
©
2SK3456  
ELECTRICAL CHARACTERISTICS (TA = 25°C)  
CHARACTERISTICS  
Zero Gate Voltage Drain Current  
Gate Leakage Current  
Gate Cut-off Voltage  
SYMBOL  
IDSS  
TEST CONDITIONS  
VDS = 500 V, VGS = 0 V  
MIN.  
TYP.  
MAX.  
100  
UNIT  
µA  
nA  
V
IGSS  
VGS(off)  
| yfs |  
RDS(on)  
Ciss  
VGS = ±30 V, VDS = 0 V  
VDS = 10 V, ID = 1 mA  
VDS = 10 V, ID = 6.0 A  
VGS = 10 V, ID = 6.0 A  
VDS = 10 V  
±100  
3.5  
2.5  
2.0  
Forward Transfer Admittance  
Drain to Source On-state Resistance  
Input Capacitance  
S
0.48  
1620  
250  
10  
0.60  
pF  
pF  
pF  
ns  
ns  
ns  
ns  
nC  
nC  
nC  
V
Output Capacitance  
Coss  
Crss  
VGS = 0 V  
Reverse Transfer Capacitance  
Turn-on Delay Time  
f = 1 MHz  
td(on)  
tr  
td(off)  
tf  
VDD = 150 V, ID = 6.0 A  
VGS = 10 V  
24  
Rise Time  
18  
Turn-off Delay Time  
RG = 10 Ω  
50  
Fall Time  
15  
Total Gate Charge  
QG  
VDD = 400 V  
30  
Gate to Source Charge  
Gate to Drain Charge  
Body Diode Forward Voltage  
Reverse Recovery Time  
Reverse Recovery Charge  
QGS  
QGD  
VF(S-D)  
trr  
VGS = 10 V  
9
ID = 12 A  
11  
IF = 12 A, VGS = 0 V  
IF = 12 A, VGS = 0 V  
di/dt = 50 A/ µs  
1.0  
1.5  
11  
µs  
µC  
Qrr  
TEST CIRCUIT 1 AVALANCHE CAPABILITY  
TEST CIRCUIT 2 SWITCHING TIME  
D.U.T.  
L
D.U.T.  
V
GS  
R
L
R
G
= 25 Ω  
90%  
V
GS  
Wave Form  
V
GS  
10%  
10%  
0
R
G
PG.  
PG.  
50 Ω  
V
DD  
V
DD  
V
GS = 200V  
I
D
90%  
90%  
10%  
I
D
V
0
GS  
BVDSS  
I
D
0
Wave Form  
I
AS  
V
DS  
τ
I
D
t
d(on)  
t
r
t
d(off)  
tf  
V
DD  
t
on  
toff  
µ
τ = 1  
s
Duty Cycle 1%  
Starting Tch  
TEST CIRCUIT 3 GATE CHARGE  
D.U.T.  
= 2 mA  
I
G
RL  
PG.  
50 Ω  
V
DD  
2
Data Sheet D14753EJ1V0DS  
2SK3456  
TYPICAL CHARACTERISTICS (TA = 25°C)  
DRAIN CURRENT vs.  
DRAIN TO SOURCE VOLTAGE  
FORWARD TRANSFER CHARACTERISTICS  
35  
100  
10  
Pulsed  
V
GS = 20 V  
30  
25  
20  
15  
10  
5
10 V  
T
A
=150˚C  
125˚C  
75˚C  
1
25˚C  
25˚C  
50˚C  
0.1  
0.01  
0.001  
VDS = 10 V  
Pulsed  
0
0
10  
20  
30  
40  
0
5
10  
15  
V
DS - Drain to Source Voltage - V  
V
GS  
- Gate to Source Voltage - V  
FORWARD TRANSFER ADMITTANCE vs.  
DRAIN CURRENT  
GATE TO SOURCE CUT-OFF VOLTAGE vs.  
CHANNEL TEMPERATURE  
100  
10  
4.0  
3.0  
2.0  
1.0  
0
V
DS = 10 V  
V
DS = 10 V  
= 1 mA  
Pulsed  
I
D
T
A
= 50˚C  
25˚C  
25˚C  
75˚C  
125˚C  
150˚C  
1
0.1  
0.01  
150  
50  
0
50  
100  
0.1  
1
10  
100  
T
ch - Channel Temperature - ˚C  
I
D
- Drain Current - A  
DRAIN TO SOURCE ON-STATE RESISTANCE vs.  
GATE TO SOURCE VOLTAGE  
DRAIN TO SOURCE ON-STATE  
RESISTANCE vs. DRAIN CURRENT  
1.5  
1.2  
0.9  
0.6  
0.3  
0
Pulsed  
1.4  
Pulsed  
VGS = 10 V  
1.2  
1.0  
0.8  
0.6  
0.4  
0.2  
0
20 V  
I
D
= 12 A  
6.0 A  
2.4 A  
0.1  
1
10  
100  
0
5
10  
15  
20  
I
D - Drain Current - A  
V
GS - Gate to Source Voltage - V  
3
Data Sheet D14753EJ1V0DS  
2SK3456  
DRAIN TO SOURCE ON-STATE RESISTANCE vs.  
CHANNEL TEMPERATURE  
SOURCE TO DRAIN DIODE  
FORWARD VOLTAGE  
1.6  
100  
10  
1.4  
1.2  
1.0  
0.8  
0.6  
0.4  
0.2  
0
I = 6.0 A  
D
V
GS = 10 V  
12 A  
1
0 V  
0.1  
0.01  
V
GS = 10 V  
Pulsed  
1.5  
Pulsed  
0
0.5  
1.0  
50  
0
50  
100  
150  
VSD - Source to Drain Voltage - V  
T
ch - Channel Temperature - ˚C  
SWITCHING CHARACTERISTICS  
CAPACITANCE vs. DRAIN TO  
SOURCE VOLTAGE  
10000  
1000  
100  
10  
1000  
100  
10  
C
iss  
t
f
t
d(off)  
t
d(on)  
Coss  
t
r
1
1
V
V
DD = 150 V  
GS = 10 V  
V
GS = 0 V  
Crss  
R
G
= 10 Ω  
f = 1 MHz  
0.1  
0.1  
0.1  
1
10  
100  
1000  
0.1  
1
10  
100  
V
DS - Drain to Source Voltage - V  
I
D
- Drain Current - A  
DYNAMIC INPUT/OUTPUT CHARACTERISTICS  
REVERSE RECOVERY TIME vs.  
DRAIN CURRENT  
10000  
1000  
100  
10  
600  
400  
200  
0
12  
10  
8
di/dt = 50 A/ s  
µ
V
GS = 0 V  
V
DD = 400 V  
250 V  
125 V  
V
GS  
6
4
2
V
DS  
I
D
= 12 A  
30  
1
0
0.1  
1
10  
100  
0
5
10  
15  
20  
25  
35  
I
D
- Drain Current - A  
QG - Gate Charge - nC  
4
Data Sheet D14753EJ1V0DS  
2SK3456  
TOTAL POWER DISSIPATION vs.  
CASE TEMPERATURE  
DERATING FACTOR OF FORWARD BIAS  
SAFE OPERATING AREA  
120  
100  
80  
60  
40  
20  
0
100  
90  
80  
70  
60  
50  
40  
30  
20  
10  
0
0
20  
40  
60  
80 100 120 140 160  
0
20 40 60 80 100 120 140 160  
T
C
- Case Temperature - ˚C  
TC - Case Temperature - ˚C  
FORWARD BIAS SAFE OPERATING AREA  
100  
10  
1
PW = 10  
I
D(pulse)  
100  
µ
s
ID(DC)  
µ
s
1 ms  
3 ms  
10 ms  
30 ms  
100 ms  
Power Dissipation Limited  
T
C
= 25˚C  
Single Pulse  
0.1  
1
10  
100  
1000  
V
DS - Drain to Source Voltage - V  
TRANSIENT THERMAL RESISTANCE vs. PULSE WIDTH  
1000  
100  
10  
Rth(ch-A) = 83.3˚C/W  
Rth(ch-C) = 1.25˚C/W  
1
0.1  
0.01  
0.001  
Single Pulse  
100 1000  
10 µ  
100 µ  
1 m  
10 m  
100 m  
1
10  
PW - Pulse Width - s  
5
Data Sheet D14753EJ1V0DS  
2SK3456  
SINGLE AVALANCHE CURRENT vs.  
INDUCTIVE LOAD  
SINGLE AVALANCHE ENERGY  
DERATING FACTOR  
120  
100  
80  
60  
40  
20  
0
100  
10  
V
R
V
DD = 150 V  
= 25 Ω  
GS = 20 0 V  
G
I
AS 12 A  
IAS = 12 A  
1
VDD = 150 V  
VGS = 20 0 V  
RG = 25 Ω  
Starting Tch = 25˚C  
0.1  
0.01  
0.1  
1
10  
25  
50  
75  
100  
125  
150  
Starting Tch - Starting Channel Temperature - ˚C  
L - Inductive Load - mH  
6
Data Sheet D14753EJ1V0DS  
2SK3456  
PACKAGE DRAWINGS (Unit: mm)  
1) TO-220AB (MP-25)  
2) TO-262 (MP-25 Fin Cut)  
4.8 MAX.  
1.3±0.2  
10.6 MAX.  
10.0 TYP.  
4.8 MAX.  
1.3±0.2  
φ
3.6±0.2  
10 TYP.  
4
1
2
3
4
1
2 3  
1.3±0.2  
1.3±0.2  
2.8±0.2  
0.5±0.2  
1.Gate  
0.75±0.3  
2.54 TYP.  
2.54 TYP.  
0.75±0.1  
2.54 TYP.  
0.5±0.2  
1.Gate  
2.Drain  
3.Source  
4.Fin (Drain)  
2.8±0.2  
2.54 TYP.  
2.Drain  
3.Source  
4.Fin (Drain)  
3) TO-263 (MP-25ZJ)  
4.8 MAX.  
10 TYP.  
4
1.3±0.2  
EQUIVALENT CIRCUIT  
Drain  
1
2
3
1.4±0.2  
Body  
Diode  
0.7±0.2  
Gate  
0.5±0.2  
2.54 TYP.  
2.54 TYP.  
1.Gate  
Source  
2.Drain  
3.Source  
4.Fin (Drain)  
Remark Strong electric field, when exposed to this device, can cause destruction of the gate oxide and ultimately  
degrade the device operation. Steps must be taken to stop generation of static electricity as much as possible,  
and quickly dissipate it once, when it has occurred.  
7
Data Sheet D14753EJ1V0DS  
2SK3456  
The information in this document is current as of May, 2002. The information is subject to change  
without notice. For actual design-in, refer to the latest publications of NEC's data sheets or data  
books, etc., for the most up-to-date specifications of NEC semiconductor products. Not all products  
and/or types are available in every country. Please check with an NEC sales representative for  
availability and additional information.  
No part of this document may be copied or reproduced in any form or by any means without prior  
written consent of NEC. NEC assumes no responsibility for any errors that may appear in this document.  
NEC does not assume any liability for infringement of patents, copyrights or other intellectual property rights of  
third parties by or arising from the use of NEC semiconductor products listed in this document or any other  
liability arising from the use of such products. No license, express, implied or otherwise, is granted under any  
patents, copyrights or other intellectual property rights of NEC or others.  
Descriptions of circuits, software and other related information in this document are provided for illustrative  
purposes in semiconductor product operation and application examples. The incorporation of these  
circuits, software and information in the design of customer's equipment shall be done under the full  
responsibility of customer. NEC assumes no responsibility for any losses incurred by customers or third  
parties arising from the use of these circuits, software and information.  
While NEC endeavours to enhance the quality, reliability and safety of NEC semiconductor products, customers  
agree and acknowledge that the possibility of defects thereof cannot be eliminated entirely. To minimize  
risks of damage to property or injury (including death) to persons arising from defects in NEC  
semiconductor products, customers must incorporate sufficient safety measures in their design, such as  
redundancy, fire-containment, and anti-failure features.  
NEC semiconductor products are classified into the following three quality grades:  
"Standard", "Special" and "Specific". The "Specific" quality grade applies only to semiconductor products  
developed based on a customer-designated "quality assurance program" for a specific application. The  
recommended applications of a semiconductor product depend on its quality grade, as indicated below.  
Customers must check the quality grade of each semiconductor product before using it in a particular  
application.  
"Standard": Computers, office equipment, communications equipment, test and measurement equipment, audio  
and visual equipment, home electronic appliances, machine tools, personal electronic equipment  
and industrial robots  
"Special": Transportation equipment (automobiles, trains, ships, etc.), traffic control systems, anti-disaster  
systems, anti-crime systems, safety equipment and medical equipment (not specifically designed  
for life support)  
"Specific": Aircraft, aerospace equipment, submersible repeaters, nuclear reactor control systems, life  
support systems and medical equipment for life support, etc.  
The quality grade of NEC semiconductor products is "Standard" unless otherwise expressly specified in NEC's  
data sheets or data books, etc. If customers wish to use NEC semiconductor products in applications not  
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to support a given application.  
(Note)  
(1) "NEC" as used in this statement means NEC Corporation and also includes its majority-owned subsidiaries.  
(2) "NEC semiconductor products" means any semiconductor product developed or manufactured by or for  
NEC (as defined above).  
M8E 00. 4  

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