LUR13743-PF [LIGITEK]

SUPER BRIGHT ROUND TYPE LED LAMPS; SUPER BRIGHT ROUND型LED灯
LUR13743-PF
型号: LUR13743-PF
厂家: LIGITEK ELECTRONICS CO., LTD.    LIGITEK ELECTRONICS CO., LTD.
描述:

SUPER BRIGHT ROUND TYPE LED LAMPS
SUPER BRIGHT ROUND型LED灯

文件: 总6页 (文件大小:122K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
LIGITEK ELECTRONICS CO.,LTD.  
Property of Ligitek Only  
SUPER BRIGHT ROUND TYPE LED LAMPS  
Pb  
Lead-Free Parts  
LUR13743-PF  
DATA SHEET  
DOC. NO : QW0905-LUR13743-PF  
REV  
: A  
DATE  
: 01 - Mar. - 2006  
LIGITEK ELECTRONICS CO.,LTD.  
Property of Ligitek Only  
PART NO. LUR13743-PF  
Page 1/5  
Package Dimensions  
5.0  
7.6  
5.9  
8.6  
1.5MAX  
25.0MIN  
0.5  
TYP  
1.0MIN  
2.54TYP  
+
-
Note : 1.All dimension are in millimeter tolerance is ±0.25mm unless otherwise noted.  
2.Specifications are subject to change without notice.  
Directivity Radiation  
LIGITEK ELECTRONICS CO.,LTD.  
Property of Ligitek Only  
Page 2/5  
PART NO. LUR13743-PF  
Absolute Maximum Ratings at Ta=25  
Ratings  
UR  
Symbol  
Parameter  
UNIT  
IF  
IFP  
PD  
Ir  
40  
Forward Current  
mA  
mA  
mW  
Peak Forward Current  
Duty 1/10@10KHz  
120  
Power Dissipation  
120  
Reverse Current @5V  
Operating Temperature  
Storage Temperature  
10  
μA  
Topr  
Tstg  
-40 ~ +85  
-40 ~ +100  
Typical Electrical & Optical Characteristics (Ta=25 )  
Forward  
voltage  
@20mA(V) @20mA(mcd)  
Luminous  
intensity  
Viewing  
angle  
2θ 1/2  
(deg)  
Peak  
wave  
length  
λPnm  
Spectral  
halfwidth  
△λnm  
COLOR  
MATERIAL  
GaAlAs  
PART NO  
Typ.  
Max.  
2.4  
Emitted  
Red  
Lens  
Min.  
1.5  
Min.  
LUR13743-PF  
Water Clear  
660  
20  
300 450  
56  
Note : 1.The forward voltage data did not including ±0.1V testing tolerance.  
2. The luminous intensity data did not including ±15% testing tolerance.  
LIGITEK ELECTRONICS CO.,LTD.  
Property of Ligitek Only  
PART NO. LUR13743-PF  
Page3/5  
Typical Electro-Optical Characteristics Curve  
UR CHIP  
Fig.1 Forward current vs. Forward Voltage  
Fig.2 Relative Intensity vs. Forward Current  
3.0  
2.5  
2.0  
1.5  
1.0  
0.5  
0.0  
1000  
100  
10  
1
0 1  
1.0  
2.0  
3.0  
4.0  
5.0  
1
10  
100  
1000  
Forward Current(mA)  
Forward Voltage(V)  
Fig.3 Forward Voltage vs. Temperature  
Fig.4 Relative Intensity vs. Temperature  
1.2  
3.0  
2.5  
2.0  
1.1  
1.0  
0.9  
0.8  
1.5  
1.0  
0.5  
0.0  
-40  
-20  
0
20  
40  
60  
80  
100  
-40 -20  
0
20  
40  
60  
80  
100  
Ambient Temperature()  
Ambient Temperature()  
Fig.5 Relative Intensity vs. Wavelength  
1.0  
0.5  
0.0  
600  
650  
700  
750  
Wavelength (nm)  
LIGITEK ELECTRONICS CO.,LTD.  
Property of Ligitek Only  
PART NO. LUR13743-PF  
Page 4/5  
Soldering Condition(Pb-Free)  
1.Iron:  
Soldering Iron:30W Max  
Temperature 350°C Max  
Soldering Time:3 Seconds Max(One Time)  
Distance:2mm Min(From solder joint to body)  
2.Wave Soldering Profile  
Dip Soldering  
Preheat: 120°C Max  
Preheat time: 60seconds Max  
Ramp-up  
2°C/sec(max)  
Ramp-Down:-5°C/sec(max)  
Solder Bath:260°C Max  
Dipping Time:3 seconds Max  
Distance:2mm Min(From solder joint to body)  
Temp(°C)  
260°C3sec Max  
260°  
120°  
5°/sec  
max  
2°/sec  
25°  
0°  
max  
0
50  
150  
Time(sec)  
100  
Preheat  
60 Seconds Max  
LIGITEK ELECTRONICS CO.,LTD.  
Property of Ligitek Only  
PART NO. LUR13743-PF  
Page  
5/5  
Reliability Test:  
Reference  
Description  
Test Item  
Test Condition  
Standard  
1.Under Room Temperature  
2.If=20mA  
3.t=1000 hrs (-24hrs, +72hrs)  
This test is conducted for the purpose  
of detemining the resistance of a part  
in electrical and themal stressed.  
MIL-STD-750: 1026  
MIL-STD-883: 1005  
JIS C 7021: B-1  
Operating Life Test  
The purpose of this is the resistance of  
the device which is laid under condition  
of high temperature for hours.  
High Temperature  
Storage Test  
1.Ta=105 ℃±5℃  
2.t=1000 hrs (-24hrs, +72hrs)  
MIL-STD-883:1008  
JIS C 7021: B-10  
The purpose of this is the resistance  
of the device which is laid under  
condition of low temperature for hours.  
Low Temperature  
Storage Test  
1.Ta=-40 ℃±5℃  
2.t=1000 hrs (-24hrs, +72hrs)  
JIS C 7021: B-12  
1.Ta=65℃±5℃  
2.RH=90%~95%  
3.t=240hrs ±2hrs  
High Temperature  
High Humidity Test  
The purpose of this test is the resistance  
of the device under tropical for hours.  
MIL-STD-202:103B  
JIS C 7021: B-11  
The purpose of this is the resistance of  
the device to sudden extreme changes  
in high and low temperature.  
1.Ta=105 ℃±5&-40℃±5℃  
(10min) (10min)  
2.total 10 cycles  
MIL-STD-202: 107D  
MIL-STD-750: 1051  
MIL-STD-883: 1011  
Thermal Shock Test  
This test intended to determine the  
thermal characteristic resistance  
of the device to sudden exposures  
at extreme changes in temperature  
when soldering the lead wire.  
MIL-STD-202: 210A  
MIL-STD-750: 2031  
JIS C 7021: A-1  
Solder Resistance  
Test  
1.T.Sol=260 ℃±5℃  
2.Dwell time= 10 ±1sec.  
MIL-STD-202: 208D  
MIL-STD-750: 2026  
MIL-STD-883: 2003  
JIS C 7021: A-2  
This test intended to see soldering well  
performed or not.  
1.T.Sol=230 ℃±5℃  
2.Dwell time=5 ±1sec  
Solderability Test  

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