LUR2041H [LIGITEK]

SUPER BRIGHT ROUND TYPE LED LAMPS; SUPER BRIGHT ROUND型LED灯
LUR2041H
型号: LUR2041H
厂家: LIGITEK ELECTRONICS CO., LTD.    LIGITEK ELECTRONICS CO., LTD.
描述:

SUPER BRIGHT ROUND TYPE LED LAMPS
SUPER BRIGHT ROUND型LED灯

文件: 总5页 (文件大小:104K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
LIGITEK ELECTRONICS CO.,LTD.  
Property of Ligitek Only  
SUPER BRIGHT ROUND TYPE LED LAMPS  
LUR2041H  
DATA SHEET  
DOC. NO : QW0905-LUR2041H  
REV.  
: A  
DATE  
: 20 - Jul. - 2005  
LIGITEK ELECTRONICS CO.,LTD.  
Property of Ligitek Only  
Page  
PART NO. LUR2041H  
1/4  
Package Dimensions  
3.0  
4.2  
4.0  
5.2  
1.5MAX  
25.0MIN  
1.0MIN  
0.5  
TYP  
2.54TYP  
-
+
Note : 1.All dimension are in millimeter tolerance is ±0.25mm unless otherwise noted.  
2.Specifications are subject to change without notice.  
Directivity Radiation  
0°  
-30°  
30°  
-60°  
60°  
100% 75% 50% 25% 0 25% 50% 75%100%  
LIGITEK ELECTRONICS CO.,LTD.  
Property of Ligitek Only  
Page 2/4  
PART NO. LUR2041H  
Absolute Maximum Ratings at Ta=25 ℃  
Ratings  
UR(H)  
50  
Symbol  
Parameter  
UNIT  
IF  
IFP  
Forward Current  
mA  
Peak Forward Current  
Duty 1/10@10KHz  
100  
mA  
mW  
Power Dissipation  
PD  
Ir  
130  
Reverse Current @5V  
Electrostatic Discharge  
Operating Temperature  
Storage Temperature  
10  
μA  
V
ESD  
Topr  
Tstg  
2000  
-40 ~ +85  
-40 ~ +100  
Max 260for 5 sec Max  
Soldering Temperature  
Tsol  
(2mm from body)  
Typical Electrical & Optical Characteristics (Ta=25 )  
Forward  
Luminous  
intensity  
Viewing  
angle  
Dominant  
wave  
Spectral  
halfwidth  
△λnm  
voltage  
COLOR  
@20mA(V) @20mA(mcd)  
length  
2θ1/2  
PART NO MATERIAL  
λDnm  
(deg)  
Typ.  
2.6 1100 2200  
Emitted  
LUR2041H AlGaInP/GaP Red  
Lens  
Red Transparent  
Max.  
Min.  
Min.  
1.7  
630  
20  
30  
Note : 1.The forward voltage data did not including ±0.1V testing tolerance.  
2. The luminous intensity data did not including ±15% testing tolerance.  
LIGITEK ELECTRONICS CO.,LTD.  
Property of Ligitek Only  
Page3/4  
PART NO. LUR2041H  
Typical Electro-Optical Characteristics Curve  
UR(H) CHIP  
Fig.1 Forward current vs. Forward Voltage  
Fig.2 Relative Intensity vs. Forward Current  
1000  
3.5  
3.0  
2.5  
2.0  
1.5  
1.0  
0.5  
0.0  
100  
10  
1
0 1  
1.0  
1.5  
2.0  
2.5  
3.0  
1
10  
100  
1000  
Forward Current(mA)  
Forward Voltage(V)  
Fig.3 Forward Voltage vs. Temperature  
Fig.4 Relative Intensity vs. Temperature  
1.2  
3.0  
2.5  
2.0  
1.1  
1.0  
0.9  
0.8  
1.5  
1.0  
0.5  
0.0  
-40  
-20  
0
20  
40  
60  
80  
100  
-40 -20  
0
20  
40  
60  
80  
100  
Ambient Temperature()  
Ambient Temperature()  
Fig.5 Relative Intensity vs. Wavelength  
1.0  
0.5  
0.0  
550  
600  
650  
700  
Wavelength (nm)  
LIGITEK ELECTRONICS CO.,LTD.  
Property of Ligitek Only  
Page  
PART NO. LUR2041H  
4/4  
Reliability Test:  
Reference  
Description  
Test Item  
Test Condition  
Standard  
1.Under Room Temperature  
2.If=20mA  
3.t=1000 hrs (-24hrs, +72hrs)  
This test is conducted for the purpose  
of detemining the resisance of a part  
in electrical and themal stressed.  
MIL-STD-750: 1026  
MIL-STD-883: 1005  
JIS C 7021: B-1  
Operating Life Test  
The purpose of this is the resistance of  
the device which is laid under ondition  
of high temperature for hours.  
High Temperature  
Storage Test  
1.Ta=105±5℃  
2.t=1000 hrs (-24hrs, +72hrs)  
MIL-STD-883:1008  
JIS C 7021: B-10  
The purpose of this is the resistance  
of the device which is laid under  
condition of low temperature for hours.  
Low Temperature  
Storage Test  
1.Ta=-40±5℃  
2.t=1000 hrs (-24hrs, +72hrs)  
JIS C 7021: B-12  
1.Ta=65±5℃  
2.RH=90%~95%  
3.t=240hrs ±2hrs  
High Temperature  
High Humidity Test  
The purpose of this test is the resistance  
of the device under tropical for hous.  
MIL-STD-202:103B  
JIS C 7021: B-11  
The purpose of this is the resistance of  
the device to sudden extreme changes  
in high and low temperature.  
1.Ta=105±5&-40±5℃  
(10min) (10min)  
2.total 10 cycles  
MIL-STD-202: 107D  
MIL-STD-750: 1051  
MIL-STD-883: 1011  
Thermal Shock Test  
This test intended to determine the  
thermal characteristic resistance  
of the device to sudden exposures  
at extreme changes in temperature  
when soldering the lead wire.  
MIL-STD-202: 210A  
MIL-STD-750: 2031  
JIS C 7021: A-1  
Solder Resistance  
Test  
1.T.Sol=260 ±5℃  
2.Dwell time= 10 ±1sec.  
MIL-STD-202: 208D  
MIL-STD-750: 2026  
MIL-STD-883: 2003  
JIS C 7021: A-2  
This test intended to see soldering well  
performed or not.  
1.T.Sol=230 ±5℃  
2.Dwell time=5 ±1sec  
Solderability Test  

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