IRFR430A [KERSEMI]

Power MOSFET; 功率MOSFET
IRFR430A
型号: IRFR430A
厂家: Kersemi Electronic Co., Ltd.    Kersemi Electronic Co., Ltd.
描述:

Power MOSFET
功率MOSFET

文件: 总7页 (文件大小:2318K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
IRFR430A, IRFU430A, SiHFR430A, SiHFU430A  
Power MOSFET  
FEATURES  
• Low Gate Charge Qg Results in Simple Drive  
Requirement  
PRODUCT SUMMARY  
VDS (V)  
500  
Available  
RDS(on) (Ω)  
VGS = 10 V  
1.7  
RoHS*  
• Improved Gate, Avalanche and Dynamic dV/dt  
Ruggedness  
Qg (Max.) (nC)  
24  
6.5  
COMPLIANT  
Q
Q
gs (nC)  
gd (nC)  
13  
• Fully Characterized Capacitance and Avalanche Voltage  
and Current  
Configuration  
Single  
• Effective Coss Specified  
• Lead (Pb)-free Available  
D
DPAK  
IPAK  
(TO-252)  
(TO-251)  
APPLICATIONS  
G
• Switch Mode Power Supply (SMPS)  
• Uninterruptible Power Supply  
• High Speed Power Switching  
S
N-Channel MOSFET  
ORDERING INFORMATION  
Package  
DPAK (TO-252)  
IRFR430APbF  
SiHFR430A-E3  
IRFR430A  
DPAK (TO-252)  
IRFR430ATRPbFa  
SiHFR430AT-E3a  
IRFR430ATRa  
DPAK (TO-252)  
IRFR430ATRLPbFa  
SiHFR430ATL-E3a  
IRFR430ATRLa  
SiHFR430ATLa  
DPAK (TO-252)  
IRFR430ATRRPbFa  
SiHFR430ATR-E3a  
IRFR430ATRRa  
SiHFR430ATRa  
IPAK (TO-251)  
IRFU430APbF  
SiHFU430A-E3  
IRFU430A  
Lead (Pb)-free  
SnPb  
SiHFR430A  
SiHFR430ATa  
SiHFU430A  
Note  
a. See device orientation.  
ABSOLUTE MAXIMUM RATINGS TC = 25 °C, unless otherwise noted  
PARAMETER  
SYMBOL  
LIMIT  
500  
UNIT  
Drain-Source Voltage  
Gate-Source Voltage  
VDS  
V
VGS  
30  
TC = 25 °C  
TC =100°C  
5.0  
Continuous Drain Current  
VGS at 10 V  
ID  
3.2  
A
Pulsed Drain Currenta  
IDM  
20  
Linear Derating Factor  
0.91  
130  
W/°C  
mJ  
A
Single Pulse Avalanche Energyb  
Repetitive Avalanche Currenta  
Repetitive Avalanche Energya  
EAS  
IAR  
5.0  
EAR  
11  
mJ  
W
Maximum Power Dissipation  
TC = 25 °C  
PD  
110  
Peak Diode Recovery dV/dtc  
dV/dt  
TJ, Tstg  
3.0  
V/ns  
Operating Junction and Storage Temperature Range  
Soldering Recommendations (Peak Temperature)  
- 55 to + 150  
300d  
°C  
for 10 s  
Notes  
a. Repetitive rating; pulse width limited by maximum junction temperature (see fig. 11).  
b. Starting TJ = 25 °C, L = 11 mH, RG = 25 Ω, IAS = 5.0 A (see fig. 12).  
c. ISD 5.0 A, dI/dt 320 A/µs, VDD VDS, TJ 150 °C.  
d. 1.6 mm from case.  
www.kersemi.com  
1
IRFR430A, IRFU430A, SiHFR430A, SiHFU430A  
THERMAL RESISTANCE RATINGS  
PARAMETER  
SYMBOL  
TYP.  
MAX.  
62  
UNIT  
Maximum Junction-to-Ambient  
Case-to-Sink, Flat, Greased Surface  
Maximum Junction-to-Case (Drain)  
RthJA  
-
0.50  
-
-
RthCS  
°C/W  
1.1  
RthJC  
SPECIFICATIONS TJ = 25 °C, unless otherwise noted  
PARAMETER  
SYMBOL  
TEST CONDITIONS  
MIN.  
TYP.  
MAX.  
UNIT  
Static  
Drain-Source Breakdown Voltage  
VDS Temperature Coefficient  
Gate-Source Threshold Voltage  
Gate-Source Leakage  
VDS  
ΔVDS/TJ  
VGS(th)  
IGSS  
VGS = 0 V, ID = 250 µA  
Reference to 25 °C, ID = 1 mA  
VDS = VGS, ID = 250 µA  
500  
-
-
V
V/°C  
V
-
0.60  
-
2.0  
-
-
-
-
-
-
4.5  
100  
25  
250  
1.7  
-
VGS  
VDS = 500 V, VGS = 0 V  
DS = 400 V, VGS = 0 V, TJ = 125 °C  
VGS = 10 V  
ID = 3.0 Ab  
=
30 V  
-
nA  
-
-
Zero Gate Voltage Drain Current  
IDSS  
µA  
V
Drain-Source On-State Resistance  
Forward Transconductance  
Dynamic  
RDS(on)  
gfs  
-
Ω
VDS = 50 V, ID = 3.0 A  
2.3  
S
Input Capacitance  
Ciss  
Coss  
Crss  
-
-
-
-
-
-
-
-
-
-
-
-
-
490  
75  
4.5  
750  
25  
51  
-
-
VGS = 0 V,  
VDS = 25 V,  
f = 1.0 MHz, see fig. 5  
Output Capacitance  
-
-
pF  
pF  
nC  
Reverse Transfer Capacitance  
V
DS = 1.0 V, f = 1.0 MHz  
-
Output Capacitance  
Coss  
VGS = 10 V  
VGS = 10 V  
VDS = 400 V, f = 1.0 MHz  
VDS = 0 V to 400 Vc  
-
Effective Output Capacitance  
Total Gate Charge  
Coss eff.  
Qg  
-
24  
6.5  
13  
-
ID = 5.0 A, VDS = 400 V,  
see fig. 6 and 13b  
Gate-Source Charge  
Gate-Drain Charge  
Qgs  
Qgd  
td(on)  
tr  
-
-
Turn-On Delay Time  
Rise Time  
8.7  
27  
17  
16  
-
VDD = 250 V, ID = 5.0 A,  
G = 15 Ω, RD = 50 Ω, see fig. 10b  
ns  
R
Turn-Off Delay Time  
Fall Time  
td(off)  
tf  
-
-
Drain-Source Body Diode Characteristics  
MOSFET symbol  
showing the  
integral reverse  
p - n junction diode  
D
Continuous Source-Drain Diode Current  
Pulsed Diode Forward Currenta  
IS  
-
-
-
-
5.0  
20  
A
G
ISM  
S
Body Diode Voltage  
VSD  
trr  
TJ = 25 °C, IS = 5.0 A, VGS = 0 Vb  
-
-
-
-
1.5  
620  
2.1  
V
Body Diode Reverse Recovery Time  
Body Diode Reverse Recovery Charge  
Forward Turn-On Time  
410  
1.4  
ns  
µC  
TJ = 25 °C, IF = 5.0 A, dI/dt = 100 A/µsb  
Qrr  
ton  
Intrinsic turn-on time is negligible (turn-on is dominated by LS and LD)  
Notes  
a. Repetitive rating; pulse width limited by maximum junction temperature (see fig. 11).  
b. Pulse width 300 µs; duty cycle 2 %.  
c. Coss eff. is a fixed capacitance that gives the same charging time as Coss while VDS is rising from 0 to 80 % VDS  
.
www.kersemi.com  
2
IRFR430A, IRFU430A, SiHFR430A, SiHFU430A  
TYPICAL CHARACTERISTICS 25 °C, unless otherwise noted  
100  
100.00  
10.00  
1.00  
VGS  
15V  
TOP  
10V  
8.0V  
7.0V  
6.0V  
5.5V  
5.0V  
10  
T
= 150°C  
J
BOTTOM 4.5V  
1
0.1  
T
= 25°C  
J
4.5V  
0.10  
0.01  
0.001  
20μs PULSE WIDTH  
Tj = 25°C  
V
= 100V  
DS  
20μs PULSE WIDTH  
0.01  
0.1  
1
10  
100  
4.0  
6.0  
V
8.0  
10.0  
12.0  
14.0  
16.0  
V
, Drain-to-Source Voltage (V)  
, Gate-to-Source Voltage (V)  
DS  
GS  
Fig. 1 - Typical Output Characteristics  
Fig. 3 - Typical Transfer Characteristics  
100  
10  
3.0  
VGS  
5.0A  
=
I
D
TOP  
15V  
10V  
8.0V  
7.0V  
2.5  
2.0  
1.5  
1.0  
0.5  
0.0  
6.0V  
5.5V  
5.0V  
BOTTOM 4.5V  
1
4.5V  
0.1  
0.01  
20μs PULSE WIDTH  
Tj = 150°C  
V
= 10V  
GS  
0.1  
1
10  
100  
-60 -40 -20  
0
20  
40  
60  
80 100 120 140 160  
°
T , Junction Temperature  
(
C)  
V
, Drain-to-Source Voltage (V)  
J
DS  
Fig. 2 - Typical Output Characteristics  
Fig. 4 - Normalized On-Resistance vs. Temperature  
www.kersemi.com  
3
IRFR430A, IRFU430A, SiHFR430A, SiHFU430A  
100  
10000  
V
C
C
= 0V,  
f = 1 MHZ  
GS  
iss  
= C + C  
,
C
SHORTED  
gs  
gd  
ds  
= C  
rss  
gd  
C
= C + C  
oss  
ds  
gd  
1000  
100  
10  
Ciss  
10  
Coss  
Crss  
°
T = 25  
C
°
T = 150  
J
C
J
1
1
V
= 0 V  
GS  
0.1  
1
10  
100  
1000  
0.2  
0.5  
0.8  
1.1  
1.4  
V
, Drain-to-Source Voltage (V)  
DS  
V
,Source-to-Drain Voltage (V)  
SD  
Fig. 5 - Typical Capacitance vs. Drain-to-Source Voltage  
Fig. 7 - Typical Source-Drain Diode Forward Voltage  
100  
12  
D
I
= 5.0A  
OPERATION IN THIS AREA  
V
V
V
= 400V  
= 250V  
= 100V  
DS  
DS  
DS  
LIMITED BY R (on)  
DS  
10  
7
10  
1
100μsec  
1msec  
5
2
Tc = 25°C  
Tj = 150°C  
Single Pulse  
10msec  
0.1  
0
0
4
8
12  
16  
20  
10  
100  
1000  
10000  
Q
, Total Gate Charge (nC)  
G
V
, Drain-toSource Voltage (V)  
DS  
Fig. 8 - Maximum Safe Operating Area  
Fig. 6 - Typical Gate Charge vs. Gate-to-Source Voltage  
www.keremi.com  
4
IRFR430A, IRFU430A, SiHFR430A, SiHFU430A  
RD  
5.5  
4.4  
3.3  
2.2  
1.1  
0.0  
VDS  
VGS  
D.U.T.  
RG  
+
V
-
DD  
10 V  
Pulse width 1 µs  
Duty factor 0.1 %  
Fig. 10a - Switching Time Test Circuit  
VDS  
90 %  
25  
50  
T
75  
100  
125  
150  
10 %  
VGS  
°
C)  
, Case Temperature  
(
C
td(on) tr  
td(off) tf  
Fig. 9 - Maximum Drain Current vs. Case Temperature  
Fig. 10b - Switching Time Waveforms  
10  
1
D = 0.50  
0.20  
0.10  
P
DM  
0.1  
0.05  
t
1
SINGLE PULSE  
(THERMAL RESPONSE)  
0.02  
0.01  
t
2
Notes:  
1. Duty factor D =  
t
/ t  
1
2
2. Peak T  
= P  
x
Z
+ T  
J
DM  
thJC  
C
0.01  
0.00001  
0.0001  
0.001  
0.01  
0.1  
1
t , Rectangular Pulse Duration (sec)  
1
Fig. 11 - Maximum Effective Transient Thermal Impedance, Junction-to-Case  
VDS  
15 V  
tp  
Driver  
L
VDS  
D.U.T  
IAS  
RG  
+
-
V
A
DD  
IAS  
20 V  
0.01 Ω  
tp  
Fig. 12a - Unclamped Inductive Test Circuit  
Fig. 12b - Unclamped Inductive Waveforms  
www.kersemi.com  
5
IRFR430A, IRFU430A, SiHFR430A, SiHFU430A  
250  
200  
150  
100  
50  
5.0  
4.5  
4.0  
3.5  
3.0  
2.5  
I
D
TOP  
2.2A  
3.2A  
5.0A  
BOTTOM  
I
= 250μA  
D
0
-75 -50 -25  
0
25  
50  
75 100 125 150  
25  
50  
75  
100  
125  
150  
T
, Temperature ( °C )  
°
J
Starting Tj, Junction Temperature  
( C)  
Fig. 12d - Threshold Voltage vs. Temperature  
Fig. 12c - Maximum Avalanche Energy vs. Drain Current  
Current regulator  
Same type as D.U.T.  
50 kΩ  
QG  
VGS  
12 V  
0.2 µF  
0.3 µF  
QGS  
QGD  
+
-
VDS  
D.U.T.  
VG  
VGS  
3 mA  
Charge  
IG  
Current sampling resistors  
Fig. 13b - Gate Charge Test Circuit  
ID  
Fig. 13a - Basic Gate Charge Waveform  
www.kersemi.com  
6
IRFR430A, IRFU430A, SiHFR430A, SiHFU430A  
Peak Diode Recovery dV/dt Test Circuit  
+
Circuit layout considerations  
Low stray inductance  
Ground plane  
D.U.T  
Low leakage inductance  
current transformer  
-
+
-
-
+
RG  
dV/dt controlled by RG  
+
-
Driver same type as D.U.T.  
ISD controlled by duty factor "D"  
D.U.T. - device under test  
VDD  
Driver gate drive  
P.W.  
P.W.  
Period  
Period  
D =  
V
= 10 V*  
GS  
D.U.T. I waveform  
SD  
Reverse  
recovery  
current  
Body diode forward  
current  
dI/dt  
D.U.T. V waveform  
DS  
Diode recovery  
dV/dt  
V
DD  
Re-applied  
voltage  
Body diode forward drop  
Ripple 5 %  
Inductor current  
I
SD  
* VGS = 5 V for logic level devices  
Fig. 14 - For N-Channel  
www.kersemi.com  
7

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