IRF8010LPBF [INFINEON]

HEXFET Power MOSFET; HEXFET功率MOSFET
IRF8010LPBF
型号: IRF8010LPBF
厂家: Infineon    Infineon
描述:

HEXFET Power MOSFET
HEXFET功率MOSFET

文件: 总10页 (文件大小:221K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
PD - 95433  
IRF8010SPbF  
SMPS MOSFET  
IRF8010LPbF  
Applications  
HEXFET® Power MOSFET  
l High frequency DC-DC converters  
l UPS and Motor Control  
l Lead-Free  
VDSS  
RDS(on) max  
ID  
80A  
‡
100V  
15mΩ  
Benefits  
l Low Gate-to-Drain Charge to Reduce  
Switching Losses  
l Fully Characterized Capacitance Including  
Effective COSS to Simplify Design, (See  
App. Note AN1001)  
l Fully Characterized Avalanche Voltage  
and Current  
D2Pak  
IRF8010S  
TO-262  
IRF8010L  
l Typical RDS(on) = 12mΩ  
Absolute Maximum Ratings  
Parameter  
Max.  
80  
Units  
A
Continuous Drain Current, VGS @ 10V  
Continuous Drain Current, VGS @ 10V  
Pulsed Drain Current  
I
I
I
@ T = 25°C  
C
D
D
@ T = 100°C  
C
57  
320  
260  
DM  
P
@T = 25°C  
Power Dissipation  
C
W
D
Linear Derating Factor  
Gate-to-Source Voltage  
1.8  
W/°C  
V
V
± 20  
GS  
dv/dt  
T
J
Peak Diode Recovery dv/dt  
Operating Junction and  
16  
V/ns  
-55 to + 175  
T
Storage Temperature Range  
°C  
STG  
Soldering Temperature, for 10 seconds  
300 (1.6mm from case )  
Thermal Resistance  
Parameter  
Typ.  
–––  
Max.  
0.57  
0.80  
–––  
Units  
RθJC  
RθJC  
RθCS  
RθJA  
Junction-to-Case  
Junction-to-Case (end of life)  
–––  
°C/W  
Case-to-Sink, Flat, Greased Surface  
0.50  
–––  
Junction-to-Ambient (PCB Mount, steady state)  
40  
Notes  through ˆ are on page 8  
www.irf.com  
1
06/21/04  
IRF8010S/LPbF  
Static @ TJ = 25°C (unless otherwise specified)  
Parameter  
Min. Typ. Max. Units  
Conditions  
V(BR)DSS  
Drain-to-Source Breakdown Voltage  
100  
–––  
0.11  
12  
–––  
V
VGS = 0V, ID = 250µA  
V(BR)DSS/ TJ  
Breakdown Voltage Temp. Coefficient –––  
––– V/°C Reference to 25°C, ID = 1mA  
mΩ  
RDS(on)  
VGS(th)  
IDSS  
Static Drain-to-Source On-Resistance  
Gate Threshold Voltage  
–––  
2.0  
15  
4.0  
V
GS = 10V, ID = 45A  
VDS = VGS, ID = 250µA  
µA VDS = 100V, VGS = 0V  
–––  
–––  
–––  
–––  
–––  
V
Drain-to-Source Leakage Current  
–––  
–––  
–––  
–––  
20  
250  
200  
-200  
VDS = 100V, VGS = 0V, TJ = 125°C  
IGSS  
Gate-to-Source Forward Leakage  
Gate-to-Source Reverse Leakage  
nA VGS = 20V  
VGS = -20V  
Dynamic @ TJ = 25°C (unless otherwise specified)  
Parameter  
Forward Transconductance  
Total Gate Charge  
Min. Typ. Max. Units  
Conditions  
gfs  
82  
–––  
81  
–––  
120  
–––  
–––  
–––  
–––  
–––  
–––  
V
VDS = 25V, ID = 45A  
ID = 80A  
Qg  
–––  
–––  
–––  
–––  
–––  
–––  
–––  
Qgs  
Qgd  
td(on)  
tr  
Gate-to-Source Charge  
Gate-to-Drain ("Miller") Charge  
Turn-On Delay Time  
Rise Time  
22  
nC  
VDS = 80V  
26  
VGS = 10V  
VDD = 50V  
ID = 80A  
15  
130  
61  
td(off)  
tf  
RG = 39  
Turn-Off Delay Time  
Fall Time  
ns  
120  
VGS = 10V  
VGS = 0V  
VDS = 25V  
Ciss  
Coss  
Crss  
Coss  
Coss  
Coss eff.  
Input Capacitance  
––– 3830 –––  
Output Capacitance  
Reverse Transfer Capacitance  
Output Capacitance  
Output Capacitance  
Effective Output Capacitance  
–––  
–––  
480  
59  
–––  
–––  
pF ƒ = 1.0MHz  
––– 3830 –––  
V
GS = 0V, VDS = 1.0V, ƒ = 1.0MHz  
–––  
–––  
280  
530  
–––  
–––  
VGS = 0V, VDS = 80V, ƒ = 1.0MHz  
VGS = 0V, VDS = 0V to 80V  
Avalanche Characteristics  
Parameter  
Single Pulse Avalanche Energy  
Typ.  
–––  
–––  
–––  
Max.  
310  
45  
Units  
mJ  
A
EAS  
IAR  
Avalanche Current  
Repetitive Avalanche Energy  
EAR  
26  
mJ  
Diode Characteristics  
Parameter  
Min. Typ. Max. Units  
Conditions  
D
I
I
Continuous Source Current  
–––  
–––  
80  
MOSFET symbol  
S
(Body Diode)  
Pulsed Source Current  
A
showing the  
integral reverse  
G
–––  
–––  
320  
SM  
S
(Body Diode)  
p-n junction diode.  
V
t
Diode Forward Voltage  
–––  
–––  
–––  
–––  
99  
1.3  
150  
700  
V
T = 25°C, I = 80A, V = 0V  
J S GS  
SD  
Reverse Recovery Time  
Reverse RecoveryCharge  
Forward Turn-On Time  
ns T = 150°C, I = 80A, VDD = 50V  
J F  
rr  
di/dt = 100A/µs  
Q
t
460  
nC  
rr  
Intrinsic turn-on time is negligible (turn-on is dominated by LS+LD)  
on  
2
www.irf.com  
IRF8010S/LPbF  
10000  
1000  
100  
10  
1000  
100  
10  
VGS  
15V  
12V  
VGS  
15V  
12V  
TOP  
TOP  
10V  
10V  
6.0V  
5.5V  
5.0V  
4.5V  
4.0V  
6.0V  
5.5V  
5.0V  
4.5V  
BOTTOM  
BOTTOM 4.0V  
4.0V  
4.0V  
1
20µs PULSE WIDTH  
Tj = 175°C  
20µs PULSE WIDTH  
Tj = 25°C  
1
0.1  
0.1  
1
10  
100  
0.1  
1
10  
100  
V
, Drain-to-Source Voltage (V)  
DS  
V
, Drain-to-Source Voltage (V)  
DS  
Fig 1. Typical Output Characteristics  
Fig 2. Typical Output Characteristics  
3.5  
1000  
80A  
=
I
D
T
= 175°C  
3.0  
2.5  
2.0  
1.5  
1.0  
0.5  
0.0  
J
100  
10  
1
T
= 25°C  
J
V
= 50V  
DS  
20µs PULSE WIDTH  
V
= 10V  
GS  
2.0  
4.0  
V
6.0  
8.0  
10.0  
12.0  
14.0  
16.0  
-60 -40 -20  
0
20 40 60 80 100 120 140 160 180  
°
T , Junction Temperature  
( C)  
, Gate-to-Source Voltage (V)  
J
GS  
Fig 3. Typical Transfer Characteristics  
Fig 4. Normalized On-Resistance  
Vs. Temperature  
www.irf.com  
3
IRF8010S/LPbF  
100000  
12  
10  
8
V
= 0V,  
f = 1 MHZ  
I = 80A  
GS  
D
C
= C + C , C SHORTED  
iss  
gs gd ds  
V
V
V
= 80V  
= 50V  
= 20V  
DS  
DS  
DS  
C
= C  
gd  
rss  
C
= C + C  
oss  
ds gd  
10000  
1000  
100  
C
iss  
6
C
oss  
4
2
C
rss  
0
10  
0
20  
40  
60  
80  
100  
1
10  
100  
Q
Total Gate Charge (nC)  
G
V
, Drain-to-Source Voltage (V)  
DS  
Fig 6. Typical Gate Charge Vs.  
Fig 5. Typical Capacitance Vs.  
Gate-to-Source Voltage  
Drain-to-Source Voltage  
1000  
100  
10  
10000  
1000  
100  
10  
OPERATION IN THIS AREA  
LIMITED BY R  
(on)  
DS  
°
T = 175  
J
C
100µsec  
1msec  
°
T = 25  
J
C
1
1
Tc = 25°C  
10msec  
Tj = 175°C  
Single Pulse  
V
= 0 V  
GS  
0.1  
0.1  
0.0  
0.5  
1.0  
1.5  
2.0  
1
10  
100  
1000  
V
,Source-to-Drain Voltage (V)  
SD  
V
, Drain-to-Source Voltage (V)  
DS  
Fig 8. Maximum Safe Operating Area  
Fig 7. Typical Source-Drain Diode  
Forward Voltage  
4
www.irf.com  
IRF8010S/LPbF  
RD  
80  
60  
40  
20  
0
VDS  
LIMITED BY PACKAGE  
VGS  
D.U.T.  
RG  
+VDD  
-
10V  
Pulse Width ≤ 1 µs  
Duty Factor ≤ 0.1 %  
Fig 10a. Switching Time Test Circuit  
V
DS  
90%  
25  
50  
75  
100  
125  
150  
175  
°
, Case Temperature ( C)  
T
C
10%  
V
GS  
t
t
r
t
t
f
Fig 9. Maximum Drain Current Vs.  
d(on)  
d(off)  
Case Temperature  
Fig 10b. Switching Time Waveforms  
10  
1
D = 0.50  
0.20  
P
DM  
0.1  
t
1
0.10  
0.05  
t
2
SINGLE PULSE  
0.02  
Notes:  
(THERMAL RESPONSE)  
0.01  
1. Duty factor D =  
t
/ t  
1
2
2. Peak T  
= P  
x
Z
+ T  
J
DM  
thJC  
C
0.01  
0.00001  
0.0001  
0.001  
0.01  
0.1  
1
t , Rectangular Pulse Duration (sec)  
1
Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Case  
www.irf.com  
5
IRF8010S/LPbF  
600  
500  
400  
300  
200  
100  
0
15V  
I
D
TOP  
18A  
32A  
45A  
DRIVER  
+
L
BOTTOM  
V
DS  
D.U.T  
AS  
R
G
V
DD  
-
I
A
20V  
0.01  
t
p
Fig 12a. Unclamped Inductive Test Circuit  
V
(BR)DSS  
t
p
25  
50  
75  
100  
125  
150  
175  
Starting Tj, Junction Temperature (°C)  
Fig 12c. Maximum Avalanche Energy  
Vs. Drain Current  
I
AS  
Fig 12b. Unclamped Inductive Waveforms  
Current Regulator  
Same Type as D.U.T.  
Q
G
50KΩ  
.2µF  
12V  
10 V  
.3µF  
Q
Q
GD  
GS  
+
V
DS  
D.U.T.  
-
V
GS  
V
G
3mA  
I
I
D
G
Charge  
Current Sampling Resistors  
Fig 13a. Basic Gate Charge Waveform  
Fig 13b. Gate Charge Test Circuit  
6
www.irf.com  
IRF8010S/LPbF  
Peak Diode Recovery dv/dt Test Circuit  
+
Circuit Layout Considerations  
Low Stray Inductance  
Ground Plane  
Low Leakage Inductance  
Current Transformer  
D.U.T  
ƒ
-
+
‚
-
„
-
+

RG  
dv/dt controlled by RG  
+
-
Driver same type as D.U.T.  
ISD controlled by Duty Factor "D"  
D.U.T. - Device Under Test  
VDD  
Driver Gate Drive  
P.W.  
P.W.  
Period  
Period  
D =  
V
=10V  
*
GS  
D.U.T. I Waveform  
SD  
Reverse  
Recovery  
Current  
Body Diode Forward  
Current  
di/dt  
D.U.T. V Waveform  
DS  
Diode Recovery  
dv/dt  
V
DD  
Re-Applied  
Voltage  
Body Diode  
Forward Drop  
Inductor Curent  
I
SD  
Ripple 5%  
* VGS = 5V for Logic Level Devices  
Fig 14. For N-Channel HEXFET® Power MOSFETs  
www.irf.com  
7
IRF8010S/LPbF  
D2Pak Package Outline  
Dimensions are shown in millimeters (inches)  
D2Pak Part Marking Information  
THIS IS AN IRF530S WITH  
LOT CODE 8024  
PART NUMBER  
INTERNATIONAL  
RECTIFIER  
LOGO  
AS S EMBLED ON WW 02, 2000  
IN THE ASSEMBLY LINE "L"  
F530S  
DAT E CODE  
YEAR 0 = 2000  
WEEK 02  
Note: "P" in ass embly line  
pos i ti on indi cates "L ead-F r ee"  
ASSEMBLY  
LOT CODE  
LINE L  
OR  
PART NUMBER  
INTERNATIONAL  
RECTIFIER  
LOGO  
F530S  
DAT E CODE  
P = DE S IGNAT E S L E AD-F RE E  
PRODUCT (OPTIONAL)  
YEAR 0 = 2000  
AS S E MB L Y  
LOT CODE  
WE E K 02  
A = AS S E MB L Y S IT E CODE  
8
www.irf.com  
IRF8010S/LPbF  
TO-262 Package Outline  
Dimensions are shown in millimeters (inches)  
TO-262 Part Marking Information  
EXAMPLE: T HIS IS AN IRL3103L  
LOT CODE 1789  
PART NUMBER  
INTERNATIONAL  
RECTIFIER  
LOGO  
ASSEMBLED ON WW 19, 1997  
IN THE ASSEMBLY LINE "C"  
DATE CODE  
YEAR 7 = 1997  
WEEK 19  
Note: "P" in as sembly line  
pos ition indicates "L ead-F ree"  
ASSEMBLY  
LOT CODE  
LINE C  
OR  
PART NUMBER  
INT ERNAT IONAL  
RECTIFIER  
LOGO  
DATE CODE  
P = DESIGNATES LEAD-FREE  
PRODUCT (OPTIONAL)  
YEAR 7 = 1997  
ASSEMBLY  
LOT CODE  
WEEK 19  
A = ASSEMBLYSITE CODE  
www.irf.com  
9
IRF8010S/LPbF  
D2Pak Tape & Reel Information  
Dimensions are shown in millimeters (inches)  
TRR  
1.60 (.063)  
1.50 (.059)  
1.60 (.063)  
1.50 (.059)  
4.10 (.161)  
3.90 (.153)  
0.368 (.0145)  
0.342 (.0135)  
FEED DIRECTION  
TRL  
11.60 (.457)  
11.40 (.449)  
1.85 (.073)  
1.65 (.065)  
24.30 (.957)  
23.90 (.941)  
15.42 (.609)  
15.22 (.601)  
1.75 (.069)  
1.25 (.049)  
10.90 (.429)  
10.70 (.421)  
4.72 (.136)  
4.52 (.178)  
16.10 (.634)  
15.90 (.626)  
FEED DIRECTION  
13.50 (.532)  
12.80 (.504)  
27.40 (1.079)  
23.90 (.941)  
4
330.00  
(14.173)  
MAX.  
60.00 (2.362)  
MIN.  
30.40 (1.197)  
MAX.  
NOTES :  
1. COMFORMS TO EIA-418.  
2. CONTROLLING DIMENSION: MILLIMETER.  
3. DIMENSION MEASURED @ HUB.  
26.40 (1.039)  
24.40 (.961)  
4
3
4. INCLUDES FLANGE DISTORTION @ OUTER EDGE.  
Notes:  
† Coss eff. is a fixed capacitance that gives the same  
 Repetitive rating; pulse width limited by max. junction  
temperature.  
charging time as Coss while VDS is rising from 0 to 80%  
‚ Starting TJ = 25°C, L = 0.31mH, RG = 25, IAS = 45A.  
ƒ ISD 45A, di/dt 110A/µs, VDD V(BR)DSS, TJ 175°C.  
„ Pulse width 300µs; duty cycle 2%.  
Rth(jc) (end of life) is the maximum measured value  
after 1000 temperature cycles from -55 to 150°C and  
is accounted for by the physical wearout of the die attach  
medium in worse case PCB mounting condition of  
material (solder/substrate), process and re-flow  
temperature.  
VDSS  
.
‡ Calculated continuous current based on maximum  
allowable junction temperature. Package limitation  
current is 75A.  
ˆ When mounted on 1" square PCB ( FR-4 or G-10  
Material ). For recommended footprint and soldering  
techniques refer to application note #AN-994.  
Data and specifications subject to change without notice.  
This product has been designed and qualified for the Industrial market.  
Qualification Standards can be found on IR’s Web site.  
IR WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, USA Tel: (310) 252-7105  
TAC Fax: (310) 252-7903  
Visit us at www.irf.com for sales contact information.06/04  
10  
www.irf.com  

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