IRF7815 [INFINEON]
150V 单个 N 通道 HEXFET Power MOSFET, 采用 SO-8 封装;型号: | IRF7815 |
厂家: | Infineon |
描述: | 150V 单个 N 通道 HEXFET Power MOSFET, 采用 SO-8 封装 |
文件: | 总10页 (文件大小:270K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
PD - 96284
IRF7815PbF
HEXFET® Power MOSFET
Applications
l Synchronous MOSFET for Notebook
VDSS
RDS(on) max
Qg (typ.)
25nC
43m @VGS = 10V
150V
Processor Power
l Synchronous Rectifier MOSFET for
Isolated DC-DC Converters in
Networking Systems
A
A
D
1
8
S
Benefits
2
7
S
D
l Very Low RDS(on) at 10V VGS
l Low Gate Charge
l Fully Characterized Avalanche Voltage
and Current
l 20V VGS Max. Gate Rating
3
6
S
D
4
5
G
D
SO-8
Top View
Absolute Maximum Ratings
Parameter
Max.
150
± 20
5.1
Units
VDS
Drain-to-Source Voltage
Gate-to-Source Voltage
Continuous Drain Current, VGS @ 10V
Continuous Drain Current, VGS @ 10V
Pulsed Drain Current
V
V
GS
I
I
I
@ TA = 25°C
D
D
@ TA = 70°C
4.1
A
41
DM
Power Dissipation
P
P
@TA = 25°C
@TA = 70°C
2.5
W
D
D
Power Dissipation
1.6
Linear Derating Factor
Operating Junction and
0.02
-55 to + 150
W/°C
°C
T
J
T
Storage Temperature Range
STG
Thermal Resistance
Parameter
Junction-to-Drain Lead
Junction-to-Ambient
Typ.
–––
Max.
20
Units
RθJL
RθJA
°C/W
–––
50
Notes through ꢀ are on page 9
www.irf.com
1
12/01/09
IRF7815PbF
Static @ TJ = 25°C (unless otherwise specified)
Parameter
Drain-to-Source Breakdown Voltage
Min. Typ. Max. Units
Conditions
VGS = 0V, ID = 250µA
BVDSS
150
–––
0.17
34
–––
V
∆ΒVDSS/∆TJ
RDS(on)
Breakdown Voltage Temp. Coefficient –––
––– V/°C Reference to 25°C, ID = 1mA
Static Drain-to-Source On-Resistance
Gate Threshold Voltage
–––
3.0
43
VGS = 10V, ID = 3.1A
Ω
m
VGS(th)
4.0
5.0
V
VDS = VGS, ID = 100µA
∆
VGS(th)
Gate Threshold Voltage Coefficient
Drain-to-Source Leakage Current
––– -12.2 ––– mV/°C
IDSS
–––
–––
–––
–––
8.2
–––
–––
–––
–––
–––
25
20
250
100
-100
–––
38
VDS = 150V, VGS = 0V
µA
V
DS = 150V, VGS = 0V, TJ = 125°C
VGS = 20V
GS = -20V
IGSS
Gate-to-Source Forward Leakage
Gate-to-Source Reverse Leakage
Forward Transconductance
Total Gate Charge
nA
S
V
gfs
Qg
VDS = 50V, ID = 3.1A
–––
–––
–––
–––
–––
–––
–––
–––
–––
–––
–––
–––
–––
Qgs1
Pre-Vth Gate-to-Source Charge
Post-Vth Gate-to-Source Charge
Gate-to-Source Charge
6.5
1.3
7.8
7.4
9.8
8..7
10
–––
–––
–––
–––
–––
–––
–––
–––
–––
–––
–––
–––
VDS = 75V
Qgs2
Qgs
VGS = 10V
ID = 3.1A
nC
Qgd
Gate-to-Drain Charge
See Figs. 6, 16a & 16b
Qgodr
Gate Charge Overdrive
Switch Charge (Qgs2 + Qgd)
Qsw
Qoss
RG
Output Charge
nC VDS = 16V, VGS = 0V
Ω
Gate Resistance
Turn-On Delay Time
Rise Time
1.02
8.4
3.2
14
td(on)
tr
td(off)
tf
V
DD = 75V, VGS = 10V
ID = 3.1A
ns
pF
Turn-Off Delay Time
Fall Time
Ω
RG = 1.8
8.3
See Figs. 15a & 15b
Ciss
Coss
Crss
Input Capacitance
Output Capacitance
Reverse Transfer Capacitance
––– 1647 –––
VGS = 0V
–––
–––
129
30
–––
–––
VDS = 75V
ƒ = 1.0MHz
Avalanche Characteristics
Parameter
Typ.
–––
–––
Max.
Units
mJ
Single Pulse Avalanche Energy
EAS
IAR
529
3.1
Avalanche Current
A
Diode Characteristics
Parameter
Min. Typ. Max. Units
Conditions
IS
Continuous Source Current
MOSFET symbol
–––
–––
2.3
(Body Diode)
Pulsed Source Current
showing the
integral reverse
A
ISM
–––
–––
41
(Body Diode)
p-n junction diode.
VSD
trr
Diode Forward Voltage
–––
–––
–––
–––
41
1.3
62
V
T = 25°C, I = 3.1A, V = 0V
J S GS
Reverse Recovery Time
Reverse Recovery Charge
ns T = 25°C, I = 3.1A, VDD = 75V
J F
Qrr
di/dt = 300A/µs
213
320
nC
2
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IRF7815PbF
100
10
100
10
1
VGS
15V
10V
8.0V
7.0V
6.5V
6.0V
5.5V
5.0V
VGS
15V
10V
8.0V
7.0V
6.5V
6.0V
5.5V
5.0V
TOP
TOP
BOTTOM
BOTTOM
1
5.0V
0.1
0.01
60µs PULSE WIDTH
Tj = 150°C
5.0V
≤
≤
60µs PULSE WIDTH Tj = 25°C
0.1
0.1
1
10
100
0.1
1
10
100
V
, Drain-to-Source Voltage (V)
V
, Drain-to-Source Voltage (V)
DS
DS
Fig 1. Typical Output Characteristics
Fig 2. Typical Output Characteristics
2.5
2.0
1.5
1.0
0.5
100
10
1
I
= 5.1A
D
V
= 50V
DS
V
= 10V
GS
≤
60µs PULSE WIDTH
T
= 150°C
J
T
= 25°C
J
0.1
3.5 4.0 4.5 5.0 5.5 6.0 6.5 7.0 7.5
-60 -40 -20
0
20 40 60 80 100 120140 160
T
J
, Junction Temperature (°C)
V
, Gate-to-Source Voltage (V)
GS
Fig 3. Typical Transfer Characteristics
Fig 4. Normalized On-Resistance
Vs. Temperature
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3
IRF7815PbF
100000
14.0
12.0
10.0
8.0
V
= 0V,
= C
f = 1 MHZ
GS
I = 3.1A
D
C
C
C
+ C , C
SHORTED
iss
gs
gd
ds
= C
rss
oss
gd
V
= 120V
= 75V
DS
= C + C
ds
gd
10000
1000
100
V
DS
VDS= 30V
C
iss
6.0
C
oss
4.0
C
rss
2.0
10
0.0
1
10
100
1000
0
5
10
, Total Gate Charge (nC)
G
15
20
25
30
35
V
, Drain-to-Source Voltage (V)
Q
DS
Fig 6. Typical Gate Charge Vs.
Fig 5. Typical Capacitance Vs.
Gate-to-Source Voltage
Drain-to-Source Voltage
100
10
1
100
10
1
OPERATION IN THIS AREA
LIMITED BY R
(on)
DS
100µsec
T
= 150°C
J
10msec
1msec
T
= 25°C
J
T
= 25°C
A
Tj = 150°C
Single Pulse
V
GS
= 0V
0.1
0.3
0.5
0.7
0.9
0
1
10
100
1000
V
, Drain-to-Source Voltage (V)
V
, Source-to-Drain Voltage (V)
SD
DS
Fig 8. Maximum Safe Operating Area
Fig 7. Typical Source-Drain Diode
Forward Voltage
4
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IRF7815PbF
6
5
4
3
2
1
0
6.0
5.0
4.0
3.0
2.0
I
I
I
= 100uA
= 150uA
= 250uA
D
D
D
ID = 1.0mA
= 1.0A
I
D
25
50
75
100
125
150
-75 -50 -25
0
25 50 75 100 125 150
T
, Ambient Temperature (°C)
T , Temperature ( °C )
A
J
Fig 10. Threshold Voltage Vs. Temperature
Fig 9. Maximum Drain Current Vs.
Ambient Temperature
100
D = 0.50
10
1
0.20
0.10
0.05
0.02
0.01
R1
R1
R2
R2
R3
R3
R4
R4
Ri (°C/W) τi (sec)
τ
J τJ
τ
2.8482
0.012383
0.1
AτA
τ
τ
1 τ1
τ
τ
16.4171
36.75014
2 τ2
3 τ3
4 τ4
20.8292 5.677801
9.8220 0.525832
0.01
0.001
0.0001
Ci= τi/Ri
Ci= τi/Ri
Notes:
1. Duty Factor D = t1/t2
SINGLE PULSE
( THERMAL RESPONSE )
2. Peak Tj = P dm x Zthja + T
A
1E-006
1E-005
0.0001
0.001
0.01
0.1
1
10
100
t
, Rectangular Pulse Duration (sec)
1
Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Ambient
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5
IRF7815PbF
100
90
80
70
60
50
2500
2000
1500
1000
500
I
I
= 5.1A
D
D
TOP
0.30A
0.44A
BOTTOM 3.1A
T
= 125°C
J
T
= 25°C
J
40
30
20
0
4
6
8
10
12 14 16
18 20
25
50
75
100
125
150
Starting T , Junction Temperature (°C)
J
V
Gate -to -Source Voltage (V)
GS,
Fig 12. On-Resistance Vs. Gate Voltage
Fig 13c. Maximum Avalanche Energy
Vs. Drain Current
V
(BR)DSS
15V
t
p
DRIVER
+
L
V
DS
D.U.T
AS
R
G
V
DD
-
I
A
V
GS
Ω
0.01
t
p
I
AS
Fig 14a. Unclamped Inductive Test Circuit
Fig 14b. Unclamped Inductive Waveforms
RD
V
DS
VDS
90%
VGS
D.U.T.
RG
+VDD
-
10%
VGS
Pulse Width ≤ 1 µs
Duty Factor ≤ 0.1 %
V
GS
t
t
r
t
t
f
d(on)
d(off)
Fig 15a. Switching Time Test Circuit
Fig 15b. Switching Time Waveforms
6
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IRF7815PbF
Id
Vds
Vgs
L
VCC
DUT
0
Vgs(th)
20K
Qgs1
Qgs2
Qgodr
Qgd
Fig 16b. Gate Charge Waveform
Fig 16a. Gate Charge Test Circuit
Driver Gate Drive
P.W.
Period
D =
D.U.T
Period
P.W.
+
V***
=10V
GS
Circuit Layout Considerations
• Low Stray Inductance
• Ground Plane
• Low Leakage Inductance
Current Transformer
-
D.U.T. I Waveform
SD
+
-
Reverse
Recovery
Current
Body Diode Forward
Current
di/dt
-
+
D.U.T. V Waveform
DS
Diode Recovery
dv/dt
V
DD
*
VDD
**
Re-Applied
Voltage
• dv/dt controlled by RG
RG
+
-
Body Diode
Forward Drop
• Driver same type as D.U.T.
• ISD controlled by Duty Factor "D"
• D.U.T. - Device Under Test
Inductor Curent
I
SD
Ripple
≤ 5%
* Use P-Channel Driver for P-Channel Measurements
** Reverse Polarity for P-Channel
*** VGS = 5V for Logic Level Devices
Fig 17. Diode Reverse Recovery Test Circuit for HEXFET® Power MOSFETs
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7
IRF7815PbF
SO-8 Package Outline(Mosfet & Fetky)
Dimensions are shown in milimeters (inches)
SO-8 Part Marking Information
Note: For the most current drawing please refer to IR website at http://www.irf.com/package/
8
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IRF7815PbF
SO-8 Tape and Reel
TERMINAL NUMBER 1
12.3 ( .484 )
11.7 ( .461 )
8.1 ( .318 )
7.9 ( .312 )
FEED DIRECTION
NOTES:
1. CONTROLLING DIMENSION : MILLIMETER.
2. ALL DIMENSIONS ARE SHOWN IN MILLIMETERS(INCHES).
3. OUTLINE CONFORMS TO EIA-481 & EIA-541.
330.00
(12.992)
MAX.
14.40 ( .566 )
12.40 ( .488 )
NOTES :
1. CONTROLLING DIMENSION : MILLIMETER.
2. OUTLINE CONFORMS TO EIA-481 & EIA-541.
Note: For the most current drawing please refer to IR website at http://www.irf.com/package/
Notes:
Repetitive rating; pulse width limited by max. junction temperature.
Starting TJ = 25°C, L = 110mH, RG = 25Ω, IAS = 3.1A
Pulse width ≤ 400µs; duty cycle ≤ 2%.
When mounted on 1 inch square copper board.
ꢀ R is measured at TJ of approximately 90°C.
θ
Data and specifications subject to change without notice.
This product has been designed and qualified for the Industrial market.
Qualification Standards can be found on IR’s Web site.
IR WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, USA Tel: (310) 252-7105
TAC Fax: (310) 252-7903
Visit us at www.irf.com for sales contact information.12/2009
www.irf.com
9
IMPORTANT NOTICE
The information given in this document shall in no For further information on the product, technology,
event be regarded as a guarantee of conditions or delivery terms and conditions and prices please
characteristics (“Beschaffenheitsgarantie”) .
contact your nearest Infineon Technologies office
(www.infineon.com).
With respect to any examples, hints or any typical
values stated herein and/or any information
regarding the application of the product, Infineon
Technologies hereby disclaims any and all
warranties and liabilities of any kind, including
without limitation warranties of non-infringement
of intellectual property rights of any third party.
WARNINGS
Due to technical requirements products may
contain dangerous substances. For information on
the types in question please contact your nearest
Infineon Technologies office.
In addition, any information given in this document
is subject to customer’s compliance with its
obligations stated in this document and any
applicable legal requirements, norms and
standards concerning customer’s products and any
use of the product of Infineon Technologies in
customer’s applications.
Except as otherwise explicitly approved by Infineon
Technologies in a written document signed by
authorized
representatives
of
Infineon
Technologies, Infineon Technologies’ products may
not be used in any applications where a failure of
the product or any consequences of the use thereof
can reasonably be expected to result in personal
injury.
The data contained in this document is exclusively
intended for technically trained staff. It is the
responsibility of customer’s technical departments
to evaluate the suitability of the product for the
intended application and the completeness of the
product information given in this document with
respect to such application.
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