ISL55100BIRZ [INTERSIL]

Quad 18V Pin Electronics Driver/Window Comparator; 四路18V引脚电子驱动器/窗口比较器
ISL55100BIRZ
型号: ISL55100BIRZ
厂家: Intersil    Intersil
描述:

Quad 18V Pin Electronics Driver/Window Comparator
四路18V引脚电子驱动器/窗口比较器

驱动器 比较器 电子
文件: 总13页 (文件大小:494K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
ISL55100B  
®
Data Sheet  
March 17, 2006  
FN6229.0  
Quad 18V Pin Electronics Driver/Window  
Comparator  
Features  
• Low Driver Output Resistance  
- R Typical: 9.0  
The ISL55100B is a Quad pin driver and window comparator  
fabricated in a wide voltage CMOS process. It is designed  
specifically for Test During Burn In (TDBI) applications,  
where cost, functional density, and power are all at a  
premium.  
OUT  
• 18V I/O Range  
• 50MHz Operation  
• 4 Channel Driver/Receiver Pairs with Per Pin Flexibility  
• Dual Level - Per Pin - Input Thresholds  
• Differential or Single Ended Digital Inputs  
• User Defined Comparator Output Levels  
• Low Channel to Channel Timing Skew  
• Small Footprint (72 Ld QFN)  
This IC incorporates four channels of programmable drivers  
and window comparators into a small 72 Ld QFN package.  
Each channel has independent driver levels, data, and high  
impedance control. Each receiver has dual comparators  
which provide high and low threshold levels.  
The ISL55100B uses differential mode digital inputs, and can  
therefore mate directly with LVDS or CML outputs. Single  
ended logic families are handled by connecting one of the  
digital input pins to an appropriate threshold voltage (e.g.,  
1.4V for TTL compatibility). The comparator outputs are  
single ended, and the output levels are user defined to mate  
directly with any digital technology.  
• Pb-Free Plus Anneal Available (RoHS Compliant)  
Applications  
• Burn In ATE  
• Wafer Level Flash Memory Test  
• LCD Panel Test  
• Low Cost ATE  
The 18V driver output and receiver input ranges allow this  
device to interface directly with TTL, ECL, CMOS (3V, 5V,  
and 7V), LVCMOS, and custom level circuitry, as well as the  
high voltage (Super Voltage) level required for many special  
test modes for Flash Devices.  
• Instrumentation  
• Emulation  
Functional Block Diagram  
QUAD - WIDE RANGE, LOW ROUT, TRI-STATEABLE - DRIVERS  
• Device Programmers  
VH(0-3)  
Ordering Information  
DATA+(0-3)  
DATA-(0-3)  
DOUT(0-3)  
VL(0-3)  
+
-
TEMP.  
PART  
PART  
RANGE  
(°C)  
PKG.  
NUMBER  
MARKING  
PACKAGE DWG. #  
DRVEN+(0-3)  
DRVEN-(0-3)  
+
-
ISL55100BIRZ ISL55100BIRZ -40 to +85 72 Ld QFN L72.10x10  
(See Note)  
(Pb-free)  
Add “-T” suffix for tape and reel.  
NOTE: Intersil Pb-free plus anneal products employ special Pb-free  
material sets; molding compounds/die attach materials and 100%  
matte tin plate termination finish, which are RoHS compliant and  
compatible with both SnPb and Pb-free soldering operations. Intersil  
Pb-free products are MSL classified at Pb-free peak reflow  
temperatures that meet or exceed the Pb-free requirements of  
IPC/JEDEC J STD-020.  
QUAD - DUAL LEVEL COMPARATOR - RECEIVERS  
V
CC  
COMP HIGH  
QA(0-3)  
CVA(0-3)  
VINP(0-3)  
COMP LOW  
V
V
EE  
CC  
COMP HIGH  
QB(0-3)  
COMP LOW  
CVB(0-3)  
V
EE  
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures.  
1
1-888-INTERSIL or 1-888-468-3774 | Intersil (and design) is a registered trademark of Intersil Americas Inc.  
Copyright Intersil Americas Inc. 2006. All Rights Reserved  
All other trademarks mentioned are the property of their respective owners.  
ISL55100B  
Pinout  
ISL55100B (QFN)  
TOP VIEW  
72 71 70 69 68 67 66 65 64 63 62 61 60 59 58 57 56 55  
DATA+ 0  
DATA- 0  
QA 1  
V
EXT  
1
2
54  
53  
52  
51  
50  
49  
48  
47  
46  
45  
44  
43  
42  
41  
VH 0  
DOUT 0  
NC  
3
QB 1  
4
DRV EN+ 1  
DRV EN- 1  
VL 0  
5
VH 1  
6
DATA+ 1  
DATA- 1  
QA 2  
DOUT 1  
NC  
7
8
VL 1  
9
QB 2  
DRV EN+ 2  
DRV EN- 2  
DATA+ 2  
VH 2  
DOUT 2  
NC  
10  
11  
12  
13  
14  
VL 2  
DATA- 2  
VH 3  
QA 3  
QB 3  
DOUT 3  
NC  
15  
16  
17  
18  
40  
39  
38  
37  
DRV EN+ 3  
DRV EN- 3  
VL 3  
LOSWING  
19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36  
FN6229.0  
2
March 17, 2006  
ISL55100B  
Pin Descriptions  
PIN  
FUNCTION  
DATA+(0:3) Positive differential digital input that determines the driver output state when it is enabled.  
DATA-(0:3) Negative differential digital input that determines the driver output state when it is enabled.  
DRV EN+(0:3) Positive differential digital input that enables or disables the corresponding driver.  
DRV EN-(0:3) Negative differential digital input that enables or disables the corresponding driver.  
QA (0:3)  
QB (0:3)  
Comparator digital outputs. QA(X) is high when VINP(X) exceeds CVA(X).  
Comparator digital outputs. QB(X) is high when VINP(X) exceeds CVB(X).  
DOUT (0:3) Driver outputs.  
VINP (0:3)  
VH (0:3)  
VL (0:3)  
NC  
Comparator inputs.  
Unbuffered analog inputs that set each individual driver’s “high” voltage level.  
Unbuffered analog inputs that set each individual driver’s “low” voltage level. VL must be a lower voltage than VH.  
No internal connection.  
CVA (0:3)  
CVB (0:3)  
COMP HI  
COMP LO  
Analog inputs that set the threshold for the corresponding channel’s A comparators.  
Analog inputs that set the threshold for the corresponding channel’s B comparators.  
Supply voltage, unbuffered input that sets the high output level of all comparators. Must be greater than COMP LO.  
Supply voltage, unbuffered input that sets the low output level of all comparators. Must be less than COMP HI.  
Positive power supply (5% tolerance).  
V
CC  
V
Negative power supply (5% tolerance).  
EE  
V
External 5.5VDC power supply (-0%+5% tolerance, referenced to V , NOT GND) for internal logic. Connect pin to V when  
EE EE  
EXT  
not using an external supply.  
LOSWING  
Input that selects driver output configurations optimized to yield minimum overshoots for low level swings (VH < V +5V), or  
EE  
to select high  
optimized for large output swings. Connect LOSWING to V to select low swing circuitry, or connect it to V  
EE  
CC  
swing circuitry.  
Truth Tables  
RECEIVERS  
DRIVERS  
INPUT  
OUTPUTS  
INPUTS  
OUTPUT  
DOUT  
Hi - Z  
VH  
VINP  
QA  
0
QB  
0
DATA  
DRV EN  
+ > -  
<CVA  
<CVA  
>CVA  
>CVA  
<CVB  
X
+ > -  
>CVB  
<CVB  
>CVB  
0
1
+ < -  
1
0
+ < -  
+ < -  
VL  
1
1
X = DON’T CARE  
FN6229.0  
March 17, 2006  
3
ISL55100B  
Absolute Maximum Ratings  
Thermal Information  
Thermal Resistance (Typical, Note 1)  
72 Ld QFN Package. . . . . . . . . . . . . . .  
Maximum Junction Temperature (Plastic Package) . . . . . . . 150°C  
Maximum Storage Temperature Range. . . . . . . . . . .-65°C to 150°C  
Maximum Lead Temperature (Soldering 10s) . . . . . . . . . . . . 300°C  
V
to V  
EXT  
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . -0.5V to 19V  
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . -0.5V to 7V  
EE  
θ
JA  
(°C/W)  
23  
θ
JC  
(°C/W)  
2.0  
CC  
EE  
V
to V  
Input Voltages  
DATA, DRV EN, CVX, VH, VL, VINP, COMPX, LOSWING  
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . (V -0.5V) to (V  
EE  
+0.5V)  
+0.5V)  
CC  
Output Voltages  
DOUT . . . . . . . . . . . . . . . . . . . . . . . . (V -0.5V) to (V  
EE  
CC  
QX . . . . . . . . . . . . . (COMP LOW -0.5V) to (COMP HIGH +0.5V)  
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation of the  
device at these or any other conditions above those indicated in the operational sections of this specification is not implied.  
NOTE:  
1. θ is measured in free air with the component mounted on high effective thermal conductivity test board with “direct attach” features. See Tech  
JA  
Brief TB379 and Tech Brief TB389 for details. Device temperature is closely tied to data-rates, driver loads and overall pin activity. Review Power  
Dissipation Considerations for more information.  
Recommended Operating Conditions  
PARAMETER  
SYMBOL  
MIN  
TYP  
MAX  
18  
UNITS  
Device Power-(V  
= V  
V
not used  
V
-V  
12 (Note 5)  
9 (Note 5)  
5.5 (Note 5)  
15  
V
V
EXT  
EXT  
EE) EXT  
= V +5.5V)  
CC EE  
Device Power-(V  
V
-V  
15  
18  
EE  
CC EE  
V
Optional External Logic Power  
V
-V  
5.75  
6.0  
V
EXT  
EXT EE  
Driver Output High Rail  
Driver Output Low Rail  
Comparator Output High Rail  
Comparator Output Low Rail  
Ambient Temperature  
V
V
+1  
EE  
-
-
-
-
-
-
V
V
-0.5  
CC  
V
H
V
V
+0.5  
EE  
V
+6  
V
L
EE  
COMP-High  
COMP-Low  
V
+1  
EE  
-0.5  
V
CC  
V
+.5  
EE  
V
+6  
V
EE  
T
-40  
-
+85  
°C  
°C  
A
Junction Temperature  
T
+150  
J
Electrical Specifications Test Conditions: V = 12V, V = -3V, VH = 6V, VL = 0V, Comp-High = 5V, Comp Low = 0V, V = V and  
EXT EE  
CC  
CC,  
SYMBOL  
EE  
LOSWING = V  
25°C; Unless Otherwise specified.  
PARAMETER  
TEST CONDITIONS  
MIN  
TYP  
MAX  
UNITS  
DRIVER DC CHARACTERISTICS  
ISL55100B Output Resistance  
ISL55100B DC Output Current  
R
I
= ±125mA, data not toggling  
O
6
±125  
-
9
-
14  
-
OUTD  
Iout D  
Per Individual driver  
mA  
mA  
mV  
µA  
ISL55100B AC Output Current (Note 2) IOUTDAC Per Individual driver  
600  
-
-
ISL55100A Minimum Output Swing  
Disabled HIZ Leakage Current  
V
V
= 200mV, V = 0V  
185  
-1  
-
OMIN  
HIZ  
H
L
V
V
= V  
with V = V + V or  
0
1
OUT  
OUT  
CC  
H
L
EE  
CC  
= VEE with V = V = V  
H
L
DRIVER TIMING CHARACTERISTICS  
Data± to DOUT Propagation Delay  
t
Lowswing Disabled (Note 4)  
Lowswing Enabled (Note 4)  
5
6
12  
13  
<1  
18  
16  
17  
-
ns  
ns  
ns  
ns  
PD  
Driver Timing Skew, All Edges (Note 2)  
Disable (HIZ) Time  
-
t
DVREN± Transition from Enable to  
Disable  
15  
26  
DIS  
Enable Time  
t
DVREN± Transition from Disable to  
13  
13  
15  
18  
23  
23  
ns  
ns  
EN  
Enable: Lowswing Disabled (Note 4)  
DVREN± Transition from Disable to  
Enable: Lowswing Enabled (Note 4)  
FN6229.0  
4
March 17, 2006  
ISL55100B  
Electrical Specifications Test Conditions: V = 12V, V = -3V, VH = 6V, VL = 0V, Comp-High = 5V, Comp Low = 0V, V = V and  
EXT EE  
CC  
EE  
LOSWING = V  
25°C; Unless Otherwise specified. (Continued)  
CC,  
SYMBOL  
PARAMETER  
TEST CONDITIONS  
100pF Load V = 0.4V (20% - 80%)  
MIN  
TYP  
2.5  
2.5  
3.0  
3.5  
3.5  
9
MAX  
UNITS  
ns  
ISL55100B Rise/Fall Times (Note 2)  
t , t  
-
-
-
-
-
-
-
-
-
-
-
-
-
R
F
V = 1V (20% - 80%)  
V = 5V (10% - 90%)  
V = 10V (10% - 90%)  
V = 14V (10% - 90%)  
ns  
-
ns  
-
ns  
-
ns  
ISL55100B Rise/Fall Times (Note 2)  
t , t  
1000pF Load V = 1V (20% - 80%)  
V = 5V (10% - 90%)  
-
ns  
R
F
-
11  
ns  
V = 10V (10% - 90%)  
-
14  
ns  
ISL55100B Maximum Toggle Frequency FMAXD No Load, 50% Symmetry  
50  
-
65  
MHz  
ns  
ISL55100B Min Driver Pulse Width  
t
Standard Load, 1K/100pF  
7.7  
WIDD  
OS  
ISL55100B Overshoot Lowswing Mode  
(Note 2)  
Lowswing Enabled, (VH-VL<2v)  
-
20mV+  
10% of  
output  
swing  
%+V  
RECEIVER DC CHARACTERISTICS  
Input Offset Voltage  
V
CVA = CVB = 1.5V  
-200  
-
-
200  
30  
mV  
nA  
OS  
Input Bias Current  
I
V
- CV = ±5V  
(A/B)  
10  
25  
BIAS  
INP  
Output Resistance  
RoutR  
18  
35  
RECEIVER TIMING CHARACTERISTICS  
Propagation Delay  
t
7
50  
-
12  
65  
18  
-
ns  
MHz  
ns  
PP  
Maximum Operating Frequency  
Min Pulse Width  
F
Under No Load, PWOUT Symmetry 50%  
MAXR  
WIDR  
t
7.7  
<1  
-
Rcvr Channel to Channel Skew (Note 2)  
DIGITAL INPUTS  
-
-
ns  
Differential Input High Voltage  
Differential Input Low Voltage  
Input Current  
V
V
V
V
V
V
- V  
- V  
200  
-
-
-
-
mV  
mV  
nA  
V
DIFFH  
DIG+  
DIG+  
IN  
DIG-  
DIG-  
V
-200  
50  
DIFFL  
I
= V  
or V  
EE  
-50  
0
IN  
CC  
Common Mode Input Voltage Range  
V
not greater than V  
-0.2 Volts  
V
-5V  
CM  
DIFFL  
DIFFH  
DIFFH  
CC  
not less than V  
+0.2 Volts  
V
+0.2V  
-
-
V
DIFFL  
EE  
POWER SUPPLIES, DRIVER/RECEIVER STATIC CONDITIONS V  
EXT  
= V  
EXTERNAL LOGIC POWER OPTION NOT USED. (Note 6)  
EE,  
Positive Supply Current  
I
V
V
= V = 12V, V = V = -3V,  
EE  
EXT  
-
-85  
-
65  
-65  
<1  
85  
mA  
mA  
mA  
CC  
CC  
H
L
= V , Outputs Unloaded  
EE  
Negative Supply Current  
I
V
V
= V = 12V, V = V = -3V,  
EE  
-
EE  
CC  
H
L
= V , Outputs Unloaded  
EE  
EXT  
V
Supply Current  
I
V
V
= V = 12, V = V = -3V,  
-
EXT  
EXT  
CC  
H
EE  
L
= V , Outputs Unloaded  
EE  
EXT  
FN6229.0  
5
March 17, 2006  
ISL55100B  
Electrical Specifications Test Conditions: V = 12V, V = -3V, VH = 6V, VL = 0V, Comp-High = 5V, Comp Low = 0V, V = V and  
EXT EE  
CC  
EE  
LOSWING = V  
25°C; Unless Otherwise specified. (Continued)  
CC,  
SYMBOL  
POWER SUPPLIES, DRIVER/RECEIVER STATIC CONDITIONS V  
PARAMETER  
TEST CONDITIONS  
MIN  
TYP  
MAX  
UNITS  
= V + 5.5V, EXTERNAL LOGIC POWER OPTION USED. (Note 7)  
EE  
EXT  
Positive Supply Current  
I
V
V
= V = 12V, V = V = -3V,  
-
-50  
-
35  
-35  
25  
50  
mA  
mA  
mA  
CC  
CC  
H
EE  
L
= V +5.5V, Outputs Unloaded  
EXT  
EE  
Negative Supply Current  
I
V
V
= V = 12V, V = V = -3V,  
CC H EE L  
-
EE  
= V +5.5V, Outputs Unloaded  
EE  
EXT  
V
Supply Current  
I
V
V
= V = 12, V = V = -3V,  
40  
EXT  
EXT  
CC  
H
EE  
L
= V + 5.5V, Outputs Unloaded  
EE  
EXT  
NOTES:  
2. Lab characterization, room temp, Timing Parameters Matched Stimulus/Loads, Channel to Channel Skew < 500ps, 1ns Max by design.  
3. Measured across 100pF/1K lump sum load + 15pF PCB/Scope Probe. Cap and Resistor Surface Mount/Stacked ~0.5inch from Pin.  
4. To Enable LOWSWING, connect LOWSWING to V and keep VH < V +5. To disable LOWSWING, connect it to V  
EE EE  
CC.  
5. When V  
is connected to V (External Device Power not used) then the Minimum V -V is 12V. When V  
EE CC EE  
is connected to an external  
EXT  
EXT  
5.5V supply, then the minimum V -V voltage is 9.0V.  
CC EE  
6. I  
& I values are based on static conditions and will increase with pattern rates. I  
CC EE  
& I reach 400-500mA at maximum data rates (provided  
CC EE  
sufficient device cooling is employed). These currents can be reduced by 1) Reducing the V -V operating voltage 2) Utilizing the V  
CC EE  
EXT  
option.  
7. When using V  
= 5.5V, current requirements of the V  
input can approach 100mA at maximum pattern rates.  
EXT  
EXT  
Test Circuits and Waveforms  
VH  
VL  
DATA+  
DATA-  
(NOTE 3)  
V
O
DRV EN+  
DOUT  
100pF  
1k  
DRV EN-  
FIGURE 1. DRIVER SWITCHING TEST CIRCUIT  
DATA = 0  
DATA = 1  
400mV  
0V  
DATA-  
DATA+  
t
t
PDLH  
PDHL  
V
(V )  
OH  
OL  
H
50%  
50%  
V
O
V
(V )  
L
t
t
R
F
FIGURE 2. DRIVER PROPAGATION DELAY AND TRANSITION TIME MEASUREMENT POINTS  
FN6229.0  
6
March 17, 2006  
ISL55100B  
Test Circuits and Waveforms (Continued)  
DIS  
EN  
400mV  
DRV EN-  
DRV EN+  
0V  
t
t
DISL  
ENH  
V
REF  
V
O
1V  
2V  
(FOR DATA = 0)  
10%  
V
(V )  
L
OL  
OH  
t
t
DISH  
ENL  
V
(V )  
H
90%  
V
O
(FOR DATA = 1)  
V
REF  
FIGURE 3. DRIVER ENABLE AND DISABLE TIME MEASUREMENT POINTS  
COMP HI  
CVA  
-
QA  
+
5V  
VINP  
+
-
QB  
CVB  
COMP LO  
FIGURE 4. RECEIVER SWITCHING TEST CIRCUIT  
500mV  
VINP  
0V  
0V  
-500mV  
t
t
PDLH  
PDHL  
V
(5V)  
(0V)  
OH  
OL  
50%  
50%  
QX  
V
FIGURE 5. RECEIVER PROPAGATION DELAY MEASUREMENT POINTS  
Receiver Features  
Application Information  
The receivers are four independent window comparators that  
feature high output current capability, and user defined high  
and low output levels to interface with a wide variety of logic  
families. Each receiver, comprises two comparators and each  
comparator has an independent threshold level input, making  
it easy to implement window comparator functions. The CVA  
and CVB pins set the threshold levels of the A and B  
The ISL55100B provides Quad pin drivers and Quad dual  
level comparator receivers in a small footprint. The four  
channels may be used as bidirectional or split channels.  
Drivers have per channel level, data, and high impedance  
controls, while comparators have per channel high and low  
threshold levels.  
FN6229.0  
7
March 17, 2006  
ISL55100B  
comparators respectively. COMP HIGH and COMP LOW set  
Logic Inputs  
all the comparator output levels, and COMP HIGH must be  
more positive than COMP LOW. These two inputs are  
unbuffered supply pins, so the sources driving these pins  
must provide adequate current for the expected load. COMP  
HIGH and COMP LOW typically connect to the power  
supplies of the logic device driven by the comparator outputs.  
The truth table for the receivers is given on page 3. Receiver  
outputs cannot be placed in a HIZ state, and do not  
incorporate any on-chip short circuit current protection.  
Momentary short circuits to GND, or any supply voltage, won’t  
cause permanent damage, but care must be taken to avoid  
longer duration short circuits. If tolerable to the application,  
current limiting resistors can be inserted in series with the  
QA(0-3) and QB(0-3) outputs to protect the receiver outputs  
from damage due to overcurrent conditions.  
The ISL55100B uses differential mode digital inputs, and can  
therefore mate directly with LVDS or CML outputs. Single  
ended logic families are handled by connecting one of the  
digital input pins to an appropriate threshold voltage (e.g.,  
1.4V for TTL compatibility).  
LOSWING Circuit Option  
The drivers include switchable circuitry that is optimized for  
either low (VH-VL < 3V) or high output swings. Configuring  
the part is accomplished via the LOSWING pin. Connecting  
LOSWING to V selects the circuits optimized for low  
EE  
overshoots at low swing operation. Connecting the pin to  
V
enables the large signal circuitry. (See Figure 6)  
CC  
With LOSWING = V , the low swing circuitry activates  
EE  
whenever VH < V + 5V. Set LOSWING = V only if the  
EE  
EE  
output swing (VH-VL) is less than 3V, and better than 10%  
overshoots are required.  
Driver Features  
The drivers are single ended outputs featuring a wide  
voltage range, an output stage capable of delivering 125mA  
while providing a low out resistance and HIZ capability. The  
driver output can be toggled to drive one of two user defined  
output levels High (VH) or Low (VL).  
For the best small ( low swing) signal performance, the  
VH/VL common mode voltage [(VH + VL)/2] must be V  
+
EE  
1.5V. So if V = 0V, and the desired swing is 500mV, set  
EE  
VH = 1.75V, and VL = 1.25V.  
Driver and Receiver Overload Protection  
Driver waveforms are greatly affected by load  
characteristics. The ISL55100B actually double bonds the  
VH(0-3) and VL(0-3) supply pins for each channel. The  
Driver Output Pins (DOUT(0-3)) are triple bonded. Multiple  
bond wires help reduce the effects of Inductance between  
the IC Die (Wafer) and the packaging. Also the QFN style of  
packaging reduces inductance over other types of  
packaging.  
The ISL55100 is designed to provide minimum and balanced  
Driver ROUT. Great care should be taken when making use  
of the ISL55100B low ROUT drivers as there is no internal  
protection. There is no short circuit protection built into either  
the driver or the receiver/comparator outputs. Also there are  
no junction temperature monitors or thermal shutdown  
features.  
The driver or receiver outputs may be damaged by more  
than a momentary short circuit directly to any low impedance  
voltage. Driver Protection can be obtained with a 50Series  
Termination Resistor that is properly rated.  
While the inductance of a bond wire might seem  
insignificant, it can reduce high-frequency waveform fidelity.  
So this should be borne in mind when doing PCB layout and  
DUT interconnect. Lead lengths should be kept as short as  
possible, maintaining as much decoupling on the drive rails  
as possible and make sure scope measurements are made  
properly. Often the inductance of a scope probe ground can  
be the actual cause of the waveform distortion.  
External Logic Supply Option (V  
EXT  
)
Connection of the V  
Pin to a 5.5V DC Source  
EXT  
(Referenced to V ) will reduce the V -V current drain.  
EE CC EE  
Current drain is directly proportional to Data Rate. This  
option will help with Power Supply/Dissipation should heat  
distribution become an issue.  
VH and VL (Driver Output Rails)  
Sets of VH and VL pins are designated for each Driver.  
These are unbuffered analog inputs that determine the Drive  
High (VH) and Drive Low (VL) Voltages that the drivers will  
deliver. These inputs are double bonded to reduce  
inductance and decrease AC Impedance.  
Power Supply Bypassing and Printed Circuit  
Board Layout  
As with any high frequency device, good printed circuit  
board layout is necessary for optimum performance. Ground  
plane construction is highly recommended, lead lengths  
should be as short as possible, and the power supply pins  
must be well bypassed to reduce the risk of oscillation. For  
Each VH and VL should be decoupled with 4.7µF and 0.1µF  
capacitors to ground. If all four Driver VH/VLs are bussed,  
then one 4.7µF can be used. Layouts should also  
accommodate the placement of capacitance “across” VH  
and VL. So in addition to decoupling the VH/VL pins to  
ground, they are also decoupled to each other.  
normal single supply operation, where the V pin is  
EE  
connected to ground, one 0.1µF ceramic capacitor should be  
placed from the V  
pin to ground. A 4.7µF tantalum  
CC  
capacitor should then be connected from the V  
pin to  
CC  
ground. This same capacitor combination should be placed  
at each supply pin to ground if split supplies are to be used.  
FN6229.0  
8
March 17, 2006  
ISL55100B  
especially true if the users applications require continuous,  
high speed operation.  
Power Dissipation Considerations  
Specifying continuous data rates, driver loads and driver  
level amplitudes are key in determining power supply  
requirements as well as dissipation/cooling necessities.  
Driver Output patterns also impact these needs. The faster  
the pin activity, the greater the need to supply current and  
remove heat.  
The reader is cautioned agains t as s uming the s ame  
level of thermal performance in actual applications . A  
careful ins pection of conditions in your application  
s hould be conducted. Great care mus t be taken to  
ens ure Die Temperature does not exceed 150°C Abs olute  
Maximum Thermal Limits .  
Figures 16 and 17 address power consumption relative to  
frequency of operation. These graphs are based on Driving  
Important Note: The ISL55100B package metal plane is  
used for heat sinking of the device. It is electrically  
6.0/0.0V Out into a 1kload. Theta J for the device  
A
package is 23.0, 16.6 and 14.9°C/W based on Airflows of 0,  
1 and 2.5 meters per second. Device mounted per Note 1  
under Thermal Information. With the high speed data rate  
capability of the ISL55100B, it is possible to exceed the  
150°C “absolute-maximum junction temperature” as  
operating conditions and frequencies increase. Therefore, it  
is important to calculate the maximum junction temperature  
for the application to determine if operating conditions need  
to be modified for the device to remain in the safe operating  
area.  
connected to the negative supply potential (V ). If V  
EE  
EE  
is tied to ground, the thermal pad can be connected to  
ground. Otherwise, the thermal pad (V ) must be  
EE  
isolated from other power planes.  
Power Supply Sequencing  
The ISL55100B references every supply with respect to  
VEE. Therefore apply VEE, then VCC followed by the VH,VL  
busses, then the COMP High and Comp Low followed by the  
CVA & CVB Supplies. Digital Inputs should be set with a  
differential bias as soon as possible. In cases where V  
is  
EXT  
The maximum power dissipation allowed in a package is  
determined according to:  
being utilized (V  
= V + 5.5v), it should be powered up  
EXT  
EE  
immediately after V . Basically, no pin should be biased  
CC  
or below V .  
EE  
T
- T  
AMAX  
above V  
JMAX  
CC  
P
= --------------------------------------------  
DMAX  
Θ
JA  
Data Rates  
Please note that the Frequency - MHz in Figures 16 and 17  
contain two transitions within each period. A digital  
application that requires a new test pattern every 50ns would  
be running at a 20MHz Data Rate. Figure 18 reveals 100ns  
period, in 10MHz frequency parlance, results in two 50ns  
digital patterns.  
where:  
• T  
• T  
= Maximum junction temperature  
= Maximum ambient temperature  
JMAX  
AMAX  
θ = Thermal resistance of the package  
JA  
• P  
DMAX  
= Maximum power dissipation in the package  
The maximum power dissipation actually produced by an IC  
is the total quiescent supply current times the total power  
supply voltage, plus the power in the IC due to the loads.  
Power also depends on number of channels changing state,  
frequency of operation. The extent of continuous active  
pattern generation/reception will greatly effect dissipation  
requirements.  
The power dissipation curves (Figure 16), provide a way to  
see if the device will overheat. The maximum safe power  
temperature vs operating frequency can be found  
graphically in Figure 17. This graph is based on the package  
type Theta J ratings and actual current/wattage  
A
requirements of the ISL55100B when driving a 1K load with  
a 6V High Level and a 0V Low Rail. The temperatures are  
indicated as calculated junction temperature over the  
ambient temperature of the user’s system. Plots indicate  
temperature change as operating frequency increases. (The  
graph assumes continuous operation.) The user should  
evaluate various heat sink/cooling options in order to control  
the ambient temperature part of the equation. This is  
FN6229.0  
9
March 17, 2006  
ISL55100B  
Typical Performance Curves Device installed on Intersil ISL55100B Evaluation Board.  
VCC 12.0 DH 6.0  
VEE - 3.0 DL 0.0  
VCC 12.0 DH 6.0  
VEE - 3.0 DL 0.0  
0
Data In  
680pF  
/Lowswing Off  
/Lowswing On  
1k100pF  
0
0
2200pF  
0
1000pF  
10ns/DIV  
10ns/DIV  
FIGURE 7. DRIVER WAVEFORMS UNDER VARIOUS LOADS  
FIGURE 6. LOWSWING EFFECTS ON DRIVER SHAPE AND  
T
(100pF-1K LOAD)  
Tristate/Data/Dout Timing  
DRVEN  
PD  
10.0  
VH (6.00 Volts) Rout : Driver sources 125mA  
0
0
Data In  
5.0  
VL (0.0V Volts) Rout : Driver sinks 125mA  
Driver Out  
0
0.0  
12  
13  
14  
15  
16  
17  
18  
VCC-VEE VOLTS (VEE -3.0 Fixed)  
20ns/DIV  
FIGURE 9. R  
vs DEVICE VOLTAGE  
FIGURE 8. DATA/HIZ/DRIVER OUT TIMING  
OUT  
20.0  
18.0  
16.0  
14.0  
12.0  
10.0  
8.0  
8.0  
VH (1V-15V) Rout : Driver sources 125mA  
7.2  
6.4  
5.6  
4.8  
4.0  
3.2  
2.4  
1.6  
0.8  
0.0  
2200pF  
1000pF  
680pF  
VL (0.0V Fixed) Rout : Driver sinks 125mA  
1k100pF  
6.0  
4.0  
2.0  
0.0  
1
2
3
4
5
6
7
8
9
10 11 12 13 14 15  
1
2
3
4
5
6
7
8
9
10 11 12 13 14  
VH VOLTS (VL = 0.0)  
VH VOLTS (VL = 0.0)  
FIGURE 11. PROPAGATION DELAY vs VH RAIL, VARIOUS  
FIGURE 10. R  
vs VH RAIL  
OUT  
LOADS  
FN6229.0  
March 17, 2006  
10  
ISL55100B  
Typical Performance Curves Device installed on Intersil ISL55100B Evaluation Board. (Continued)  
20.0  
18.0  
16.0  
14.0  
12.0  
10.0  
8.0  
45.0  
40.5  
36.0  
31.5  
27.0  
22.5  
18.0  
13.5  
9.0  
2200pF  
Driver TPD .. No Load  
1000pF  
680pF  
Comparator TPD .. No Load  
6.0  
4.0  
1k100pF  
2.0  
4.5  
0.0  
0.0  
11  
12  
13  
14  
15  
16  
17  
18  
19  
1
2
3
4
5
6
7
8
9
10 11 12 13 14  
VCC-VEE (VEE = -3.0)  
VH VOLTS (VL = 0.0)  
FIGURE 13. DRIVER & RECEIVER TPD VARIANCE vs V  
FIGURE 12. DRIVER FALL TIME vs VH RAIL, VARIOUS LOADS  
CC  
35.0  
31.5  
100  
90  
80  
70  
60  
50  
28.0  
24.5  
21.0  
17.5  
14.0  
10.5  
7.0  
2200pF  
1000pF  
ICC STATIC CONDITIONS  
40  
680pF  
30  
20  
10  
0
3.5  
1k100pF  
0.0  
1
2
3
4
5
6
7
8
9
10 11 12 13 14  
11  
12  
13  
14  
15  
16  
17  
18  
19  
VH VOLTS (VL = 0.0)  
V
-V (V = -3.0)  
CC EE EE  
FIGURE 14. DRIVER RISE TIME vs VH RAIL, VARIOUS LOADS  
FIGURE 15. STATIC I  
CC  
vs V  
CC  
AIRFLOW LEGEND A = 0m/s : B = 1.0m/s : C = 2.5m/s  
10.0  
9.0  
150  
135  
120  
105  
90  
A
A
B
C
8.0  
12V V  
CC  
B
C
12V V  
CC  
7.0  
6.0  
5.0  
4.0  
3.0  
2.0  
1.0  
0.0  
18V V  
CC  
A
B
C
75  
18V V  
CC  
60  
45  
30  
9V V  
& V  
= 5.5V  
EXT  
9V V  
& V  
= 5.5V  
EXT  
CC  
CC  
15  
0
5
10 15 20 25 30 35 40 45 50 55 60  
FREQUENCY (MHz)  
5
10 15 20 25 30 35 40 45 50 55 60  
FREQUENCY (MHz)  
FIGURE 17. CALCULATED JUNCTION TEMP ABOVE  
FIGURE 16. DEVICE POWER DISSIPATION WITH  
-V = 18, 12 & 9.0 (V = 5.5V) VOLTS. All  
AMBIENT WITH V -V = 18, 12 & 9.0  
V
CC EE  
= 5.5V) VOLTS. ALL FOUR PINS MAKING  
CC EE  
EXT  
(V  
FOUR PINS MAKING TWO TRANSITIONS PER  
PERIOD  
EXT  
TWO TRANSITIONS PER PERIOD  
FN6229.0  
11  
March 17, 2006  
ISL55100B  
Typical Performance Curves Device installed on Intersil ISL55100B Evaluation Board. (Continued)  
VCC 12.0 DH 6.0  
VEE - 3.0 DL 0.0  
VCC 12.0 DH 6.0  
VEE - 3.0 DL 0.0  
0
0
0
10ns/DIV  
FIGURE 18. FREQUENCY OF 10MHz = 50ns PATTERN RATE  
FIGURE 19. MINIMUM PULSE WIDTH VH 6/8/10V  
FN6229.0  
March 17, 2006  
12  
ISL55100B  
Quad Flat No-Lead Plas tic Package (QFN)  
Micro Lead Frame Plas tic Package (MLFP)  
L72.10x10  
72 LEAD QUAD FLAT NO-LEAD PLASTIC PACKAGE  
MILLIMETERS  
SYMBOL  
MIN  
NOMINAL  
0.90  
MAX  
1.00  
0.05  
1.00  
NOTES  
A
A1  
A2  
A3  
b
0.80  
-
-
-
0.02  
-
0.65  
9
0.20 REF  
0.25  
9
0.18  
5.85  
5.85  
0.30  
6.15  
6.15  
5, 8  
D
10.00 BSC  
9.75 BSC  
6.00  
-
D1  
D2  
E
9
7, 8  
10.00 BSC  
9.75 BSC  
6.00  
-
E1  
E2  
e
9
7, 8  
0.50 BSC  
-
-
k
0.20  
0.30  
-
-
L
0.40  
0.50  
8, 10  
N
72  
2
Nd  
Ne  
P
18  
3
18  
3
-
-
-
0.60  
12  
9
θ
-
9
Rev. 1 11/04  
NOTES:  
1. Dimensioning and tolerancing conform to ASME Y14.5-1994.  
2. N is the number of terminals.  
3. Nd and Ne refer to the number of terminals on each D and E.  
4. All dimensions are in millimeters. Angles are in degrees.  
5. Dimension b applies to the metallized terminal and is measured  
between 0.15mm and 0.30mm from the terminal tip.  
6. The configuration of the pin #1 identifier is optional, but must be  
located within the zone indicated. The pin #1 identifier may be  
either a mold or mark feature.  
7. Dimensions D2 and E2 are for the exposed pads which provide  
improved electrical and thermal performance.  
8. Nominal dimensionsare provided toassistwith PCBLandPattern  
Design efforts, see Intersil Technical Brief TB389.  
9. Features and dimensions A2, A3, D1, E1, P & θ are present when  
Anvil singulation method is used and not present for saw  
singulation.  
10. Compliant to JEDEC MO-220VNND-3 except for the "L" min  
dimension.  
All Intersil U.S. products are manufactured, assembled and tested utilizing ISO9000 quality systems.  
Intersil Corporation’s quality certifications can be viewed at www.intersil.com/design/quality  
Intersil products are sold by description only. Intersil Corporation reserves the right to make changes in circuit design, software and/or specifications at any time without  
notice. Accordingly, the reader is cautioned to verify that data sheets are current before placing orders. Information furnished by Intersil is believed to be accurate and  
reliable. However, no responsibility is assumed by Intersil or its subsidiaries for its use; nor for any infringements of patents or other rights of third parties which may result  
from its use. No license is granted by implication or otherwise under any patent or patent rights of Intersil or its subsidiaries.  
For information regarding Intersil Corporation and its products, see www.intersil.com  
FN6229.0  
13  
March 17, 2006  

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