HA-5101883 [INTERSIL]

Low Noise, High Performance Operational Amplifier; 低噪声,高性能运算放大器
HA-5101883
型号: HA-5101883
厂家: Intersil    Intersil
描述:

Low Noise, High Performance Operational Amplifier
低噪声,高性能运算放大器

运算放大器
文件: 总16页 (文件大小:1176K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
HA-5101/883  
®
Data Sheet  
August 17, 2005  
FN3931.1  
Low Noise, High Performance Operational  
Amplifier  
The HA-5101/883 is a dielectrically isolated operational  
amplifier featuring low noise and high performance. This  
amplifier has an excellent noise voltage density of  
4.5nV/Hz (max) at 1kHz. The unity gain stable  
HA-5101/883 yields a 10MHz unity gain bandwidth and a  
6V/µs slew rate.  
Features  
• This Circuit is Processed in Accordance to MIL-STD-883  
and is Fully Conformant Under the Provisions of  
Paragraph 1.2.1.  
• Low Noise Voltage @ 1kHz . . . . . . . . . . . 4.5nV/Hz Max  
• Low Noise Current @ 1kHz . . . . . . . . . . . . . 3pA/Hz Max  
• Wide Unity Gain Bandwidth . . . . . . . . . . . . . . . 10MHz Min  
DC characteristics of the HA-5101/883 assure accurate  
performance. The 3mV (max) offset voltage is externally  
adjustable and offset voltage drift is just 3µV/°C. Low bias  
currents (200nA max) reduce input current errors and the  
high open loop voltage gain of 100kV/V, over temperature,  
increases the loop gain for low distortion amplification.  
• High Gain (Full Temp) . . . . . . . . . . . . . . . . . .100kV/V Min  
(Room Temp) . . . . . . . . . . . . . . . . . 1MV/V Typ  
• Slew Rate. . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6V/µs Min  
• High CMRR/PSRR (Full Temp) . . . . . . . . . . . . . 80dB Min  
• High Output Drive Capability (Full Temp). . . . . . . . . 25mA  
The HA-5101/883 is ideal for audio applications, especially  
low-level signal amplifiers such as microphone, tape head  
and preamplifiers. Additionally, it is well suited for low  
distortion oscillators, low noise function generators and high  
Q filters.  
Applications  
• High Quality Audio Preamplifiers  
• High Q Active Filters  
• Low Noise Function Generators  
• Low Distortion Oscillators  
• Low Noise Comparators  
Ordering Information  
TEMP.  
PKG.  
PART NUMBER RANGE (°C)  
PACKAGE  
DWG. #  
HA7-5101/883  
-55 to 125 8 Ld CerDIP  
F8.3A  
5962-89636012A  
-55 to 125 20 Ld Ceramic LCC J20.A  
Pinouts  
HA7-5101/883 (CERDIP)  
5962-896360 (CLCC)  
TOP VIEW  
TOP VIEW  
3
2
1
20 19  
BAL  
-IN  
1
2
3
4
8
7
6
5
NC  
NC  
V+  
18  
17  
NC  
-IN  
4
5
6
7
8
V+  
-
+
-
16 NC  
NC  
+IN  
NC  
OUT  
+IN  
V-  
+
15 OUT  
BAL  
NC  
14  
9
10 11 12 13  
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures.  
1-888-INTERSIL or 1-888-468-3774 | Intersil (and design) is a registered trademark of Intersil Americas Inc.  
Copyright © Intersil Americas Inc. 1994, 2005. All Rights Reserved  
1
All other trademarks mentioned are the property of their respective owners.  
HA-5101/883  
Absolute Maximum Ratings  
Thermal Information  
Voltage Between V+ and V- Terminals . . . . . . . . . . . . . . . . . . . 40V  
Differential Input Voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7V  
Voltage at Either Input Terminal . . . . . . . . . . . . . . . . . . . . . V+ to V-  
Input Current . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 25mA  
Output Short Circuit Duration. . . . . . . . . . . . . . . . . . . . . . . Indefinite  
Thermal Resistance  
Ceramic DIP Package . . . . . . . . . . . . .  
Ceramic LCC Package. . . . . . . . . . . . .  
Package Power Dissipation Limit at +75°C for T +175°C  
Ceramic DIP Package . . . . . . . . . . . . . . . . . . . . . . . . . . . . .1.22W  
Ceramic LCC Package. . . . . . . . . . . . . . . . . . . . . . . . . . . . .1.35W  
Package Power Dissipation Derating Factor Above +75°C  
θ
(°C/W)  
120  
86  
θ
(°C/W)  
30  
26  
JA  
JC  
J
Junction Temperature (T ). . . . . . . . . . . . . . . . . . . . . . . . . . .+175°C  
J
Storage Temperature Range . . . . . . . . . . . . . . . . . .-65°C to +150°C  
ESD Rating . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .<2000V  
Lead Temperature (Soldering 10s) . . . . . . . . . . . . . . . . . . . .+300°C  
Ceramic DIP Package . . . . . . . . . . . . . . . . . . . . . . . . .12.2mW/°C  
Ceramic LCC Package. . . . . . . . . . . . . . . . . . . . . . . . .13.5mW/°C  
Operating Conditions  
Operating Temperature Range . . . . . . . . . . . . . . . -55°C to +125°C  
Operating Supply Voltage . . . . . . . . . . . . . . . . . . . . . . . ±5V to ±15V  
V
R
1/2 (V+ - V-)  
INcm  
500Ω  
L
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation of the  
device at these or any other conditions above those indicated in the operational sections of this specification is not implied.  
TABLE 1. D.C. ELECTRICAL PERFORMANCE CHARACTERISTICS  
Device Tested at: V = ±15V, R = 100Ω, R = 500kΩ, V  
= 0V, Unless Otherwise Specified  
S
S
L
OUT  
LIMITS  
GROUP A  
PARAMETER  
Input Offset Voltage  
SYMBOL  
TEST CONDITIONS  
SUBGROUP TEMP (°C)  
MIN  
MAX  
3
UNITS  
mV  
V
V
V
= 0V  
1
+25  
-3  
-4  
IO  
CM  
CM  
2, 3  
1
+125, -55  
+25  
4
mV  
Input Bias Current  
+I  
= 0V  
-200  
-325  
200  
325  
nA  
B
+R = 100kΩ  
S
2, 3  
+125, -55  
nA  
-RS = 100Ω  
-I  
V
= 0V  
1
+25  
-200  
-325  
200  
325  
nA  
nA  
B
CM  
S
+R = 100Ω  
2, 3  
+125, -55  
-RS = 100kΩ  
Input Offset Current  
I
V
= 0V  
CM  
S
1
+25  
-75  
75  
nA  
nA  
IO  
+R = 100kΩ  
2, 3  
+125, -55  
-125  
125  
-RS = 100kΩ  
Common Mode Range  
+CMR  
-CMR  
V+ = 3V  
1
2, 3  
1
+25  
+125, -55  
+25  
12  
12  
-
-
V
V
V- = -27V  
-
V+ = 27V  
V- = -3V  
-12  
V
2, 3  
4
+125, -55  
+25  
-
-12  
V
Large Signal Voltage Gain  
+A  
VOL  
V
R
= 0V and +10V  
100  
100  
100  
100  
80  
80  
-
-
-
-
-
-
kV/V  
kV/V  
kV/V  
kV/V  
dB  
OUT  
L
= 2kΩ  
5, 6  
4
+125, -55  
+25  
-A  
VOL  
V
R
= 0V and 10V  
OUT  
L
= 2kΩ  
5, 6  
1
+125, -55  
+25  
Common Mode Rejection Ratio  
+CMRR  
-CMRR  
V  
= +10V  
CM  
V+ =+5V  
V- = -25V  
2, 3  
+125, -55  
dB  
V
= -10V  
OUT  
V  
= -10V  
1
+25  
80  
80  
-
-
dB  
dB  
CM  
V+ = +25V  
V- = -5V  
2, 3  
+125, -55  
V
= +10V  
OUT  
FN3931.1  
2
August 17, 2005  
HA-5101/883  
TABLE 1. D.C. ELECTRICAL PERFORMANCE CHARACTERISTICS (Continued)  
Device Tested at: V = ±15V, R = 100Ω, R = 500kΩ, V  
= 0V, Unless Otherwise Specified  
S
S
L
OUT  
LIMITS  
GROUP A  
PARAMETER  
SYMBOL  
TEST CONDITIONS  
= 2kΩ  
SUBGROUP TEMP (°C)  
MIN  
MAX  
UNITS  
V
Output Voltage Swing  
+V  
R
R
1
2, 3  
1
+25  
+125, -55  
+25  
12  
12  
-
-
OUT1  
L
L
-
-12  
-12  
-
V
-V  
= 2kΩ  
V
OUT1  
2, 3  
1
+125, -55  
+25  
-
V
+V  
V
= ±18V  
= 600Ω  
15  
15  
-
V
OUT2  
S
R
L
2, 3  
1
+125, -55  
+25  
-
V
-V  
V
= ±18V  
= 600Ω  
-15  
-15  
-
V
OUT2  
S
R
L
2, 3  
1
+125, -55  
+25  
-
V
Output Current  
+I  
V
V
= -15V  
= +15V  
= 0V  
25  
25  
-
mA  
mA  
mA  
mA  
mA  
mA  
mA  
mA  
dB  
dB  
OUT  
OUT  
= ±18V  
S
2, 3  
1
+125, -55  
+25  
-
-I  
V
V
-25  
-25  
6
OUT  
OUT  
= ±18V  
S
2, 3  
1
+125, -55  
+25  
-
Quiescent Power Supply Current  
Power Supply Rejection Ratio  
+I  
V
I
-
CC  
OUT  
OUT  
= 0mA  
2, 3  
1
+125, -55  
+25  
-
6
-I  
V
I
= 0V  
-6  
-6  
80  
80  
-
CC  
OUT  
= 0mA  
OUT  
2, 3  
1
+125, -55  
+25  
-
+PSRR  
-PSRR  
V = 10V  
-
S
V+ = +10V, V- = -15V  
V+ = +20V, V- = -15V  
2, 3  
+125, -55  
-
V = 10V  
1
+25  
80  
80  
-
-
dB  
dB  
S
V+ = +15V, V- = -10V  
V+ = +15V, V- = -20V  
2, 3  
+125, -55  
Offset Voltage Adjustment  
+V Adj  
IO  
Note 4  
1
+25  
V
V
-1  
-
-
-
-
mV  
mV  
mV  
mV  
IO  
R
= 2k, C = 50pF  
L
L
2, 3  
1
+125, -55  
+25  
-1  
IO  
A
= +1V/V  
V
-V Adj  
IO  
V
V
+1  
+1  
IO  
IO  
2, 3  
+125, -55  
TABLE 2. A.C. ELECTRICAL PERFORMANCE CHARACTERISTICS  
Device Tested at: V = ±15V, R = 50Ω, R = 2kΩ, C = 50pF, A  
= +1V/V, Unless Otherwise Specified  
S
S
L
L
VCL  
LIMITS  
GROUP A  
PARAMETER  
SYMBOL  
+SR  
TEST CONDITIONS  
= -3V to +3V  
SUBGROUP TEMP (°C)  
MIN  
MAX  
-
UNITS  
V/µs  
V/µs  
ns  
Slew Rate  
V
V
V
4
4
+25  
+25  
6
6
-
OUT  
OUT  
OUT  
-SR  
= +3V to -3V  
-
Rise and Fall Time  
Overshoot  
t
= 0V to +200mV  
4
+25  
200  
400  
200  
400  
35  
R
10% t 90%  
R
5, 6  
4
+125, -55  
+25  
-
ns  
t
V
= 0V to -200mV  
-
ns  
F
OUT  
10% t 90%  
F
5, 6  
4
+125, -55  
+25  
-
ns  
+OS  
-OS  
V
V
= 0V to +200mV  
-
%
OUT  
OUT  
5, 6  
4
+125, -55  
+25  
-
35  
%
= 0V to -200mV  
-
35  
%
5, 6  
+125, -55  
-
35  
%
FN3931.1  
3
August 17, 2005  
HA-5101/883  
TABLE 3. ELECTRICAL PERFORMANCE CHARACTERISTICS  
Device Characterized at: V = ±15V, R = 2kΩ, C = 50pF, A = +1, Unless Otherwise Specified  
S
L
L
V
LIMITS  
PARAMETER  
Differential Input Resistance  
Low Frequency Peak-to-Peak Noise  
Input Noise Voltage Density  
Input Noise Current Density  
Unity Gain Bandwidth  
SYMBOL  
TEST CONDITIONS  
NOTES  
TEMP (°C)  
+25  
MIN  
MAX  
UNITS  
R
V
= 0V  
CM  
1
1
250  
-
0.2  
4.5  
3
kΩ  
IN  
E
0.1Hz to 10Hz  
+25  
-
-
µV  
P-P  
nP-P  
E
R
R
V
= 20, f = 1000Hz  
1
+25  
nV/Hz  
pA/Hz  
MHz  
kHz  
n
S
o
I
= 2M, f = 1000Hz  
1
+25  
-
n
S
o
UGBW  
FPBW  
CLSG  
= 100mV  
= 10V  
1
+25  
10  
95  
+1  
-
-
O
Full Power Bandwidth  
V
1, 2  
1
+25  
-
PEAK  
Minimum Closed Loop Stable Gain  
Output Resistance  
-55 to +125  
+25  
-
V/V  
R
Open Loop  
= 0V, I  
1
150  
180  
OUT  
PC  
Quiescent Power Consumption  
NOTES:  
V
= 0mA  
OUT  
1, 3  
-55 to +125  
-
mW  
OUT  
1. Parameters listed in Table 3 are controlled via design or process parameters and are not directly tested at final production. These parameters  
are lab characterized upon initial design release, or upon design changes. These parameters are guaranteed by characterization based upon  
data from multiple production runs which reflect lot to lot and within lot variation.  
2. Full Power Bandwidth guarantee based on Slew Rate measurement using FPBW = Slew Rate/(2πV  
).  
PEAK  
3. Quiescent Power Consumption based upon Quiescent Supply Current test maximum. (No load on outputs.)  
4. Offset adjustment range is [V ±1mV] minimum referred to output. This test is for functionality only to assure adjustment through 0V.  
IO (Measured)  
TABLE 4. ELECTRICAL TEST REQUIREMENTS  
MIL-STD-883 TEST REQUIREMENTS SUBGROUPS (SEE TABLES 1 & 2)  
Interim Electrical Parameters (Pre Burn-in)  
Final Electrical Test Parameters  
Group A Test Requirements  
1
1*, 2, 3, 4, 5, 6  
1, 2, 3, 4, 5, 6  
1
Groups C & D Endpoints  
*PDA applies to Subgroup 1 only.  
FN3931.1  
4
August 17, 2005  
HA-5101/883  
t
t
F
R
t
t
F
R
FN3931.1  
5
August 17, 2005  
HA-5101/883  
Burn-in Circuits  
CERAMIC MINI-DIP  
1
2
3
4
8
V+  
7
-
+
D
1
6
C
C
3
1
V-  
5
D
C
R
1
2
2
CERAMIC LCC  
NOTES:  
R
C
C
D
= 1M, ±5%, 1/4W (Min)  
1
1
3
1
= C = 0.01µF/Socket (Min) or 0.1µF/Row, (Min)  
2
= 0.01µF/Socket, 10%  
= D = 1N4002 or Equivalent/Board  
2
(V+) - (V-)= 30V  
FN3931.1  
6
August 17, 2005  
HA-5101/883  
Schematic  
-IN  
+IN  
D
D
2
1
V+  
R
R
R
Q
R
R
25  
23  
R
60  
26  
28  
24  
Q
Q
26  
47  
23  
Q
Q
Q
28  
24  
Q
Q
16  
25  
Q
Q
Q
L2  
L1  
L41  
R
R
34  
35  
Q
Q
14  
15  
Q
45  
R
R
37  
36  
Q
43  
8
R
15  
Q
Q
37  
36  
Q
Q
Q
Q
1B  
2A  
2B  
30  
OUTPUT  
Q
Q
Q
46  
44  
29  
R
22  
Q
38  
Q
1A  
Q
35  
8
Q
R
41  
13  
17A  
Q
Q
33  
32  
Q
42  
Q
31  
Q
Q
22  
Q
21  
17  
Q
19B  
R
20  
C
1
Q
Q
Q
5
6
20  
Q
10  
Q
19A  
Q
Q
7
Q
4
C
Q
2
Q
Q
3
11  
27  
Q
9
Q
12  
R
Q
58  
34  
Q
Q
18  
8
R
3A  
3.65K  
R
4A  
Q
Q
49  
50  
3.65K  
Q
Q
39  
48  
51  
R
R
R
4B  
18  
V-  
38  
830  
R
R
R
R
12  
19A  
R
27  
11  
10  
830  
R
19B  
BAL  
BAL  
FN3931.1  
August 17, 2005  
7
HA-5101/883  
Die Characteris tics  
DIE DIMENSIONS  
70 X 70 X 19 mils ±1mil  
1790 x 1780 x 483µm ±25.4µm  
METALLIZATION  
Type: AI, 1% Cu  
Thickness: 16kÅ ±2kÅ  
GLASSIVATION  
Type: Nitride (Si3N4) over Silox (SiO2, 5% Phos.)  
Silox Thickness: 12kÅ ±2kÅ  
Nitride Thickness: 3.5kÅ ±1.5kÅ  
WORST CASE CURRENT DENSITY:  
5
2
1.38 x 10 A/cm  
SUBSTRATE POTENTIAL (Powered Up): V-  
TRANSISTOR COUNT: 54  
PROCESS: Bipolar Dielectric Isolation  
Metallization Mas k Layout  
HA-5101/883  
BAL  
NC  
-IN  
V+  
OUT  
BAL  
+IN  
V-  
FN3931.1  
8
August 17, 2005  
HA-5101/883  
Ceramic Dual-In-Line Frit Seal Packages (CERDIP)  
c1 LEAD FINISH  
F8.3A MIL-STD-1835 GDIP1-T8 (D-4, CONFIGURATION A)  
8 LEAD CERAMIC DUAL-IN-LINE FRIT SEAL PACKAGE  
-D-  
E
-A-  
INCHES MILLIMETERS  
MIN  
-
BASE  
(c)  
METAL  
SYMBOL  
MAX  
0.200  
0.026  
0.023  
0.065  
0.045  
0.018  
0.015  
0.405  
0.310  
MIN  
-
MAX  
5.08  
0.66  
0.58  
1.65  
1.14  
0.46  
0.38  
10.29  
7.87  
NOTES  
b1  
A
b
-
M
M
0.014  
0.014  
0.045  
0.023  
0.008  
0.008  
-
0.36  
0.36  
1.14  
0.58  
0.20  
0.20  
-
2
-B-  
(b)  
b1  
b2  
b3  
c
3
SECTION A-A  
bbb  
C A - B  
D
D
S
S
S
-
4
BASE  
Q
PLANE  
A
2
-C-  
SEATING  
PLANE  
c1  
D
3
L
α
5
S1  
b2  
eA  
A A  
e
E
0.220  
5.59  
5
b
C A - B  
eA/2  
C A - B  
c
e
0.100 BSC  
2.54 BSC  
-
eA  
eA/2  
L
0.300 BSC  
0.150 BSC  
7.62 BSC  
3.81 BSC  
-
ccc  
D
aaa  
D
S
M
S
S
M
S
-
NOTES:  
0.125  
0.200  
0.060  
-
3.18  
5.08  
1.52  
-
-
1. Index area: A notch or a pin one identification mark shall be  
located adjacent to pin one and shall be located within the  
Q
0.015  
0.005  
0.38  
0.13  
6
shaded area shown. The manufacturer’s identification shall not  
be used as a pin one identification mark.  
S1  
7
o
o
o
o
90  
105  
90  
105  
-
α
aaa  
bbb  
ccc  
M
2. The maximum limits of lead dimensions b and c or M shall be  
measured at the centroid of the finished lead surfaces, when  
solder dip or tin plate lead finish is applied.  
-
-
-
-
0.015  
0.030  
0.010  
0.0015  
-
-
-
-
0.38  
0.76  
0.25  
0.038  
-
-
3. Dimensions b1 and c1 apply to lead base metal only. Dimension  
-
M applies to lead plating and finish thickness.  
2, 3  
8
4. Corner leads (1, N, N/2, and N/2+1) may be configured with a  
partial lead paddle. For this configuration dimension b3 replaces  
dimension b2.  
N
8
8
Rev. 0 4/94  
5. This dimension allows for off-center lid, meniscus, and glass  
overrun.  
6. Dimension Q shall be measured from the seating plane to the  
base plane.  
7. Measure dimension S1 at all four corners.  
8. N is the maximum number of terminal positions.  
9. Dimensioning and tolerancing per ANSI Y14.5M - 1982.  
10. Controlling dimension: INCH  
FN3931.1  
9
August 17, 2005  
HA-5101/883  
Ceramic Leadles s Chip Carrier Packages (CLCC)  
J20.A MIL-STD-1835 CQCC1-N20 (C-2)  
20 PAD CERAMIC LEADLESS CHIP CARRIER PACKAGE  
0.010 S E H S  
D
INCHES MILLIMETERS  
D3  
SYMBOL  
A
MIN  
MAX  
0.100  
0.088  
-
MIN  
1.52  
1.27  
-
MAX  
2.54  
2.23  
-
NOTES  
o
j x 45  
0.060  
0.050  
-
6, 7  
-
-
A1  
B
B1  
B2  
B3  
D
0.022  
0.028  
0.56  
0.71  
2, 4  
-
0.072 REF  
1.83 REF  
E3  
E
B
0.006  
0.022  
0.15  
0.56  
-
0.342  
0.358  
8.69  
9.09  
-
D1  
D2  
D3  
E
0.200 BSC  
0.100 BSC  
5.08 BSC  
2.54 BSC  
-
-
o
h x 45  
-
0.358  
-
9.09  
2
-
0.010 S E F S  
A1  
0.342  
0.358  
8.69  
9.09  
E1  
E2  
E3  
e
0.200 BSC  
0.100 BSC  
0.358  
0.050 BSC  
0.015  
5.08 BSC  
2.54 BSC  
9.09  
1.27 BSC  
0.38  
1.02 REF  
0.51 REF  
-
A
-
2
-
PLANE 2  
PLANE 1  
-
-
-E-  
e1  
h
j
-
-
2
5
5
-
0.040 REF  
0.020 REF  
0.007 M E F S H S  
L
0.045  
0.055  
0.055  
0.095  
0.015  
1.14  
1.14  
1.91  
0.08  
1.40  
1.40  
2.41  
0.38  
L1  
L2  
L3  
ND  
NE  
N
0.045  
0.075  
0.003  
-
-
B1  
e
L3  
L
-H-  
-
5
5
5
5
3
3
3
20  
20  
Rev. 0 5/18/94  
-F-  
NOTES:  
B3  
L1  
E1  
1. Metallized castellations shall be connected to plane 1 terminals  
and extend toward plane 2 across at least two layers of ceramic  
or completely across all of the ceramic layers to make electrical  
connection with the optional plane 2 terminals.  
2. Unless otherwise specified, a minimum clearance of 0.015 inch  
(0.38mm) shall be maintained between all metallized features  
(e.g., lid, castellations, terminals, thermal pads, etc.)  
L2  
E2  
B2  
3. Symbol “N” is the maximum number of terminals. Symbols “ND”  
and “NE” are the number of terminals along the sides of length  
“D” and “E”, respectively.  
D2  
D1  
e1  
4. The required plane 1 terminals and optional plane 2 terminals (if  
used) shall be electrically connected.  
5. The corner shape (square, notch, radius, etc.) may vary at the  
manufacturer’s option, from that shown on the drawing.  
6. Chip carriers shall be constructed of a minimum of two ceramic  
layers.  
7. Dimension “A” controls the overall package thickness. The  
maximum “A” dimension is package height before being solder  
dipped.  
8. Dimensioning and tolerancing per ANSI Y14.5M-1982.  
9. Controlling dimension: INCH.  
FN3931.1  
10  
August 17, 2005  
HA-5101  
®
Data Sheet  
August 17, 2005  
FN3931.1  
DESIGN INFORMATION  
The information contained on the following pages has been developed through characterization by Intersil Semiconductor and is  
for use as application and design information only. No guarantee is implied.  
Typical Performance Curves Unless Otherwise Specified: V = ±15V, T = +25°C  
S
A
8
7
1500  
1000  
6
5
VOLTAGE  
CURRENT  
4
3
2
500  
0
1
0
10  
100  
1K  
FREQUENCY (Hz)  
10K  
100K  
-50  
-25  
0
25  
50  
75  
100  
125  
TEMPERATURE (°C)  
FIGURE 1. NOISE SPECTRUM  
FIGURE 2. OFFSET VOLTAGE vs TEMPERATURE  
A
= 25,000, V = ±15V (12.89mV  
RTO or 0.52µV RTI)  
P-P  
V
S
P-P  
A
= 25,000, V = ±15V (0.09nV  
RTI)  
P-P  
V
S
PEAK-TO-PEAK TOTAL NOISE 0.1Hz TO 1MHz  
PEAK-TO-PEAK NOISE 0.1Hz TO 10Hz  
11  
HA-5101  
Typical Performance Curves Unless Otherwise Specified: V = ±15V, T = +25°C (Continued)  
S
A
20  
250  
200  
150  
100  
50  
0
-20  
-40  
-60  
0
-55  
-25  
0
25  
50  
75  
100  
125  
-55  
-25  
0
25  
50  
75  
100  
125  
TEMPERATURE (°C)  
TEMPERATURE (°C)  
FIGURE 4. INPUT BIAS CURRENT vs TEMPERATURE  
FIGURE 3. INPUT OFFSET CURRENT vs TEMPERATURE  
30  
20  
5
MAXIMUM  
4
MINIMUM  
10  
0
3
TYPICAL  
2
1
0
-10  
-20  
-30  
0
50 100 150 200 250 300 350 400 450 500  
TIME (s)  
0
2
4
6
8
10  
12  
14  
16  
18  
20  
SUPPLY VOLTAGE (±V)  
FIGURE 5. INPUT OFFSET WARMUP DRIFT vs TIME  
(NORMALIZED TO ZERO FINAL VALUE)  
(SIX REPRESENTATIVE UNITS)  
FIGURE 6. SUPPLY CURRENT vs SUPPLY VOLTAGE  
1.1  
1.1  
60  
D
RISE TIME  
50  
1.0  
1.0  
0.9  
0.8  
B
SLEW RATE  
40  
C
0.9  
0.8  
0.7  
30  
20  
10  
0
A
V
V
OUT  
IN  
A
B
C
D
+15mV  
-15mV  
+15mV  
-15mV  
±15V  
±15V  
0V  
0.7  
0.6  
R
= 2K, C = 50pF  
L
L
0V  
0.6  
-60 -40 -20  
0
20  
40  
60  
80  
100  
120  
140  
160  
0
20  
40  
60  
80 100 120  
TIME (s)  
TEMPERATURE (°C)  
FIGURE 7. SLEW RATE/RISE TIME vs TEMPERATURE  
FIGURE 8. SHORT CIRCUIT CURRENT vs TIME  
FN3931.1  
12  
August 17, 2005  
HA-5101  
Typical Performance Curves Unless Otherwise Specified: V = ±15V, T = +25°C (Continued)  
S
A
10M  
(140)  
V
ERROR  
1M  
(120)  
1mV  
100K  
(100)  
2.65µs  
10K  
(80)  
5
10  
15  
18  
TIME (1.5µs/DIV)  
SUPPLY VOLTAGE (±V)  
FIGURE 9. DC OPEN-LOOP VOLTAGE GAIN vs SUPPLY  
VOLTAGE  
FIGURE 10. SETTLING WAVEFORM  
6
3
40  
30  
20  
10  
0
A
= 100  
-55°C  
V
GAIN  
0
125°C  
A
= 10  
= 1  
V
-3  
-6  
GAIN  
-9  
A
0
V
-55°C  
PHASE  
-12  
-45  
-90  
125°C  
-10  
-20  
PHASE  
-135  
-180  
-225  
A
R
= 1V/V  
V
L
R
= 2K, C = 50pF  
= 2K, C = 50pF  
L
L
L
10K  
100K  
1M  
FREQUENCY (Hz)  
10M  
100M  
10K  
100K  
1M  
FREQUENCY (Hz)  
10M  
100M  
FIGURE 11. CLOSED LOOP GAIN AND PHASE AT HIGH AND  
LOW TEMPERATURES  
FIGURE 12. CLOSED-LOOP VOLTAGE GAIN vs FREQUENCY  
AT DIFFERENT CLOSED LOOP GAINS  
FN3931.1  
August 17, 2005  
13  
HA-5101  
Typical Performance Curves Unless Otherwise Specified: V = ±15V, T = +25°C (Continued)  
S
A
-40  
-60  
140  
120  
100  
-PSRR/CMRR  
+PSRR  
80  
60  
40  
GAIN  
-80  
0
45  
90  
20  
0
-100  
-120  
PHASE  
100  
135  
180  
10  
1K  
10K  
100K  
1M  
10M  
100M  
100  
1K  
10K  
FREQUENCY (Hz)  
100K  
1M  
FREQUENCY (Hz)  
FIGURE 13. OPEN-LOOP GAIN/PHASE vs FREQUENCY  
FIGURE 14. REJECTION RATIOS vs FREQUENCY  
Rise Time and Overshoot  
IN  
Timescale = 20ns/Div.  
V
= V = ±3V, A = +1, R = 2k, C = 50pF  
OUT V L L  
IN  
V
= V  
= 0V to +200mV, A = +1, R = 2K, C = 50pF  
OUT V L L  
Timescale = 500ns/Div., Scale: Input = 5V/Div, Output = 2V/Div  
FIGURE 15. SLEW RATE WAVEFORM  
FIGURE 16. SMALL SIGNAL WAVEFORM  
FN3931.1  
14  
August 17, 2005  
HA-5101  
Offs et Adjus tment  
The following is the recommended V adjust configuration:  
IO  
Applications Information  
Operation At ±5V Supply  
+15V  
The HA-5101 performs well at V = ±5V exhibiting typical  
S
characteristics as listed below:  
7
(NOTE)  
6
3
2
I
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3.7mA  
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0.5mV  
. . . . . . . . . . . . . . . . . . . . . . . . . . . . 56nA  
CC  
+
V
I
IO  
-
BIAS  
5
1
R
A
(V = ±3V) . . . . . . . . . . . . . . . . . . 106kV/V  
VOL  
O
4
P
V
I
. . . . . . . . . . . . . . . . . . . . . . . . . . . 3.7V  
OUT  
. . . . . . . . . . . . . . . . . . . . . . . . . . . . 13mA  
OUT  
(NOTE)  
R
= 100kΩ  
P
CMRR (V  
= ±2.5V) . . . . . . . . . . . . . 90dB  
= 0.5V). . . . . . . . . . . . . . . 90dB  
CM  
-15V  
PSRR (V  
CC  
Unity Gain Bandwidth . . . . . . . . . . . . . . 10MHz  
Slew Rate. . . . . . . . . . . . . . . . . . . . . . . . 7V/µs  
NOTE: Proper decoupling is always recommended, 0.1µF high quality  
capacitor should be at or very near the device’s supply pins.  
Input Protection  
The HA-5101 has built-in back-to-back protection diodes  
which will limit the differential input voltage to approximately  
7V. If the HA-5101 will be used in conditions where that volt-  
age may be exceeded, then current limiting resistors must  
be used. No more than 25mA should be allowed to flow in  
the HA-5101’s input.  
Comparator Circuit  
V+  
R
LIM  
2
7
-
6
V  
IN  
R
LIM  
+
3
Output Saturation  
When an op amp is overdriven, output devices can saturate  
and sometimes take a long time to recover. Saturation can  
be avoided (sometimes) by using circuits such as:  
4
V-  
(∆V MAX 7V)  
IN  
----------------------------------------------  
V+  
Choose R  
Such That:  
2R  
LIM  
LIM  
25mA  
R
1
2
R
+
-
R
R
3
4
IN  
V
SOURCE  
V-  
If saturation cannot be avoided the HA-5101 recovers from a  
25% overdrive in about 6.5µs (see photo).  
OUT  
Top: Input  
Bottom: Output, 5V/Div., 2µs/Div.  
Output is overdriven negative and recovers in 6µs.  
FN3931.1  
August 17, 2005  
15  
HA-5101  
TABLE 1. TYPICAL PERFORMANCE CHARACTERISTICS  
Device Characterized At: V = ±15V, R = 2kΩ, C = 50pF, A = +1V/V, Unless Otherwise Specified  
VCL  
S
L
L
PARAMETER  
Offset Voltage  
TEST CONDITIONS  
TEMP (°C)  
+25  
TYP  
0.8  
3
DESIGN LIMITS  
Table 1  
7
UNITS  
mV  
V
= 0V  
CM  
Offset Voltage Average Drift  
Offset Current Average Drift  
Input Bias Current  
Versus Temperature  
Versus Temperature  
-55 to +125  
-55 to +125  
+25  
µV/°C  
pA/°C  
nA  
100  
65  
250  
V
V
V
= 0V  
= 0V  
= 0V  
Table 1  
Table 1  
Table 3  
9
CM  
CM  
CM  
Input Offset Current  
+25  
35  
nA  
Differential Input Resistance  
Input Noise Voltage Density  
+25  
500  
5.4  
3.4  
3.2  
6
kΩ  
f
= 10Hz  
= 100Hz  
= 1kHz  
= 10Hz  
= 100Hz  
= 1kHz  
+25  
nV/Hz  
nV/Hz  
nV/Hz  
pA/Hz  
pA/Hz  
pA/Hz  
V/V  
o
f
+25  
5.5  
o
f
+25  
Table 3  
20  
o
Input Noise Current Density  
Large Signal Voltage Gain  
f
+25  
o
f
+25  
1.5  
0.52  
400K  
1M  
1M  
10  
5
o
f
+25  
Table 3  
Table 1  
Table 1  
Table 1  
5.4  
o
V
= ±10V  
-55  
OUT  
+25  
V/V  
+125  
V/V  
Slew Rate  
V
V
V
V
= ±3V  
-55 to +125  
-55 to +125  
-55 to +125  
-55 to +125  
+25  
V/µs  
kHz  
OUT  
Full Power Bandwidth  
Rise and Fall Times  
Overshoot  
= 10V, (Note 2)  
159  
50  
85  
PEAK  
= ±200mV  
= ±200mV  
Table 2  
35  
ns  
OUT  
OUT  
20  
%
Settling Time  
To 0.1% for 10V Step  
To 0.01% for 10V Step  
4.5  
6
6
µs  
+25  
10  
µs  
Output Short Circuit Current  
Output Resistance  
t < 10s, V  
= ±15V  
+25  
±35  
110  
4.3  
±4  
±50  
mA  
OUT  
Open Loop  
+25  
Table 3  
Table 1  
±5  
Supply Current  
No Load  
+25  
mA  
Minimum Supply Voltage  
Functional Operation Only,  
Other Parameters Will Vary  
+25  
V
All Intersil U.S. products are manufactured, assembled and tested utilizing ISO9000 quality systems.  
Intersil Corporation’s quality certifications can be viewed at www.intersil.com/design/quality  
Intersil products are sold by description only. Intersil Corporation reserves the right to make changes in circuit design, software and/or specifications at any time without  
notice. Accordingly, the reader is cautioned to verify that data sheets are current before placing orders. Information furnished by Intersil is believed to be accurate and  
reliable. However, no responsibility is assumed by Intersil or its subsidiaries for its use; nor for any infringements of patents or other rights of third parties which may result  
from its use. No license is granted by implication or otherwise under any patent or patent rights of Intersil or its subsidiaries.  
For information regarding Intersil Corporation and its products, see www.intersil.com  
FN3931.1  
16  
August 17, 2005  

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